ATE366165T1 - Transparente mikroporöse materialien für cmp - Google Patents
Transparente mikroporöse materialien für cmpInfo
- Publication number
- ATE366165T1 ATE366165T1 AT03809403T AT03809403T ATE366165T1 AT E366165 T1 ATE366165 T1 AT E366165T1 AT 03809403 T AT03809403 T AT 03809403T AT 03809403 T AT03809403 T AT 03809403T AT E366165 T1 ATE366165 T1 AT E366165T1
- Authority
- AT
- Austria
- Prior art keywords
- polishing pad
- cmp
- pad substrate
- microporous materials
- transparent microporous
- Prior art date
Links
- 239000012229 microporous material Substances 0.000 title 1
- 238000005498 polishing Methods 0.000 abstract 6
- 239000000758 substrate Substances 0.000 abstract 5
- 239000011148 porous material Substances 0.000 abstract 2
- 238000007517 polishing process Methods 0.000 abstract 1
- 238000002834 transmittance Methods 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacture Of Porous Articles, And Recovery And Treatment Of Waste Products (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/282,489 US7435165B2 (en) | 2002-10-28 | 2002-10-28 | Transparent microporous materials for CMP |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE366165T1 true ATE366165T1 (de) | 2007-07-15 |
Family
ID=32107376
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT03809403T ATE366165T1 (de) | 2002-10-28 | 2003-10-06 | Transparente mikroporöse materialien für cmp |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US7435165B2 (de) |
| EP (1) | EP1567306B1 (de) |
| JP (4) | JP2006504260A (de) |
| KR (1) | KR101065117B1 (de) |
| CN (1) | CN100589934C (de) |
| AT (1) | ATE366165T1 (de) |
| AU (1) | AU2003264819A1 (de) |
| DE (1) | DE60314772T2 (de) |
| TW (1) | TWI234505B (de) |
| WO (1) | WO2004037490A1 (de) |
Families Citing this family (56)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW591089B (en) | 2001-08-09 | 2004-06-11 | Cheil Ind Inc | Slurry composition for use in chemical mechanical polishing of metal wiring |
| US6953389B2 (en) * | 2001-08-09 | 2005-10-11 | Cheil Industries, Inc. | Metal CMP slurry compositions that favor mechanical removal of oxides with reduced susceptibility to micro-scratching |
| US7311862B2 (en) * | 2002-10-28 | 2007-12-25 | Cabot Microelectronics Corporation | Method for manufacturing microporous CMP materials having controlled pore size |
| US7267607B2 (en) * | 2002-10-28 | 2007-09-11 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| US6984163B2 (en) * | 2003-11-25 | 2006-01-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad with high optical transmission window |
| TWI293266B (en) * | 2004-05-05 | 2008-02-11 | Iv Technologies Co Ltd | A single-layer polishing pad and a method of producing the same |
| JP4845347B2 (ja) * | 2004-05-17 | 2011-12-28 | 東洋ゴム工業株式会社 | 研磨パッドおよびその製造方法 |
| KR100699522B1 (ko) * | 2005-06-30 | 2007-03-27 | (주)제이티앤씨 | 웨이퍼용 연마패드의 제조방법 및 그 연마패드 |
| TW200709892A (en) * | 2005-08-18 | 2007-03-16 | Rohm & Haas Elect Mat | Transparent polishing pad |
| TWI378844B (en) * | 2005-08-18 | 2012-12-11 | Rohm & Haas Elect Mat | Polishing pad and method of manufacture |
| JP5110677B2 (ja) * | 2006-05-17 | 2012-12-26 | 東洋ゴム工業株式会社 | 研磨パッド |
| JP2007307639A (ja) * | 2006-05-17 | 2007-11-29 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
| US7838108B2 (en) * | 2007-01-17 | 2010-11-23 | Sabic Innovative Plastics Ip B.V. | Nano-cellular polymer foam and methods for making them |
| US8092626B2 (en) * | 2007-03-12 | 2012-01-10 | University Of Washington | Foaming methods for making cellular thermoplastic materials |
| US7842379B2 (en) * | 2007-07-05 | 2010-11-30 | Sabic Innovative Plastics Ip B.V. | Polymeric foams with nanocellular morphology and methods for making them |
| KR101431512B1 (ko) * | 2007-08-27 | 2014-08-20 | 주식회사 동진쎄미켐 | 초임계 유체를 이용한 금속층의 기계화학적 연마방법 및장치 |
| EP2227350A4 (de) * | 2007-11-30 | 2011-01-12 | Innopad Inc | Kissen mit endpunkterfassungsfenster für chemisch-mechanisches polieren |
| US8908129B2 (en) * | 2007-12-28 | 2014-12-09 | Sabic Global Technologies B.V. | Reflective polymeric article and manufacture |
| US8430721B2 (en) * | 2007-12-31 | 2013-04-30 | Innopad, Inc. | Chemical-mechanical planarization pad |
| US8440732B2 (en) * | 2008-03-25 | 2013-05-14 | Sabic Innovative Plastics Ip B.V. | Polymeric foams with nanocellular morphology and methods for making them |
| JP5514806B2 (ja) * | 2008-04-29 | 2014-06-04 | セミクエスト・インコーポレーテッド | 研磨パッド組成物およびその製造方法ならびに使用 |
| JP5336799B2 (ja) * | 2008-09-24 | 2013-11-06 | 東京エレクトロン株式会社 | 化学的機械研磨装置、化学的機械研磨方法及び制御プログラム |
| WO2010143899A2 (ko) * | 2009-06-10 | 2010-12-16 | 주식회사 엘지화학 | 다공성 시트의 제조방법 및 이에 의해 제조된 다공성 시트 |
| US8283390B2 (en) * | 2009-09-10 | 2012-10-09 | Sabic Innovative Plastics Ip B.V. | Siloxane block copolymer nanoporous foams, methods of manufacture thereof and articles comprising the same |
| US8162728B2 (en) * | 2009-09-28 | 2012-04-24 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Dual-pore structure polishing pad |
| US9017140B2 (en) | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
| US8697217B2 (en) * | 2010-01-15 | 2014-04-15 | Rohm and Haas Electronics Materials CMP Holdings, Inc. | Creep-resistant polishing pad window |
| CN102791783B (zh) | 2010-03-10 | 2014-04-02 | 陶氏环球技术有限责任公司 | 具有高孔密度且不含纳米填充剂的纳米多孔聚合泡沫 |
| US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| US8758659B2 (en) | 2010-09-29 | 2014-06-24 | Fns Tech Co., Ltd. | Method of grooving a chemical-mechanical planarization pad |
| US9156125B2 (en) | 2012-04-11 | 2015-10-13 | Cabot Microelectronics Corporation | Polishing pad with light-stable light-transmitting region |
| DE202014007186U1 (de) * | 2014-09-09 | 2015-08-27 | Kolthoff Gabrovo Eood | Werkzeug zur Oberflächenfeinbearbeitung |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| CN113579992A (zh) | 2014-10-17 | 2021-11-02 | 应用材料公司 | 使用加成制造工艺的具复合材料特性的cmp衬垫建构 |
| US10399201B2 (en) | 2014-10-17 | 2019-09-03 | Applied Materials, Inc. | Advanced polishing pads having compositional gradients by use of an additive manufacturing process |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10875145B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| US10821573B2 (en) | 2014-10-17 | 2020-11-03 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| WO2017019906A1 (en) * | 2015-07-30 | 2017-02-02 | Jh Rhodes Company, Inc. | Polymeric lapping materials, media and systems including polymeric lapping material, and methods of forming and using same |
| JP6940495B2 (ja) | 2015-10-30 | 2021-09-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 所望のゼータ電位を有する研磨用物品を形成するための装置及び方法 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| TWI548683B (zh) | 2015-11-10 | 2016-09-11 | 國立臺灣科技大學 | 製造高分子奈米泡材的方法 |
| KR20240015161A (ko) | 2016-01-19 | 2024-02-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 다공성 화학적 기계적 연마 패드들 |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| KR20210042171A (ko) | 2018-09-04 | 2021-04-16 | 어플라이드 머티어리얼스, 인코포레이티드 | 진보한 폴리싱 패드들을 위한 제형들 |
| US11813712B2 (en) | 2019-12-20 | 2023-11-14 | Applied Materials, Inc. | Polishing pads having selectively arranged porosity |
| US11806829B2 (en) | 2020-06-19 | 2023-11-07 | Applied Materials, Inc. | Advanced polishing pads and related polishing pad manufacturing methods |
| US11667009B2 (en) | 2020-07-10 | 2023-06-06 | Saint-Gobain Abrasives, Inc. | Bonded abrasive article and method of making the same |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| CN113977453B (zh) * | 2021-11-08 | 2023-01-13 | 万华化学集团电子材料有限公司 | 提高抛光平坦度的化学机械抛光垫及其应用 |
| CN115464511B (zh) * | 2022-09-19 | 2023-08-01 | 厦门大学 | 一种集多通道孔径检测及纳米孔制备于一体的装置及其使用方法 |
| CN116749074A (zh) * | 2023-06-27 | 2023-09-15 | 中国地质大学(北京) | 一种改善透光晶圆厚度均匀性的方法及装置 |
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-
2002
- 2002-10-28 US US10/282,489 patent/US7435165B2/en not_active Expired - Lifetime
-
2003
- 2003-10-06 KR KR1020057007277A patent/KR101065117B1/ko not_active Expired - Fee Related
- 2003-10-06 CN CN200380102155A patent/CN100589934C/zh not_active Expired - Fee Related
- 2003-10-06 EP EP03809403A patent/EP1567306B1/de not_active Expired - Lifetime
- 2003-10-06 WO PCT/IB2003/004476 patent/WO2004037490A1/en not_active Ceased
- 2003-10-06 AU AU2003264819A patent/AU2003264819A1/en not_active Abandoned
- 2003-10-06 JP JP2004546252A patent/JP2006504260A/ja active Pending
- 2003-10-06 DE DE60314772T patent/DE60314772T2/de not_active Expired - Lifetime
- 2003-10-06 AT AT03809403T patent/ATE366165T1/de not_active IP Right Cessation
- 2003-10-09 TW TW092128094A patent/TWI234505B/zh not_active IP Right Cessation
-
2010
- 2010-03-23 JP JP2010066030A patent/JP5675136B2/ja not_active Expired - Fee Related
-
2013
- 2013-06-03 JP JP2013116652A patent/JP5882947B2/ja not_active Expired - Fee Related
-
2015
- 2015-06-19 JP JP2015123439A patent/JP5986268B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2004037490A1 (en) | 2004-05-06 |
| DE60314772T2 (de) | 2007-10-31 |
| KR20050061569A (ko) | 2005-06-22 |
| JP2013201452A (ja) | 2013-10-03 |
| KR101065117B1 (ko) | 2011-09-16 |
| JP5986268B2 (ja) | 2016-09-06 |
| JP2010166078A (ja) | 2010-07-29 |
| CN100589934C (zh) | 2010-02-17 |
| EP1567306A1 (de) | 2005-08-31 |
| DE60314772D1 (de) | 2007-08-16 |
| TWI234505B (en) | 2005-06-21 |
| CN1708377A (zh) | 2005-12-14 |
| TW200420382A (en) | 2004-10-16 |
| EP1567306B1 (de) | 2007-07-04 |
| JP5675136B2 (ja) | 2015-02-25 |
| JP5882947B2 (ja) | 2016-03-09 |
| JP2006504260A (ja) | 2006-02-02 |
| US20040082276A1 (en) | 2004-04-29 |
| JP2015193077A (ja) | 2015-11-05 |
| US7435165B2 (en) | 2008-10-14 |
| AU2003264819A1 (en) | 2004-05-13 |
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| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |