ATE346486T1 - Strahlabschirmung der integrierte schaltkreisen und multichipmodule in metallischen und keramischen packungen - Google Patents

Strahlabschirmung der integrierte schaltkreisen und multichipmodule in metallischen und keramischen packungen

Info

Publication number
ATE346486T1
ATE346486T1 AT96911182T AT96911182T ATE346486T1 AT E346486 T1 ATE346486 T1 AT E346486T1 AT 96911182 T AT96911182 T AT 96911182T AT 96911182 T AT96911182 T AT 96911182T AT E346486 T1 ATE346486 T1 AT E346486T1
Authority
AT
Austria
Prior art keywords
metallic
integrated circuits
integrated circuit
base
multichip modules
Prior art date
Application number
AT96911182T
Other languages
English (en)
Inventor
David J Strobel
David R Czajkowski
Original Assignee
Maxwell Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maxwell Technologies Inc filed Critical Maxwell Technologies Inc
Application granted granted Critical
Publication of ATE346486T1 publication Critical patent/ATE346486T1/de

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W76/00Containers; Fillings or auxiliary members therefor; Seals
    • H10W76/10Containers or parts thereof
    • H10W76/12Containers or parts thereof characterised by their shape
    • H10W76/15Containers comprising an insulating or insulated base
    • H10W76/153Containers comprising an insulating or insulated base having interconnections in passages through the insulating or insulated base
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H10W42/25Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons against alpha rays, e.g. for outer space applications
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W76/00Containers; Fillings or auxiliary members therefor; Seals
    • H10W76/10Containers or parts thereof
    • H10W76/12Containers or parts thereof characterised by their shape
    • H10W76/15Containers comprising an insulating or insulated base
    • H10W76/157Containers comprising an insulating or insulated base having interconnections parallel to the insulating or insulated base
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W76/00Containers; Fillings or auxiliary members therefor; Seals
    • H10W76/40Fillings or auxiliary members in containers, e.g. centering rings
    • H10W76/42Fillings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/682Shapes or dispositions thereof comprising holes having chips therein
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5449Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/931Shapes of bond pads
    • H10W72/932Plan-view shape, i.e. in top view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/753Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT96911182T 1995-01-13 1996-01-16 Strahlabschirmung der integrierte schaltkreisen und multichipmodule in metallischen und keramischen packungen ATE346486T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/372,289 US5635754A (en) 1994-04-01 1995-01-13 Radiation shielding of integrated circuits and multi-chip modules in ceramic and metal packages

Publications (1)

Publication Number Publication Date
ATE346486T1 true ATE346486T1 (de) 2006-12-15

Family

ID=23467522

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96911182T ATE346486T1 (de) 1995-01-13 1996-01-16 Strahlabschirmung der integrierte schaltkreisen und multichipmodule in metallischen und keramischen packungen

Country Status (8)

Country Link
US (1) US5635754A (de)
EP (1) EP0803174B1 (de)
JP (1) JPH09509016A (de)
AT (1) ATE346486T1 (de)
AU (1) AU5414696A (de)
DE (1) DE69636716T2 (de)
ES (1) ES2276400T3 (de)
WO (1) WO1996022669A2 (de)

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US5880403A (en) * 1994-04-01 1999-03-09 Space Electronics, Inc. Radiation shielding of three dimensional multi-chip modules
US6720493B1 (en) * 1994-04-01 2004-04-13 Space Electronics, Inc. Radiation shielding of integrated circuits and multi-chip modules in ceramic and metal packages
US5998867A (en) * 1996-02-23 1999-12-07 Honeywell Inc. Radiation enhanced chip encapsulant
US5740261A (en) * 1996-11-21 1998-04-14 Knowles Electronics, Inc. Miniature silicon condenser microphone
US5939772A (en) * 1997-10-31 1999-08-17 Honeywell Inc. Shielded package for magnetic devices
JP3129288B2 (ja) * 1998-05-28 2001-01-29 日本電気株式会社 マイクロ波集積回路マルチチップモジュール、マイクロ波集積回路マルチチップモジュールの実装構造
US6121672A (en) * 1998-11-03 2000-09-19 Utmc Microelectronic Systems Inc. Raised pedestal radiation shield for sensitive electronics
FR2790327B1 (fr) * 1999-02-26 2001-04-13 Commissariat Energie Atomique Systeme electronique fonctionnant sous irradiation, procede de conception d'un tel systeme, et application de celui-ci a la commande d'un robot mobile
US6594156B1 (en) * 2000-04-24 2003-07-15 Minimed Inc. Device and method for circuit protection during radiation sterilization
US6414383B1 (en) 1999-07-16 2002-07-02 Agere Systems Guardian Corp. Very low magnetic field integrated circuit
US6650003B1 (en) 1999-11-17 2003-11-18 Aeroflex Utmc Microelectronic Systems, Inc. Radiation shielded carriers for sensitive electronics
US6452263B1 (en) 1999-11-23 2002-09-17 Aeroflex Utmc Microelectronic Systems, Inc. Radiation shield and radiation shielded integrated circuit device
US6515352B1 (en) * 2000-09-25 2003-02-04 Micron Technology, Inc. Shielding arrangement to protect a circuit from stray magnetic fields
US6504256B2 (en) 2001-01-30 2003-01-07 Bae Systems Information And Electronic Systems Integration, Inc. Insitu radiation protection of integrated circuits
US6740959B2 (en) 2001-08-01 2004-05-25 International Business Machines Corporation EMI shielding for semiconductor chip carriers
US6906396B2 (en) * 2002-01-15 2005-06-14 Micron Technology, Inc. Magnetic shield for integrated circuit packaging
JP4024103B2 (ja) * 2002-05-29 2007-12-19 アルプス電気株式会社 高周波回路の接続構造
US7382043B2 (en) * 2002-09-25 2008-06-03 Maxwell Technologies, Inc. Method and apparatus for shielding an integrated circuit from radiation
JP4096302B2 (ja) * 2002-12-16 2008-06-04 ソニー株式会社 磁気メモリ装置
US7467326B2 (en) * 2003-02-28 2008-12-16 Maxwell Technologies, Inc. Self-correcting computer
JP2004364170A (ja) * 2003-06-06 2004-12-24 Toshiba Corp ケーブルモデムモジュール装置及び送受信装置
US7475326B2 (en) * 2003-06-27 2009-01-06 Maxwell Technologies, Inc. Error detection and correction method and system for memory devices
US7191516B2 (en) * 2003-07-16 2007-03-20 Maxwell Technologies, Inc. Method for shielding integrated circuit devices
US7119393B1 (en) 2003-07-28 2006-10-10 Actel Corporation Transistor having fully-depleted junctions to reduce capacitance and increase radiation immunity in an integrated circuit
WO2005027196A2 (en) * 2003-09-05 2005-03-24 Solid State Devices, Inc. Radiation shielded semiconductor device package
US7030469B2 (en) * 2003-09-25 2006-04-18 Freescale Semiconductor, Inc. Method of forming a semiconductor package and structure thereof
US6853055B1 (en) 2003-11-26 2005-02-08 Actel Corporation Radiation shielding die carrier package
US20060002099A1 (en) * 2004-06-30 2006-01-05 Stoneham Edward B Electromagnetic shield assembly
US7813145B2 (en) * 2004-06-30 2010-10-12 Endwave Corporation Circuit structure with multifunction circuit cover
US7327015B2 (en) * 2004-09-20 2008-02-05 Advanced Semiconductor Engineering, Inc. Semiconductor device package
US7718984B2 (en) * 2005-05-10 2010-05-18 Space Micro Inc. Optimized nuclear radiation shielding within composite structures for combined man made and natural radiation environments
US7677765B2 (en) * 2006-06-15 2010-03-16 Avago Technologies General Ip (Singapore) Pte. Ltd. Light emitting device having a metal can package for improved heat dissipation
US8492762B2 (en) * 2006-06-27 2013-07-23 General Electric Company Electrical interface for a sensor array
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US8421214B2 (en) * 2007-10-10 2013-04-16 Vishay General Semiconductor Llc Semiconductor device and method for manufacturing a semiconductor device
KR20110054710A (ko) * 2009-11-18 2011-05-25 한국전자통신연구원 소자 패키지 및 그 제조 방법
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JP2013160684A (ja) * 2012-02-07 2013-08-19 Mitsubishi Electric Corp 半導体装置とモジュール
EP2725715B1 (de) * 2012-10-29 2018-12-12 Optosys SA Näherungssensor
EP3054534B1 (de) * 2013-10-02 2019-12-11 Hitachi Automotive Systems, Ltd. Elektronische steuerungsvorrichtung
FR3066643B1 (fr) * 2017-05-16 2020-03-13 Stmicroelectronics (Grenoble 2) Sas Boitier electronique pourvu d'une fente locale formant un event
US11209317B2 (en) 2019-09-18 2021-12-28 Raytheon Company Internal ionizing radiation shielding for infrared cameras
CN112967938B (zh) * 2020-12-29 2024-11-08 中国电子科技集团公司第四十七研究所 一种宇航级集成电路总剂量屏蔽方法及抗辐照加固效果验证方法
CN114334886B (zh) * 2021-12-21 2026-02-10 华中科技大学 一种抗电子辐照的mosfet加固封装结构

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Also Published As

Publication number Publication date
AU5414696A (en) 1996-08-07
JPH09509016A (ja) 1997-09-09
WO1996022669A3 (en) 1996-09-26
US5635754A (en) 1997-06-03
EP0803174A4 (de) 1999-05-06
DE69636716T2 (de) 2007-10-25
EP0803174A2 (de) 1997-10-29
EP0803174B1 (de) 2006-11-22
DE69636716D1 (de) 2007-01-04
ES2276400T3 (es) 2007-06-16
WO1996022669A2 (en) 1996-07-25

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