ATE244445T1 - Anordnung und verfahren für statischen ramspeicher - Google Patents

Anordnung und verfahren für statischen ramspeicher

Info

Publication number
ATE244445T1
ATE244445T1 AT99203042T AT99203042T ATE244445T1 AT E244445 T1 ATE244445 T1 AT E244445T1 AT 99203042 T AT99203042 T AT 99203042T AT 99203042 T AT99203042 T AT 99203042T AT E244445 T1 ATE244445 T1 AT E244445T1
Authority
AT
Austria
Prior art keywords
array
power supply
output voltage
arrangement
ram memory
Prior art date
Application number
AT99203042T
Other languages
English (en)
Inventor
Bob D Strong
Sudhir Madan
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of ATE244445T1 publication Critical patent/ATE244445T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/418Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/419Read-write [R-W] circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
AT99203042T 1998-09-17 1999-09-17 Anordnung und verfahren für statischen ramspeicher ATE244445T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10072298P 1998-09-17 1998-09-17

Publications (1)

Publication Number Publication Date
ATE244445T1 true ATE244445T1 (de) 2003-07-15

Family

ID=22281200

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99203042T ATE244445T1 (de) 1998-09-17 1999-09-17 Anordnung und verfahren für statischen ramspeicher

Country Status (4)

Country Link
US (1) US6141240A (de)
EP (1) EP0987714B1 (de)
AT (1) ATE244445T1 (de)
DE (1) DE69909202T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4198201B2 (ja) * 1995-06-02 2008-12-17 株式会社ルネサステクノロジ 半導体装置
US6946901B2 (en) * 2001-05-22 2005-09-20 The Regents Of The University Of California Low-power high-performance integrated circuit and related methods
KR20040078664A (ko) 2002-01-11 2004-09-10 주식회사 하이닉스반도체 반도체 메모리 장치의 리프레시 주기 증가
KR100993517B1 (ko) * 2002-03-27 2010-11-10 더 리전트 오브 더 유니버시티 오브 캘리포니아 집적 회로, 집적 회로 구동 회로, 및 관련방법
JP4260469B2 (ja) * 2002-12-16 2009-04-30 株式会社ルネサステクノロジ 半導体記憶装置
KR100937647B1 (ko) * 2002-12-30 2010-01-19 동부일렉트로닉스 주식회사 프로그램이 가능한 커패시터 및 이의 제조 방법
US7046572B2 (en) * 2003-06-16 2006-05-16 International Business Machines Corporation Low power manager for standby operation of memory system
US7447919B2 (en) * 2004-04-06 2008-11-04 Hewlett-Packard Development Company, L.P. Voltage modulation for increased reliability in an integrated circuit
US7286389B2 (en) * 2004-07-21 2007-10-23 Duke University Low-power, p-channel enhancement-type metal-oxide semiconductor field-effect transistor (PMOSFET) SRAM cells
US20060139995A1 (en) * 2004-12-28 2006-06-29 Ali Keshavarzi One time programmable memory
US7355905B2 (en) 2005-07-01 2008-04-08 P.A. Semi, Inc. Integrated circuit with separate supply voltage for memory that is different from logic circuit supply voltage
WO2010080751A1 (en) * 2009-01-06 2010-07-15 Next Biometrics As Low noise reading architecture for active sensor arrays
TWI459390B (zh) * 2011-09-26 2014-11-01 Winbond Electronics Corp 半導體記憶裝置
US9330751B2 (en) * 2014-01-07 2016-05-03 Samsung Electronics Co., Ltd. SRAM wordline driver supply block with multiple modes
CN108847264A (zh) * 2018-05-30 2018-11-20 上海华力集成电路制造有限公司 字线电压控制器及控制电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60231996A (ja) * 1984-04-28 1985-11-18 Mitsubishi Electric Corp 半導体記憶装置
JPS63166090A (ja) * 1986-12-26 1988-07-09 Toshiba Corp スタティック型メモリ
JP4198201B2 (ja) * 1995-06-02 2008-12-17 株式会社ルネサステクノロジ 半導体装置
TW373175B (en) * 1995-10-31 1999-11-01 Matsushita Electric Mfg Corp Data maintaining circuit
US5726944A (en) * 1996-02-05 1998-03-10 Motorola, Inc. Voltage regulator for regulating an output voltage from a charge pump and method therefor
JP3220035B2 (ja) * 1997-02-27 2001-10-22 エヌイーシーマイクロシステム株式会社 スタチック型半導体記憶装置
JPH1166858A (ja) * 1997-08-12 1999-03-09 Mitsubishi Electric Corp 半導体記憶装置

Also Published As

Publication number Publication date
DE69909202D1 (de) 2003-08-07
EP0987714B1 (de) 2003-07-02
EP0987714A2 (de) 2000-03-22
EP0987714A3 (de) 2001-01-24
US6141240A (en) 2000-10-31
DE69909202T2 (de) 2004-06-03

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Legal Events

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