WO2019138505A1 - Probe pin, test jig, test unit, and test device - Google Patents

Probe pin, test jig, test unit, and test device Download PDF

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Publication number
WO2019138505A1
WO2019138505A1 PCT/JP2018/000508 JP2018000508W WO2019138505A1 WO 2019138505 A1 WO2019138505 A1 WO 2019138505A1 JP 2018000508 W JP2018000508 W JP 2018000508W WO 2019138505 A1 WO2019138505 A1 WO 2019138505A1
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WO
WIPO (PCT)
Prior art keywords
probe pin
inspection
elastic
longitudinal direction
contact portion
Prior art date
Application number
PCT/JP2018/000508
Other languages
French (fr)
Japanese (ja)
Inventor
直哉 笹野
宏真 寺西
貴浩 酒井
時薫 崔
Original Assignee
オムロン株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by オムロン株式会社 filed Critical オムロン株式会社
Priority to PCT/JP2018/000508 priority Critical patent/WO2019138505A1/en
Priority to JP2019564209A priority patent/JP6908133B2/en
Priority to CN201880051883.5A priority patent/CN111033272B/en
Priority to CN202010200587.6A priority patent/CN111239447B/en
Priority to KR1020180011384A priority patent/KR101903319B1/en
Priority to KR1020180112245A priority patent/KR102058152B1/en
Publication of WO2019138505A1 publication Critical patent/WO2019138505A1/en
Priority to KR1020190167468A priority patent/KR102103370B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted

Definitions

  • the present disclosure relates to a probe pin, an inspection jig provided with the probe pin, an inspection unit provided with the inspection jig, and an inspection apparatus provided with the inspection unit.
  • an inspection device is connected to an electrode part such as an FPC contact electrode for connection with a main substrate installed in the electronic component module or a mounted substrate-to-substrate connector using probe pins. It is done by.
  • the probe pin includes a pair of contacts that can contact the electrode terminal of the electronic component and the electrode terminal of the connected electronic component, and a serpentine portion interposed between the pair of contacts and connecting the pair of contacts There is.
  • the contact pressure between each contact and the electrode terminal of the electronic component and the electrode terminal of the connected electronic component is secured by the meandering portion, and the electrode terminal of the electronic component and the electrode terminal of the connected electronic component are secured. Improve contact reliability.
  • probe pins used for inspection of electronic component modules are also required to be compatible with signals in a high frequency region.
  • the signal in the high frequency region can not necessarily be sufficiently coped with, and the loss of the signal in the high frequency region flowing through the probe pin may become large when the electronic component module is inspected. .
  • the present disclosure relates to a probe pin capable of reducing loss of a signal in a high frequency region while securing contact reliability to an inspection object and an inspection apparatus, an inspection jig including the probe pin, and an inspection unit including the inspection jig
  • An object of the present invention is to provide an inspection apparatus provided with the inspection unit.
  • An example probe pin of the present disclosure is An elastic portion that expands and contracts along the longitudinal direction, A plate-like first contact portion connected to the first end of the elastic portion in the longitudinal direction; A plate-like second contact portion disposed in series with the first contact portion and connected to the second end of the elastic portion in the longitudinal direction;
  • the elastic portion is A first straight portion extending in a direction intersecting the longitudinal direction and having one end in the extending direction connected to the first contact portion; It extends in an arc shape projecting in the direction intersecting the longitudinal direction and away from the first contact portion, and one end in the extending direction is the other end in the extending direction of the first straight portion
  • a curved portion connected to the It extends in a direction intersecting the longitudinal direction, and has a second straight portion whose one end in the extending direction is connected to the other end of the curved portion in the extending direction,
  • the central angle of the curved portion is configured to be larger than 90 degrees and smaller than 180 degrees.
  • an inspection jig of an example of the present disclosure is The probe pin, And a housing having a receptacle capable of receiving the probe pin.
  • the probe pin is housed in the housing portion such that the central angle of the curved portion is larger than 90 degrees and smaller than 180 degrees.
  • an inspection unit of an example of the present disclosure is At least one inspection jig was provided.
  • an inspection apparatus is: At least one inspection unit was provided.
  • the elastic portion extends in the direction crossing the longitudinal direction of the probe pin, and the first straight portion whose one end in the extending direction is connected to the first contact portion, and the longitudinal direction of the probe pin A curved portion extending in an arc shape protruding in a crossing direction and in a direction away from the first contact portion, one end of the extending direction being connected to the other end of the first straight portion in the extending direction; And a second straight portion whose one end in the extending direction is connected to the other end of the bending portion in the extending direction, the central angle of the bending portion being 90 degrees It is configured to be larger than 180 degrees smaller.
  • the probe pin has high contact reliability to the inspection object and the inspection apparatus, and the inspection jig has a small loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. Can be realized.
  • the inspection jig has high contact reliability with respect to the inspection object and the inspection apparatus, and an inspection unit with little loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. realizable.
  • the inspection unit realizes an inspection apparatus having high contact reliability to the inspection object and the inspection apparatus, and having a small loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. it can.
  • FIG. 1 is a cross-sectional perspective view showing an inspection unit of an embodiment of the present disclosure.
  • Sectional drawing along the II-II line of FIG. 1 is a perspective view of a probe pin according to an embodiment of the present disclosure.
  • FIG. 4 is a plan view of the probe pin of FIG. 3;
  • FIG. 4 is an enlarged plan view of an elastic portion of the probe pin of FIG. 3;
  • FIG. 7 is an enlarged plan view of an elastic portion showing a first modified example of the probe pin of FIG. 3;
  • FIG. 14 is a plan view showing a second modification of the probe pin of FIG. 3;
  • the probe pin 10 has conductivity, and is used in a state of being accommodated in the socket 3 as shown in FIGS. 1 and 2, for example, and constitutes the inspection jig 2 together with the socket 3 Do.
  • the inspection jig 2 accommodates, for example, a plurality of thin thin plate-like probe pins 10.
  • the inspection jig 2 constitutes a part of the inspection unit 1.
  • the inspection unit 1 includes, as an example, a substantially rectangular base housing 4 in which a plurality of inspection jigs 2 are incorporated.
  • the base housing 4 is composed of a substantially rectangular plate-shaped first housing 5 and a second housing 6 stacked in the thickness direction of the first housing 5.
  • the socket 3 has a plurality of accommodating portions 7 capable of accommodating the respective probe pins 10 and is held by the first housing 5 and the second housing 6.
  • Each housing portion 7 is surrounded by the socket 3 and the second housing 6 of the base housing 4, and a first contact portion 121 and a second contact portion 131 described later are exposed to the outside of the socket 3 and the base housing 4, respectively. In the state, each probe pin 10 can be accommodated.
  • the 1st contact part 121 is comprised, for example so that contact with the terminal provided in the board
  • the second contact portion 131 is configured to be capable of coming into contact with the terminal 120 of the inspection object (for example, a substrate-to-substrate (BtoB) connector) 110.
  • each probe pin 10 is connected to an elastic portion 11 which expands and contracts along its longitudinal direction (that is, the vertical direction in FIG. 3) and a first end 111 of the elastic portion 11 in the longitudinal direction.
  • a plate-like first contact portion 12 and a plate-like second contact portion 13 connected to the second end 112 in the longitudinal direction of the elastic portion 11 are provided.
  • the probe pin 10 is formed, for example, by an electroforming method, and the elastic portion 11, the first contact portion 12, and the second contact portion 13 are integrally configured.
  • the elastic portion 11 has a serpentine shape as viewed in the thickness direction of the first contact portion 12 (i.e., the paper surface penetrating direction in FIG. 4), and is arranged with a gap 23 therebetween.
  • a plurality of elastic strips (in this embodiment, two elastic strips) 21 and 22 are provided.
  • Each of the elastic strips 21 and 22 has an elongated strip shape, and the first end 211 which is one end in the longitudinal direction of the probe pin 10 is connected to the first contact portion 12, and the other end in the longitudinal direction of the probe pin 10
  • the second end 212 which is a portion, is connected to the second contact portion 13.
  • each of the elastic strips 21 and 22 has four linear portions (ie, first linear portions 31 and 32, second linear portions 51 and 52, and third linear portions). 71, 72, fourth straight portion 91, 92), and three belt-like curved portions (that is, first curved portions 41, 42, second curved portions 61, 62, third curved portions 81, 82) And.
  • the first straight portions 31, 32 extend in a direction (for example, an orthogonal direction) intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is connected to the first contact portion 12, One end portion 211, 221 is configured.
  • the first straight portions 31 and 32 are connected to the first contact portion 12 from a direction (for example, a direction orthogonal to the longitudinal direction) intersecting with the longitudinal direction of the probe pin 10.
  • the first curved portions 41, 42 project in a direction intersecting the longitudinal direction of the probe pin 10 and in a direction away from the first contact portion 12, and in an arc with respect to a central angle ⁇ 1 larger than 90 degrees and smaller than 180 degrees. It extends along. Further, one end of the first curved portion 41, 42 in the extending direction is connected to the other end of the first straight portion 31, 32 in the extending direction.
  • the second straight portions 51, 52 extend in a direction intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is the other end of the first bending portion 41, 42 in the extending direction. It is connected.
  • the second straight portions 51, 52 have a first straight line in the longitudinal direction of the probe pin 10 as they move from one end to the other end in the extending direction (that is, as they move away from the first curved portions 41, 42). It extends away from the sections 31, 32.
  • the second curved portions 61, 62 protrude in the direction intersecting the longitudinal direction of the probe pin 10 and in the direction approaching the first contact portion 12, and are arcs with respect to the central angle ⁇ 2 larger than 90 degrees and smaller than 180 degrees. It extends along the Further, one end of the second curved portion 61, 62 in the extending direction is connected to the other end of the second straight portion 51, 52 in the extending direction.
  • the third straight portions 71, 72 extend in a direction intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is the other end of the second curved portion 61, 62 in the extending direction. It is connected.
  • the third straight portions 71 and 72 extend in the longitudinal direction of the probe pin 10 from the one end to the other end in the extending direction (that is, as they are separated from the second curved portions 61 and 62). It extends away from the parts 51, 52.
  • the third curved portions 81, 82 project in a direction intersecting the longitudinal direction of the probe pin 10 and in a direction away from the first contact portion 12, and in an arc with respect to a central angle ⁇ 3 larger than 90 degrees and smaller than 180 degrees. It extends along. Further, one end of the third curved portion 81, 82 in the extending direction is connected to the other end of the third linear portion 71, 72 in the extending direction.
  • the fourth straight portions 91, 92 extend in a direction (for example, an orthogonal direction) intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is the extension of the third curved portion 81, 82 It is connected to the other end of the direction.
  • the fourth straight portion 91, 92 has a third straight line in the longitudinal direction of the probe pin 10 as it goes from one end to the other end in the extending direction (that is, as it moves away from the third curved portion 81, 82). It extends away from the parts 71, 72.
  • the other ends of the fourth straight portions 91 and 92 in the extending direction are connected to the second contact portion 13 to configure the second ends 212 and 222.
  • the fourth straight portions 91 and 92 are connected to the second contact portion 13 in the longitudinal direction of the probe pin 10.
  • the first straight portions 31, 32 and the fourth straight portions 91, 92 pass straight through the center of curvature of the second curved portions 61, 62 and extend in a direction orthogonal to the longitudinal direction of the probe pin 10.
  • the second straight portions 51 and 52 and the third straight portions 71 and 72 are disposed symmetrically with respect to the straight line L1
  • the first curved portions 41 and 42 and the third curved portions 81 and 82 with respect to the straight line L1. Are arranged symmetrically.
  • each of the elastic strips 21 and 22 (that is, in the width direction orthogonal to the extending direction of the path between the first end 211 and 221 and the second end 212 and 222 of each elastic strip 21 or 22
  • the lengths W1 and W2 are configured to be smaller than the shortest distance W3 between the adjacent elastic strips 21 and 22.
  • the linear distance between the first bending portions 41 and 42 is shown as the shortest distance W5.
  • the first contact portion 12 extends along the longitudinal direction of the probe pin 10, and one end portion in the extending direction is connected to the first end portion 111 of the elastic portion 11.
  • a first contact portion 121 is provided at the other end of the first contact portion 12 in the extending direction.
  • the second contact portion 13 extends along the longitudinal direction of the probe pin 10, and one end portion in the extending direction is connected to the second end portion 112 of the elastic portion 11.
  • a second contact portion 131 is provided at the other end of the second contact portion 13 in the extending direction.
  • Each of the first contact portion 12 and the second contact portion 13 is arranged in series along an imaginary straight line L ⁇ b> 2 extending along the longitudinal direction of the probe pin 10. That is, as shown in FIG. 5, each of the straight portions 31, 32, 51, 52, 71, 72, 91, 92 of the elastic portion 11, the first curved portions 41, 42 and the third curved portions 81, 82
  • the second curved portions 61 and 62 are disposed between the first contact portion 12 and the second contact portion 13 and are disposed on the same side with respect to the virtual straight line L2 (that is, one side in the width direction of the first contact portion 12). And it arrange
  • a support portion 122 is provided on one side in the width direction of the middle portion in the extending direction of the first contact portion 12.
  • the supporting portion 122 is a first straight line with respect to the virtual straight line L3 in a direction (for example, an orthogonal direction) intersecting the longitudinal direction of the probe pin 10 from the first contact portion 1 when viewed from the thickness direction of the first contact portion 12 It protrudes toward the parts 31 and 32 side.
  • the support portion 122 of the first contact portion 12 has a surface on the first contact portion 121 side in the longitudinal direction of the probe pin 10
  • the housing 7 is configured to be in contact with the surface facing the first housing 5 of the second housing 6 that constitutes the housing 7.
  • the fourth linear portion 91 of the strip-like elastic piece 21 is on the surface of the socket 3 constituting the housing portion 7 facing the second housing 6 in the surface on the second contact portion 131 side in the longitudinal direction. It is comprised so that it may contact
  • the central angles ⁇ 1, ⁇ 2, ⁇ 3 of the respective curved portions 41, 42, 61, 62, 81, 82 are larger than 90 degrees and smaller than 180 degrees Is configured.
  • the first linear portion 31 of the elastic strip 21 may be configured to abut on the surface of the second housing 6 facing the first housing 5. Good. That is, the probe pin 10 may be supported by the first linear portion 31 and the fourth linear portion 91 of the strip-like elastic piece 21 inside the accommodation portion 7.
  • a through hole 132 penetrating the second contact portion 13 in the thickness direction is provided at the end of the second contact portion 13 on the side of the elastic portion 11 in the longitudinal direction of the probe pin 10. It is done.
  • the through holes 132 extend in the longitudinal direction of the probe pin 10 and are connected to the gaps 23 between the elastic strips 21 and 22. The through holes 132 disperse the stress generated in the second contact portion 13.
  • central angle (theta) 1 of the 1st curved part 41, 42 is 180 degrees or more, sufficient distance can not be provided between the 1st linear parts 31 and 32 and the 2nd linear parts 51 and 52. Therefore, for example, the signal in the high frequency area flowing through the first straight portions 31, 32 interferes with the signal in the high frequency area flowing through the second straight portions 51, 52, making it difficult to reduce the loss of signals in the high frequency area. become.
  • the elastic portion 11 extends in a direction intersecting the longitudinal direction of the probe pin 10, and a first straight portion in which one end portion 111 in the extending direction is connected to the first contact portion 12 31 and 32, extending in an arc shape projecting in a direction crossing the longitudinal direction of the probe pin 10 and away from the first contact portion 12, one end of the extending direction is the extension of the first straight portion 31, 32
  • the first curved portions 41 and 42 connected to the other end in the existing direction, and one end portion in the extending direction which extends in a direction intersecting the longitudinal direction of the probe pin 10 is the extension of the first curved portions 41 and 42
  • second straight portions 51 and 52 connected to the other end of the direction, and the central angle .theta.1 of the first curved portions 41 and 42 is configured to be larger than 90 degrees and smaller than 180 degrees.
  • each of the curved portions 41, 42, 61, 62, 81, 82 has a central angle ⁇ 1, ⁇ 2, ⁇ 3 of 180 degrees (hereinafter referred to as a probe pin of the comparative example), and each curved portion 41, Insertion loss and return loss were measured for probe pins 10 (hereinafter referred to as probe pins in the examples) having central angles ⁇ 1, ⁇ 2, ⁇ 3 of 42, 61, 62, 81, 82 all at 150 degrees.
  • an insertion loss of ⁇ 1 dB occurred for the signal of 14.28 Gbps, and a return loss of ⁇ 10 dB occurred for the signal of 13.40 Gbps.
  • an insertion loss of ⁇ 1 dB occurs for a 30.60 Gbps signal, and a ⁇ 10 dB return loss occurs for a 30.24 Gbps signal. . That is, by configuring the probe pin 10 such that the central angle ⁇ 1 of the first curved portions 41 and 42 is larger than 90 degrees and smaller than 180 degrees, it is possible to reduce the loss of signals in the high frequency region.
  • the elastic portion 11 is composed of a plurality of elastic strips arranged with a gap 23 therebetween, and the widths W1 and W2 of the elastic strips 21 and 22 are adjacent to each other. It is configured to be smaller than the shortest distance W3 between the elastic strips 21 and 22.
  • inspection contact with the inspection object and the inspection apparatus is high by the probe pin 10, and inspection and repair with a small loss of signals in the high frequency region when connected to the inspection object and the inspection apparatus.
  • Tool 2 can be realized.
  • the inspection jig 2 has high contact reliability to the inspection object and the inspection apparatus, and the inspection unit has a small loss of signals in the high frequency region when connected to the inspection object and the inspection apparatus. 2 can be realized.
  • the inspection unit 1 can constitute a part of the inspection apparatus. According to such an inspection apparatus, the inspection unit 1 realizes an inspection apparatus having high contact reliability with respect to the inspection object and the inspection apparatus and little loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. it can.
  • the elastic portion 11 has first linear portions 31, 32, first curved portions 41, 42 and second linear portions 51, 52, and the central angle of the first curved portions 41, 42 is larger than 90 degrees and 180 degrees. It should just be comprised so that it may become smaller.
  • the elastic portion 11 may be configured by only the first straight portions 31 and 32, the first bending portions 41 and 42, and the second straight portions 51 and 52.
  • the elastic portion 11 is not limited to the case where it has the two strip-like elastic pieces 21 and 22 disposed with the gap 23 therebetween.
  • the elastic portion 11 may have four elastic strips 21, 22, 24, 25 spaced apart from one another, although not shown in the figure. It may have one elastic band.
  • the widths W1 and W2 of the elastic strips 21 and 22 are not limited to the case where the widths W1 and W2 of the elastic strips 21 and 22 are smaller than the shortest distance W3 between the adjacent elastic strips 21 and 22.
  • first contact portion 12 and the second contact portion 13 can be appropriately changed according to the design and the like of the probe pin 10.
  • the second contact portion 13 may be provided on each of the tips of the pair of legs 133 and 134 extending along the longitudinal direction of the probe pin 10. That is, each of the first contact portion 121 and the second contact portion 131 can be appropriately changed in shape, position, and the like according to various aspects of the inspection apparatus or the inspection object.
  • the configurations of the inspection jig 2 and the base housing 4 can be appropriately changed according to various aspects of the inspection apparatus or the inspection object. That is, the inspection jig 2 and the base housing 4 can be generalized, and the productivity of the inspection unit 1 (and thus the inspection apparatus) can be improved.
  • the probe pin 10 of the first aspect of the present disclosure is An elastic portion 11 extending and contracting along the longitudinal direction; A plate-like first contact portion 12 connected to the first end portion 111 in the longitudinal direction of the elastic portion 11; And a plate-like second contact portion 13 disposed in series with the first contact portion 12 and connected to the second end 112 in the longitudinal direction of the elastic portion 11;
  • the elastic portion 11 is The first straight portion 31 extends in a direction intersecting the longitudinal direction, and one end portion in the extending direction is connected to the first contact portion; While extending in the shape of an arc projecting in the direction crossing the longitudinal direction and in the direction away from the first contact portion 12, one end portion in the extending direction is the other extending direction of the first straight portion 31
  • the second linear portion 51 extends in a direction intersecting the longitudinal direction, and has one end in the extending direction connected to the other end in the extending direction of the curved portion 41,
  • the central angle ⁇ 1 of the curved portion 41 is configured
  • the probe pin 10 of the first aspect since a distance can be provided between the first linear portion 31 and the second linear portion 51 in the longitudinal direction of the probe pin 10, for example, it flows in the first linear portion 31 Interference with the signal of the high frequency area flowing through the second straight portion 51 of the signal of the high frequency area can be reduced. As a result, it is possible to realize the probe pin 10 capable of reducing the loss of the signal in the high frequency region while securing the contact reliability to the inspection object and the inspection apparatus.
  • the probe pin 10 of the second aspect of the present disclosure is The elastic portion 11 is composed of a plurality of elastic strips 21 and 22 disposed with a gap 23 therebetween, The widths W1 and W2 of the plurality of elastic strips 21 and 22 are smaller than the shortest distance W3 between the adjacent elastic strips 21 and 22.
  • each of the strip elastic pieces 21 and 22 is a probe pin 10 when each of the first contact portion 121 and the second contact portion 131 is in contact with the inspection object and the inspection device. Even when compressed in the longitudinal direction, contact between the elastic strips 21 and 22 can be prevented, and a probe pin 10 capable of ensuring high contact reliability can be realized.
  • the inspection jig 2 of the third aspect of the present disclosure is The probe pin 10; And a socket 3 having a receptacle 7 capable of receiving the probe pin 10;
  • the probe pin 10 is housed in the housing portion 7 so that the central angle of the curved portion 41 is larger than 90 degrees and smaller than 180 degrees.
  • the inspection jig 2 of the third aspect inspection with high contact reliability to the inspection object and the inspection apparatus by the probe pin 10 and little loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus
  • the jig 2 can be realized.
  • the inspection unit 1 of the fourth aspect of the present disclosure is At least one inspection jig was provided.
  • the inspection jig 2 has high contact reliability with respect to the inspection object and the inspection apparatus, and inspection with a small loss of signals in the high frequency region when connected to the inspection object and the inspection apparatus Unit 2 can be realized.
  • the inspection apparatus of the fifth aspect of the present disclosure is At least one inspection unit 1 was provided.
  • the inspection device has high contact reliability with respect to the inspection object and the inspection device, and a small loss of signal in the high frequency region when connected to the inspection object and the inspection device realizable.
  • the probe pin of the present disclosure can be applied to, for example, an inspection jig used for inspection of a liquid crystal panel.
  • the inspection jig of the present disclosure can be applied to, for example, an inspection unit used for inspection of a liquid crystal panel.
  • the inspection unit of the present disclosure can be applied to, for example, an inspection device of a liquid crystal panel.
  • the inspection apparatus of the present disclosure can be used, for example, for inspection of a liquid crystal panel.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Abstract

A probe pin according to the present invention is provided with an elastic section, a first contact section, and a second contact section. The elastic section includes: a first linear section having one end section in the extending direction thereof connected to the first contact section; a curved section having one end section in the extending direction thereof connected to the other end section of the first linear section in the extending direction of the first linear section; and a second linear section having one end section in the extending direction thereof connected to the other end section of the curved section in the extending direction of the curved section. The elastic section is configured such that the center angle of the curved section is greater than 90 degrees and less than 180 degrees.

Description

プローブピン、検査治具、検査ユニットおよび検査装置Probe pin, inspection jig, inspection unit and inspection device
　本開示は、プローブピン、このプローブピンを備えた検査治具、この検査治具を備えた検査ユニット、および、この検査ユニットを備えた検査装置に関する。 The present disclosure relates to a probe pin, an inspection jig provided with the probe pin, an inspection unit provided with the inspection jig, and an inspection apparatus provided with the inspection unit.
　カメラあるいは液晶パネル等の電子部品モジュールでは、一般に、その製造工程において、導通検査および動作特性検査等が行われる。これらの検査は、プローブピンを用いて、電子部品モジュールに設置されている本体基板と接続するためのＦＰＣ接触電極、あるいは、実装された基板対基板コネクタ等の電極部と検査装置とを接続することにより行われる。 Generally, in an electronic component module such as a camera or a liquid crystal panel, a continuity test, an operation characteristic test, and the like are performed in the manufacturing process. In these inspections, an inspection device is connected to an electrode part such as an FPC contact electrode for connection with a main substrate installed in the electronic component module or a mounted substrate-to-substrate connector using probe pins. It is done by.
　このようなプローブピンとしては、例えば、特許文献１に記載されたものがある。このプローブピンは、電子部品の電極端子および被接続電子部品の電極端子に対してそれぞれ接触可能な一対のコンタクトと、一対のコンタクト間に介在して一対のコンタクトを接続する蛇行部とを備えている。前記プローブピンでは、蛇行部により、各コンタクトと電子部品の電極端子および被接続電子部品の電極端子との間の接圧を確保して、電子部品の電極端子および被接続電子部品の電極端子に対する接触信頼性を高めている。 As such a probe pin, there is, for example, one described in Patent Document 1. The probe pin includes a pair of contacts that can contact the electrode terminal of the electronic component and the electrode terminal of the connected electronic component, and a serpentine portion interposed between the pair of contacts and connecting the pair of contacts There is. In the probe pin, the contact pressure between each contact and the electrode terminal of the electronic component and the electrode terminal of the connected electronic component is secured by the meandering portion, and the electrode terminal of the electronic component and the electrode terminal of the connected electronic component are secured. Improve contact reliability.
特開２００２－１３４２０２号公報JP 2002-134202 A
　近年、電子部品モジュール間で送受信される情報量の増大などに伴って、電子部品モジュールの検査に用いるプローブピンにも高周波領域の信号に対応することが要請されている。 In recent years, with an increase in the amount of information transmitted and received between electronic component modules, etc., probe pins used for inspection of electronic component modules are also required to be compatible with signals in a high frequency region.
　しかし、特許文献１のプローブピンでは、高周波領域の信号に必ずしも十分に対応できているとはいえず、電子部品モジュールの検査時にプローブピンを流れる高周波領域の信号の損失が大きくなる場合があった。 However, in the probe pin of Patent Document 1, the signal in the high frequency region can not necessarily be sufficiently coped with, and the loss of the signal in the high frequency region flowing through the probe pin may become large when the electronic component module is inspected. .
　本開示は、検査対象物および検査装置に対する接触信頼性を確保しつつ、高周波領域の信号の損失を低減できるプローブピン、このプローブピンを備えた検査治具、この検査治具を備えた検査ユニット、および、この検査ユニットを備えた検査装置を提供することを目的とする。 The present disclosure relates to a probe pin capable of reducing loss of a signal in a high frequency region while securing contact reliability to an inspection object and an inspection apparatus, an inspection jig including the probe pin, and an inspection unit including the inspection jig An object of the present invention is to provide an inspection apparatus provided with the inspection unit.
　本開示の一例のプローブピンは、
　長手方向に沿って伸縮する弾性部と、
　前記弾性部の前記長手方向の第１端部に接続された板状の第１接触部と、
　前記第１接触部に対して直列的に配置され、前記弾性部の前記長手方向の第２端部に接続された板状の第２接触部と
を備え、
　前記弾性部が、
　前記長手方向に交差する方向に延びると共に、その延在方向の一端部が前記第１接触部に接続された第１直線部と、
　前記長手方向に交差する方向でかつ前記第１接触部から離れる方向に突出した円弧状に延びていると共に、その延在方向の一端部が前記第１直線部のその延在方向の他端部に接続された湾曲部と、
　前記長手方向に交差する方向に延びると共に、その延在方向の一端部が前記湾曲部のその延在方向の他端部に接続された第２直線部と
を有し、
　前記湾曲部の中心角が、９０度よりも大きく１８０度よりも小さくなるように構成されている。 An example probe pin of the present disclosure is
An elastic portion that expands and contracts along the longitudinal direction,
A plate-like first contact portion connected to the first end of the elastic portion in the longitudinal direction;
A plate-like second contact portion disposed in series with the first contact portion and connected to the second end of the elastic portion in the longitudinal direction;
The elastic portion is
A first straight portion extending in a direction intersecting the longitudinal direction and having one end in the extending direction connected to the first contact portion;
It extends in an arc shape projecting in the direction intersecting the longitudinal direction and away from the first contact portion, and one end in the extending direction is the other end in the extending direction of the first straight portion A curved portion connected to the
It extends in a direction intersecting the longitudinal direction, and has a second straight portion whose one end in the extending direction is connected to the other end of the curved portion in the extending direction,
The central angle of the curved portion is configured to be larger than 90 degrees and smaller than 180 degrees.
　また、本開示の一例の検査治具は、
　前記プローブピンと、
　前記プローブピンを収容可能な収容部を有するハウジングと
を備え、
前記プローブピンが、前記湾曲部の中心角が、９０度よりも大きく１８０度よりも小さくなるように、前記収容部に収容されている。 In addition, an inspection jig of an example of the present disclosure is
The probe pin,
And a housing having a receptacle capable of receiving the probe pin.
The probe pin is housed in the housing portion such that the central angle of the curved portion is larger than 90 degrees and smaller than 180 degrees.
　また、本開示の一例の検査ユニットは、
　前記検査治具を少なくとも１つ備えた。 In addition, an inspection unit of an example of the present disclosure is
At least one inspection jig was provided.
　また、本開示の一例の検査装置は、
　前記検査ユニットを少なくとも１つ備えた。 In addition, an inspection apparatus according to an example of the present disclosure is:
At least one inspection unit was provided.
　前記プローブピンによれば、弾性部が、プローブピンの長手方向に交差する方向に延びて延在方向の一端部が第１接触部に接続された第１直線部と、プローブピンの長手方向に交差する方向でかつ第１接触部から離れる方向に突出した円弧状に延びて延在方向の一端部が第１直線部のその延在方向の他端部に接続された湾曲部と、プローブピンの長手方向に交差する方向に延びて延在方向の一端部が湾曲部のその延在方向の他端部に接続された第２直線部とを有し、湾曲部の中心角が、９０度よりも大きく１８０度よりも小さくなるように構成されている。これにより、プローブピンの長手方向における第１直線部と第２直線部との間に距離を設けることができるので、例えば、第１直線部を流れる高周波領域の信号の第２直線部を流れる高周波領域の信号に対する干渉を低減できる。その結果、検査対象物および検査装置に対する接触信頼性を確保しつつ、高周波領域の信号の損失を低減できるプローブピンを実現できる。 According to the probe pin, the elastic portion extends in the direction crossing the longitudinal direction of the probe pin, and the first straight portion whose one end in the extending direction is connected to the first contact portion, and the longitudinal direction of the probe pin A curved portion extending in an arc shape protruding in a crossing direction and in a direction away from the first contact portion, one end of the extending direction being connected to the other end of the first straight portion in the extending direction; And a second straight portion whose one end in the extending direction is connected to the other end of the bending portion in the extending direction, the central angle of the bending portion being 90 degrees It is configured to be larger than 180 degrees smaller. Thereby, since a distance can be provided between the first linear portion and the second linear portion in the longitudinal direction of the probe pin, for example, the high frequency flowing in the second linear portion of the signal in the high frequency region flowing in the first linear portion Interference with signals in the area can be reduced. As a result, it is possible to realize a probe pin that can reduce signal loss in a high frequency region while securing contact reliability with respect to an inspection object and an inspection device.
　また、前記検査治具によれば、前記プローブピンにより、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査治具を実現できる。 In addition, according to the inspection jig, the probe pin has high contact reliability to the inspection object and the inspection apparatus, and the inspection jig has a small loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. Can be realized.
　また、前記検査ユニットによれば、前記検査治具により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査ユニットを実現できる。 Further, according to the inspection unit, the inspection jig has high contact reliability with respect to the inspection object and the inspection apparatus, and an inspection unit with little loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. realizable.
　また、前記検査装置によれば、前記検査ユニットにより、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査装置を実現できる。 Further, according to the inspection apparatus, the inspection unit realizes an inspection apparatus having high contact reliability to the inspection object and the inspection apparatus, and having a small loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. it can.
本開示の一実施形態の検査ユニットを示す断面斜視図。1 is a cross-sectional perspective view showing an inspection unit of an embodiment of the present disclosure. 図１のII-II線に沿った断面図。Sectional drawing along the II-II line of FIG. 本開示の一実施形態のプローブピンを示す斜視図。1 is a perspective view of a probe pin according to an embodiment of the present disclosure. 図３のプローブピンの平面図。FIG. 4 is a plan view of the probe pin of FIG. 3; 図３のプローブピンの弾性部の拡大平面図。FIG. 4 is an enlarged plan view of an elastic portion of the probe pin of FIG. 3; 比較例のプローブピンを用いたインサーションロスおよびリターンロスの測定結果を示す図。The figure which shows the measurement result of the insertion loss and return loss which used the probe pin of a comparative example. 実施例のプローブピンのプローブピンを用いたインサーションロスおよびリターンロスの測定結果を示す図。The figure which shows the measurement result of the insertion loss and return loss which used the probe pin of the probe pin of an Example. 図３のプローブピンの第１の変形例を示す弾性部の拡大平面図。FIG. 7 is an enlarged plan view of an elastic portion showing a first modified example of the probe pin of FIG. 3; 図３のプローブピンの第２の変形例を示す平面図。FIG. 14 is a plan view showing a second modification of the probe pin of FIG. 3;
　以下、本開示の一例を添付図面に従って説明する。なお、以下の説明では、必要に応じて特定の方向あるいは位置を示す用語（例えば、「上」、「下」、「右」、「左」を含む用語）を用いるが、それらの用語の使用は図面を参照した本開示の理解を容易にするためであって、それらの用語の意味によって本開示の技術的範囲が限定されるものではない。また、以下の説明は、本質的に例示に過ぎず、本開示、その適用物、あるいは、その用途を制限することを意図するものではない。さらに、図面は模式的なものであり、各寸法の比率等は現実のものとは必ずしも合致していない。 Hereinafter, an example of the present disclosure will be described according to the attached drawings. In the following description, terms that indicate specific directions or positions (for example, terms including “upper”, “lower”, “right”, and “left”) are used when necessary, but use of those terms Is to facilitate the understanding of the present disclosure with reference to the drawings, and the technical scope of the present disclosure is not limited by the meaning of those terms. In addition, the following description is merely exemplary in nature and is not intended to limit the present disclosure, its application, or its application. Further, the drawings are schematic, and the proportions of the respective dimensions do not necessarily match the actual ones.
　本開示の一実施形態のプローブピン１０は、導電性を有し、例えば、図１および図２に示すように、ソケット３に収容された状態で使用され、ソケット３と共に検査治具２を構成する。この検査治具２には、一例として、複数の細長い薄板状のプローブピン１０が収容されている。 The probe pin 10 according to an embodiment of the present disclosure has conductivity, and is used in a state of being accommodated in the socket 3 as shown in FIGS. 1 and 2, for example, and constitutes the inspection jig 2 together with the socket 3 Do. The inspection jig 2 accommodates, for example, a plurality of thin thin plate-like probe pins 10.
　また、検査治具２は、検査ユニット１の一部を構成している。検査ユニット１は、図１に示すように、一例として、複数の検査治具２が組み込まれた略直方体状のベースハウジング４を備えている。このベースハウジング４は、略矩形板状の第１ハウジング５と、この第１ハウジング５の板厚方向に積み重ねられた第２ハウジング６とで構成されている。 Further, the inspection jig 2 constitutes a part of the inspection unit 1. As shown in FIG. 1, the inspection unit 1 includes, as an example, a substantially rectangular base housing 4 in which a plurality of inspection jigs 2 are incorporated. The base housing 4 is composed of a substantially rectangular plate-shaped first housing 5 and a second housing 6 stacked in the thickness direction of the first housing 5.
　ソケット３は、図２に示すように、各プローブピン１０を収容可能な複数の収容部７を有し、第１ハウジング５および第２ハウジング６で保持されている。各収容部７は、ソケット３とベースハウジング４の第２ハウジング６とで取り囲まれており、後述する第１接点部１２１および第２接点部１３１がソケット３およびベースハウジング４の外部にそれぞれ露出した状態で、各プローブピン１０を収容可能に構成されている。 As shown in FIG. 2, the socket 3 has a plurality of accommodating portions 7 capable of accommodating the respective probe pins 10 and is held by the first housing 5 and the second housing 6. Each housing portion 7 is surrounded by the socket 3 and the second housing 6 of the base housing 4, and a first contact portion 121 and a second contact portion 131 described later are exposed to the outside of the socket 3 and the base housing 4, respectively. In the state, each probe pin 10 can be accommodated.
　なお、図２に示すように、第１接点部１２１は、一例として、検査装置の基板（例えば、ＰＣＢパッド）１００に設けられた端子に接触可能に構成されている。また、第２接点部１３１は、一例として、検査対象物（例えば、基板対基板（ＢｔｏＢ）コネクタ）１１０の端子１２０に接触可能に構成されている。 In addition, as shown in FIG. 2, the 1st contact part 121 is comprised, for example so that contact with the terminal provided in the board | substrate (for example, PCB pad) 100 of a test | inspection apparatus is possible. Further, as an example, the second contact portion 131 is configured to be capable of coming into contact with the terminal 120 of the inspection object (for example, a substrate-to-substrate (BtoB) connector) 110.
　各プローブピン１０は、図３に示すように、その長手方向（すなわち、図３の上下方向）に沿って伸縮する弾性部１１と、弾性部１１の長手方向の第１端部１１１に接続された板状の第１接触部１２と、弾性部１１の長手方向の第２端部１１２に接続された板状の第２接触部１３とを備えている。このプローブピン１０では、例えば、電鋳法で形成され、弾性部１１、第１接触部１２および第２接触部１３が一体に構成されている。 As shown in FIG. 3, each probe pin 10 is connected to an elastic portion 11 which expands and contracts along its longitudinal direction (that is, the vertical direction in FIG. 3) and a first end 111 of the elastic portion 11 in the longitudinal direction. A plate-like first contact portion 12 and a plate-like second contact portion 13 connected to the second end 112 in the longitudinal direction of the elastic portion 11 are provided. The probe pin 10 is formed, for example, by an electroforming method, and the elastic portion 11, the first contact portion 12, and the second contact portion 13 are integrally configured.
　弾性部１１は、図４に示すように、第１接触部１２の板厚方向（すなわち、図４の紙面貫通方向）から見て、蛇行形状を有し、相互に隙間２３を空けて配置された複数の帯状弾性片（この実施形態では、２つの帯状弾性片）２１、２２を有している。各帯状弾性片２１、２２は、細長い帯状を有し、プローブピン１０の長手方向における一端部である第１端部２１１が第１接触部１２に接続され、プローブピン１０の長手方向における他端部である第２端部２１２が第２接触部１３に接続されている。 As shown in FIG. 4, the elastic portion 11 has a serpentine shape as viewed in the thickness direction of the first contact portion 12 (i.e., the paper surface penetrating direction in FIG. 4), and is arranged with a gap 23 therebetween. A plurality of elastic strips (in this embodiment, two elastic strips) 21 and 22 are provided. Each of the elastic strips 21 and 22 has an elongated strip shape, and the first end 211 which is one end in the longitudinal direction of the probe pin 10 is connected to the first contact portion 12, and the other end in the longitudinal direction of the probe pin 10 The second end 212, which is a portion, is connected to the second contact portion 13.
　詳しくは、図５に示すように、各帯状弾性片２１、２２は、４つの帯状の直線部（すなわち、第１直線部３１、３２と、第２直線部５１、５２と、第３直線部７１、７２と、第４直線部９１、９２）と、３つの帯状の湾曲部（すなわち、第１湾曲部４１、４２と、第２湾曲部６１、６２と、第３湾曲部８１、８２）とを有している。 More specifically, as shown in FIG. 5, each of the elastic strips 21 and 22 has four linear portions (ie, first linear portions 31 and 32, second linear portions 51 and 52, and third linear portions). 71, 72, fourth straight portion 91, 92), and three belt-like curved portions (that is, first curved portions 41, 42, second curved portions 61, 62, third curved portions 81, 82) And.
　第１直線部３１、３２は、プローブピン１０の長手方向に交差する方向（例えば、直交方向）に延びていると共に、その延在方向の一端部が第１接触部１２に接続されて、第１端部２１１、２２１を構成している。なお、第１直線部３１、３２は、プローブピン１０の長手方向に交差する方向（例えば、直交する方向）から第１接触部１２に接続されている。 The first straight portions 31, 32 extend in a direction (for example, an orthogonal direction) intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is connected to the first contact portion 12, One end portion 211, 221 is configured. The first straight portions 31 and 32 are connected to the first contact portion 12 from a direction (for example, a direction orthogonal to the longitudinal direction) intersecting with the longitudinal direction of the probe pin 10.
　第１湾曲部４１、４２は、プローブピン１０の長手方向に交差する方向でかつ第１接触部１２から離れる方向に突出し、かつ、９０度よりも大きく１８０度よりも小さい中心角θ１に対する円弧に沿って延びている。また、第１湾曲部４１、４２は、その延在方向の一端部が第１直線部３１、３２のその延在方向の他端部に接続されている。 The first curved portions 41, 42 project in a direction intersecting the longitudinal direction of the probe pin 10 and in a direction away from the first contact portion 12, and in an arc with respect to a central angle θ1 larger than 90 degrees and smaller than 180 degrees. It extends along. Further, one end of the first curved portion 41, 42 in the extending direction is connected to the other end of the first straight portion 31, 32 in the extending direction.
　第２直線部５１、５２は、プローブピン１０の長手方向に交差する方向に延びていると共に、その延在方向の一端部が第１湾曲部４１、４２のその延在方向の他端部に接続されている。この第２直線部５１、５２は、その延在方向の一端部から他端部に向かうにつれて（すなわち、第１湾曲部４１、４２から離れるにつれて）、プローブピン１０の長手方向において、第１直線部３１、３２から離れる方向に延びている。 The second straight portions 51, 52 extend in a direction intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is the other end of the first bending portion 41, 42 in the extending direction. It is connected. The second straight portions 51, 52 have a first straight line in the longitudinal direction of the probe pin 10 as they move from one end to the other end in the extending direction (that is, as they move away from the first curved portions 41, 42). It extends away from the sections 31, 32.
　第２湾曲部６１、６２は、プローブピン１０の長手方向に交差する方向でかつ第１接触部１２に接近する方向に突出し、かつ、９０度よりも大きく１８０度よりも小さい中心角θ２に対する円弧に沿って延びている。また、第２湾曲部６１、６２は、その延在方向の一端部が第２直線部５１、５２のその延在方向の他端部に接続されている。 The second curved portions 61, 62 protrude in the direction intersecting the longitudinal direction of the probe pin 10 and in the direction approaching the first contact portion 12, and are arcs with respect to the central angle θ2 larger than 90 degrees and smaller than 180 degrees. It extends along the Further, one end of the second curved portion 61, 62 in the extending direction is connected to the other end of the second straight portion 51, 52 in the extending direction.
　第３直線部７１、７２は、プローブピン１０の長手方向に交差する方向に延びていると共に、その延在方向の一端部が第２湾曲部６１、６２のその延在方向の他端部に接続されている。この第３直線部７１、７２は、その延在方向の一端部から他端部に向かうにつれて（すなわち、第２湾曲部６１、６２から離れるにつれて）、プローブピン１０の長手方向において、第２直線部５１、５２から離れる方向に延びている。 The third straight portions 71, 72 extend in a direction intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is the other end of the second curved portion 61, 62 in the extending direction. It is connected. The third straight portions 71 and 72 extend in the longitudinal direction of the probe pin 10 from the one end to the other end in the extending direction (that is, as they are separated from the second curved portions 61 and 62). It extends away from the parts 51, 52.
　第３湾曲部８１、８２は、プローブピン１０の長手方向に交差する方向でかつ第１接触部１２から離れる方向に突出し、かつ、９０度よりも大きく１８０度よりも小さい中心角θ３に対する円弧に沿って延びている。また、第３湾曲部８１、８２は、その延在方向の一端部が第３直線部７１、７２のその延在方向の他端部に接続されている。 The third curved portions 81, 82 project in a direction intersecting the longitudinal direction of the probe pin 10 and in a direction away from the first contact portion 12, and in an arc with respect to a central angle θ3 larger than 90 degrees and smaller than 180 degrees. It extends along. Further, one end of the third curved portion 81, 82 in the extending direction is connected to the other end of the third linear portion 71, 72 in the extending direction.
　第４直線部９１、９２は、プローブピン１０の長手方向に交差する方向（例えば、直交方向）に延びていると共に、その延在方向の一端部が第３湾曲部８１、８２のその延在方向の他端部に接続されている。この第４直線部９１、９２は、その延在方向の一端部から他端部に向かうにつれて（すなわち、第３湾曲部８１、８２から離れるにつれて）、プローブピン１０の長手方向において、第３直線部７１、７２から離れる方向に延びている。また、第４直線部９１、９２は、その延在方向の他端部が第２接触部１３に接続されて、第２端部２１２、２２２を構成している。なお、第４直線部９１、９２は、プローブピン１０の長手方向から第２接触部１３に接続されている。 The fourth straight portions 91, 92 extend in a direction (for example, an orthogonal direction) intersecting the longitudinal direction of the probe pin 10, and one end in the extending direction is the extension of the third curved portion 81, 82 It is connected to the other end of the direction. The fourth straight portion 91, 92 has a third straight line in the longitudinal direction of the probe pin 10 as it goes from one end to the other end in the extending direction (that is, as it moves away from the third curved portion 81, 82). It extends away from the parts 71, 72. In addition, the other ends of the fourth straight portions 91 and 92 in the extending direction are connected to the second contact portion 13 to configure the second ends 212 and 222. The fourth straight portions 91 and 92 are connected to the second contact portion 13 in the longitudinal direction of the probe pin 10.
　前記プローブピン１０では、第１直線部３１、３２および第４直線部９１、９２は、第２湾曲部６１、６２の曲率中心を通りかつプローブピン１０の長手方向に直交する方向に延びる直線Ｌ１に対して対称に配置されている。また、第２直線部５１、５２および第３直線部７１、７２は、直線Ｌ１に対して対称に配置され、第１湾曲部４１、４２および第３湾曲部８１、８２は、直線Ｌ１に対して対称に配置されている。 In the probe pin 10, the first straight portions 31, 32 and the fourth straight portions 91, 92 pass straight through the center of curvature of the second curved portions 61, 62 and extend in a direction orthogonal to the longitudinal direction of the probe pin 10. Are arranged symmetrically with respect to In addition, the second straight portions 51 and 52 and the third straight portions 71 and 72 are disposed symmetrically with respect to the straight line L1, and the first curved portions 41 and 42 and the third curved portions 81 and 82 with respect to the straight line L1. Are arranged symmetrically.
　また、各帯状弾性片２１、２２の幅（すなわち、各帯状弾性片２１、２２の第１端部２１１、２２１および第２端部２１２、２２２間の経路の延在方向に直交する幅方向の長さ）Ｗ１、Ｗ２が、隣接する帯状弾性片２１、２２間の最短距離Ｗ３よりも小さくなるように構成されている。なお、図５には、一例として、第１湾曲部４１、４２間の直線距離を最短距離Ｗ５として示している。 In addition, the width of each of the elastic strips 21 and 22 (that is, in the width direction orthogonal to the extending direction of the path between the first end 211 and 221 and the second end 212 and 222 of each elastic strip 21 or 22 The lengths W1 and W2 are configured to be smaller than the shortest distance W3 between the adjacent elastic strips 21 and 22. In FIG. 5, as an example, the linear distance between the first bending portions 41 and 42 is shown as the shortest distance W5.
　第１接触部１２は、図４に示すように、プローブピン１０の長手方向に沿って延び、その延在方向の一端部が弾性部１１の第１端部１１１に接続されている。第１接触部１２の延在方向の他端部には、第１接点部１２１が設けられている。また、第２接触部１３は、図４に示すように、プローブピン１０の長手方向に沿って延び、その延在方向の一端部が弾性部１１の第２端部１１２に接続されている。第２接触部１３の延在方向の他端部には、第２接点部１３１が設けられている。 As shown in FIG. 4, the first contact portion 12 extends along the longitudinal direction of the probe pin 10, and one end portion in the extending direction is connected to the first end portion 111 of the elastic portion 11. A first contact portion 121 is provided at the other end of the first contact portion 12 in the extending direction. Further, as shown in FIG. 4, the second contact portion 13 extends along the longitudinal direction of the probe pin 10, and one end portion in the extending direction is connected to the second end portion 112 of the elastic portion 11. A second contact portion 131 is provided at the other end of the second contact portion 13 in the extending direction.
　第１接触部１２および第２接触部１３の各々は、プローブピン１０の長手方向沿いに延びる仮想直線Ｌ２に沿って直列的に配置されている。すなわち、図５に示すように、弾性部１１の各直線部３１、３２、５１、５２、７１、７２、９１、９２と、第１湾曲部４１、４２および第３湾曲部８１、８２は、仮想直線Ｌ２に対して同じ側（すなわち、第１接触部１２の幅方向の一方側）に配置され、第２湾曲部６１、６２は、第１接触部１２および第２接触部１３の間でかつ仮想直線Ｌ２に沿って直列的に配置されている。 Each of the first contact portion 12 and the second contact portion 13 is arranged in series along an imaginary straight line L <b> 2 extending along the longitudinal direction of the probe pin 10. That is, as shown in FIG. 5, each of the straight portions 31, 32, 51, 52, 71, 72, 91, 92 of the elastic portion 11, the first curved portions 41, 42 and the third curved portions 81, 82 The second curved portions 61 and 62 are disposed between the first contact portion 12 and the second contact portion 13 and are disposed on the same side with respect to the virtual straight line L2 (that is, one side in the width direction of the first contact portion 12). And it arrange | positions in series along the virtual straight line L2.
　図４に示すように、第１接触部１２のその延在方向の中間部における幅方向の一方側には、支持部１２２が設けられている。支持部１２２は、第１接触部１２の板厚方向から見て、第１接触部１から、プローブピン１０の長手方向に交差する方向（例えば、直交方向）でかつ仮想直線Ｌ３に対する第１直線部３１、３２側に向かって突出している。 As shown in FIG. 4, a support portion 122 is provided on one side in the width direction of the middle portion in the extending direction of the first contact portion 12. The supporting portion 122 is a first straight line with respect to the virtual straight line L3 in a direction (for example, an orthogonal direction) intersecting the longitudinal direction of the probe pin 10 from the first contact portion 1 when viewed from the thickness direction of the first contact portion 12 It protrudes toward the parts 31 and 32 side.
　図２に示すように、ソケット３の収容部７にプローブピン１０を収容したとき、第１接触部１２の支持部１２２は、プローブピン１０の長手方向における第１接点部１２１側の面が、収容部７を構成する第２ハウジング６の第１ハウジング５に対向する面に当接するように構成されている。また、プローブピン１０は、その長手方向における第２接点部１３１側の面が収容部７を構成するソケット３の第２ハウジング６に対向する面に、帯状弾性片２１の第４直線部９１が当接するように構成されている。すなわち、第１接触部１２の支持部１２２および帯状弾性片２１の第４直線部９１により、プローブピン１０が収容部７の内部で支持されるように構成されている。 As shown in FIG. 2, when the probe pin 10 is housed in the housing portion 7 of the socket 3, the support portion 122 of the first contact portion 12 has a surface on the first contact portion 121 side in the longitudinal direction of the probe pin 10 The housing 7 is configured to be in contact with the surface facing the first housing 5 of the second housing 6 that constitutes the housing 7. Further, in the probe pin 10, the fourth linear portion 91 of the strip-like elastic piece 21 is on the surface of the socket 3 constituting the housing portion 7 facing the second housing 6 in the surface on the second contact portion 131 side in the longitudinal direction. It is comprised so that it may contact | abut. That is, the probe pin 10 is configured to be supported inside the accommodation portion 7 by the support portion 122 of the first contact portion 12 and the fourth linear portion 91 of the elastic strip 21.
　ソケット３の収容部７に収容された状態においても、各湾曲部４１、４２、６１、６２、８１、８２の中心角θ１、θ２、θ３は、９０度よりも大きく１８０度よりも小さくなるように構成されている。 Even in the state of being housed in the housing portion 7 of the socket 3, the central angles θ 1, θ 2, θ 3 of the respective curved portions 41, 42, 61, 62, 81, 82 are larger than 90 degrees and smaller than 180 degrees Is configured.
　なお、第１接触部１２の支持部１２２を省略して、帯状弾性片２１の第１直線部３１が、第２ハウジング６の第１ハウジング５に対向する面に当接するように構成してもよい。すなわち、帯状弾性片２１の第１直線部３１および第４直線部９１により、プローブピン１０が収容部７の内部で支持されるように構成してもよい。 In addition, even if the support portion 122 of the first contact portion 12 is omitted, the first linear portion 31 of the elastic strip 21 may be configured to abut on the surface of the second housing 6 facing the first housing 5. Good. That is, the probe pin 10 may be supported by the first linear portion 31 and the fourth linear portion 91 of the strip-like elastic piece 21 inside the accommodation portion 7.
　また、図４に示すように、第２接触部１３のプローブピン１０の長手方向における弾性部１１側の端部には、第２接触部１３を板厚方向に貫通する貫通孔部１３２が設けられている。この貫通孔部１３２は、プローブピン１０の長手方向に延びて、帯状弾性片２１、２２の間の隙間２３に接続されている。この貫通孔部１３２により、第２接触部１３に発生する応力を分散させている。 Further, as shown in FIG. 4, at the end of the second contact portion 13 on the side of the elastic portion 11 in the longitudinal direction of the probe pin 10, a through hole 132 penetrating the second contact portion 13 in the thickness direction is provided. It is done. The through holes 132 extend in the longitudinal direction of the probe pin 10 and are connected to the gaps 23 between the elastic strips 21 and 22. The through holes 132 disperse the stress generated in the second contact portion 13.
　ところで、第１湾曲部４１、４２の中心角θ１が、９０度以下であった場合、第１接触部１２および第２接触部１３を直列的に配置することができず、また、検査対象物および検査装置に対する接触信頼性を確保できる弾性力を備えた弾性部１１を得ることが困難になる。 By the way, when central angle (theta) 1 of the 1st curved part 41 and 42 is 90 degrees or less, the 1st contact part 12 and the 2nd contact part 13 can not be arranged in series, and also inspection object thing And it becomes difficult to obtain the elastic part 11 provided with the elastic force which can ensure the contact reliability with respect to an inspection apparatus.
　また、第１湾曲部４１、４２の中心角θ１が、１８０度以上であった場合、第１直線部３１、３２と第２直線部５１、５２との間に十分な距離を設けることができないため、例えば、第１直線部３１、３２を流れる高周波領域の信号が、第２直線部５１、５２を流れる高周波領域の信号に対して干渉し、高周波領域の信号の損失を低減するのが困難になる。 Moreover, when central angle (theta) 1 of the 1st curved part 41, 42 is 180 degrees or more, sufficient distance can not be provided between the 1st linear parts 31 and 32 and the 2nd linear parts 51 and 52. Therefore, for example, the signal in the high frequency area flowing through the first straight portions 31, 32 interferes with the signal in the high frequency area flowing through the second straight portions 51, 52, making it difficult to reduce the loss of signals in the high frequency area. become.
　これに対して、前記プローブピン１０では、弾性部１１が、プローブピン１０の長手方向に交差する方向に延びて延在方向の一端部１１１が第１接触部１２に接続された第１直線部３１、３２と、プローブピン１０の長手方向に交差する方向でかつ第１接触部１２から離れる方向に突出した円弧状に延びて延在方向の一端部が第１直線部３１、３２のその延在方向の他端部に接続された第１湾曲部４１、４２と、プローブピン１０の長手方向に交差する方向に延びて延在方向の一端部が第１湾曲部４１、４２のその延在方向の他端部に接続された第２直線部５１、５２とを有し、第１湾曲部４１、４２の中心角θ１が、９０度よりも大きく１８０度よりも小さくなるように構成されている。これにより、プローブピン１０の長手方向における第１直線部３１、３２と第２直線部５１、５２との間に距離を設けることができるので、例えば、第１直線部３１、３２を流れる高周波領域の信号の第２直線部５１、５２を流れる高周波領域の信号に対する干渉を低減できる。その結果、検査対象物および検査装置に対する接触信頼性を確保しつつ、高周波領域の信号の損失を低減できるプローブピン１０を実現できる。 On the other hand, in the probe pin 10, the elastic portion 11 extends in a direction intersecting the longitudinal direction of the probe pin 10, and a first straight portion in which one end portion 111 in the extending direction is connected to the first contact portion 12 31 and 32, extending in an arc shape projecting in a direction crossing the longitudinal direction of the probe pin 10 and away from the first contact portion 12, one end of the extending direction is the extension of the first straight portion 31, 32 The first curved portions 41 and 42 connected to the other end in the existing direction, and one end portion in the extending direction which extends in a direction intersecting the longitudinal direction of the probe pin 10 is the extension of the first curved portions 41 and 42 And second straight portions 51 and 52 connected to the other end of the direction, and the central angle .theta.1 of the first curved portions 41 and 42 is configured to be larger than 90 degrees and smaller than 180 degrees. There is. Thereby, since a distance can be provided between the first straight portions 31 and 32 and the second straight portions 51 and 52 in the longitudinal direction of the probe pin 10, for example, a high frequency region flowing through the first straight portions 31 and 32 The interference with the signal of the high frequency region flowing through the second straight portions 51 and 52 of the signal of (1) can be reduced. As a result, it is possible to realize the probe pin 10 capable of reducing the loss of the signal in the high frequency region while securing the contact reliability to the inspection object and the inspection apparatus.
　ここで、各湾曲部４１、４２、６１、６２、８１、８２の中心角θ１、θ２、θ３が全て１８０度のプローブピン１０（以下、比較例のプローブピンという）と、各湾曲部４１、４２、６１、６２、８１、８２の中心角θ１、θ２、θ３が全て１５０度のプローブピン１０（以下、実施例のプローブピンという）とについて、インサーションロスおよびリターンロスを測定した。 Here, each of the curved portions 41, 42, 61, 62, 81, 82 has a central angle θ1, θ2, θ3 of 180 degrees (hereinafter referred to as a probe pin of the comparative example), and each curved portion 41, Insertion loss and return loss were measured for probe pins 10 (hereinafter referred to as probe pins in the examples) having central angles θ 1, θ 2, θ 3 of 42, 61, 62, 81, 82 all at 150 degrees.
　図６に示すように、比較例のプローブピンでは、１４．２８Ｇｂｐｓの信号に対して－１ｄＢのインサーションロスが発生し、１３．４０Ｇｂｐｓの信号に対して－１０ｄＢのリターンロスが発生した。一方、図７に示すように、実施例のプローブピンでは、３０．６０Ｇｂｐｓの信号に対して－１ｄＢのインサーションロスが発生し、３０．２４Ｇｂｐｓの信号に対して－１０ｄＢのリターンロスが発生した。すなわち、第１湾曲部４１、４２の中心角θ１が、９０度よりも大きく１８０度よりも小さくなるようにプローブピン１０を構成することで、高周波領域の信号の損失を低減できることができた。 As shown in FIG. 6, with the probe pin of the comparative example, an insertion loss of −1 dB occurred for the signal of 14.28 Gbps, and a return loss of −10 dB occurred for the signal of 13.40 Gbps. On the other hand, as shown in FIG. 7, with the probe pin of the embodiment, an insertion loss of −1 dB occurs for a 30.60 Gbps signal, and a −10 dB return loss occurs for a 30.24 Gbps signal. . That is, by configuring the probe pin 10 such that the central angle θ1 of the first curved portions 41 and 42 is larger than 90 degrees and smaller than 180 degrees, it is possible to reduce the loss of signals in the high frequency region.
　また、前記プローブピン１０によれば、弾性部１１が、相互に隙間２３を空けて配置された複数の帯状弾性片で構成され、各帯状弾性片２１、２２の幅Ｗ１、Ｗ２が、隣接する帯状弾性片２１、２２間の最短距離Ｗ３よりも小さくなるように構成されている。これにより、例えば、第１接点部１２１および第２接点部１３１の各々が検査対象物および検査装置に対して接触して各帯状弾性片２１、２２がプローブピン１０の長手方向に圧縮されたときでも、各帯状弾性片２１、２２同士の接触を防止することができ、高い接触信頼性を確保できるプローブピン１０を実現できる。 Further, according to the probe pin 10, the elastic portion 11 is composed of a plurality of elastic strips arranged with a gap 23 therebetween, and the widths W1 and W2 of the elastic strips 21 and 22 are adjacent to each other. It is configured to be smaller than the shortest distance W3 between the elastic strips 21 and 22. Thereby, for example, when each of the strip elastic pieces 21 and 22 is compressed in the longitudinal direction of the probe pin 10 by each of the first contact portion 121 and the second contact portion 131 coming into contact with the inspection object and the inspection device However, contact between the strip-like elastic pieces 21 and 22 can be prevented, and the probe pin 10 capable of securing high contact reliability can be realized.
　また、前記検査治具２によれば、プローブピン１０により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査治具２を実現できる。 In addition, according to the inspection jig 2, inspection contact with the inspection object and the inspection apparatus is high by the probe pin 10, and inspection and repair with a small loss of signals in the high frequency region when connected to the inspection object and the inspection apparatus. Tool 2 can be realized.
　また、前記検査ユニット１によれば、検査治具２により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査ユニット２を実現できる。 Further, according to the inspection unit 1, the inspection jig 2 has high contact reliability to the inspection object and the inspection apparatus, and the inspection unit has a small loss of signals in the high frequency region when connected to the inspection object and the inspection apparatus. 2 can be realized.
　なお、前記検査ユニット１は、検査装置の一部を構成することができる。このような検査装置によれば、検査ユニット１により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査装置を実現できる。 The inspection unit 1 can constitute a part of the inspection apparatus. According to such an inspection apparatus, the inspection unit 1 realizes an inspection apparatus having high contact reliability with respect to the inspection object and the inspection apparatus and little loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus. it can.
　弾性部１１は、第１直線部３１、３２、第１湾曲部４１、４２および第２直線部５１、５２を有し、第１湾曲部４１、４２の中心角が９０度よりも大きく１８０度よりも小さくなるように構成されていればよい。 The elastic portion 11 has first linear portions 31, 32, first curved portions 41, 42 and second linear portions 51, 52, and the central angle of the first curved portions 41, 42 is larger than 90 degrees and 180 degrees. It should just be comprised so that it may become smaller.
　例えば、弾性部１１は、図８に示すように、第１直線部３１、３２、第１湾曲部４１、４２および第２直線部５１、５２のみで構成してもよい。 For example, as shown in FIG. 8, the elastic portion 11 may be configured by only the first straight portions 31 and 32, the first bending portions 41 and 42, and the second straight portions 51 and 52.
　また、弾性部１１は、相互に隙間２３を空けて配置された２つの帯状弾性片２１、２２を有する場合に限らない。弾性部１１は、例えば、図９に示すように、相互に隙間を空けて配置された４つの帯状弾性片２１、２２、２４、２５を有していてもよいし、図示していないが、１つの帯状弾性片を有していてもよい。 Further, the elastic portion 11 is not limited to the case where it has the two strip-like elastic pieces 21 and 22 disposed with the gap 23 therebetween. For example, as shown in FIG. 9, the elastic portion 11 may have four elastic strips 21, 22, 24, 25 spaced apart from one another, although not shown in the figure. It may have one elastic band.
　各帯状弾性片２１、２２の幅Ｗ１、Ｗ２は、隣接する帯状弾性片２１、２２間の最短距離Ｗ３よりも小さい場合に限らず、大きくてもよい。 The widths W1 and W2 of the elastic strips 21 and 22 are not limited to the case where the widths W1 and W2 of the elastic strips 21 and 22 are smaller than the shortest distance W3 between the adjacent elastic strips 21 and 22.
　第１接触部１２および第２接触部１３は、プローブピン１０の設計等に応じて、その形状等を適宜変更できる。例えば、第２接触部１３は、図９に示すように、プローブピン１０の長手方向に沿って延びる一対の脚部１３３、１３４の先端部のそれぞれに設けてもよい。すなわち、第１接点部１２１および第２接点部１３１の各々は、検査装置あるいは検査対象物の様々な態様に応じて、形状および位置などを適宜変更することができる。 The shapes and the like of the first contact portion 12 and the second contact portion 13 can be appropriately changed according to the design and the like of the probe pin 10. For example, as shown in FIG. 9, the second contact portion 13 may be provided on each of the tips of the pair of legs 133 and 134 extending along the longitudinal direction of the probe pin 10. That is, each of the first contact portion 121 and the second contact portion 131 can be appropriately changed in shape, position, and the like according to various aspects of the inspection apparatus or the inspection object.
　検査治具２およびベースハウジング４は、検査装置あるいは検査対象物の様々な態様に応じて、その構成を適宜変更することができる。すなわち、検査治具２およびベースハウジング４を汎用化して、検査ユニット１（ひいては検査装置）の生産性を向上させることができる。 The configurations of the inspection jig 2 and the base housing 4 can be appropriately changed according to various aspects of the inspection apparatus or the inspection object. That is, the inspection jig 2 and the base housing 4 can be generalized, and the productivity of the inspection unit 1 (and thus the inspection apparatus) can be improved.
　以上、図面を参照して本開示における種々の実施形態を詳細に説明したが、最後に、本開示の種々の態様について説明する。なお、以下の説明では、一例として、参照符号も添えて記載する。 While the various embodiments of the present disclosure have been described in detail with reference to the drawings, various aspects of the present disclosure will be finally described. In the following description, as an example, reference numerals will be attached.
　本開示の第１態様のプローブピン１０は、
　長手方向に沿って伸縮する弾性部１１と、
　前記弾性部１１の前記長手方向の第１端部１１１に接続された板状の第１接触部１２と、
　前記第１接触部１２に対して直列的に配置され、前記弾性部１１の前記長手方向の第２端部１１２に接続された板状の第２接触部１３と
を備え、
　前記弾性部１１が、
　前記長手方向に交差する方向に延びると共に、その延在方向の一端部が前記第１接触部に接続された第１直線部３１と、
　前記長手方向に交差する方向でかつ前記第１接触部１２から離れる方向に突出した円弧状に延びていると共に、その延在方向の一端部が前記第１直線部３１のその延在方向の他端部に接続された湾曲部４１と、
　前記長手方向に交差する方向に延びると共に、その延在方向の一端部が前記湾曲部４１のその延在方向の他端部に接続された第２直線部５１と
を有し、
　前記湾曲部４１の中心角θ１が、９０度よりも大きく１８０度よりも小さくなるように構成されている。 The probe pin 10 of the first aspect of the present disclosure is
An elastic portion 11 extending and contracting along the longitudinal direction;
A plate-like first contact portion 12 connected to the first end portion 111 in the longitudinal direction of the elastic portion 11;
And a plate-like second contact portion 13 disposed in series with the first contact portion 12 and connected to the second end 112 in the longitudinal direction of the elastic portion 11;
The elastic portion 11 is
The first straight portion 31 extends in a direction intersecting the longitudinal direction, and one end portion in the extending direction is connected to the first contact portion;
While extending in the shape of an arc projecting in the direction crossing the longitudinal direction and in the direction away from the first contact portion 12, one end portion in the extending direction is the other extending direction of the first straight portion 31 A curved portion 41 connected to the end,
The second linear portion 51 extends in a direction intersecting the longitudinal direction, and has one end in the extending direction connected to the other end in the extending direction of the curved portion 41,
The central angle θ1 of the curved portion 41 is configured to be larger than 90 degrees and smaller than 180 degrees.
　第１態様のプローブピン１０によれば、プローブピン１０の長手方向における第１直線部３１と第２直線部５１との間に距離を設けることができるので、例えば、第１直線部３１を流れる高周波領域の信号の第２直線部５１を流れる高周波領域の信号に対する干渉を低減できる。その結果、検査対象物および検査装置に対する接触信頼性を確保しつつ、高周波領域の信号の損失を低減できるプローブピン１０を実現できる。 According to the probe pin 10 of the first aspect, since a distance can be provided between the first linear portion 31 and the second linear portion 51 in the longitudinal direction of the probe pin 10, for example, it flows in the first linear portion 31 Interference with the signal of the high frequency area flowing through the second straight portion 51 of the signal of the high frequency area can be reduced. As a result, it is possible to realize the probe pin 10 capable of reducing the loss of the signal in the high frequency region while securing the contact reliability to the inspection object and the inspection apparatus.
　本開示の第２態様のプローブピン１０は、
　前記弾性部１１が、相互に隙間２３を空けて配置された複数の帯状弾性片２１、２２で構成され、
　前記複数の帯状弾性片２１、２２の各々の幅Ｗ１、Ｗ２が、隣接する前記複数の帯状弾性片２１、２２間の最短距離Ｗ３よりも小さくなるように構成されている。 The probe pin 10 of the second aspect of the present disclosure is
The elastic portion 11 is composed of a plurality of elastic strips 21 and 22 disposed with a gap 23 therebetween,
The widths W1 and W2 of the plurality of elastic strips 21 and 22 are smaller than the shortest distance W3 between the adjacent elastic strips 21 and 22.
　第２態様のプローブピン１０によれば、例えば、第１接点部１２１および第２接点部１３１の各々が検査対象物および検査装置に対して接触して各帯状弾性片２１、２２がプローブピン１０の長手方向に圧縮されたときでも、各帯状弾性片２１、２２同士の接触を防止することができ、高い接触信頼性を確保できるプローブピン１０を実現できる。 According to the probe pin 10 of the second aspect, for example, each of the strip elastic pieces 21 and 22 is a probe pin 10 when each of the first contact portion 121 and the second contact portion 131 is in contact with the inspection object and the inspection device. Even when compressed in the longitudinal direction, contact between the elastic strips 21 and 22 can be prevented, and a probe pin 10 capable of ensuring high contact reliability can be realized.
　本開示の第３態様の検査治具２は、
　前記プローブピン１０と、
　前記プローブピン１０を収容可能な収容部７を有するソケット３と
を備え、
　前記プローブピン１０が、前記湾曲部４１の中心角が、９０度よりも大きく１８０度よりも小さくなるように、前記収容部７に収容されている。 The inspection jig 2 of the third aspect of the present disclosure is
The probe pin 10;
And a socket 3 having a receptacle 7 capable of receiving the probe pin 10;
The probe pin 10 is housed in the housing portion 7 so that the central angle of the curved portion 41 is larger than 90 degrees and smaller than 180 degrees.
　第３態様の検査治具２によれば、プローブピン１０により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査治具２を実現できる。 According to the inspection jig 2 of the third aspect, inspection with high contact reliability to the inspection object and the inspection apparatus by the probe pin 10 and little loss of signals in a high frequency region when connected to the inspection object and the inspection apparatus The jig 2 can be realized.
　本開示の第４態様の検査ユニット１は、
　前記検査治具を少なくとも１つ備えた。 The inspection unit 1 of the fourth aspect of the present disclosure is
At least one inspection jig was provided.
　第４態様の検査ユニット１によれば、検査治具２により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査ユニット２を実現できる。 According to the inspection unit 1 of the fourth aspect, the inspection jig 2 has high contact reliability with respect to the inspection object and the inspection apparatus, and inspection with a small loss of signals in the high frequency region when connected to the inspection object and the inspection apparatus Unit 2 can be realized.
　本開示の第５態様の検査装置は、
　前記検査ユニット１を少なくとも１つ備えた。 The inspection apparatus of the fifth aspect of the present disclosure is
At least one inspection unit 1 was provided.
　第４態様の検査装置によれば、検査ユニット１により、検査対象物および検査装置に対する接触信頼性が高く、検査対象物および検査装置に接続した場合の高周波領域の信号の損失が少ない検査装置を実現できる。 According to the inspection device of the fourth aspect, the inspection device has high contact reliability with respect to the inspection object and the inspection device, and a small loss of signal in the high frequency region when connected to the inspection object and the inspection device realizable.
　なお、前記様々な実施形態または変形例のうちの任意の実施形態または変形例を適宜組み合わせることにより、それぞれの有する効果を奏するようにすることができる。また、実施形態同士の組み合わせまたは実施例同士の組み合わせまたは実施形態と実施例との組み合わせが可能であると共に、異なる実施形態または実施例の中の特徴同士の組み合わせも可能である。 In addition, the effect which each has can be show | played by combining suitably the arbitrary embodiment or modification of said various embodiment or modification. Further, a combination of the embodiments or a combination of the embodiments or a combination of the embodiments and the embodiments is possible, and a combination of the features in different embodiments or the embodiments is also possible.
　本開示のプローブピンは、例えば、液晶パネルの検査に用いる検査治具に適用できる。 The probe pin of the present disclosure can be applied to, for example, an inspection jig used for inspection of a liquid crystal panel.
　本開示の検査治具は、例えば、液晶パネルの検査に用いる検査ユニットに適用できる。 The inspection jig of the present disclosure can be applied to, for example, an inspection unit used for inspection of a liquid crystal panel.
　本開示の検査ユニットは、例えば、液晶パネルの検査装置に適用できる。 The inspection unit of the present disclosure can be applied to, for example, an inspection device of a liquid crystal panel.
　本開示の検査装置は、例えば、液晶パネルの検査に用いることができる。 The inspection apparatus of the present disclosure can be used, for example, for inspection of a liquid crystal panel.
１　検査ユニット
２　検査治具
３　ソケット
４　ベースハウジング
５　第１ハウジング
６　第２ハウジング
７　収容部
１０　プローブピン
１１　弾性部
１１１　第１端部
１１２　第２端部
１２　第１接触部
１２１　第１接点部
１３　第２接触部
１３１　第２接点部
１３２　貫通孔部
１３３、１３４　脚部
２１、２２、２４、２５　帯状弾性片
２１１、２２１　第１端部
２１２、２２２　第２端部
２３　隙間
３１、３２　第１直線部
４１、４２　第１湾曲部
５１、５２　第２直線部
６１、６２　第２湾曲部
７１、７２　第３直線部
８１、８２　第３湾曲部
９１、９２　第４直線部
１００　基板
１１０　検査対象物
１２０　端子
θ１、θ２、θ３　中心角
Ｌ１、Ｌ２　直線
Ｗ１、Ｗ２　幅
Ｗ３　最短距離 Reference Signs List 1 inspection unit 2 inspection jig 3 socket 4 base housing 5 first housing 6 second housing 7 accommodation portion 10 probe pin 11 elastic portion 111 first end portion 112 second end portion 12 first contact portion 121 first contact portion 13 Second contact portion 131 Second contact portion 132 Through hole 133, 134 Leg 21, 22, 24, 25 Strip elastic piece 211, 221 first end 212, 222 second end 23 Clearance 31, 32 first straight Portions 41 and 42 First curved portion 51 and 52 Second straight portion 61 and 62 Second curved portion 71 and 72 Third straight portion 81 and 82 Third curved portion 91 and 92 Fourth straight portion 100 Substrate 110 Test object 120 Terminal θ1, θ2, θ3 Central angle L1, L2 Straight line W1, W2 Width W3 shortest distance

Claims (5)

  1. 　長手方向に沿って伸縮する弾性部と、
    　前記弾性部の前記長手方向の第１端部に接続された板状の第１接触部と、
    　前記第１接触部に対して直列的に配置され、前記弾性部の前記長手方向の第２端部に接続された板状の第２接触部と
    を備え、
    　前記弾性部が、
    　前記長手方向に交差する方向に延びると共に、その延在方向の一端部が前記第１接触部に接続された第１直線部と、
    　前記長手方向に交差する方向でかつ前記第１接触部から離れる方向に突出した円弧状に延びていると共に、その延在方向の一端部が前記第１直線部のその延在方向の他端部に接続された湾曲部と、
    　前記長手方向に交差する方向に延びると共に、その延在方向の一端部が前記湾曲部のその延在方向の他端部に接続された第２直線部と
    を有し、
    　前記湾曲部の中心角が、９０度よりも大きく１８０度よりも小さくなるように構成されている、プローブピン。     An elastic portion that expands and contracts along the longitudinal direction,
    A plate-like first contact portion connected to the first end of the elastic portion in the longitudinal direction;
    A plate-like second contact portion disposed in series with the first contact portion and connected to the second end of the elastic portion in the longitudinal direction;
    The elastic portion is
    A first straight portion extending in a direction intersecting the longitudinal direction and having one end in the extending direction connected to the first contact portion;
    It extends in an arc shape projecting in the direction intersecting the longitudinal direction and away from the first contact portion, and one end in the extending direction is the other end in the extending direction of the first straight portion A curved portion connected to the
    It extends in a direction intersecting the longitudinal direction, and has a second straight portion whose one end in the extending direction is connected to the other end of the curved portion in the extending direction,
    A probe pin, wherein a central angle of the curved portion is configured to be larger than 90 degrees and smaller than 180 degrees.
  2. 　前記弾性部が、相互に隙間を空けて配置された複数の帯状弾性片で構成され、
    　前記複数の帯状弾性片の各々の幅が、隣接する前記複数の帯状弾性片間の最短距離よりも小さくなるように構成されている、請求項１のプローブピン。     The elastic portion is composed of a plurality of elastic strips arranged with a gap therebetween.
    The probe pin according to claim 1, wherein the width of each of the plurality of elastic strips is smaller than the shortest distance between the adjacent elastic strips.
  3. 　請求項１または２のプローブピンと、
    　前記プローブピンを収容可能な収容部を有するソケットと
    を備え、
    　前記プローブピンが、前記湾曲部の中心角が、９０度よりも大きく１８０度よりも小さくなるように、前記収容部に収容されている、検査治具。     A probe pin according to claim 1 or 2;
    And a socket having a receptacle capable of receiving the probe pin.
    The inspection jig, wherein the probe pin is housed in the housing portion such that a central angle of the curved portion is larger than 90 degrees and smaller than 180 degrees.
  4. 　請求項３の検査治具を少なくとも１つ備えた、検査ユニット。 An inspection unit provided with at least one inspection jig according to claim 3.
  5. 　請求項４の検査ユニットを少なくとも１つ備えた検査装置。 An inspection apparatus comprising at least one inspection unit according to claim 4.
PCT/JP2018/000508 2018-01-11 2018-01-11 Probe pin, test jig, test unit, and test device WO2019138505A1 (en)

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CN201880051883.5A CN111033272B (en) 2018-01-11 2018-01-11 Probe, inspection tool, inspection unit, and inspection device
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KR1020180011384A KR101903319B1 (en) 2018-01-11 2018-01-30 Probe pin, inspection jig, inspection unit and inspection apparatus
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