CN111579837B

CN111579837B - Probe and connector suitable for high-current high-speed signal test

Info

Publication number: CN111579837B
Application number: CN202010421968.7A
Authority: CN
Inventors: 陈前祎
Original assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Current assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Priority date: 2020-05-18
Filing date: 2020-05-18
Publication date: 2022-09-20
Anticipated expiration: 2040-05-18
Also published as: CN111579837A

Abstract

The invention discloses a probe and a connector suitable for high-current high-speed signal test, wherein the probe comprises a first contact part with a first contact part, an elastic part, a coupling part and a second contact part; the elastic part comprises a first straight line part, a bent part and a second straight line part; the first linear portion extends in the axial direction, and has one end connected to the other end of the first contact portion and the other end connected to the second linear portion extending in a direction intersecting the axial direction via a bent portion; under the unstressed state, the central angle corresponding to the bending part is larger than 0 degree and smaller than 90 degrees; the connecting part is used for connecting the second straight line part and the second contact part; the second contact part is arranged at one end of the connecting part and is provided with at least one second contact part; the probe provided by the invention shortens the signal transmission path on the premise of providing elasticity, and can be applied to high-speed signal transmission and high-current test environments.

Description

Probe and connector suitable for high-current high-speed signal test

Technical Field

The invention belongs to the technical field of signal transmission and testing, and particularly relates to an elastic flat probe and a connector which are suitable for being used on testing equipment in high-speed signal transmission and large-current testing use environments.

Background

In the manufacturing process of electronic components such as liquid crystal panels and integrated circuits, it is necessary to perform conduction detection and operation characteristic inspection of products, and a specific detection method is to connect an electrode portion such as an FPC contact electrode connected to a main substrate of an electronic component module or a substrate-to-substrate connector to be mounted and an inspection device using a probe to perform such detection.

A probe pin that is commonly used at present has a pair of contacts that can be brought into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion that connects between the pair of contacts. As shown in fig. 1, the probe pin ensures contact pressure between the contact and the electrode terminal of the electronic component and the electrode terminal of the connected electronic component by the elastic portion, thereby improving contact reliability with respect to the electrode terminal of the electronic component and the electrode terminal of the connected electronic component. The elastic part is S-shaped or S-shaped in appearance and is formed by alternately connecting a straight line part and a bent part; in order to better exert the spring characteristic of the elastic part, the number of the bending parts is at least two, so that the linear distance of the elastic part is longer; because signals need to be transmitted between the two contacts through the elastic part in the test process, the signal transmission path is long due to the long length of the elastic part, the signals are seriously attenuated in the transmission process, and the signal quality is poor, so that the use requirement of high-speed signal transmission cannot be met; in addition, the conductive resistance of such probes is too high, which severely limits the transmission speed of high-speed signals. Based on the defects, the maximum overcurrent capacity of the current commonly used probe is less than 2.5A, and the current commonly used probe can only be applied to a test environment with a signal transmission rate of not more than 1.2 Gbps.

Disclosure of Invention

In view of at least one of the defects or the improvement requirements of the prior art, the present invention provides a probe and a connector suitable for high-current high-speed signal testing, which aims to solve the problems of the existing probe that the signal transmission path is long, which results in serious signal attenuation, and the conducting resistance is too large, which limits the signal transmission speed.

To achieve the above object, according to one aspect of the present invention, there is provided a probe suitable for high-current high-speed signal testing, including a first contact portion, an elastic portion, a coupling portion, and a second contact portion;

one end of the first contact part is provided with a first contact part which can be matched with a contact terminal of the tested object; the elastic part comprises a first straight line part, a bent part and a second straight line part;

the first linear portion extends in the axial direction, and has one end connected to the other end of the first contact portion and the other end connected to the second linear portion extending in a direction intersecting the axial direction via the bent portion; under the unstressed state, the central angle corresponding to the bending part is larger than 0 degree and smaller than 90 degrees;

the coupling portion extends in the axial direction and is used for connecting the second linear portion and the second contact portion; the second contact part is arranged at one end of the connecting part and is provided with at least one second contact part;

the elastic portion deforms in the axial direction to apply force to the first contact portion and the second contact portion when the first contact portion or the second contact portion is applied with axial force.

In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:

(1) the invention provides a probe suitable for testing a large-current high-speed signal, wherein an elastic part of the probe comprises a first straight line part, a bending part and a second straight line part; a first straight portion extending in the axial direction and having one end connected to the other end of the first contact portion and the other end connected to a second straight portion extending in a direction intersecting the axial direction via a bent portion; under the unstressed state, the central angle corresponding to the bending part is larger than 0 degree and smaller than 90 degrees; therefore, the elastic part is L-shaped, the path required by the elastic part for generating the elastic force is short, the transmission path of the signal can be effectively shortened on the premise that the elastic force is provided to enable the first contact part to be in good contact with the terminal of the detected object, the signal is prevented from being seriously attenuated in the long-distance transmission process, the signal quality is improved, and the elastic part can be applied to the use scene of high-speed signal transmission.

(2) According to the probe suitable for testing the high-current high-speed signal, the ratio of the effective width of the elastic part to the maximum width of the probe in the vertical axial direction is controlled within the range of 1: 200-1: 5, the effective conduction width/cross-sectional area of the elastic part is increased to reduce the resistance of the probe so as to increase the overcurrent capacity of the probe, and the signal transmission speed is increased.

(3) The probe suitable for testing the large-current high-speed signal is characterized in that the probe accommodated in the shell is fixed through the first limiting part arranged in the second contact part and the second limiting part arranged at one end of the connecting part close to the first contact part, so that the probe is prevented from moving up and down, the first contact part is prevented from inclining left and right under the action of the elastic part, and the first contact part is ensured to be accurately butted with an object to be tested.

(4) The elastic flat probe for testing the high-speed signal and the large current is simple in structure and convenient to set, and by means of corresponding arrangement of all parts, the conductive resistance of the probe can be reduced on the basis of realizing reliable connection of two contact parts of the probe, so that the possibility is provided for transmission of the high-speed signal and application in a large-current testing environment, the application range of the probe is expanded, the application cost of the probe is reduced, and the elastic flat probe has good application prospect and popularization value.

Drawings

FIG. 1 is a schematic diagram of a conventional probe;

fig. 2 is a schematic cross-sectional view of a connector according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of a three-dimensional structure of a probe provided in an embodiment of the invention;

FIG. 4 is a schematic plan view of a probe according to an embodiment of the present invention;

FIG. 5 is a front view of a plurality of first contact portions having different shapes provided by an embodiment of the present invention;

FIG. 6 is a detailed structural view of an elastic part provided in an embodiment of the present invention;

FIG. 7 is a schematic structural deformation diagram of a probe in an unstressed state and in an axially stressed state according to an embodiment of the present invention;

in all the figures, the same reference numerals denote the same features, in particular:

1 Probe

2 first contact part

21 first contact part

3 elastic part

31 first end part

32 second end portion

4 second contact part

41 second contact part

42 second limit part

43 first limit part

9 connecting part

33. 34, 35 belt-like elastic sheet

331. 341, 351 first end portion

332. 342, 352 second end

51. 52 gap

61. 71, 81 first straight line part

62. 72, 82 bending part

63. 73, 83 second straight line part

W1, W6, W7 Width

W2 minimum gap width

Center of curvature of O1

Angle of inclination A

00 connector

30 rubber frame

40 cover plate.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

The following description is merely exemplary in nature and is not intended to limit the present invention, its applications, or uses. Further, the drawings are schematic, and the proportions of the respective dimensions and the like do not necessarily coincide with the actual situation.

Fig. 2 is a schematic cross-sectional structure view of a connector according to an embodiment of the present invention, referring to fig. 2, the connector 00 includes probes 1 and a housing for receiving the probes 1, each probe 1 and the housing outside the probe 1 constitute an independent detection unit, one or more probes 1 can be disposed inside each housing, for example, a plurality of probes 1 are disposed in parallel in a cross-sectional direction perpendicular to fig. 1 inside the housing, and adjacent probes 1 are spaced at equal intervals; in addition, two adjacent housings may be separately disposed, or may be disposed in parallel by sharing one sidewall, thereby reducing the volume of the entire connector 00. The probe 1 is used in a state of being housed in a case.

As shown in fig. 2, the case has a substantially rectangular parallelepiped shape, and includes a rubber frame 30 and a cover plate 40; the rubber frame 30 and the cover plate 40 enclose to form a cavity capable of accommodating the probe 1; the probe 1 has a first contact part 2 and a second contact part 4, wherein the end of the first contact part 2 is provided with a first contact point part 21, the second contact part 4 is provided with at least one second contact point part 41, and in fig. 1, the second contact part 4 of each probe 1 is provided with two second contact point parts 41; when the probe is accommodated in the cavity formed by the rubber frame 30 and the cover plate 40, the first contact portion 2 protrudes from the surface of the rubber frame 30, the second contact portion 41 on the second contact portion 4 protrudes from the surface of the cover plate 40, and accordingly, the surface of the rubber frame 30 is provided with an opening for allowing the first contact portion 2 to pass through, and the surface of the cover plate 40 is provided with an opening for allowing the second contact portion 41 to pass through.

The first contact point portion 21 on the first contact portion 2 is configured to be contactable with a terminal of an object to be measured (for example, an FPC contact electrode, a substrate-to-substrate (BtoB) connector); the second contact point portion 41 of the second contact portion 4 is configured to be able to contact a terminal of a substrate (for example, FPC/PCBA or other conductive adapter) of the inspection apparatus; in use, the probe 1 having conductivity connects the object to be tested and the inspection apparatus to provide a test signal transmission path.

FIG. 3 is a schematic three-dimensional structure diagram of the probe provided in this embodiment; FIG. 4 is a schematic plan view of the probe provided in this embodiment; referring to fig. 3 and 4, the probe 1 includes a first contact portion 2, an elastic portion 3, a coupling portion 9, and a second contact portion 4;

wherein, one end of the first contact part 2 is provided with a first contact part 21 which can be matched with a contact terminal of a measured object; fig. 5 shows a front view of a plurality of first contact portions 2 having different shapes, and the first contact portion 21 can be appropriately changed in shape according to the design of the probe 1 and the like, and is not limited to the shape shown in fig. 2; for example, the first contact portion 21 can be designed to have a shape and a position appropriately changed according to the form of the contact terminal of the object to be tested so that the contact surface between the probe 1 and the object to be tested can be as large as possible during the test, or to have another shape according to the specific shape of the contact terminal pair of the object to be tested.

The elastic part 3 has a first end 31 and a second end 32, and the first contact part 2 is connected to the first end 31 of the elastic part 3 in the width direction of the probe 1 (i.e., the left-right direction in fig. 4); one end of the connection part 9 is connected to the second end 32 of the elastic part 3 in the width direction of the probe 1, and the second end 32 of the elastic part 3 is actually connected to the side wall of the connection part 9 because the elastic part 3 has a certain width; the second contact portion 4 is provided at an end of the coupling portion 9; the probe 1 is a thin plate, has conductivity, and is integrally molded.

In order to reduce the resistance of the probe 1 as much as possible to increase the overcurrent capacity, the effective width (i.e. the length in the width direction perpendicular to the extending direction of the path of the elastic part 3)/the cross-sectional area of the elastic part 3 needs to be increased as much as possible, and in the embodiment, the ratio of the width of the elastic part 3 to the maximum width of the probe in the perpendicular axial direction is controlled within the range of 1: 200-1: 5; referring to fig. 4, the maximum width of the probe in the vertical axial direction is the length of the second contact portion 4 extending in the vertical axial direction, and in an actual product, the maximum width of the probe ranges from 1mm to 20 mm.

TABLE 1 minimum Cross-sectional area of Probe conduction Path impact on Probe Performance

Table 1 shows the effect of the minimum cross-sectional area of the probe conduction path on the performance of the probe, the thickness of the probe is uniformly set to 0.11mm, the path length is the length of the elastic part in the probe, for the new probe provided in this embodiment, L1/L2 is the ratio of the minimum conduction width of the probe to the probe width, in this embodiment, the minimum conduction width of the probe is the width at the elastic part; the minimum cross-sectional area is the cross-sectional area of the elastic part; the elastic force at the needle point represents the elastic force measured by the first contact part of the first contact part; the parameters in the table show that compared with the existing spring plate probe, the invention greatly shortens the path length of the probe, and the maximum overcurrent capacity and the signal transmission rate of the probe are obviously increased along with the gradual increase of the minimum cross-sectional area of the conduction path of the probe, wherein the maximum transmission rate of the new probe 9 to signals can reach 11Gbps, and the maximum overcurrent capacity can reach 12A; compared with the existing spring plate probe, the signal transmission rate is improved by about 9 times, and the maximum overcurrent capacity is improved by about 5 times, so that the probe structure provided by the invention has larger overcurrent capacity, can pass signals with larger rate, and can be applied to scenes of high-speed signals and large-current tests. In addition, as the minimum cross-sectional area of the probe conduction path is gradually increased, the elastic force at the probe tip is also increased.

The elastic portion 3 deforms in the axial direction to apply pressure to the first contact point 21 portion and the second contact point portion 41 when the first contact portion 2 is applied with an axial force (i.e., the up-down direction of fig. 4); the elastic part 3 comprises a first straight part, a curved part and a second straight part; the first straight portion extends in the axial direction and has one end connected to the other end of the first contact portion 2 remote from the first contact portion 21, and the other end connected to a second straight portion extending in a direction intersecting the axial direction through a curved portion; the elastic part 3 is shaped like an L, the central angle corresponding to the bending part is larger than 0 degree and smaller than 90 degrees under the unstressed state, the included angle between the extension lines of the first linear part and the second linear part is larger than 90 degrees and smaller than 180 degrees, and the included angle between the extension direction of the second linear part and the width direction of the probe 1 is larger than 0 degree and smaller than 90 degrees correspondingly.

For example, the elastic part 3 may be a solid structure, and the cross-sectional area of the elastic part 3 is related to the width and the thickness of the probe 1, so that the cross-sectional area of the elastic part 3 is increased to improve the overcurrent capability and the signal transmission speed of the probe 1, but the elastic force of the probe 1 is increased accordingly, and when the probe is used, a clamping structure matched with the probe 1 needs to provide a large clamping force to ensure that the object to be measured is well contacted with the probe 1, and the object to be measured may be crushed. And the cross-sectional area of the elastic part 3 is too small, so that the overcurrent capacity and the signal transmission speed of the probe 1 cannot meet the use requirements. Therefore, considerIn the case of the relative balance between the cross-sectional area of the elastic part 2 and the elastic force provided by the elastic part, the present embodiment preferably sets the cross-sectional area of the elastic part 3 to 0.01 to 60mm ² Further preferably, the thickness of the elastic part 3 (probe 1) is set to 0.1 to 5mm, and the width of the elastic part 3 is set to 0.1 to 4 mm.

As another example, one or more hollow through grooves may be formed in the elastic portion 3 along the extending direction of the elastic portion 3, so that the elastic portion 3 may have a plurality of strip-shaped elastic pieces spaced apart from each other; as a preferred example, the outline of the hollow through groove is parallel to or coincident with the outer edge of the elastic portion 3.

Fig. 6 is a detailed structural view of the elastic portion provided in the present embodiment, and as shown in fig. 6, the elastic portion 3 has a plurality of belt-like

elastic pieces

33, 34, 35 arranged to be spaced apart from each other by

spaces

51, 52; the number of the band-shaped elastic pieces (3 band-shaped

elastic pieces

33, 34, 35 in the present embodiment) in the elastic portion 3 is not limited to 3, and may be 1 to 6; the number of the corresponding arrangements having the mutual spacing (2

spacing intervals

51 and 52 in this embodiment) is not limited to 2, and may be 0 to 5.

As shown in fig. 6, each of the elastic band-shaped

pieces

33, 34, 35 is an elongated band-shaped piece, and is similarly divided into a first

linear portion

61, 71, 81, a

bent portion

62, 72, 82, and a second

linear portion

63, 73, 83. The sectional shapes of the respective belt-like

elastic pieces

33, 34, 35 may be configured to be the same or different without affecting the function of the elastic portion 3; as a preferable example, the belt-like

elastic pieces

33, 34, 35 have substantially the same cross-sectional shape.

The first

straight portions

61, 71, 81 are disposed below the first contact portions 2 with respect to the first contact portions 2, and extend downward in the axial direction of the probe 1. Further, one end portions of the first

linear portions

61, 71, 81 constitute

first end portions

331, 341, 351 of the respective strip-shaped

elastic pieces

33, 34, 35 (i.e., the first end portion 31 of the elastic portion 3), and are connected to the first contact portion 2 from the longitudinal direction of the probe 1.

The second

straight portions

63, 73, 83 are disposed on the right side of the coupling portion 9 with respect to the coupling portion 9, and extend in a direction intersecting the width direction of the probe 1. Further, one end portions of the second

linear portions

63, 73, 83 constitute the

second end portions

332, 342, 352 of the respective strip-shaped

elastic pieces

33, 34, 35 (i.e., the second end portion 32 of the elastic portion 3), and are connected to the coupling portion 9 from the width direction of the probe 1.

The

bent portions

62, 72, and 82 have a substantially C-shape when viewed in the plate thickness direction of the first contact portion 2, and are connected to the other end portions of the first

linear portions

61, 71, and 81 in the extending direction and the other end portions of the second

linear portions

63, 73, and 83 in the extending direction.

The shape of each of the belt-like

elastic pieces

33, 34, 35 of the elastic portion 3 is like an L, in which the first

straight portions

61, 71, 81 are provided in series with the first contact portion 2, extending directions of the two overlap, the second

straight portions

63, 73, 83 are in a diagonal state, an angle a is formed with respect to a horizontal direction (i.e., a width direction of the probe 1), and the first

straight portions

61, 71, 81 intersect with extension lines of the second

straight portions

63, 73, 83. The curvature center O1 of the

curved portions

62, 72, 82 is on the left side of the first

linear portions

61, 71, 81 and above the second

linear portions

63, 73, 83.

As shown in fig. 6, the sum of the widths W1 of the respective strip-shaped

elastic pieces

33, 34, 35 (i.e., the lengths of the respective strip-shaped

elastic pieces

33, 34, 35 in the width direction perpendicular to the extending direction of the paths between the

first end portions

331, 341, 351 and the

second end portions

332, 342, 352) (i.e., the effective conduction width of the elastic portion 3) is smaller than the minimum width W7 of the coupling portion 9, and the conduction resistance of the first contact portion 2 and the second contact portion 4 can be reduced.

Also, considering the relative balance between the cross-sectional area of the elastic part 3 and the elastic force provided by the elastic part, the cross-sectional area of the elastic part 3 is set to 0.01 to 60mm ² When the thickness is 0.1 to 5mm, the width W1 of each of the belt-like

elastic pieces

33, 34, 35 of the elastic portion 3 is preferably set to 0.05 to 2mm in this embodiment.

The

gaps

51, 52 between the adjacent belt-like

elastic pieces

33, 34, 35 are preferably set to a width W2 of 0.06 to 1mm, mainly for preventing the belt-like

elastic pieces

33, 34, 35 from contacting each other when the elastic portion 3 is compressed and deformed; too small a gap increases the processing difficulty, and too large a gap widens the elastic portion 3, and the overall size of the probe 1 increases accordingly.

When the

elastic band pieces

33, 34, 35 of the elastic portion 3 are compressed and deformed, the deformation amount of the innermost elastic band piece 33 is slightly smaller than that of the outermost elastic band piece 35; as a preferable example, the

gaps

51 and 52 between the respective elastic band-shaped

pieces

33, 34 and 35 are configured such that the gap width on the side closer to the curvature center O1 of the

bent portions

62, 72 and 82 is small, and the gap width on the side farther from the curvature center O1 is large (the gap width is only ensured so that the elastic band-shaped pieces do not contact when deformed), that is, the width of the gap 51 is smaller than the gap 52, and the gap widths are gradually increased from the inside to the outside, thereby ensuring that the width of the elastic portion 3 is reduced as much as possible without contact when the elastic band-shaped pieces are deformed, and offsetting the probe width increased by providing the hollow through groove.

As shown in fig. 4, the coupling portion 9 extends in the axial direction of the probe 1 for connecting the second end portion 32 of the elastic portion 3 (specifically, the

second end portions

332, 342, 352 of the respective strip-like

elastic pieces

33, 34, 35) and the second contact portion 4; specifically, the second end portion 32 of the elastic portion 3 and the second contact portion 4 are connected to the side of the connecting portion 9 close to the first contact portion 2.

The second contact portion 4 includes a first stopper portion 43 extending in the width direction of the probe 1 and a protruding second contact portion 41 provided on a side of the first stopper portion 43 away from the elastic portion 3. As shown in fig. 4, the second contact portions 41 are configured in an inverted symmetrical trapezoidal projection pattern, and the contact surfaces are short sides of the trapezoidal projection for contacting with the switching FPC/PCBA or other conduction adapter of the inspection device, and two are generally designed, with a gap left between the two second contact portions 41. The shape of the second contact portion 41 can be appropriately changed according to the design of the probe 1 and the like, and is not limited to the shape shown in fig. 4; for example, the second contact portion 41 may be designed to have a shape and a position that are appropriately changed according to the form of the contact terminal of the inspection apparatus so that the contact surface between the probe 1 and the inspection apparatus is as large as possible during the test, or may have another shape according to the specific shape of the contact terminal pair of the inspection apparatus.

As a preferable example, the center lines of the two second contact points 41 of the second contact portion 4 in the axial direction coincide with the center line of the coupling portion 9 in the axial direction, so that the elastic force generated by the elastic portion 3 can be uniformly applied to the two second contact points 41 through the coupling portion 9, and it is ensured that both the two second contact points 41 can be brought into good contact with the contact terminals of the inspection apparatus. However, this structure expands the entire width of the probe 1 to some extent, resulting in an increase in size thereof.

As a preferable example, the first stopper portion 43 is formed with a hollow groove at least partially (not shown) or over the entire extension length thereof, and the first stopper portion 43 is formed as a plurality of strip-like elastic pieces spaced apart from each other, so that the first stopper portion 4 can exert both a stopper function and a spring function, and increase the elastic force provided by the probe 1 during expansion and contraction without extending the length thereof, which is advantageous in improving the contact reliability between the second contact portion 41 and the contact terminal of the inspection apparatus.

As shown in fig. 4, one end of the coupling portion 9 near the first contact portion 2 is provided with a second stopper portion 42 extending in the width direction of the probe 1; as a preferable example, one side surface of the second stopper portion 42 close to the second

linear portions

63, 73, 83 has substantially the same inclination angle as the second

linear portions

63, 73, 83, and one side surface far from the second

linear portions

63, 73, 83 has a surface capable of being fitted to an inner wall of the rubber frame 30 having an opening hole for allowing the first contact portion 2 to pass therethrough; the second stopper 42 is abutted against the inner wall of the housing when the probe 1 is accommodated in the housing to fix the probe 1, and prevents the first contact part 2 from being inclined in the left-right direction by the elastic part 3. Referring to fig. 1, the probe 1 is accommodated in the housing, and in an unstressed state, the inner wall of the upper surface of the rubber frame 30 limits the probe 1 through the second limiting portion 42 of the probe 1, and the upper surface of the cover plate 40 limits the probe 1 through the first lower limiting portion 43 of the probe 1, so that the probe 1 is prevented from moving up and down in the housing.

The elastic force generated by the elastic part 3 deforming under force makes the first contact point 21 of the first contact part 2 of the probe 1 contact well with the terminal of the detected object, and the elastic force can be transmitted to the second contact point 41 of the second contact part 4 through the connecting part 9 to make the contact well with the terminal of the substrate of the inspection device; fig. 7 shows a schematic structural deformation of the probe 1 in an unstressed state and an axially stressed state, as shown in fig. 7, when the first contact point portion 21 on the first contact portion 2 of the probe 1 is subjected to an axial pressure, each of the strip-shaped elastic pieces 33, 34, 35 of the elastic portion 3 is deformed, the first straight portions 61, 71, 81 and the curved portions 62, 72, 82 move downward, and the second straight portions 63, 73, 83 are downwardly deflected at the second end portion 32 in contact with the coupling portion 9 as a fixed point, so as to transfer at least part of the axial pressure applied to the first contact point portion 21 into the coupling portion 9; as can be seen from the figure, the central angle of the curved portions 62, 72, 82 increases when the elastic portion 3 is deformed, and the distance between the curved portions 62, 72, 82 and the second contact portion 4 decreases. In addition, the first contact point portion 21 can move downward to generate a large displacement amount, and the belt-shaped

elastic pieces

33, 34 and 35 disperse the pressure generated by the displacement of the first contact point portion 21, so that the stress concentration is avoided, and the belt-shaped

elastic pieces

33, 34 and 35 are broken.

In this embodiment, the central angles corresponding to the

curved portions

62, 72, 82 are greater than 0 degree and smaller than 90 degrees; correspondingly, the extending direction of the second

straight parts

63, 73, 83 forms an angle of more than 0 degree and less than 90 degrees with the width direction of the probe 1. When the included angle between the extending direction of the second

straight portions

63, 73, 83 and the width direction of the probe 1 is equal to or less than 0 degree, the distance between the

curved portions

62, 72, 82 and the second contact portion 4 is too small to provide a sufficient deformation space for the elastic portion 3; when the angle between the extending direction of the second

straight portions

63, 73, 83 and the width direction of the probe 1 is equal to 90 degrees, the first

straight portions

61, 71, 81 and the second

straight portions

63, 73, 83 are arranged in series, the

bent portions

62, 72, 82 disappear, and the elastic portion 3 loses the elastic function; in order to reduce the length of the probe 1 as much as possible while sufficiently utilizing the elastic action of the elastic portion 3, it is preferable that the angle between the extending direction of the second

linear portions

63, 73, 83 and the width direction of the probe 1 is greater than 0 degrees and equal to or less than 45 degrees; correspondingly, the central angles of the

curved portions

62, 72, 82 are greater than 0 degrees and less than 45 degrees.

The shape of each strip-shaped

elastic piece

33, 34, 35 of the elastic part 3 provided in this embodiment is L-like, and compared with a serpentine shape or S-shape, the path required for generating the elastic force is shorter, so that the transmission path of the signal can be effectively shortened on the premise that the elastic force is provided to make the first contact part 21 of the first contact part 2 contact with the terminal of the detected object well, thereby avoiding serious attenuation of the signal in the long-distance transmission process, improving the signal quality, and being applicable to the use scene of high-speed signal transmission.

The first end 31 of the elastic part 3 is directly connected to the first contact part 2, and after the deformation, the elastic part can apply pressure to the first contact part 2 to make the first contact part 21 on the first contact part 2 reliably contact with the object to be detected, and can apply pressure to the second contact part 4 through the connecting part 9 to make the second contact part 41 on the second contact part 4 reliably contact with the electron of the object to be detected.

When the second contact portion 41 of the second contact portion 4 of the probe 1 is pressed in the axial direction, the second contact portion 41 can move upward and drive the connecting portion 9 to generate a displacement amount, so as to force the elastic portion 3 to deform and generate an elastic force, and then the first contact portion 21 and the second contact portion 41 are pressed to be in close contact with the inspection apparatus and the terminal of the object to be tested.

As shown in fig. 2, the probe 1 is installed inside the housing, the vertical surface of the housing can play a limiting role in facing the probe 1, and when the first contact part 2 and the second contact part 4 of the probe 1 receive a radial force, the vertical surface of the cavity of the connector 00 can effectively prevent the first contact part 2 and the probe 1 from being damaged due to deformation caused by the integral left-right deviation. In addition, even if the probe 1 provided by the embodiment is not accommodated in the housing, the first contact portion 2 can be prevented from being bent and damaged when the first contact portion 2 receives a radial force; specifically, when the first contact portion 2 receives a radial force (i.e., a force applied in the width direction of the probe 1), the first

linear portions

33, 34, 35 in the elastic portion 3 are deformed in a manner of being displaced in the radial direction, and at this time, the stress generated by the deformation of the first

linear portions

33, 34, 35 is uniformly dispersed in the

bent portions

62, 72, 82 and the second

linear portions

63, 73, 83, and is transferred to the coupling portion 9 through the

bent portions

62, 72, 82 and the second

linear portions

63, 73, 83, thereby effectively preventing the first contact portion 2 of the probe 1 from being damaged. Therefore, the probe 1 provided by the embodiment can realize effective dispersion and transfer of stress when the probe is subjected to axial force or radial force, avoid damage, and improve the use reliability and service life.

In order to further reduce the conductive resistance of the probe 1, the present embodiment uses materials with better conductive performance, such as copper alloy, aluminum alloy, silver-copper alloy, etc., as the base material for forming the probe; furthermore, the surface of the probe 1 is also plated with a coating of materials such as nickel, gold and the like.

The probe 1 provided by the embodiment is of an integrally formed flat plate structure, the service life is not influenced by internal friction in the test compression process, and the general service life can reach more than 5 times of that of a conventional probe.

Table 2 is a comparison of the size parameters and performance parameters of the probe provided in this example with those of the conventional probe in the prior art, wherein the thickness of the probe is uniformly set to 0.11 mm;

TABLE 2 influence of the curvature of the elastic part and the number of the elastic pieces on the performance of the probe

As can be seen from the parameters in table 2, in the case that the effective cross-sectional area of the probe is fixed, changing the number of the elastic strip-shaped elastic pieces of the elastic portion has little influence on the maximum overcurrent capability and the signal transmission rate of the probe, and has a large influence on the elastic force at the needle point; the elastic force of the probe gradually decreases as the number of the band-shaped elastic pieces increases, indicating that an appropriate elastic force can be obtained by adjusting the number of the band-shaped elastic pieces of the elastic portion.

It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. A probe suitable for testing a large-current high-speed signal is characterized by comprising a first contact part, an elastic part, a connecting part and a second contact part;

the first contact part extends along the axial direction, and one end of the first contact part is provided with a first contact part which can be matched with a contact terminal of an object to be measured; the elastic part is L-shaped and comprises a first straight line part, a bent part and a second straight line part;

the connecting part is used for connecting the second linear part and the second contact part and is arranged on the different side of the elastic part relative to the first contact part; the second contact part is arranged at one end of the connecting part and is provided with at least one second contact part;

the elastic portion is deformed in the axial direction to apply a force to the first contact portion and the second contact portion when the first contact portion or the second contact portion is applied with an axial force, and a central angle corresponding to a bent portion of the elastic portion increases.

2. The probe according to claim 1, wherein the second contact portion includes a first stopper portion extending in a direction perpendicular to the axial direction and a protruding second contact portion provided on a side of the first stopper portion away from the elastic portion.

3. The probe according to claim 1, wherein a ratio of a width of the elastic portion to a maximum width of the probe in a direction perpendicular to the axial direction is 1:200 to 1: 5.

4. The probe according to claim 3, wherein the thickness of the probe is 0.1 to 5mm, and the effective conduction area of the elastic part is 0.01 to 60mm ² 。

5. The probe according to claim 4, wherein the maximum width of the probe is 1 to 20mm,

the width of elastic part is 0.1 ~ 4mm, perhaps, the elastic part comprises a plurality of banded elastic modulus that the interval set up, every the width of banded elastic modulus is 0.05 ~ 2mm, and the clearance width between two adjacent banded elastic modulus is 0.06 ~ 1 mm.

6. The probe of claim 5, wherein the plurality of gaps in the flexible portion have successively increasing widths in a direction away from a center of curvature of the curved portion.

7. The probe of claim 2, wherein the first retaining portion defines one or more hollow channels.

8. The probe according to claim 1, wherein an end of the coupling portion adjacent to the first contact portion is provided with a second stopper portion extending in a direction adjacent to the first contact portion, the second stopper portion abutting against an inner wall of the housing when the probe is received inside the housing to fix the probe and prevent the first contact portion from being inclined in a direction perpendicular to the axial direction.

9. The probe according to claim 1, wherein the substrate of the probe is selected from copper alloy, aluminum alloy or silver-copper alloy, and the surface of the substrate is further plated with a nickel or gold coating.

10. A connector comprising the probe according to any one of claims 1 to 9 and a housing for housing the probe, the probe being housed in the housing with the first contact portion and the second contact portion thereof protruding from a surface of the housing.