CN216670080U

CN216670080U - Probe and connector

Info

Publication number: CN216670080U
Application number: CN202123086044.5U
Authority: CN
Inventors: 郑和海; 张静波; 王涛; 王璞
Original assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Current assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Priority date: 2021-12-09
Filing date: 2021-12-09
Publication date: 2022-06-03
Anticipated expiration: 2031-12-09

Abstract

The application discloses probe and connector, this probe includes: the first contact part and the second contact part are arranged at intervals in the length direction, and the elastic part is used for connecting the first contact part and the second contact part; the elastic part comprises any two or more of a first elastic structure, a second elastic structure and a third elastic structure; the first elastic structure is a bent structure with at least two curvature centers, the first end of the bent structure is connected with the first contact part, and the second end of the bent structure is connected with the first end of the second elastic structure through the first connecting part; the second elastic structure is of a U-shaped structure, and the second end of the second elastic structure is connected with the first end of the third elastic structure through a second connecting part; the third elastic structure is of a C-like structure, and the second end part of the third elastic structure is connected with the second contact part; the probe provided by the utility model well balances the cross section area and the path length of the elastic part and the elasticity provided by the elastic part, and can be applied to high-speed signal transmission and high-current test environments.

Description

Probe and connector

Technical Field

The present disclosure relates to the field of signal transmission and testing technologies, and more particularly, to an elastic flat probe and a connector for use in a testing device suitable for high-speed signal transmission and high-current testing environments.

Background

In the manufacturing process of electronic component modules such as liquid crystal panels and integrated circuits, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to FPC contact electrodes by using probes, or electrode portions of the substrate be connected to a detection device, and the detection operation be completed accordingly.

A probe pin that is commonly used at present has a pair of contacts that can be contacted with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion that connects between the pair of contacts. The probe pin ensures contact pressure between the contact and the electrode terminal of the electronic component and the electrode terminal of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminal of the electronic component and the electrode terminal of the connected electronic component. In addition to the index of contact reliability, in order to meet the use requirements for high-speed, large-current signal transmission, it is required that the conductive resistance of the probe is as low as possible.

At present, the resistance of a conduction path between two contact parts is generally reduced by reducing the path length of an elastic part and increasing the cross-sectional area of the path of the elastic part; this method can actually effectively reduce the resistance of the probe, but at the same time, increasing the cross-sectional area of the path of the elastic portion and reducing the path length of the elastic portion will significantly increase the elastic force of the elastic portion, and in order to ensure good contact between the object to be measured and the probe during use, a clamping structure associated therewith needs to provide a large clamping force, which may crush the object to be measured. Therefore, in the structural design process of the probe, the relative balance among the cross-sectional area (conductive resistance) of the elastic part, the path length of the elastic part and the elastic force provided by the elastic part needs to be considered, the elastic force of the elastic part is reduced while the cross-sectional area is increased to reduce the conductive resistance so as to improve the overcurrent capacity, and the probe and a contact object of the probe are prevented from being damaged due to excessive elastic force/clamping force.

SUMMERY OF THE UTILITY MODEL

In view of at least one of the defects or the improvement requirements of the prior art, the utility model provides a probe and a connector suitable for high-current high-speed signal testing, and aims to solve the problems that the probe is easy to damage and contact objects due to overlarge probe elasticity caused by increasing the cross-sectional area and reducing the conduction path of the conventional probe.

To achieve the above object, according to one aspect of the present invention, there is provided a probe including first and second contact portions spaced apart in a length direction, and further including an elastic portion connecting the first and second contact portions; the elastic part comprises any two or more of a first elastic structure, a second elastic structure and a third elastic structure;

the first elastic structure is a bent structure with at least two curvature centers, the first end of the bent structure is connected with the first contact part, and the second end of the bent structure is connected with the first end of the second elastic structure through the first connecting part;

the second elastic structure is of a U-shaped structure, and the second end of the second elastic structure is connected with the first end of the third elastic structure through a second connecting part; the third elastic structure is of a C-like structure, and the second end part of the third elastic structure is connected with the second contact part;

the first elastic structure, the second elastic structure and the third elastic structure are arranged at intervals in the length direction.

Preferably, the first elastic structure of the probe includes a first bending portion, a second bending portion, and a first straight portion connected in sequence;

the first bending part is provided with an S-shaped structure extending along the width direction, a first end part of the first bending part is connected with the first contact part, and a second end part of the first bending part is connected with the first straight line part through the second bending part; the first straight portion is connected to the first coupling portion.

Preferably, the probe has the second bending portion, the second elastic structure, and the third elastic structure, which have centers of curvature respectively disposed on the same side with respect to the elastic portion.

Preferably, the probe has a first coupling portion including a second linear portion, a third bent portion, and a third linear portion;

the first end part of the second straight line part is connected with the first elastic structure, and the second end part is connected with the third straight line part through the third bent part;

the third bending part and the second/third elastic structure have centers of curvature respectively disposed at different sides with respect to the elastic part.

Preferably, the probe pin has a second coupling portion including a fourth linear portion, a fourth bent portion, and a fifth linear portion;

one end of the fourth straight line part is connected with the second end of the second elastic structure, and the other end of the fourth straight line part is connected with the fifth straight line part through the fourth bent part;

the curvature centers of the fourth bending part and the second/third elastic structure are respectively disposed at different sides relative to the elastic part.

Preferably, the probe pin has a first contact portion having a sixth linear portion extending in the longitudinal direction and a seventh linear portion extending in the width direction; the first end part of the sixth straight line part is provided with a first contact part which can be matched with a contact terminal of the measured object, and the second end part is connected with the first end part of the seventh straight line part; and the second end part of the seventh straight line part is connected with the first elastic structure.

Preferably, the probe has a first contact portion provided with a first stopper portion;

the first limiting part extends along the width direction by taking the joint of the first elastic structure and the seventh straight line part as a starting point. The first limiting part is abutted against the inner wall of the shell when the probe is accommodated in the shell so as to fix the probe.

Preferably, the second contact portion of the probe is in a straight-line structure, one side of the second contact portion is connected to the third elastic structure, and the other side of the second contact portion has at least one second contact portion capable of being matched with a contact terminal of an object to be measured.

Preferably, the probe has a second contact portion provided with a second stopper portion;

the second limiting portion extends in the width direction with a joint of the third elastic structure and the second contact portion as a starting point, and curvature centers of the second limiting portion and the third elastic structure are respectively arranged on different sides relative to the elastic portion. The second limiting part is abutted against the inner wall of the shell when the probe is accommodated in the shell so as to fix the probe.

Preferably, the first elastic structure, the second elastic structure, the third elastic structure, the first coupling portion and the second coupling portion of the probe are respectively a band-shaped elastic piece, or a plurality of band-shaped elastic pieces arranged at intervals.

Preferably, in the probe, the width of the band-shaped elastic piece in the first coupling portion and the second coupling portion is not smaller than the width of the band-shaped elastic piece in the first elastic structure, the second elastic structure, and the third elastic structure.

Preferably, in the probe, the sum of the widths of all the strip-shaped elastic pieces in the first elastic structure is not greater than the minimum width of the second contact portion and the first contact portion.

According to another aspect of the present invention, there is also provided a connector having the probe described in any one of the above and a housing accommodating the probe, the probe being accommodated in the housing with end portions of the first contact portion and the second contact portion thereof protruding from a surface of the housing.

In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:

(1) the utility model provides a probe and a connector, wherein an elastic part of the probe and the connector comprises any two or more of a first elastic structure, a second elastic structure and a third elastic structure; the first elastic structure is a bending structure with at least two curvature centers, the second elastic structure is a U-shaped structure, and the third elastic structure is a C-shaped structure; weakening the elasticity of the third elastic structure through the first elastic structure and the second elastic structure, and reducing the path length of the first elastic structure through the second elastic structure and the third elastic structure; the balance between the cross-sectional area of the elastic part, the path length and the elastic force provided by the elastic part is maintained by the structure of the elastic force grading transmission. Therefore, even if the cross section area of the elastic part is increased to reduce the conductive resistance, the elastic force of the probe can be reduced as much as possible on the premise of ensuring that the first contact part is well contacted with the end terminal of the detected object, and the probe and the contact object thereof are prevented from being damaged due to excessive elastic force/clamping force.

(2) The probe and the connector provided by the utility model fix the probe accommodated in the shell through the first limit part arranged in the first contact part and the second limit part arranged on the second contact part, prevent the probe from moving up and down, prevent the probe from tilting left and right under the action of the elastic part, and ensure the accurate butt joint of the first contact part and the object to be measured.

(3) The probe and the connector provided by the utility model have simple structures and simple and convenient arrangement, and the conductive resistance of the probe is reduced by increasing the cross section area of the elastic part, so that the possibility is provided for the transmission of high-speed signals and the application under a high-current test environment; and on the basis of realizing the reliable connection of the two contact parts of the probe, the elasticity of the probe is reduced as much as possible, the probe is prevented from being damaged, the application range of the probe is expanded, the application cost of the probe is reduced, and the probe has better application prospect and popularization value.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

Fig. 1 is a schematic three-dimensional structure diagram of a probe provided in this embodiment;

FIG. 2 is a schematic plan view of the probe provided in this embodiment;

fig. 3 is a front view of a plurality of first contact portions having different shapes provided in the present embodiment;

fig. 4 is a schematic plan view of the first elastic structure provided in this embodiment;

fig. 5 is a detailed structural schematic diagram of the first elastic structure provided in this embodiment;

FIG. 6 is a schematic diagram of a detailed structure of the second elastic structure provided in this embodiment;

fig. 7 is a detailed structural schematic diagram of a third elastic structure provided in this embodiment;

fig. 8 is a schematic view of a center of curvature of the first elastic structure provided in the present embodiment;

FIG. 9 is a schematic view of the centers of curvature of the second resilient structure, the third resilient structure, the first link, and the second link provided in this embodiment;

fig. 10 is a schematic structural deformation diagram of the probe provided in this embodiment in an unstressed state and an axially stressed state;

fig. 11 is a schematic cross-sectional view of a connector according to an embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the utility model and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the utility model.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature "under," "beneath," and "under" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

The following description is merely exemplary in nature and is not intended to limit the present invention, the application of the present invention, or the uses of the present invention. Further, the drawings are schematic, and the proportions of the respective dimensions and the like do not necessarily coincide with the actual situation.

FIG. 1 is a schematic diagram of a three-dimensional structure of a probe provided in this embodiment; FIG. 2 is a schematic plan view of the probe provided in this embodiment; the probe 1 is a thin plate, has conductivity, and is integrally molded. Referring to fig. 1 and 2, the probe 1 includes a first contact portion 2, an elastic portion 3, and a second contact portion 4;

wherein, one end of the first contact part 2 is provided with a first contact part 21 which can be matched with a contact terminal of a measured object; fig. 3 shows a front view of a plurality of first contact portions 2 having different shapes, and the first contact portion 21 can be appropriately changed in shape according to the design of the probe 1 and the like, and is not limited to the shape shown in fig. 3; for example, the first contact portion 21 can be designed to have a shape and a position appropriately changed according to the form of the contact terminal of the object to be tested so that the contact surface between the probe 1 and the object to be tested can be as large as possible during the test, or to have another shape according to the specific shape of the contact terminal pair of the object to be tested.

The elastic part 3 has a first end 31 and a second end 32, the first contact part 2 is connected with the first end 31 on the first elastic structure 3; the second contact portion 4 is connected to the second end portion 32 of the first elastic structure 3; the elastic part 3 can stretch and contract along the length direction of the probe 1; the probe 1 is a thin plate, has conductivity, and is integrally molded.

With reference to fig. 1 and 2, the elastic portion 3 includes a first elastic structure 6, a second elastic structure 7 and a third elastic structure 8; wherein, the first elastic structure 6 is a bent structure with at least two curvature centers, one end of the first elastic structure is connected with the first contact part 2, and the other end is connected with the second elastic structure 7 through a first connecting part 39;

the second elastic structure 7 has a U-like structure, which is connected to the third elastic structure 8 by a second link 40; the third elastic structure 8 has a C-like structure, which is connected to the second contact portion 4;

the respective ends of the first, second and third elastic structures 6, 7, 8 are arranged at intervals in the length direction of the probe 1.

In this embodiment, the path of the first elastic structure 6 in the elastic portion is the longest, and the paths of the second elastic structure 7 and the third elastic structure 8 decrease in sequence; on the contrary, the elasticity of the first elastic structure 6 is the smallest, and the elasticity of the second elastic structure 7 and the third elastic structure 8 is increased in sequence; therefore, after the probe is pressed, the deformation amounts of the first elastic structure 6, the second elastic structure 7 and the third elastic structure 8 are different, wherein the deformation amount of the first elastic structure 6 with at least two curvature centers is the largest, the deformation amount of the second elastic structure 7 with the U-shaped structure is the second largest, and the deformation amount of the third elastic structure 8 with the C-shaped structure is the smallest.

In this embodiment, the elasticity of the third elastic structure 8 is weakened by the first elastic structure 6 and the second elastic structure 7, and the path length of the first elastic structure 6 is reduced by the second elastic structure 7 and the third elastic structure 8; the balance between the cross-sectional area (conductive resistance) of the spring, the path length and the spring force it provides is maintained by this configuration of spring force step transfer. Therefore, even if the cross-sectional area of the elastic part is increased to reduce the conductive resistance, the elastic force of the probe can be reduced as much as possible on the premise of ensuring that the first contact part is in good contact with the end terminal of the detected object, and the probe (the first contact part) and the contact object thereof are prevented from being damaged due to excessive elastic force/clamping force.

It should be noted that the elastic portion 3 in the present embodiment includes three different types of elastic structures, i.e., a first elastic structure having at least two curvature centers, a second elastic structure having a U-like structure, and a third elastic structure having a C-like structure, but the number of each elastic structure is not limited to one shown in the drawings, and may be plural, and the number of the three different types of elastic structures is not limited to be completely equal, and is determined according to the overall elastic force required by the probe. In addition, the elastic portion 3 does not necessarily have to include three different types of elastic structures at the same time, but may also be a combination of any two types of elastic structures, for example, the elastic portion 3 includes the first elastic structure 6 and the second elastic structure 7, and then the second elastic structure 7 is directly connected to the second contact portion 4 through the second connecting portion 40; the shape of the second coupling part 40 may be slightly changed at this time so that the end thereof may be connected to the second contact part 4 in the length direction. For example, if the elastic portion 3 comprises the first elastic structure 6 and the third elastic structure 8, the first attachment portion 39 and the second elastic structure 7 are omitted. If, on the other hand, the spring part 3 comprises the second spring structure 7 and the third spring structure 8, the first spring structure 6 is omitted, and the shape of the first coupling part 39 can be changed slightly so that its end can be connected to the first contact part 2 in the longitudinal direction.

Referring to fig. 4, the first elastic structure 6 includes a first bending portion 61, a second bending portion 62 and a first straight portion 63 connected in sequence;

wherein, the first bending part 61 has an S-shaped structure extending along the width direction, one end of which is connected to the first contact part 2, and the other end of which is connected to the first straight part 63 through the second bending part 62; the first straight portion 63 is connected to the first coupling portion 39. In a specific example, the first bent portion 61 has two

curvature centers

01 and 02, and the two

curvature centers

01 and 02 are respectively disposed at different sides relative to the first bent portion 61, wherein the curvature center 01 is located at one side of the first bent portion 61 close to the first contact portion 2, and the curvature center 02 is located at the other side of the first bent portion 61 away from the first contact portion 2; the center of curvature of the second bent portion 62 is also located on the other side of the first bent portion 61 away from the first contact portion 2; thus, the first elastic structure 6 is a bent structure having three centers of curvature. The centers of curvature of the second bending portion 62, the second elastic structure 7 and the third elastic structure 8 are respectively disposed on the same side with respect to the elastic portion 3.

With continued reference to fig. 2, in one embodiment, the first coupling portion 39 and the second coupling portion 40 are used as the connecting portions between two adjacent elastic structures, and both have a U-shaped structure; the first connecting portion 39 is connected to the first elastic structure 6 and the second elastic structure 7 by two linear portions, and the second connecting portion 40 is connected to the second elastic structure 8 and the third elastic structure 8 by two linear portions. The centers of curvature of the bent portions of the first and

second coupling portions

39, 40 and the centers of curvature of the second and third elastic structures 7, 8 are disposed on different sides with respect to an imaginary straight line L, which is substantially a center line of the probe 1 in the width direction. Generally, the longer the path of the first and

second coupling parts

39, 40, the less the elastic force of the probe 1; the shapes of the first coupling portion 39 and the second coupling portion 40 are not limited to the U-shaped structure shown in the drawings, and are adjusted according to the kinds and the number of the elastic structures.

The first contact portion 2 has a sixth straight portion 22 extending in the length direction and a seventh straight portion 23 extending in the width direction; a first end of the sixth straight line part 22 is provided with a first contact point part 21 which can be matched with a contact terminal of the measured object, and a second end is connected with a first end of the seventh straight line part 23; a second end of the seventh linear portion 23 is connected to the first resilient structure 6. In a preferred example, the first contact portion 2 is provided with a first stopper portion 24; the first position-limiting portion 24 extends in the width direction with a connection 25 between the first elastic structure 6 and the seventh linear portion as a starting point. The first stopper 24 is abutted against the inner wall of the housing when the probe is accommodated in the housing to fix the probe 1 and to limit the amount of deformation of the first elastic structure 6.

In a specific example, the second contact portion 4 is in a straight-line structure, and one side of the straight-line structure is connected to the third elastic structure 8, and the other side of the straight-line structure has at least one second contact portion 41 capable of matching with a contact terminal of the object to be tested. The second contact portions 41 are formed in an inverted symmetrical trapezoidal boss pattern, and the contact surfaces are short sides of the trapezoidal bosses for contacting with a switching FPC/PCBA or other conduction adapter of the inspection device, and two of the second contact portions 41 are generally designed with a gap left therebetween. The shape of the second contact portion 41 can be appropriately changed according to the design of the probe 1 and the like, and is not limited to the shape shown in fig. 7; for example, the second contact portion 41 may be designed to have a shape and a position that are appropriately changed according to the form of the contact terminal of the inspection apparatus so that the contact surface between the probe 1 and the inspection apparatus is as large as possible during the test, or may have another shape according to the specific shape of the contact terminal pair of the inspection apparatus.

In a preferred example, the second contact portion 4 is provided with

second stopper portions

42, 43; the second stopper 43 extends in the width direction with the joint of the third elastic structure 8 and the second contact portion 4 as a starting point, and the curvature centers of the second stopper and the third elastic structure 8 are respectively disposed on different sides with respect to the elastic portion. The second stopper 43 may limit the amount of deformation of the third elastic structure 8. The

second stoppers

42 and 43 abut against the inner wall of the housing when the probe 1 is housed in the housing to fix the probe 1.

In this embodiment, the first elastic structure 6, the second elastic structure 7, the third elastic structure 8, the first coupling portion 39 and the second coupling portion 40 may be a band-shaped elastic sheet, or may be a plurality of band-shaped elastic sheets arranged at intervals. In general, the elastic portion 3 may be provided as a plurality of spaced strip-like elastic pieces in order to reduce the elastic force of the entire probe 1.

The first elastic structure 6, the second elastic structure 7, and the third elastic structure 8 each have two belt-like elastic pieces provided at intervals, and the first coupling portion 39 and the second coupling portion 40 are both belt-like elastic pieces.

Referring to fig. 2, the first elastic structure 6 has two belt-like

elastic pieces

33 and 34 disposed at a distance 51 from each other, the second elastic structure 7 has two belt-like

elastic pieces

35 and 36 disposed at a distance 52 from each other, and the third elastic structure 8 has two belt-like

elastic pieces

37 and 38 disposed at a distance 53 from each other. The first coupling portion 39 and the second coupling portion 40 each have a band-shaped elastic piece.

As shown in fig. 5 to 7, the band-like

elastic pieces

33, 34 in the first elastic construction 6 have a combined S-shape and arc-shape, the band-like

elastic pieces

35, 36, 39, 40 have a U-shaped elongated band shape, and the band-like

elastic pieces

37, 38 have a semicircular band shape. Referring to fig. 3, the belt-like

elastic pieces

33 and 34 are composed of

linear portions

311 and 312,

curved portions

331 and 341,

curved portions

332 and 342,

curved portions

333 and 343,

linear portions

334 and 344, and linear portions 335 and 345; the

straight portions

311 and 312 are tangent to the

curved portions

331 and 341, the

curved portions

331 and 341 and the

curved portions

332 and 342 are tangent to the

curved portions

333 and 343, and the

curved portions

333 and 343 are not tangent to the

straight portions

334 and 344.

The belt-like elastic piece 39 includes a linear portion 391, a curved portion 392, and a linear portion 393; the

straight line parts

334 and 344 are transitionally connected with the straight line part 391 through an arc; the straight line part 391 is connected with the straight line parts 335 and 345 in a transition way through a circular arc; the

straight portions

391 and 393 are tangent to the bent portion 392.

The belt-like

elastic pieces

35, 36 include

linear portions

351, 361,

linear portions

352, 362,

curved portions

353, 363,

linear portions

354, 364, and

linear portions

355, 365; the straight-line part 393 is in transition connection with the straight-

line parts

351 and 361 through a circular arc; the

straight line parts

352 and 362 are connected with the

straight line parts

351 and 361 through a circular arc transition; the

straight portions

352, 362 and the

straight portions

354, 364 are tangent to the

curved portions

353, 363, respectively.

The belt-like elastic piece 40 has a linear portion 401, a curved portion 402, and a linear portion 403; the

straight line parts

354 and 364 are connected with the

straight line parts

355 and 365 through a circular arc transition; the straight portion 401 and the

straight portions

355 and 365 are connected by an arc transition.

The band-shaped

elastic pieces

37, 38 include

linear portions

371, 381,

curved portions

372, 382, and

linear portions

373, 383. The

straight portions

373 and 383 may be regarded as a part of the second contact portion 4, that is, a strip-shaped elastic piece is disposed at a connection portion between the third elastic structure 8 and the second contact portion 4, and thus the elastic force of the third elastic structure 8 is reduced without increasing the path length of the elastic portion.

As an example, the belt-like

elastic pieces

33, 34, 35, 36, 37, 38, 39, and 40 have substantially the same cross-sectional area.

Referring to fig. 8 and 9, the curvature centers O1 of the

curved portions

331 and 341 are right of the linear portions 311 and 321 and outside the

curved portions

332 and 342; the curvature centers O2, O3 of the

curved portions

332, 342 and the

curved portions

333, 343 are rightward of the linear portions 311, 321, above the

linear portions

334, 344, and outside the

curved portions

331, 341. The center of curvature O4 of the curved portion is midway between the arcs assumed by the curved portion 392, between the line 391 and the line 393, and to the left of the linear portions 311, 321; the center of curvature O5 of the curved portion is midway between the arcs assumed by

curved portions

353, 363, between

straight portions

362, 352 and

straight portions

354, 364, and to the right of straight portions 311, 321; the curvature center O6 of the curved portion is in the middle of the arc assumed by the curved portion 402, between the straight portion 401 and the straight portion 403, and to the left of the straight portions 311, 321, the curvature center O6 being to the left of the curvature center O4; the center of curvature O7 of the

curved portions

372, 382 is in the middle of the arc presented by the curved portion 402, directly below the linear portions 311, 321.

As shown in fig. 5 to 9, the width W2 of the band-shaped

elastic pieces

33, 34, 35, 36, 37, 38 constitutes a minimum width W3 not greater than the gap 51 between the adjacent band-shaped

elastic pieces

33, 34, and the width W1 of the band-shaped

elastic pieces

39, 40 is not smaller than the width W2 of the band-shaped

elastic pieces

33, 34, 35, 36, 37, 38. The minimum width W6 of the seventh straight portion 23, the minimum width W7 of the sixth straight portion 22, and the minimum width W4 or W5 of the second contact portion 4, and the sum of the widths of the respective strip-shaped

elastic pieces

33 and 34 is smaller than the minimum width W4, W5, W6, or W7, thereby reducing the conductive resistance of the first contact portion 2 and the second contact portion 4.

For example, the elastic force generated by the 1 st elastic part 3 deforming under force makes the first contact point part 21 of the first contact part 2 of the probe 1 contact well with the object to be detected (for example, a substrate-to-substrate connector); the elastic force generated by the compression of the elastic part 3 makes the second contact part 41 of the second contact part 4 of the probe 1 well contact with a substrate (for example, a PCB pad) provided in the inspection apparatus.

As shown in fig. 10, when the first contact point portion 21 of the first contact portion 2 of the probe 1 is pressed, the strip-shaped

elastic pieces

33, 34, 35, 36, 37, 38, 39, 40 of the first elastic portion 3 are deformed, wherein the deformation amount of the strip-shaped

elastic pieces

33, 34 is the largest, the deformation amount of the strip-shaped

elastic pieces

35, 36, 37, 38, 39, 40 is smaller, the first contact point portion 21 can move downward to generate a larger displacement amount, the strip-shaped

elastic pieces

33, 34 disperse the pressure required for the displacement of the first contact point portion 21, and prevent the strip-shaped

elastic pieces

35, 36, 37, 38, 39, 40 from being broken due to the concentration of brute force.

In order to make the width and cross-sectional area of each strip-shaped elastic piece as large as possible and to make the elastic force generated by the probe 1 as small as possible when in use, each strip-shaped

elastic piece

33, 34 in the first elastic structure 6 is half S-arc-shaped, each strip-shaped

elastic piece

35, 36 and two connecting

parts

39, 40 in the second elastic structure 7 are U-shaped, each strip-shaped

elastic piece

37, 38 in the third elastic structure 8 is semi-circular, the path of each strip-shaped elastic piece is relatively lengthened, the influence of the lengthened path on the conductor resistance is larger than that of the lengthened path due to the enlarged cross-sectional area of the conductor resistance, so that the overall resistance of the corresponding probe 1 is reduced, and the speed and overcurrent capacity of the transmission signal are increased.

The number of the strip-shaped

elastic pieces

33, 34, 35, 36, 37, 38 in the first elastic portion 3 is not limited to 2, and may be 1 or more than 2; the number of the corresponding arrangements having the mutual spacing (2 spacing intervals 51 in this embodiment) is not limited to 1, and may be 0 or more than 1. The number of the belt-like

elastic pieces

39 and 40 is not limited to 1, and may be more than 1.

The probe 1 of the present invention includes: an elastic section 3 that expands and contracts in the longitudinal direction; a plate-shaped first contact portion 2 connected to a first end 31 of the elastic portion 3 in the longitudinal direction; and a plate-shaped second contact portion 4 connected to a second end portion 32 of the elastic portion 3 in the longitudinal direction. The elastic part 3 is a combination of elastic structures with various shapes, can deform along the length direction, and can be selected to be different combinations according to different application conditions so as to meet different use environments and requirements.

In this embodiment, the probe 1 is a flat plate structure, and is easier to be applied to a smaller distance than a conventional test probe, and the thickness of a general flat test probe can be 0.05-0.2 mm.

The probe 1 is integrally formed, the service life is not influenced by internal friction in the test compression process, and the service life can reach more than 3-5 times of that of a conventional probe.

Compared with the conventional test probe, the probe 1 has the advantages of simpler structure, small volume, easy processing, no need of assembly, more substantial price, application in high-speed signal transmission, large-current environment and the like, and is a new product with combined process, material and structure.

In order to further reduce the conductive resistance of the probe 1, the present embodiment uses materials with better conductive performance, such as copper alloy, aluminum alloy, silver-copper alloy, etc., as the base material for forming the probe; furthermore, the surface of the probe 1 is also plated with a coating of materials such as nickel, gold and the like.

Fig. 11 is a schematic cross-sectional structure view of a connector according to an embodiment of the present invention, referring to fig. 11, the connector 00 includes probes 1 and a housing for receiving the probes 1, each probe 1 and the housing outside the probe 1 constitute an independent detection unit, one or more probes 1 can be disposed inside each housing, for example, a plurality of probes 1 are disposed in parallel in a cross-sectional direction perpendicular to fig. 1 inside the housing, and adjacent probes 1 are spaced at equal intervals; in addition, two adjacent housings may be separately disposed, or may be disposed in parallel by sharing one sidewall, thereby reducing the volume of the entire connector 00. The probe 1 is used in a state of being housed in a case.

As shown in fig. 11, the housing has a substantially rectangular parallelepiped shape, and includes a rubber frame 51 and a cover plate 52; the rubber frame 51 and the cover plate 52 enclose to form a cavity capable of accommodating the probe 1; the probe 1 has a first contact part 2 and a second contact part 4, wherein the end of the first contact part 2 is provided with a first contact point part 21, the second contact part 4 is provided with at least one second contact point part 41, and in fig. 11, the second contact part 4 of each probe 1 is provided with two second contact point parts 41; when the probe is accommodated in the cavity formed by the rubber frame 51 and the cover plate 52, the first contact portion 2 protrudes from the surface of the rubber frame 51, the second contact portion 41 on the second contact portion 4 protrudes from the surface of the cover plate 52, accordingly, the surface of the rubber frame 51 is provided with an opening for allowing the first contact portion 2 to pass through, and the surface of the cover plate 52 is provided with an opening for allowing the second contact portion 41 to pass through.

The first contact point portion 21 on the first contact portion 2 is configured to be contactable with a terminal of an object to be measured (for example, an FPC contact electrode, a substrate-to-substrate (BtoB) connector); the second contact point portion 41 of the second contact portion 4 is configured to be able to contact a terminal of a substrate (for example, FPC/PCBA or other conductive adapter) of the inspection apparatus; in use, the probe 1 having conductivity connects the object to be tested and the inspection apparatus to provide a test signal transmission path.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the utility model, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. A probe comprises a first contact part and a second contact part which are arranged at intervals in the length direction, and also comprises an elastic part which is used for connecting the first contact part and the second contact part; the elastic part is characterized by comprising any two or more of a first elastic structure, a second elastic structure and a third elastic structure;

the respective ends of the first elastic structure, the second elastic structure and the third elastic structure are arranged at intervals in the length direction.

2. The probe according to claim 1, wherein the first elastic structure comprises a first bending part, a second bending part and a first straight part which are connected in sequence;

3. The probe according to claim 2, wherein the centers of curvature of the second bending portion, the second elastic structure and the third elastic structure are respectively disposed on the same side with respect to the elastic portion.

4. The probe according to claim 1, wherein the first coupling portion comprises a second straight portion, a third bent portion, and a third straight portion;

5. The probe of claim 1, wherein the second coupling portion comprises a fourth straight portion, a fourth bent portion, and a fifth straight portion;

6. The probe according to any one of claims 1 to 5, wherein the first contact portion has a sixth linear portion extending in the length direction and a seventh linear portion extending in the width direction; the first end part of the sixth straight line part is provided with a first contact part which can be matched with a contact terminal of the measured object, and the second end part is connected with the first end part of the seventh straight line part; and the second end part of the seventh straight line part is connected with the first elastic structure.

7. A probe according to any of claims 1 to 5, wherein the second contact portion is in the form of a straight line structure having one side connected to the third spring structure and the other side having at least one second contact portion adapted to mate with a contact terminal of an object to be tested.

8. The probe according to any of claims 1-5, wherein the first elastic structure, the second elastic structure, the third elastic structure, the first coupling portion and the second coupling portion are respectively a strip-shaped elastic sheet or a plurality of strip-shaped elastic sheets arranged at intervals.

9. The probe of claim 8, wherein the sum of the widths of all the strip-like elastic pieces in the first elastic structure is not greater than the minimum width of the second contact portion and the first contact portion.

10. A connector comprising the probe according to any one of claims 1 to 9 and a housing for housing the probe, wherein the probe is housed in the housing with end portions of the first contact portion and the second contact portion thereof protruding from a surface of the housing.