CN212514713U - Probe and connector suitable for high-current high-speed signal test - Google Patents

Abstract

The utility model discloses a probe and a connector suitable for high-current high-speed signal test, wherein the probe comprises a first contact part, an elastic part, a connecting part and a second contact part; the elastic part comprises a first straight line part, a first bending part and a second straight line part; the first straight line part extends along the direction vertical to the axial direction, and one end of the first straight line part is connected with the other end of the first contact part; the second straight line part extends along the direction vertical to the axial direction and one end of the second straight line part is connected with the connecting part; the first bending part is of a C-like structure, one end part of the first bending part is connected with the first straight line part, and the other end part of the first bending part is connected with the second straight line part; the distance between the first straight line part and the second straight line part is smaller than the maximum inner diameter of the first bending part in the axial direction; the connecting part extends in the axial direction to connect the second linear part and the second contact part; the utility model provides a probe can reduce the elasticity of elasticity portion simultaneously at the increase cross-sectional area, prevents that probe and contact object from taking place to damage because of too big elasticity/clamping-force.

Description

Probe and connector suitable for high-current high-speed signal test

Technical Field

The utility model belongs to the technical field of signal transmission and test, more specifically relates to an elasticity flat probe and connector that use on the test equipment suitable for high rate signal transmission, heavy current test service environment.

Background

In the manufacturing process of electronic parts such as liquid crystal panels and integrated circuits, it is necessary to perform conduction detection and operation characteristic inspection of products, and a specific detection method is to connect electrode portions such as FPC contact electrodes connected to a main substrate of an electronic part module or a substrate-to-substrate connector mounted thereon and an inspection apparatus using probes to perform such detection.

A probe pin that is commonly used at present has a pair of contacts that can be brought into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion that connects between the pair of contacts. The probe ensures contact pressure between the contact and the electrode terminals of the electronic component and the electrode terminals of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminals of the electronic component and the electrode terminals of the connected electronic component. In addition to the index of contact reliability, in order to meet the use requirements of high-speed and large-current signal transmission, the conductive resistance of the probe is required to be as small as possible.

The utility model patent application publication No. CN111033273A, utility model "probe, inspection tool, inspection unit and inspection apparatus", in order to reduce the resistance of the conduction path, a snake-shaped elastic part with an excessively long conduction path is improved, and according to the description in paragraph 0047, the resistance of the conduction path between two contact parts is reduced by reducing the length of the path of the elastic part and increasing the cross-sectional area of the path of the elastic part; it is needless to say that the elastic part structure can effectively reduce the resistance of the probe, but at the same time, increasing the cross-sectional area of the path of the elastic part and reducing the path length of the elastic part will significantly increase the elastic force of the elastic part, and in order to ensure good contact between the object to be measured and the probe during use, a clamping structure associated with the elastic part needs to provide a large clamping force, which may crush the object to be measured. Therefore, in the structural design process of the probe, the relative balance between the cross-sectional area (conductive resistance) of the elastic part and the elastic force provided by the elastic part needs to be considered, the elastic force of the elastic part is reduced while the cross-sectional area is increased to reduce the conductive resistance so as to improve the overcurrent capacity, and the probe and a contact object of the probe are prevented from being damaged due to excessive elastic force/clamping force.

SUMMERY OF THE UTILITY MODEL

To at least one defect or improvement demand of prior art, the utility model provides a probe and connector suitable for high-speed signal test of heavy current, its aim at solve the increase cross-sectional area that current probe exists and reduce the probe elasticity that conduction path leads to too big, damage the problem of probe and contact object easily.

To achieve the above object, according to one aspect of the present invention, there is provided a probe suitable for high current high speed signal testing, comprising a first contact portion, an elastic portion, a coupling portion and a second contact portion;

one end of the first contact part is provided with a first contact part which can be matched with a contact terminal of the object to be measured; the elastic part can deform along the axial direction of the probe when being stressed and comprises a first straight line part, a second bent part, a first bent part, a third bent part and a second straight line part which are arranged on the same side of the axial direction;

the first straight line part extends along the direction vertical to the axial direction, and one end of the first straight line part is connected with the other end of the first contact part; the second straight line portion extends in a direction perpendicular to the axial direction and has one end connected to the coupling portion; the first bending part is of a C-like structure, one end of the first bending part is connected with the other end of the first straight line part through the second bending part, and the other end of the first bending part is connected with the other end of the second straight line part through the third bending part;

the distance between the first straight line part and the second straight line part is smaller than the maximum inner diameter of the first bending part along the axial direction, and the curvature centers of the second bending part, the first bending part and the third bending part are sequentially and alternately arranged on different sides of the elastic part;

the coupling portion extends in the axial direction and is used for connecting the second linear portion and the second contact portion; the second contact part is arranged at the other end of the second elastic part and is provided with at least one second contact part.

Generally, through the utility model discloses above technical scheme who conceives compares with prior art, can gain following beneficial effect:

(1) the utility model provides a probe suitable for high-speed signal test of heavy current, its elasticity portion includes first straight line portion, second flexion, first flexion, third flexion and second straight line portion that dispose in the same one side of the axial direction of probe; the first bending part is of a C-like structure, one end part of the first bending part is connected with the other end of the first straight line part through the second bending part, and the other end part of the first bending part is connected with the other end of the second straight line part through the third bending part; the distance between the first straight line part and the second straight line part is smaller than the maximum inner diameter of the first bending part along the axial direction, and the curvature centers of the second bending part, the first bending part and the third bending part are sequentially and alternately arranged on different sides of the elastic part; therefore, the elastic part can reduce the elastic force of the probe as much as possible on the premise of ensuring that the first contact part is well contacted with the terminal of the detected object while the cross section area of the elastic part is increased to reduce the conductive resistance, and the probe (the first contact part) and the contact object thereof are prevented from being damaged due to excessive elastic force/clamping force.

(2) The utility model provides a probe suitable for high-speed signal test of heavy current, when the elastic component was the definite value along the ascending extension length of perpendicular to axial direction, the elasticity size of probe was adjusted through the length proportion between adjustment first flexion and first straight line portion, the second straight line portion to reach the purpose that suitably reduces probe elasticity in the cross-sectional area of increase elastic component.

(3) The utility model provides a probe suitable for high-speed signal test of heavy current, the ratio control of the effective width of elasticity portion and the probe along the ascending maximum width in the vertical axial direction is in 1:300 ~ 1:10 within range, reduces the resistance of probe in order to increase its ability of overflowing through the effective conduction width/cross-sectional area of increase elasticity portion, improves signal transmission speed.

(4) The utility model provides a probe suitable for high-speed signal test of heavy current, the first spacing portion that sets up in the second contact part and the spacing portion of second that sets up on first contact part are fixed taking in the inside probe of casing, prevent the probe activity from top to bottom to prevent that first contact part from taking place the horizontal tilt under the effect of elasticity portion, ensure the accurate butt joint of first contact part and measured object.

(5) The utility model provides a probe suitable for high-speed signal test of heavy current, its simple structure sets up portably, reduces the conductive resistance of probe through the cross-sectional area that increases the elasticity portion, provides probably for the transmission of high rate signal and the application under the heavy current test environment; and on the basis of realizing the reliable connection of the two contact parts of the probe, the elasticity of the probe is reduced as much as possible, the probe is prevented from being damaged, the application range of the probe is expanded, the application cost of the probe is reduced, and the probe has better application prospect and popularization value.

Drawings

FIG. 1 is a schematic diagram of a conventional probe;

fig. 2 is a schematic cross-sectional view of a connector according to an embodiment of the present invention;

fig. 3 is a schematic three-dimensional structure diagram of a probe provided by an embodiment of the present invention;

fig. 4 is a schematic plan view of a probe according to an embodiment of the present invention;

fig. 5 is a front view of a plurality of first contact portions having different shapes provided by the embodiment of the present invention;

fig. 6 is a detailed structure diagram of the elastic part according to the embodiment of the present invention;

fig. 7 is a partial structural view when the first bending portion has a circular shape, in which fig. 7(a) shows a case where an outer diameter L3 of the first bending portion is smaller than an extension length L4 of the first and second linear portions in the probe width direction, and fig. 7(b) shows a case where an outer diameter L3 of the first bending portion is larger than an extension length L4 of the first and second linear portions in the probe width direction;

fig. 8 is a partial structural view when the first bending part has an elliptical shape, in which fig. 8(a) shows a case where a maximum outer diameter L5 of the first bending part in the probe width direction is smaller than a maximum outer diameter L6 of the first bending part in the probe length direction, and fig. 8(b) shows a case where a maximum outer diameter L5 of the first bending part in the probe width direction is larger than a maximum outer diameter L6 of the first bending part in the probe length direction;

fig. 9 is a schematic structural deformation diagram of the probe according to the embodiment of the present invention in an unstressed state and an axially stressed state;

in all the figures, the same reference numerals denote the same features, in particular:

1 Probe

2 first contact part

21 first contact part

3 elastic part

31 first end part

32 second end portion

4 second contact part

41 second contact part

42 second limit part

43 first limit part

9 connecting part

33. 34 elastic strip

331. 341 first end portion

332. 342 second end portion

51 gap

61. 71 first straight line part

62. 72 second bend

63. 73 first bend

64. 74 third bend

65. 75 second straight line part

W1, W6, W7 Width

W2 minimum gap width

O1, O2, O3 center of curvature

Outer diameter of L3 when first curved part is circular

L4 extension lengths of the first and second straight parts in the probe width direction

Maximum outer diameter in the probe width direction when the first curved portion of L5 is oval

Maximum outer diameter of L6 in the length direction of the probe when the first bending part is elliptic

00 connector

30 rubber frame

40 cover plate.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. Furthermore, the technical features mentioned in the embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship indicated based on the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

The following description is merely exemplary in nature and is not intended to limit the present invention, the applications thereof, or the uses thereof. Further, the drawings are schematic, and the proportions of the respective dimensions and the like do not necessarily coincide with the actual situation.

Fig. 2 is a schematic cross-sectional structure view of a connector according to an embodiment of the present invention, referring to fig. 2, the connector 00 includes probes 1 and a housing for receiving the probes 1, each probe 1 and the housing outside the probe 1 constitute an independent detection unit, one or more probes 1 can be disposed inside each housing, for example, a plurality of probes 1 are disposed side by side in a cross-sectional direction perpendicular to fig. 2 inside the housing, and adjacent probes 1 are spaced at equal intervals; in addition, two adjacent housings may be separately disposed, or may be disposed in parallel by sharing one sidewall, thereby reducing the volume of the entire connector 00. The probe 1 is used in a state of being housed in a case.

As shown in fig. 2, the case has a substantially rectangular parallelepiped shape, and includes a rubber frame 30 and a cover plate 40; the rubber frame 30 and the cover plate 40 enclose to form a cavity capable of accommodating the probe 1; the probe 1 has a first contact part 2 and a second contact part 4, wherein the end of the first contact part 2 is provided with a first contact point part 21, the second contact part 4 is provided with at least one second contact point part 41, and in fig. 1, the second contact part 4 of each probe 1 is provided with two second contact point parts 41; when the probe is accommodated in the cavity formed by the rubber frame 30 and the cover plate 40, the first contact portion 2 protrudes from the surface of the rubber frame 30, the second contact portion 41 on the second contact portion 4 protrudes from the surface of the cover plate 40, and accordingly, the surface of the rubber frame 30 is provided with an opening for allowing the first contact portion 2 to pass through, and the surface of the cover plate 40 is provided with an opening for allowing the second contact portion 41 to pass through.

The first contact point portion 21 on the first contact portion 2 is configured to be contactable with a terminal of an object to be measured (for example, an FPC contact electrode, a substrate-to-substrate (BtoB) connector); the second contact point portion 41 of the second contact portion 4 is configured to be able to contact a terminal of a substrate (for example, FPC/PCBA or other conductive adapter) of the inspection apparatus; in use, the probe 1 having conductivity connects the object to be tested and the inspection apparatus to provide a test signal transmission path.

FIG. 3 is a schematic three-dimensional structure diagram of the probe provided in this embodiment; FIG. 4 is a schematic plan view of the probe provided in this embodiment; referring to fig. 3 and 4, the probe 1 includes a first contact portion 2, an elastic portion 3, a coupling portion 9, and a second contact portion 4;

wherein, one end of the first contact part 2 is provided with a first contact part 21 which can be matched with a contact terminal of a measured object; fig. 5 shows a front view of a plurality of first contact portions 2 having different shapes, and the first contact portion 21 can be appropriately changed in shape according to the design of the probe 1 and the like, and is not limited to the shape shown in fig. 4; for example, the first contact portion 21 can be designed to have a shape and a position appropriately changed according to the form of the contact terminal of the object to be tested so that the contact surface between the probe 1 and the object to be tested can be as large as possible during the test, or to have another shape according to the specific shape of the contact terminal pair of the object to be tested.

The elastic part 3 has a first end 31 and a second end 32, and the first contact part 2 is connected to the first end 31 of the elastic part 3 in the width direction of the probe 1 (i.e., the left-right direction in fig. 4); one end of the coupling portion 9 is connected to the second end 32 of the elastic portion 3 in the width direction of the probe 1; the other end of the link 9 is connected to the second contact portion 4; the probe 1 is a thin plate, has conductivity, and is integrally molded.

In order to reduce the resistance of the probe 1 as much as possible to increase the overcurrent capacity, the effective width (i.e. the length in the width direction perpendicular to the extending direction of the path of the elastic part)/the cross-sectional area of the elastic part 3 needs to be increased as much as possible, and in the embodiment, the ratio of the width of the elastic part 3 to the maximum width of the probe in the perpendicular axial direction is controlled within the range of 1: 300-1: 10; referring to fig. 4, the maximum width of the probe in the vertical axial direction is the length of the second contact portion 4 extending in the vertical axial direction, and in an actual product, the maximum width of the probe ranges from 2 mm to 30 mm.

TABLE 1 minimum Cross-sectional area of Probe conduction Path impact on Probe Performance

Table 1 shows the effect of the minimum cross-sectional area of the probe conduction path on the performance of the probe, the thickness of the probe was uniformly set to 0.11mm, and the path length was the length of the elastic part of the probe; for the new probe provided in this embodiment, L1/L2 is the ratio of the minimum on width of the probe to the probe width, and in this embodiment, the minimum on width of the probe is the width of the elastic part; the minimum cross-sectional area is the cross-sectional area of the elastic part; the elastic force at the needle point represents the elastic force measured by the first contact part of the first contact part; can find out from the parameter in the table, compare in current shell fragment probe, the utility model discloses prolonged the path length of probe, along with the minimum cross-sectional area gradual increase of probe conduction path, the biggest ability of overflowing and the signal transmission rate of probe are showing the increase, and wherein, new probe 10 can reach 11.2Gbps to the transmission rate of signal the highest, and the biggest ability of overflowing can reach 12.6A, show the utility model provides a probe structure has bigger ability of overflowing, the bigger rate signal of accessible, can be applied to in the scene of high-speed signal, heavy current test. In addition, as the minimum cross-sectional area of the probe conduction path is gradually increased, the elastic force at the probe tip is also increased. However, when the probe provided by the embodiment has a minimum cross-sectional area equivalent to that of the conventional pogo pin, the maximum flow capacity and the transmission rate of the probe provided by the embodiment are slightly larger than those of the conventional pogo pin, but the elastic force at the tip of the probe is smaller than that of the conventional pogo pin.

The elastic portion 3 deforms in the axial direction to apply pressure to the first contact point 21 portion and the second contact point portion 41 when the first contact portion 2 is applied with an axial force (i.e., the up-down direction of fig. 4); the elastic portion 3 includes first straight portions 61, 71, second bent portions 62, 72, first bent portions 63, 73, third bent portions 64, 74, and second straight portions 65, 75, which are disposed on the same side in the axial direction of the probe 1; the first bent portions 63, 73 have a C-like configuration, one end portions thereof being connected to the other ends of the first linear portions 61, 71 via the second bent portions 62, 72, and the other end portions thereof being connected to the other ends of the second linear portions 65, 75 via the third bent portions 64, 74; the distance between the first straight portions 61, 71 and the second straight portions 65, 75 is smaller than the maximum inner diameter of the first bent portions 63, 73 in the axial direction, and the centers of curvature O1, O2, O3 of the first bends 62, 72, the first bent portions 63, 73, and the third bent portions 64, 74 are alternately arranged on different sides of the elastic portion 3 in this order, and the central angles thereof are all larger than 0 degree and smaller than 180 degrees.

For example, the elastic portion 3 may be a solid structure, the cross-sectional area of the elastic portion 3 is related to the width and the thickness of the probe 1, and the cross-sectional area of the elastic portion 3 is increased to reduce the conductive resistance of the probe and to improve the overcurrent capability and the signal transmission speed of the probe 1, but the elastic force of the probe 1 is increased accordingly, and the elastic portion is used for increasing the signal transmission speed and the overcurrent capability of the probe 1The contact between the object to be tested and the probe 1 is ensured to be good, a matched clamping structure needs to provide larger clamping force, and the object to be tested is likely to be crushed. And the cross-sectional area of the elastic part 3 is too small, so that the overcurrent capacity and the signal transmission speed of the probe 1 cannot meet the use requirements. Therefore, in the present embodiment, considering that the effective conduction area of the elastic part 3 is increased to reduce the conductive resistance, it is preferable to set the cross-sectional area of the elastic part 3 to be 0.01 to 90mm²More preferably, the thickness of the elastic part 3 (probe 1) is 0.1 to 5mm, and the width of the elastic part 3 is 0.1 to 6 mm. Considering the problem that the increase of the cross-sectional area of the elastic part 3 will increase its elastic force at the same time, the present embodiment designs the detailed structure of the elastic part 3 as follows: the extending directions of the first straight parts 61 and 71 and the second straight parts 65 and 75 are kept perpendicular to the axial direction of the probe 1, so that when the elastic part 3 is subjected to axial pressure, the first straight parts 61 and 71 and the second straight parts 65 and 75 can completely transfer and disperse the pressure along the direction perpendicular to the axial direction (namely the width direction of the probe 1), no axial pressure component exists, and the elastic force generated by the elastic part 3 along the axial direction can be reduced; secondly, the maximum inner diameter of the first curved part 63, 73 in the axial direction is configured to be larger than the distance between the first straight part 61, 71 and the second straight part 65, 75, and the degree of dispersion of the pressure is increased by increasing the length of the first curved part 63, 73, thereby reducing the elastic force; furthermore, the centers of curvature O1, O2, and O3 of the first bends 62 and 72, the first bends 63 and 73, and the third bends 64 and 74 are alternately arranged on different sides of the elastic portion 3 in this order, which is more advantageous for the pressure to be distributed on the elastic portion 3, thereby reducing the elastic force.

As another example, one or more hollow through grooves may be formed in the elastic portion 3 along the extending direction of the elastic portion 3, so that the elastic portion 3 may have a plurality of strip-shaped elastic pieces spaced apart from each other; as a preferred example, the outline of the hollow through groove is parallel to or coincident with the outer edge of the elastic portion 3.

Fig. 6 is a detailed structural view of the elastic portion provided in the present embodiment, and as shown in fig. 6, the elastic portion 3 has two belt-like elastic pieces 33, 34 arranged to be spaced from each other by a space 51; the number of the strip-shaped elastic pieces in the elastic part 3 is not limited to 2, and may be 1 to 6; the number of the corresponding arrangements having the interval therebetween is not limited to 1, and may be 0 to 5.

As shown in fig. 6, each of the elastic band-shaped pieces 33 and 34 is an elongated band-shaped piece, and is similarly divided into a first straight portion 61 and 71, a first bend 62 and 72, a first bend portion 63 and 73, a third bend portion 64 and 74, and a second straight portion 65 and 75. The sectional shapes of the respective belt-like elastic pieces 33, 34 may be configured to be the same or different without affecting the function of the elastic portion 3; as a preferable example, the belt-like elastic pieces 33 and 34 have substantially the same cross-sectional shape.

The first straight portions 61, 71 are disposed below the first contact portion 2 with respect to the first contact portion 2, and extend leftward in the width direction of the probe 1. Further, one end portions of the first linear portions 61 and 71 constitute first end portions 331 and 341 of the respective strip-shaped elastic pieces 33 and 34 (i.e., the first end portion 31 of the elastic portion 3), and are connected to the first contact portion 2 from the width direction of the probe 1.

The second straight portions 65 and 75 are disposed on the left side of the coupling portion 9 with respect to the coupling portion 9, and extend leftward in the width direction of the probe 1. One end of the second linear portions 65 and 75 forms the second end portions 332 and 342 of the respective strip-shaped elastic pieces 33 and 34 (i.e., the second end portions 32 of the elastic portions), and is connected to the coupling portion 9 in the width direction of the probe 1.

The first curved portions 63, 73 have a circular or quasi-circular, elliptical or quasi-elliptical notched arc line as viewed in the plate thickness direction of the first contact portion 2, and one end portion is connected to the second curved portions 62, 72, and the other end portion is connected to the third curved portions 64, 74.

Second curved portions 62, 72 and third curved portions 64, 74, which are first linear portions 61, 71, and second linear portions 65, 75 are transitionally disposed in an arc connecting the first curved portions 63, 73.

The center of curvature O1 of the second curved portions 62, 72 is above the first straight portions 61, 71 and outside the first curved portions 63, 73; the third curved portions 64, 74 have centers of curvature O3 below the second linear portions 65, 75 and outside the first curved portions 63, 73. The center of curvature O2 of the first curved portion 63, 73 is midway of the arc that the first curved portion 63, 73 describes, and is located between the first linear portion 61, 71 and the second linear portion 65, 75.

Further, the present embodiment adjusts the overall elastic force of the probe by adjusting the shape of the first bending portion and the extension length of the first bending portion and the first and second linear portions in the probe width direction. Fig. 7 is a partial structural diagram of the first bending portion when the first bending portion is circular, the outer diameter L3 of the first bending portion 63, 73 and the extension length L4 of the first straight portion 61, 71 or the second straight portion 65, 75 in the width direction of the probe 1 are constant, and the ratio of the outer diameter L3 of the first bending portion 63, 73 to the constant (L3+ L4) is 1:40 to 39: 40. Among them, fig. 7(a) shows the case where L3 is smaller than L4, fig. 7(b) shows the case where L3 is larger than L4, and generally, the larger the outer diameter L3 of the first curved parts 63, 73, the larger the first linear parts 61, 71, and the shorter the extended length L4 of the second linear parts 65, 75, the larger the overall elastic force of the probe 1, so that in order to increase the cross-sectional area of the elastic part 3 and reduce the elastic force of the probe 1, this can be achieved by appropriately extending the first linear parts 61, 71, the length L4 of the second linear parts 65, 75, and reducing the outer diameter L3 of the first curved parts 63, 73; preferably, the ratio of the outer diameter L3 of the first bending parts 63 and 73 to the constant value (L3+ L4) is 1:40 to 1: 2.

Fig. 8 is a partial structural view when the first bending portion has an elliptical shape, in which L5 represents the maximum outer diameter of the first bending portion 63, 73 in the probe width direction, L6 represents the maximum outer diameter of the first bending portion 63, 73 in the probe length (axial direction) direction, and the maximum outer diameter L5 of the first bending portion 63, 73 in the probe 1 width direction is constant with the extension length L4 of the first straight portion 61, 71 or the second straight portion 65, 75 in the probe 1 width direction;

FIG. 8(a) shows a case where L5 is smaller than L6, FIG. 8(b) shows a case where L5 is larger than L6, and when L5 is smaller than L6, the ratio of the maximum outer diameter L5 of the first bending parts 63, 73 in the width direction of the probe 1 to the constant value (L5+ L4) is 1:30 to 19: 20; further preferably, the ratio of L5 to (L5+ L4) is 1: 30-1: 2. When L5 is larger than L6, the ratio of the maximum outer diameter L5 of the first bending parts 63 and 73 in the width direction of the probe 1 to a fixed value (L5+ L4) is 1: 20-29: 30; further preferably, the ratio of L5 to (L5+ L4) is 1: 20-1: 2.

As shown in fig. 4 and 6, the sum of the widths W1 of the respective strip-shaped elastic pieces 33 and 34 (i.e., the lengths of the respective strip-shaped elastic pieces 33 and 34 in the width direction perpendicular to the extending direction of the paths between the first end portions 331 and 341 and the second end portions 332 and 342) (i.e., the effective conduction width of the elastic portion 3) is smaller than the minimum width W6 of the first contact portion 2 and the minimum width W7 of the coupling portion 9, and the electrical resistance of the first contact portion 2 and the second contact portion 4 can be reduced.

Also, considering the relative balance between the cross-sectional area of the elastic part 3 and the elastic force provided by the elastic part, the cross-sectional area of the elastic part 3 is set to 0.01 to 90mm²When the thickness is 0.1 to 5mm, the width W1 of each of the belt-like elastic pieces 33, 34 of the elastic portion 3 is preferably set to 0.05 to 3mm in this embodiment.

The gap 51 between the adjacent belt-like elastic pieces 33, 34 is mainly to prevent the belt-like elastic pieces 33, 34 from contacting each other when the elastic portion 3 is compressed and deformed, and the width W2 of the gap 51 between the adjacent belt-like elastic pieces 33, 34 is preferably set to 0.06 to 1.5 mm; too small a gap increases the processing difficulty, and too large a gap widens the elastic portion 3, and the overall size of the probe 1 increases accordingly.

When the respective elastic band pieces 33, 34 of the elastic portion 3 are compressively deformed, the second bent portions 62, 72 and the third bent portions 64, 74 are slightly more deformed by the elastic band piece 33 on the inner side than the elastic band piece 34 on the outer side; when the number of the elastic band-shaped pieces of the elastic portion 3 is greater than 2, as a preferable example, the gap between the elastic band-shaped pieces is configured such that the gap width on the side close to the curvature center of each elastic band-shaped piece is large, the gap width on the side far from the curvature center is small (the gap width only ensures that the elastic band-shaped pieces do not contact when deformed), and the gap widths are gradually decreased from the inside to the outside, thereby ensuring that the width of the elastic portion 3 is reduced as much as possible on the premise that the elastic band-shaped pieces do not contact when deformed, and offsetting the probe width increased by providing the hollow through groove.

As shown in fig. 4, the coupling portion 9 extends in the axial direction of the probe 1 for connecting the second end portion 32 of the elastic portion 3 (specifically, the second end portions 332, 342 of the respective strip-like elastic pieces 33, 34) and the second contact portion 4; specifically, the second contact portion 4 is disposed at the other end of the elastic portion 3.

The second contact portion 4 includes a first stopper portion 43 extending in the width direction of the probe 1 and a protruding second contact portion 41 provided on a side of the first stopper portion 43 away from the elastic portion 3. As shown in fig. 4, the second contact portions 41 are configured in an inverted symmetrical trapezoidal projection pattern, and the contact surfaces are short sides of the trapezoidal projection for contacting with the switching FPC/PCBA or other conduction adapter of the inspection device, and two are generally designed, with a gap left between the two second contact portions 41. The shape of the second contact portion 41 can be appropriately changed according to the design of the probe 1 and the like, and is not limited to the shape shown in fig. 4; for example, the second contact portion 41 may be designed to have a shape and a position that are appropriately changed according to the form of the contact terminal of the inspection apparatus so that the contact surface between the probe 1 and the inspection apparatus is as large as possible during the test, or may have another shape according to the specific shape of the contact terminal pair of the inspection apparatus.

As a preferable example, at least a part or all of the extension length of the first stopper portion 43 is provided with a hollow groove (not shown in the figure), so that the first stopper portion 43 is configured as a plurality of respective strip-shaped elastic pieces spaced apart from each other; thus, the first stopper 4 can exert its own stopper function and spring function at the same time, and increase the elastic force provided when the probe 1 is extended or retracted without extending its length.

As shown in fig. 4, the first contact portion 2 is provided with a second stopper portion 42, and the second stopper portion 42 extends in a direction perpendicular to the axial direction of the probe 1 and is disposed on the same side of the elastic portion 3 with respect to the first contact portion 2; the second limiting part 42 is arranged above the elastic part 3, and one side surface of the second limiting part, which is far away from the elastic part 3, is provided with a surface which can be attached to the inner wall of the rubber frame 30, which is provided with an opening allowing the first contact part 2 to pass through; the second stopper 42 is abutted against the inner wall of the housing when the probe 1 is accommodated in the housing to fix the probe 1, and prevents the first contact part 2 from being inclined in the left-right direction by the elastic part 3. Referring to fig. 1, the probe 1 is accommodated in the housing, and in an unstressed state, the inner wall of the upper surface of the rubber frame 30 limits the probe 1 through the second limiting portion 42 of the probe 1, and the upper surface of the cover plate 40 limits the probe 1 through the first lower limiting portion 43 of the probe 1, so that the probe 1 is prevented from moving up and down in the housing.

The elastic force generated by the elastic part 3 deforming under force makes the first contact point part 21 of the first contact part 2 of the probe 1 contact well with the terminal of the detected object, and the elastic force can be transmitted to the second contact point part 41 of the second contact part 4 through the connecting part 9 to make the contact well with the terminal of the substrate of the inspection device; figure 9 shows a schematic view of the structural deformation of the probe 1 in an unstressed condition as well as in an axially stressed condition,

as shown in fig. 9, when the first contact point portion 21 on the first contact portion 2 of the probe 1 is subjected to an axial pressure, the first contact point portion 21 can move downward by a large displacement amount, the strip-shaped elastic pieces 33 and 34 of the elastic portion 3 are deformed, the distance between the first straight portions 61 and 71 and the second straight portions 65 and 75 is reduced, the strip-shaped elastic pieces 33 and 34 disperse the pressure required for the displacement of the first contact point portion 21, and the strip-shaped elastic pieces 33 and 34 are prevented from being broken due to the concentration of a brute force.

Since the elastic force of the elastic part 3 is reduced by the structural design under the condition of increasing the cross-sectional area of the elastic part 3, and the structure that the first straight parts 61 and 71 are separated from the second straight parts 65 and 75 in the elastic part 3 causes the elastic part 3 to apply pressure to the elastic part 3 through the first contact part 2, the pressure applied to the second contact part 4 by the elastic part 3 is relatively smaller than the pressure applied to the first contact part 2, in order to ensure the contact reliability between the second contact part 41 of the second contact part 4 and the terminal of the substrate of the inspection device, the embodiment provides a hollow groove on the first limiting part 43, so that the hollow groove has certain elastic force action, and the contact reliability of the second contact part 4 is improved.

As shown in fig. 2, the probe 1 is installed inside the housing, the vertical surface of the housing can play a limiting role in facing the probe 1, and when the first contact part 2 and the second contact part 4 of the probe 1 receive a radial force, the vertical surface of the cavity of the connector 00 can effectively prevent the first contact part 2 and the probe 1 from being damaged due to deformation caused by the integral left-right deviation. In addition, even if the probe 1 provided by the embodiment is not accommodated in the housing, the first contact portion 2 can be prevented from being bent and damaged when the first contact portion 2 receives a radial force; specifically, when the first contact portion 2 receives a radial force (i.e., a force applied in the width direction of the probe 1), the first straight portions 61 and 71 and the second curved portions 62 and 72 in the elastic portion 3 are deformed in a manner of being displaced in the radial direction, and at this time, the stress generated by the deformation of the first straight portions 61 and 71 and the second curved portions 62 and 72 can be uniformly dispersed to the first curved portions 63 and 73, thereby effectively preventing the first contact portion 2 of the probe 1 from being damaged. Therefore, the probe 1 provided by the embodiment can realize effective dispersion and transfer of stress when the probe is subjected to axial force or radial force, avoid damage, and improve the use reliability and service life.

In order to further reduce the conductive resistance of the probe 1, the present embodiment uses materials with better conductive performance, such as copper alloy, aluminum alloy, silver-copper alloy, etc., as the base material for forming the probe; furthermore, the surface of the probe 1 is also plated with a coating of materials such as nickel, gold and the like.

The probe 1 provided by the embodiment is of an integrally formed flat plate structure, the service life is not influenced by internal friction in the test compression process, and the general service life can reach more than 5 times of that of a conventional probe.

Table 2 is a comparison of the size parameters and performance parameters of the probe provided in this example with those of the conventional probe in the prior art, wherein the thickness of the probe is uniformly set to 0.11 mm;

TABLE 2 influence of the width and number of the strip-shaped elastic pieces on the performance of the probe

As can be seen from the parameters in table 2, the new probe provided in this embodiment extends the length of the elastic portion compared to the existing pogo pin, and when the two have the same cross-sectional area, the maximum overcurrent capacity and the transmission rate of the probe are equivalent; the elastic force of the probe is gradually reduced along with the increase of the number of the strip-shaped elastic pieces of the elastic part; however, in the case that the two have equivalent cross-sectional areas and the number of the strip-shaped elastic pieces, the new probe provided by the embodiment has smaller elastic force, and the situation that the elastic force of the probe is too large due to the increase of the cross-sectional area of the elastic part can be prevented.

It will be understood by those skilled in the art that the foregoing is merely a preferred embodiment of the present invention, and is not intended to limit the invention to the particular forms disclosed, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.

Claims (10)

1. A probe suitable for testing a large-current high-speed signal is characterized by comprising a first contact part, an elastic part, a connecting part and a second contact part;

one end of the first contact part is provided with a first contact part which can be matched with a contact terminal of the object to be measured; the elastic part can deform along the axial direction of the probe when stressed and comprises a first straight line part, a first bending part and a second straight line part which are arranged on the same side of the axial direction;

the first straight line part extends along the direction vertical to the axial direction, and one end of the first straight line part is connected with the other end of the first contact part; the second straight line portion extends in a direction perpendicular to the axial direction and has one end connected to the coupling portion; the first bending part is of a C-like structure, one end of the first bending part is connected with the other end of the first straight line part, and the other end of the first bending part is connected with the other end of the second straight line part; the distance between the first straight line part and the second straight line part is smaller than the maximum inner diameter of the first bending part in the axial direction;

the connecting part is used for connecting the second straight line part and the second contact part; the second contact part is arranged at the other end of the second elastic part and is provided with at least one second contact part.

2. The probe according to claim 1, wherein the second contact portion includes a first stopper portion extending in a direction perpendicular to the axial direction and a protruding second contact portion provided on a side of the first stopper portion away from the second elastic portion; one or more hollow through grooves are formed in the first limiting part.

3. The probe according to claim 1, wherein the first curved portion has a circular shape, an outer diameter of the first curved portion and an extension length of the first straight portion or the second straight portion in a direction perpendicular to the axial direction are constant, and a ratio of the outer diameter of the first curved portion to the constant is 1:40 to 39: 40.

4. The probe of claim 1, wherein the first curved portion has an elliptical shape having a first maximum outer diameter in a direction perpendicular to the axial direction that is constant with an extension of the first straight portion or the second straight portion in the direction perpendicular to the axial direction;

when the second maximum outer diameter of the first bending part in the axial direction is larger than the first maximum outer diameter, the ratio of the first maximum outer diameter to the fixed value is 1: 30-19: 20;

when the second maximum outer diameter of the first bending part in the axial direction is smaller than the first maximum outer diameter, the ratio of the first maximum outer diameter to the fixed value is 1: 20-29: 30.

5. The probe according to claim 1, wherein a ratio of a width of the elastic portion to a maximum width of the probe in a direction perpendicular to the axial direction is 1:300 to 1: 10.

6. The probe according to claim 5, wherein the thickness of the probe is 0.1 to 5mm, and the effective conduction areas of the elastic parts are 0.01 to 90mm, respectively²。

7. The probe according to claim 6, wherein the maximum width of the probe is 2 to 30mm,

the width of elastic part is 0.1 ~ 6mm, perhaps, the elastic part comprises a plurality of banded elastic modulus that the interval set up, every the width of banded elastic modulus is 0.05 ~ 3mm, and the clearance width between two adjacent banded elastic modulus is 0.06 ~ 1.5 mm.

8. The probe of claim 7, wherein the resilient portion further comprises a second bend and a third bend;

one end portion of the first curved portion is connected to the first linear portion via the second curved portion, and the other end portion is connected to the second linear portion via the third curved portion; the curvature centers of the second bending part, the first bending part and the third bending part are sequentially and alternately arranged on different sides of the elastic part;

the widths of the plurality of gaps in the second and third curved portions decrease in sequence in a direction away from the respective centers of curvature.

9. The probe according to claim 1, wherein the first contact portion is provided with a second stopper portion extending in a direction perpendicular to the axial direction and disposed on the same side as the elastic portion with respect to the first contact portion, the second stopper portion abutting against an inner wall of the housing when the probe is housed inside the housing to fix the probe and prevent the first contact portion from tilting in the direction perpendicular to the axial direction.

10. A connector comprising the probe according to any one of claims 1 to 9 and a housing for housing the probe, the probe being housed in the housing with the first contact portion and the second contact portion thereof protruding from a surface of the housing.

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