CN111579831B - Probe and connector suitable for high-current high-speed signal test - Google Patents
Probe and connector suitable for high-current high-speed signal test Download PDFInfo
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- CN111579831B CN111579831B CN202010421251.2A CN202010421251A CN111579831B CN 111579831 B CN111579831 B CN 111579831B CN 202010421251 A CN202010421251 A CN 202010421251A CN 111579831 B CN111579831 B CN 111579831B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
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- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a probe and a connector suitable for high-current high-speed signal testing, which belong to the technical field of signal transmission and testing. The probe and the connector suitable for high-current high-speed signal testing have simple structures and simple and convenient arrangement, can reduce the resistance of the probe on the basis of realizing the reliable connection of two contact parts of the probe by utilizing the corresponding arrangement of the structures and parameters of all parts, provide possibility for the transmission of high-speed signals and the application under a high-current testing environment, expand the application range of the probe, reduce the application cost of the probe, and have better application prospect and popularization value.
Description
Technical Field
The invention belongs to the technical field of signal transmission and testing, and particularly relates to a probe and a connector suitable for testing a large-current high-speed signal.
Background
In the manufacturing process of electronic component modules such as liquid crystal panels and integrated circuits, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to FPC contact electrodes by using probes, or electrode portions of the substrate be connected to a detection device, and the detection operation be completed accordingly.
At present, a probe pin commonly used has a pair of contacts capable of being brought into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion connected between the pair of contacts. The probe ensures contact pressure between the contact and the electrode terminals of the electronic component and the electrode terminals of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminals of the electronic component and the electrode terminals of the connected electronic component. The elastic part is S-shaped or S-shaped in appearance and is formed by alternately connecting straight line parts and bent parts; in order to better exert the spring characteristic of the elastic part, the number of the bending parts is at least two, so that the linear distance of the elastic part is longer; because signals need to be transmitted between the two contacts through the elastic part in the test process, the signal transmission path is long due to the long length of the elastic part, the signals are seriously attenuated in the transmission process, and the signal quality is poor, so that the use requirement of high-speed signal transmission cannot be met; in addition, the conductive resistance of such probes is too large, which severely limits the transmission speed of high-speed signals. Based on the defects, the maximum overcurrent capacity of the current commonly used probe is less than 2.5A, and the current commonly used probe can only be applied to a test environment with a signal transmission rate of not more than 1.2 Gbps.
Disclosure of Invention
Aiming at one or more of the defects or the improvement requirements in the prior art, the invention provides the probe and the connector suitable for the high-current high-speed signal test, which can effectively realize the abutting between two contact parts and corresponding parts when the probe works, improve the reliability of abutting communication of the probe and effectively realize the application of the probe in the environments of high-speed signal transmission and high-current action.
In order to achieve the above object, in one aspect of the present invention, a probe suitable for high-current high-speed signal testing is provided, which includes a first contact portion and a second contact portion arranged at an interval in a longitudinal direction of the probe, and further includes an elastic portion and a connecting portion, each of which is integrally formed;
the first contact part and the connecting part are oppositely arranged at intervals in the transverse direction of the probe, and the first contact part and the connecting part are respectively of a plate-shaped structure extending along the longitudinal direction of the probe;
the elastic part extends transversely along the probe, two ends of the elastic part are respectively connected with the first contact part and the connecting part, and the elastic part can deform when the first contact part is subjected to longitudinal force and transmit the longitudinal force to the connecting part;
the second contact part is a plate-shaped structure extending along the transverse direction of the probe, one end of the second contact part is opposite to the end part of the first contact part in the longitudinal direction of the probe, the other end of the second contact part is correspondingly connected with the end part of the connecting part, and one side of the second contact part, which is deviated from the first contact part, is provided with at least one contact part.
As a further improvement of the invention, the device also comprises a limiting component;
the limiting assembly is arranged corresponding to the first contact part and used for limiting and guiding the first contact part when the first contact part moves in the longitudinal direction of the probe and limiting the first contact part to incline in the transverse direction of the probe.
As a further improvement of the invention, the minimum cross-sectional area of the probe conduction path is located in the elastic part, the connecting part or the two contact parts, and the ratio of the width corresponding to the minimum cross-sectional area to the probe width is 1.
As a further improvement of the present invention, the effective sectional area of the elastic portion is not more than the minimum of the sectional areas of the two contact portions and the connecting portion; the elastic part is of a wavy structure and comprises at least one elastic sheet;
the elastic sheet is of a belt-shaped structure, and two ends of the elastic sheet are connected to the first contact part and the side wall surface of the connecting part respectively; and the elastic sheet is provided with a plurality of second bending parts, and the curvature centers of two adjacent second bending parts are arranged at two sides of the elastic part along the longitudinal direction of the probe.
As a further improvement of the invention, the width of the probe is 1.5 mm-15 mm; and is provided with
The number of the elastic pieces is 1, and the width range of the elastic pieces is 0.1 mm-2 mm; or alternatively
The number of the elastic pieces is 2-6, the width range of the elastic pieces is 0.05 mm-1 mm, and the width of the elastic piece gap between every two adjacent elastic pieces is 0.06 mm-0.5 mm.
As a further improvement of the invention, the probe is arranged with the thickness of 0.05 mm-3 mm, and the minimum effective cross-sectional area of the probe conduction path is 0.005mm 2 ～18mm 2 。
As a further improvement of the present invention, the position limiting assembly includes a first position limiting portion;
the first limiting part is formed by bending one end of the connecting part, which deviates from the second contact part, by 90 degrees and then extending towards the first contact part along the transverse direction of the probe.
As a further improvement of the invention, the limiting component further comprises a third limiting part;
the third limiting part comprises a first limiting column and a second limiting column which are arranged along the longitudinal direction of the probe; the first limiting column is formed by extending the end, close to the second contact part, of the first contact part along the longitudinal direction of the probe; the second limiting column is fixedly arranged on the second contact part and is arranged along the longitudinal direction of the probe, the end part of the second limiting column is aligned with one side of the elastic part, and the side wall surface of the second limiting column is tightly attached to the side wall surface of the first limiting column.
As a further improvement of the invention, the limiting component further comprises a third limiting part;
the third limiting part comprises a third limiting column and a limiting groove; the limiting groove is longitudinally formed in the first contact part along the probe, the third limiting column is longitudinally arranged on the end part of the first limiting part or the second contact part along the probe, and the end part of the third limiting column is embedded into the limiting groove.
In another aspect of the invention, a connector is provided, which includes the probe described above, and further includes a needle mold capable of receiving the probe, and an end cap capable of limitedly encapsulating the probe in the needle mold.
The above-described improved technical features may be combined with each other as long as they do not conflict with each other.
Generally, compared with the prior art, the above technical solution conceived by the present invention has the following beneficial effects:
(1) According to the probe applicable to the high-current high-speed signal test, the connecting part and the elastic part are arranged corresponding to the first contact part and the second contact part, and the corresponding connection among the parts is utilized, so that when the end part of the first contact part is stressed to work, the elastic part can disperse the borne acting force and apply a reaction force to the end part, and the contact part of the first contact part can be stably abutted against the corresponding part; meanwhile, the elastic part can transmit the acting force borne by the first contact part to the connecting part and the second contact part, so that the contact part on the second contact part can be tightly abutted with the corresponding component, thereby effectively improving the connection stability of the probe in working and improving the test quality;
(2) According to the probe suitable for testing the high-current high-speed signal, the effective cross-sectional area of the elastic part is preferably set, so that the effective cross-sectional area of the elastic part is not larger than the minimum value of the cross-sectional areas of the two contact parts and the connecting part, namely the on-resistance of the probe can be effectively reduced only by controlling the effective cross-sectional area of the elastic part to be as large as possible, and conditions are provided for transmission of the high-speed signal under a high-current application environment; meanwhile, considering the problems that the acting force required by the deformation of the elastic part is increased when the cross section area is larger and the probe is inconvenient to work, the elastic part is divided into a plurality of strip-shaped elastic pieces so as to disperse the acting force born by the elastic part and ensure the normal work of the probe; however, if the number of the strip-shaped elastic pieces formed by the elastic parts is too large, the total width of the elastic piece gap is too large, so that the acting force transmitted by the contact part during operation can be effectively dispersed, but the whole length of the probe is also increased, which is not favorable for the matching use of the probe and related matched equipment; based on the above reasons, the probe in the invention realizes the corresponding balance among the parameters of the effective cross-sectional area of the elastic part, the number of the strip-shaped elastic pieces, the width of the strip-shaped elastic pieces, the gap width of the elastic pieces and the like through the optimal design, so that the on-resistance of the probe is reduced as much as possible under the condition of ensuring the normal use of the probe, and the application of the probe under the high-current high-speed signal test is ensured;
(3) According to the probe suitable for testing the high-current high-speed signal, the effective cross-sectional area of the elastic part on the probe conduction path is preferably set, so that the cross-sectional area is as large as possible on the premise that the cross-sectional area is smaller than the minimum cross-sectional area of the two contact parts and the connecting part, the conduction resistance between the two contact parts is further reduced, the possibility is provided for the probe to work in high-speed signal transmission and high-current environments, the application field of the probe is fully expanded, and the testing efficiency of the probe is improved;
(4) According to the probe suitable for testing the high-current high-speed signal, the limiting assembly consisting of the first limiting part, the second limiting part, the first limiting column, the second limiting column, the limiting groove, the third limiting column and the like is arranged corresponding to the first contact part, so that the limitation and the guidance of the first contact part after the first contact part is connected to the connecting part through the elastic part can be effectively realized, the first contact part is always or approximately always in a form along the longitudinal direction of the probe, the left-right oblique deviation of the first contact part is avoided, and the setting and working stability of the probe is ensured;
(5) The probe and the connector suitable for testing the high-current high-speed signal have simple structures and simple and convenient arrangement, can reduce the resistance of the probe on the basis of realizing the reliable connection of the two contact parts of the probe by utilizing the corresponding arrangement of each part, provides possibility for the transmission of the high-speed signal and the application under the high-current testing environment, expands the application range of the probe, reduces the application cost of the probe, and has better application prospect and popularization value.
Drawings
FIG. 1 is a schematic perspective view of a flat elastic probe in example 1 of the present invention;
FIG. 2 is a schematic plan view showing the structure of an elastic flat probe in example 1 of the present invention;
FIG. 3 is an enlarged view of a part of the structure of the elastic portion in embodiment 1 of the present invention;
FIG. 4 is a schematic perspective view of a flat elastic probe in example 2 of the present invention;
FIG. 5 is a schematic plan view of the elastic flat probe in example 2 of the present invention;
FIG. 6 is a schematic perspective view of a flat elastic probe in example 3 of the present invention;
FIG. 7 is a schematic plan view showing the structure of an elastic flat probe in example 3 of the present invention;
FIG. 8 is a schematic perspective view of a flat elastic probe in example 4 of the present invention;
FIG. 9 is a schematic plan view showing the structure of the elastic flat probe in example 4 of the present invention;
FIG. 10 is a schematic view showing the probe in example 1 of the present invention, which is switched from the initial state to the operating state;
FIG. 11 is a schematic diagram of the application of the elastic flat probe in the needle mold in the embodiment 1 of the present invention;
in all the figures, the same reference numerals denote the same features, in particular:
1. a probe for detecting the position of the probe,
2. the contact structure comprises a first contact part, 21, a first contact part, 22, a first limit column, 23, a second limit column, 24, a limit groove, 25 and a third limit column;
3. elastic part, 31, first end part, 331, first elastic piece end part; 32. a second end, 332, a second resilient tab end; 33. a belt-like elastic sheet;
4. a second contact portion 41, a second contact portion 42, a first limit portion 43, a second limit portion;
51. a first spring plate gap, 52, a second spring plate gap;
62. a first bend, 63, a second bend;
9. connecting part, 00 connector, 30 needle die and 40 end cover.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the second feature or the first and second features may be indirectly contacting each other through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
Example (b):
the probe and connector suitable for high-current high-speed signal testing in the preferred embodiment of the present invention is shown in fig. 1 to 11, and includes a first contact portion 2, an elastic portion 3, a second contact portion 4, and a connecting portion 9. Here, the two contact portions (2, 4) of the probe 1 can be close to or away from each other along a vertical direction shown in fig. 2, that is, elastic expansion and contraction of the probe 1 are realized, and the vertical direction is referred to as a probe longitudinal direction (i.e., a length direction of the probe 1), and a direction horizontally perpendicular thereto is referred to as a probe transverse direction (i.e., a width direction of the probe 1).
Specifically, the probe 1 has a flat structure integrally molded as shown in fig. 1 to 11, and the thicknesses of the respective portions are preferably equal to each other. Meanwhile, the first contact part 2 is a plate-shaped structure arranged along the longitudinal direction of the probe, the second contact part 4 is a plate-shaped structure arranged along the transverse direction of the probe, the first contact part and the second contact part are correspondingly connected through the elastic part 3 and the connecting part 9, and all the parts are integrally formed. Moreover, when the probe 1 is integrally formed, the base material of the probe can be preferably selected according to the requirements of the probe 1 during operation, preferably stainless steel material, and nickel plating and gold plating treatment can be carried out on the surface; of course, it is also preferable to use a material with better conductivity, such as aluminum alloy, copper alloy, silver-copper alloy, etc., and the on-resistance of the whole probe can be further adjusted by changing the thickness of the plating layer on the surface of the material, and the specific selection of the above-mentioned substrate factors needs to be comprehensively considered and selected from the aspects of the overall performance and economic benefits of the probe 1.
Further specifically, as shown in fig. 1 to 2, the first contact portion 2 extends in the probe longitudinal direction, and an end portion thereof is provided with a first contact point portion 21 for contact communication with the corresponding detecting unit. Meanwhile, as shown in fig. 3, the elastic part 3 in the preferred embodiment extends in the probe transverse direction, and has one end connected to a first end part 31 of the first contact part 2 side and the other end connected to a second end part 32 of the connection part 9 side. Between the first end 31 and the second end 32, 3 strip-shaped elastic pieces extending in the probe transverse direction, i.e., a strip-shaped elastic piece 33 shown in fig. 2, are included. Both ends (i.e. the first elastic sheet end 331 and the second elastic sheet end 332) of each strip-shaped elastic sheet are respectively connected to the side wall surfaces of the first contact portion 2 and the connecting portion 9, and are separated from each other by the first elastic sheet gap 51 and the second elastic sheet gap 52, and the widths of the first elastic sheet gap 51 and the second elastic sheet gap 52 may be the same or different.
Further, eachThe band-shaped elastic pieces are respectively formed in a wave shape extending in the probe transverse direction with a plurality of bent portions, such as a first bent portion 62 and a second bent portion 63 shown in fig. 3. Wherein the center of curvature O of the first curved portion 1 A center of curvature O of the second curved portion below the elastic portion 3 2 Above the flexible part 3, the first bending part corresponds to the bending arc angle (corresponding to the curvature center O in FIG. 3) 1 Angle between two dotted lines) is preferably noted as θ 1 The second bending part corresponds to the bending arc angle (corresponding to the curvature center O in FIG. 3) 2 Angle between two dotted lines) is preferably recorded as θ 2 . At the same time, theta 1 、θ 2 Preferably between 5 ° and 175 °, and the change in the bending arc angle generally corresponds to the change in the corresponding bending section length and bending arc. In addition, the curvature center of the two bending parts on the same strip-shaped elastic sheet is arranged on the two sides of the elastic part 3 along the longitudinal direction of the probe, so that when one end of the elastic part 3 is elastically deformed by the longitudinal acting force of the probe, the restoring stress in the two bending parts can be offset to a certain degree in the longitudinal direction of the probe, and further the stress in the elastic part 3 is dispersed.
It is preferable that the number of the bending portions in the elastic portion 3 is two, as shown in fig. 3, in order to make the length of the elastic portion 3 relatively close to a straight line while generating elasticity, that is, to make the actual transmission path of each strip-shaped elastic piece not too long, in this case, the sectional area of each strip-shaped elastic piece may be set in a large form, thereby making the overall resistance of the probe 1 small. Of course, the number of the bending portions in the elastic portion 3 is not limited to 2, and it may be provided in plurality according to actual needs, and the curvature centers of two adjacent bending portions are provided on both sides of the elastic portion 3. However, as the more bending portions in the wavy structure, the longer the actual transmission path thereof, which leads to the deterioration of the quality of the probe signal transmission, and the smaller the sectional area of the strip-shaped elastic sheet that can be actually set, the larger the overall resistance of the probe 1, which is not favorable for the application of the probe 1 in the environment of high-speed signal and high overcurrent, the number of the bending portions is not more than 4 in the actual setting.
In the present embodiment, the belt-like elastic pieces 33 have substantially the same cross-sectional shape, that is, a rectangular shape, and the cross-sectional areas thereof are preferably the same. However, in actual installation, the sectional forms of the respective elastic band pieces may be the same or different, and the sectional areas may be the same or different. In addition, the number of the belt-shaped elastic pieces is not limited to three as shown in the application, and may be preferably more or less according to actual needs, and it is only necessary to ensure that the sum of the cross-sectional areas of all the belt-shaped elastic pieces meets the signal transmission requirement.
In actual installation, the length of the probe 1 in the width direction (i.e. the probe width) is 1.5 to 15mm, and the installation thickness of the probe 1 is preferably 0.05 to 3mm, and the selection of the probe width, the probe length and the probe thickness is closely related to the application environment of the probe 1. When the thickness of the probe 1 is determined, the minimum effective cross-sectional area of the probe 1 for signal transmission can be effectively controlled by preferably designing the width of each component of the probe 1, and the resistance of the probe 1 can be further controlled. When the probe 1 is designed, the magnitude of the on-resistance is determined by the minimum sectional area of the conductive portion, and the larger the minimum sectional area is, the smaller the on-resistance is. Therefore, in the case of a constant thickness of the probe 1, it is necessary to control the minimum conduction width in the conduction portion, and the ratio of the minimum conduction width to the probe width is preferably 1.
Further, the smallest cross-sectional area in the conduction path of the probe 1 may be present at the elastic part 3, and also at the non-elastic part (i.e. the two contact parts and the connecting part), which may be preferred according to the actual installation requirements. In general, regarding the structure of each part of the probe 1, the first contact part 2, the second contact part 4, and the connection part 9 hardly deform during the operation of the probe, and most of them are displacements in position, while the elastic part 3 deforms according to the stress of the first contact part 2. It is known that the larger the width of a material having the same thickness and the same material is, the larger the force to be applied when the material is deformed becomes. Therefore, the width of the probe 1 at the location where the strain occurs (i.e., the elastic portion 3) cannot be set too large. In view of this, the preferred embodiment of the present invention sets the effective conduction cross-sectional area of the spring portion to the smallest conduction cross-sectional area in the conduction path of the probe 1, i.e., the effective conduction cross-sectional area of the spring portion is not greater than the smallest cross-sectional area on the two contact portions and the connecting portion. As long as the minimum conductive cross-sectional area is increased as much as possible, the on-resistance of the probe 1 is as small as possible, so that the probe 1 meets the requirement of high-speed signal transmission.
Referring to table 1, a comparison is made between the conventional pogo pin and several probes in the preferred embodiment of the present invention, the difference between the performance index of the probe in the preferred embodiment of the present invention and the performance index of the conventional pogo pin is investigated, and the influence of the minimum cross-sectional area on the performance of the probe is analyzed by changing the minimum cross-sectional area on the conduction path of the probe. Specifically, the probes in table 1 were unified to have a probe thickness of 0.11mm, the new probes 1 to 7 were probes in the preferred embodiment of the present invention, and the minimum cross-sectional area of the new probes 1 to 7 was provided in the elastic portion. In addition, L1/L2 refers to the ratio of the minimum on width of the probe to the width of the probe.
It can be easily found from the data comparison in table 1: 1. compared with the conventional dome probe, the probe 1 in the preferred embodiment of the present invention has a significantly shortened length of the conduction path for signal transmission, which is a necessary result based on the preferred design of the specific structure of the probe 1 in the preferred embodiment of the present invention; 2. in the preferred embodiment of the invention, the ratio of the minimum conduction width to the probe width is preferably selected, so that the minimum cross-sectional area on the conduction path of the probe is larger than the minimum cross-sectional area of the conventional spring probe, the maximum overcurrent capacity and the transmission rate of the probe in the preferred embodiment of the invention are obviously higher than those of the conventional spring probe, and the working performance of the probe is greatly improved; 3. the probe in the preferred embodiment of the invention has the advantages that through the preferred design of the structure, the elastic force at the probe needle point is far larger than that of the existing elastic sheet probe, and the effect is generated because the effective width of the elastic part in the preferred embodiment of the invention is greatly increased compared with that of the existing elastic sheet probe, and when the needle point is matched with a corresponding part and the elastic part is deformed, the reaction force acted on the needle point by the elastic part is correspondingly increased, so that the connection reliability of the contact part of the probe and the related part can be fully ensured; 4. in the probe according to the preferred embodiment of the present invention, as the minimum cross-sectional area increases, the magnitude of the elastic force of the tip increases, and obviously, in order to ensure the reliability of the matching of the probe and the relevant components, the magnitude of the elastic force at the tip cannot be too large, otherwise, the risk of damaging the relevant components is easy to occur, and therefore, the minimum cross-sectional area needs to be controlled within a certain range, that is, the minimum conduction width at the elastic part needs to be controlled.
Table 1: minimum cross-sectional area of probe conduction path has an effect on probe performance
In summary, compared with the conventional pogo pin, the probe in the preferred embodiment of the present invention has a significantly shortened conduction path, a significantly improved maximum current capacity and transmission rate, and a significantly improved connection stability between the probe and the related components. Meanwhile, although the increase of the minimum cross-sectional area is accompanied with the increase of the maximum flow capacity and the transmission rate, the elastic force at the needle tip is increased at the same time, and the connection reliability of the needle tip of the probe and related components is influenced. Therefore, when actually arranging the probe according to the preferred embodiment of the present invention, the minimum cross-sectional area or the minimum on-width needs to be controlled within a certain range in consideration of the balance of parameters such as the maximum overcurrent capacity, the transmission rate, the tip elasticity, and the like.
Further, the magnitude of the acting force applied to the elastic part when the elastic part is deformed is considered to be closely related to the thickness of the elastic part. Therefore, when the thickness of the probe 1 is constant and the overcurrent capability of the probe 1 is determined, the thickness of the elastic part can be determined. In this case, if the thickness of the elastic portion is large, the force required for deformation is large. In order to avoid this, the elastic portion may be divided into a plurality of band-like elastic pieces in the width direction thereof. Theoretically, the elastic part is divided into enough strip-shaped elastic pieces, so that the acting force borne by the first contact part 2 can be fully dispersed; however, as the number of the strip-shaped elastic pieces increases, the corresponding elastic piece gap also increases, and the installation length of the probe 1 increases, which may result in that the probe 1 cannot meet the requirement of the application length. Therefore, in actual installation, it is necessary to fully consider the balance between the effective sectional area of the elastic portion, the number of the belt-like elastic pieces installed, the installation width, the elastic piece gap width, and other factors.
Further, in a preferred embodiment, the effective cross-sectional area of the elastic portion 3 ranges from 0.005mm 2 ～18mm 2 And the number of the strip-shaped elastic pieces is 1-6. When the number of the strip-shaped elastic pieces is 1, namely the elastic part 3 is of a complete structure and does not contain a spring piece gap, the width range of the strip-shaped elastic pieces is 0.1-2 mm. When the number of the strip-shaped elastic pieces is 2-6, the elastic part 3 has 1-5 elastic piece gaps, the width range of each strip-shaped elastic piece is 0.05-1 mm, and the gap range between the strip-shaped elastic pieces is 0.06-0.5 mm. Meanwhile, the width of the strip-shaped elastic pieces can be the same or partially the same or different. For example, when the number of the belt-like elastic pieces is more than two, the width of the belt-like elastic piece positioned in the middle is the largest, and the width of the belt-like elastic piece is gradually reduced towards two sides; alternatively, when the belt-like elastic piece is provided in plural, the width value of the belt-like elastic piece increases or decreases in the probe longitudinal direction from one side to the other side in order. Similarly, the setting widths of the gaps of the elastic sheets can be equal or different, and when the setting widths are different, the gap widths can be sequentially increased or sequentially decreased in the longitudinal direction of the probe.
Referring to table 2, by comparing the conventional pogo pin with the several pins 1 of the preferred embodiment of the present invention, the influence of the curvature of the elastic portion of the pin and the number of the elastic pieces on the performance of the pin can be determined. For each of the probes in table 2, the thickness was uniformly 0.11mm, the new probes 1 to 8 were probes in the preferred embodiment of the present invention, and the smallest cross-sectional area on the probe 1 was located in the elastic portion 3. Theta 1 、θ 2 Each represents a bending angle corresponding to a bending portion of the strip-shaped elastic piece in the elastic portion 3, and the specific meaning is the same as that described above.
It can be easily found from the comparison of the data in table 2: 1. compared with the existing spring plate probe, the probe 1 in the preferred embodiment of the invention has the advantages that through the structural preferred design and the corresponding selection of the minimum cross-sectional area, the signal transmission path is effectively shortened, the on-resistance of the probe 1 is greatly reduced, the probe has better maximum overcurrent capacity and higher transmission rate, and the signal transmission path and the data in the table 1 can also correspond to each other; 2. compared with the existing shrapnel probe, the probe 1 in the preferred embodiment of the invention has the advantages that the elastic force at the probe tip is far larger than that of the existing shrapnel probe, which can correspond to the relevant data in the table 1; 3. for the probe in the preferred embodiment of the present invention, when the cross-sectional area of the elastic part 3 is kept constant, the length of the probe conduction path can be further changed by preferably setting the bending arc angle of the bending part thereof, and the elastic force at the tip can be changed; 4. along with the increase of the number of the strip-shaped elastic pieces, the elasticity of the probe needle point is reduced, which shows that on the premise of meeting the signal transmission capability of the probe, the purpose of changing the elasticity of the probe needle point can be achieved by changing the number of the strip-shaped elastic pieces.
Table 2: influence of bending radian of elastic part and number of elastic pieces on performance of probe
In summary, compared with the conventional spring probe, the probe in the preferred embodiment of the present invention has a significantly shortened conduction path, and the magnitude of the elastic force at the tip of the probe is significantly increased, i.e., the transmission rate of the probe is significantly increased, and the connection stability is also higher. Meanwhile, the bending radian of the bending part on the strip-shaped elastic sheet in the preferred embodiment of the invention is controlled, so that the length of a conduction path can be further adjusted, and the transmission performance of the probe is improved. In addition, through the quantity that sets up of control banded elastic webbing, can correspond the size of adjusting the elasticity of needle point department, make the probe satisfy the transmission performance on the basis, fully promote the reliability that probe and relevant part match. However, as can be seen from the foregoing, the number of the strip-shaped elastic pieces needs to be matched with the overall length of the probe, i.e., the number of the strip-shaped elastic pieces should be controlled within a certain range.
Further, the connecting portion 9 connected to the elastic portion 3 is a plate-like structure disposed along the longitudinal direction of the probe as shown in fig. 1 to 10, and the second end portion 32 of the elastic portion 3 is connected to a side thereof facing the first contact portion 2, which is correspondingly connected to an end portion of the second contact portion 4.
Further, the second contact portion 4 in the preferred embodiment is as shown in fig. 1 to 3, and one side of the second contact portion facing away from the elastic portion 3 is provided with at least one contact point portion along the longitudinal direction of the probe, namely a second contact point portion 41 extending along the longitudinal direction of the probe, for abutting communication with another testing component. Specifically, the number of the second contact portions 41 is two, which are spaced apart from each other in the longitudinal direction (i.e., in the probe transverse direction) of the second contact portion 4. In addition, since the two second contact portions 41 are disposed at a distance from the end of the second contact portion 4, two sides of the two second contact portions 41 departing from each other are formed with second limiting portions 43, which are used for limiting the two ends of the end cap 40 to abut against after the probe 1 is disposed on the needle mold 30 in a matching manner, as shown in fig. 11.
Since the first contact part 2 is connected to the connection part 9 through the elastic part 3, and the length direction of the elastic part 3 is along the transverse direction of the probe, there is a risk that the first contact part 2 is inclined left and right after being arranged. Therefore, in order to ensure that the first contact part 2 of the probe 1 can be always in or almost always in a vertical state after the probe is arranged, a limiting component for limiting the first contact part 2 is correspondingly arranged on the probe 1.
The stop assembly of the preferred embodiment may be configured in a variety of ways depending on the form of manufacture, the environment of use, etc., and will be described in more detail with reference to several specific embodiments.
Example 1:
in this embodiment, the structure of the probe 1 is as shown in fig. 1 to 3, wherein the limiting assembly includes a first limiting portion 42, a second limiting portion 43, and a third limiting portion, and the second limiting portion 43 is described in the foregoing, and is not described herein again. The first position-limiting part 42 is formed by bending the top of the connecting part 9 by 90 degrees and extending a certain length along the probe transverse direction towards the first contact part 2, and the end part of the first position-limiting part points to the first contact part 2 and is spaced from the first contact part 2 by a certain distance. By providing the first stopper 42, the first contact portion 2 can be laterally stopped when it is inclined toward the connection portion 9. Meanwhile, the arrangement of the first limiting part 42 can also realize the longitudinal limiting of the probe 1 when the probe is arranged in the needle die, and the stability of the probe in the longitudinal direction is ensured. Furthermore, the first stopper portion 42 is provided to also stop the vertical movement of the first contact portion 2 by stopping the movement of the elastic portion 3 in the probe longitudinal direction by the first stopper portion 42.
Further, the third position-limiting part comprises a first position-limiting column 22 and a second position-limiting column 23, and the first position-limiting column 22 is formed by extending the end, facing the second contact part 4, of the first contact part 2 along the longitudinal direction of the probe, that is, along the length direction of the first contact part 2. The second limiting column 23 is disposed on one side of the second contact portion 4 opposite to the elastic portion 3 along the length direction, and the end portion of the elastic portion 3 is aligned with the end portion, and the first limiting column 22 and the second limiting column 23 are slidably attached to each other through side wall surfaces, so that the first contact portion 2 can be guided by the second limiting column 23 when moving along the length direction. Meanwhile, the second stopper column 23 may be disposed to limit the inclination of the first contact portion 2 to the right. In addition, the length of the second limiting column 23 along the length direction should satisfy: when the end of the first stopper column 22 abuts against the second contact portion 4, the end of the second stopper column 23 does not abut against the elastic portion 3.
Example 2:
in this embodiment, the structure of the probe 1 is as shown in fig. 4 and 5, at this time, the limiting component includes a first limiting portion 42, a second limiting portion 43 and a third limiting portion, and the second limiting portion 43 is described in the foregoing, and is not described herein again. The first position-limiting portion 42 is formed by bending the top of the connecting portion 9 by 90 degrees and then horizontally extending for a certain length, the end portion of the first position-limiting portion is directed to the first contact portion 2, and the end portion is bent by 90 degrees to the side away from the elastic portion 3 and then extends for a certain length to form a third position-limiting column 25.
Correspondingly, a limiting groove 24 is formed on the first contact part 2 along the longitudinal direction of the probe, as shown in fig. 6, and at this time, the first contact part 2 is in a 7-shaped structure. Then, the side wall surface of the third stopper post 25 abuts against the side wall surface of the first contact portion 2, and the end portion thereof is embedded in the stopper groove 24. Through the matching of the limiting groove 24 and the third limiting column 25, the limitation of the left and right inclination of the first contact part 2 can be realized, and the motion of the second contact part 2 along the longitudinal direction of the probe is guided.
Example 3:
in this embodiment, the structure of the probe 1 is as shown in fig. 6 and 7, and on the basis of the structure in the preferred embodiment 2, a first stopper column 22 and a second stopper column 23 are further provided, and the arrangement form of both is the same as that in embodiment 1. Through the corresponding arrangement and matching of the first limiting column 22, the second limiting column 23, the limiting groove 24 and the third limiting column 25, the accurate limiting and guiding of the first contact part 2 can be realized.
Example 4:
in this embodiment, the structure of the probe 1 is as shown in fig. 8 and 9, and compared with the structure in embodiment 1, the arrangement form of the first limiting column 22 is merely changed into the form of the limiting groove 24, that is, the end of the first contact part 2 aligned with the second contact part 4 is provided with a groove with a certain depth along the longitudinal direction of the probe. Meanwhile, the limiting groove 24 is aligned with the second limiting column 23 in the longitudinal direction of the probe, and the end of the second limiting column 23 is embedded into the limiting groove 24 in a matching manner and can guide the movement of the first contact part 2.
Obviously, the arrangement form of the limiting component of the probe 1 in the preferred embodiment of the present invention is not limited to the four types described above, as long as the requirement of the inclination of the first contact part 1 on the left and right sides can be satisfied, and the limitation of the movement of the first contact part 2 in the longitudinal direction of the probe can be realized.
Further, for the probe 1 in the preferred embodiment of the present invention, the initial state and the working compression state are as shown in fig. 10, and the arrangement form of the probe 1 in the needle mold 30 is as shown in fig. 11. It can be easily seen that the setting of first contact site 2, second contact site 4 can be realized, the during operation is reliable spacing through the corresponding setting of elastic part 3 and spacing subassembly, and the setting of elastic part makes two contact sites can both accurate butt detection part to promote the intercommunication reliability of probe 1 during operation.
The probe and the connector suitable for high-current high-speed signal testing are simple in structure and convenient to set, the elastic part, the connecting part and the limiting assembly are arranged corresponding to the first contact part and the second contact part, and the application of the probe in high-speed transmission and high-current testing environments can be fully met by utilizing the corresponding arrangement of the elastic part structure, so that the reliability and the stability of probe testing are improved, and the probe and the connector have good application prospects and popularization values.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (5)
1. The probe suitable for testing the high-current high-speed signal comprises a first contact part and a second contact part which are arranged at intervals in the longitudinal direction of the probe, and is characterized in that the arrangement thickness of the probe is 0.05-3 mm, and the minimum effective cross-sectional area of a conduction path of the probe is 0.005mm 2 ～18mm 2 ；
Meanwhile, the probe also comprises an elastic part, a connecting part and a limiting assembly, and all the parts are integrally formed; the first contact part and the connecting part are oppositely arranged at intervals in the transverse direction of the probe, and the first contact part and the connecting part are respectively of a plate-shaped structure extending along the longitudinal direction of the probe;
the elastic part extends transversely along the probe, two ends of the elastic part are respectively connected with the first contact part and the connecting part, and the elastic part can deform when the first contact part is subjected to longitudinal force and transmit the longitudinal force to the connecting part;
the second contact part is a plate-shaped structure extending along the transverse direction of the probe, one end of the second contact part is opposite to the end part of the first contact part in the longitudinal direction of the probe, the other end of the second contact part is correspondingly connected with the end part of the connecting part, and one side of the second contact part, which is far away from the first contact part, is provided with at least one contact part;
the limiting assembly is arranged corresponding to the first contact part and is used for limiting and guiding the first contact part when the first contact part moves in the longitudinal direction of the probe and limiting the first contact part to deflect and incline in the transverse direction of the probe; the limiting assembly comprises a first limiting part, and the first limiting part is formed by bending one end of the connecting part, which is far away from the second contact part, by 90 degrees and then extending towards the first contact part along the transverse direction of the probe; and the limit component comprises a third limit part;
the third limiting part comprises a first limiting column and a second limiting column which are arranged along the longitudinal direction of the probe; the first limiting column is formed by extending the end, close to the second contact part, of the first contact part along the longitudinal direction of the probe; the second limiting column is fixedly arranged on the second contact part, is arranged along the longitudinal direction of the probe, has an end part aligned with one side of the elastic part, and is tightly attached to the side wall surface of the first limiting column by the side wall surface;
or
The third limiting part comprises a third limiting column and a limiting groove; the limiting groove is longitudinally arranged on the first contact part along the probe, the third limiting column is longitudinally arranged on the end part of the first limiting part or the second contact part along the probe, and the end part of the third limiting column is embedded into the limiting groove.
2. The probe suitable for high current high speed signal testing according to claim 1, wherein the minimum cross-sectional area of the probe conduction path is located at the elastic portion, the connecting portion or the two contact portions, and the ratio of the width corresponding to the minimum cross-sectional area to the probe width is 1.
3. The probe suitable for high current high speed signal testing according to claim 1, wherein the effective cross-sectional area of the elastic portion is not greater than the minimum of the cross-sectional areas of the two contact portions and the connecting portion; the elastic part is of a wavy structure and comprises at least one elastic sheet;
the elastic sheet is of a belt-shaped structure, and two ends of the elastic sheet are respectively connected to the first contact part and the side wall surface of the connecting part; and the elastic sheet is provided with a plurality of second bending parts, and the curvature centers of two adjacent second bending parts are arranged at two sides of the elastic part along the longitudinal direction of the probe.
4. The probe suitable for high-current high-speed signal testing according to claim 3, wherein the width of the probe is 1.5 mm-15 mm; and is
The number of the elastic pieces is 1, and the width range of the elastic pieces is 0.1 mm-2 mm; or
The number of the elastic pieces is 2-6, the width range of the elastic pieces is 0.05 mm-1 mm, and the width of the elastic piece gap between every two adjacent elastic pieces is 0.06 mm-0.5 mm.
5. A connector comprising the probe of any one of claims 1 to 4, and further comprising a needle mold capable of receiving the probe and an end cap capable of limitedly sealing the probe in the needle mold.
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| CN202010421251.2A CN111579831B (en) | 2020-05-18 | 2020-05-18 | Probe and connector suitable for high-current high-speed signal test |
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| CN202010421251.2A CN111579831B (en) | 2020-05-18 | 2020-05-18 | Probe and connector suitable for high-current high-speed signal test |
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| CN111579831B true CN111579831B (en) | 2023-03-14 |
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| CN118330275B (en) * | 2024-06-17 | 2024-09-03 | 西南应用磁学研究所(中国电子科技集团公司第九研究所) | Radio frequency probe for deep cavity test and test method |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20090108433A (en) * | 2008-04-11 | 2009-10-15 | 한국기계연구원 | Cantilever type micro contact probe |
| TWM408038U (en) * | 2010-12-29 | 2011-07-21 | Ru-Fu Li | Probe module structure |
| CN103837817A (en) * | 2012-11-26 | 2014-06-04 | 昆山威典电子有限公司 | Double-section test structure of PCB ejector pad |
| CN105807213A (en) * | 2016-05-30 | 2016-07-27 | 青岛港湾职业技术学院 | Testing device for flat lead chip |
| CN206975085U (en) * | 2017-08-04 | 2018-02-06 | 健坤精密科技（深圳）有限公司 | A kind of precision measurement probe |
| CN107884704A (en) * | 2017-12-12 | 2018-04-06 | 张家港市得道电子有限公司 | A kind of quick test fixture of improved circuit board |
| CN207301267U (en) * | 2017-09-26 | 2018-05-01 | 上海金鑫电子有限公司 | A kind of function test fixture |
| CN208902841U (en) * | 2018-08-15 | 2019-05-24 | 苏州市高威电子有限公司 | A kind of Rigid Flex energization test fixture |
| CN210323125U (en) * | 2019-07-08 | 2020-04-14 | 深圳凯智通微电子技术有限公司 | BTB module with space less than 0.5mm for high-current test |
| CN111033273A (en) * | 2018-01-11 | 2020-04-17 | 欧姆龙株式会社 | Probe, inspection tool, inspection unit, and inspection apparatus |
| CN212364378U (en) * | 2020-05-18 | 2021-01-15 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050253602A1 (en) * | 2004-04-28 | 2005-11-17 | Cram Daniel P | Resilient contact probe apparatus, methods of using and making, and resilient contact probes |
| JP2008164351A (en) * | 2006-12-27 | 2008-07-17 | Texas Instr Japan Ltd | Large current capable probe |
| KR100947862B1 (en) * | 2008-06-30 | 2010-03-18 | 한국기계연구원 | Cantilever type micro contact probe with hinge structure |
| CN109212283B (en) * | 2018-09-26 | 2024-08-09 | 昆山鑫润利自动化科技有限公司 | Probe module positioning structure for VSWR test |
-
2020
- 2020-05-18 CN CN202010421251.2A patent/CN111579831B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20090108433A (en) * | 2008-04-11 | 2009-10-15 | 한국기계연구원 | Cantilever type micro contact probe |
| TWM408038U (en) * | 2010-12-29 | 2011-07-21 | Ru-Fu Li | Probe module structure |
| CN103837817A (en) * | 2012-11-26 | 2014-06-04 | 昆山威典电子有限公司 | Double-section test structure of PCB ejector pad |
| CN105807213A (en) * | 2016-05-30 | 2016-07-27 | 青岛港湾职业技术学院 | Testing device for flat lead chip |
| CN206975085U (en) * | 2017-08-04 | 2018-02-06 | 健坤精密科技（深圳）有限公司 | A kind of precision measurement probe |
| CN207301267U (en) * | 2017-09-26 | 2018-05-01 | 上海金鑫电子有限公司 | A kind of function test fixture |
| CN107884704A (en) * | 2017-12-12 | 2018-04-06 | 张家港市得道电子有限公司 | A kind of quick test fixture of improved circuit board |
| CN111033273A (en) * | 2018-01-11 | 2020-04-17 | 欧姆龙株式会社 | Probe, inspection tool, inspection unit, and inspection apparatus |
| CN208902841U (en) * | 2018-08-15 | 2019-05-24 | 苏州市高威电子有限公司 | A kind of Rigid Flex energization test fixture |
| CN210323125U (en) * | 2019-07-08 | 2020-04-14 | 深圳凯智通微电子技术有限公司 | BTB module with space less than 0.5mm for high-current test |
| CN212364378U (en) * | 2020-05-18 | 2021-01-15 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
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