CN212364378U

CN212364378U - Probe and connector suitable for high-current high-speed signal test

Info

Publication number: CN212364378U
Application number: CN202020836514.1U
Authority: CN
Inventors: 陈前祎
Original assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Current assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Priority date: 2020-05-18
Filing date: 2020-05-18
Publication date: 2021-01-15
Anticipated expiration: 2030-05-18

Abstract

The utility model discloses a probe and connector suitable for high-speed signal test of heavy current belongs to signal transmission and test technical field, and it sets up connecting portion, elasticity portion through corresponding first contact site and second contact site, utilizes the correspondence between each part to connect for when the tip atress during operation of first contact site, elasticity portion can be respectively applyed the vertical ascending effort of probe to two contact sites, guarantees that the testing arrangement that the butt corresponds is stabilized to two contact sites. The utility model discloses a probe and connector suitable for high-speed signal test of heavy current, its simple structure sets up portably, utilizes the corresponding setting of each part structure and parameter, can reduce the resistance of probe on realizing the reliable basis of connecting of two contact sites of probe, for the transmission of high rate signal and the application under the heavy current test environment provide probably, has expanded the range of application of probe, has reduced the application cost of probe, has better application prospect and spreading value.

Description

Probe and connector suitable for high-current high-speed signal test

Technical Field

The utility model belongs to the technical field of signal transmission and test, concretely relates to probe and connector suitable for high-current high-speed signal test.

Background

In the manufacturing process of electronic component modules such as liquid crystal panels and integrated circuits, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to FPC contact electrodes by using probes, or electrode portions of the substrate be connected to a detection device, and the detection operation be completed accordingly.

At present, a probe pin commonly used has a pair of contacts capable of being brought into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion connected between the pair of contacts. The probe ensures contact pressure between the contact and the electrode terminals of the electronic component and the electrode terminals of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminals of the electronic component and the electrode terminals of the connected electronic component. The elastic part is S-shaped or S-shaped in appearance and is formed by alternately connecting a straight line part and a bent part; in order to better exert the spring characteristic of the elastic part, the number of the bending parts is at least two, so that the linear distance of the elastic part is longer; because signals need to be transmitted between the two contacts through the elastic part in the test process, the long length of the elastic part can cause the long signal transmission path, the signals are seriously attenuated in the transmission process, and the signal quality is poor, so that the use requirement of high-speed signal transmission cannot be met; in addition, the conductive resistance of such probes is too large, which severely limits the transmission speed of high-speed signals. Based on the defects, the maximum overcurrent capacity of the current commonly used probe is less than 2.5A, and the current commonly used probe can only be applied to a test environment with a signal transmission rate of not more than 1.2 Gbps.

SUMMERY OF THE UTILITY MODEL

To the above defect of prior art or improve in the demand one or more, the utility model provides a probe and connector suitable for heavy current high speed signal test can effectively realize two contact sites of probe during operation and correspond supporting of part tightly, promotes the reliability of probe butt intercommunication to effectively realize the application of probe under high speed signal transmission, heavy current effect environment.

In order to achieve the above object, one aspect of the present invention provides a probe suitable for high-current high-speed signal testing, including a first contact portion and a second contact portion disposed at an interval in a longitudinal direction of the probe, and further including an elastic portion and a connecting portion, each of which is integrally formed;

the first contact part and the connecting part are oppositely arranged at intervals in the transverse direction of the probe, and the first contact part and the connecting part are respectively of a plate-shaped structure extending along the longitudinal direction of the probe;

the elastic part extends transversely along the probe, two ends of the elastic part are respectively connected with the first contact part and the connecting part, and the elastic part can deform when the first contact part is subjected to longitudinal force and transmit the longitudinal force to the connecting part;

the second contact part is a plate-shaped structure extending along the transverse direction of the probe, one end of the second contact part is opposite to the end part of the first contact part in the longitudinal direction of the probe, the other end of the second contact part is correspondingly connected with the end part of the connecting part, and one side of the second contact part, which is deviated from the first contact part, is provided with at least one contact part.

As a further improvement of the utility model, the utility model also comprises a limit component;

the limiting assembly is arranged corresponding to the first contact part and used for limiting and guiding the first contact part when the first contact part moves in the longitudinal direction of the probe and limiting the first contact part to incline in the transverse direction of the probe.

As a further improvement of the utility model, the minimum cross-sectional area of the probe conduction path is located at the elastic part, the connecting part or the two contact parts, and the ratio of the width corresponding to the minimum cross-sectional area to the probe width is between 1:150 and 1: 10.

As a further improvement of the present invention, the effective sectional area of the elastic portion is not greater than the minimum of the sectional areas of the two contact portions and the connecting portion; the elastic part is of a wavy structure and comprises at least one elastic sheet;

the elastic sheet is of a belt-shaped structure, and two ends of the elastic sheet are respectively connected to the first contact part and the side wall surface of the connecting part; and the elastic sheet is provided with a plurality of second bending parts, and the curvature centers of two adjacent second bending parts are arranged at two sides of the elastic part along the longitudinal direction of the probe.

As a further improvement of the utility model, the width of the probe is 1.5 mm-15 mm; and is

The number of the elastic pieces is 1, and the width range of the elastic pieces is 0.1 mm-2 mm; or

The number of the elastic pieces is 2-6, the width range of the elastic pieces is 0.05-1 mm, and the width of a spring piece gap between every two adjacent elastic pieces is 0.06-0.5 mm.

As a further improvement, the probe is set to have a thickness of 0.05 mm-3 mm, and the minimum effective cross-sectional area of the probe conduction path is 0.005mm²～18mm²。

As a further improvement of the present invention, the limiting component comprises a first limiting part;

the first limiting part is formed by bending one end of the connecting part, which deviates from the second contact part, by 90 degrees and then extending towards the first contact part along the transverse direction of the probe.

As a further improvement of the present invention, the position-limiting component further comprises a third position-limiting part;

the third limiting part comprises a first limiting column and a second limiting column which are arranged along the longitudinal direction of the probe; the first limiting column is formed by extending the end, close to the second contact part, of the first contact part along the longitudinal direction of the probe; the second limiting column is fixedly arranged on the second contact part and is arranged along the longitudinal direction of the probe, the end part of the second limiting column is aligned with one side of the elastic part, and the side wall surface of the second limiting column is tightly attached to the side wall surface of the first limiting column.

the third limiting part comprises a third limiting column and a limiting groove; the limiting groove is longitudinally arranged on the first contact part along the probe, the third limiting column is longitudinally arranged on the end part of the first limiting part or the second contact part along the probe, and the end part of the third limiting column is embedded into the limiting groove.

The utility model discloses a connector is provided in another aspect, and it includes above-mentioned probe, still including accomodating the needle mould of probe with can with the spacing encapsulation of probe in end cover in the needle mould.

The above-described improved technical features may be combined with each other as long as they do not conflict with each other.

Generally, through the utility model discloses above technical scheme who conceives compares with prior art, has following beneficial effect:

(1) the utility model discloses a probe suitable for high-speed signal test of heavy current, it sets up connecting portion, elastic component through corresponding first contact site and second contact site, utilizes the corresponding connection between each part, makes when the tip atress of first contact site is worked, the elastic component can disperse the effort that it bore and exert a reaction force to it, makes the contact portion of first contact site can stabilize the corresponding part of butt; meanwhile, the elastic part can transmit the acting force borne by the first contact part to the connecting part and the second contact part, so that the contact part on the second contact part can be tightly abutted with the corresponding component, thereby effectively improving the connection stability of the probe in working and improving the test quality;

(2) the utility model discloses a probe suitable for high-speed signal test of heavy current, it makes the effective cross-sectional area of elasticity portion be not more than the cross-sectional area minimum of two contact sites and connecting portion through the preferred effective cross-sectional area that sets up elasticity portion, namely only need control the effective cross-sectional area of elasticity portion as big as possible, just can effectively reduce the on-resistance of probe, provide the condition for the transmission of high-speed signal under the heavy current application environment; meanwhile, considering the problems that the acting force required by the deformation of the elastic part can be increased and the probe is inconvenient to work when the cross section area is larger, the elastic part is divided into a plurality of strip-shaped elastic pieces in the utility model, so that the acting force born by the elastic part is dispersed, and the normal work of the probe is ensured; however, if the number of the strip-shaped elastic pieces formed by the elastic parts is too large, the total width of the elastic piece gap is too large, so that the acting force transmitted by the contact part during operation can be effectively dispersed, but the whole length of the probe is also increased, which is not favorable for the matching use of the probe and related matched equipment; based on the above reasons, the probe in the utility model realizes the corresponding balance among the parameters such as the effective cross-sectional area of the elastic part, the number of the strip-shaped elastic pieces, the width of the strip-shaped elastic pieces, the gap width of the elastic pieces and the like through the optimal design, so that the on-resistance of the probe is reduced as much as possible under the condition of ensuring the normal use, and the application of the probe under the high-current high-speed signal test is ensured;

(3) the utility model discloses a probe suitable for high-speed signal test of heavy current, it sets up the effective cross-sectional area of elasticity portion on the probe conduction path through preferred, makes above-mentioned cross-sectional area as big as possible under the prerequisite that is less than two contact sites and connecting portion minimum cross-sectional area, and then reduces the on-resistance between two contact sites, provides probably for the work of probe under high-speed signal transmission and heavy current environment, has fully expanded the application of probe, has promoted the test efficiency of probe;

(4) the utility model discloses a probe suitable for heavy current high speed signal test, it is through corresponding first contact site setting by first spacing portion, spacing portion of second, first spacing post, spacing post of second, spacing recess, spacing subassembly that the spacing post isotructure of third constitutes, can effectively realize spacing and direction after first contact site connects on the connecting portion with the elastic component, guarantee that first contact site is in or approximately be in along the longitudinal form of probe all the time, avoid the left and right sides slope skew of first contact site, guarantee the stability of probe setting and work;

(5) the utility model discloses a probe and connector suitable for high-speed signal test of heavy current, its simple structure sets up portably, utilizes the corresponding setting of each part, can reduce the resistance of probe on realizing the reliable basis of connecting of two contact sites of probe, for the transmission of high rate signal and the application under the heavy current test environment provide probably, has expanded the range of application of probe, has reduced the application cost of probe, has better application prospect and spreading value.

Drawings

Fig. 1 is a schematic perspective view of an elastic flat probe in example 1 of the present invention;

fig. 2 is a schematic plan view of an elastic flat probe according to embodiment 1 of the present invention;

fig. 3 is an enlarged view of a partial structure of the elastic portion in embodiment 1 of the present invention;

fig. 4 is a schematic perspective view of an elastic flat probe in embodiment 2 of the present invention;

fig. 5 is a schematic plan view of an elastic flat probe according to embodiment 2 of the present invention;

fig. 6 is a schematic perspective view of an elastic flat probe in embodiment 3 of the present invention;

fig. 7 is a schematic plan view of an elastic flat probe according to embodiment 3 of the present invention;

fig. 8 is a schematic perspective view of an elastic flat probe in embodiment 4 of the present invention;

fig. 9 is a schematic plan view of the elastic flat probe in embodiment 4 of the present invention;

fig. 10 is a schematic view of the probe in embodiment 1 of the present invention, which is switched from the initial state to the working state;

fig. 11 is a schematic diagram of the application of the elastic flat probe in the needle mold in the embodiment 1 of the present invention;

in all the figures, the same reference numerals denote the same features, in particular:

1. a probe is arranged on the outer surface of the probe,

2. the contact structure comprises a first contact part, 21, a first contact part, 22, a first limit column, 23, a second limit column, 24, a limit groove, 25 and a third limit column;

3. elastic part, 31, first end part, 331, 341, 351, first elastic piece end part; 32. a second end, 332, 342, 352, a second elastic sheet end; 33-35, a band-shaped elastic sheet;

4. a second contact portion 41, a second contact portion 42, a first limit portion 43, a second limit portion;

51. a spring plate gap;

62. 72, 82, 63, 73, 83, second bend;

9. connecting part, 00 connector, 30 needle die and 40 end cover.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention. Furthermore, the technical features mentioned in the embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship indicated based on the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

Example (b):

the probe and connector suitable for high-current high-speed signal testing in the preferred embodiment of the present invention are shown in fig. 1 to 11, and include a first contact portion 2, an elastic portion 3, a second contact portion 4 and a connecting portion 9. Here, the two contact portions (2, 4) of the probe 1 can be close to or away from each other along a vertical direction shown in fig. 2, that is, elastic expansion and contraction of the probe 1 is realized, and the vertical direction is referred to as a probe longitudinal direction (i.e., a length direction of the probe 1), and a direction horizontally perpendicular thereto is referred to as a probe transverse direction (i.e., a width direction of the probe 1).

Specifically, the probe 1 has a flat structure integrally molded as shown in fig. 1 to 11, and the thicknesses of the respective portions are preferably equal to each other. Meanwhile, the first contact part 2 is a plate-shaped structure arranged along the longitudinal direction of the probe, the second contact part 4 is a plate-shaped structure arranged along the transverse direction of the probe, the first contact part and the second contact part are correspondingly connected through the elastic part 3 and the connecting part 9, and all the parts are integrally formed. Moreover, when the probe 1 is integrally formed, the base material of the probe can be preferably selected according to the requirements of the probe 1 during operation, preferably stainless steel material, and nickel plating and gold plating treatment can be carried out on the surface; of course, it is also preferable to use a material with better conductivity, such as aluminum alloy, copper alloy, silver-copper alloy, etc., and the on-resistance of the whole probe can be further adjusted by changing the thickness of the plating layer on the surface of the material, and the specific selection of the above-mentioned substrate factors needs to be comprehensively considered and selected from the aspects of the overall performance and economic benefits of the probe 1.

Further specifically, as shown in fig. 1 to 2, the first contact portion 2 extends in the longitudinal direction of the probe, and an end portion thereof is provided with a first contact point portion 21 for contact communication with the corresponding detecting unit. Meanwhile, as shown in fig. 3, the elastic part 3 in the preferred embodiment extends in the probe transverse direction, and has one end connected to a first end part 31 of the first contact part 2 side and the other end connected to a second end part 32 of the connection part 9 side. The first end portion 31 and the second end portion 32 include 3 strip-shaped elastic pieces extending in the probe transverse direction, i.e., strip-shaped

elastic pieces

33, 34, 35 shown in fig. 3. Both ends of each strip-shaped elastic piece (i.e. the first elastic piece end

portions

331, 341, 351 and the second elastic piece end

portions

332, 342, 352) are respectively connected with the side wall surfaces of the first contact portion 2 and the connecting portion 9, and are separated from each other by the

elastic piece gaps

51, 52, and the widths of the

elastic piece gaps

51, 52 can be the same or different.

Further, each of the band-shaped elastic pieces has a wave shape extending in the probe transverse direction, and is formed with a plurality of bent portions, such as first

bent portions

62, 73, 83 and second

bent portions

63, 73, 83 shown in fig. 3. Wherein the center of curvature O of the first curved portion₁A center of curvature O of the second curved portion below the elastic portion 3₂Above the flexible part 3, the first bending part corresponds to the bending arc angle (corresponding to the curvature center O in FIG. 3)₁Angle between two dotted lines) is preferably recorded as θ₁The second bending part corresponds to the bending arc angle (corresponding to the curvature center O in FIG. 3)₂Angle between two dotted lines) is preferably recorded as θ₂. At the same time, theta₁、θ₂Preferably between 5 and 175 DEG, and a bending arc angleThe variation generally corresponds to a variation in the bending arc corresponding to the length of the bending portion. In addition, the curvature center of the two bending parts on the same strip-shaped elastic sheet is arranged on the two sides of the elastic part 3 along the longitudinal direction of the probe, so that when one end of the elastic part 3 is elastically deformed by the longitudinal acting force of the probe, the restoring stress in the two bending parts can be offset to a certain degree in the longitudinal direction of the probe, and further the stress in the elastic part 3 is dispersed.

Preferably, the number of the bending portions in the elastic portion 3 is two, as shown in fig. 3, in order to make the length of the elastic portion 3 closer to a straight line while generating elasticity, i.e., to make the actual transmission path of each strip-shaped elastic piece not too long, in which case the sectional area of each strip-shaped elastic piece may be set in a large form, thereby making the overall resistance of the probe 1 small. Of course, the number of the bending portions in the elastic portion 3 is not limited to 2, and it may be provided in plurality according to actual needs, and the curvature centers of two adjacent bending portions are provided on both sides of the elastic portion 3. However, as the more bending portions in the wavy structure, the longer the actual transmission path thereof, which leads to the deterioration of the quality of the probe signal transmission, and the smaller the sectional area of the strip-shaped elastic sheet that can be actually set, the larger the overall resistance of the probe 1, which is not favorable for the application of the probe 1 in the environment of high-speed signal and high overcurrent, the number of the bending portions is not more than 4 in the actual setting.

In the present embodiment, the belt-like

elastic pieces

33, 34, and 35 have substantially the same cross-sectional shape, that is, a rectangular shape, and preferably have the same cross-sectional area. However, in actual installation, the sectional forms of the respective elastic band pieces may be the same or different, and the sectional areas may be the same or different. In addition, the number of the strip-shaped elastic pieces is not limited to three shown in the application, and more or less strip-shaped elastic pieces can be preferred according to actual needs, and only the sum of the sectional areas of all the strip-shaped elastic pieces is required to be ensured to meet the signal transmission requirement.

In practical installation, the length of the probe 1 in the width direction (i.e. the probe width) is 1.5-15 mm, and the installation thickness of the probe 1 is preferably 0.05-3 mm, and the selection of the probe width, length and thickness is closely related to the application environment of the probe 1. When the thickness of the probe 1 is determined, the minimum effective cross-sectional area of the probe 1 for signal transmission can be effectively controlled by preferably designing the width of each component of the probe 1, and the resistance of the probe 1 can be further controlled. When the probe 1 is designed, the magnitude of the on-resistance is determined by the minimum sectional area of the conductive portion, and the larger the minimum sectional area is, the smaller the on-resistance is. Therefore, in the case of a constant thickness of the probe 1, the minimum conducting width in the conducting portion thereof needs to be controlled, and the ratio of the minimum conducting width to the probe width is preferably between 1:150 and 1: 10.

Further, the smallest cross-sectional area in the conduction path of the probe 1 may be present at the elastic part 3, and also at the non-elastic part (i.e. the two contact parts and the connecting part), which may be preferred according to the actual installation requirements. In general, regarding the structure of each part of the probe 1, the first contact part 2, the second contact part 4, and the connection part 9 hardly deform during the operation of the probe, and most of the parts are position displacements, while the elastic part 3 deforms according to the stress condition of the first contact part 2. It is known that the larger the width of a material having the same thickness and the same material is, the larger the force to be applied when the material is deformed becomes. Therefore, the width of the probe 1 at the location where the strain occurs (i.e., the elastic portion 3) cannot be set too large. In view of this, the present invention in the preferred embodiment sets the effective conduction cross-sectional area of the elastic part to the minimum conduction cross-sectional area in the conduction path of the probe 1, i.e. the effective conduction cross-sectional area of the elastic part is not greater than the minimum cross-sectional area on the two contact parts and the connecting part. As long as the minimum conductive cross-sectional area is increased as much as possible, the on-resistance of the probe 1 is as small as possible, so that the probe 1 meets the requirement of high-speed signal transmission.

Referring to table 1, wherein to current shell fragment probe and the utility model discloses several probes in the preferred embodiment have carried out the comparison, have explored the utility model discloses probe performance index and the difference of current shell fragment probe performance index in the preferred embodiment to through changing the minimum cross-sectional area on the probe conduction path, analyzed the influence of minimum cross-sectional area to the probe performance. Specifically, for each probe in table 1, the probe thickness is uniformly 0.11mm, the new probes 1 to 7 are the probes in the preferred embodiment of the present invention, and the minimum cross-sectional area in the new probes 1 to 7 is provided in the elastic portion. Furthermore, L1/L2 indicates the ratio of the minimum on width of the probe to the width of the probe.

It can be easily found from the data comparison in table 1: 1. compared with the existing spring plate probe, the probe 1 in the preferred embodiment of the present invention has a significantly shortened length of the conduction path for signal transmission, which is an inevitable result due to the preferred design of the specific structure of the probe 1 in the preferred embodiment of the present invention; 2. in the preferred embodiment of the present invention, the ratio of the minimum conduction width to the probe width is preferably selected, so that the minimum cross-sectional area on the conduction path of the probe is larger than the minimum cross-sectional area of the existing spring probe, and further the maximum overcurrent capacity and transmission rate of the probe in the preferred embodiment of the present invention are obviously higher than those of the existing spring probe, and the working performance of the probe is greatly improved; 3. the probe in the preferred embodiment of the present invention is designed preferably through its structure, the elastic force at the probe tip is much larger than the elastic force of the probe tip of the existing spring probe, and the effect is that the effective width of the elastic part in the preferred embodiment of the present invention is greatly increased compared with the existing spring probe, when the probe tip matches with the corresponding component and the elastic part deforms, the reaction force acted on the probe tip by the elastic part is correspondingly increased, so that the connection reliability between the probe contact part and the related component can be fully ensured; 4. for the probe in the preferred embodiment of the present invention, the magnitude of the elastic force of the needle tip increases with the increase of the minimum cross-sectional area, obviously, in order to ensure the reliability of the matching of the probe and the related component, the magnitude of the elastic force at the needle tip cannot be too large, otherwise, there is a risk of damaging the related component, and therefore, the minimum cross-sectional area needs to be controlled within a certain range, that is, the minimum conduction width at the elastic part needs to be controlled.

Table 1: minimum cross-sectional area of probe conduction path has an effect on probe performance

Generally speaking, the utility model discloses probe in the preferred embodiment compares in current shell fragment probe, and its conduction path obviously shortens, and the biggest ability of overflowing and transmission rate obviously promote, and the probe also has showing the promotion with the connection stability of relevant part. Meanwhile, although the increase of the minimum cross-sectional area is accompanied with the increase of the maximum flow capacity and the transmission rate, the elastic force at the needle tip is increased at the same time, and the connection reliability of the needle tip of the probe and related components is influenced. Therefore, when actually setting the probe in the preferred embodiment of the present invention, the balance of parameters such as the maximum overcurrent capacity, the transmission rate, the needle point elasticity, etc. needs to be considered, and the minimum cross-sectional area or the minimum conduction width is controlled within a certain range.

Further, the magnitude of the acting force applied to the elastic part when the elastic part is deformed is considered to be closely related to the thickness of the elastic part. Therefore, when the thickness of the probe 1 is constant and the overcurrent capability of the probe 1 is determined, the thickness of the elastic part can be determined. In this case, if the thickness of the elastic portion is large, the force required for deformation is large. In order to avoid this, the elastic portion may be divided into a plurality of band-like elastic pieces in the width direction thereof. Theoretically, the elastic part is divided into enough strip-shaped elastic pieces, so that the acting force borne by the first contact part 2 can be fully dispersed; however, as the number of the strip-shaped elastic pieces increases, the corresponding elastic piece gap also increases, and the installation length of the probe 1 increases, which may result in that the probe 1 cannot meet the requirement of the application length. Therefore, in actual installation, it is necessary to fully consider the balance between the effective sectional area of the elastic portion, the number of the belt-like elastic pieces installed, the installation width, the elastic piece gap width, and other factors.

Further, in a preferred embodiment, the effective cross-sectional area of the elastic portion 3 ranges from 0.005mm²～18mm²And the number of the strip-shaped elastic pieces is 1-6. When the number of the strip-shaped elastic pieces is 1, namely the elastic part 3 is of a complete structure and is not wrappedThe elastic sheet gap is included, and the width range of the belt-shaped elastic sheet is 0.1-2 mm. When the number of the strip-shaped elastic pieces is 2-6, 1-5 elastic piece gaps are formed in the elastic part 3, at the moment, the width range of each strip-shaped elastic piece is 0.05-1 mm, and the gap range between the strip-shaped elastic pieces is 0.06-0.5 mm. Meanwhile, the width of the strip-shaped elastic pieces can be the same or partially the same or different. For example, when the number of the belt-like elastic pieces is more than two, the width of the belt-like elastic piece positioned in the middle is the largest, and the width of the belt-like elastic piece is gradually reduced towards two sides; alternatively, when the belt-like elastic piece is provided in plural, the width value of the belt-like elastic piece increases or decreases in the probe longitudinal direction from one side to the other side in order. Similarly, the setting widths of the gaps of the elastic sheets can be equal or different, and when the setting widths are different, the gap widths can be sequentially increased or sequentially decreased in the longitudinal direction of the probe.

Referring to table 2, through comparing the existing spring plate probe with the probes 1 in the preferred embodiment of the present invention, the influence of the bending radian of the elastic part of the probe and the number of the elastic pieces on the performance of the probe can be determined. For each probe in table 2, the thickness is uniformly 0.11mm, the new probes 1-8 are the probes in the preferred embodiment of the present invention, and the minimum cross-sectional area on the probe 1 is located in the elastic part 3. Theta₁、θ₂Each represents a bending angle corresponding to a bending portion of the strip-shaped elastic piece in the elastic portion 3, and the specific meaning is the same as that described above.

It can be easily found from the comparison of the data in table 2: 1. compared with the existing spring plate probe, the probe 1 in the preferred embodiment of the utility model has the advantages that the signal transmission path is effectively shortened through the structure optimization design and the corresponding selection of the minimum cross-sectional area, the on-resistance of the probe 1 is greatly reduced, the probe has better maximum overcurrent capacity and higher transmission rate, and the signal transmission path and the data in the table 1 can correspond to each other; 2. compared with the existing spring probe, the probe 1 in the preferred embodiment of the present invention has the elasticity at the probe tip far larger than that of the existing spring probe, which can correspond to the relevant data in table 1; 3. for the probe in the preferred embodiment of the present invention, when the cross-sectional area of the elastic portion 3 is kept constant, the length of the probe conduction path can be further changed by preferably setting the bending arc angle of the bending portion, and the elastic force at the needle tip can be changed; 4. along with the increase of the number of the strip-shaped elastic pieces, the elastic force at the needle point of the probe is reduced, which shows that on the premise of meeting the signal transmission capability of the probe, the purpose of changing the elastic force at the needle point can be achieved by changing the number of the strip-shaped elastic pieces.

Table 2: influence of bending radian of elastic part and number of elastic pieces on performance of probe

In a word, the utility model discloses probe in the preferred embodiment compares in current shell fragment probe, and its conduction path obviously shortens, and needle point department elasticity size obviously increases, and the speed rate that passes of probe obviously promotes promptly, and the stability of connecting is also higher. Simultaneously, through controlling the utility model discloses the crooked radian of the last flexion of banded elastic sheet in the preferred embodiment can further adjust the length of conduction path, improves the transmission performance of probe. In addition, through the quantity that sets up of control banded elastic webbing, can correspond the size of adjusting the elasticity of needle point department, make the probe satisfy the transmission performance on the basis, fully promote the reliability that probe and relevant part match. However, as can be seen from the foregoing, the number of the strip-shaped elastic pieces needs to be matched with the overall length of the probe, i.e., the number of the strip-shaped elastic pieces should be controlled within a certain range.

Further, the connecting portion 9 connected to the elastic portion 3 is a plate-like structure disposed along the longitudinal direction of the probe as shown in fig. 1 to 10, and the second end portion 32 of the elastic portion 3 is connected to a side thereof facing the first contact portion 2 and is correspondingly connected to an end portion of the second contact portion 4.

Further, the second contact portion 4 in the preferred embodiment is as shown in fig. 1-3, and a side thereof facing away from the elastic portion 3 is provided with at least one contact portion along the probe longitudinal direction, i.e. a second contact portion 41 extending along the probe longitudinal direction for abutting communication with another test component. Specifically, the number of the second contact portions 41 is two, which are spaced apart from each other in the longitudinal direction (i.e., in the probe transverse direction) of the second contact portion 4. In addition, since the two second contact portions 41 are disposed at a distance from the end of the second contact portion 4, two sides of the two second contact portions 41 departing from each other are formed with second limiting portions 43, which are used for limiting the two ends of the end cap 40 to abut against after the probe 1 is disposed on the needle mold 30 in a matching manner, as shown in fig. 11.

Since the first contact part 2 is connected to the connection part 9 through the elastic part 3, and the length direction of the elastic part 3 is along the transverse direction of the probe, there is a risk that the first contact part 2 is inclined left and right after being arranged. Therefore, in order to ensure that the first contact part 2 of the probe 1 can be always in or almost always in a vertical state after the probe is arranged, a limiting component for limiting the first contact part 2 is correspondingly arranged on the probe 1.

The stop assembly of the preferred embodiment may be configured in a variety of ways depending on the form of manufacture, the environment of use, etc., and will be described in more detail with reference to several specific embodiments.

Example 1:

in this embodiment, the structure of the probe 1 is as shown in fig. 1 to 3, wherein the limiting assembly includes a first limiting portion 42, a second limiting portion 43, and a third limiting portion, and the second limiting portion 43 is described in the foregoing, and is not described herein again. The first limiting portion 42 is formed by bending the top of the connecting portion 9 by 90 degrees and extending a certain length along the probe transverse direction towards the first contact portion 2, and the end portion of the first limiting portion points to the first contact portion 2 and is spaced from the first contact portion 2 by a certain distance. By providing the first stopper 42, the first contact portion 2 can be laterally stopped when it is inclined toward the connection portion 9. Meanwhile, the arrangement of the first limiting part 42 can also realize the longitudinal limiting of the probe 1 when the probe is arranged in the needle die, and the stability of the probe in the longitudinal direction is ensured. Furthermore, the first stopper portion 42 is provided to also stop the vertical movement of the first contact portion 2 by stopping the movement of the elastic portion 3 in the probe longitudinal direction by the first stopper portion 42.

Further, the third position-limiting part comprises a first position-limiting column 22 and a second position-limiting column 23, and the first position-limiting column 22 is formed by extending the end, facing the second contact part 4, of the first contact part 2 along the longitudinal direction of the probe, that is, along the length direction of the first contact part 2. The second limiting column 23 is disposed on one side of the second contact portion 4 opposite to the elastic portion 3 along the length direction, and the end portion of the elastic portion 3 is aligned with the end portion, and the first limiting column 22 and the second limiting column 23 are slidably attached to each other with the side wall surfaces, so that the first contact portion 2 can be guided by the second limiting column 23 when moving along the length direction. Meanwhile, the second stopper column 23 may be disposed to limit the inclination of the first contact portion 2 to the right. In addition, the length of the second limiting column 23 along the length direction should satisfy: when the end of the first stopper column 22 abuts against the second contact portion 4, the end of the second stopper column 23 does not abut against the elastic portion 3.

Example 2:

in this embodiment, the structure of the probe 1 is as shown in fig. 4 and 5, at this time, the limiting component includes a first limiting portion 42, a second limiting portion 43 and a third limiting portion, and the second limiting portion 43 is described in the foregoing, and is not described herein again. The first position-limiting portion 42 is formed by bending the top of the connecting portion 9 by 90 degrees and then horizontally extending for a certain length, the end portion of the first position-limiting portion is directed to the first contact portion 2, and the end portion is bent by 90 degrees to the side away from the elastic portion 3 and then extends for a certain length to form a third position-limiting column 25.

Correspondingly, a limiting groove 24 is formed on the first contact part 2 along the longitudinal direction of the probe, as shown in fig. 6, and at this time, the first contact part 2 is in a 7-shaped structure. Then, the side wall surface of the third stopper post 25 abuts against the side wall surface of the first contact portion 2, and the end portion thereof is embedded in the stopper groove 24. Through the matching of the limiting groove 24 and the third limiting column 25, the limitation of the left and right inclination of the first contact part 2 can be realized, and the motion of the second contact part 2 along the longitudinal direction of the probe is guided.

Example 3:

in this embodiment, the structure of the probe 1 is as shown in fig. 6 and 7, and on the basis of the structure in the preferred embodiment 2, a first stopper column 22 and a second stopper column 23 are further provided, and the arrangement form of both is the same as that in embodiment 1. Through the corresponding arrangement and matching of the first limiting column 22, the second limiting column 23, the limiting groove 24 and the third limiting column 25, the accurate limiting and guiding of the first contact part 2 can be realized.

Example 4:

in this embodiment, the structure of the probe 1 is as shown in fig. 8 and 9, and compared with the structure in embodiment 1, the arrangement form of the first limiting column 22 is merely changed into the form of the limiting groove 24, that is, the end of the first contact part 2 aligned with the second contact part 4 is provided with a groove with a certain depth along the longitudinal direction of the probe. Meanwhile, the limiting groove 24 is aligned with the second limiting column 23 in the longitudinal direction of the probe, and the end of the second limiting column 23 is embedded into the limiting groove 24 in a matching manner and can guide the movement of the first contact part 2.

Obviously, the arrangement of the limiting component of the probe 1 in the preferred embodiment of the present invention is not limited to the above-mentioned four types, as long as the first contact portion 1 can be ensured to satisfy the requirements of the left and right sides, and the limitation of the movement of the first contact portion 2 in the longitudinal direction of the probe can be realized.

Further, for the probe 1 in the preferred embodiment of the present invention, the initial state and the working compression state are as shown in fig. 10, and the arrangement form of the probe 1 in the needle mold 30 is as shown in fig. 11. It can be easily seen that the setting of first contact site 2, second contact site 4 can be realized, the during operation is reliable spacing through the corresponding setting of elastic part 3 and spacing subassembly, and the setting of elastic part makes two contact sites can both accurate butt detection part to promote the intercommunication reliability of probe 1 during operation.

The utility model provides a probe and connector suitable for high-speed signal test of heavy current, its simple structure sets up portably, sets up elasticity portion, connecting portion and spacing subassembly through corresponding first contact site and second contact site, utilizes the corresponding setting of elasticity portion structure, but the application of fully provided probe under high rate transmission, heavy current test environment promotes probe test's reliability and stability, has better application prospect and spreading value.

It will be understood by those skilled in the art that the foregoing is merely a preferred embodiment of the present invention, and is not intended to limit the invention to the particular forms disclosed, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.

Claims

1. A probe suitable for high-current high-speed signal test comprises a first contact part and a second contact part which are arranged at intervals in the longitudinal direction of the probe, and is characterized by further comprising an elastic part and a connecting part, wherein all the parts are integrally formed;

2. The probe suitable for high current high speed signal testing of claim 1, further comprising a limiting assembly;

3. The probe suitable for high-current high-speed signal testing according to claim 1 or 2, wherein the minimum cross-sectional area of the probe conduction path is located at the elastic part, the connecting part or the two contact parts, and the ratio of the width corresponding to the minimum cross-sectional area to the probe width is between 1:150 and 1: 10.

4. The probe suitable for high current high speed signal testing according to claim 1, wherein the effective cross-sectional area of the elastic portion is not greater than the minimum of the cross-sectional areas of the two contact portions and the connecting portion; the elastic part is of a wavy structure and comprises at least one elastic sheet;

5. The probe suitable for high-current high-speed signal testing according to claim 4, wherein the width of the probe is 1.5 mm-15 mm; and is

6. The probe suitable for high current high speed signal testing according to claim 1, wherein the probe is arranged to have a thickness of 0.05mm to 3mm, and the minimum effective cross-sectional area of the probe conduction path is 0.005mm²～18mm²。

7. The probe suitable for high current high speed signal testing according to claim 2, wherein the limiting component comprises a first limiting portion;

8. The probe suitable for high-current high-speed signal testing according to claim 2 or 7, wherein the limiting assembly further comprises a third limiting part;

9. The probe suitable for high current high speed signal testing according to claim 7, wherein the limiting assembly further comprises a third limiting portion;

10. A connector comprising the probe of any one of claims 1 to 9, and further comprising a needle mold capable of receiving the probe and an end cap capable of limitedly encapsulating the probe in the needle mold.