CN111579834B

CN111579834B - Probe and connector suitable for high-current high-speed signal test

Info

Publication number: CN111579834B
Application number: CN202010421960.0A
Authority: CN
Inventors: 陈前祎
Original assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Current assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Priority date: 2020-05-18
Filing date: 2020-05-18
Publication date: 2023-03-31
Anticipated expiration: 2040-05-18
Also published as: CN111579834A

Abstract

The invention discloses a probe and a connector suitable for high-current high-speed signal testing, belonging to the technical field of signal transmission and testing. The probe and the connector suitable for testing the high-current high-speed signal have simple structures and simple and convenient arrangement, can reduce the resistance of the probe on the basis of realizing the reliable connection of the two contact parts of the probe by utilizing the corresponding arrangement of each part, provides possibility for the transmission of the high-speed signal and the application under the high-current testing environment, expands the application range of the probe, reduces the application cost of the probe, and has better application prospect and popularization value.

Description

Probe and connector suitable for high-current high-speed signal test

Technical Field

The invention belongs to the technical field of signal transmission and testing, and particularly relates to a probe and a connector suitable for testing a large-current high-speed signal.

Background

In the manufacturing process of electronic component modules such as liquid crystal panels and integrated circuits, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to FPC contact electrodes by using probes, or electrode portions of the substrate be connected to a detection device, and the detection operation be completed accordingly.

At present, a probe pin commonly used has a pair of contacts capable of being brought into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion connected between the pair of contacts. The probe ensures contact pressure between the contact and the electrode terminals of the electronic component and the electrode terminals of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminals of the electronic component and the electrode terminals of the connected electronic component. The elastic part is S-shaped or S-shaped in appearance and is formed by alternately connecting a straight line part and a bent part; in order to better exert the spring characteristic of the elastic part, the number of the bending parts is at least two, so that the linear distance of the elastic part is longer; because signals need to be transmitted between the two contacts through the elastic part in the test process, the signal transmission path is long due to the long length of the elastic part, the signals are seriously attenuated in the transmission process, and the signal quality is poor, so that the use requirement of high-speed signal transmission cannot be met; in addition, the conductive resistance of such probes is too large, which severely limits the transmission speed of high-speed signals. Based on the defects, the maximum overcurrent capacity of the current commonly used probe is less than 2.5A, and the current commonly used probe can only be applied to a test environment with a signal transmission rate of not more than 1.2 Gbps.

Disclosure of Invention

Aiming at one or more of the defects or improvement requirements in the prior art, the invention provides the probe and the connector suitable for high-current high-speed signal testing, which can effectively realize the abutting between the two contact parts and the corresponding parts when the probe works, improve the reliability of abutting communication of the probe, and effectively realize the application of the probe in the environments of high-speed signal transmission and high-current action.

In order to achieve the above object, in one aspect of the present invention, a probe suitable for high-current high-speed signal testing is provided, which includes a first contact portion and a second contact portion spaced apart from each other in a longitudinal direction of the probe, and further includes a first elastic portion, a second elastic portion, and a connecting portion, each of which is integrally formed;

the first contact part and the connecting part are oppositely arranged at intervals in the transverse direction of the probe, and the first contact part and the connecting part are respectively of a plate-shaped structure extending along the longitudinal direction of the probe; the second contact part is a plate-shaped structure extending along the transverse direction of the probe, and one side of the second contact part, which is far away from the first contact part, is provided with at least one contact part;

the first elastic part extends transversely along the probe, two ends of the first elastic part are respectively connected with the first contact part and the connecting part, and the first elastic part can deform when the first contact part is subjected to longitudinal force and transmit the longitudinal force to the connecting part; the second elastic part extends along the longitudinal direction of the probe in a bending way and comprises at least one straight line part and a plurality of first bending parts; the straight portion is disposed in the transverse direction of the probe, and both ends of the straight portion are connected to the end portion of the second contact portion, the end portions of the adjacent straight portions, or the end portions of the connection portions by corresponding first bent portions.

As a further improvement of the invention, the device also comprises a limiting component;

the limiting assembly is arranged corresponding to the first contact part and used for limiting and guiding the first contact part when the first contact part moves in the longitudinal direction of the probe and limiting the first contact part to incline in the transverse direction of the probe.

As a further improvement of the invention, the minimum cross-sectional area of the probe conduction path is located at two elastic parts, connecting parts or two contact parts, and the ratio of the width corresponding to the minimum cross-sectional area to the probe width is 1.

As a further improvement of the present invention,

the thickness of the probe is 0.05 mm-3 mm, and the effective cross-sectional area of the two elastic parts is 0.005mm ² ～18mm ² 。

As a further improvement of the invention, the effective sectional areas of the two elastic parts are respectively not more than the minimum value of the sectional areas of the two contact parts and the connecting part; the first elastic part is of a wavy structure and comprises at least one first elastic sheet;

the first elastic sheet is of a belt-shaped structure, and two ends of the first elastic sheet are connected to the first contact part and the side wall surface of the connecting part respectively; and the first elastic sheet is provided with a plurality of second bending parts, and the curvature centers of two adjacent second bending parts are arranged at two sides of the first elastic part along the longitudinal direction of the probe.

As a further improvement of the invention, the width of the probe is 1.5 mm-15 mm;

the number of the first elastic pieces is 1, and the width range of the first elastic pieces is 0.1 mm-2 mm; or

The number of the first elastic pieces is 2-6, the width range of the first elastic pieces is 0.05 mm-1 mm, and the width of a spring piece gap between every two adjacent first elastic pieces is 0.06 mm-0.5 mm.

As a further improvement of the present invention, the second elastic part includes a second elastic sheet having a width in the range of 0.1mm to 2mm; or

The second elastic part comprises 2-6 second elastic sheets arranged at intervals, the width range of each second elastic sheet is 0.05-1 mm, and the width of a spring sheet gap between every two adjacent second elastic sheets is 0.06-0.5 mm.

As a further improvement of the present invention, the position limiting assembly includes a first position limiting portion;

the first limiting part is obtained by bending one end of the connecting part, which is deviated from the second elastic part, by 90 degrees and then transversely extending the connecting part towards the first contact part along the probe.

As a further improvement of the invention, the limiting component further comprises a third limiting part;

the third limiting part comprises a first limiting column and a second limiting column which are arranged along the longitudinal direction of the probe; the first limiting column is formed by extending the end, close to the second contact part, of the first contact part along the longitudinal direction of the probe; the second limiting column is fixedly arranged on the second elastic part and is arranged along the longitudinal direction of the probe, the end part of the second limiting column is aligned with one side of the first elastic part, and the side wall surface of the second limiting column is tightly attached to the side wall surface of the first limiting column.

the third limiting part comprises a third limiting column and a limiting groove; the limiting groove is longitudinally arranged on the first contact part along the probe, the third limiting column is longitudinally arranged on the end part of the first limiting part or the second elastic part along the probe, and the end part of the third limiting column is embedded into the limiting groove.

In another aspect of the invention, a connector is provided, which includes the probe, and further includes a needle mold capable of receiving the probe, and an end cap capable of limitedly encapsulating the probe in the needle mold.

The above-described improved technical features may be combined with each other as long as they do not conflict with each other.

Generally, compared with the prior art, the above technical solution conceived by the present invention has the following beneficial effects:

(1) According to the probe applicable to the large-current high-speed signal test, the connecting part, the first elastic part and the second elastic part are arranged corresponding to the first contact part and the second contact part, and corresponding connection among the parts is utilized, so that when the end part of the first contact part is stressed to work, the first elastic part can disperse the bearing acting force and apply a reaction force to the first contact part, and the contact part of the first contact part can stably abut against the corresponding part; meanwhile, the first elastic part can transmit the acting force borne by the first contact part to the connecting part and the second elastic part in sequence, so that the second elastic part is compressed and deformed in the longitudinal direction of the probe, and then the second elastic part applies an acting force to the second contact part, so that the contact part on the second contact part can be ensured to be tightly abutted with a corresponding component, the connection stability of the probe during working is effectively improved, and the test quality is improved;

(2) According to the probe suitable for testing the high-current high-speed signal, the effective cross-sectional areas of the first elastic part and the second elastic part are preferably set, so that the effective cross-sectional areas of the two elastic parts are not larger than the minimum value of the cross-sectional areas of the two contact parts and the connecting part, namely the effective cross-sectional areas of the two elastic parts are controlled to be as large as possible, the on-resistance of the probe can be effectively reduced, and conditions are provided for transmission of the high-speed signal in a high-current application environment; meanwhile, considering the problems that the acting force required by the deformation of the two elastic parts is increased when the cross sectional areas of the two elastic parts are larger and the probe is inconvenient to work, the elastic parts are divided into a plurality of strip-shaped elastic pieces, so that the acting force borne by the elastic parts is dispersed, and the normal work of the probe is ensured; however, if the two elastic parts are separated into too many belt-shaped elastic pieces, that is, the total width of the elastic piece gap is too large, so that the acting force transmitted by the contact part during operation can be effectively dispersed, but the whole length of the probe can be increased, which is not favorable for the matching use of the probe and related matching equipment; based on the above reasons, the probe in the invention realizes the corresponding balance among the parameters of the effective cross-sectional area of the elastic part, the number of the strip-shaped elastic pieces, the width of the strip-shaped elastic pieces, the gap width of the elastic pieces and the like through the optimal design, so that the on-resistance of the probe is reduced as much as possible under the condition of ensuring the normal use of the probe, and the application of the probe under the high-current high-speed signal test is ensured;

(3) The probe suitable for testing the high-current high-speed signal is characterized in that the first elastic part is preferably arranged into a plurality of wavy strip-shaped elastic pieces, the corresponding arrangement of the bent parts on the strip-shaped elastic pieces is utilized, so that the curvature centers of two adjacent bent parts can be respectively arranged at two longitudinal sides of the probe of the first elastic part, the acting force borne by the first contact part is fully dispersed by utilizing the mutual offset of the adjacent bent parts when the adjacent bent parts are deformed by the acting force, and the first contact part can bear a stable acting force through the deformation recovery of the bent parts, so that the contact reliability of the first contact part is ensured;

(4) According to the probe suitable for testing the high-current high-speed signal, the limiting assembly consisting of the first limiting part, the second limiting part, the first limiting column, the second limiting column, the limiting groove, the third limiting column and the like is arranged corresponding to the first contact part, so that the limitation and the guidance of the first contact part after the first contact part is connected to the connecting part through the first elastic part can be effectively realized, the first contact part is always or approximately always in a form along the longitudinal direction of the probe, the left-right oblique offset of the first contact part is avoided, and the setting and working stability of the probe is ensured;

(5) The probe and the connector suitable for testing the high-current high-speed signal have simple structures and simple and convenient arrangement, can reduce the resistance of the probe on the basis of realizing the reliable connection of the two contact parts of the probe by utilizing the corresponding arrangement of each part, provides possibility for the transmission of the high-speed signal and the application under the high-current testing environment, expands the application range of the probe, reduces the application cost of the probe, and has better application prospect and popularization value.

Drawings

FIG. 1 is a schematic perspective view of a flat elastic probe in example 1 of the present invention;

FIG. 2 is a schematic plan view of the elastic flat probe in example 1 of the present invention;

fig. 3 is an enlarged view of a part of the first elastic portion in embodiment 1 of the present invention;

fig. 4 is an enlarged view of a part of the second elastic portion in embodiment 1 of the present invention;

FIG. 5 is a schematic perspective view of a flat elastic probe in example 2 of the present invention;

FIG. 6 is a schematic plan view showing the structure of an elastic flat probe in example 2 of the present invention;

FIG. 7 is a schematic perspective view of a flat elastic probe in example 3 of the present invention;

FIG. 8 is a schematic plan view showing the structure of an elastic flat probe in example 3 of the present invention;

FIG. 9 is a schematic perspective view of a flat elastic probe in example 4 of the present invention;

FIG. 10 is a schematic plan view showing the structure of the elastic flat probe in example 4 of the present invention;

FIG. 11 is a schematic view showing the probe in example 1 of the present invention, which is switched from the initial state to the operating state;

FIG. 12 is a schematic diagram of the application of the elastic flat probe in the needle mold in the embodiment 1 of the present invention;

throughout the drawings, like reference numerals designate like features, and in particular:

1. a probe for detecting the position of the probe,

2. the contact structure comprises a first contact part, 21, a first contact part, 22, a first limit column, 23, a second limit column, 24, a limit groove, 25 and a third limit column;

3. a first elastic part 31, a first end part 331, a first elastic sheet end part; 32. a second end, 332, a second resilient tab end; 33. a first belt-like elastic sheet;

4. a second contact portion 41, a second contact portion 42, a first limit portion 43, a second limit portion;

51. a first spring plate gap; 52. a second spring plate gap; 101. a third spring plate gap; 102. a fourth spring plate gap;

64. a first bend 65, a second bend;

81. a second belt-like elastic sheet;

9. a connecting part, 91, an elastic bending part, 911, a third bending part, 912 and a fourth bending part; 92. a straight portion;

10. a second elastic part; 00. connector, 30. Pin die, 40. End cap.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "above," and "over" a second feature may be directly on or obliquely above the second feature, or simply mean that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

The embodiment is as follows:

the probe suitable for high-current high-speed signal testing in the preferred embodiment of the present invention includes a first contact portion 2, a first elastic portion 3, a second contact portion 4, a connecting portion 9, and a second elastic portion 10, as shown in fig. 1 to 12. Here, the two contact portions (2, 4) of the probe 1 can move toward or away from each other along the Z-axis direction shown in fig. 2, that is, the elastic expansion and contraction of the probe 1 are realized, and this direction is referred to as a probe longitudinal direction (i.e., a length direction of the probe 1), and an X-axis direction horizontally perpendicular thereto is a probe transverse direction (i.e., a width direction of the probe 1).

Specifically, the probe 1 has a flat structure integrally molded as shown in fig. 1 to 12, and the thicknesses of the respective portions are preferably equal to each other. Meanwhile, the first contact part 2 is a plate-shaped structure arranged along the longitudinal direction of the probe, the second contact part 4 is a plate-shaped structure arranged along the transverse direction of the probe, the first contact part and the second contact part are correspondingly connected through the first elastic part 3, the connecting part 9 and the second elastic part 10, and all the parts are integrally formed. Moreover, when the probe 1 is integrally formed, the base material of the probe can be preferably selected according to the requirement when the probe 1 works, the stainless steel material is preferably adopted, and nickel plating and gold plating treatment are carried out on the surface; of course, it is also preferable to use a material with better conductivity, such as aluminum alloy, copper alloy, silver-copper alloy, etc., and the on-resistance of the whole probe can be further adjusted by changing the thickness of the plating layer on the surface of the material, and the specific selection of the above-mentioned substrate factors needs to be comprehensively considered and selected from the aspects of the overall performance and economic benefits of the probe 1.

Further specifically, as shown in fig. 1 to 2, the first contact portion 2 extends in the probe longitudinal direction, and an end portion thereof is provided with a first contact point portion 21 for contact communication with the corresponding detecting unit. Meanwhile, as shown in fig. 3, the first elastic part 3 in the preferred embodiment extends in the probe transverse direction, and has one end connected to a first end part 31 of the first contact part 2 side and the other end connected to a second end part 32 of the connection part 9 side. The first end portion 31 and the second end portion 32 include 3 strip-shaped elastic pieces extending in the probe transverse direction, i.e., a first strip-shaped elastic piece 33 shown in fig. 2. Both ends (i.e. the first elastic sheet end 331 and the second elastic sheet end 332) of each strip-shaped elastic sheet are respectively connected to the side wall surfaces of the first contact portion 2 and the connecting portion 9, and are separated from each other by the first elastic sheet gap 51 and the second elastic sheet gap 52, and the widths of the first elastic sheet gap 51 and the second elastic sheet gap 52 may be the same or different.

Further, each of the first band-like elastic pieces 33 has a wave shape extending in the probe transverse direction, and is formed with a plurality of bent portions, such as a first bent portion 64 and a second bent portion 65 shown in fig. 3. Wherein the center of curvature O of the first curved portion ₁ A center of curvature O of the second curved portion below the first elastic portion 3 ₂ A bending arc angle corresponding to the first bending part (corresponding to the curvature center O in FIG. 3) above the first elastic part 3 ₁ Angle between two dotted lines) is preferably recorded as θ ₁ The second bending part corresponds to the bending arc angle (corresponding to the curvature center O in FIG. 3) ₂ Angle between two dotted lines) is preferably recorded as θ ₂ . At the same time, theta ₁ 、θ ₂ Preferably between 5 ° and 175 °, and the change in the bending arc angle generally corresponds to the change in the corresponding bending section length and bending arc. In addition, the center of curvature of the two bent parts of the same strip-shaped elastic piece is arranged on the two sides of the first elastic part 3 along the longitudinal direction of the probe, so that one end of the first elastic part 3When elastic deformation is generated by the Z-direction acting force, the restoring stress in the two bending parts can be offset to a certain extent in the longitudinal direction of the probe, and then the stress in the first elastic part 3 is dispersed.

It is preferable that the number of the bent portions in the first elastic portion 3 is two, as shown in fig. 3, in order to make the length of the first elastic portion 3 relatively close to a straight line while generating elasticity, i.e., so that the actual transmission path of each strip-shaped elastic piece is not too long, in which case the sectional area of each strip-shaped elastic piece may be set in a large form, thereby making the overall resistance of the probe 1 small. Of course, the number of the curved portions in the first elastic portion 3 is not limited to 2, and it may be provided in a plurality according to actual needs, and the curvature centers of two adjacent curved portions are provided on two sides of the first elastic portion 3. However, as the more bending portions in the wavy structure, the longer the actual transmission path thereof, which results in poor quality of probe signal transmission, the smaller the cross-sectional area of the strip-shaped elastic sheet that can be actually disposed, and further results in a larger overall resistance of the probe 1, which is not favorable for the application of the probe 1 in the environment of high-speed signal and high overcurrent, the number of the bending portions is not more than 4 in actual disposition.

In the present embodiment, each of the first belt-like elastic pieces 33 has substantially the same cross-sectional shape, that is, a rectangular shape, and the cross-sectional areas thereof are preferably the same. However, in actual installation, the cross-sectional arrangement form of each of the elastic band pieces may be the same or different, and the cross-sectional areas may be the same or different from each other. In addition, the number of the belt-shaped elastic pieces is not limited to three as shown in the present application, and may be preferably more or less according to actual needs, and it is only necessary to ensure that the sum of the sectional areas of all the belt-shaped elastic pieces meets the transmission requirement.

In actual installation, the length of the probe 1 in the width direction (i.e. the probe width) is 1.5 to 15mm, and the installation thickness of the probe 1 is preferably 0.05 to 3mm, and the selection of the probe width, the probe length and the probe thickness is closely related to the application environment of the probe 1. When the thickness of the probe 1 is determined, the minimum effective cross-sectional area of the probe 1 for signal transmission can be effectively controlled by preferably designing the width of each component of the probe 1, and the resistance of the probe 1 can be further controlled. When the probe 1 is designed, the magnitude of the on-resistance is determined by the minimum sectional area of the conductive portion, and the larger the minimum sectional area is, the smaller the on-resistance is. Therefore, in the case of a certain thickness of the probe 1, it is necessary to control the minimum conducting width in the conducting part, and the ratio of the minimum conducting width to the probe width is between 1 and 150.

Further, the minimum cross-sectional area in the conduction path of the probe 1 may be present at the elastic portion, and may also be present at the position of the non-elastic portion (i.e., the two contact portions and the connecting portion), which may be preferable according to the actual installation requirements. In general, regarding the structure of each part of the probe 1, the first contact part 2, the second contact part 4, and the connection part 9 hardly deform during the operation of the probe, and mostly displace in position, while the first elastic part 3 and the second elastic part 10 deform according to the stress of the first contact part 2. It is known that the larger the width of a material having the same thickness and the same material is, the larger the force to be applied when the material is deformed becomes. Therefore, the width of the probe 1 at which deformation occurs (i.e., the first elastic portion 3 and the second elastic portion 10) cannot be set too large. In view of this, the preferred embodiment of the present invention sets the effective cross-sectional conducting area of the two elastic portions to the minimum cross-sectional conducting area of the probe 1, i.e. the effective cross-sectional conducting area of the two elastic portions is not greater than the minimum cross-sectional area on the two contact portions and the connecting portion. As long as the minimum conductive cross-sectional area is increased as much as possible, the on-resistance of the probe 1 is as small as possible, so that the probe 1 meets the requirement of high-speed signal transmission.

Referring to table 1, a comparison is made between the conventional pogo pin and several probes in the preferred embodiment of the present invention, the difference between the performance index of the probe in the preferred embodiment of the present invention and the performance index of the conventional pogo pin is investigated, and the influence of the minimum cross-sectional area on the performance of the probe is analyzed by changing the minimum cross-sectional area on the conduction path of the probe. Specifically, the probes in table 1 were unified to have a probe thickness of 0.11mm, the new probes 1 to 7 were probes in the preferred embodiment of the present invention, and the minimum cross-sectional area of the new probes 1 to 7 was provided in the elastic portion. In addition, L1/L2 refers to the ratio of the minimum conduction width of the probe to the width of the probe.

Table 1: minimum cross-sectional area of probe conduction path has an effect on probe performance

It can be easily found from the data comparison in table 1: 1. compared with the conventional dome probe, the probe 1 in the preferred embodiment of the present invention has a significantly shortened length of the conduction path for signal transmission, which is a necessary result based on the preferred design of the specific structure of the probe 1 in the preferred embodiment of the present invention; 2. in the preferred embodiment of the invention, the ratio of the minimum conduction width to the probe width is preferably selected, so that the minimum cross-sectional area on the conduction path of the probe is larger than the minimum cross-sectional area of the conventional spring probe, the maximum overcurrent capacity and the transmission rate of the probe in the preferred embodiment of the invention are obviously higher than those of the conventional spring probe, and the working performance of the probe is greatly improved; 3. the probe in the preferred embodiment of the invention has the advantages that through the preferred design of the structure, the elasticity of the probe tip is far larger than that of the existing spring probe, and the effect is generated because the effective width of the elastic part in the preferred embodiment of the invention is greatly increased compared with that of the existing spring probe, and when the probe tip is matched with a corresponding part and the elastic part is deformed, the reaction force acted on the probe tip by the elastic part is correspondingly increased, so that the connection reliability of the contact part of the probe and the related part can be fully ensured; 4. in the probe according to the preferred embodiment of the present invention, the magnitude of the elastic force of the tip increases with the increase of the minimum cross-sectional area, and obviously, in order to ensure the reliability of the matching of the probe and the relevant components, the magnitude of the elastic force at the tip cannot be too large, otherwise, the risk of damaging the relevant components is easy to exist, and therefore, the minimum cross-sectional area needs to be controlled within a certain range, that is, the minimum conduction width at the elastic part needs to be controlled.

In summary, compared with the conventional pogo pin, the probe in the preferred embodiment of the present invention has a significantly shortened conduction path, a significantly improved maximum current capacity and transmission rate, and a significantly improved connection stability between the probe and the related components. Meanwhile, although the increase of the minimum cross-sectional area is accompanied with the increase of the maximum flow capacity and the transmission rate, the elastic force at the needle tip is increased at the same time, and the connection reliability of the needle tip of the probe and related components is influenced. Therefore, when actually arranging the probe according to the preferred embodiment of the present invention, it is necessary to control the minimum cross-sectional area or the minimum conduction width within a certain range in consideration of the balance of parameters such as the maximum overcurrent capacity, the transmission rate, the tip elastic force, and the like.

Further, the magnitude of the acting force applied to the elastic part when the elastic part is deformed is considered to be closely related to the thickness of the elastic part. Therefore, when the thickness of the probe 1 is constant and the overcurrent capacity of the probe 1 is determined, the thicknesses of the two elastic parts can be determined. In this case, if the thickness of the elastic portion is large, the force required for deformation is large. In order to avoid this, the elastic portion may be divided into a plurality of band-like elastic pieces in the width direction thereof. Theoretically, the elastic part is divided into enough strip-shaped elastic pieces, so that the acting force borne by the first contact part 2 can be fully dispersed; however, as the number of the strip-shaped elastic pieces increases, the corresponding elastic piece gap also increases, and the installation length of the probe 1 increases, which may result in that the probe 1 cannot meet the requirement of the application length. Therefore, in actual installation, it is necessary to fully consider the balance between the effective sectional area of the elastic portion, the number of the belt-like elastic pieces installed, the installation width, the elastic piece gap width, and other factors.

Further, in the preferred embodiment, the first elastic portion 3 is exemplified to have an effective cross-sectional area in the range of 0.005mm ² ～18mm ² The number of the strip-shaped elastic pieces is 1-6. When the number of the strip-shaped elastic pieces is 1, namely the first elastic part 3 is of a complete structure and does not contain a spring piece gap, the width range of the strip-shaped elastic pieces is 0.1-2 mm. When the number of the strip-shaped elastic pieces is 2-6, the first elastic part 3 is provided with 1-5 elastic piece gaps, and each strip-shaped elastic pieceThe width of the sheet ranges from 0.05 to 1mm, and the gap between the belt-shaped elastic sheets ranges from 0.06 to 0.5mm. Meanwhile, the width of the belt-shaped elastic pieces can be the same or partially the same or different. For example, when the number of the belt-like elastic pieces is more than two, the width of the belt-like elastic piece positioned in the middle is the largest, and the width of the belt-like elastic piece is reduced towards two sides in sequence; alternatively, when the belt-like elastic piece is provided in plural, the width value of the belt-like elastic piece increases or decreases in the probe longitudinal direction from one side to the other side in order. Similarly, the setting width of each elastic sheet gap can be equal or unequal.

Referring to table 2, by comparing the conventional pogo pin with the several pins 1 of the preferred embodiment of the present invention, the influence of the curvature of the elastic portion of the pin and the number of the elastic pieces on the performance of the pin can be determined. For each of the probes in table 2, the thickness was uniformly 0.11mm, the new probes 1 to 8 were probes in the preferred embodiment of the present invention, and the minimum cross-sectional area on the probe 1 was located in the first elastic part 3. Theta ₁ 、θ ₂ Each of the first elastic portions 3 has a bending angle corresponding to a bending portion of the strip-shaped elastic piece, and the specific meaning is the same as that described above.

It can be easily found from the comparison of the data in table 2: 1. compared with the existing spring plate probe, the probe 1 in the preferred embodiment of the invention has the advantages that through the structural preferred design and the corresponding selection of the minimum cross-sectional area, the signal transmission path is effectively shortened, the on-resistance of the probe 1 is greatly reduced, the probe has better maximum overcurrent capacity and higher transmission rate, and the signal transmission path and the data in the table 1 can also correspond to each other; 2. compared with the existing shrapnel probe, the probe 1 in the preferred embodiment of the invention has the advantages that the elastic force at the probe tip is far larger than that of the existing shrapnel probe, which can correspond to the relevant data in the table 1; 3. for the probe in the preferred embodiment of the present invention, when the cross-sectional area of the first elastic part 3 is kept constant, the length of the probe conduction path can be further changed by preferably setting the bending arc angle of the bending part thereof, and the elastic force at the tip can be changed; 4. along with the increase of the number of the strip-shaped elastic pieces, the elastic force at the needle point of the probe is reduced, which shows that on the premise of meeting the signal transmission capability of the probe, the purpose of changing the elastic force at the needle point can be achieved by changing the number of the strip-shaped elastic pieces.

Table 2: influence of bending radian of elastic part and number of elastic pieces on performance of probe

In summary, compared with the conventional spring probe, the probe in the preferred embodiment of the present invention has a significantly shortened conduction path, and the magnitude of the elastic force at the tip of the probe is significantly increased, i.e., the transmission rate of the probe is significantly increased, and the connection stability is also higher. Meanwhile, the bending radian of the bending part on the strip-shaped elastic sheet in the preferred embodiment of the invention is controlled, so that the length of a conduction path can be further adjusted, and the transmission performance of the probe is improved. In addition, through the quantity that sets up of control banded elastic webbing, can correspond the size of adjusting the elasticity of needle point department, make the probe satisfy the transmission performance on the basis, fully promote the reliability that probe and relevant part match. However, as can be seen from the foregoing, the number of the strip-shaped elastic pieces needs to be matched with the overall length of the probe, i.e., the number of the strip-shaped elastic pieces should be controlled within a certain range.

Further, as shown in fig. 1 to 10, the connecting portion 9 connected to the first elastic portion 3 is a plate-shaped structure disposed along the longitudinal direction of the probe, and the second end portion 32 of the first elastic portion 3 is connected to a side thereof opposite to the first contact portion 2, and is correspondingly connected to the second contact portion 4 through the second elastic portion 10.

In the present embodiment, the second elastic portion 10 has a structure as shown in fig. 4, 6, and 8, which has an S-like shape or a C-like shape continuously extending in the longitudinal direction of the probe.

Specifically, the second elastic portion 10 is formed by sequentially connecting a plurality of elastic bending portions 91 and a plurality of linear portions 92, wherein the linear portions 92 are straight plates extending in the transverse direction of the probe, both ends of each linear portion are connected to the bending portions 91, and two adjacent linear portions 92 are arranged in parallel and at intervals in the longitudinal direction of the probe. In the present embodiment, the number of the linear portions 92 is two, the linear portion 92 close to the second contact portion 4 is connected to one end of the second contact portion 4 by a third curved portion 911 having a curved angle of 180 ° (as shown on the left side in fig. 4), the two linear portions 92 are connected to each other by a fourth curved portion 912 having a curved angle of 180 ° (as shown on the right side in fig. 4), and the left end of the linear portion 92 away from the second contact portion 4 is connected to the bottom end of the connecting portion 9 by a fifth curved portion having a curved angle of 90 °.

Obviously, in actual arrangement, the number of the straight line portions 92 may be preferably set according to actual needs, and is, for example, 1, 3 or more. However, if the number of the straight portions 92 is large, firstly, the length of the transmission path of the probe 1 is lengthened, so that the resistance is increased, and secondly, the length of the probe 1 is lengthened, so that the matching design of the probe 1 is affected; when the number of the linear portions 92 is small, the elastic driving force of the second contact portion 10 may be insufficient. Therefore, the number of the linear portions 92 is usually two or 3, and when the number of the linear portions 92 is 3, the positions of the first contact portions 2 and the connecting portions 9 in fig. 2 are correspondingly reversed.

Further, the second elastic portion 10 is composed of a plurality of second strip-shaped elastic pieces 81 arranged at intervals, and two adjacent second strip-shaped elastic pieces 81 are separated by a third elastic piece gap 101 and a fourth elastic piece gap 102. In the preferred embodiment, the cross-sectional shape of the second band-like elastic pieces 81 is rectangular, and the width of each second band-like elastic piece 81 (i.e., the thickness of each band-like elastic piece in the longitudinal direction of the probe at the straight portion 92) is equal or unequal. Obviously, as with the first elastic part 3, the total width of the second elastic part 10, which is the total width W8 minus the interval between the spring pieces, is not greater than the width W7 of the connecting part 9, i.e., (W8-2W 9) ≦ W7, i.e., the effective cross-sectional area of the second elastic part 10 is not greater than the cross-sectional area of the connecting part 9, nor greater than the minimum of the cross-sectional areas of the first contact part 2 and the second contact part 4.

Obviously, the number of the belt-like elastic pieces in the second elastic portion 10 is not limited to 3, and may be set to other numbers, such as 1 to 6 corresponding to the first elastic portion 2, as required, and the arrangement form of the belt-like elastic pieces may be the same as that of the first elastic portion 2. In addition, in the preferred embodiment, the connecting portion 9 is provided with a width equal to the width of the second contact portion 10, which is W7.

Further, the second contact portion 4 in the preferred embodiment is as shown in fig. 1, 2 and 4, and a side thereof facing away from the second elastic portion 10 is provided with at least one contact portion in the longitudinal direction of the probe, i.e. a second contact portion 41 extending in the longitudinal direction of the probe for abutting communication with another test component. Specifically, the second contact portions 41 are provided in two spaced-apart positions in the longitudinal direction (i.e., in the probe-transverse direction) of the second contact portion 4, and the center lines of the two second contact portions 41 are flush with the ends of the respective straight portions 92, as shown in fig. 4. In addition, since the two second contact portions 41 are disposed at a distance from the end of the second contact portion 4, two sides of the two second contact portions 41 departing from each other are formed with second limiting portions 43, which are used for limiting the two ends of the end cap 40 to abut against after the probe 1 is disposed on the needle mold 30 in a matching manner, as shown in fig. 12.

Since the first contact portion 2 is connected to the connection portion 9 through the first elastic portion 3, and the length direction of the first elastic portion 3 is along the transverse direction of the probe, there is a risk that the first contact portion 2 is inclined left and right after being disposed. Therefore, in order to ensure that the first contact part 2 of the probe 1 can be always in or almost always in a vertical state after the probe is arranged, a limiting component for limiting the first contact part 2 is correspondingly arranged on the probe 1.

The stop assembly of the preferred embodiment may be configured in a variety of ways depending on the type of manufacture, the environment of use, etc., and is described in more detail below with reference to several embodiments.

Example 1:

in this embodiment, the structure of the probe 1 is as shown in fig. 1 to 4, wherein the position limiting assembly includes a first position limiting portion 42, a second position limiting portion 43, and a third position limiting portion, and the second position limiting portion 43 is described in the foregoing, and is not described herein again. The first limiting portion 42 is formed by bending the top of the connecting portion 9 by 90 degrees and horizontally extending for a certain length, and the end portion of the first limiting portion points to the first contact portion 2 and is spaced from the first contact portion 2 by a certain distance. By providing the first stopper 42, the first contact portion 2 can be laterally stopped when it is inclined toward the connection portion 9. Meanwhile, the arrangement of the first limiting part 42 can realize the Z-direction limitation when the probe 1 is arranged in the needle die, and the stability of the longitudinal arrangement of the probe is ensured. Furthermore, the provision of the first stopper portion 42 can also restrict the vertical movement of the first contact portion 2 by the first stopper portion 42 stopping the vertical movement of the first elastic portion 3.

Furthermore, the third position-limiting part includes a first position-limiting post 22 and a second position-limiting post 23, and the first position-limiting post 22 is extended from the end of the first contact part 2 facing the second elastic part 10 along the longitudinal direction of the probe, that is, along the length direction of the first contact part 2. The second position-limiting post 23 is disposed on one side of the second elastic portion 10 opposite to the first elastic portion 3 along the length direction, and the end portion of the second elastic portion 3 is aligned with the end portion, and the first position-limiting post 22 and the second position-limiting post 23 are slidably attached to each other by the side wall surfaces, so that the first contact portion 2 can be guided by the second position-limiting post 23 when moving along the length direction. Meanwhile, the second stopper column 23 may be disposed to limit the inclination of the first contact portion 2 to the right. In addition, the length of the second limiting column 23 along the length direction should satisfy: when the end of the first stopper column 22 abuts against the second elastic portion 10, the end of the second stopper column 23 does not abut against the first elastic portion 3.

Example 2:

in this embodiment, the structure of the probe 1 is as shown in fig. 5 and 6, at this time, the limiting component includes a first limiting portion 42, a second limiting portion 43 and a third limiting portion, and the second limiting portion 43 is described in the foregoing, and is not described herein again. The first limiting portion 42 is formed by bending the top of the connecting portion 9 by 90 degrees and then horizontally extending for a certain length, the end portion of the first limiting portion is directed to the first contact portion 2, and the end portion is bent by 90 degrees and then extends for a certain length to the side away from the first elastic portion 3, so that a third limiting column 25 is formed.

Correspondingly, a limiting groove 24 is formed on the first contact part 2 along the longitudinal direction of the probe, as shown in fig. 6, and at this time, the first contact part 2 is in a 7-shaped structure. Then, the side wall surface of the third stopper post 25 abuts against the side wall surface of the first contact portion 2, and the end portion thereof is embedded in the stopper groove 24. Through the matching of the limiting groove 24 and the third limiting column 25, the limitation of the left and right inclination of the first contact part 2 can be realized, and the motion of the second contact part 2 along the longitudinal direction of the probe is guided.

Example 3:

in this embodiment, the structure of the probe 1 is as shown in fig. 7 and 8, and on the basis of the structure in the preferred embodiment 2, a first stopper column 22 and a second stopper column 23 are further provided, and the arrangement form of both is the same as that in embodiment 1. Through the corresponding arrangement and matching of the first limiting column 22, the second limiting column 23, the limiting groove 24 and the third limiting column 25, the accurate limiting and guiding of the first contact part 2 can be realized.

Example 4:

in the present embodiment, the structure of the probe 1 is as shown in fig. 9 and 10, and compared with the structure in embodiment 1, the arrangement form of the first limiting column 22 is only changed to the form of the limiting groove 24, that is, the first contact part 2 is provided with a groove with a certain depth along the longitudinal direction of the probe in alignment with the end part of the second elastic part 10. Meanwhile, the limiting groove 24 is aligned with the second limiting column 23 in the longitudinal direction of the probe, and the end of the second limiting column 23 is embedded into the limiting groove 24 in a matching manner and can guide the movement of the first contact part 2.

Obviously, the arrangement form of the limiting component of the probe 1 in the preferred embodiment of the present invention is not limited to the four types described above, as long as the requirement of the inclination of the first contact part 1 on the left and right sides can be satisfied, and the limitation of the movement of the first contact part 2 in the longitudinal direction of the probe can be realized.

Further, for the probe 1 in the preferred embodiment of the present invention, the initial state and the working compression state are as shown in fig. 11, and the arrangement form of the probe 1 in the needle mold 30 is as shown in fig. 12. It can be easily seen that the first contact part 2 and the second contact part 4 can be reliably limited during operation by the corresponding arrangement of the first elastic part 3, the second elastic part 10 and the limiting assembly, and the arrangement of the two elastic parts enables the two contact parts to be accurately abutted to the detection part. Especially, the second elastic part 10 is arranged, so that the second contact part 4 is subjected to a downward acting force when the probe works, and the second contact part 4 is abutted against a corresponding part, thereby improving the communication reliability of the probe 1 during working.

The probe and the connector suitable for high-current high-speed signal testing are simple in structure and convenient to set, the first elastic part, the second elastic part and the limiting assembly are arranged corresponding to the first contact part and the second contact part, and the corresponding arrangement of the two elastic part structures can be utilized to fully meet the application of the probe in high-speed transmission and high-current testing environments, improve the reliability and stability of probe testing, and have good application prospect and popularization value.

It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. A probe suitable for high-current high-speed signal testing comprises a first contact part and a second contact part which are arranged at intervals in the longitudinal direction of the probe, and is characterized by further comprising a first elastic part, a second elastic part, a connecting part and a limiting assembly, wherein all the parts are integrally formed;

the first elastic part is bent and extended along the transverse direction of the probe, two ends of the first elastic part are respectively connected with the first contact part and the connecting part, and the first elastic part can deform when the first contact part is subjected to longitudinal force and transmit the longitudinal force to the connecting part; the second elastic part extends along the longitudinal direction of the probe in a bending way and comprises at least one straight line part and a plurality of first bending parts; the straight line part is arranged along the transverse direction of the probe, and two ends of the straight line part are connected with the end part of the second contact part, the end part of the adjacent straight line part or the end part of the connecting part through corresponding first bending parts; and is

The limiting assembly is arranged corresponding to the first contact part and is used for limiting and guiding the first contact part when the first contact part moves in the longitudinal direction of the probe and limiting the first contact part to deflect and incline in the transverse direction of the probe; the limiting assembly comprises a first limiting part; the first limiting part is obtained by bending one end of the connecting part, which is far away from the second elastic part, by 90 degrees and then extending towards the first contact part along the transverse direction of the probe; the limiting component also comprises a third limiting part;

the third limiting part comprises a first limiting column and a second limiting column which are arranged along the longitudinal direction of the probe; the first limiting column is formed by extending one end of the first contact part, which is close to the second contact part, along the longitudinal direction of the probe; the second limiting column is fixedly arranged on the second elastic part and is arranged along the longitudinal direction of the probe, the end part of the second limiting column is aligned to one side of the first elastic part, and the side wall surface of the second limiting column is tightly attached to the side wall surface of the first limiting column;

or

2. The probe suitable for high current high speed signal testing according to claim 1, wherein the minimum cross-sectional area of the probe conduction path is located at two elastic portions, connecting portions or two contact portions, and the ratio of the corresponding width of the minimum cross-sectional area to the probe width is 1.

3. The probe suitable for high-current high-speed signal testing according to claim 2, wherein the effective cross-sectional areas of the two elastic portions are respectively not greater than the minimum value of the cross-sectional areas of the two contact portions and the connecting portion; the first elastic part is of a wavy structure and comprises at least one first elastic sheet;

the first elastic sheet is of a belt-shaped structure, and two ends of the first elastic sheet are respectively connected to the first contact part and the side wall surface of the connecting part; and the first elastic sheet is provided with a plurality of second bending parts, and the curvature centers of two adjacent second bending parts are arranged at two sides of the first elastic part along the longitudinal direction of the probe.

4. The probe suitable for high-current high-speed signal testing according to claim 3, wherein the width of the probe is 1.5 mm-15 mm;

the number of the first elastic pieces is 1, and the width range of the first elastic pieces is 0.1 mm-2 mm; or alternatively

5. The probe suitable for high-current high-speed signal testing according to claim 4, wherein the second elastic portion comprises a second elastic sheet with a width ranging from 0.1mm to 2mm; or

The second elastic part comprises 2-6 second elastic pieces which are arranged at intervals, the width range of each second elastic piece is 0.05 mm-1 mm, and the width of an elastic piece gap between every two adjacent second elastic pieces is 0.06 mm-0.5 mm.

6. A connector comprising the probe of any one of claims 1 to 5, and further comprising a needle mold capable of receiving the probe and an end cap capable of limitedly sealing the probe in the needle mold.