CN211528494U - Probe - Google Patents

Abstract

The utility model discloses a probe, which comprises a first contact part and a second contact part which are arranged at intervals in the longitudinal direction, and an elastic part which is used for connecting the first contact part and the second contact part; the elastic part comprises a plurality of elastic units which are in annular structures and are connected in series in the longitudinal direction, and the adjacent two elastic units are connected in a way that the outer contours are tangent or intersected; the end parts of the head elastic unit and the tail elastic unit are respectively connected with the first contact part and the second contact part; the utility model can improve the binding force between two adjacent elastic units, and avoid the deviation along the width direction of the probe when the elastic part is compressed by stress, thereby avoiding affecting the connection reliability between the first contact part, the second contact part and the respective contacted object; in addition, the conduction path of the probe can be shortened, and the signal transmission quality and the signal transmission rate are improved, so that the probe can adapt to the transmission of high-speed signals and is applied to a large-current test scene.

Description

Probe

Technical Field

The utility model belongs to the technical field of signal transmission and test, more specifically relates to an elasticity flat probe that is applicable to high speed signal transmission and can effectively restrain the skew.

Background

In the manufacturing process of electronic component modules such as liquid crystal panels and integrated circuits, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to FPC contact electrodes by using probes, or electrode portions of the substrate be connected to a detection device, and the detection operation be completed accordingly.

In general, a probe pin is generally used which has a pair of contacts capable of being brought into contact with electrode terminals of an electronic component and electrode terminals of a connected electronic component, respectively, and an elastic portion connected between the pair of contacts. The probe ensures contact pressure between the contact and the electrode terminals of the electronic component and the electrode terminals of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminals of the electronic component and the electrode terminals of the connected electronic component.

At present, an elastic part of a probe is mostly formed by alternately connecting a straight part and a bent part, and in order to better exert the spring characteristic of the elastic part, the elastic part is often provided with more than two bent parts, which causes the actual conduction length of the elastic part to be longer, which results in that the transmission path of a signal in the probe is lengthened, the signal has the risks of serious attenuation and poor signal quality in the transmission process, and the use requirement of high-speed signal transmission cannot be met. In addition, the conventional probe has a large on-resistance, which can severely limit the transmission speed of the high-speed signal, and thus cannot be effectively applied to the test environment of the high-speed signal.

SUMMERY OF THE UTILITY MODEL

At least one defect or improvement demand to prior art, the utility model provides a probe can effectively realize two contact sites of probe during operation and correspond supporting of part tightly, promotes the reliability of probe butt intercommunication to reliably realize the test of probe under low impedance, high-speed signal transmission environment.

In order to achieve the above object, according to one aspect of the present invention, there is provided a probe including a first contact portion and a second contact portion which are spaced apart from each other in a longitudinal direction, and an elastic portion for connecting the first contact portion and the second contact portion; wherein:

the elastic part comprises a plurality of elastic units which are in annular structures and are connected in series in the longitudinal direction, and the adjacent two elastic units are connected in a way that the outer contours are tangent or intersected; the end parts of the head elastic unit and the tail elastic unit are respectively connected with the first contact part and the second contact part.

Preferably, the probe has a first connecting portion, which is non-elastic, at a joint between two adjacent elastic units.

Preferably, the first and second elastic units of the probe are connected to the first contact portion or the second contact portion via a non-elastic second connecting portion, and the second connecting portion is disposed on a center line of the elastic units.

Preferably, in the probe described above, the first contact portion includes a first stopper portion extending in the lateral direction and a first contact portion disposed at an end of the first stopper portion;

the first limiting part is connected with the elastic unit through the connecting part and is configured to be symmetrical about the center line of the elastic unit.

Preferably, in the probe, a side of the first stopper portion adjacent to the elastic unit has a contact surface matching a curvature of the elastic unit.

Preferably, in the probe described above, the second contact portion includes a second position-limiting portion extending in the transverse direction and a second contact portion protruding from the second position-limiting portion on a side away from the elastic unit;

the second limiting part is connected with the elastic unit through the connecting part and is configured to be symmetrical about the center line of the elastic unit.

Preferably, in the probe, a side of the second stopper portion adjacent to the elastic unit has a contact surface matching a curvature of the elastic unit.

Preferably, in the probe, the elastic unit includes 1-3 elastic pieces, and the two adjacent elastic pieces are separated by an elastic piece gap.

Preferably, in the probe, the width of the elastic sheet is 0.03-0.2 mm, and the width of the elastic sheet gap is 0.05-0.1 mm.

Preferably, in the probe, a ratio of a compressible amount of the elastic part in the longitudinal direction to a maximum length of the probe in the longitudinal direction is 1/20 to 1/25.

Generally, through the utility model discloses above technical scheme who conceives compares with prior art, can gain following beneficial effect:

(1) the utility model provides a probe, the elasticity portion for connecting first contact site, second contact site includes a plurality of ring structures and connects elastic unit in series longitudinally, connect with the tangent or crossing mode of outline between two adjacent elastic units; based on the structure, the binding force between two adjacent elastic units is improved, and the elastic parts are prevented from deviating in the width direction of the probe when being stressed and compressed, so that the connection reliability between the first contact part and the second contact part and the respective contacted objects is further prevented from being influenced; in addition, the connecting structure can also shorten the conduction path of the probe and improve the signal transmission quality and transmission rate, so that the probe can adapt to the transmission of high-speed signals and is applied to a large-current test scene.

(2) The utility model discloses a probe, it is through setting up the elasticity portion into a plurality of spaced flexure strips each other, utilizes the matching setting of flexure strip quantity, width, shell fragment clearance width isoparametric and probe length, thickness, has effectively realized the elasticity portion and has actually switched on the corresponding regulation of cross sectional area and deformability, has guaranteed the reliability of the first contact site of probe, second contact site and corresponding part butt intercommunication, provides the condition for the reliable application of probe under the high-speed signal transmission environment.

(3) The utility model provides a probe, two adjacent elastic unit's the connection position and head, two elastic unit of tail and the connection position of first contact site, second contact site are non-elastic construction, further improve the cohesion between elastic site and first contact site, the second contact site, restrain the probe in the ascending skew of width direction, ensure first, second contact site and the accurate butt joint of measurand thing.

(4) The utility model provides a probe, its simple structure sets up portably, utilizes the corresponding setting of each part, can reduce the conducting resistance of probe on realizing the reliable basis of connecting of two contact sites of probe, for the transmission of high rate signal and the application under the heavy current test environment provide probably, has expanded the range of application of probe, has reduced the application cost of probe, has better application prospect and spreading value.

Drawings

Fig. 1 is a schematic structural diagram of a probe provided in an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a probe according to a preferred example provided in the embodiment of the present invention;

fig. 3 is a schematic diagram illustrating deformation of the probe when compressed by a force according to an embodiment of the present invention;

fig. 4 is a front view of a plurality of first contact portions having different shapes provided by the embodiment of the present invention;

in all the figures, the same reference numerals denote the same features, in particular: 1-a first contact part, 11-a first contact part, 12-a first limit part; 2-elastic part, 21-elastic unit, 211-band elastic sheet, 212-elastic sheet gap; 22-a first connection, 23-a second connection; 3-a second contact part, 31-a second contact part, 32-a second limit part; w₁Width of spring plate, W₂The gap width.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. Furthermore, the technical features mentioned in the embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship indicated based on the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

The following description is merely exemplary in nature and is not intended to limit the present invention, the applications thereof, or the uses thereof. Further, the drawings are schematic, and the proportions of the respective dimensions and the like do not necessarily coincide with the actual situation.

Fig. 1 is a schematic structural diagram of the probe provided in this embodiment, and referring to fig. 1, the probe is a plate-shaped structure having conductivity, and the thicknesses of the parts are preferably equal. The probe comprises a first contact part 1, a second contact part 3 and an elastic part 2 for connecting the first contact part 1 and the second contact part 3;

wherein, the end of the first contact part 1 is provided with a first contact part 11, the second contact part 3 is provided with at least one second contact part 31, and in fig. 1, the second contact part 3 of each probe is provided with two second contact parts 31; the first contact point portion 11 of the first contact portion 1 is configured to be able to contact a terminal of an object to be measured (for example, an FPC contact electrode, a substrate-to-substrate (BtoB) connector); the second contact point portion 31 of the second contact portion 3 is configured to be able to contact with a terminal of a substrate (for example, FPC/PCBA or other conductive adapter) of the inspection apparatus; in use, the probe having conductivity connects the object to be tested and the inspection apparatus to provide a test signal transmission path.

The elastic part 2 can stretch and contract along the length direction (longitudinal direction) of the probe when the first contact part 1 or the second contact part 3 is stressed, so that the first contact part 1 and the second contact part 3 are close to or far away from each other along the length direction of the probe; accordingly, the width direction of the probe is taken as the lateral direction. As shown in fig. 1, the elastic part 2 includes a plurality of elastic units 21 connected in series in the longitudinal direction, each elastic unit 21 is a ring structure with a certain width, and preferably, each elastic unit 21 is a ring structure with central symmetry, which can ensure that the elastic units 21 can be uniformly stressed and compressed when stressed, and avoid lateral deviation; two adjacent elastic units 21 are connected in a way that the respective outer profiles are tangent or intersected; the ends of the first and the last elastic units 21 are respectively connected with the first contact part 1 and the second contact part 3. Based on the structure, the binding force between two adjacent elastic units 21 can be improved, the deviation along the width direction of the probe is avoided when the elastic part 2 is compressed by force, and the connection reliability between the first contact part 1 and the second contact part 3 and respective contacted objects is seriously influenced by the deviation; in addition, when the number of the elastic units 21 is fixed, the connection between two adjacent elastic units 21 in a manner that the outer contours of the two adjacent elastic units are tangent or intersected can also shorten the overall length of the elastic part 2 and further shorten the conduction path of the probe; under a normal condition, the service performance of the probe is related to the length of an actual conduction path of the probe, the shorter the conduction path is, the better the signal transmission quality is, and the higher the transmission rate is, so that the probe can adapt to the transmission of high-rate signals and is applied to a large-current test scene.

In order to further improve the resistance of the elastic portion 2 against the lateral deviation, as a preferred example, two adjacent elastic units 21 are connected in a manner that the respective outer contours thereof are tangent or intersected, and the formed connection is an inelastic first connection portion 22, so that the inelastic first connection portion 22 can further improve the bonding force between two adjacent elastic units 21 compared with the elastic state.

Further, in order to further improve the resistance of the elastic part 2 against the lateral deviation, the first and the last elastic units 21 are connected with the first contact part 1 or the second contact part 3 through the inelastic second connecting part 23, and the inelastic second connecting part 23 can improve the binding force between the elastic part 2 and the first and the second contact parts 1 and 3; more preferably, the second connecting portion 23 is disposed on the center line of the plurality of elastic units 21, so as to ensure that the elastic portion 2 can be uniformly compressed by force when the force is applied, and avoid the occurrence of lateral deviation.

Further, the present embodiment adjusts the overall elastic force of the probe by adjusting the shape of the elastic unit 21, and the shape of the elastic unit 21 may be circular, elliptical, or frame-like circular, elliptical, etc., and is not limited to the circular shape shown in fig. 1; the lengths of the elastic units 21 in the longitudinal direction and the transverse direction have an influence on the service performance of the probe, and specifically, when the maximum length of the elastic unit 21 in the longitudinal direction is greater than the maximum length thereof in the transverse direction, the overall elastic force of the elastic part 2 is improved, but limited by the width of the joint between two adjacent elastic units 21, the resistance of the entire elastic part 2 to transverse offset when compressed under force is not great; when the maximum length of the elastic unit 21 in the longitudinal direction is smaller than the maximum length thereof in the transverse direction, the overall elastic force of the elastic part 2 is appropriately reduced, but it is advantageous to improve the resistance of the entire elastic part 2 against the transverse deflection when compressed by a force, and to suppress the transverse deflection of the probe; preferably, the present embodiment improves the resistance of the elastic portion 2 against lateral deflection when compressed under force as much as possible, while ensuring that the elastic portion 2 can provide an elastic force that provides reliable connection between the first and second contact portions 1, 3 and the respective objects to be contacted; therefore, as a preferred example, the maximum length of the elastic unit 21 in the longitudinal direction is not greater than the maximum length thereof in the transverse direction.

Further, in a preferred embodiment, the thickness of the probe is 0.05-0.2 mm, the use performance of the probe is also related to the size of the on-resistance, the on-resistance is minimum, the signal transmission quality is higher, and the size of the on-resistance of the probe is generally determined by the minimum cross-sectional area in the conduction path, namely, the larger the minimum cross-sectional area is, the smaller the on-resistance is. Once the thickness value of the probe is determined, the actual on-resistance of the probe is determined by the minimum setting width on the conduction path, and by using the minimum setting width and the thickness of the probe, the minimum cross-sectional area on the conduction path of the probe can be known, so that the actual on-resistance of the probe can be determined. In the preferred embodiment, the smallest cross-sectional area in the conduction path of the probe is provided in the spring part 2, and by setting the actual conduction cross-section of the spring part 2 large enough, the actual on-resistance of the probe can be small enough, so that a fast transfer of high-speed signals can be achieved. However, in practical arrangements, it is obviously also possible to arrange the so-called minimum cross-sectional area in other areas, such as the first contact 1 and/or the second contact 3, but it should also be ensured that this minimum cross-sectional area meets the transmission requirements for high-speed signals.

However, it is known that, in the case of materials having the same thickness and the same material, the larger the width of the material, the larger the force to be applied when the material is deformed. Therefore, the width of the probe cannot be set to be too large for a portion (i.e., the elastic portion 2) where deformation occurs in the probe. In view of this, the preferred embodiment determines the elastic part 2 as the area with the smallest cross-sectional area and correspondingly achieves the balance between the elastic deformation capability of the elastic part 2 and the actual conduction capability.

Fig. 2 is a schematic structural diagram of a probe according to a preferred example provided in the present embodiment, in which each elastic unit 21 includes one or more belt-shaped elastic pieces 211 extending in a bent manner, and the sectional shapes of the respective belt-shaped elastic pieces 211 may be configured to be the same or different without affecting the function of the elastic part 2; as a preferable example, each of the belt-like elastic pieces 211 has substantially the same sectional area shape. The width W1 of the strip-shaped elastic pieces 211 is preferably 0.03-0.2 mm, and the number of the strip-shaped elastic pieces 211 is preferably 1-3, for example, two strip-shaped elastic pieces 211 are shown in fig. 2, and a certain gap, i.e., a spring piece gap 212, is arranged between two adjacent strip-shaped elastic pieces 211. The elastic piece gap 212 between the adjacent strip-shaped elastic pieces 211 is mainly used for preventing the strip-shaped elastic pieces 211 from contacting each other when the elastic part 2 is compressed and deformed, and the width W2 of the elastic piece gap 212 between the adjacent strip-shaped elastic pieces 211 is preferably set to be 0.05-0.1 mm; too small a gap increases the processing difficulty, and too large a gap widens the elastic portion 3, and the overall size of the probe increases accordingly. In practice, the same spring gap 212 is preferably the same in width at each part when the elastic part 2 is not under load. Theoretically, the larger the actual conduction cross-sectional area of the elastic portion 2 (the sum of the cross-sectional areas of the strip-shaped elastic pieces 211), the smaller the on-resistance of the probe, and the more suitable it is for application in a high-speed signal test environment; however, the cross-sectional area of the elastic part 2 is increased, which also correspondingly increases the acting force required to be applied when the elastic part 2 deforms, and at this time, the reaction force of the first contact part 11 and the second contact part 31 on the corresponding components is also increased, and if the reaction force is too large, there is a risk that the test component is damaged by jacking; when the cross-sectional area of the elastic part 2 is large, the deformation capability of the elastic part 2 can be improved by dividing the elastic part into a plurality of strip-shaped elastic pieces 211, but the increase of the number of the strip-shaped elastic pieces 211 can increase the elastic piece gap 212, and further the length of the probe can be increased, so that the probe can not meet the design requirement. Therefore, in the actual installation, it is necessary to consider the balance of the parameters such as the actual conductive cross-sectional area of the elastic portion, the number of elastic pieces, the thickness of the elastic pieces, and the number of elastic gaps, which is also the reason for performing the above-mentioned parameter installation in the preferred embodiment.

In addition, the lateral deviation of the probe is restrained by limiting the compression amount of the probe, specifically, the ratio of the compression amount of the elastic part 2 of the probe in the longitudinal direction to the maximum length of the probe in the longitudinal direction is 1/20-1/25; referring to fig. 3, when the probe has a length of H0 in an unstressed natural state and a length of H1 when compressed under a stress, the compression amount of the probe is (H0-H1), and the ratio of the compression amount of the probe to the maximum length of the probe in the longitudinal direction is (H0-H1)/H0 = 1/20-1/25. In practical applications, the elastic portion 2 provided in this embodiment has a compressible amount of 0.2 to 0.8mm in the longitudinal direction, and a corresponding compression force of 30gf to 100 gf.

Further, referring to fig. 1, the first contact portion 1 further includes a first limiting portion 12 extending along the transverse direction, and the first contact portion 11 is disposed at an end portion of the first limiting portion 12; the first stopper portion 12 is connected to the elastic unit 21 through a second connection portion 23, and is preferably configured to be symmetrical with respect to a center line of the elastic unit 21, that is, an end portion of the second connection portion 23 is connected to a center line of the first stopper portion 12; more preferably, the first stopper portion 12 has a contact surface on a side close to the elastic unit 21, the contact surface matching with the curvature of the elastic unit 21, so as to limit the amount of deformation of the elastic unit 21 when the elastic unit 21 is deformed. The shape of the first contact part 11 is matched with the contact terminal of the object to be measured; fig. 4 is a front view showing a plurality of first contact portions 1 having different shapes, the first contact portion 11 can be appropriately changed in shape according to the design of the probe, and is not limited to the shape shown in fig. 2, such as a (circular) arc-shaped tip, a single-pointed tip, a double-pointed tip, a wave-shaped tip, a wedge-shaped tip, a tooth-shaped tip, and the like, and the first contact portion 11 can be appropriately changed in shape and position according to the different shapes of the contact terminal of the object to be tested, so that the contact surface between the probe and the object to be tested can be as large as possible during the test, and can be designed into other shapes according to the special shape of the contact terminal pair of the object to be tested. Preferably, a hollow hole penetrating through both end surfaces is formed in the middle of the first contact portion 1, and the size of the hollow hole should correspond to the actual conduction cross-sectional area of the elastic portion 3, specifically, it can be understood that: the actual conductive cross-sectional area of the second contact portion 1 is not smaller than the actual conductive cross-sectional area of the spring portion 3.

The second contact part 3 further comprises a second limiting part 32 extending along the transverse direction, and the second contact part 31 is arranged on one side of the second limiting part 32 far away from the elastic unit 21; the second stopper portion 32 is connected to the elastic unit 21 through the second connection portion 23, and is preferably and symmetrically arranged with respect to the center line of the elastic unit 21; more preferably, one side of the second limiting portion 32 close to the elastic unit 21 has a contact surface matching with the curvature of the elastic unit 21, so as to limit the deformation of the elastic unit 21 when the elastic unit 21 is deformed. The second contact portion 31 in the preferred embodiment is shown in fig. 1 as having a block-like structure of "inverted trapezoid", extending in the longitudinal direction from the side of the second contact portion 3 facing away from the first contact portion 1, and the inverted trapezoid structure connects the second contact portion 3 at its bottom side (long side), i.e. the position where the second contact portion 31 contacts the component is the top side (short side) thereof. Preferably, a hollow hole penetrating through the two end faces is formed in the middle of the inverted trapezoid-shaped block structure, and the size of the hollow hole should correspond to the actual conduction cross-sectional area of the elastic part 3, specifically, it can be understood that: the actual conductive cross-sectional area of the second contact portion 31 is not smaller than the actual conductive cross-sectional area of the spring portion 3. Further preferably, at least two second contact portions 31 are provided on the second contact portion 3 at a lateral interval, a certain gap is provided between two adjacent second contact portions 31, and two second contact portions 31 located at the lateral outermost sides are respectively at a certain distance from the end of the second contact portion 3.

In addition, in practical use, a plurality of probes are generally arranged side by side in corresponding pin dies and combined into a connector structure for application. The first contact part 11 and the second contact part 31 of the probe are exposed outside the probe mould so as to be in butt joint with the measured object; in order to ensure the stability and reliability of the probe in the needle mold, the lengths of the first limiting part 12 and the second limiting part 32 are equal to the width of the inner cavity of the needle mold, so that the first contact part 1 and the second contact part 3 can respectively abut against the inner wall surface of the needle mold with the end parts, and the limitation of the probe in the needle mold is realized.

In order to further reduce the conductive resistance of the probe, in this embodiment, materials with better conductive performance, such as copper alloy, aluminum alloy, silver-copper alloy, and the like, are used as the base material for forming the probe; furthermore, the surface of the probe is also plated with a coating of materials such as nickel, gold and the like.

The probe that this embodiment provided is integrated into one piece's flat plate structure, does not have inside friction influence life-span in the test compression process, and general life-span can reach more than 5 times of conventional probe.

The utility model provides a probe, its simple structure, small, easy processing, through the corresponding setting of elasticity portion structure, take place horizontal skew when can effectively placing probe atress compression, be applied to the high-speed signal transmission under the low impedance test environment, satisfy the application demand of probe under specific application environment to can effectively guarantee the test stability and the test accuracy of probe, have better application prospect and spreading value.

It will be understood by those skilled in the art that the foregoing is merely a preferred embodiment of the present invention, and is not intended to limit the invention to the particular forms disclosed, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.

Claims (10)

1. A probe comprises a first contact part and a second contact part which are arranged at intervals in the longitudinal direction, and an elastic part used for connecting the first contact part and the second contact part; it is characterized in that the preparation method is characterized in that,

the elastic part comprises a plurality of elastic units which are in annular structures and are connected in series in the longitudinal direction, and the adjacent two elastic units are connected in a way that the outer contours are tangent or intersected; the end parts of the head elastic unit and the tail elastic unit are respectively connected with the first contact part and the second contact part;

each elastic unit comprises one or more elastic sheets, and the two adjacent elastic sheets are separated by an elastic sheet gap.

2. The probe according to claim 1, wherein the joint of two adjacent elastic units is a non-elastic first connecting part.

3. The probe according to claim 1, wherein the first and the last elastic units are connected to the first contact portion or the second contact portion through a non-elastic second connecting portion, and the second connecting portion is disposed on a center line of the elastic units.

4. The probe of claim 1, wherein the first contact portion comprises a first position-limiting portion extending in a transverse direction and a first contact portion disposed at an end of the first position-limiting portion;

the first limiting part is connected with the elastic unit and is configured to be symmetrical about the center line of the elastic unit.

5. The probe according to claim 4, wherein a side of the first stopper portion adjacent to the elastic unit has a contact surface matching a curvature of the elastic unit.

6. The probe according to claim 1, wherein the second contact portion includes a second stopper portion extending in the transverse direction and a protruding second contact portion provided on a side of the second stopper portion away from the elastic unit;

the second limiting part is connected with the elastic unit and is configured to be symmetrical about the center line of the elastic unit.

7. The probe according to claim 6, wherein a side of the second stopper portion adjacent to the elastic member has a contact surface matching a curvature of the elastic member.

8. The probe according to any one of claims 1 to 6, wherein the elastic unit comprises 1 to 3 elastic pieces.

9. The probe according to claim 8, wherein the width of the elastic piece is 0.03-0.2 mm, and the width of the spring piece gap is 0.05-0.1 mm.

10. The probe of claim 1, wherein the ratio of the amount of compressibility of the resilient portion in the longitudinal direction to the maximum length of the probe in the longitudinal direction is 1: (20-25).

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