CN216525969U

CN216525969U - Elastic flat probe

Info

Publication number: CN216525969U
Application number: CN202220245562.2U
Authority: CN
Inventors: 郑和海; 卜世琳; 余愿
Original assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Current assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingyitong Electronic Technology Co Ltd
Priority date: 2022-01-28
Filing date: 2022-01-28
Publication date: 2022-05-13
Anticipated expiration: 2032-01-28

Abstract

The utility model discloses an elastic flat probe, which belongs to the technical field of signal transmission and testing, and realizes the reliable support of a needle point part and a needle tail part in the probe conduction process by optimally arranging an elastic part structure in the elastic flat probe and utilizing the corresponding arrangement of an arc-shaped section, an end part connecting section and a straight section in the elastic part structure, thereby ensuring the reliability of the probe in the using process. The elastic flat probe is simple in structure and convenient to set, stress transmission between the needle point part and the needle tail part is more stable through the corresponding arrangement of the end part connecting section, the arc-shaped section and the straight section in the elastic part, transverse deflection of the needle point part and the needle tail part relative to the elastic part is avoided, high-speed signal transmission is guaranteed, the use stability of the probe is improved, the service life of the probe is prolonged, and the elastic flat probe has better practical value and application prospect.

Description

Elastic flat probe

Technical Field

The utility model belongs to the technical field of signal transmission and testing, and particularly relates to an elastic flat probe.

Background

In the manufacturing process of electronic component modules such as liquid crystal panels and integrated circuits, it is often necessary to perform processes such as conduction detection and operation characteristic inspection, and this generally requires that a main substrate of the electronic component module be connected to FPC contact electrodes by using probes, or electrode portions of the substrate be connected to a detection device, and the detection operation be completed accordingly.

At present, a probe pin commonly used has a pair of contacts capable of being brought into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and an elastic portion connected between the pair of contacts. The probe ensures contact pressure between the contact and the electrode terminals of the electronic component and the electrode terminals of the connected electronic component through the elastic part, and improves contact reliability of the electrode terminals of the electronic component and the electrode terminals of the connected electronic component. Common elastic part appearance is mostly S-shaped, snakelike, locates the flexion alternate connection at straight line portion both ends by the straight line portion that the level set up and part and constitutes, and often is provided with a plurality of parallel arrangement' S elastic webbing in the elastic part, and the interval between the elastic webbing is often less, leads to the connection of each elastic webbing in two contacts departments to comparatively concentrate for two contacts are when receiving probe width direction effort, very easily take place to deflect and are out of shape.

In the prior art, in order to avoid the deflection of the contact relative to the elastic part in the width direction of the probe, a limiting mechanism is often arranged aiming at the elastic part or the connection strength of the elastic belt and the contact is increased, so that the two contacts of the probe can only reciprocate in the length direction of the probe without deflection. However, the arrangement of the structure not only occupies the arrangement space of the elastic part, but also makes the molding and using processes of the probe more complicated, and increases the preparation cost and the application cost of the probe.

SUMMERY OF THE UTILITY MODEL

In view of one or more of the above drawbacks or needs in the prior art, the present invention provides a flat elastic probe, which can ensure the signal transmission efficiency of the probe, improve the stability and reliability of the probe, reduce the lateral deflection of the contacts at the two ends of the probe, and prolong the service life of the probe.

In order to achieve the purpose, the utility model provides an elastic flat probe, which comprises a needle tip part, an elastic part and a needle tail part which are sequentially arranged in the length direction of the probe; the needle tip part comprises a needle tip contact end and a needle tip connecting end connected with one end of the elastic part; the needle tail part comprises a needle tail contact end and a needle tail connecting end connected with the other end of the elastic part;

the elastic part is bent and extends between the needle tip part and the needle tail part, two ends of the elastic part are respectively connected with the needle tip connecting end and the needle tail connecting end through end connecting sections, and at least one group of arc sections are arranged between the two end connecting sections;

the arc-shaped section extends in a bending way in the width direction of the probe and at least comprises a first arc-shaped unit and a second arc-shaped unit which are arranged at intervals; the end parts of two adjacent arc sections are connected through a straight section along the length direction of the probe;

the end connecting section is provided with connecting ribs the number of which is the same as that of the arc units in the arc section; the connecting ribs comprise at least one vertical connecting rib and at least one oblique connecting rib; vertical splice bar extends along probe length direction, the slant splice bar extends along the crossing slant with probe length direction, and the arc unit is connected respectively to the tip that two splice bars are close to each other, and the tip that two splice bars deviate from each other is connected respectively perhaps on the needle point joint end.

As a further improvement of the utility model, the needle tip connecting end and/or the needle tail connecting end extend along the width direction of the probe.

As a further improvement of the utility model, the end parts of the vertical connecting ribs and the inclined connecting ribs, which are deviated from each other, are respectively connected to two ends of the needle point connecting end or the needle tail connecting end.

As a further improvement of the present invention, at least one additional arc unit is disposed between the first arc unit and the second arc unit;

correspondingly, a corresponding number of additional connecting ribs are arranged between the vertical connecting ribs and the oblique connecting ribs; the additional connection rib extends along the oblique direction or the length direction of the probe.

As a further improvement of the present invention, at least two elastic bands continuously extending in a curved manner are formed in the elastic portion; the width of the elastic belt is 0.03 mm-0.20 mm.

As a further improvement of the utility model, the distance between two adjacent elastic belts is 0.05 mm-0.10 mm.

As a further improvement of the utility model, the arc sections are a plurality of groups arranged at intervals in the length direction of the probe, and the distance between two adjacent groups of arc sections is 0.5 mm-1.0 mm.

As a further improvement of the utility model, the vertical connecting rib is connected to one end of the needle point connecting end, which is close to the needle point contact end.

As a further improvement of the utility model, the needle point contact end is arranged orthogonally to the needle point connecting end, and the end part of the needle point contact end, which is far away from the needle point connecting end, is provided with a needle point for abutting and conducting with a corresponding conducting switching assembly.

As a further improvement of the utility model, the pin tail contact end comprises a plurality of contact bosses arranged on one side of the pin tail connection end, which is far away from the elastic part, and the contact bosses are used for being abutted and conducted with the corresponding conduction switching assembly.

The above-described improved technical features may be combined with each other as long as they do not conflict with each other.

Generally, compared with the prior art, the technical scheme conceived by the utility model has the following beneficial effects:

(1) according to the elastic flat probe, the elastic part structure in the elastic flat probe is preferably arranged, and the arc-shaped section, the end part connecting section and the linear section in the elastic part structure are correspondingly arranged, so that the needle point part and the needle tail part in the probe conduction process can be reliably supported, the linear section can better transmit stress in the length direction of the probe, the force transmission stability of the needle point part and the needle tail part under the abutting acting force is ensured, the deflection deformation of the needle point part and the needle tail part is reduced, the stability and the accuracy of the probe in the use process are fully ensured, and the service life of the probe is prolonged.

(2) According to the elastic flat probe, the parameters such as the number of the layers of the arc-shaped sections, the arrangement intervals of the arc-shaped units, the bending radius of the arc-shaped units and the like are optimized, so that probes with various specifications can be formed, the reliable application under different application scenes is met, the application range of the elastic flat probe is expanded, and the stable conduction process of the probes under different application scenes is ensured.

(3) The elastic flat probe is simple in structure and convenient to set, stress transmission between the needle point part and the needle tail part is more stable through the corresponding arrangement of the end part connecting section, the arc-shaped section and the straight section in the elastic part, transverse deflection of the needle point part and the needle tail part relative to the elastic part is avoided, high-speed signal transmission is guaranteed, the use stability of the probe is improved, the service life of the probe is prolonged, and the elastic flat probe has better practical value and application prospect.

Drawings

FIG. 1 is a schematic view showing the structure of a flexible flat probe in example 1 of the present invention;

FIG. 2 is a schematic structural view of a flexible flat probe in example 2 of the present invention;

FIG. 3 is a schematic structural view of a flexible flat probe in example 3 of the present invention;

FIGS. 4 and 5 are schematic structural diagrams of two probes of the same type in the prior art;

in all the figures, the same reference numerals denote the same features, in particular:

1. a needle tip portion; 2. an elastic portion; 3. a needle tail portion;

101. a needle tip contact end; 102. a needle tip connecting end; 1011. a needle tip; 1012. hollowing out holes; 201. an end connection section; 2011. vertical connecting ribs; 2012. oblique connecting ribs; 202. an arc-shaped section; 2021. a first arc unit; 2022. a second arc unit; 203. a straight line segment; 2031. a first straight line unit; 2032. a second straight line unit; 301. a needle tail connecting end; 302. the needle tail is contacted with the end.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the utility model and are not intended to limit the utility model. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the utility model and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the utility model.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

Example (b):

referring to fig. 1, the elastic flat probe in the preferred embodiment of the present invention is in the form of a flat plate, and includes a tip portion 1, an elastic portion 2, and a tail portion 3, which are sequentially disposed along a length direction of the probe, and the ends of the tip portion 1 and the tail portion 3 respectively abut against a conduction position of a device to be conducted, so as to implement conduction of the corresponding device.

Specifically, the tip portion 1 in the preferred embodiment includes a tip contacting end 101 and a tip connecting end 102, wherein the tip contacting end 101 extends along the length of the probe and the tip connecting end 102 extends in a direction intersecting the tip contacting end 101 and is connected to one end of the tip contacting end 101.

More specifically, the end of the tip contact end 101 away from the tip connection end 102 is set as a tip 1011 for abutting against a conductive connection component on a corresponding device and conducting the probe therewith. In actual setting, the setting form of the needle tip 1011 may be optimized according to actual conditions, for example, the setting form may be a wave form, a zigzag form, a triangle form, a round head form, or other forms according to the special shape of the product against which the needle tip is abutted, or a specific form may be designed based on increasing the contact area between the probe and the product as large as possible in the test process, which is not described herein.

In a preferred embodiment, the needle tip connecting end 102 is arranged orthogonally to the needle tip contacting end 101, as shown in fig. 1, and the side of the needle tip connecting end 102 facing away from the needle tip contacting end 101 connects to one end of the resilient part 2.

Further, the pin tail portion 3 in the preferred embodiment includes a pin tail connection end 301 extending in a direction intersecting the length direction of the probe, one side being connected to the other end of the flexible portion 2, and the other side being a pin tail contact end 302 for abutting the device. In a preferred embodiment, the direction of extension of pin tail connection end 301 is perpendicular to the probe length direction, i.e., horizontally in fig. 1, in which case pin tail connection end 301 is parallel to tip connection end 102. In addition, the pin tail contact end 302 in the preferred embodiment includes a plurality of contact bosses arranged at intervals, and each contact boss is arranged on one side of the pin tail contact end 301 facing away from the elastic part 2 and extends along the length direction of the probe.

In more detail, the end of the contact boss in the preferred embodiment is configured as a trapezoid structure, as shown in fig. 1, at this time, the trapezoid boss structure is in an inverted state, and the contact boss contacts with its trapezoid boss short side with the conduction adapter fitting of the corresponding device. In actual arrangement, the number of the contact bosses may be optimized according to actual needs, for example, two contact bosses are arranged at intervals as shown in fig. 1, or only one contact boss or more than two contact bosses may be arranged.

Further, the elastic part 2 in the preferred embodiment is shown in fig. 1, and includes two end connecting sections 201 respectively disposed at both ends of the probe in the length direction and a plurality of arc-shaped sections 202 disposed between the two end connecting sections 201. The end connecting section 201 is used for connecting the elastic part 2 with the needle point connecting end 102 or the needle tail connecting end 301; the arc section 202 is used as a main elastic deformation section of the elastic part 2, is bent and extended in the transverse direction of the probe, and is used for elastic deformation when the two ends of the probe are abutted and stressed, so that the needle tip part 1 and the needle tail part 3 are abutted and tightly abutted on the corresponding conduction adapter fitting, and the reliability of equipment conduction connection is ensured.

Specifically, the end connection section 201 includes a vertical connection rib 2011 extending in the probe length direction and an oblique connection rib 2012 extending in an oblique direction intersecting the probe length direction. Taking the connection between the elastic part 2 and the needle tip part 1 as an example, at this time, one end of the vertical connecting rib 2011 and one end of the oblique connecting rib 2012 are connected to one side of the needle tip connection end 102, and the other end are connected to the end parts of the group of arc-shaped sections 202; obviously, the arc section 202 at this time includes two arc units, i.e., a first arc unit 2021 and a second arc unit 2022.

More in detail, the vertical connecting rib 2011 and the oblique connecting rib 2012 are respectively connected at two ends of the needle point connecting end 102 deviating from each other, so that the stability of the force support of the needle point connecting end 102 is ensured, the needle point connecting end 102 is ensured to be only deformed in a reciprocating telescopic manner along the length direction of the probe, and the force deflection of the needle point part 1 is avoided. Further, a vertical rib 2011 is provided at the end of the needle tip connection end 102 near the needle tip contact end 101, as shown in fig. 1.

It can be understood that, when the arc-shaped section 202 includes more arc-shaped units, taking three arc-shaped units as an example, at this time, the end connection section 201 is provided with a corresponding number of connection ribs, and an additional connection rib is further provided between the oblique connection rib 2012 and the vertical connection rib 2011, where the additional connection rib may be in a vertical form or in an oblique form, and one end of the additional connection rib is connected to the needle tip connection end 102, and the other end of the additional connection rib is connected to an end of the additional arc-shaped unit between the first arc-shaped unit 2021 and the second arc-shaped unit 2022.

In practical arrangement, the arc units in the arc section 202 are respectively arranged in parallel, and the curvature center of the arc section 202 is preferably located at the side of the needle tip portion 1, i.e. the convex portion formed by the arc section 202 is directed to the side of the needle tail portion 3. Meanwhile, when the arc segments 202 are arranged in multiple groups, the multiple groups of arc segments 202 are preferably arranged in parallel, for example, in fig. 1, the arc segments 202 are arranged in 4 groups, and two adjacent groups of arc segments 202 are connected by a straight segment 203 along the length direction of the probe.

In fig. 1, the straight line section 203 includes a first straight line unit 2031 and a second straight line unit 2032 arranged in parallel, respectively for connecting the ends of the arc units in two adjacent sets of arc sections 202; it will be appreciated that the length of the second linear element 2032 on the inner side is less than the length of the first linear element 2031 on the outer side, ensuring that the lateral (probe width direction) spacing between the two linear elements is equal to the spacing between the two arcuate elements. Through the layered arrangement of the plurality of groups of arc-shaped sections 202 and the connection arrangement of the two end connecting sections at the two ends of the elastic part 2 and the straight section 203 between the two adjacent groups of arc-shaped sections 202, the elastic part 2 which continuously bends and extends can be formed between the needle tip part 1 and the needle tail part 3, and the elastic part 2 comprises at least two elastic belts which are arranged in an extending way.

In actual installation, the number of the elastic bands is preferably 2 to 3, and the widths of the elastic bands in the extending direction are preferably equal to each other, and more preferably 0.03mm to 0.20 mm. Meanwhile, the gap between two adjacent elastic belts is preferably 0.05 mm-0.10 mm, the number of the arranged layers of the arc-shaped section 202 is preferably 1-6, and the specific number can be preferably selected according to actual needs by combining the length of the probe.

Further, in a preferred embodiment, the bending radius of each arc unit in the arc sections 202 is 1.5mm to 3mm, and the distance between two adjacent sets of arc sections 202 is 0.5mm to 1.0 mm. In addition, it is easy to see that the distance between the arc-shaped sections 202 at the two ends of the elastic part 2 in the length direction of the probe and the needle tip part 1 or the needle tail part 3 can be realized by controlling the lengths of the vertical connecting rib 2011 and the oblique connecting rib 2012. In the preferred embodiment shown in fig. 1, the elastic part 2 has a multi-layer centrosymmetric structure, and can withstand a compressive deformation of preferably 0.2mm to 1.0mm, corresponding to a compressive force of 20gf to 100 gf.

In practical applications, the number of layers of the arc-shaped sections 202 in the elastic flat probe may be correspondingly preferred according to practical application requirements, for example, the arrangement is as shown in fig. 2 and fig. 3.

In fig. 2, the elastic portion 2 includes two sets of arc-shaped sections 202, the ends of the two arc-shaped sections 202 are connected by a set of straight sections 203, and the other ends of the two arc-shaped sections 202 are connected with the needle tip connection end 102 and the needle tail connection end 301 respectively by end connection sections 201.

In fig. 3, the flexible part 2 includes a set of arc-shaped sections 202, and the two ends of the arc-shaped sections 202 are connected to the tip connection end 102 and the tail connection end respectively through the end connection sections 201 to form a short flexible flat probe.

Further, a control experiment is carried out by comparing the elastic flat probe in the application with two probes in the prior art, wherein the experimental group is the elastic flat probe in the application; the

control groups

1 and 2 are two types of conventional probes shown in fig. 4 and 5, respectively, and the experimental data are shown in tables 1 to 3 below, while keeping other experimental conditions consistent.

TABLE 1 Probe 30 ten thousand times spring attenuation test results

Serial number	Experimental group	Control group	1	Control group 2
					1	6.6153	6.5449	6.4344
2	6.5894	6.5985	6.4255
				3	6.614	6.5986	6.4365
4	6.5628	6.5891	6.4517
				5	6.6043	6.5777	6.4645
6	6.6137	6.6075	6.4452
				7	6.6209	6.6072	6.4341
8	6.6171	6.5967	6.4487
				9	6.6124	6.6083	6.4312
10	6.6199	6.6018	6.4262
				Attenuation data	≤0.1	≤0.1	＞0.1

TABLE 2 impedance test results for the probes

Serial number	1	2	3	4	5	6	7	8	9	10	Mean impedance
												Experimental group	22.7	19.3	17.9	17.2	14.3	18.4	15.6	14.8	17.6	18.9	18mΩ
Control group
	1	32.1	25.7	26.7	26.3	23.7	26.1	24.7	20.6	22.7	21.6	25mΩ
Control group
	2	25	18.6	19.6	19.2	16.6	19	17.6	13.5	15.6	14.5	18mΩ

TABLE 3 Current tolerance test results for the probes

In the three testing processes, 10 probes of the same type produced in the same batch are respectively selected for each group of testing objects, so that the accuracy of each group of testing results is ensured. Meanwhile, in the actual test, the selected test objects are different, and other experimental conditions are kept consistent.

More specifically, the foregoing table 1 carries out attenuation test data of the probe length dimension after 30 ten thousand probe crimps; 10 experimental examples are respectively selected for carrying out 30 ten thousand times of crimping test, probe length attenuation values of the experimental examples are calculated, and then the attenuation values of each group of experimental objects are summed to calculate an average value, so that the test result can be seen; for the probes in the experimental group and the control group 1, the attenuation data is less than or equal to 0.1, so that the actual use requirement is met; however, the attenuation data of the control group 2 is more than 0.1, and the actual use requirement is difficult to meet.

Meanwhile, table 2 shows impedance test data of the probe; by performing impedance measurements on 10 experimental examples of each group and calculating the average value, it can be found that: the average impedance of the elastic flat probes in the experimental group and the control group 2 is the lowest, and is about 18m omega respectively; in contrast, the average impedance of the probes in the control group 1 is about 25m Ω, which is much larger than the commonly used optimal impedance value of 20m Ω of the elastic flat probe, indicating that the probes need to apply larger force when in use, which may affect the service life of the probes and the risk of damage to the connector of the device to be connected to some extent.

Finally, table 3 shows the current tolerance test results for the probes; wherein, for the probes in the experimental group, the current for fusing the probes is about 5.5A; the fusing current of the control group 1 is about 6.5A, and the fusing current of the control group 2 is about 3.5A, which indicates that the current tolerance of the control group 2 is poor. Although the current endurance of control 1 was the best, there was a certain restriction in practical use in consideration of the large average resistance.

In conclusion, by comprehensively considering factors such as the compression joint attenuation resistance, impedance and current tolerance of the probe, the elastic flat probe in the application shows a good application effect in all aspects, and compared with the existing probes of the same type, the probe has stronger functionality and better use effect.

The elastic flat probe is simple in structure and convenient to set, stress transmission between the needle point part and the needle tail part is more stable through the corresponding arrangement of the end part connecting section, the arc-shaped section and the straight section in the elastic part, transverse deflection of the needle point part and the needle tail part relative to the elastic part is avoided, high-speed signal transmission is guaranteed, the use stability of the probe is improved, the service life of the probe is prolonged, and the elastic flat probe has better practical value and application prospect.

It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the utility model, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. An elastic flat probe comprises a needle tip part, an elastic part and a needle tail part which are sequentially arranged in the length direction of the probe; the needle tip part comprises a needle tip contact end and a needle tip connecting end connected with one end of the elastic part; the needle tail part comprises a needle tail contact end and a needle tail connecting end connected with the other end of the elastic part; it is characterized in that the preparation method is characterized in that,

2. The elastic flat probe according to claim 1, wherein the tip connection end and/or the tail connection end is extended in a probe width direction.

3. The elastic flat probe according to claim 1, wherein ends of the vertical connection rib and the oblique connection rib, which are deviated from each other, are connected to both ends of the needle tip connection end or the needle tail connection end, respectively.

4. The elastic flat probe according to any of claims 1 to 3, wherein at least one additional arc unit is provided between the first arc unit and the second arc unit;

5. An elastic flat probe according to any one of claims 1 to 3, wherein at least two elastic bands continuously extending in a curved manner are formed in said elastic portion; the width of the elastic belt is 0.03 mm-0.20 mm.

6. The elastic flat probe according to claim 5, wherein the distance between two adjacent elastic bands is 0.05mm to 0.10 mm.

7. The elastic flat probe according to any one of claims 1 to 3 and 6, wherein the arc-shaped sections are a plurality of groups arranged at intervals in the length direction of the probe, and the distance between two adjacent groups of arc-shaped sections is 0.5mm to 1.0 mm.

8. The elastic flat probe according to any one of claims 1 to 3 and 6, wherein the vertical connecting rib is connected to one end of the tip connecting end close to the tip contacting end.

9. The elastic flat probe according to any one of claims 1 to 3 and 6, wherein the needle tip contact end is orthogonal to the needle tip connection end, and a needle tip is arranged at an end of the needle tip contact end, which is away from the needle tip connection end, and is used for being abutted and conducted with a corresponding conduction adapter assembly.

10. The flat elastic probe according to any one of claims 1 to 3 and 6, wherein the pin tail contact end comprises a plurality of contact bosses disposed on a side of the pin tail contact end facing away from the elastic portion, and the contact bosses are used for being abutted and conducted with corresponding conduction switching assemblies.