CN208506094U - A kind of blade type elastic slice probe for test fixture crimping - Google Patents
A kind of blade type elastic slice probe for test fixture crimping Download PDFInfo
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- CN208506094U CN208506094U CN201820814111.XU CN201820814111U CN208506094U CN 208506094 U CN208506094 U CN 208506094U CN 201820814111 U CN201820814111 U CN 201820814111U CN 208506094 U CN208506094 U CN 208506094U
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- switching part
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Abstract
The utility model discloses a kind of blade type elastic slice probes for test fixture crimping, it includes for connecting the first metal switching part of product connector, the second metal switching part for connecting FPC and the metallic bending portion for the first metal switching part and the second metal switching part and elastically deformable to be connected, probe is provided on first metal switching part and the second metal switching part, first metal switching part, the second metal switching part and metallic bending portion are integrally formed, and metallic bending portion includes the metal conduction band of at least three parallel intervals arrangement；Width≤probe width/3 of the metal conduction band of width/4 of probe≤every.The utility model structure is simple, easy to use, it improves the impedance and conduction of elastic slice probe by designing the metal conduction band of at least three parallel intervals arrangement by 2~4 times of the width that the width design of metallic bending portion is probe and by metallic bending portion to effectively increase the area for being used for conductive metallic bending portion.
Description
Technical field
The utility model relates to a kind of elastic slice probes, belong to the nonstandard products the field of test technology such as electronic curtain, especially relate to
And a kind of blade type elastic slice probe for test fixture crimping.
Background technique
In the prior art, the conducting device in test fixture is most of using spring ejector pin connector, spring top
Needle connector is formed by three needle shaft, spring, needle tubing basic element of character by precision instrument riveting later, since spring thimble connects
Needle tubing aperture of the needle shaft of device relatively carefully and for installing needle shaft is smaller, therefore there are not easy to be processed, processing essences for spring ejector pin connector
Spend the technical problems such as uncontrollable.In order to solve the above-mentioned technical problem, it is disclosed in Chinese utility model patent CN206515372U
A kind of flat probe of integrated circuit testing comprising upper contact jaw, bending segment and lower contact jaw, wherein bending segment is set
It is equipped with the spring portion that flexible deformation is provided and the relay portion for conducting；Relay portion upper end and upper contact jaw are integrally formed,
Lower end and the contact aside of lower contact jaw are fixed.The service life of the utility model can achieve 5 times of typical probe or more, and
Conduction property is more preferable than general probe, but the width of the bending segment entirety of the utility model is substantially equal with the width of probe
And only relay portion is conductive, therefore its to be used for conductive relay portion area small, to cause that probe impedance is big, conduction is bad
The technical issues of；Secondly, the bending segment of the utility model includes spring portion and relay portion two parts composition, it is not easy to processing system
It makes.
Summary of the invention
The invention of the utility model is to design a kind of blade type bullet for test fixture crimping for above-mentioned performance requirement
Piece probe is not only simple in structure, convenient processing and manufacture, and testing efficiency and success rate can be improved, increase service life, reduce
Cost.
In order to solve the above technical problems, the utility model uses such a blade type bullet for test fixture crimping
Piece probe, the blade type elastic slice probe are flat slab construction, and the blade type elastic slice probe is flat slab construction,
Including the first metal switching part for connecting product connector, the second metal switching part for connecting FPC and for being connected
The metallic bending portion of first metal switching part and the second metal switching part and elastically deformable, the first metal switching part and institute
It states and is provided with probe on the second metal switching part, the first metal switching part, the second metal switching part and described
Metallic bending portion is integrally formed, and the metallic bending portion includes the metal conduction band of at least three parallel intervals arrangement, probe
Width≤probe width/3 of the metal conduction band of width/4≤every.
In a kind of preferred embodiment of the utility model, the width of the probe is the width of the metal conduction band
3 times.
In a kind of preferred embodiment of the utility model, the every metal conduction band is by not only electrically conductive but also can bullet
Property deformation material be made.
In a kind of preferred embodiment of the utility model, the impedance of the every metal conduction band is less than 50 milliohms.
In a kind of preferred embodiment of the utility model, the conveyance capacity of the every metal conduction band is greater than 3 peaces.
In a kind of preferred embodiment of the utility model, the shape of the metallic bending portion include U-shaped, S-shaped, M shape,
Any one in more S-shapeds.
In a kind of preferred embodiment of the utility model, the side of the first metal switching part is provided with for supporting
Disappear the first protrusion of the first metal switching part screen resilience, and the center of gravity of first protrusion and the center of the metallic bending portion are located at
The same side of the first metal switching part.
In a kind of preferred embodiment of the utility model, the side of the second metal switching part is provided with for supporting
Disappear the second protrusion of the second metal switching part screen resilience, and the center of gravity of second protrusion and the center of the metallic bending portion are located at
The same side of the second metal switching part.
In a kind of preferred embodiment of the utility model, the shape of the probe of the first metal switching part is P
Shape, B shape, T shape, F shape, W-shaped, M shape, V-arrangement, O shape, any one in R shape.
In a kind of preferred embodiment of the utility model, the shape of the probe of the second metal switching part is P
Shape, B shape, T shape, F shape, W-shaped, M shape, V-arrangement, O shape, any one in R shape.In a kind of preferred embodiment of the utility model
In, the metallic bending portion includes U-shaped, S-shaped, M shape, any one in more S-shapeds along the projection of shape of its thickness direction.
The beneficial effects of the utility model are: the utility model structure is simple, easily manufactured, by by the width of probe
Degree is 3 times (i.e. the width designs of metallic bending portion be the width of probe 2~4 times) of the width of metal conduction band and by metal
The metal conduction band of bending part design at least three parallel intervals arrangement is to effectively increase for conductive metallic bending portion
Area, reduce the impedance of elastic slice probe and improve the conduction of elastic slice probe, while the present invention only includes a gold
Belonging to bending part, it had both played the role of the effect that spring reset also functions to conduction, eliminated spring portion compared to documents, from
And facilitate the manufacture of elastic slice probe；Further, the present invention is by being designed as U-shaped, S-shaped, M shape, more S-shapeds for metallic bending portion
In any one, further increase the area of metallic bending portion so that elastic slice probe have smaller impedance and
More good conduction；Further, the present invention on the first metal switching part by being arranged identical with its bending direction the
Setting the second protrusion identical with its bending direction is in one protrusion, the second metal switching part to effectively balance the first metal
Switching part and the second metal switching part reset generated torque when rebound, ensure that elastic slice probe overall structure of the invention exists
It is not destroyed when being resetted after compression；The last present invention is designed by the shape to probe, enables elastic slice probe of the invention
It is enough in connection various product and connects machine, to improve versatility of the invention.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of the blade type elastic slice probe for test fixture crimping of the utility model machine.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, below in conjunction with attached drawing and implementation
Example, the present invention will be further described in detail.It should be appreciated that specific embodiment described herein is only to explain this
Utility model is not used to limit the utility model.
By Figure of description 1 it is found that a kind of blade type elastic slice for test fixture crimping of the utility model embodiment is visited
Needle be flat slab construction comprising for connect product connector the first metal switching part 1, second for connecting FPC
Metal switching part 2 and metallic bending portion for the first metal switching part 1 and the second metal switching part 2 and elastically deformable to be connected
3, metallic bending portion 3 provide the first metal switching part 1 and the second metal switching part 2 each other axial approach or axially away from elasticity
Deformation, the flexible deformation are equivalent to the spring of typical probe, enable the unsecured prolonged good basis of probe.
Probe, the first metal switching part 1, second are provided on first metal switching part 1 and the second metal switching part 2
Metal switching part 2 and metallic bending portion 3 are integrally formed.Metallic bending portion 3 includes that the metal of at least three parallel intervals arrangement is led
Band 3.1, width≤probe width/3 of the metal conduction band 3.1 of width/4 of probe≤every, while guaranteeing that metal is bent
The width (the sum of width of all metal conduction bands 3.1 is plus the spacing between adjacent two metal conduction bands 3.1) in portion 3 is probe
2~4 times of width.Optimal case of the invention is: the width of metallic bending portion 3 is 3 times of the width of probe.Pass through increasing
Add the width of metallic bending portion 3, the conductive area of metallic bending portion 3 can be effectively improved, to reduce elastic slice probe
Impedance and the conduction for improving elastic slice probe.Compared to documents 1, the present invention by documents 1 spring portion and after
Electric portion is made of one formula structure, to facilitate the processing and manufacture of elastic slice probe.Every metal conduction band 3.1 of the invention was by both
Electrically conductive and resiliently flexible material is made, and the impedance of every metal conduction band 3.1 is less than 50 milliohms, every metal conduction band
3.1 conveyance capacity is greater than 3 peaces, it should be pointed out that, as long as metal conduction band 3.1 of the invention meets above-mentioned two requirement, as long as can
It may be used to the present invention, every gold with the conductive metal conduction band 3.1 that elastically-deformable any materials and shape may be implemented again
The service life for belonging to conduction band 3.1 is 200,000 times, the use of temperature is -40 DEG C~+120 DEG C.
Further, metallic bending portion 3 of the invention includes U-shaped, S-shaped, M shape, more S along the projection of shape of its thickness direction
Any one in shape.By the reasonable selection of the shape to metallic bending portion 3, the impedance of elastic slice probe can be effectively reduced
With the conduction for improving elastic slice probe.
Further, generated in compression rebound in order to balance the first metal switching part 1 and the second metal switching part 2
Torque, the present invention are provided with the first protrusion for offsetting 1 screen resilience of the first metal switching part on the first metal switching part 1
1.1, the direction of the first protrusion 1.1 is identical as the bending direction of metallic bending portion 3；It is provided with and is used on second metal switching part 2
Offset the second protrusion 2.1 of 2 screen resilience of the second metal switching part, the direction of the second protrusion 2.1 and the bending side of metallic bending portion 3
To identical.
Further, in order to use test various products connector, the probe of the first metal switching part 1 of the invention
Shape is any one in P, B, T, F, W, M, V, O, R；The probe of second metal switching part 2
Shape be P, B, T, F, W, M, V, O, R in any one.
The above content is the further description for combining specific embodiment to do the utility model, and it cannot be said that
The specific implementation of the utility model is only limited to these instructions.For the ordinary skill people of technical field belonging to the utility model
For member, without departing from the concept of the premise utility, a number of simple deductions or replacements can also be made, all should be considered as
Belong to the protection scope of the utility model.
Claims (8)
1. a kind of blade type elastic slice probe for test fixture crimping, the blade type elastic slice probe is flat slab construction,
It include for connecting the first metal switching part (1) of product connector, the second metal switching part (2) for connecting FPC and
It is described for the metallic bending portion (3) of the first metal switching part (1) and the second metal switching part (2) and elastically deformable to be connected
Probe, the first metal switching part are provided on first metal switching part (1) and the second metal switching part (2)
(1), the second metal switching part (2) and the metallic bending portion (3) are integrally formed, it is characterised in that: the metal bending
Portion (3) includes the metal conduction band (3.1) of at least three parallel intervals arrangement, width/4≤every metal conduction band of probe
(3.1) width≤probe width/3.
2. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
The width of probe is 3 times of the width of the metal conduction band (3.1).
3. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
Every metal conduction band (3.1) is made of not only electrically conductive but also resiliently flexible material；The every metal conduction band (3.1)
Impedance is less than 50 milliohms；The conveyance capacity of the every metal conduction band (3.1) is greater than 3 peaces.
4. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
The shape of metallic bending portion (3) includes U-shaped, S-shaped, M shape, any one in more S-shapeds.
5. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
The side of first metal switching part (1) is provided with first raised (1.1) for offsetting first metal switching part (1) screen resilience,
The center of gravity of described first raised (1.1) and the center of the metallic bending portion (3) are located at the same of the first metal switching part (1)
Side.
6. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
The side of second metal switching part (2) is provided with second raised (2.1) for offsetting second metal switching part (2) screen resilience,
The center of gravity of described second raised (2.1) and the center of the metallic bending portion (3) are located at the same of the second metal switching part (2)
Side.
7. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
The shape of the probe of first metal switching part (1) is p-shaped, B shape, T shape, F shape, W-shaped, M shape, V-arrangement, O shape, any in R shape
It is a kind of.
8. a kind of blade type elastic slice probe for test fixture crimping according to claim 1, it is characterised in that: described
The shape of the probe of second metal switching part (2) is p-shaped, B shape, T shape, F shape, W-shaped, M shape, V-arrangement, O shape, any in R shape
It is a kind of.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820814111.XU CN208506094U (en) | 2018-05-29 | 2018-05-29 | A kind of blade type elastic slice probe for test fixture crimping |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820814111.XU CN208506094U (en) | 2018-05-29 | 2018-05-29 | A kind of blade type elastic slice probe for test fixture crimping |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208506094U true CN208506094U (en) | 2019-02-15 |
Family
ID=65294219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820814111.XU Active CN208506094U (en) | 2018-05-29 | 2018-05-29 | A kind of blade type elastic slice probe for test fixture crimping |
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| Country | Link |
|---|---|
| CN (1) | CN208506094U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111579837A (en) * | 2020-05-18 | 2020-08-25 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
| CN111579833A (en) * | 2020-05-18 | 2020-08-25 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
| CN113703204A (en) * | 2021-09-03 | 2021-11-26 | 苏州凌云光工业智能技术有限公司 | Probe and display screen lighting jig |
| TWI756653B (en) * | 2019-04-25 | 2022-03-01 | 日商歐姆龍股份有限公司 | Probes, Inspection Fixtures, and Inspection Units |
-
2018
- 2018-05-29 CN CN201820814111.XU patent/CN208506094U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI756653B (en) * | 2019-04-25 | 2022-03-01 | 日商歐姆龍股份有限公司 | Probes, Inspection Fixtures, and Inspection Units |
| CN111579837A (en) * | 2020-05-18 | 2020-08-25 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
| CN111579833A (en) * | 2020-05-18 | 2020-08-25 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
| CN113703204A (en) * | 2021-09-03 | 2021-11-26 | 苏州凌云光工业智能技术有限公司 | Probe and display screen lighting jig |
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