CN206515372U - A kind of flat probe of integrated circuit testing - Google Patents
A kind of flat probe of integrated circuit testing Download PDFInfo
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- CN206515372U CN206515372U CN201720152055.3U CN201720152055U CN206515372U CN 206515372 U CN206515372 U CN 206515372U CN 201720152055 U CN201720152055 U CN 201720152055U CN 206515372 U CN206515372 U CN 206515372U
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- contact jaw
- probe
- flat
- relay portion
- spring
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Abstract
The utility model discloses a kind of flat probe of integrated circuit testing, including upper contact jaw, bending segment and lower contact jaw, wherein, bending segment setting is provided with the spring of elastic deformation and the relay portion for conducting；Relay portion upper end is integrally formed with upper contact jaw, and its lower end and the contact aside of lower contact jaw are fixed.The flat test probe of the utility model is integral and influences the life-span without internal friction, and General Life can reach more than 5 times of typical probe, and conduction property is much better than typical probe than the more preferable and electric parameter of general probe.
Description
Technical field
The utility model is related to integrated circuit test device field, more particularly to a kind of integrated circuit testing is flat
Flat probe.
Background technology
In the prior art, conventionally test probe is as shown in figure 1, conventionally test probe is in test, syringe needle and spring and pin
Pipe compression contact, has certain friction, the life-span of probe is had a certain impact, it is with point that syringe needle is contacted with spring during compression
Contact either face contact turn-on effect is general, and contact impedance is than larger.
Therefore, the prior art is defective, it is necessary to improve.
Utility model content
Technical problem to be solved in the utility model is：A kind of small, impedance that rubs of offer is smaller, conduction property is outstanding,
The flat probe of the integrated circuit testing of service life length.
The technical solution of the utility model is as follows：A kind of flat probe of integrated circuit testing, including it is upper contact jaw, curved
Trisection and lower contact jaw, wherein, bending segment sets and is provided with elastic deformation and integrally formed with upper contact jaw and lower contact jaw
Spring and the relay portion for conducting；Relay portion upper end is integrally formed with upper contact jaw, its lower end and the side of lower contact jaw
Side contact is fixed.
Applied to above-mentioned technical proposal, in described flat probe, the side in relay portion also contacts fixation with spring.
Applied to each above-mentioned technical proposal, in described flat probe, lower contact jaw, which is provided with one, prevents spring from existing
The wider planar section of off normal during elastic compression.
Applied to each above-mentioned technical proposal, in described flat probe pin, lower contact jaw, which is provided with one, is used for spacing L
Type step, its lower end of relay portion is provided with the F types end of adaptation.
Applied to each above-mentioned technical proposal, in described flat probe, the probe point of upper contact jaw and lower contact jaw
Flat slab construction is not set to.
Applied to each above-mentioned technical proposal, in described flat probe, the probe capitiform of upper contact jaw and lower contact jaw
Shape is respectively set to any one in P, B, T, F, W, M, V, O, R.
Using such scheme, the flat test probe of the utility model is integral and influences life-span, one without internal friction
As the life-span can reach more than 5 times of typical probe, and conduction property is much better than often than the more preferable and electric parameter of general probe
Advise probe.
Brief description of the drawings
Fig. 1 is the structural representation of prior art；
Fig. 2 is structural representation of the present utility model；
Fig. 3 is flat planar plate structure schematic diagram of the present utility model；
Fig. 4 is various probe shape and structure schematic diagrames of the present utility model.
Embodiment
Below in conjunction with the drawings and specific embodiments, the utility model is described in detail.
A kind of flat probe of integrated circuit testing is present embodiments provided, as shown in Fig. 2 integrated circuit testing
Flat probe includes upper contact jaw 102, lower contact jaw 108 and is arranged between contact jaw 102 and lower contact jaw 108
Bending segment, wherein, spring 109 of the bending segment by offer elastic deformation and the relay portion 103 for conducting are constituted, wherein,
Spring 109 and upper contact jaw 102 and the lower integrated punching of contact jaw 108 are molded, spring 109 provide contact jaw 102 on this, under
Contact jaw 108 each other axial convergence or axially away from elastic deformation, reached Elastic Contact IC continuity test functions, elasticity becomes
Shape ensure that probe and contact good for a long time equivalent to the spring of typical probe.
The upper end of relay portion 103 is integrally formed with upper contact jaw 102, and its lower end and the contact aside of lower contact jaw 108 are fixed,
The side in relay portion 103 can also contact fixation with spring 109, and relay portion 103 is equally used for contacting IC continuity test functions,
Spring and relay portion are separated, the stability and durability and electric conductivity of resistance is preferably realized.
Or, lower contact jaw 108, which is provided with one, prevents the wider planar section 107 of spring off normal in elastic compression, compared with
Wide planar section 107 can be contacted with more stable with middle bending segment, so as to prevent off normal of the spring in elastic compression.
Lower contact jaw 108, which is provided with one, is used for spacing L-type step 105, and its lower end is provided with the F types end 104 of adaptation,
In this way, being fixed by L-type step 105 and the adaptation of F types end 104, spring 109 makes the F in relay portion 103 in compression
Type end 104 along the lower side of contact jaw 108 when down being slided, and L-type step 105 can be played to the F types end 104 of slip
Spacing effect, so as to limit the stroke of probe, so as to prevent the shell fragment of spring 109 from damaging shell fragment by overvoltage.
As shown in figure 3, the probe of upper contact jaw and lower contact jaw is respectively set to flat slab construction, wherein A is two
The spacing of integrated circuit test probes, B is the shaping wall thickness of two integrated circuit test probes, and C is integrated circuit test probes
Thickness, in this way, using slab construction, being easier to use in smaller spacing compared with general probe, general flat test is visited
Pin C thickness can accomplish 0.06~3.0mm, and applicable scope is more extensive.
By or, in order to be applicable the probe for testing different products, the probe 101 of upper contact jaw and lower contact jaw
106 shapes are respectively set to any one in P, B, T, F, W, M, V, O, R, or, can also
Other arbitrary structures are set to, as long as with test product correspondence, the partial shape structure of probe is as shown in Figure 4.
In this way, the present embodiment flat probe is simpler than general probe structure, small volume more, be easily worked assembling, price
More preferably the advantages of, be a kind of new technology, the product of new construction.
Preferred embodiment of the present utility model is these are only, the utility model is not limited to, it is all in this practicality
Any modifications, equivalent substitutions and improvements made within new spirit and principle etc., should be included in guarantor of the present utility model
Within the scope of shield.
Claims (6)
1. a kind of flat probe of integrated circuit testing, it is characterised in that：
Including upper contact jaw, bending segment and lower contact jaw, wherein, bending segment set be provided with elastic deformation and with upper contact jaw and
The lower integrally formed spring of contact jaw and the relay portion for conducting；
Relay portion upper end is integrally formed with upper contact jaw, and its lower end and the contact aside of lower contact jaw are fixed.
2. flat probe according to claim 1, it is characterised in that：The side in relay portion also contacts fixation with spring.
3. flat probe according to claim 1, it is characterised in that：Lower contact jaw, which is provided with one, prevents spring in elasticity
The wider planar section of off normal during compression.
4. flat probe according to claim 1, it is characterised in that：Lower contact jaw, which is provided with one, is used for spacing L-type platform
Rank, its lower end of relay portion is provided with the F types end of adaptation.
5. flat probe according to claim 1, it is characterised in that：The probe of upper contact jaw and lower contact jaw is set respectively
It is set to flat slab construction.
6. according to any described flat probes of claim 1-4, it is characterised in that：The probe of upper contact jaw and lower contact jaw
Shape is respectively set to any one in P, B, T, F, W, M, V, O, R.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720152055.3U CN206515372U (en) | 2017-02-17 | 2017-02-17 | A kind of flat probe of integrated circuit testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720152055.3U CN206515372U (en) | 2017-02-17 | 2017-02-17 | A kind of flat probe of integrated circuit testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206515372U true CN206515372U (en) | 2017-09-22 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720152055.3U Active CN206515372U (en) | 2017-02-17 | 2017-02-17 | A kind of flat probe of integrated circuit testing |
Country Status (1)
| Country | Link |
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| CN (1) | CN206515372U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572264A (en) * | 2018-06-21 | 2018-09-25 | 武汉精测电子集团股份有限公司 | A kind of crimping shrapnel in single buffer channel |
| CN108695617A (en) * | 2018-06-21 | 2018-10-23 | 武汉精测电子集团股份有限公司 | A kind of crimping shrapnel of more buffer channels |
| CN108776400A (en) * | 2018-07-17 | 2018-11-09 | 武汉精测电子集团股份有限公司 | A kind of portable electronic screen test fixture of adjustable angle |
| CN111579833A (en) * | 2020-05-18 | 2020-08-25 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
| CN112394206A (en) * | 2019-08-14 | 2021-02-23 | 华为技术有限公司 | Test needle assembly and test device |
| WO2021196497A1 (en) * | 2020-03-30 | 2021-10-07 | 苏州华兴源创科技股份有限公司 | Electrical connector and test conduction device |
| CN113866464A (en) * | 2021-09-22 | 2021-12-31 | 深圳凯智通微电子技术有限公司 | Probe and integrated circuit test equipment |
-
2017
- 2017-02-17 CN CN201720152055.3U patent/CN206515372U/en active Active
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572264A (en) * | 2018-06-21 | 2018-09-25 | 武汉精测电子集团股份有限公司 | A kind of crimping shrapnel in single buffer channel |
| CN108695617A (en) * | 2018-06-21 | 2018-10-23 | 武汉精测电子集团股份有限公司 | A kind of crimping shrapnel of more buffer channels |
| CN108572264B (en) * | 2018-06-21 | 2023-12-01 | 武汉精测电子集团股份有限公司 | Crimping shell fragment of single buffering passageway |
| CN108776400A (en) * | 2018-07-17 | 2018-11-09 | 武汉精测电子集团股份有限公司 | A kind of portable electronic screen test fixture of adjustable angle |
| CN108776400B (en) * | 2018-07-17 | 2024-04-05 | 武汉精测电子集团股份有限公司 | Portable electronic screen test fixture of angularly adjustable |
| CN112394206A (en) * | 2019-08-14 | 2021-02-23 | 华为技术有限公司 | Test needle assembly and test device |
| WO2021196497A1 (en) * | 2020-03-30 | 2021-10-07 | 苏州华兴源创科技股份有限公司 | Electrical connector and test conduction device |
| US11973289B2 (en) | 2020-03-30 | 2024-04-30 | Suzhou Hyc Technology Co., Ltd. | Electrical connector and device for testing conduction |
| CN111579833A (en) * | 2020-05-18 | 2020-08-25 | 武汉精毅通电子技术有限公司 | Probe and connector suitable for high-current high-speed signal test |
| CN113866464A (en) * | 2021-09-22 | 2021-12-31 | 深圳凯智通微电子技术有限公司 | Probe and integrated circuit test equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20210317 Address after: 518000 Second Floor of Building 14, Zitian Industrial Zone, Zitian Community, Fuyong Street, Baoan District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN KZT MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee after: WUHAN JINGYITONG ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: 518000 Second Floor of Building 14, Zitian Industrial Zone, Zitian Community, Fuyong Street, Baoan District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN KZT MICROELECTRONICS TECHNOLOGY Co.,Ltd. |