CN206515371U - A kind of probe of integrated circuit testing - Google Patents
A kind of probe of integrated circuit testing Download PDFInfo
- Publication number
- CN206515371U CN206515371U CN201720145753.0U CN201720145753U CN206515371U CN 206515371 U CN206515371 U CN 206515371U CN 201720145753 U CN201720145753 U CN 201720145753U CN 206515371 U CN206515371 U CN 206515371U
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- CN
- China
- Prior art keywords
- probe
- contact jaw
- lower contact
- bending
- probe body
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Abstract
The utility model discloses a kind of probe of integrated circuit testing, including integrally formed probe body, probe body includes upper contact jaw, bending segment and lower contact jaw, wherein, bending segment is by being stamped and formed out an elastomer taken all of；Also, also set up a shell body for being coated on probe body, the lower contact jaw of shell body and probe body is integrally formed, also, its upper contact jaw activity with probe body is separately positioned.The utility model probe is integral and influences the life-span without internal friction, and General Life can reach more than 5 times of typical probe, and conduction property is much better than typical probe than the more preferable and electric parameter of general probe.
Description
Technical field
The utility model is related to integrated circuit test device field, more particularly to a kind of spy of integrated circuit testing
Pin.
Background technology
In the prior art, conventionally test probe is as shown in figure 1, conventionally test probe is in test, syringe needle and spring and pin
Pipe compression contact, has certain friction, the life-span of probe is had a certain impact, it is with point that syringe needle is contacted with spring during compression
Contact either face contact turn-on effect is general, and contact impedance is than larger.
Therefore, the prior art is defective, it is necessary to improve.
Utility model content
Technical problem to be solved in the utility model is：A kind of small, impedance that rubs of offer is smaller, conduction property is outstanding,
The probe of the integrated circuit testing of service life length.
The technical solution of the utility model is as follows：A kind of probe of integrated circuit testing, including integrally formed probe
Main body, probe body includes upper contact jaw, bending segment and lower contact jaw, wherein, the elastomer that bending segment formation one takes all of；And
And, also set up a shell body for being coated on probe body, the lower contact jaw of shell body and probe body is integrally formed, also, its
Upper contact jaw activity with probe body is separately positioned.
Applied to above-mentioned technical proposal, in described probe, the elastomer taken all of is respectively by some bending compression section groups
The bending for including being separately positioned on Different Plane into, each bending compression section takes all of section, compression section and compression linkage section composition.
Applied to each above-mentioned technical proposal, in described probe, the compression of the lower contact jaw of shell body and probe body
End connects and is integrally formed setting.
Applied to each above-mentioned technical proposal, in described probe, the probe head shapes point of upper contact jaw and lower contact jaw
Any one in P, B, T, F, W, M, V, O, R is not set to.
Using such scheme, the utility model probe is integral and influences the life-span without internal friction, and General Life can
To reach more than 5 times of typical probe, and conduction property is much better than typical probe than the more preferable and electric parameter of general probe.
Brief description of the drawings
Fig. 1 is the structural representation of prior art；
Fig. 2 is structural representation of the present utility model；
Fig. 3 a are the structural representation of the utility model middle probe main body；
Fig. 3 b are Fig. 3 a top view；
Fig. 4 is the enlarged drawing of part A in Fig. 3 a；
Fig. 5 is various probe shape and structure schematic diagrames of the present utility model.
Embodiment
Below in conjunction with the drawings and specific embodiments, the utility model is described in detail.
A kind of probe of integrated circuit testing is present embodiments provided, probe includes one as shown in Fig. 2 punching press takes all of
The probe body of shaping, wherein, probe body includes upper contact jaw 201, bending segment 202 and lower contact jaw 204, upper contact jaw
201st, bending segment 202 and lower contact jaw 204 are integrally formed by the way of punching press.
Wherein, the elastomer that bending segment 202 takes all of for formation one；The bending segment 202 has one section of curved structure, curved structure
There is provided the upper and lower contact jaw each other axial convergence or axially away from elastic deformation, reached Elastic Contact IC continuity test work(
Can, elastic deformation ensure that probe and contact good for a long time equivalent to the spring of typical probe.
Also, also set up a shell body 203 for being coated on probe body, the lower contact jaw of shell body 203 and probe body
204 are integrally formed, also, the activity of upper contact jaw 201 of shell body 203 and probe body is separately positioned, in this way, ensure that good
Good conduction property and less impedance, also, contact jaw 201 is carried out elastic compression by bending segment 202.
As shown in Fig. 2 when the lower contact jaw of shell body and probe body is integrally formed setting, it is particular by shell body
Be connected with the compression end 301 of the lower contact jaw of probe body and be integrally formed setting, its with compression end 301 be connected when,
It can be attached by way of integrally casting, so as to further ensure the overall conduction property of probe.
As illustrated in figures 3 a and 4, the elastomer taken all of, i.e. bending segment 202 are made up of some bending compression sections respectively, often
The structure of one bending compression section is as shown in part A in Fig. 4, and each bending compression section includes being separately positioned on the bending of Different Plane
The section that takes all of 401, compression section 402 and compression linkage section 403 are constituted, in this way, being taken all of section 401, the and of compression section 402 by setting bending
Linkage section 403 is compressed, the elastomer that bending segment formation one can be made to take all of, its top view is as shown in Figure 3 b.
Or, in order to be applicable the probe for testing different products, the probe 101 of upper contact jaw and lower contact jaw
106 shapes are respectively set to any one in P, B, T, F, W, M, V, O, R, or, can also
Other arbitrary structures are set to, as long as with test product correspondence, the partial shape structure of probe is as shown in Figure 4.
This probe is simpler than general probe structure, small volume more, be easily worked assembling, price more preferably the advantages of, be one
Plant new technology, the product of new construction.
Preferred embodiment of the present utility model is these are only, the utility model is not limited to, it is all in this practicality
Any modifications, equivalent substitutions and improvements made within new spirit and principle etc., should be included in guarantor of the present utility model
Within the scope of shield.
Claims (4)
1. a kind of probe of integrated circuit testing, it is characterised in that：
Include the probe body of one, probe body includes upper contact jaw, bending segment and lower contact jaw, wherein, bending segment is formed
One elastomer taken all of；
Also, also set up a shell body for being coated on probe body, the lower contact jaw of shell body and probe body is integrally formed, and
And, its upper contact jaw activity with probe body is separately positioned.
2. probe according to claim 1, it is characterised in that：The elastomer taken all of is respectively by some bending compression section groups
The bending for including being separately positioned on Different Plane into, each bending compression section takes all of section, compression section and compression linkage section composition.
3. probe according to claim 1, it is characterised in that：The compression end of the lower contact jaw of shell body and probe body
Connect and be integrally formed setting.
4. according to any described probes of claim 1-3, it is characterised in that：The probe head shapes of upper contact jaw and lower contact jaw
It is respectively set to any one in P, B, T, F, W, M, V, O, R.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720145753.0U CN206515371U (en) | 2017-02-17 | 2017-02-17 | A kind of probe of integrated circuit testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720145753.0U CN206515371U (en) | 2017-02-17 | 2017-02-17 | A kind of probe of integrated circuit testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206515371U true CN206515371U (en) | 2017-09-22 |
Family
ID=59866776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720145753.0U Active CN206515371U (en) | 2017-02-17 | 2017-02-17 | A kind of probe of integrated circuit testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206515371U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115308456A (en) * | 2022-09-29 | 2022-11-08 | 深圳市道格特科技有限公司 | Vertical probe and probe card |
-
2017
- 2017-02-17 CN CN201720145753.0U patent/CN206515371U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115308456A (en) * | 2022-09-29 | 2022-11-08 | 深圳市道格特科技有限公司 | Vertical probe and probe card |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20210316 Address after: 518000 Second Floor of Building 14, Zitian Industrial Zone, Zitian Community, Fuyong Street, Baoan District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN KZT MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee after: WUHAN JINGYITONG ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: 518000 Second Floor of Building 14, Zitian Industrial Zone, Zitian Community, Fuyong Street, Baoan District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN KZT MICROELECTRONICS TECHNOLOGY Co.,Ltd. |
|
| TR01 | Transfer of patent right |