CN211318536U

CN211318536U - Flat probe

Info

Publication number: CN211318536U
Application number: CN201921951956.4U
Authority: CN
Inventors: 魏伟; 江斌
Original assignee: Suzhou HYC Technology Co Ltd
Current assignee: Suzhou HYC Technology Co Ltd
Priority date: 2019-11-13
Filing date: 2019-11-13
Publication date: 2020-08-21
Anticipated expiration: 2029-11-13

Abstract

The utility model discloses a flat probe, include last switching portion, lower switching portion and be used for connecting the kink of switching portion and lower switching portion, go up switching portion under with kink integrated into one piece, the kink just has elastic first metal conduction band and second metal conduction band including parallelly connected setting, first metal conduction band and the mutual symmetry of second metal conduction band, first metal conduction band and second metal conduction band all adopt the entity structure. The utility model discloses a kink not only can increase the elasticity of flat probe, reaches the purpose of elastic contact device to be measured, can also increase the area that is used for electrically conductive kink effectively, improves the impedance and the conductivity of flat probe. In addition, the first metal conduction band and the second metal conduction band are both in solid structures, so that on one hand, the bent parts can be guaranteed to have good elasticity and strong overcurrent capacity, and the problem of untight crimping due to small elasticity when the probe is used is solved.

Description

Flat probe

Technical Field

The utility model relates to a check out test set field, in particular to flat probe.

Background

The probe is mainly used for testing various manufactured electronic elements and circuit boards, and is particularly configured on a testing jig so as to be in contact with the electronic elements or the circuit boards, and then the probe transmits a testing result back to a computer through a lead so as to confirm whether the object to be tested has a bad part.

The current probe structure, the probe is installed in the probe seat, during the test, need exert pressure to the both ends of probe, switches on the detection, and long-term operation back causes the damage to the probe easily, makes the needle body of probe take place to break even, and probe life is short.

SUMMERY OF THE UTILITY MODEL

The utility model provides a well flat probe to solve the problem that probe life is short among the prior art.

In order to solve the above technical problem, the utility model provides a flat probe, include: go up the switching portion, down the switching portion and be used for connecting the kink of switching portion and lower switching portion, go up the switching portion down the switching portion with kink integrated into one piece, the kink just has elastic first metal conduction band and second metal conduction band including parallelly connected setting, first metal conduction band and the mutual symmetry of second metal conduction band, first metal conduction band and second metal conduction band all adopt the entity structure.

Preferably, the upper connection part and the lower connection part each include a connection part connected to the bending part and a probe head connected to the connection part.

Preferably, the end of the probe head is shaped in a V-shape, W-shape, M-shape, O-shape, U-shape, T-shape or T-shape.

Preferably, the probe head is of a solid structure.

Preferably, the connection portion of the upper connection portion is Y-shaped to be connected to the first metal conduction band and the second metal conduction band, respectively.

Preferably, the connecting portion of the lower connecting portion is of a T-shaped structure so as to be connected with the first metal conduction band and the second metal conduction band respectively.

Preferably, the shapes of the first metal conduction band and the second metal conduction band comprise any one of a C shape, an M shape, an S shape, an i shape, an arc shape and a multi-S shape.

Compared with the prior art, the utility model discloses a flat probe includes last switching part, lower switching part and is used for connecting the kink of switching part and lower switching part, go up switching part under with kink integrated into one piece, the kink just has elastic first metal conduction band and second metal conduction band including parallelly connected setting, first metal conduction band and second metal conduction band are symmetrical each other, first metal conduction band and second metal conduction band all adopt the entity structure. The utility model discloses set up the kink into the first metal conduction band and the second metal conduction band of symmetry, not only can increase the elasticity of flat probe, reach the purpose of elastic contact device to be measured, can also increase the area that is used for electrically conductive kink effectively, improve the impedance and the continuity of flat probe. In addition, the first metal conduction band and the second metal conduction band both adopt solid structures, so that on one hand, the bent part can be ensured to have good elasticity, and the problem of untight compression joint caused by small elasticity when the probe is used is solved; on the other hand, the first metal conduction band and the second metal conduction band have larger overcurrent capacity and cannot be blown due to overlarge current and voltage when the power-on device is powered on.

Drawings

Fig. 1 is a schematic perspective view of a flat probe according to the present invention;

fig. 2 is a schematic plan view of the flat probe according to the present invention.

Shown in the figure: 1. an upper transfer part; 11. a connecting portion; 12. a probe head; 2. a lower junction part; 3. a bending section; 31. a first metal conduction band; 32. a second metal conduction band.

Detailed Description

In order to make the technical problems solved, technical solutions adopted and technical effects achieved by the embodiments of the present disclosure clearer, the technical solutions of the embodiments of the present disclosure will be described in further detail below with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments, but not all embodiments, of the embodiments of the present disclosure. All other embodiments, which can be obtained by a person skilled in the art without making creative efforts based on the embodiments of the present disclosure, belong to the protection scope of the embodiments of the present disclosure.

It should be noted that reference to "and/or" in embodiments of the present disclosure is intended to include any and all combinations of one or more of the associated listed items. The terms "first", "second", and the like in the description and claims of the present disclosure and in the drawings are used for distinguishing between different objects and not for limiting a particular order.

It should also be noted that, in the embodiments of the present disclosure, each of the following embodiments may be executed alone, or may be executed in combination with each other, and the embodiments of the present disclosure are not limited specifically.

The technical solutions of the embodiments of the present disclosure are further described by the following detailed description in conjunction with the accompanying drawings.

As shown in fig. 1 and 2, the present invention provides a flat probe, including: go up switching portion 1, lower switching portion 2 and be used for connecting the kink 3 of switching portion 1 and lower switching portion 2, go up switching portion 1 lower switching portion 2 with 3 integrated into one piece of kink. The bending part 3 can be elastically deformed when the flat probe is punched or stretched, so that the purpose of elastically contacting with a device to be tested is achieved, the flat probe is prevented from being damaged due to overlarge stress, and the service life of the flat probe is fundamentally prolonged.

The bending part 3 includes a first metal conduction band 31 and a second metal conduction band 32 which are arranged in parallel and have elasticity. The first metal conduction band 31 and the second metal conduction band 32 can effectively increase the area of the bent portion 3 for conducting electricity, and improve the impedance and conductivity of the flat probe.

Furthermore, the first metal conduction band 31 and the second metal conduction band 32 are symmetrical to each other, so that the stress of the flat probe can be uniformly shared, and the service life of the flat probe is longer compared with that of a single metal conduction band.

The first metal conduction band 31 and the second metal conduction band 32 both adopt solid structures, and the solid structures can ensure that the bent part 3 has good elasticity on one hand, so that the problem of untight compression joint caused by small elasticity when the probe is used is solved; on the other hand, the first metal conduction band 31 and the second metal conduction band 32 have larger overcurrent capacity and cannot be blown due to overlarge current voltage when being electrified.

With continued reference to fig. 1 and 2, the upper junction portion 1 and the lower junction portion 2 each include a connection portion 11 connected to the bending portion 3 and a probe head 12 connected to the connection portion 11. The probe head 12 has a solid structure, and the end of the probe head is shaped like a V, a W, an M, an O, a U, a T or a T, so that the probe head can adapt to different product connectors.

Preferably, the connection portion 11 of the upper connection portion 1 is Y-shaped, one end of the Y-shaped connection portion 11 can be connected to the first metal conduction band 31 and the second metal conduction band 32, respectively, and the other end is connected to the probe head 12.

Preferably, the connecting portion 11 of the lower connecting portion 2 is of a T-shaped structure, one end of the T-shaped connecting portion 11 is connected to the first metal conduction band 31 and the second metal conduction band 32, and the other end is connected to the probe head 12.

Preferably, the shapes of the first metal conduction band 31 and the second metal conduction band 32 each include any one of C-shape, M-shape, S-shape, i-shape, arch shape, and multiple S-shape or any one of the variants. The first metal conduction band 31 and the second metal conduction band 32 in this embodiment preferably have an S-shaped or arcuate structure.

To sum up, the utility model discloses a flat probe, including last switching part 1, lower switching part 2 and be used for connecting the kink 3 of switching part 1 and lower switching part 2, go up switching part 1 lower switching part 2 with 3 integrated into one piece of kink, kink 3 just has elastic first metal conduction band 31 and second metal conduction band 32 including parallelly connected setting, first metal conduction band 31 and second metal conduction band 32 are symmetrical each other, first metal conduction band 31 and second metal conduction band 32 all adopt the entity structure. The utility model discloses set up kink 3 into symmetrical first metal conduction band 31 and second metal conduction band 32, not only can increase the elasticity of flat probe, reach the purpose of elastic contact device under test, can also increase the area that is used for electrically conductive kink 3 effectively, improve the impedance and the conductivity of flat probe. In addition, the first metal conduction band 31 and the second metal conduction band 32 both adopt solid structures, so that on one hand, the bent part 3 can be ensured to have good elasticity, and the problem of untight compression joint caused by small elasticity when the probe is used is avoided; on the other hand, the first metal conduction band 31 and the second metal conduction band 32 have larger overcurrent capacity and cannot be blown due to overlarge current voltage when being electrified.

The foregoing description is only a preferred embodiment of the disclosed embodiments and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the disclosure in the embodiments of the present disclosure is not limited to the particular combination of the above-described features, but also encompasses other embodiments in which any combination of the above-described features or their equivalents is possible without departing from the scope of the present disclosure. For example, the above features and (but not limited to) the features with similar functions disclosed in the embodiments of the present disclosure are mutually replaced to form the technical solution.

It will be apparent to those skilled in the art that various changes and modifications may be made to the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims and their equivalents, the present invention is also intended to include such modifications and variations.

Claims

1. A flat probe, comprising: go up the switching portion, down the switching portion and be used for connecting the kink of switching portion and lower switching portion, go up the switching portion down the switching portion with kink integrated into one piece, its characterized in that, the kink just has elastic first metal conduction band and second metal conduction band including parallelly connected setting, first metal conduction band and second metal conduction band are symmetrical each other, first metal conduction band and second metal conduction band all adopt the entity structure.

2. The flat probe as claimed in claim 1, wherein the upper and lower junctions each include a connection portion connected with the bending portion and a probe head connected with the connection portion.

3. The flat probe as claimed in claim 2, wherein the end of the probe head is shaped as V, W, M, O, U, T or T.

4. The flat probe according to claim 2, wherein said probe head is of a solid construction.

5. The flat probe according to claim 2, wherein the connection portion of the upper junction is Y-shaped to be connected to the first metal conduction band and the second metal conduction band, respectively.

6. The flat probe as claimed in claim 2, wherein the connection portions of the lower junctions are T-shaped to be connected to the first and second metal conduction bands, respectively.

7. The flat probe as claimed in claim 1, wherein the shapes of the first and second metal conduction bands each include any one of a C-shape, an M-shape, an S-shape, an i-shape, an arcuate shape, and a multiple S-shape.