WO2018076483A1 - Oled显示器 - Google Patents
Oled显示器 Download PDFInfo
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- WO2018076483A1 WO2018076483A1 PCT/CN2016/109570 CN2016109570W WO2018076483A1 WO 2018076483 A1 WO2018076483 A1 WO 2018076483A1 CN 2016109570 W CN2016109570 W CN 2016109570W WO 2018076483 A1 WO2018076483 A1 WO 2018076483A1
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- WIPO (PCT)
- Prior art keywords
- layer
- water
- oxygen quenching
- oled
- inorganic passivation
- Prior art date
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- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 147
- 239000001301 oxygen Substances 0.000 claims abstract description 147
- 238000010791 quenching Methods 0.000 claims abstract description 147
- 230000000171 quenching effect Effects 0.000 claims abstract description 147
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 90
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 89
- 238000002161 passivation Methods 0.000 claims abstract description 60
- 239000010409 thin film Substances 0.000 claims abstract description 32
- 239000000463 material Substances 0.000 claims description 37
- 238000005538 encapsulation Methods 0.000 claims description 29
- 239000000758 substrate Substances 0.000 claims description 21
- 239000010408 film Substances 0.000 claims description 20
- 230000002093 peripheral effect Effects 0.000 claims description 15
- 229910052749 magnesium Inorganic materials 0.000 claims description 9
- 239000011368 organic material Substances 0.000 claims description 9
- 229910045601 alloy Inorganic materials 0.000 claims description 8
- 239000000956 alloy Substances 0.000 claims description 8
- 229910052791 calcium Inorganic materials 0.000 claims description 5
- 229910052744 lithium Inorganic materials 0.000 claims description 5
- 229910052700 potassium Inorganic materials 0.000 claims description 5
- 229910052708 sodium Inorganic materials 0.000 claims description 5
- 229910052783 alkali metal Inorganic materials 0.000 claims description 4
- 150000001340 alkali metals Chemical group 0.000 claims description 4
- 229910052784 alkaline earth metal Inorganic materials 0.000 claims description 4
- 150000001342 alkaline earth metals Chemical class 0.000 claims description 4
- 229910052788 barium Inorganic materials 0.000 claims description 4
- 239000002585 base Substances 0.000 claims description 4
- 230000006378 damage Effects 0.000 abstract description 9
- 238000005452 bending Methods 0.000 abstract description 7
- 238000006243 chemical reaction Methods 0.000 abstract description 6
- 238000001179 sorption measurement Methods 0.000 abstract description 6
- 238000004806 packaging method and process Methods 0.000 abstract description 5
- 239000010410 layer Substances 0.000 description 238
- 239000011777 magnesium Substances 0.000 description 9
- 239000012044 organic layer Substances 0.000 description 7
- 230000007547 defect Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 229910052709 silver Inorganic materials 0.000 description 5
- 239000011575 calcium Substances 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 239000011734 sodium Substances 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000005525 hole transport Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910002027 silica gel Inorganic materials 0.000 description 2
- 239000000741 silica gel Substances 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 229910052712 strontium Inorganic materials 0.000 description 2
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 229910000861 Mg alloy Inorganic materials 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000003463 adsorbent Substances 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 238000010549 co-Evaporation Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000004005 microsphere Substances 0.000 description 1
- 239000002114 nanocomposite Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- QQONPFPTGQHPMA-UHFFFAOYSA-N propylene Natural products CC=C QQONPFPTGQHPMA-UHFFFAOYSA-N 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/874—Passivation; Containers; Encapsulations including getter material or desiccant
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/873—Encapsulations
- H10K59/8731—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
- H10K50/8445—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/846—Passivation; Containers; Encapsulations comprising getter material or desiccants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/311—Flexible OLED
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Definitions
- the present invention relates to the field of flat panel display technologies, and in particular, to an OLED display.
- OLED Organic light emitting diode
- the OLED device is composed of an anode, an organic layer and a cathode, wherein the anode is usually a high work function and high reflectivity indium tin oxide (ITO). It is composed of a three-layer superposed structure of ITO/Ag/ITO of silver (Ag).
- the organic layer comprises a hole injection layer, a hole transport layer, a light-emitting layer, an electron transport layer and an electron injection layer, and the cathode is a low work function metal magnesium and Silver Mg/Ag alloy.
- the organic layer and the cathode are very sensitive to water and oxygen, various methods are required for packaging the organic light-emitting component when preparing the flexible OLED screen.
- TFE thin film encapsulation
- FIG. 1 the most common technology for film packaging is that the polymer organic film 21 and the inorganic film 22 are alternately deposited on the surface of the flexible OLED substrate 10 , wherein the flexible OLED substrate 10 includes the substrate 11 and is disposed on the substrate.
- the inorganic film 22 of the TFE layer has good water and oxygen barrier properties, and the polymer organic film 21 can be well absorbed and dispersed between the layers.
- the stress prevents the dense inorganic film 22 from being cracked and reduces the barrier property to water and oxygen.
- the inorganic film 22 in the TFE layer may generate new defects or increase the original defects in the subsequent fabrication process, or the use of the screen (external force impact, bending, falling). These defects will become channels for water and oxygen permeation, reduce the water blocking performance of the TFE layer, and make the water oxygen in the atmospheric environment contact the OLED light emitting device, which affects the service life of the OLED light emitting device.
- water quenching layer Moisture/Oxygen Quenching Laryer, MOQL
- the present invention provides an OLED display including a substrate substrate, a TFT array layer disposed on the substrate, an OLED layer disposed on the TFT array layer, and an array disposed on the TFT array. a thin film encapsulation layer on the layer and the OLED layer and covering the OLED layer;
- the thin film encapsulation layer includes an inorganic passivation layer, an organic buffer layer, and a water oxygen quenching layer; in the thin film encapsulation layer, the inorganic passivation layer and the organic buffer layer are alternately stacked, and the inorganic passivation layer is more than the organic buffer layer One more layer on the number of layers, the inorganic passivation layer and the organic buffer layer together form a laminated structure;
- the water oxygen quenching layer is a first water oxygen quenching layer, a second water oxygen quenching layer, or a combination of the two, wherein the first water oxygen quenching layer is disposed on the OLED layer, Between the stacked structure and the OLED layer, the second water-oxygen quenching layer is disposed in the stacked structure between the two inorganic passivation layers.
- the OLED display has a centrally located display area and a non-display area located around the display area, the display area having a plurality of arrayed sub-pixel areas and remaining remaining areas;
- the first water oxygen quenching layer includes an annular peripheral portion and a central portion located in the outer peripheral portion of the ring, the peripheral portion is disposed corresponding to the non-display region, and the central portion is disposed in the display region
- the spacing portion is a combination of a network structure corresponding to the spacing region or a plurality of quenching individuals distributed in the spacing region.
- the material of the first water oxygen quenching layer is an alkali metal, an alkaline earth metal, or an alloy of the two.
- the material of the first water oxygen quenching layer is an alloy of one or more of Li, Na, K, Ru, Cs, Mg, Ca, and Ba.
- the shape of the quenching individual is circular, rectangular, or L-shaped;
- Each quenching individual corresponds to one, or a plurality of sub-pixel regions, or each sub-pixel region corresponds to a plurality of quenching individuals.
- the thickness of the first water oxygen quenching layer and the second water oxygen quenching layer are both 5 nm to 100 nm.
- the second water-oxygen quenching layer is located between an inorganic passivation layer and an organic buffer layer, and the upper and lower surfaces of the second water-oxygen quenching layer and the organic buffer layer and the inorganic
- the passivation layer is in contact;
- the material of the second water oxygen quenching layer is a light absorbing and hygroscopic physical adsorbing material.
- the second water-oxygen quenching layer is located between an inorganic passivation layer and an organic buffer layer, and the upper and lower surfaces of the second water-oxygen quenching layer and the inorganic passivation layer and the Organic buffer layer
- the material of the second water-oxygen quenching layer is a physical adsorbing material having light transmissivity and hygroscopicity.
- the second water-oxygen quenching layer is a film layer formed by uniformly dispersing a light-transmitting and hygroscopic physical adsorbing material in an organic material, and the second water-oxygen quenching layer serves as an organic buffer layer at the same time.
- the second water-oxygen quenching layer is a film layer formed by uniformly dispersing a particulate physical adsorption material in the organic material.
- the present invention also provides an OLED display, comprising: a base substrate, a TFT array layer disposed on the base substrate, an OLED layer disposed on the TFT array layer, and the TFT array layer and the OLED layer And covering the thin film encapsulation layer of the OLED layer;
- the thin film encapsulation layer includes an inorganic passivation layer, an organic buffer layer, and a water oxygen quenching layer; in the thin film encapsulation layer, the inorganic passivation layer and the organic buffer layer are alternately stacked, and the inorganic passivation layer is more than the organic buffer layer One more layer on the number of layers, the inorganic passivation layer and the organic buffer layer together form a laminated structure;
- the water oxygen quenching layer is a first water oxygen quenching layer, a second water oxygen quenching layer, or a combination of the two, wherein the first water oxygen quenching layer is disposed on the OLED layer, Between the layered structure and the OLED layer, the second water-oxygen quenching layer is disposed in the layered structure between two inorganic passivation layers;
- first water oxygen quenching layer and the second water oxygen quenching layer have a thickness of 5 nm to 100 nm;
- a display area located at the center and a non-display area located around the display area, the display area having a plurality of sub-pixel areas arranged in an array, and remaining remaining areas;
- the first water oxygen quenching layer includes an annular peripheral portion and a central portion located in the outer peripheral portion of the ring, the peripheral portion is disposed corresponding to the non-display region, and the central portion is disposed in the display region
- the spacing portion is a combination of a network structure corresponding to the spacing region or a plurality of quenching individuals distributed in the spacing region.
- the OLED display of the present invention has a thin film encapsulation layer including an inorganic passivation layer, an organic buffer layer, and a water oxygen quenching layer, wherein the inorganic passivation layer and the organic buffer layer together form a stacked structure.
- the water oxygen quenching layer is a first water oxygen quenching layer between the stacked structure and the OLED layer, or a second water oxygen quenching layer between the two inorganic passivation layers in the stacked structure, or two
- the water-oxygen quenching layer can effectively interact with the inorganic passivation layer and the organic buffer layer by physical adsorption or chemical reaction without affecting the luminescence performance of the OLED device.
- FIG. 1 is a schematic structural view of a conventional OLED display
- FIG. 2 is a schematic view showing the inorganic film in the package structure of the OLED display of FIG. 1 having defects eroded by water and oxygen;
- FIG. 3 is a schematic structural view of a first embodiment of an OLED display of the present invention.
- FIG. 4 is a first schematic view showing the first water oxygen quenching layer in the first embodiment of the OLED display of the present invention
- FIG. 5 is a schematic view showing a second shape of a first water oxygen quenching layer in a first embodiment of the OLED display of the present invention
- FIG. 6 is a schematic view showing a third shape of a first water oxygen quenching layer in a first embodiment of the OLED display of the present invention
- FIG. 7 is a schematic view showing a fourth shape of a first water oxygen quenching layer in a first embodiment of the OLED display of the present invention.
- FIG. 8 is a fifth schematic view showing the shape of the first water oxygen quenching layer in the first embodiment of the OLED display of the present invention.
- FIG. 9 is a sixth schematic view showing the shape of the first water oxygen quenching layer in the first embodiment of the OLED display of the present invention.
- FIG. 10 is a schematic structural view of a second embodiment of an OLED display of the present invention.
- FIG. 11 is a schematic structural view of a third embodiment of an OLED display of the present invention.
- FIG. 12 is a schematic structural view of a fourth embodiment of an OLED display of the present invention.
- Figure 13 is a schematic view showing the structure of a fifth embodiment of the OLED display of the present invention.
- the OLED display includes a substrate substrate 100 and is disposed on the substrate substrate.
- the thin film encapsulation layer 400 includes an inorganic passivation layer 401, an organic buffer layer 402, and a water oxygen quenching layer 403.
- the inorganic passivation layer 401 and the organic buffer layer 402 are alternately stacked, and inorganic
- the passivation layer 401 has one more layer than the organic buffer layer 402, and the inorganic passivation layer 401 and the organic buffer layer 402 together constitute a laminated structure.
- the water oxygen quenching layer 403 is a first water oxygen quenching layer 4031, a second water oxygen quenching layer 4032, or a combination of the two, wherein the first water oxygen quenching layer 4031 is disposed on the OLED.
- the second water-oxygen quenching layer 4032 is disposed in the laminated structure between the two inorganic passivation layers 401.
- the water oxygen quenching layer 403 is a first water oxygen quenching layer 4031.
- the OLED display has a centrally located display area (AA) and a non-display area located around the display area, the display area having a plurality of arrayed sub-pixel areas, and remaining intervals region.
- AA centrally located display area
- non-display area located around the display area, the display area having a plurality of arrayed sub-pixel areas, and remaining intervals region.
- the TFT array layer 200 includes a plurality of TFT devices arranged in a matrix corresponding to the plurality of sub-pixel regions, wherein the TFT device can be amorphous silicon (a-Si) or low temperature polysilicon (LTPS), an oxide semiconductor, or the like is used as an active layer.
- a-Si amorphous silicon
- LTPS low temperature polysilicon
- oxide semiconductor oxide semiconductor
- the OLED layer 300 includes a plurality of OLED devices arranged in a matrix corresponding to the plurality of sub-pixel regions, and each OLED device includes an anode, an organic layer 301, and a cathode 302 arranged in this order from top to bottom.
- the organic layer 301 includes a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer arranged in this order from top to bottom, wherein the cathode 302 of the plurality of OLED devices is a full surface structure The four side edges of the cathode 302 extend from the display area to the non-display area.
- the cathode 302 is formed by co-evaporation of Mg and Ag, wherein the composition ratio of Mg and Ag in the cathode 302 can be flexibly regulated according to the performance requirements of the device, specifically, the composition ratio of Mg and Ag in the cathode 302 is 1:9-9. :1.
- the material of the first water-oxygen quenching layer 4031 is an alkali metal (eg, lithium Li, sodium Na, potassium K, strontium Ru, cesium Cs, etc.), an alkaline earth metal (eg, magnesium Mg, calcium Ca, strontium). Ba, etc.), or an alloy of both.
- the first water oxygen quenching layer 4031 is more chemically active than the cathode 302 and the organic layer 301, and can be quickly reacted with water and oxygen by a chemical reaction, thereby avoiding the OLED device. Destruction of the organic layer 301 and the cathode 302.
- the material of the inorganic passivation layer 401 is silicon nitride (SiN), silicon oxide (SiO X ), aluminum oxide (Al 2 O 3 ), titanium oxide (TiO 2 ), or zirconium oxide (ZrO 2 );
- the organic buffer layer 402 is a polymer transparent material such as acrylic, polycarbonate polymer, and polystyrene, so that the stress during the film formation of the inorganic passivation layer 401 can be effectively alleviated.
- the material of the first water-oxygen quenching layer 4031 is an alloy of one or more of Li, Na, K, Ru, Cs, Mg, Ca, and Ba.
- the first water oxygen quenching layer 4031 is distributed in the non-display area outside the display area and the spacing area in the display area, thereby avoiding affecting the light-emitting effect of the sub-pixel area; the first water oxygen quenching The annihilation layer 4031 includes an annular outer peripheral portion and a central portion located in the outer peripheral portion of the annular shape.
- the peripheral portion of the first water-oxygen quenching layer 4031 outside the entire display area covers the cathode ring of the cathode 302 in the non-display area, as shown in FIG. 4-9.
- the central portion of the first water-oxygen quenching layer 4031 can be flexibly designed according to an actual process.
- the central portion of the first water-oxygen quenching layer 4031 can be a network structure corresponding to the spacing region and surrounding each sub-pixel region.
- the whole may also be a combination of quenching individuals distributed in a circle, a square (which may include rounded corners), a rectangle, an L-shape, and other shapes distributed around the sub-pixel region, wherein each quenching individual corresponds to One or more sub-pixel regions, or each sub-pixel region corresponds to a plurality of quenching individuals.
- the first water oxygen quenching layer 4031 has a thickness of 5 nm to 100 nm.
- the base substrate 100 is a flexible substrate.
- the first water oxygen quenching layer 4031 is introduced on the OLED layer 300, and the water and oxygen can be effectively avoided by the chemical reaction without affecting the luminescent properties of the OLED device. Damage, thereby increasing the service life of the OLED device, and reducing the number and thickness of the thin film encapsulation layer 400, thereby thinning the thickness of the OLED display as a whole and improving the bending performance of the flexible OLED display.
- the water-oxygen quenching layer 403 is a second water-oxygen quenching.
- Layer 4032 is a second water-oxygen quenching.
- the second water-oxygen quenching layer 4032 is located between an inorganic passivation layer 401 and an organic buffer layer 402, and the second water-oxygen quenching layer 4032 is disposed on the inorganic passivation layer 401.
- the upper and lower surfaces of the second water-oxygen quenching layer 4032 are respectively in contact with the organic buffer layer 402 and the inorganic passivation layer 401; the material of the second water-oxygen quenching layer 4032 and the first
- the material of the water-oxygen quenching layer 4031 is a physical adsorbing material having light transmissivity and hygroscopicity.
- the physical adsorbing material is a transparent porous silica gel, a micro-nano composite silica gel, or a propylene resin. a material having high light transmittance; the second water oxygen quenching layer 4031 has a thickness of 5 nm to 100 nm. Others are the same as the first embodiment described above, and are not described herein again.
- the second water-oxygen quenching layer 4032 having high light transmittance is introduced in the laminated structure of the inorganic passivation layer 401 and the organic buffer layer 402, without affecting the luminescent properties of the OLED device.
- the physical adsorption can effectively avoid the damage of the OLED device by water and oxygen, thereby improving the service life of the OLED device, and reducing the number and thickness of the thin film encapsulation layer 400, thereby reducing the thickness of the OLED display and improving the flexibility. Bending performance of OLED displays.
- FIG. 11 is a schematic structural view of a third embodiment of an OLED display according to the present invention.
- the second water oxygen quenching layer 4032 is located in a layer of inorganic blunt.
- the second water-oxygen quenching layer 4032 is disposed on the organic buffer layer 402, and the upper and lower surfaces of the second water-oxygen quenching layer 4032 are respectively
- the inorganic passivation layer 401 and the organic buffer layer 402 are in contact with each other; the other is the same as the second embodiment described above, and details are not described herein again.
- FIG. 12 is a schematic structural view of a fourth embodiment of an OLED display according to the present invention.
- the second water-oxygen quenching layer 4032 is translucent.
- the hygroscopic physical adsorbing material is uniformly dispersed in the film layer formed in the organic material, and the second water oxygen quenching layer 4032 serves as the organic buffer layer 402 at the same time.
- the second water-oxygen quenching layer 4032 is a film layer formed by uniformly dispersing a granular physical adsorption material of a nanometer or micron order in an organic material, and the size of the physical adsorbing material is 10 nm to 10 ⁇ m.
- the physical adsorbent material is made into nano- or micro-scale microspheres, and then uniformly dispersed in an organic material to form a film layer, to obtain a second water-oxygen quenching layer 4032.
- Others are the same as the second embodiment described above, and are not described herein again.
- the water-oxygen quenching layer 403 is first water-oxygen quenched.
- the layer 4031 is combined with the second water oxygen quenching layer 4032, wherein the second water oxygen quenching layer 4032 is a light absorbing and hygroscopic physical adsorbing material; the first water oxygen quenching layer 4031 passes a chemical reaction
- the second water oxygen quenching layer 4032 is physically adsorbed to avoid damage of the OLED device by water and oxygen. Others are the same as the first embodiment described above, and are not described herein again.
- the OLED display of the present invention has a thin film encapsulation layer including an inorganic passivation layer, an organic buffer layer, and a water oxygen quenching layer, wherein the inorganic passivation layer and the organic buffer layer together form a laminated structure.
- the water oxygen quenching layer is a first water oxygen quenching layer between the stacked structure and the OLED layer, or a second water oxygen quenching layer between the two inorganic passivation layers in the stacked structure, or both
- the combination of the water-oxygen quenching layer in the thin film encapsulation layer by physical adsorption or chemical reaction without affecting the luminescent properties of the OLED device, and the inorganic passivation layer and the organic buffer layer Synergistic effect can effectively avoid the damage of water and oxygen to the OLED device, thereby improving the service life of the OLED device, and at the same time, releasing the stress of the inorganic passivation layer in the thin film encapsulation layer, reducing the number and thickness of the thin film encapsulation layer. Therefore, the overall thickness of the OLED display is thinned, and the bending performance of the flexible OLED display is improved.
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Abstract
Description
Claims (18)
- 一种OLED显示器,包括衬底基板、设于所述衬底基板上的TFT阵列层、设于所述TFT阵列层上的OLED层、及设于所述TFT阵列层及OLED层上且覆盖所述OLED层的薄膜封装层;所述薄膜封装层包括无机钝化层、有机缓冲层、及水氧淬灭层;所述薄膜封装层中,无机钝化层和有机缓冲层交替层叠设置,且无机钝化层比有机缓冲层在层数上多一层,所述无机钝化层和有机缓冲层共同构成层叠结构;所述水氧淬灭层为第一水氧淬灭层、第二水氧淬灭层、或两者的组合,其中,所述第一水氧淬灭层设于所述OLED层上,位于所述层叠结构与OLED层之间,所述第二水氧淬灭层设于所述层叠结构之中,位于两层无机钝化层之间。
- 如权利要求1所述的OLED显示器,其中,具有位于中央的显示区域、及位于显示区域四周的非显示区域,所述显示区域具有数个阵列排布的子像素区域、及剩余的间隔区域;所述第一水氧淬灭层包括环状的外围部、及位于环状的外围部内的中心部,所述外围部对应所述非显示区域设置,所述中心部分布于所述显示区域内的间隔区域,所述中心部为对应所述间隔区域的呈网络结构的整体、或者为分布于间隔区域的数个淬灭个体的组合。
- 如权利要求2所述的OLED显示器,其中,所述第一水氧淬灭层的材料为碱金属、碱土金属、或者两者的合金。
- 如权利要求3所述的OLED显示器,其中,所述第一水氧淬灭层的材料为Li、Na、K、Ru、Cs、Mg、Ca、及Ba中的一种或多种的合金。
- 如权利要求2所述的OLED显示器,其中,所述淬灭个体的形状为圆形、矩形、或L字形;每一淬灭个体对应于一个、或者多个子像素区域,或者每一个子像素区域对应于多个淬灭个体。
- 如权利要求1所述的OLED显示器,其中,第一水氧淬灭层、及第二水氧淬灭层的厚度均为5nm-100nm。
- 如权利要求1所述的OLED显示器,其中,所述第二水氧淬灭层位于一层无机钝化层和一层有机缓冲层之间,所述第二水氧淬灭层的上、下两表面分别与该有机缓冲层、及该无机钝化层相接触;所述第二水氧淬灭 层的材料为具有透光性、及吸湿性的物理吸附材料。
- 如权利要求1所述的OLED显示器,其中,所述第二水氧淬灭层位于一层无机钝化层和一层有机缓冲层之间,所述第二水氧淬灭层的上、下两表面分别与该无机钝化层、及该有机缓冲层相接触;所述第二水氧淬灭层的材料为具有透光性、及吸湿性的物理吸附材料。
- 如权利要求1所述的OLED显示器,其中,所述第二水氧淬灭层为具有透光性、及吸湿性的物理吸附材料均匀分散于有机材料中所形成的膜层,所述第二水氧淬灭层同时作为有机缓冲层。
- 如权利要求9所述的OLED显示器,其中,所述第二水氧淬灭层为颗粒状的物理吸附材料均匀分散于有机材料中所形成的膜层。
- 一种OLED显示器,包括衬底基板、设于所述衬底基板上的TFT阵列层、设于所述TFT阵列层上的OLED层、及设于所述TFT阵列层及OLED层上且覆盖所述OLED层的薄膜封装层;所述薄膜封装层包括无机钝化层、有机缓冲层、及水氧淬灭层;所述薄膜封装层中,无机钝化层和有机缓冲层交替层叠设置,且无机钝化层比有机缓冲层在层数上多一层,所述无机钝化层和有机缓冲层共同构成层叠结构;所述水氧淬灭层为第一水氧淬灭层、第二水氧淬灭层、或两者的组合,其中,所述第一水氧淬灭层设于所述OLED层上,位于所述层叠结构与OLED层之间,所述第二水氧淬灭层设于所述层叠结构之中,位于两层无机钝化层之间;其中,第一水氧淬灭层、及第二水氧淬灭层的厚度均为5nm-100nm;其中,具有位于中央的显示区域、及位于显示区域四周的非显示区域,所述显示区域具有数个阵列排布的子像素区域、及剩余的间隔区域;所述第一水氧淬灭层包括环状的外围部、及位于环状的外围部内的中心部,所述外围部对应所述非显示区域设置,所述中心部分布于所述显示区域内的间隔区域,所述中心部为对应所述间隔区域的呈网络结构的整体、或者为分布于间隔区域的数个淬灭个体的组合。
- 如权利要求11所述的OLED显示器,其中,所述第一水氧淬灭层的材料为碱金属、碱土金属、或者两者的合金。
- 如权利要求12所述的OLED显示器,其中,所述第一水氧淬灭层的材料为Li、Na、K、Ru、Cs、Mg、Ca、及Ba中的一种或多种的合金。
- 如权利要求11所述的OLED显示器,其中,所述淬灭个体的形状为圆形、矩形、或L字形;每一淬灭个体对应于一个、或者多个子像素区域,或者每一个子像素区域对应于多个淬灭个体。
- 如权利要求11所述的OLED显示器,其中,所述第二水氧淬灭层位于一层无机钝化层和一层有机缓冲层之间,所述第二水氧淬灭层的上、下两表面分别与该有机缓冲层、及该无机钝化层相接触;所述第二水氧淬灭层的材料为具有透光性、及吸湿性的物理吸附材料。
- 如权利要求11所述的OLED显示器,其中,所述第二水氧淬灭层位于一层无机钝化层和一层有机缓冲层之间,所述第二水氧淬灭层的上、下两表面分别与该无机钝化层、及该有机缓冲层相接触;所述第二水氧淬灭层的材料为具有透光性、及吸湿性的物理吸附材料。
- 如权利要求11所述的OLED显示器,其中,所述第二水氧淬灭层为具有透光性、及吸湿性的物理吸附材料均匀分散于有机材料中所形成的膜层,所述第二水氧淬灭层同时作为有机缓冲层。
- 如权利要求17所述的OLED显示器,其中,所述第二水氧淬灭层为颗粒状的物理吸附材料均匀分散于有机材料中所形成的膜层。
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US15/329,232 US10084155B2 (en) | 2016-10-31 | 2016-12-13 | OLED display |
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EP3534425A4 (en) | 2020-06-17 |
JP7130638B2 (ja) | 2022-09-05 |
KR20190077054A (ko) | 2019-07-02 |
EP3534425B1 (en) | 2023-04-12 |
US10084155B2 (en) | 2018-09-25 |
CN106328825B (zh) | 2019-01-15 |
US20180248153A1 (en) | 2018-08-30 |
EP3534425A1 (en) | 2019-09-04 |
CN106328825A (zh) | 2017-01-11 |
JP2019533886A (ja) | 2019-11-21 |
KR102215330B1 (ko) | 2021-02-15 |
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