WO2017047495A1 - Broche de sonde et outil d'inspection comprenant celle-ci - Google Patents

Broche de sonde et outil d'inspection comprenant celle-ci Download PDF

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Publication number
WO2017047495A1
WO2017047495A1 PCT/JP2016/076460 JP2016076460W WO2017047495A1 WO 2017047495 A1 WO2017047495 A1 WO 2017047495A1 JP 2016076460 W JP2016076460 W JP 2016076460W WO 2017047495 A1 WO2017047495 A1 WO 2017047495A1
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WO
WIPO (PCT)
Prior art keywords
contact
coil spring
housing
center line
probe pin
Prior art date
Application number
PCT/JP2016/076460
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English (en)
Japanese (ja)
Inventor
宏真 寺西
貴浩 酒井
近藤　誠
Original Assignee
オムロン株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by オムロン株式会社 filed Critical オムロン株式会社
Publication of WO2017047495A1 publication Critical patent/WO2017047495A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/72—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted

Definitions

  • the present invention relates to a probe pin and an inspection jig provided with the probe pin.
  • the probe pin includes two contact pins having the same shape with a contact portion provided at one end, and a coil spring. Two contact pins are respectively inserted from both ends of the coil spring so that the contact portion is exposed, and are coupled to each other so as to be slidable and orthogonal to each other inside the coil spring.
  • an object of the present invention is to provide a probe pin that can cope with the complexity and diversification of an object to be inspected, and an inspection jig provided with the probe pin.
  • the probe pin of the present invention is to solve the above problems.
  • the first plunger comprises: A first insertion portion disposed inside the coil spring;
  • a first support provided at a boundary portion between the first contact portion and the first insertion portion, extending in a direction intersecting the center line, and contacting one end of the coil spring to prevent the coil spring from coming off.
  • the second plunger comprises: A second insertion part arranged inside the coil spring and slidably connected to the first insertion part; A second contact portion that is exposed to the outside of the coil spring and provided with a second contact that can reciprocate in a direction intersecting the center line; A second portion provided at a boundary portion between the second contact portion and the second insertion portion, extending in a direction intersecting the center line, and contacting the other end of the coil spring to prevent the coil spring from coming off; A support part; Have
  • the first contact that can reciprocate along the center line of the coil spring and the second contact that can reciprocate in the direction intersecting the center line of the coil spring are provided.
  • the terminal of the object to be inspected cannot be arranged on the same straight line as the terminal of the inspection device, and the terminal of the object to be inspected unless one contact is reciprocated in a direction intersecting the center line of the coil spring
  • the terminal of the inspection object and the terminal of the inspection apparatus can be contacted at the same time.
  • FIG. 5 is a cross-sectional view taken along line VV in FIG.
  • FIG. 5 is an exploded perspective view of the probe pin of FIG. 4. It is a perspective view for demonstrating the test
  • FIG. 8 is a sectional view taken along line VIII-VIII in FIG. It is a perspective view of the probe pin of 2nd Embodiment of this invention, It is a perspective view of another inspection jig provided with the probe pin of the first embodiment of the present invention, It is sectional drawing along the XI-XI line of FIG. It is a disassembled perspective view of the inspection jig of FIG. It is a perspective view for demonstrating the test
  • an inspection jig 1 having a probe pin 3 according to the first embodiment of the present invention includes an insulating housing 2 and a plurality of probe pins 3 housed in the housing 2. And.
  • the housing 2 has a rectangular shape in a top view, and a lower housing 10 as an example of the first housing, and a second housing provided on the lower housing 10 (upper side in the Z direction in FIG. 1). And an upper housing 20 as an example.
  • a housing holding portion 4 for housing and holding the probe pin 3 is provided inside the housing 2.
  • the storage / holding portion 4 includes a holding portion 11 provided in the lower housing 10 and a storage portion 28 provided in the upper housing 20.
  • the lower housing 10 includes a plurality of holding portions 11 for holding the plurality of probe pins 3, four engagement protrusions 12 for positioning the lower housing 10 and the upper housing 20, While fixing the lower housing 10 and the upper housing 20, it has a pair of attachment hole 13 for fixing the housing 2 to a board
  • Each holding portion 11 has a through hole 111 that penetrates the lower housing 10 in the Z direction, and a holding groove portion 112 that communicates with the through hole 111 and extends on the upper surface of the lower housing 10 along the Y direction. It consists of and.
  • the holding portions 11 are arranged at equal intervals on the upper surface of the lower housing 10 so as to form two parallel rows extending along the X direction. As shown in FIG. 2, the two rows of the holding portions 11 are arranged at intervals in the short side direction (Y direction) so that the second contacts 47 of the probe pins 3 described later face each other. . That is, the holding groove 112 is provided on the surface of the lower housing 10 that faces the upper housing 20.
  • Each engagement protrusion 12 is provided so as to protrude from the upper surface of the lower housing 10 toward the upper side in the Z direction.
  • each engagement protrusion 12 is disposed between the holding portion 11 at both ends in the X direction of the lower housing 10 and the mounting hole 13 so as to face both long sides extending in the X direction of the lower housing 10. Has been.
  • Each mounting hole 13 has a shape that penetrates the lower housing 10 in the Z direction and allows a fastening member to be inserted, and is disposed at each end of the lower housing 10 in the X direction (only one is shown in FIG. 3). ).
  • the upper housing 20 includes a pair of support parts 21 and 22 for supporting an object to be inspected, and an inspection part (inspection groove part) 23 for inserting the object to be inspected and performing an electric current inspection.
  • Four engagement receiving portions 24 (only two are shown in FIG. 3) for positioning the lower housing 10 and the upper housing 20, and a pair of mounting holes 25 (FIG. 3) for fixing the upper housing 20 to a substrate or the like. Shows only one).
  • each of the support groove portions 26 and 27 includes groove portions 261 and 271 (only one is shown in FIG. 2), and introduction portions 262 and 272 (in FIG. 2, continuous to the upper side in the Z direction of the groove portions 261 and 271). (Only one is shown).
  • Each of the groove portions 261 and 271 has substantially the same width in which an inspection object can be inserted.
  • each introduction portion 262, 272 has a width that gradually increases toward the upper side in the Z direction.
  • the inspection unit 23 is provided on the upper surface of the upper housing 20 along the X direction, and penetrates in the Z direction as shown in FIG.
  • the inspection portion 23 is disposed so as to be positioned between the rows of the holding portions 11 of the lower housing 10. Further, both ends in the X direction of the inspection unit 23 communicate with the support groove portions 26 and 27, respectively.
  • Each engagement receiving portion 24 is provided such that when the upper housing 20 is fixed to the lower housing 10, the corresponding engagement protrusion 12 of the lower housing 10 can be engaged.
  • This engagement receiving part 24 is arrange
  • Each mounting hole 25 has a shape that penetrates the upper housing 20 in the Z direction and allows a fastening member to be inserted.
  • the mounting holes 25 are arranged at both ends in the X direction of the upper housing 20 so as to coincide with the mounting holes 13 of the lower housing 10 when the upper housing 20 is fixed to the lower housing 10 (in FIG. Only).
  • a plurality of storage portions 28 are provided on the bottom surface of the upper housing 20 for storing a second contact 47 of the probe pin 3 to be described later so as to be able to reciprocate.
  • Each storage portion 28 corresponds to each of the plurality of holding portions 11, and when the upper housing 20 is fixed to the lower housing 10, the holding portion communicates with the corresponding holding portion 11 and is adjacent to the Y direction. It is arranged to have an opening 281 on the 11th side. Further, each storage portion 28 is provided such that the width in the Y direction is smaller than the length in the Y direction of the holding groove portion 112 of the holding portion 11.
  • the storage and holding section 4 includes a storage section 28 provided with an opening 281 that allows the second contact 47 to contact a terminal of an object to be inspected inserted into the inspection section 23, and a first contact 34 exposed to the outside. And a through-hole 111 that can contact a terminal of a board attached to the housing 2.
  • Each probe pin 3 includes a first plunger 30, a second plunger 40, and a coil spring 50, as shown in FIGS.
  • Each of the first and second plungers 30 and 40 has conductivity, and is formed by, for example, an electroforming method.
  • the first plunger 30 is inserted from one end of the coil spring 50 along the center line CL1 extending in the Z direction of the coil spring 50 and extends into the coil spring 50.
  • the second plunger 40 is inserted along the center line CL ⁇ b> 1 (shown in FIG. 5) from the other end of the coil spring 50 so that its plate surface is orthogonal to the plate surface of the first plunger 30. It extends to.
  • the 1st plunger 30 and the 2nd plunger 40 are mutually connected inside the coil spring 50 via the 1st insertion part 31 and the 2nd insertion part 41 which are mentioned later.
  • the surface orthogonal to the plate thickness direction (X direction) of the 1st plunger 30 be a plate surface
  • the surface orthogonal to the plate thickness direction (Y direction) of the 2nd plunger 40 be a plate surface.
  • board thickness direction orthogonal to a plate surface be a side surface.
  • the first plunger 30 has a substantially rectangular plate shape with substantially the same thickness and symmetrical in the width direction (Y direction).
  • the first plunger 30 includes a first insertion portion 31 disposed inside the coil spring 50 and a first contact portion 32 that is integrally formed with the first insertion portion 31 and exposed to the outside of the coil spring 50. Has been.
  • the first insertion portion 31 has a guide groove 33 penetrating the first insertion portion 31 on the tip side (the upper side in FIG. 6) of the plate surface.
  • the guide groove 33 has a rectangular shape extending in the longitudinal direction (vertical direction in FIG. 6) of the first insertion portion 31 and has a width larger than the plate thickness of the second plunger 40.
  • 1st contact part 32 has the 1st contact 34 provided in the front-end
  • the first contact 34 has an arc shape when viewed from the plate.
  • a pair of first support portions 35 are provided at a boundary portion between the first contact portion 32 and the first insertion portion 31.
  • Each first support portion 35 is provided so as to protrude from both side surfaces of the first contact portion 32, and extends in a direction orthogonal to the center line CL1.
  • Each of the first support portions 35 has a distance between the tips thereof larger than the inner diameter of the coil spring 50, and comes into contact with the lower end portion of the coil spring 50 in the Z direction so as to prevent the coil spring 50 from coming off. ing.
  • center line of the first plunger 30 coincides with the center line CL 1 of the coil spring 50.
  • the second plunger 40 has substantially the same plate thickness, a second insertion portion 41 disposed inside the coil spring 50, a single molding with the second insertion portion 41, and a coil The second contact portion 42 is exposed to the outside of the spring 50.
  • the second insertion portion 41 includes a first elastic piece 43 and a second elastic piece 44 that extend along the center line CL1.
  • Each of the first elastic piece 43 and the second elastic piece 44 is disposed substantially parallel to each other with an interval larger than the plate thickness of the first plunger 30.
  • the first elastic piece 43 and the second elastic piece 44 have different lengths, and are provided so that the first elastic piece 43 is shorter than the second elastic piece 44.
  • a guide protrusion 431 is provided so as to protrude from the tip of the inner surface of the first elastic piece 43 facing the second elastic piece 44.
  • the guide protrusion 431 is configured to be engageable with the guide groove 33 of the first insertion portion 31 of the first plunger 30.
  • a contact protrusion 441 is provided so as to protrude from the tip of the inner surface of the second elastic piece 44 facing the first elastic piece 43.
  • the first elastic piece 43 and the second elastic piece 44 are such that the contact protrusion 441 of the second elastic piece 44 is the first in a state where the guide protrusion 431 of the first elastic piece 43 is engaged with the guide groove 33 of the first plunger 30.
  • the plunger 30 is configured to be able to contact the plate surface between the guide groove 33 of the plunger 30 and the first support portion 35.
  • the second contact portion 42 includes a second support portion 45 to which the second insertion portion 41 is connected and an elastic portion 46 that protrudes upward from the second support portion 45 in the Z direction.
  • the second support portion 45 has a rectangular flat plate shape, is provided at a boundary portion between the second contact portion 42 and the second insertion portion 41, and extends in the X direction (a direction orthogonal to the center line CL1).
  • the second support portion 45 has a distance L1 between both ends 451 and 452 larger than the inner diameter of the coil spring 50, and contacts the upper end portion in the Z direction of the coil spring 50 to prevent the coil spring 50 from coming off. It is like that.
  • the second support portion 45 is provided such that a distance L2 from the center line CL1 to the left end 452 in the X direction is larger than a distance L1 from the center line CL1 to the right end 451 in the X direction. ing.
  • the elastic portion 46 includes three continuous straight portions 461, 462, and 463 arranged at different angles with respect to the center line CL1.
  • the first straight portion 461 extends from the second support portion 45 along the center line CL1.
  • the second straight portion 461 is continuous with the upper end in the Z direction of the first straight portion 461 and extends so as to form an acute angle with the first straight portion 461.
  • the third straight portion 463 is continuous with the lower end of the second straight portion 462 in the Z direction, and extends so as to form an obtuse angle with the second straight portion 462.
  • the connecting portions of the straight portions 461, 462, and 463 are curved, and the connecting portion of the second straight portion 462 and the third straight portion 463 constitutes the second contact 47.
  • the second contact 47 has a distance L3 from the center line CL1 larger than a distance L2 from the center line CL1 to the right end 451 in the X direction of the second support portion 45. Is arranged.
  • the first insertion portion 31 of the first plunger 30 and the second insertion portion 41 of the second plunger 40 are such that the guide protrusion 431 of the first elastic piece 43 of the second plunger 40 is the first
  • the sliding movement is possible in a state where the contact protrusion 441 of the second elastic piece 44 of the second plunger 40 is in contact with the plate surface of the first insertion portion 31 of the first plunger 30 while engaging with the guide groove 33 of the plunger 30. It is connected to.
  • the coil spring 50 is made of, for example, carbon steel or stainless steel, and is formed to expand and contract along the center line CL1 (shown in FIG. 5).
  • the coil spring 50 has an inner diameter into which the first insertion portion 31 of the first plunger 30 and the second insertion portion 41 of the second plunger 40 can be inserted. Further, as shown in FIG. 2, the coil spring 50 has an outer diameter that can be inserted into the through-hole 111 of the holding portion 11 of the lower housing 10.
  • both ends of the coil spring 50 are connected to the first support portion 35 of the first plunger 30 and the second plunger 30.
  • the spring length is adjusted so that the plunger 40 is held off by the second support portion 45 of the plunger 40 and is always compressed.
  • the probe pin 3 is assembled. First, the first insertion portion 31 of the first plunger 30 is inserted from one end side of the coil spring 50 along the center line CL1, while the second plunger 40 of the second plunger 40 is inserted from the other end side of the coil spring 50 along the center line CL1. 2 Insert the insertion part 41. At this time, each of the first plunger 30 and the second plunger 40 is inserted so that the plate surfaces are orthogonal to each other.
  • each probe pin 3 When the assembly of each probe pin 3 is completed, each probe pin 3 is assembled to the holding portion 11 of the lower housing 10. At this time, as shown in FIG. 2, each probe pin 3 inserts the first plunger 30 into the corresponding through hole 111 of the holding portion 11 from the upper side in the Z direction and inserts the second support portion 45 into the holding groove portion 112. To do. Thereby, each probe pin 3 has a part of the first contact portion 32 including the first contact 34 exposed at the lower side of the lower housing 10 in the Z direction, and the second contact portion 42 including the second contact 47. Is held by the lower housing 10 in a state where a part of the upper portion is exposed above the lower housing 10 in the Z direction.
  • the upper housing 20 After assembling the probe pins 3 to all the holding parts 11, the upper housing 20 is attached from the upper side of the lower housing 10 in the Z direction. At this time, each of the second contact portions 42 exposed on the upper side in the Z direction of the lower housing 10 is accommodated in the corresponding accommodating portion 28 on the bottom surface of the upper housing 20, and the second contact 47 is in the inspection portion 23. Be placed. Moreover, as shown in FIG. 2, each 2nd support part 45 is clamped by the lower housing 10 and the upper housing 20, and each probe pin 3 is fixed.
  • the fastening members 106 are respectively inserted into the respective mounting holes 13 of the lower housing 10 and the corresponding mounting holes 25 of the upper housing 20 to fix the inspection jig 1 to the substrate 100.
  • the inspection jig 1 is fixed so that the first contact 34 of each probe pin 3 and the terminal 105 of the substrate 100 are in contact with each other, as shown in FIG.
  • the assembly process of the inspection jig 1 is completed.
  • the inspection jig 1 assembled in this way is used for continuity inspection of the device 200 as an example of an inspection object having electrodes on both sides such as a double-sided substrate.
  • This continuity test is performed by inserting the device 200 into the test section 23 as shown in FIG. At this time, in the device 200, both ends in the X direction are held by the support portions 21 and 22, respectively, and as shown in FIG.
  • the probe pin 3 is inserted into the inspection unit 23 so as to be in contact with the second contact 47 of the probe pin 3.
  • the first contact 34 that can reciprocate along the center line CL1 of the coil spring 50 and the reciprocation in a direction orthogonal to the direction that intersects the center line CL1 of the coil spring 50 are possible.
  • a second contact 47 for this reason, for example, the terminal of the object to be inspected cannot be arranged on the same straight line as the terminal of the inspection device, and the terminal of the object to be inspected unless one contact is reciprocated in a direction intersecting the center line of the coil spring Even if it is not possible to contact the terminal of the inspection apparatus at the same time, the terminal of the inspection object and the terminal of the inspection apparatus can be contacted at the same time.
  • the reciprocating movement of the second contact 47 of the second plunger 40 is performed by the elastic force of the elastic portion 46. For this reason, since the 2nd contact 47 can be reciprocated without using other elastic members, such as a coil spring, a number of parts decreases and manufacturing cost can be reduced.
  • the inspection jig 1 since the inspection jig 1 includes the probe pin 3 of the first embodiment, it can cope with the complexity and diversification of the inspection object.
  • the probe pin 3 can be easily attached and detached. For this reason, even if one of the plurality of probe pins 3 is broken, only the broken probe pin 3 can be easily replaced.
  • FIG. 9 is a perspective view showing the probe pin 103 of the second embodiment.
  • the same parts as those in the first embodiment are denoted by the same reference numerals, and the description thereof is omitted. Differences from the first embodiment will be described.
  • the probe pin 103 of the second embodiment is different from the probe pin 3 of the first embodiment in that an elastic portion 146 having a wave shape is provided on the second plunger 40.
  • the elastic portion 146 is provided with a through hole 147 that penetrates the elastic portion 146 in the thickness direction. Thereby, the restoring force of the second contact 47 can be adjusted.
  • the elastic portion of the second plunger 40 can adopt any shape and structure as long as the second contact 47 can reciprocate in the direction intersecting the center line CL1 of the coil spring 50. That is, the second contact 47 is not limited to the case where the second contact 47 can be reciprocated in a direction orthogonal to the center line CL1 of the coil spring 50. It may be provided so as to be capable of reciprocating in the direction.
  • the probe pin 3 of the first embodiment and the probe pin 103 of the second embodiment are not limited to the inspection jig 1 used for the continuity inspection of the device 200 as shown in FIG.
  • the inspection jig 1 used for the continuity inspection of the device 200 as shown in FIG.
  • it can also be used for an inspection jig 101 used for continuity inspection of the LED element 210.
  • 10 to 13 show the probe pin 3 of the first embodiment.
  • the inspection jig 101 includes a substantially rectangular parallelepiped housing 102 composed of a lower housing 110 and an upper housing 120, and four probe pins 3 housed in the housing 102. I have.
  • the lower housing 110 has four holding portions 11 and attachment holes 13 provided at each corner.
  • Each holding portion 11 has a through hole 111 that penetrates the lower housing 110 in the Z direction, and a holding groove portion 112 that communicates with the through hole 111 and extends on the upper surface of the lower housing 110 along the Y direction. It consists of and.
  • the holding portions 11 are arranged at equal intervals on the upper surface of the lower housing 110 so as to form two parallel rows extending along the X direction. Further, as shown in FIG. 11, the two rows of each holding portion 11 are arranged at an interval in the Y direction so that the second contacts 47 of the probe pins 3 face each other.
  • the upper housing 120 has an inspection part (inspection concave part) 23 provided in the center part and mounting holes 25 provided in each corner part.
  • the continuity inspection of the inspection jig 101 is performed by fixing the inspection jig 101 on the substrate 100 and inserting the LED element 210 into the inspection section 23 as shown in FIG. At this time, although not shown, the LED element 210 is inserted into the inspection unit 23 so that the terminals provided on the pair of opposed surfaces come into contact with the second contact 47 of the probe pin 3.
  • the shape of the first contact 34 of the first plunger 30 is not limited to an arc shape, and can be selected as appropriate according to the design of the probe pin, such as a triangle or a quadrangle.
  • the guide protrusion 431 of the first elastic piece 43 of the second plunger 40 may be any one that can be inserted and fitted into the guide groove 33 of the first plunger 30 and can be slidably moved in the guide groove 33.
  • the shape, size, etc. Can be selected as appropriate.
  • the second support portion 45 of the second plunger 40 only needs to be able to support the coil spring 50 and be sandwiched between the lower housing 10 and the upper housing 20, and the shape, size, and the like can be selected as appropriate. .
  • the shape and size of the holding portion 11 of the lower housing 10 can be appropriately selected according to the probe pin used.
  • the plate thickness of the first and second plungers 30 and 40 is not limited to the same, and may have different plate thickness depending on the part.
  • the first and second plungers 30 and 40 can be subjected to surface treatment such as plating and coating according to the design.
  • the first and second plungers 30 and 40 are not limited to electroforming, and any manufacturing method can be adopted if possible.
  • the guide groove 33 is provided in the first plunger 30 and the first and second elastic pieces 43 and 44 are provided in the second plunger 40, the present invention is not limited thereto.
  • the first plunger may be provided with first and second elastic pieces
  • the second plunger may be provided with a guide groove.
  • the first and second plungers 30 and 40 may adopt any configuration as long as they can be connected to each other so as to be slidable and conductive when inserted from both ends of the coil spring 50.
  • the probe pin of the first aspect of the present invention is A coil spring that expands and contracts along the center line; A conductive first plunger inserted from one end of the coil spring along the center line into the coil spring; A conductive second plunger inserted into the coil spring from the other end of the coil spring along the center line;
  • the first plunger comprises: A first insertion portion inserted into the coil spring; A first contact portion provided with a first contact that is continuous with the first insertion portion and is capable of reciprocating along the center line; A first support portion provided at a boundary portion between the first contact portion and the first insertion portion, extending in a direction intersecting the center line, and supporting the coil spring;
  • the second plunger comprises: A second insertion part that is inserted into the coil spring and is slidably connected to the first insertion part; A second contact portion provided with a second contact capable of reciprocating in a direction crossing the center line; A second support portion provided at a boundary portion of the second contact portion with the second insertion portion, extending in a direction intersecting the center
  • the probe pin of the first aspect is A coil spring that expands and contracts along the center line; A conductive first plunger extending from one end of the coil spring along the center line into the coil spring; A conductive second plunger extending from the other end of the coil spring along the center line into the coil spring;
  • the first plunger comprises: A first insertion portion disposed inside the coil spring; A first contact portion that is exposed to the outside of the coil spring and provided with a first contact that can reciprocate along the center line; A first support provided at a boundary portion between the first contact portion and the first insertion portion, extending in a direction intersecting the center line, and contacting one end of the coil spring to prevent the coil spring from coming off.
  • the second plunger comprises: A second insertion part arranged inside the coil spring and slidably connected to the first insertion part; A second contact portion that is exposed to the outside of the coil spring and provided with a second contact that can reciprocate in a direction intersecting the center line; A second portion provided at a boundary portion between the second contact portion and the second insertion portion, extending in a direction intersecting the center line, and contacting the other end of the coil spring to prevent the coil spring from coming off; A support part; Have
  • the first contact that can reciprocate along the center line of the coil spring and the second contact that can reciprocate in the direction intersecting the center line of the coil spring are provided.
  • the terminal of the object to be inspected cannot be arranged on the same straight line as the terminal of the inspection device, and the terminal of the object to be inspected unless one contact is reciprocated in a direction intersecting the center line of the coil spring. Even if it is not possible to contact the terminal of the inspection apparatus at the same time, the terminal of the inspection object and the terminal of the inspection apparatus can be contacted at the same time.
  • the second contact portion includes an elastic portion that urges the second contact in a direction intersecting the center line so that the second contact portion returns to a natural state in which no load is applied.
  • the second contact is reciprocated by force.
  • the reciprocating movement of the second contact is performed by the elastic force of the elastic portion. For this reason, since the 2nd contact can be reciprocated without using other elastic members, such as a coil spring, the number of parts decreases and manufacturing cost can be reduced.
  • the inspection jig of the third aspect of the present invention is An inspection jig for performing a continuity test between terminals provided on a pair of opposing surfaces of an object to be inspected and terminals provided on a substrate, A housing having an inspection part into which the inspection object can be inserted; When the inspection object is inserted into the inspection portion, the second contact contacts the terminal of the inspection object, and when the housing is mounted on the substrate, the first contact is made to the terminal of the substrate.
  • the inspection jig of the third aspect is An inspection jig for performing a continuity test between terminals provided on a pair of opposing surfaces of an object to be inspected and terminals provided on a substrate,
  • the probe pin ;
  • a housing having an inspection part into which the inspection object can be inserted, and a holding part for receiving and holding the probe pin;
  • the housing holding portion includes a housing portion provided with an opening that can contact the terminal of the object to be inspected, the second contact being inserted into the inspection portion, and the first contact exposed to the outside is the housing. And a through hole that can contact the terminal of the board attached to the board.
  • the probe pin is provided, it is possible to cope with the complexity and diversification of the inspection object.
  • the inspection jig of the fourth aspect of the present invention is The housing comprises: A first housing holding the probe pin such that at least a part of the first and second contact portions are exposed; The inspection unit and the storage unit that is connected to the first housing and communicates with the inspection unit and stores the second contact unit so that the second contact can reciprocate. A second housing; Have A second support portion of the probe pin is sandwiched between the first and second housings.
  • the inspection jig of the fourth aspect is The housing comprises: A first through hole that holds the probe pin therein so that at least a part of the first contact portion and the second contact portion are exposed; and a holding groove portion into which the second support portion of the probe pin is inserted.
  • the probe pin can be easily attached and detached. For this reason, even if one of the plurality of probe pins is broken, only the broken probe pin can be easily replaced.
  • the probe pin and the inspection jig according to the present invention are not limited to the above-described embodiment, and can be applied to inspection units such as other semiconductor integrated circuits and semiconductor devices.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

L'invention concerne une broche de sonde qui comprend un ressort hélicoïdal (50), un premier piston (30), et un second piston (40). Le premier piston (30) comprend : une première pièce d'insertion (31) positionnée à l'intérieur du ressort hélicoïdal (50) ; et une première partie de contact (32) qui est visible à l'extérieur du ressort hélicoïdal, et qui est pourvue d'un premier point de contact (34) susceptible de se déplacer avec un mouvement de va-et-vient le long d'une ligne centrale. Le second piston (40) comprend : une seconde partie d'insertion (41) qui est positionnée à l'intérieur du ressort hélicoïdal (50) et qui est reliée de façon coulissante à la première partie d'insertion (31) ; et une seconde partie de contact (42) qui est visible à l'extérieur du ressort hélicoïdal, et qui est pourvue d'un second point de contact (47) susceptible de se déplacer avec un mouvement de va-et-vient dans une direction croisant la ligne centrale.
PCT/JP2016/076460 2015-09-15 2016-09-08 Broche de sonde et outil d'inspection comprenant celle-ci WO2017047495A1 (fr)

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10312616B2 (en) * 2017-07-14 2019-06-04 Molex, Llc Card edge connector
JP6881343B2 (ja) * 2018-02-07 2021-06-02 オムロン株式会社 プローブピン、検査治具、検査ユニットおよび検査装置
CN112005448B (zh) * 2018-05-22 2022-09-23 欧姆龙株式会社 探针销
JP2020034352A (ja) * 2018-08-28 2020-03-05 オムロン株式会社 プローブピン用ハウジング、検査治具、検査ユニットおよび検査装置
JP2022135106A (ja) * 2021-03-04 2022-09-15 オムロン株式会社 プローブピン、検査治具および検査治具ユニット

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325306A (ja) * 2003-04-25 2004-11-18 Yokowo Co Ltd 検査用同軸プローブおよびそれを用いた検査ユニット
JP2013511039A (ja) * 2009-11-11 2013-03-28 ハイコン カンパニー リミテッド バネコンタクト及びバネコンタクト内蔵ソケット

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4047456B2 (ja) * 1998-05-29 2008-02-13 日置電機株式会社 回路基板検査装置
JP4276163B2 (ja) * 2004-11-12 2009-06-10 サンコール株式会社 Ｉｃソケット
JP2006234428A (ja) * 2005-02-22 2006-09-07 Omron Corp コンタクトプローブおよび検査装置
JP2009128211A (ja) * 2007-11-26 2009-06-11 Sensata Technologies Inc プローブピン
JP5629611B2 (ja) * 2011-03-01 2014-11-26 株式会社日本マイクロニクス 接触子及び電気的接続装置
JPWO2013061486A1 (ja) * 2011-10-26 2015-04-02 ユニテクノ株式会社 コンタクトプローブおよびそれを備えた検査ソケット
JP2015152380A (ja) * 2014-02-13 2015-08-24 日置電機株式会社 基板検査装置および基板検査方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325306A (ja) * 2003-04-25 2004-11-18 Yokowo Co Ltd 検査用同軸プローブおよびそれを用いた検査ユニット
JP2013511039A (ja) * 2009-11-11 2013-03-28 ハイコン カンパニー リミテッド バネコンタクト及びバネコンタクト内蔵ソケット

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