WO2016084841A1 - 電子部品収納用パッケージ、多数個取り配線基板および電子部品収納用パッケージの製造方法 - Google Patents
電子部品収納用パッケージ、多数個取り配線基板および電子部品収納用パッケージの製造方法 Download PDFInfo
- Publication number
- WO2016084841A1 WO2016084841A1 PCT/JP2015/083059 JP2015083059W WO2016084841A1 WO 2016084841 A1 WO2016084841 A1 WO 2016084841A1 JP 2015083059 W JP2015083059 W JP 2015083059W WO 2016084841 A1 WO2016084841 A1 WO 2016084841A1
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- Prior art keywords
- frame
- electronic component
- metallized layer
- metal frame
- peripheral side
- Prior art date
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- 238000004519 manufacturing process Methods 0.000 title claims description 19
- 229910052751 metal Inorganic materials 0.000 claims abstract description 179
- 239000002184 metal Substances 0.000 claims abstract description 179
- 239000000463 material Substances 0.000 claims abstract description 100
- 238000005219 brazing Methods 0.000 claims abstract description 95
- 230000002093 peripheral effect Effects 0.000 claims abstract description 84
- 239000000758 substrate Substances 0.000 claims description 104
- 238000003860 storage Methods 0.000 claims description 82
- 238000000034 method Methods 0.000 claims description 30
- 238000005304 joining Methods 0.000 claims description 23
- 239000000945 filler Substances 0.000 claims description 16
- 238000001465 metallisation Methods 0.000 claims description 14
- 230000008569 process Effects 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 230000004308 accommodation Effects 0.000 claims 1
- 239000010410 layer Substances 0.000 description 206
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 41
- 238000007747 plating Methods 0.000 description 28
- 239000004020 conductor Substances 0.000 description 25
- 239000000919 ceramic Substances 0.000 description 21
- 229910052759 nickel Inorganic materials 0.000 description 21
- 238000012545 processing Methods 0.000 description 16
- 238000010304 firing Methods 0.000 description 12
- 238000007650 screen-printing Methods 0.000 description 8
- 238000012546 transfer Methods 0.000 description 8
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 6
- 229910052737 gold Inorganic materials 0.000 description 6
- 239000010931 gold Substances 0.000 description 6
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 5
- 238000003825 pressing Methods 0.000 description 5
- 238000004080 punching Methods 0.000 description 5
- 239000011230 binding agent Substances 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000011572 manganese Substances 0.000 description 4
- 229910052750 molybdenum Inorganic materials 0.000 description 4
- 239000011733 molybdenum Substances 0.000 description 4
- 238000007789 sealing Methods 0.000 description 4
- 238000005245 sintering Methods 0.000 description 4
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 230000009471 action Effects 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 239000002241 glass-ceramic Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000000155 melt Substances 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 239000003960 organic solvent Substances 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 238000002679 ablation Methods 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 description 2
- 229910052863 mullite Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000011218 segmentation Effects 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 238000010897 surface acoustic wave method Methods 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 238000009736 wetting Methods 0.000 description 2
- 229910000531 Co alloy Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- KGWWEXORQXHJJQ-UHFFFAOYSA-N [Fe].[Co].[Ni] Chemical compound [Fe].[Co].[Ni] KGWWEXORQXHJJQ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 230000009194 climbing Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K5/00—Casings, cabinets or drawers for electric apparatus
- H05K5/06—Hermetically-sealed casings
- H05K5/066—Hermetically-sealed casings sealed by fusion of the joining parts without bringing material; sealed by brazing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4817—Conductive parts for containers, e.g. caps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
- H01L23/057—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body the leads being parallel to the base
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/10—Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/564—Details not otherwise provided for, e.g. protection against moisture
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02937—Means for compensation or elimination of undesirable effects of chemical damage, e.g. corrosion
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1007—Mounting in enclosures for bulk acoustic wave [BAW] devices
- H03H9/1014—Mounting in enclosures for bulk acoustic wave [BAW] devices the enclosure being defined by a frame built on a substrate and a cap, the frame having no mechanical contact with the BAW device
- H03H9/1021—Mounting in enclosures for bulk acoustic wave [BAW] devices the enclosure being defined by a frame built on a substrate and a cap, the frame having no mechanical contact with the BAW device the BAW device being of the cantilever type
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1071—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a frame built on a substrate and a cap, the frame having no mechanical contact with the SAW device
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/19—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator consisting of quartz
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0044—Mechanical working of the substrate, e.g. drilling or punching
- H05K3/0052—Depaneling, i.e. dividing a panel into circuit boards; Working of the edges of circuit boards
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/163—Connection portion, e.g. seal
- H01L2924/16315—Shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/171—Frame
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/171—Frame
- H01L2924/173—Connection portion, e.g. seal
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
- H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
- H03B5/326—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator the resonator being an acoustic wave device, e.g. SAW or BAW device
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10083—Electromechanical or electro-acoustic component, e.g. microphone
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10424—Frame holders
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/10—Using electric, magnetic and electromagnetic fields; Using laser light
- H05K2203/107—Using laser light
Definitions
- the present invention relates to an electronic component storage package on which electronic components are mounted, a multi-piece wiring substrate in which a plurality of wiring substrate regions serving as electronic component storage packages are arranged vertically and horizontally, and a method for manufacturing the electronic component storage package. It is.
- packages used to store electronic components such as semiconductor devices and surface acoustic wave devices are sintered ceramics such as aluminum oxide sintered bodies and glass ceramic sintered bodies.
- An insulating substrate made of a body has a concave mounting portion for accommodating electronic components.
- the insulating substrate generally has a square flat plate-like base portion and a square frame-like frame portion laminated on the upper surface of the base portion so as to surround the mounting portion.
- a metal frame also referred to as a seal ring
- a brazing material is joined to the upper surface of the frame portion via a frame-like metallized layer and a brazing material.
- a concave mounting portion is formed by the upper surface of the base portion and the inner surface of the frame portion and the metal frame body.
- a lid made of metal is joined to the upper surface of the metal frame, and the mounting portion (electronic component mounted on the mounting portion) is hermetically sealed.
- Such a package is generally manufactured in the form of a so-called multi-cavity wiring board in which a plurality of packages are obtained simultaneously from a single large-area mother board.
- the multi-cavity wiring board for example, a plurality of wiring board regions, each of which is an individual package, are arranged vertically and horizontally on a mother board made of an aluminum oxide sintered body.
- a dividing groove is formed in the main surface such as the upper surface of the mother board along the boundary of the wiring board region. A bending stress is applied to the mother board across the dividing groove, and the mother board is broken to be divided into individual packages.
- the dividing grooves are formed, for example, by cutting at a predetermined depth on the upper and lower surfaces of an unfired mother board using a cutter blade or the like at the boundary between adjacent wiring board regions (Japanese Patent Laid-Open No. 2006-173287). See the official gazette).
- the thickness of the frame portion is reduced in accordance with the miniaturization of the wiring board, the reliability of the hermetic sealing with respect to the external environment of the mounting portion (electronic component) may be lowered. This is because the thickness (distance between the end on the mounting portion side and the end on the outer peripheral side along the joining surface) of the frame-like joining region between the metal frame and the upper surface (frame-like metallized layer) of the insulating substrate is small. It is to become.
- An electronic component storage package includes an insulating substrate having an upper surface including a mounting portion for an electronic component, a frame-like metallization layer formed on the upper surface of the insulating substrate so as to surround the mounting portion, A metal frame bonded to the frame-shaped metallized layer by a brazing material, the frame-shaped metallized layer includes a first inclined portion inclined inward from the upper surface to the inner peripheral side surface, A filler fillet is formed between the outer periphery of the upper surface of the frame-like metallized layer and the metal frame, and a filler filling portion between the first inclined portion and the metal frame.
- a plurality of wiring board regions to be the electronic component storage package described above are arranged on the mother board.
- a method for manufacturing an electronic component storage package comprising: a stacked body in which a plurality of wiring board regions having a mounting portion on an upper surface thereof are arranged vertically and horizontally; And a step of producing a connection substrate to be a mother substrate including a frame-shaped metallization layer provided in a convex shape on the upper side in a longitudinal section in the width direction, and a laser beam from the upper side of the frame-shaped metallization layer to the connection substrate And forming a first inclined portion inclined inward from the upper surface to the inner peripheral side surface, and an outer periphery of the upper surface of the frame-like metallized layer and a metal frame. Forming a filler fillet between the first inclined portion and the metal frame, and joining the metal frame to the frame-like metallized layer by the brazing material. And the wiring base And a step of dividing, along a region in the dividing groove.
- an insulating substrate having an upper surface including a mounting portion of the electronic component, a frame-shaped metallization layer formed on the upper surface of the insulating substrate so as to surround the mounting portion,
- a metal frame joined by a brazing material on the frame-like metallized layer, and the frame-like metallized layer includes a first inclined part inclined inward from the upper surface to the inner peripheral side surface. Since the filler fillet of the brazing material is formed between the outer periphery of the upper surface of the metallized layer and the metal frame, and the filler filling portion of the brazing material is formed between the first inclined portion and the metal frame, the fillet and filler of the brazing material are formed.
- the metal frame is firmly bonded to the frame-like metallization layer from the outer peripheral side surface to the lower surface, and the airtightness is improved in the brazing structure of the metal frame even if the insulating substrate is downsized. ,powered by It can airtightness to provide an electronic component storing package with improved.
- the multi-cavity wiring board of one aspect of the present invention since a plurality of wiring board regions to be the electronic component storage package having the above-described configuration are arranged on the mother board, the airtightness of the mounting portion is improved. An electronic component storage package can be efficiently manufactured.
- a stacked body in which a plurality of wiring board regions having mounting portions on the top surface are arranged vertically and horizontally, and a boundary between the wiring substrate regions on the top surface of the stacked body
- forming a dividing groove on the upper surface of the laminate and forming a first inclined portion inclined inward from the upper surface to the inner peripheral side surface, and between the upper surface outer periphery of the frame-shaped metallized layer and the metal frame Forming a filler filling portion between the fillet and first inclined portion of the brazing material and the metal frame, and joining the metal frame to the frame-like metallized layer with the brazing material; And dividing along the line Therefore,
- (A) is a top view showing the electronic component storage package of the embodiment of the present invention
- (b) is a cross-sectional view taken along line X-X ′ of (a). It is a top view which expands and shows a part of multi-piece wiring board of embodiment of this invention. It is sectional drawing to which the principal part in the electronic component storage package of embodiment of this invention was expanded. It is sectional drawing which shows the modification of FIG. It is sectional drawing to which the principal part in the other example of the electronic component storage package of embodiment of this invention was expanded. It is sectional drawing to which the principal part in the other example of the electronic component storage package of embodiment of this invention was expanded. It is sectional drawing which the principal part in the other example of the electronic component storage package of embodiment of this invention was expanded. It is sectional drawing which shows the modification of FIG. (A) is a top view showing a modification of FIG. 6, and (b) is a cross-sectional view taken along line Y-Y ′.
- (A)-(d) is sectional
- FIG. 1A is a top view showing an electronic component storage package according to an embodiment of the present invention
- FIG. 1B is a cross-sectional view taken along the line X-X ′ of FIG.
- FIG. 2 is an enlarged top view showing a part of the multi-piece wiring board according to the embodiment of the present invention.
- FIG. 3 is a cross-sectional view showing a main part of the electronic component storage package shown in FIG.
- FIG. 4 is a cross-sectional view showing a modification of FIG. 9A to 9D are cross-sectional views schematically showing the method for manufacturing the electronic component storage package shown in FIG. 1 in the order of steps.
- the insulating substrate 101 included in the electronic component storage package has an upper surface including a concave mounting portion 102, and the electronic component 103 is accommodated in the mounting portion 102.
- the insulating substrate 101 includes a base portion 104 and a frame portion 105 stacked on the base portion 104.
- a frame-like metallized layer 106 is provided on the upper surface of the frame part 105, and a metal frame 108 is joined to the frame-like metallized layer 106 by a brazing material 107.
- the frame-like metallized layer 106 has a first inclined portion 106a from the upper surface to the inner peripheral side surface.
- the second inclined portion 106b is provided on the outer surface, and the frame portion 105 is connected to the second inclined portion 106b and has the third inclined portion 110 on the outer peripheral side surface.
- the electronic component storage package includes a wiring conductor 111 and an external connection conductor 112.
- the electronic device 103 is formed by bonding the electronic component 103 to the electronic component storage package with the bonding material 113 or the like.
- the electronic component storage package and the electronic device include a castellation 114 at the corner of the insulating substrate 101, a lid 115 for sealing the mounting portion 102, and an exposed surface of the metal frame 108.
- the first nickel plating layer 116 and the second nickel plating layer 117 are included. 4 and 7 to be described later, a structure in which a frame-like metallized layer 106 is formed on a flat insulating substrate 101 having no frame portion may be used.
- the electronic component storage package shown in FIG. 1 may be manufactured as a multi-piece wiring substrate in which a plurality of regions (wiring substrate regions) each serving as an electronic component storage package are arranged on a mother substrate, for example.
- the principal part in an example of this multi-piece wiring board is shown in FIG.
- a laser beam 118 hereinafter simply referred to as a laser
- 118 is irradiated onto the boundary 119 of the wiring board region to form the dividing groove 120.
- the electronic component storage package includes an insulating substrate 101 in which a frame portion 105 is laminated on the upper surface of a rectangular flat plate-like base portion 104.
- a frame-like metallized layer 106 is formed on the frame portion 105.
- a metal frame 108 is bonded onto the frame-like metallized layer 106, and a wiring conductor 111 having a predetermined pattern is provided on the inside or the surface of the insulating substrate 101 as necessary, so that an electronic component storage package is basically configured. Has been.
- the insulating substrate 101 is a ceramic sintered body such as an aluminum oxide sintered body, a glass ceramic sintered body, an aluminum nitride sintered body, a silicon carbide sintered body, a silicon nitride sintered body, or a mullite sintered body. Formed by the body.
- the insulating substrate 101 is produced by laminating a plurality of ceramic insulating layers and integrally firing the laminated body. That is, if the insulating substrate 101 is made of an aluminum oxide sintered body, it is manufactured as follows. First, a plurality of ceramic green sheets are produced by adding a suitable organic solvent and a binder to a raw material powder containing a glass component such as aluminum oxide and silicon oxide and forming into a sheet shape. Next, a part of this is punched and formed into a frame shape, and then a frame-shaped ceramic green sheet is laminated on a flat ceramic green sheet that has not been punched.
- an insulating substrate 101 in which a plurality of ceramic insulating layers (no symbol as ceramic insulating layers) is stacked can be manufactured.
- the punched ceramic green sheet becomes the frame portion 105
- the ceramic green sheet not punched becomes the base portion 104.
- the insulating substrate 101 constituting the electronic component storage package has a mounting portion 102 (concave portion) for the electronic component 103 at the center of the upper surface thereof.
- the base portion 104 and the frame portion 105 function as a container for protecting the electronic component 103 accommodated in the mounting portion 102.
- Examples of the electronic component 103 accommodated in the mounting unit 102 include various types of elements such as a piezoelectric vibrator such as a crystal vibrator, a surface acoustic wave element, a semiconductor element such as a semiconductor integrated circuit element (IC), a capacitive element, an inductor element, and a resistor. Can be mentioned.
- Such an electronic component storage package is, for example, when the electronic component 103 is a crystal resonator and when the electronic device is a crystal device, a communication device such as a mobile phone or a smart phone, a computer, an IC card It is used as a package for an oscillator that is a reference for frequency and time in electronic equipment such as information equipment. In this case, the electronic device is used as an oscillator.
- the electronic component housed in the mounting portion is electrically connected to the wiring conductor 111 by a bonding material 113 such as a conductive adhesive.
- the electronic component storage package may be a so-called multi-piece package that is divided into individual pieces.
- a plurality of wiring board regions (regions to be the insulating substrate 101) having the mounting portions 102 are arranged in a vertical and horizontal arrangement on a mother substrate in which a plurality of ceramic insulating layers are laminated.
- Divided grooves 120 are formed on the upper surface of the mother board along the boundary 119 of the wiring board region, so that, for example, a multi-piece wiring board as shown in FIG. 2 is basically constructed.
- Such a mother board is divided along the boundary 119 of the wiring board region, and for example, an electronic component storage package as shown in FIG. 1 is manufactured.
- dividing grooves 120 are formed on the upper surface and the lower surface of the mother substrate along the boundary 119 of the wiring substrate region.
- the mother board is divided into individual insulating boards 101 by applying stress to the mother board at the part where the dividing groove 120 is formed (border 119 of the wiring board region) and breaking the mother board in the thickness direction. become.
- a wiring conductor 111 is formed inside and on the surface of the insulating substrate 101 from the bottom surface of the mounting portion 102 to the lower surface of the insulating substrate 101.
- a portion formed on the lower surface of the insulating substrate 101 is, for example, the external connection conductor 112 located on the outer peripheral portion of the lower surface.
- the wiring conductors 111 those formed inside the insulating substrate 101 are in the form of through conductors (so-called via conductors) or internal wiring layers.
- the wiring conductor 111 is made of a metal material such as copper, silver, palladium, gold, platinum, tungsten, molybdenum, manganese, or an alloy containing them. If the wiring conductor 111 is made of, for example, molybdenum, which is a high melting point metal, a ceramic green sheet that forms an insulating substrate 101 using a metal paste (not shown) prepared by adding an organic solvent and a binder to molybdenum powder. It can be formed by coating in a predetermined pattern and firing simultaneously.
- a metallized conductor layer is formed on the outer peripheral portion of the upper surface of each wiring board region, which becomes the frame-like metallized layer 106 of the divided electronic component storage package.
- the outer periphery of the frame-like metallized layer 106 is in contact with the dividing groove 120.
- the frame-like metallized layer 106 is made of a metal such as tungsten or molybdenum.
- a metal paste prepared by adding an organic solvent, a binder, etc. to a molybdenum powder is used as a ceramic insulating layer (frame part 105). It can be formed by printing in a predetermined pattern on the upper surface of the green sheet. For example, the metal paste is formed by a screen printing method or the like so that the thickness of the fired frame-like metallized layer 106 is about 8 to 20 ⁇ m.
- a metal frame body 108 is further joined to the upper surface of the frame-like metallized layer 106 by a brazing material 107.
- the joining of the metal frames 108 may be performed in the state of a multi-piece wiring substrate or in the state of a package for storing electronic components (insulating substrate 101). When productivity is taken into consideration, the joining is performed in a multi-piece state. Then, as described later, a lid 115 made of metal is joined to the metal frame 108, and the mounting portion 102 is sealed.
- a nickel-plated layer (the nickel layer as a whole has no symbol) and a gold-plated layer (not shown) are sequentially deposited on the exposed surfaces of the frame-like metallized layer 106 and the metal frame 108. Yes. Note that the nickel plating layer on the wiring conductor 111 other than the frame-like metallized layer 106 is not shown.
- the electronic component storage package includes a first inclined portion 106a inclined inward from the upper surface of the frame-like metallized layer 106 to the inner peripheral side surface. Further, a fillet 107 a of the brazing material 107 is formed between the outer periphery of the upper surface of the frame-like metallized layer 106 and the metal frame 108, and a filling portion 107 b of the brazing material 107 is formed between the first inclined portion 106 a and the metal frame 108. ing. With such a structure, the metal frame 108 is firmly bonded to the frame-like metallized layer 106.
- the frame-shaped metallized layer 106 has a first inclined portion 106 a that is inclined inward from the upper surface to the inner peripheral side surface, and the brazing material 107 is interposed between the upper surface outer periphery of the frame-shaped metallized layer 106 and the outer peripheral side surface of the metal frame 108.
- the fillet 107a is formed, and the filler 107b of the brazing material 107 is formed between the first inclined portion 106a and the lower surface of the metal frame 108. Therefore, the metal frame 108 is firmly joined to the frame-like metallized layer 106 from the outer peripheral side surface to the lower surface by the fillet 107a and the filling portion 107b of the brazing material 107. Even if the insulating substrate 101 is downsized, the metal frame body In the brazing structure 108, the airtightness is improved, and the electronic component storage package in which the airtightness of the mounting portion 102 is improved can be provided.
- the formation of the first inclined portion 106a from the upper surface to the inner peripheral side surface of the frame-like metallized layer 106 may be performed as follows, for example. That is, in the form of a multi-cavity wiring substrate, a plurality of frame-like metallized layers 106 are formed for each wiring substrate region on the upper surface of a laminate (unfired) serving as a mother substrate. Then, the frame-like metallized layers 106 between the adjacent wiring board regions are formed in a state where they are connected to each other by a screen printing method (a state where the frame-like metallized layers 106 covering the frame part 105 are connected to each other on the left and right).
- the frame-like metallized layers 106 of the two wiring board regions connected to each other are arranged in the width direction (from the inner periphery of the mounting portion 102 of one wiring board region to the inner periphery of the mounting portion 102 of the other wiring board region.
- the surface is convex upward due to the surface tension of the metal paste that becomes the frame-like metallized layer 106.
- the protruding form of the convex portion can be appropriately adjusted depending on, for example, the viscosity of the metal paste used in the screen printing method. If necessary, the printing shape of the frame-like metallized layer 106 can be adjusted by adjusting the viscosity of the metallized paste and screen printing conditions.
- the protruding dimension at the center portion in the width direction is likely to be increased. That is, it becomes easier to increase the thickness of the frame-like metallized layer 106 on the outer peripheral side than on the mounting portion 102 side in accordance with downsizing.
- the laminated body as described above is irradiated with a laser 118 in a focused manner along the center in the width direction of the frame-like metallized layers 106 connected to each other (border 119 of the wiring board region), and the second inclined portion
- the dividing groove 120 including the 106b and the third inclined portion 110 is formed.
- a wiring board region having the first inclined portion 106a inclined inward from the upper surface to the inner peripheral side surface of the frame-like metallized layer 106 can be produced.
- the laminate in which the dividing grooves 120 are formed is integrally fired to become a mother substrate.
- the frame-like metallized layer 106 includes a second inclined portion 106b whose outer peripheral side surface is inclined outward from the upper end to the lower end. Further, the second inclined portion 106b of the frame-shaped metallized layer 106 is covered with a brazing material 107 that joins the frame-shaped metallized layer 106 and the metal frame 108. With such a structure, even if the insulating substrate 101 is reduced in size and the thickness of the frame portion 105 in the width direction is reduced, an electronic component housing package with good airtightness of the mounting portion 102 can be provided.
- the frame-shaped metallized layer 106 since the frame-shaped metallized layer 106 has the second inclined portion 106b on the outer peripheral side surface and the brazing material 107 covers the second inclined portion 106b, the frame-shaped metallized layer 106 is formed from the outer surface of the metal frame 108.
- a brazing material 107 is formed on the outer peripheral side surface in a wider range than before. Therefore, apparently, the width of the joining region (joining region in FIGS. 3 and 4) through the brazing material 107 between the frame-like metallized layer 106 and the metal frame 108 can be increased.
- the width of the joining region between the metal frame 108 and the frame-like metallized layer 106 (the distance along the joining interface between the inner periphery and the outer periphery of the joint surface between the metal frame 108 and the frame-like metallized layer 106). It can be made larger effectively than before. In other words, the length of the joint surface where gas may pass between the mounting portion 102 and the outside due to poor wetting of the brazing material 107 or the like can be made longer than before. Therefore, it is advantageous for improving the airtightness of the mounting portion 102, and it is possible to provide an electronic component storage package in which the airtightness of the mounting portion 102 is good.
- the formation of the second inclined portion 106b on the outer peripheral side surface of the frame-shaped metallized layer 106 and the formation of the third inclined portion 110 on the outer peripheral side surface of the insulating substrate 101 (upper end of the frame portion 105) are performed as follows, for example. That's fine. That is, when the electronic component storage package is manufactured in the form of a multi-piece wiring board as described above, the upper surface of the mother board in which a plurality of wiring board areas are arranged vertically and horizontally, along the boundary 119 of the wiring board area.
- the dividing groove 120 may be formed by the laser 118. Details of processing by the laser 118 will be described later (see FIG. 9).
- the frame-shaped metallized layer 106 and the dividing groove 120 having the inner surface inclined downward from the upper end side of the insulating substrate 101 are formed.
- the frame-like metallized layer 106 is provided across the wiring board regions adjacent to each other.
- a part of the frame-like metallized layer 106 is also located on the boundary 119 of the wiring board region (part where the dividing groove 120 is formed).
- the inclined inner surface corresponds to the second inclined portion 106b and the third inclined portion 110.
- the step of forming the dividing groove 120 by the laser 118 is a stage of a laminated body of a plurality of ceramic sheets, that is, an unfired laminated body that becomes a mother substrate.
- a UV laser, a green laser, an IR laser, or the like may be used as the type of laser.
- the output per unit area of the laser during laser processing (the unit area of the surface of the workpiece at the site irradiated with the laser) is relatively small, and the amount of melt generated is small accordingly.
- the frame-like metallized layer 106 sintered metal
- the dividing groove 120 may be formed on the lower surface at a position overlapping the dividing groove 120 on the upper surface in plan view. Thereby, the division
- the second inclined portion 106b of the frame-like metallized layer 106 is located on the outer periphery of the upper surface of the insulating substrate 101, and the outer peripheral side surface of the insulating substrate 101 is continuous with the second inclined portion 106b.
- FIG. In the case of such a structure, for example, in the form of a multi-piece wiring board, it becomes easy to secure a sufficient interval between the frame-like metallized layers 106 in the wiring board region adjacent to the mother board. Therefore, it is possible to suppress the frame-like metallized layers 106 and the like in adjacent wiring board regions from being connected by the brazing material 107.
- the wiring board region is reduced in size corresponding to the downsizing of the individual electronic component storage package, it can be favorably divided by breaking the mother board in the thickness direction. That is, it is possible to provide a multi-piece wiring board that is excellent in external dimension accuracy and easier to manufacture an electronic component storage package in which the mounting portion 102 has good airtightness.
- the dividing grooves 120 may be formed by performing laser processing under the same conditions as described above.
- the laser processing conditions include, for example, a pulse frequency of 100 to 1000 kHz, a pulse width of 50 ps or less, and an average output of 50 W, preferably about 20 W. Then, the optimum laser can be selected according to the pulse characteristics of each laser 118 and the workability of the workpiece.
- a laser 118 is irradiated from above the frame-like metallized layer 106 before firing the laminate, A method of forming a V-shaped dividing groove 120 at the boundary 119 may be mentioned.
- the second inclined portion 106b and the third inclined portion 110 that is continuous with the second inclined portion 106b can be simultaneously formed at the boundary 119 of the wiring substrate region (the region that becomes the outer peripheral side surface of the wiring substrate). Since the dividing groove 120 is formed on the mother substrate with high positional accuracy by laser processing, unlike a conventional machining method such as a cutter blade, surface processing with a fine shape in a minute range is possible. And productivity of an ultra-small electronic component storage package can be improved.
- each wiring board region in the mother board has a quadrangular shape with a side length of about 1.0 to 3.2 mm, for example.
- the outer periphery of each wiring board region corresponds to the boundary 119 of the wiring board region.
- Divided grooves 120 are formed at boundaries 119 of the plurality of wiring board regions on the upper surface of the mother board.
- the mother board is basically made of the same material as the insulating board 101 of the individual electronic component storage package. That is, the mother substrate is formed of a ceramic sintered body mainly composed of alumina, silicon nitride, aluminum nitride, silicon carbide, mullite, ferrite, glass ceramics or the like as described above. By using such a material, a plurality of ceramic insulating layers having a thickness of, for example, about 50 to 200 ⁇ m (not indicated as ceramic insulating layers) are stacked, and formed to have a thickness of, for example, 150 to 500 ⁇ m.
- the mother substrate contains at least one metal oxide selected from the group consisting of Mg, Mn, Co, Cr, Cu, Ni and Fe as a component for increasing the laser absorption rate. Is preferred.
- the mother substrate when the mother substrate is formed of a ceramic sintered body whose main component is alumina, it contains 92% by mass of Al 2 O 3 as a main component, and 3 SiO 2 as a sintering aid component.
- examples include those containing 3.5% by mass, 3.5% by mass of Mn 2 O 3 , 1% by mass of MgO and 0.5% by mass of MoO 3 .
- it contains 90.5% by mass of Al 2 O 3 as a main component, and further contains 1.5% by mass of SiO 2 , 2.5% by mass of Mn 2 O 3 , 1% by mass of MgO and 1% by mass of TiO 2 as sintering aid components. % And 3.5% by mass of CrO, respectively.
- Al 2 O 3 contains 93% by mass of Al 2 O 3 as a main component, and contains 2% by mass of SiO 2 , 3 % by mass of Mn 2 O 3 , 1% by mass of MgO and MoO 3 as a sintering aid component. 1% by mass, and those containing each.
- the outer peripheral side of the frame-like metallized layer 106 may be thicker than the mounting portion 102 side. In the case of such a structure, a sufficient thickness can be secured on the outer peripheral side of the frame-like metallized layer 106, and the metallized strength can be more effectively strengthened. Therefore, in this case, it is possible to provide an electronic component storage package in which peeling of the frame-like metallized layer 106 from the insulating substrate 101 is more effectively suppressed.
- the frame-like metallized layer 106 may be the same as the formation of the first inclined portion 106a. That is, in the form of a multi-cavity wiring substrate, a plurality of frame-like metallized layers 106 are formed for each wiring substrate region on the upper surface of a laminate (unfired) serving as a mother substrate. Then, the frame-like metallized layers 106 between the adjacent wiring board regions are formed in a state where they are connected to each other by a screen printing method (a state where the frame-like metallized layers 106 covering the frame part 105 are connected to each other on the left and right).
- a screen printing method a state where the frame-like metallized layers 106 covering the frame part 105 are connected to each other on the left and right.
- the frame-like metallized layers 106 of the two wiring board regions connected to each other are arranged in the width direction (from the inner periphery of the mounting portion 102 of one wiring board region to the inner periphery of the mounting portion 102 of the other wiring board region.
- the surface is convex upward due to the surface tension of the metal paste that becomes the frame-like metallized layer 106.
- the protruding form of the protruding portion can be appropriately adjusted depending on, for example, the viscosity of the metal paste used in the screen printing method. If necessary, the printing shape of the frame-like metallized layer 106 can be adjusted by adjusting the viscosity of the metallized paste and screen printing conditions.
- the protruding dimension at the center portion in the width direction is likely to be increased. That is, it becomes easier to increase the thickness of the frame-like metallized layer 106 on the outer peripheral side than on the mounting portion 102 side in accordance with downsizing.
- the thickness of the frame-like metallized layer 106 is set to be about 5 to 10 ⁇ m after firing in a relatively thin portion, for example.
- the thickness of the frame-shaped metallized layer 106 in a relatively thick region is about 10 to 20 ⁇ m.
- the laminated body as described above is irradiated with a laser 118 in a focused manner along the center in the width direction of the frame-like metallized layers 106 connected to each other (border 119 of the wiring board region), and the second inclined portion
- the dividing groove 120 including the 106b and the third inclined portion 110 is formed. In this way, it is possible to produce a wiring board region in which the frame-like metallized layer 106 is thicker on the outer peripheral side than the mounting portion 102 side.
- the laminate in which the dividing grooves 120 are formed is integrally fired to become a mother substrate.
- the plated layer of nickel or the like that covers the frame-like metallized layer 106 prevents oxidative corrosion of the exposed metal such as the frame-like metallized layer 106, and also improves wettability and strengthens the bonding force during brazing. It is formed.
- the plating layer preferably has a multi-layer structure in which, for example, a nickel plating layer is formed on the lower side and a gold plating layer is formed on the upper side.
- An example of the plating layer is as follows. That is, first, the first nickel plating layer 116 is deposited on the exposed surface such as the upper surface of the frame-like metallized layer 106 (the surface excluding the interface with the insulating substrate 101) in order to improve the bonding with the brazing material 107. . Next, after positioning the metal frame body 108 in which the brazing material 107 is integrated on the upper surface of the frame-like metallized layer 106 to which the first nickel plating layer 116 is applied, using a jig or the like, Is melted by heating in a reducing atmosphere to braze the frame-like metallized layer 106 and the metal frame 108.
- the second nickel plating is applied to the exposed surface of the metal portion after brazing (exposed surfaces of the frame-like metallized layer 106, the wiring conductor 111, the metal frame 108, etc.) in order to improve the corrosion resistance and the bonding property with the solder.
- Layer 117 and a gold plating layer are sequentially deposited.
- the first nickel plating layer 116 is formed with a thickness of about 0.1 to 0.5 ⁇ m
- the second nickel plating layer 117 is formed with a thickness of about 1.0 to 20 ⁇ m
- the gold plating layer is formed with a thickness of about 0.1 to 1.0 ⁇ m.
- the first nickel plating layer 116 is thin because the metal frame 108 covers the frame-like metallized layer 106, and the surface of each metal layer and the metal frame 108 exposed by the second nickel plating layer 117 is finally formed. This is because the thickness is sufficient to function as a base nickel plating layer for brazing.
- These plating layers can be formed by, for example, supplying a plating deposition current to a portion to be plated (such as the surface of the frame-like metallized layer 106) in a plating solution and performing electroplating.
- the brazing material 107 covers the second inclined portion 106b of the frame-like metallized layer 106.
- the brazing material 107 is also formed on the lower surface and the outer peripheral side surface of the metal frame 108. For this reason, the brazing material 107 is likely to creep up from the outer side surface of the second inclined portion 106b to the outer peripheral side surface of the metal frame body 108, and the brazing material 107 is wider in the joining region of the metal frame body 108 than in the past. Is formed.
- castellations 114 may be provided at the corners of the side surface of the insulating substrate 101.
- the castellation 114 functions as a space for arranging, for example, side conductors (so-called castellation conductors) (not shown).
- the width of the lower surface of the metal frame 108 is narrower than the width of the upper surface in a longitudinal sectional view, and the outer peripheral side surface of the metal frame 108 is inclined outward from the lower end to the upper end. .
- the inclination angle ⁇ 1 on the outer peripheral side surface of the metal frame 108 is, for example, 93 ° to 105 °). Due to such a structure, when the metal frame 108 is joined to the frame-like metallized layer 106 by the brazing material 107, the brazing material 107 is attached to the outer periphery of the metal frame 108 by the inclined portion of the metal frame 108. Climbing the side surface to the upper surface side is suppressed.
- the brazing material 107 that climbs up the outer peripheral side surface of the metal frame 108 to the upper surface side is suppressed, and the brazing material 107 is easily provided on the second inclined portion 106b side that is formed on the outer periphery of the frame-like metallized layer 106.
- the joining region joined by the material 107 can be enlarged. That is, the joining region between the metal frame 108 and the frame-like metallized layer 106 can be effectively increased as compared with the conventional case.
- the metal frame 108 in order to form the metal frame 108 so that the width of the lower surface is narrower than the width of the upper surface in the cross section along the periphery of the mounting portion 102, for example, an iron-nickel alloy or an iron-nickel-cobalt alloy.
- an iron-nickel alloy or an iron-nickel-cobalt alloy for example, an iron-nickel alloy or an iron-nickel-cobalt alloy.
- the metal frame 108 may be manufactured using the surface of the metal frame 108 to be joined to the brazing material 107 as a punching start surface.
- the metal base material may be one in which the brazing material 107 is rolled on one side.
- the punching start surface (the side in contact with the lower mold) is the metal base material side, and the upper mold is punched into a ring shape by moving downward while pushing the brazing material 107 side.
- the metal frame body 108 in which the brazing material 107 is integrated can be manufactured, and the brazing operation of the metal frame body 108 to the insulating substrate 101 becomes easy.
- the metal base material is punched into a ring shape, a narrower clearance is provided on the inner peripheral side of the lower mold and the upper mold than on the outer peripheral side, and on the inner peripheral side of the metal frame 108, The structure is inclined inwardly from the lower end to the upper end, smaller than the outer peripheral side surface (inclination angle ⁇ 2 on the inner peripheral side surface of the metal frame 108 is 91 ° to 93 °, for example).
- the inclination of the side surface of the metal frame 108 is not only that the outer peripheral side surface is inclined outward from the lower end to the upper end, but also the inner peripheral side surface is inclined inward from the lower end to the upper end as in an inverted trapezoidal shape in a sectional view. It doesn't matter.
- the joining position of the metal frame 108 on the mounting portion 102 side to the frame-like metallized layer 106 is located on the outer peripheral side in a plan view (when the inner periphery of the frame-like metallized layer 106 is partially exposed)
- the material 107 tends to scoop up to the upper surface side on the side surface of the metal frame 108 on the mounting portion 102 side, that is, the inner peripheral side surface.
- the brazing material 107 may crawl up both side surfaces of the metal frame 108 to the upper surface side. It is suppressed. Therefore, the volume of the brazing material 107 can be secured and the joining area can be increased.
- the inclination of the inner peripheral side surface of the metal frame 108 is preferably smaller than the inclination of the outer peripheral side surface in consideration of ease of mounting the electronic component on the mounting portion 102 (inside the metal frame 108).
- the inclination angle ⁇ 3 on the peripheral side surface is, for example, 92 ° to 98 °).
- the metal frame 108 has a lower surface whose width is narrower than that of the upper surface in a longitudinal sectional view, that is, the upper surface is wider. There is also an effect that the bonding area with 115 can be increased. As a result, even when the electronic component storage package is downsized and the frame width of the insulating substrate 101 is narrow, the electronic component storage package and the lid 115 are sealed through the metal frame 108 having such a shape. Stop reliability can be improved.
- the outer periphery of the upper surface of the metal frame 108 in a cross-sectional view is closer to the inner periphery than the brazing material 107 covering the second inclined portion 106b in order to avoid interference between adjacent wiring board regions when the mother board is divided. It is preferable to form so as to be positioned.
- the inner periphery of the metal frame 108 is positioned closer to the mounting portion 102 than the inner periphery of the frame-like metallized layer 106. This state is shown in FIG. Because of such a structure, a fillet of the brazing material 107 is formed on the lower surface of the metal frame 108 on the mounting portion 102 side, so that the sealing width of the brazing material 107 can be increased, and the brazing material 107 is also formed on the outer peripheral side. Is easily formed near the mounting portion 102.
- the metal frame 108 when the metal frame 108 is positioned on the mounting portion 102 side, the inclination of the fillet of the brazing material 107 formed on the outer periphery of the electronic component storage package becomes gentle. As a result, since the volume of the brazing material 107 is not biased toward the outer periphery, the bonding of the wiring board regions to each other by the brazing material 107 in the mother board on which the wiring board areas are arranged is suppressed, and a frame caused by stress when the mother board is divided. The peeling of the metalized layer 106 is suppressed.
- the following method can be used to braze the metal frame 108 so that the inner periphery thereof is positioned closer to the mounting portion 102 than the inner periphery of the frame-shaped metallized layer 106. That is, after positioning the metal frame body 108 integrated with the brazing material 107 on the upper surface of each frame-like metallized layer 106 formed on the fired mother substrate using a jig or the like, the brazing material 107 is The frame-like metallized layer 106 and the metal frame 108 are brazed by heating and melting in a reducing atmosphere.
- the positioning of the metal frame 108 for example, a plurality of notches (not shown) are formed on the outer periphery of the mother board, and the metal frame 108 is formed on the frame-like metallized layer 106 in each wiring board region.
- the positioning pins of the jig may be inserted into the plurality of notches so as to be properly positioned.
- the metal frame body 108 can be brazed with high positional accuracy to the frame-like metallized layer 106 in the wiring board region.
- the metal frame 108 is located between the metal frame 108 and the mounting portion 102 in a top view.
- the frame-shaped metallized layer 106 is not positioned, and the mounting portion 102 is positioned inside the metal frame 108.
- the inner periphery of the frame-shaped metallized layer 106 is not visible in a top view, when mounting the electronic component 103 on the mounting portion 102, for example, when the inner periphery of the metal frame 108 is used as the position reference of the mounting portion 102
- the frame-like metallized layer 106 (frame portion 105) can suppress the area of the mounting portion 102 inside the metal frame 108 from being narrowed in a top view, and improves the mounting reliability of the electronic component 103. be able to.
- the position of the mounting portion 102 is the inner periphery of the metal frame 108 in a top view.
- the electronic component 103 is mounted on the mounting unit 102 based on the position information of the mounting unit 102 and is connected to the wiring conductor 111.
- the position of the metal frame 108 is partially displaced and the frame portion 105 (frame-like metallized layer 106) is exposed on the inner periphery of the metal frame 108 in a top view, this portion is connected to the metal frame 108. If the position information is registered by erroneous recognition, there is a possibility that the electronic component 103 cannot be mounted on the mounting unit 102 with high accuracy.
- the metal frame 108 is positioned on the mounting portion 102 side in this way, the frame-like metallized layer 106 is not positioned between the metal frame 108 and the mounting portion 102 in a top view, and the metal The mounting portion 102 is exposed inside the frame body 108, and image recognition capable of obtaining accurate position information becomes possible.
- the upper surface of the metal frame 108 is coated with a plating layer such as gold.
- the exposed surface of the mounting portion 102 is a ceramic portion, and the color difference between the metal frame 108 and the mounting portion 102 in the top view. Therefore, it is easy to perform image recognition of the mounting unit 102.
- the shape of the metal frame 108 to be joined to the frame-shaped metallized layer 106 is not only rectangular in a sectional view as shown in FIG. 6, but one or both of the outer peripheral side surface and the inner peripheral side surface are lower ends on the outer peripheral side surface.
- the shape may be inclined outward from the upper end to the upper end, or may be inclined inward from the lower end to the upper end on the inner peripheral side surface.
- the brazing material 107 scoops the side surface of the metal frame 108 toward the upper surface side by the inclined portion of the metal frame body 108 as described above. It is possible to increase the width of the joining region joined by the brazing material 107 by suppressing the rise.
- FIG. 7 is a cross-sectional view showing a modification of FIG. As shown in FIG.
- the shape of the metal frame 108 may be a structure in which the width of the lower surface is narrower than the width of the upper surface in a longitudinal sectional view, and the outer peripheral side surface of the metal frame 108 is inclined outward from the lower end to the upper end.
- the width of the frame portion becomes very small, and the portion (frame portion) that partitions the mounting portion and the external environment has a small thickness.
- the metal frame body 108 has an inner periphery that is closer to the mounting portion 102 than the inner periphery of the frame-shaped metallized layer 106.
- the joint region between the metal frame body 108 and the frame-like metallized layer 106 is the same as the opposing long side portion. Can be large. Therefore, it is possible to provide an electronic component storage package with excellent airtight reliability by the lid 115 while ensuring the storage of the electronic component 103 in the mounting portion 102.
- a plurality of wiring board regions to be the electronic component storage package are arranged on the mother board.
- the size of the mother board is, for example, a flat plate having a side of about 60 to 120 mm, and a width of about 5 to 10 mm is provided on the outer periphery of the mother board for easy handling.
- the abandonment area is formed.
- the following method can be cited. In other words, a method is adopted in which a multi-piece wiring board is sandwiched from above and below by a transfer roller and a pressing roller, and divided into each wiring board area along the dividing groove 120 using the transfer roller as a fulcrum and the pressing roller as an action point. Is done.
- the distance from the center of the axis of the transfer roller in plan view to the center of the axis of the pressing roller is set according to the length of one side of each wiring board region.
- the transfer roller and the pressure roller are respectively installed in contact with the endless belt, and by transferring the mother substrate between the upper and lower endless belts, the transfer roller serves as a fulcrum and the pressure roller serves as an action point.
- the mother substrate is sequentially broken and divided along the dividing groove 120 above the transfer roller.
- the frame metallization is caused by the ablation phenomenon (a phenomenon in which part of the material is decomposed by evaporation and erosion).
- Divided grooves 120 can be formed in the layer 106 and the frame portion 105 before firing to be an insulating layer.
- the second inclined portion 106b and the third inclined portion 110 are formed by the method as described above, so that the split groove 120 having a good shape with excellent openability and reduced adhesion during firing is formed. Is possible. Therefore, when the mother board is divided for each wiring board area, defects such as burrs, chipping, and escaping that are likely to occur on the side surface of the wiring board can be further suppressed.
- the manufacturing method of the electronic component storage package in the embodiment of the present invention includes the following steps. First, a laminated body in which a plurality of wiring board regions having mounting portions 102 on the upper surface are arranged vertically and horizontally, and provided on the upper surface of the laminated body so as to protrude upward in a longitudinal section in the width direction along the boundary 119 of the wiring board region. A step of producing a connecting substrate that is a mother substrate including the frame-like metallized layer 106 formed. Next, the coupling substrate is irradiated with a laser 118 from above the frame-like metallized layer 106 to form the dividing groove 120 on the upper surface of the laminate, and the first inclined portion 106a inclined inward from the upper surface to the inner peripheral side surface is formed.
- a fillet 107 a of the brazing material 107 is formed between the outer periphery of the upper surface of the frame-like metallized layer 106 and the metal frame 108, and a filling portion 107 b of the brazing material 107 is formed between the first inclined portion 106 a and the metal frame 108.
- the frame-like metallized layer 106 having the second inclined portion 106b and the third inclined portion 110 can be easily formed by laser processing.
- a method for manufacturing a storage package can be provided.
- a through-hole serving as the castellation 114 of the individual electronic component storage package is provided at a portion where the boundaries 119 of the wiring board regions intersect each other.
- FIG. 9A a plurality of wiring board regions having mounting portions 102 on the upper surface are arranged vertically and horizontally, and a frame-like metallized layer 106 (on the upper surface of the laminate along the boundary 119 of the wiring substrate region) ( The process of producing the connection board
- the frame-like metallized layer 106 in the step of FIG. 9A is an unfired metal paste, but in this description, the two are not particularly distinguished.
- the frame portions 105 are connected to each other in adjacent wiring board regions.
- a frame-like metallized layer 106 is formed on the upper surface of the frame portion 105.
- the frame-like metallized layer 106 is also connected to each other in adjacent wiring board regions.
- the frame-like metallized layers 106 (metal paste) that are connected to each other have a longitudinal section that is convex upward. This protruding shape is appropriately adjusted depending on, for example, the viscosity of the metal paste used in the screen printing method.
- a portion that becomes a through hole of the multi-cavity wiring board is provided by punching or the like.
- This through hole may be provided by laser processing.
- the connecting substrate is irradiated with a laser 118 from above the frame-like metallized layer 106 to form dividing grooves 120 on the upper surface of the laminate, and on the outer peripheral side surface of the frame-like metallized layer 106.
- a process of forming the second inclined portion 106b and the third inclined portion 110 inclined outward from the upper end to the lower end of the outer peripheral side surface is shown.
- a split groove 120 is formed by a laser 118 from the upper surface of the frame-like metallized layer 106 along the boundary 119 of the wiring substrate region on the upper surface of the multilayer body in which a plurality of wiring substrate regions are arranged vertically and horizontally.
- the dividing metal 120 having the inner surface inclined downward from the upper end side of the frame-like metallized layer 106 and the insulating substrate 101 is formed. Note that the frame-like metallization layer 106 at this time is provided across the wiring substrate regions adjacent to each other, and therefore the frame-like metallization layer is also formed on the boundary 119 of the wiring substrate region (the portion where the dividing groove 120 is formed). Part of 106 is located. In the formed dividing groove 120, the inclined inner surface corresponds to the second inclined portion 106b and the third inclined portion 110.
- the step of forming the dividing groove 120 by the laser 118 is a stage of a laminated body of a plurality of ceramic sheets, that is, an unfired laminated body that becomes a mother substrate.
- the inclined inner surface is the second inclined part 106b and the third inclined part 110, and it is possible to form the divided groove 120 with reduced adhesion during firing. is there. That is, due to the ablation phenomenon caused by the laser 118, the dividing groove 120 is formed in the frame-shaped metallized layer 106 and the frame portion 105 before firing that becomes the insulating layer. It is possible to form a dividing groove 120 having a simple shape. In the laser processing with a small pulse width as described above, the reliability is high and the generation of heat of the non-irradiated material in the laser processing is small. Therefore, the generation of the melt is suppressed and the width is several tens of ⁇ m level. The dividing groove 120 can be finely processed. Therefore, the external dimensional accuracy of the electronic component storage package is excellent, and defects such as burrs, chippings, and egress are suppressed.
- a step of forming a filling portion 107b of 107 and joining the metal frame 108 to the frame-shaped metallized layer 106 with the brazing material 107 and a step of covering the second inclined portion 106b of the frame-shaped metalized layer 106 with the brazing material 107 are shown. .
- the connection substrate including the unfired laminate is fired after the step of FIG. 9B.
- the brazing material 107 is reduced in a reducing atmosphere.
- the frame-shaped metallized layer 106 and the metal frame 108 are brazed by heating and melting therein.
- the first nickel plating layer 116 may be applied in advance to the exposed surface of the frame-like metallized layer 106 including the second inclined portion 106b.
- a molten brazing material flows along the first nickel plating layer 116.
- the brazing material 107 is formed on the lower surface and the outer peripheral side surface of the metal frame 108 or the exposed surface of the frame-like metallized layer 106 including the first inclined portion 109. Since the frame-shaped metallized layer 106 has a second inclined portion 106b on the outer peripheral side surface, and the brazing material 107 covers the second inclined portion 106b, the frame-shaped metalized layer 106 is formed from the outer surface of the metal frame 108.
- a brazing filler metal 107 is formed over a wider range than the conventional one on the outer peripheral side surface. That is, apparently the width of the joining region including the metal frame 108 can be increased. That is, the width of the joining region between the metal frame 108 and the frame-like metallized layer 106 (the distance between the inner periphery and the outer periphery of the joint surface between the metal frame 108 and the frame-like metallized layer 106) is more effective than before. Can be large. Since the frame-shaped metallized layer 106 is formed with the second inclined portion 106b, the brazing material 107 formed on the lower surface of the metal frame body 108 has a second inclined surface on the outer peripheral side from the upper surface of the frame-shaped metalized layer 106. There is also an effect that the portion 106b is easily wetted and spread by the amount of inclination.
- the third inclined portion 110 is a part of the insulating substrate 101 and is an exposed portion of the ceramic, so the brazing material 107 is not joined. Since the dividing groove 120 is opened by the laser 118 between the adjacent wiring board regions, the frame-like metallized layers 106 and the like in the adjacent wiring board regions are suppressed from being connected by the brazing material 107. As shown in FIG. 9C, the dividing groove 120 may be formed on the lower surface at a position overlapping the dividing groove 120 on the upper surface in plan view. Thereby, the division
- the mother board on which the wiring board regions in which the metal frame 108 is joined by the brazing material 107 is arranged is the surface of the exposed metal part after brazing (the frame-like metallized layer 106, the wiring conductor 111, and the metal frame 108.
- a second nickel plating layer 117 and a gold plating layer are sequentially deposited on the exposed surface of the metal and the like in order to improve corrosion resistance and solderability.
- the surface of the brazing material 107 joined including the second inclined portion 106b is covered with the second nickel plating layer 117 as shown in FIGS. 3 and 4, for example.
- FIG. 9D shows a process of dividing the wiring board region along the dividing groove 120.
- the method of dividing each wiring board region of the mother board into individual pieces is sandwiched between the transfer roller and the pressing roller from above and below, for example, with the transfer roller as a fulcrum and the pressing roller as an action point.
- a method of dividing the wiring board regions along the dividing grooves 120 is employed. According to such a form of the mother board, even if the wiring board area (package for storing individual electronic components) is reduced in size, the airtightness of the mounting portion 102 and the brazing material 107 between the adjacent board areas are connected. Etc. are suppressed. For this reason, for example, it is possible to provide a method for manufacturing an electronic component storage package that has excellent mother board division at the time of manufacture in a so-called multi-cavity form, and is excellent in airtight reliability and productivity.
- the electronic component storage package divided into individual pieces has a structure in which the frame-shaped metallized layer 106 has a second inclined portion 106b on the outer peripheral side surface, and the brazing material 107 covers the second inclined portion 106b. ing. That is, since the brazing filler metal 107 is formed in a wider range than before from the outer side surface of the metal frame 108 to the outer peripheral side surface of the frame-like metallized layer 106, the width of the joining region including the metal frame 108 is increased. Can do. Therefore, the length of the joint surface in which gas may pass between the mounting portion 102 and the outside due to poor wetting of the brazing material 107 or the like can be easily increased as compared with the conventional case. This is advantageous in improving the airtightness, and the electronic component storage package in which the airtightness of the mounting portion 102 is good is obtained.
- the manufacturing method of the electronic component storage package, the multi-piece wiring board, and the electronic component storage package of the present invention is not limited to the example of the above embodiment, and does not depart from the gist of the present invention. There is no problem even if various changes are made.
- the frame portion 105 is the insulating substrate 101 configured with a single layer, but the frame portion 105 may be the insulating substrate 101 configured with two or more layers.
- the part 110 may be formed across the boundary of the opposing laminated surfaces of the insulating layers constituting the frame part 105.
- the frame-shaped metallized layer 106 is configured as a single layer, but when the frame-shaped metallized layer 106 is bisected, the boundary region is larger than the outer peripheral side. You may form so that it may become a thick structure. In this case, the shape of the frame-like metallized layer 106 can be easily formed such that the outer peripheral side is thicker than the mounting portion 102 side.
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Abstract
Description
102・・・搭載部
103・・・電子部品
104・・・基部
105・・・枠部
106・・・枠状メタライズ層
106a・・第1傾き部
106b・・第2傾き部
107・・・ろう材
107a・・フィレット
107b・・充填部
108・・・金属枠体
110・・・第3傾き部
111・・・配線導体
112・・・外部接続導体
113・・・接合材
114・・・キャスタレーション
115・・・蓋体
116・・・第1ニッケルめっき層
117・・・第2ニッケルめっき層
118・・・レーザー
119・・・境界
120・・・分割溝
θ1・・・金属枠体の外周側面における傾き角度
θ2、θ3・・・金属枠体の内周側面における傾き角度
Claims (11)
- 電子部品の搭載部を含む上面を有する絶縁基板と、
該絶縁基板の上面に前記搭載部を囲んで形成されている枠状メタライズ層と、
該枠状メタライズ層上にろう材により接合されている金属枠体とを具備しており、
前記枠状メタライズ層は、上面から内周側面にかけて内側に傾いた第1傾き部を含んでおり、
前記枠状メタライズ層の上面外周と前記金属枠体との間に前記ろう材のフィレットおよび前記第1傾き部と前記金属枠体との間に前記ろう材の充填部が形成されている電子部品収納用パッケージ。 - 前記枠状メタライズ層は、外周側面が上端から下端にかけて外側に傾いた第2傾き部を含んでおり、
前記ろう材が前記枠状メタライズ層の前記第2傾き部を覆っている請求項1に記載の電子部品収納用パッケージ。 - 前記枠状メタライズ層の前記第2傾き部の下端が前記絶縁基板の上面の外周に接しており、前記絶縁基板の外周側面が前記第2傾き部と互いに連続する第3傾き部を有している請求項1または請求項2に記載の電子部品収納用パッケージ。
- 前記枠状メタライズ層は、前記絶縁基板の前記搭載部側よりも外周側が厚い請求項1乃至請求項3のいずれかに記載の電子部品収納用パッケージ。
- 前記金属枠体は、縦断面視で下面の幅が上面の幅よりも狭くなっており、かつ前記金属枠体の外周側面が下端から上端にかけて外側に傾いている請求項1乃至請求項4のいずれかに記載の電子部品収納用パッケージ。
- 前記金属枠体は、縦断面視で内周側面が下端から上端にかけて内側に傾いている請求項1乃至請求項5のいずれかに記載の電子部品収納用パッケージ。
- 前記金属枠体は、縦断面視で内周側面の傾きが外周側面の傾きよりも小さい請求項5を引用する請求項6に記載の電子部品収納用パッケージ。
- 前記金属枠体は、内周が前記枠状メタライズ層の内周よりも前記搭載部側に位置している請求項1乃至請求項7のいずれかに記載の電子部品収納用パッケージ。
- 請求項1乃至請求項8のいずれかに記載の電子部品収納用パッケージとなる配線基板領域が母基板に複数個配列されている多数個取り配線基板。
- 搭載部を上面に有する複数の配線基板領域が縦横に配列された積層体、および該積層体の上面に前記配線基板領域の境界に沿って幅方向の縦断面で上側に凸状に設けられた枠状メタライズ層を含む、母基板となる連結基板を作製する工程と、
該連結基板に前記枠状メタライズ層の上側からレーザー光を照射して、前記積層体の上面に分割溝を形成するとともに、上面から内周側面にかけて内側に傾いた第1傾き部を形成する工程と、
前記枠状メタライズ層の上面外周と金属枠体との間にろう材のフィレットおよび前記第1傾き部と前記金属枠体との間に前記ろう材の充填部を形成して、前記枠状メタライズ層に前記ろう材によって前記金属枠体を接合する工程と、
前記配線基板領域を前記分割溝に沿って分割する工程とを含む電子部品収納用パッケージの製造方法。 - 前記枠状メタライズ層の外周側面に上端から下端にかけて外側に傾いた第2傾き部を形成し、前記積層体の前記分割溝内に露出した側面に第3傾き部を形成する工程と、
前記ろう材で前記枠状メタライズ層の前記第2傾き部を覆う工程とを含む請求項10に記載の電子部品収納用パッケージの製造方法。
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US15/527,861 US10182508B2 (en) | 2014-11-26 | 2015-11-25 | Electronic component housing package, multi-piece wiring substrate, and method for manufacturing electronic component housing package |
EP15864225.6A EP3226285B1 (en) | 2014-11-26 | 2015-11-25 | Electronic component housing package, multi-piece wiring board, and method of manufacturing electronic component housing package |
JP2016561910A JP6337142B2 (ja) | 2014-11-26 | 2015-11-25 | 電子部品収納用パッケージ、多数個取り配線基板および電子部品収納用パッケージの製造方法 |
CN201580061662.2A CN107112286B (zh) | 2014-11-26 | 2015-11-25 | 电子部件收纳用封装件、批量生产型布线基板以及电子部件收纳用封装件的制造方法 |
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JP7145037B2 (ja) | 2018-10-30 | 2022-09-30 | 京セラ株式会社 | 電子素子実装用基板、電子装置、および電子モジュール |
JP7542318B2 (ja) | 2020-02-10 | 2024-08-30 | 日本カーバイド工業株式会社 | 水晶素子搭載基板及び水晶振動部品 |
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EP3226285A1 (en) | 2017-10-04 |
EP3226285A4 (en) | 2018-11-14 |
US10182508B2 (en) | 2019-01-15 |
JP6337142B2 (ja) | 2018-06-06 |
EP3226285B1 (en) | 2021-11-10 |
EP3226285A9 (en) | 2018-02-21 |
US20180324969A1 (en) | 2018-11-08 |
CN107112286B (zh) | 2019-09-03 |
CN107112286A (zh) | 2017-08-29 |
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