WO2014201729A1 - 一种显示面板、显示面板的检测线路及其检测方法 - Google Patents

一种显示面板、显示面板的检测线路及其检测方法 Download PDF

Info

Publication number
WO2014201729A1
WO2014201729A1 PCT/CN2013/078560 CN2013078560W WO2014201729A1 WO 2014201729 A1 WO2014201729 A1 WO 2014201729A1 CN 2013078560 W CN2013078560 W CN 2013078560W WO 2014201729 A1 WO2014201729 A1 WO 2014201729A1
Authority
WO
WIPO (PCT)
Prior art keywords
shorting bar
bonding
pad
display panel
tft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2013/078560
Other languages
English (en)
French (fr)
Inventor
王金杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
Original Assignee
Shenzhen China Star Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen China Star Optoelectronics Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Technology Co Ltd
Priority to US14/006,087 priority Critical patent/US9483969B2/en
Publication of WO2014201729A1 publication Critical patent/WO2014201729A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Definitions

  • the present invention relates to the field of display technologies, and in particular, to a display panel, a detection line of a display panel, and a detection method thereof.
  • the signal is usually sent to the display panel by different interfaces to illuminate it to detect whether it is defective, and usually performs a lighting detection and a secondary lighting detection.
  • a shorting bar is usually used (shorting Bar) detection method. Specifically, all bonding zones will be bonded (bonding) One end of the pad is connected to the display area of the display panel, and the other end is connected with a shorting bar, and the two ends of the shorting bar are connected to the detecting curing pad.
  • the detection signal is input through the detection curing pad, and then transported to the bonding pad of the bonding zone through the shorting bar, and then sent to the display area through the bonding pad of the bonding zone for display.
  • Laser cutting is required after the end of the test (laser Cut) process to cut off the connection between the shorting bar and the bonding pad of the bonding zone.
  • the above-mentioned Shorting bar detection method requires a simple fixture, and has low accuracy requirements for the fixture, but needs to be laser after the detection is completed. Cut, adding a process that requires additional machines to operate, thus increasing inspection costs.
  • the technical problem to be solved by the present invention is to provide a display panel, a detection line of the display panel, and a detection method thereof, which can reduce the detection cost.
  • a technical solution adopted by the present invention is to provide a detection circuit for a display panel, the detection circuit includes a shorting bar, and two ends of the shorting bar are coupled to the test curing pad to obtain a detection signal from the test curing pad.
  • a bonding pad of a plurality of bonding zones one end coupled to the shorting bar, and the other end coupled to the display area of the display panel to transmit the detection signal to the display area; wherein at least between the curing pad and the shorting bar of the bonding zone is disposed a set of switching elements, the switching element is turned on after receiving the detection signal during detection, to transmit the detection signal on the shorting bar to the bonding pad of the bonding zone, and is turned off after the detection is finished, to prevent the display panel from being normally displayed when bonding
  • the signals on the zone curing mat interfere with each other.
  • an additional curing pad is respectively disposed at both ends of the bonding pad of the bonding zone, and the additional curing pad is connected with the shorting bar to turn off the switching component by transmitting a closing signal through the shorting bar.
  • the switching element is a TFT.
  • the bonding pad of the bonding zone comprises a curing pad of the bonding chip bonding region, and one end of the curing pad of the bonding chip bonding region is connected to the source of the TFT, and the gate and the drain of the TFT are connected to the shorting bar.
  • the bonding pad of the bonding zone comprises a curing pad of the data chip bonding zone
  • the shorting bar comprises a first shorting bar and a second shorting bar
  • one end of the curing pad of the data chip bonding zone is connected to the source of the TFT, and the gate of the TFT is connected.
  • a shorting bar, the drain of the TFT is connected to the second shorting bar.
  • the additional curing pad is connected to the first shorting bar.
  • the gate and the drain of the TFT are connected to the shorting bar, and the source of the TFT is respectively connected to the bonding pads of the bonding regions.
  • the number of the plurality of TFTs is the same as the number of curing pads in the bonding region, and the gate and the drain of the TFT are connected to the shorting bar, and the source of the TFT and the corresponding bonding region curing pad respectively connection.
  • a display panel which includes a display area and a detection line disposed at a periphery of the display area, wherein the detection line includes: a shorting bar, a shorting bar
  • the test curing pad is coupled to the two ends to obtain a detection signal from the test curing pad; the bonding pads of the plurality of bonding zones are coupled to the shorting bar at one end and coupled to the display area of the display panel at the other end to transmit the detection signal to the display area;
  • at least one set of switching elements is disposed between the curing pad and the shorting bar in the bonding zone, and the switching component is turned on after receiving the detection signal during detection to transmit the detection signal on the shorting bar to the bonding pad of the bonding zone, and After the end of the test, it is turned off to prevent the signals on the curing pad of the bonding area from interfering with each other when the display panel is normally displayed.
  • an additional curing pad is respectively disposed at both ends of the bonding pad of the bonding zone, and the additional curing pad is connected with the shorting bar to turn off the switching component by transmitting a closing signal through the shorting bar.
  • the switching element is a TFT.
  • the bonding pad of the bonding zone comprises a curing pad of the bonding chip bonding region, and one end of the curing pad of the bonding chip bonding region is connected to the source of the TFT, and the gate and the drain of the TFT are connected to the shorting bar.
  • the bonding pad of the bonding zone comprises a curing pad of the data chip bonding zone
  • the shorting bar comprises a first shorting bar and a second shorting bar
  • one end of the curing pad of the data chip bonding zone is connected to the source of the TFT, and the gate of the TFT is connected.
  • a shorting bar, the drain of the TFT is connected to the second shorting bar.
  • the additional curing pad is connected to the first shorting bar.
  • the gate and the drain of the TFT are connected to the shorting bar, and the source of the TFT is respectively connected to the bonding pads of the bonding regions.
  • the number of the plurality of TFTs is the same as the number of curing pads in the bonding region, and the gate and the drain of the TFT are connected to the shorting bar, and the source of the TFT and the corresponding bonding region curing pad respectively connection.
  • another technical solution adopted by the present invention is to provide a method for detecting a display panel, the method comprising the steps of: providing at least one set between a shorting bar of a display panel and a curing pad of a bonding zone; a switching element; providing a detection signal to the shorting bar to turn on the switching element; the detecting signal enters the bonding area curing pad through the opened switching element, and then is transmitted to the display area of the display panel; after the detection is finished, the switching element is provided with the closing switch The closing signal of the component prevents the signals on the curing pad of the bonding zone from interfering with each other when the display panel is normally displayed.
  • providing the switching element with the closing signal of the closing switching element includes the steps of: providing an additional curing pad at both ends of the switching element, and after the detection is finished, adding a curing pad input closing signal for closing the switching element.
  • the detecting circuit of the present invention is provided with at least one set of switching elements between the shorting bar and the plurality of bonding zones, and the switching element receives the shorting bar during detection.
  • the detection signal is turned on, the detection signal is transmitted to the bonding pad of the bonding zone, and is turned off after the detection is finished, so as to prevent signals on the curing pad of the bonding zone from interfering with each other when the display panel is normally displayed.
  • the present invention sets the switching element to be turned on during the detection and is turned off after the detection is completed, thereby ensuring the detection effect on the one hand, and on the other hand, the additional machine is not required to open the switching element and the bonding after the detection is completed.
  • the connection between the curing pads of the zone reduces the inspection process and the machine and reduces the cost of inspection.
  • FIG. 1 is a schematic structural view of a display panel having a detection line according to a first embodiment of the present invention
  • Figure 2 is an enlarged view of the scanning side of the detection line shown in Figure 1;
  • Figure 3 is an enlarged view of the data side of the detection line shown in Figure 1;
  • FIG. 4 is a schematic structural view of a display panel having a detection line according to a second embodiment of the present invention.
  • Fig. 5 is a flow chart showing a method of detecting a display panel according to a third embodiment of the present invention.
  • FIG. 1 is a schematic structural view of a display panel with a detection line according to a first embodiment of the present invention.
  • the display panel 10 includes a display area 11 and a detection line 12 disposed at the periphery of the display area 11.
  • the detection line 12 includes a shorting bar 121 and a plurality of bonding zone curing pads 122. Both ends of the shorting bar 121 are coupled to the test curing pad 123 to acquire a detection signal from the test curing pad 123. One end of the bonding pad 122 is coupled to the shorting bar 121, and the other end is coupled to the display area 11 of the display panel 10 to transmit a detection signal to the display area 11.
  • a plurality of sets of switching elements 124 are disposed between the bonding pad 122 and the shorting bars 121.
  • the switching element 124 is turned on after receiving the detection signal at the time of detection to transmit the detection signal on the shorting bar 121 to the bonding area curing pad 122. After the end of the detection, it is in a closed state to prevent the signals on the bonding pad 122 of the bonding zone from interfering with each other when the display panel 10 is normally displayed.
  • an additional curing pad 125 is disposed on both ends of the bonding pad 122 of the bonding zone, and the additional curing pad 125 is connected to the shorting bar 121.
  • a shutdown signal such as a low level signal, is input from the additional curing pad 125 and then transmitted through the shorting bar 121 to the switching element 124 to turn off the switching element 124.
  • connection relationship between the switching element 124 and the shorting bar 121 and the bonding region curing pad 122 will be specifically described below.
  • FIG. 2 is a schematic structural view of the detecting line on the scanning side shown in FIG. 1
  • FIG. 3 is a schematic structural view of the detecting line on the data side.
  • the detection line 12 includes a detection line 12A on the scanning side and a detection line 12B on the data side.
  • the bonding zone curing pad 122 includes a scanning chip bonding zone curing pad 122A and a data chip bonding zone curing pad 122B, wherein the scanning chip bonding zone curing pad 122A is disposed in the scanning side detection line 12A, and the data chip bonding zone
  • the curing pad 122B is correspondingly disposed in the detection line 12B on the data side.
  • the switching element 124 of this embodiment is a TFT 126, and the number of TFTs 126 is the same as the number of bonding pads 122 in the bonding zone.
  • the gate G and the drain D of the TFT 126 are connected to the shorting bar 121, TFT
  • the source S of 126 is respectively connected to the corresponding scan chip bonding region curing pad 122A.
  • the shorting bar 121 further includes a first shorting bar 121A and a second shorting bar 121B, TFT
  • the gate G of the 126 is connected to the first shorting bar 121A
  • the drain D is connected to the second shorting bar 121B
  • the source S is respectively connected to the corresponding data chip bonding zone curing pad 122B
  • the additional curing pad 125 is connected to the first shorting bar 121A.
  • a detection signal such as a high level signal passes through the shorting bar 121, and the TFT is turned on. 126, then enters the display area 11 by scanning the chip bonding area curing pad 122A to open the thin film transistor M in the display area 11.
  • the detection line 12B on the data side after the detection signal, for example, a high level signal passes through the first shorting bar 121A, the TFT is turned on. 126, data signals such as R, G, B signals are transmitted from the second shorting bar 121B to the opened TFT 126 is then transferred to the data chip curing pad 122B, and then enters the display area 11, and is displayed after passing through the opened thin film transistor M.
  • the detection signal that is, the high level signal of the detection line 12A on the scanning side and the data signals R, G, B of the detection line 12B on the data side are respectively transmitted to the scanning line 13 and the data line 14 of the display panel 10 to In the display area 11, the scanning line 13 and the data line 14 form a sector-shaped area 15 between the bonding pad 122 and the display area 11, respectively. Since the scanning line 13 and the data line 14 in the sector 15 have a large density, it is likely to cause a short circuit or an open circuit during the manufacturing process. Therefore, it is also necessary to detect the line condition of the sector area 15.
  • the detection line 12 of the present invention needs the scan line 13 and the data line 14 to respectively transmit the detection signal to the display area 11, the on/off state of the scan line 13 and the data line 14 is determined by detecting the display state in the display area 11, that is, It is detected whether or not the line in the sector area 15 is defective.
  • FIG. 4 is a schematic structural diagram of a display panel with a detection line according to a second embodiment of the present invention.
  • the detection line 22 shown in FIG. 4 is different from the detection line 12 shown in FIG. 1 in that, as shown in FIG. 4, the detection line 22 is provided with only one set of TFTs. 226, that is, the detection line 22A on the scanning side is provided with only one TFT 226, and the detection line 22B on the data side is also provided with only one TFT 226.
  • the TFT The gate G and the drain D of the 226 are connected to the shorting bar 221, and the source S of the TFT 226 is connected to the plurality of scanning chip bonding region curing pads 222A, respectively.
  • TFT The gate G of the 226 is connected to the first shorting bar 221A
  • the drain D is connected to the second shorting bar 221B
  • the source S of the TFT 226 is connected to the plurality of data chip bonding zone curing pads 222B, respectively.
  • the working principle of the detecting circuit 22 shown in FIG. 4 is the same as that of the detecting circuit 12 shown in FIG. 1, and details are not described herein again.
  • the detection circuit can also set other groups of TFTs, such as two groups, three groups, etc., as long as the detection signal can be transmitted during detection and is turned off after the end, so that no additional machine is needed to cut off the shorting bar and bonding.
  • the connection between the curing pads of the area is sufficient.
  • the switching element can also be other components that can function as a switch, and is not limited herein.
  • the detecting circuit of the present invention has a switching element disposed between the shorting bar and the bonding pad of the bonding zone, so that it is not necessary to use an additional machine to cut off the shorting bar and the bonding pad of the bonding zone after the detection is completed.
  • the connection between the two saves the cost of testing.
  • the present invention since the present invention transmits the detection signal to the display area of the display panel through the bonding pad of the bonding zone for display, the present invention can test the defect of the sector region, and transmits the detection signal to the opposite side from the bonding pad of the bonding zone.
  • the detection method of the switch (Switch) is more comprehensive.
  • FIG. 5 is a flowchart of a method for detecting a display panel according to a third embodiment of the present invention. As shown in FIG. 5, the detection method of the display panel of the present invention includes:
  • Step S1 at least one set of switching elements is disposed between the shorting bar of the display panel and the bonding pad of the bonding zone.
  • step S1 the switching element is a TFT.
  • the connection manner of the specific TFT and the short-circuit bar and the bonding pad of the bonding zone is as described in the foregoing embodiments, and details are not described herein again.
  • Step S2 providing a detection signal to the shorting bar to turn on the switching element.
  • the detection signal is, for example, a high level signal for turning on the switching element.
  • the detection signal also includes R, G, B data signals.
  • Step S3 The detection signal passes through the opened switching element and enters the bonding pad of the bonding area, and then is transmitted to the display area of the display panel.
  • step S3 the principle that the detection signal enters the display area of the display panel for display is as described above, and details are not described herein again.
  • Step S4 After the detection is finished, the switching element is provided with a closing signal for turning off the switching element to prevent the signals on the bonding pad of the bonding area from interfering with each other when the display panel is normally displayed.
  • step S4 specifically, an additional curing pad is disposed at both ends of the switching element, and after the detection is completed, an additional curing pad input closing signal such as a low level signal is used to turn off the switching element.
  • the present invention provides a switching element between the shorting bar and the curing pad of the bonding zone, and is in an open state during detection to transmit the detection signal to the display area of the display panel, and is in a closed state after the detection ends,
  • the invention does not require an additional machine to disconnect the connection between the shorting bar and the bonding pad of the bonding zone after the end of the inspection, thereby saving the detection cost; on the other hand, detecting the defect of the sector region,
  • the detection of the present invention is more comprehensive in the Witch detection method.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种显示面板（10）、显示面板（10）的检测线路（12）及其检测方法。该检测线路（12）包括短路棒（121,121A,121B,221,221A,221B）、邦定区固化垫（122,122A,122B,222A,222B）以及开关元件（124,126）。开关元件（124,126）设置在邦定区固化垫（122,122A,122B,222A,222B）和短路棒（121,121A,121B,221,221A,221B）之间，开关元件（124,126）在检测时接收检测信号后开启，以将短路棒（121,121A,121B,221,221A,221B）上的检测信号传输到邦定区固化垫（122,122A,122B,222A,222B），并在检测结束后处于关闭状态，以防止显示面板（10）正常显示时邦定区固化垫（122,122A,122B,222A,222B）上的信号互相干扰。通过上述方式，能够节约检测成本。

Description

一种显示面板、显示面板的检测线路及其检测方法
【技术领域】
本发明涉及显示技术领域，特别是涉及一种显示面板、显示面板的检测线路及其检测方法。
【背景技术】
在显示面板的制造过程中，通常利用不同的介面将讯号送入显示面板中将其点亮以检测其是否有缺陷，通常进行一次点灯检测和二次点灯检测。在显示面板的二次点灯检测中，通常采用短路棒（shorting bar）检测方式。具体而言，将所有邦定区固化垫（bonding pad）的一端连接显示面板的显示区，另一端连接一条短路棒，而该短路棒的两端连接检测固化垫。在检测时检测信号通过检测固化垫输入，然后通过短路棒输送到邦定区固化垫，再通过邦定区固化垫输送到显示区中进行显示。检测结束后需要进行激光切割（laser cut）制程，以将短路棒和邦定区固化垫的连接切断。
上述的Shorting bar检测方式所需的治具简单，对治具的精度要求低，但由于在检测完成后需要进行laser cut，增加了一道工序，需要额外的机台来操作，因此增加了检测成本。
【发明内容】
本发明主要解决的技术问题是提供一种显示面板、显示面板的检测线路及其检测方法，能够降低检测成本。
为解决上述技术问题，本发明采用的一个技术方案是：提供一种显示面板的检测线路，该检测线路包括短路棒，短路棒的两端耦接测试固化垫，以从测试固化垫获取检测信号；多个邦定区固化垫，一端耦接短路棒，另一端耦接显示面板的显示区，以将检测信号传输到显示区；其中，在邦定区固化垫和短路棒之间设置有至少一组开关元件，开关元件在检测时接收检测信号后开启，以将短路棒上的检测信号传输到邦定区固化垫，并在检测结束后处于关闭状态，以防止显示面板正常显示时邦定区固化垫上的信号互相干扰。
其中，在邦定区固化垫的两端分别设置一个附加固化垫，附加固化垫与短路棒连接，以通过短路棒传输关闭信号来关闭开关元件。
其中，开关元件为TFT。
其中，邦定区固化垫包括扫描芯片邦定区固化垫，扫描芯片邦定区固化垫的一端连接TFT的源极，TFT的栅极和漏极连接短路棒。
其中，邦定区固化垫包括数据芯片邦定区固化垫，短路棒包括第一短路棒和第二短路棒，数据芯片邦定区固化垫的一端连接TFT的源极，TFT的栅极连接第一短路棒，TFT的漏极连接第二短路棒。
其中，附加固化垫与第一短路棒连接。
其中，检测线路仅设置一个TFT时，TFT的栅极和漏极连接短路棒，TFT的源极分别连接多个邦定区固化垫。
其中，检测线路设置多个TFT时，多个TFT的数量和邦定区固化垫的数量相同，且TFT的栅极和漏极连接短路棒，TFT的源极分别与对应的邦定区固化垫连接。
为解决上述技术问题，本发明采用的另一个技术方案是：提供一种显示面板，该显示面板包括显示区以及设置于显示区外围的检测线路，其中，检测线路包括：短路棒，短路棒的两端耦接测试固化垫，以从测试固化垫获取检测信号；多个邦定区固化垫，一端耦接短路棒，另一端耦接显示面板的显示区，以将检测信号传输到显示区；其中，在邦定区固化垫和短路棒之间设置有至少一组开关元件，开关元件在检测时接收检测信号后开启，以将短路棒上的检测信号传输到邦定区固化垫，并在检测结束后处于关闭状态，以防止显示面板正常显示时邦定区固化垫上的信号互相干扰。
其中，在邦定区固化垫的两端分别设置一个附加固化垫，附加固化垫与短路棒连接，以通过短路棒传输关闭信号来关闭开关元件。
其中，开关元件为TFT。
其中，邦定区固化垫包括扫描芯片邦定区固化垫，扫描芯片邦定区固化垫的一端连接TFT的源极，TFT的栅极和漏极连接短路棒。
其中，邦定区固化垫包括数据芯片邦定区固化垫，短路棒包括第一短路棒和第二短路棒，数据芯片邦定区固化垫的一端连接TFT的源极，TFT的栅极连接第一短路棒，TFT的漏极连接第二短路棒。
其中，附加固化垫与第一短路棒连接。
其中，检测线路仅设置一个TFT时，TFT的栅极和漏极连接短路棒，TFT的源极分别连接多个邦定区固化垫。
其中，检测线路设置多个TFT时，多个TFT的数量和邦定区固化垫的数量相同，且TFT的栅极和漏极连接短路棒，TFT的源极分别与对应的邦定区固化垫连接。
为解决上述技术问题，本发明采用的又一个技术方案是：提供一种显示面板的检测方法，该方法包括以下步骤：在显示面板的短路棒和邦定区固化垫之间设置有至少一组开关元件；向短路棒提供检测信号，以开启开关元件；检测信号通过开启的开关元件后进入邦定区固化垫，然后传输到显示面板的显示区；在检测结束后，向开关元件提供关闭开关元件的关闭信号，以防止显示面板正常显示时邦定区固化垫上的信号互相干扰。
其中，在检测结束后，向开关元件提供关闭开关元件的关闭信号包括步骤：在开关元件的两端设置附加固化垫，在检测结束后，附加固化垫输入关闭信号，用于关闭开关元件。
本发明的有益效果是：区别于现有技术的情况，本发明的检测线路在短路棒和多个邦定区固化垫之间设置有至少一组开关元件，该开关元件在检测时接收短路棒的检测信号后开启，以将检测信号传输到邦定区固化垫，并在检测结束后处于关闭状态，以防止显示面板正常显示时邦定区固化垫上的信号互相干扰。通过上述方式，本发明通过设置开关元件，在检测时开启，并在检测结束后关闭，一方面保证了检测的效果，另一方面在检测结束后不需要额外机台断开开关元件和邦定区固化垫之间的连接，因此减少了检测工序和机台，降低了检测成本。
【附图说明】
图1是本发明第一实施例的具有检测线路的显示面板的结构示意图；
图2是图1所示的检测线路的扫描侧的放大图；
图3是图1所示的检测线路的数据侧的放大图；
图4是本发明第二实施例的具有检测线路的显示面板的结构示意图；
图5是本发明第三实施例的显示面板的检测方法的流程图。
【具体实施方式】
下面结合附图和实施例对本发明进行详细的说明。
请参阅图1，图1是本发明第一实施例的具有检测线路的显示面板的结构示意图。如图1所示，显示面板10包括显示区11以及设置在显示区11外围的检测线路12。
其中，检测线路12包括短路棒121以及多个邦定区固化垫122。短路棒121的两端耦接测试固化垫123，以从测试固化垫123获取检测信号。邦定区固化垫122的一端耦接短路棒121，另一端耦接显示面板10的显示区11，以将检测信号传输到显示区11。
本实施例中，在邦定区固化垫122和短路棒121之间设置有多组开关元件124。开关元件124在检测时接收检测信号后开启，以将短路棒121上的检测信号传输到邦定区固化垫122。在检测结束后处于关闭状态，以防止显示面板10正常显示时邦定区固化垫122上的信号互相干扰。具体为，在邦定区固化垫122的两端分别设置一个附加固化垫125，附加固化垫125与短路棒121连接。在检测结束后，关闭信号例如低电平信号从附加固化垫125中输入，然后通过短路棒121传输到开关元件124，以关闭开关元件124。
通过设置开关元件124，使得在检测结束后不需要额外的机台断开邦定区固化垫122与短路棒121之间的连接，以达到节约检测成本的目的。以下将具体介绍开关元件124与短路棒121和邦定区固化垫122之间的连接关系。
请一起参阅图1、图2和图3，图2是图1所示的扫描侧的检测线路的结构示意图，图3是数据侧的检测线路的结构示意图。检测线路12包括扫描侧的检测线路12A和数据侧的检测线路12B。邦定区固化垫122包括扫描芯片邦定区固化垫122A和数据芯片邦定区固化垫122B，其中，扫描芯片邦定区固化垫122A设置在扫描侧的检测线路12A中，数据芯片邦定区固化垫122B对应设置在数据侧的检测线路12B中。本实施例的开关元件124为TFT 126，并且TFT 126的数量和邦定区固化垫122的数量相同。在扫描侧的检测线路12A中，TFT 126的栅极G和漏极D连接短路棒121，TFT 126的源极S分别与对应的扫描芯片邦定区固化垫122A连接。在数据侧的检测线路12B中，短路棒121进一步包括第一短路棒121A和第二短路棒121B，TFT 126的栅极G连接第一短路棒121A，漏极D连接第二短路棒121B，源极S分别与对应的数据芯片邦定区固化垫122B连接，附加固化垫125与第一短路棒121A连接。
以下介绍一下检测线路12的工作原理：
检测时，在扫描侧的检测线路12A中，检测信号例如高电平信号通过短路棒121后，打开TFT 126，然后通过扫描芯片邦定区固化垫122A进入显示区11，以打开显示区11中的薄膜晶体管M。在数据侧的检测线路12B中，检测信号例如高电平信号通过第一短路棒121A后，打开TFT 126，数据信号例如R、G、B信号由第二短路棒121B传输到打开的TFT 126，然后再传输到数据芯片固化垫122B中，进而进入显示区11，通过已打开的薄膜晶体管M后进行显示。
本实施例中，检测信号，即扫描侧的检测线路12A的高电平信号和数据侧的检测线路12B的数据信号R、G、B分别经过显示面板10的扫描线13和数据线14传输到显示区11中，而扫描线13和数据线14分别在邦定区固化垫122和显示区11之间形成一个扇形区域15。由于扇形区域15中的扫描线13和数据线14密度较大，在制作过程中较容易造成短路或断路等现象，因此，也有必要检测扇形区域15的线路情况。本发明的检测线路12由于需要扫描线13和数据线14分别传输检测信号到显示区11，因此，通过检测显示区11中的显示状态来判断扫描线13和数据线14的通断情况，即检测了扇形区域15中的线路是否有缺陷。
为了更进一步节省成本，本发明的检测线路还可以仅设置一组TFT。具体请参阅图4，图4是本发明第二实施例的具有检测线路的显示面板的结构示意图。图4所示的检测线路22和图1所示的检测线路12的不同之处在于：如图4所示，检测线路22仅设置一组TFT 226，即扫描侧的检测线路22A仅设置一个TFT 226，数据侧的检测线路22B同样也仅设置一个TFT 226。在扫描侧的检测线路22A中，TFT 226的栅极G和漏极D连接短路棒221，TFT 226的源极S分别连接多个扫描芯片邦定区固化垫222A。在数据侧的检测线路22B中，TFT 226的栅极G连接第一短路棒221A，漏极D连接第二短路棒221B，TFT 226的源极S分别连接多个数据芯片邦定区固化垫222B。
图4所示的检测线路22的工作原理和图1所示的检测线路12的工作原理相同，在此不再赘述。
其中，检测线路还可以设置其他组数的TFT，如两组、三组等，只要能够实现在检测时传输检测信号并在结束后处于关闭状态，从而不需要额外机台切断短路棒和邦定区固化垫之间的连接即可。开关元件还可以是其他能起开关作用的元件，在此不作限制。
承前所述，本发明的检测线路，由于在短路棒和邦定区固化垫之间设置了开关元件，使得在检测结束后不需要利用额外的机台来切断短路棒和邦定区固化垫之间的连接，节约了检测成本。另一方面，由于本发明通过邦定区固化垫传输检测信号到显示面板的显示区进行显示，因此本发明可以测试出扇形区域的缺陷，相对于从邦定区固化垫对侧传输检测信号进行检测的开关（Switch）测试方法，本发明的检测更加全面。
请参阅图5，图5是本发明第三实施例的显示面板的检测方法的流程图。如图5所示，本发明的显示面板的检测方法包括：
步骤S1：在显示面板的短路棒和邦定区固化垫之间设置有至少一组开关元件。
在步骤S1中，开关元件为TFT。具体TFT与短路棒和邦定区固化垫的连接方式如前文实施例所述，在此不再赘述。
步骤S2：向短路棒提供检测信号，以开启开关元件。
在步骤S2中，检测信号例如为高电平信号，用于打开开关元件。
其次，检测信号还包括R、G、B数据信号。
步骤S3：检测信号通过开启的开关元件后进入邦定区固化垫，然后传输到显示面板的显示区。
在步骤S3中，检测信号进入显示面板的显示区进行显示的原理如前文所述，在此不再赘述。
步骤S4：在检测结束后，向开关元件提供关闭开关元件的关闭信号，以防止显示面板正常显示时邦定区固化垫上的信号互相干扰。
在步骤S4中，具体为，在开关元件的两端设置附加固化垫，在检测结束后，附加固化垫输入关闭信号例如低电平信号，用于关闭开关元件。
综上所述，本发明在短路棒和邦定区固化垫之间设置开关元件，在检测时处于打开状态，以将检测信号传输到显示面板的显示区，在检测结束后处于关闭状态，以防止显示面板正常显示时，邦定区固化垫上的信号相互干扰。通过上述方式，本发明一方面在检测结束后不需要额外的机台断开短路棒和邦定区固化垫之间的连接，节省了检测成本；另一方面可检测出扇形区域的缺陷，相对于Witch检测方法，本发明的检测更加全面。
以上所述仅为本发明的实施方式，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换，或直接或间接运用在其他相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (18)

  1. 一种显示面板的检测线路，其中，所述检测线路包括：
    短路棒，所述短路棒的两端耦接测试固化垫，以从所述测试固化垫获取检测信号；
    多个邦定区固化垫，一端耦接所述短路棒，另一端耦接所述显示面板的显示区，以将所述检测信号传输到所述显示区；
    其中，在所述邦定区固化垫和所述短路棒之间设置有至少一组开关元件，所述开关元件在检测时接收所述检测信号后开启，以将所述短路棒上的检测信号传输到所述邦定区固化垫，并在检测结束后处于关闭状态，以防止所述显示面板正常显示时所述邦定区固化垫上的信号互相干扰。
  2. 根据权利要求1所述的检测线路，其中，在所述邦定区固化垫的两端分别设置一个附加固化垫，所述附加固化垫与所述短路棒连接，以通过所述短路棒传输关闭信号来关闭所述开关元件。
  3. 根据权利要求2所示的检测线路，其中，所述开关元件为TFT。
  4. 根据权利要求3所述的检测线路，其中，所述邦定区固化垫包括扫描芯片邦定区固化垫，所述扫描芯片邦定区固化垫的一端连接所述TFT的源极，所述TFT的栅极和漏极连接所述短路棒。
  5. 根据权利要求4所述的检测线路，其中，所述邦定区固化垫包括数据芯片邦定区固化垫，所述短路棒包括第一短路棒和第二短路棒，所述数据芯片邦定区固化垫的一端连接所述TFT的源极，所述TFT的栅极连接所述第一短路棒，所述TFT的漏极连接所述第二短路棒。
  6. 根据权利要求5所述的检测线路，其中，所述附加固化垫与所述第一短路棒连接。
  7. 根据权利要求3所述的检测线路，其中，所述检测线路仅设置一组所述TFT时，所述TFT的栅极和漏极连接所述短路棒，所述TFT的源极分别连接多个所述邦定区固化垫。
  8. 根据权利要求3所述的检测线路，其中，所述检测线路设置多组所述TFT时，多组所述TFT的数量和所述邦定区固化垫的数量相同，且所述TFT的栅极和漏极连接所述短路棒，所述TFT的源极分别与对应的所述邦定区固化垫连接。
  9. 一种显示面板，其中，所述显示面板包括显示区以及设置于所述显示区外围的检测线路，其中，所述检测线路包括：
    短路棒，所述短路棒的两端耦接测试固化垫，以从所述测试固化垫获取检测信号；
    多个邦定区固化垫，一端耦接所述短路棒，另一端耦接所述显示面板的显示区，以将所述检测信号传输到所述显示区；
    其中，在所述邦定区固化垫和所述短路棒之间设置有至少一组开关元件，所述开关元件在检测时接收所述检测信号后开启，以将所述短路棒上的检测信号传输到所述邦定区固化垫，并在检测结束后处于关闭状态，以防止所述显示面板正常显示时所述邦定区固化垫上的信号互相干扰。
  10. 根据权利要求9所述的显示面板，其中，在所述邦定区固化垫的两端分别设置一个附加固化垫，所述附加固化垫与所述短路棒连接，以通过所述短路棒传输关闭信号来关闭所述开关元件。
  11. 根据权利要求10所述的显示面板，其中，所述开关元件为TFT。
  12. 根据权利要求11所述的显示面板，其中，所述邦定区固化垫包括扫描芯片邦定区固化垫，所述扫描芯片邦定区固化垫的一端连接所述TFT的源极，所述TFT的栅极和漏极连接所述短路棒。
  13. 根据权利要求12所述的显示面板，其中，所述邦定区固化垫包括数据芯片邦定区固化垫，所述短路棒包括第一短路棒和第二短路棒，所述数据芯片邦定区固化垫的一端连接所述TFT的源极，所述TFT的栅极连接所述第一短路棒，所述TFT的漏极连接所述第二短路棒。
  14. 根据权利要求13所述的显示面板，其中，所述附加固化垫与所述第一短路棒连接。
  15. 根据权利要求11所述的显示面板，其中，所述检测线路仅设置一组所述TFT时，所述TFT的栅极和漏极连接所述短路棒，所述TFT的源极分别连接多个所述邦定区固化垫。
  16. 根据权利要求11所述的显示面板，其中，所述检测线路设置多组所述TFT时，多组所述TFT的数量和所述邦定区固化垫的数量相同，且所述TFT的栅极和漏极连接所述短路棒，所述TFT的源极分别与对应的所述邦定区固化垫连接。
  17. 一种显示面板的检测方法，其中，所述方法包括以下步骤：
    在所述显示面板的短路棒和邦定区固化垫之间设置有至少一组开关元件；
    向所述短路棒提供检测信号，以开启所述开关元件；
    所述检测信号通过开启的所述开关元件后进入所述邦定区固化垫，然后传输到所述显示面板的显示区；
    在检测结束后，向所述开关元件提供关闭所述开关元件的关闭信号，以防止所述显示面板正常显示时所述邦定区固化垫上的信号互相干扰。
  18. 根据权利要求17所述的检测方法，其中，所述在检测结束后，向所述开关元件提供关闭所述开关元件的关闭信号包括步骤：在所述开关元件的两端设置附加固化垫，在检测结束后，所述附加固化垫输入关闭信号，用于关闭所述开关元件。
PCT/CN2013/078560 2013-06-20 2013-07-01 一种显示面板、显示面板的检测线路及其检测方法 Ceased WO2014201729A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US14/006,087 US9483969B2 (en) 2013-06-20 2013-07-01 Liquid crystal panel, and testing circuit and testing method thereof

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201310247234.1 2013-06-20
CN201310247234.1A CN103325327B (zh) 2013-06-20 2013-06-20 一种显示面板、显示面板的检测线路

Publications (1)

Publication Number Publication Date
WO2014201729A1 true WO2014201729A1 (zh) 2014-12-24

Family

ID=49194038

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2013/078560 Ceased WO2014201729A1 (zh) 2013-06-20 2013-07-01 一种显示面板、显示面板的检测线路及其检测方法

Country Status (3)

Country Link
US (1) US9483969B2 (zh)
CN (1) CN103325327B (zh)
WO (1) WO2014201729A1 (zh)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103499892B (zh) 2013-09-29 2016-02-24 京东方科技集团股份有限公司 栅线通断检测方法及检测设备
KR102272789B1 (ko) * 2014-01-15 2021-07-05 삼성디스플레이 주식회사 표시 패널 및 이를 포함하는 표시 장치
CN104218042B (zh) * 2014-09-02 2017-06-09 合肥鑫晟光电科技有限公司 一种阵列基板及其制备方法、显示装置
US9263477B1 (en) * 2014-10-20 2016-02-16 Shenzhen China Star Optoelectronics Technology Co., Ltd. Tri-gate display panel
CN104299975B (zh) * 2014-10-28 2017-05-31 合肥鑫晟光电科技有限公司 阵列基板及其制作方法
CN104656292B (zh) * 2015-03-17 2018-04-17 京东方科技集团股份有限公司 阵列基板及制造方法、显示面板及其测试方法、显示装置
CN104965321B (zh) * 2015-07-01 2018-11-23 深圳市华星光电技术有限公司 显示面板检测系统及检测方法
CN106940975A (zh) 2016-01-04 2017-07-11 中华映管股份有限公司 检测装置及检测方法
CN105676047B (zh) * 2016-01-05 2018-10-30 京东方科技集团股份有限公司 电路检测装置及检测显示面板绑定区电路的方法
CN105445979B (zh) * 2016-01-29 2018-09-11 京东方科技集团股份有限公司 一种点灯治具及点灯方法
CN106324928B (zh) * 2016-08-31 2019-10-25 深圳市华星光电技术有限公司 一种面板的外引脚压合区
CN106782248B (zh) * 2017-01-12 2021-01-15 京东方科技集团股份有限公司 一种显示面板检测装置及显示面板检测的方法
CN108507599B (zh) * 2017-02-24 2021-05-14 奕瑞影像科技（太仓）有限公司 具有高兼容性的x射线传感器面板、x射线探测器
CN106910446B (zh) * 2017-04-19 2020-12-18 惠科股份有限公司 一种显示面板
CN107248387A (zh) * 2017-07-19 2017-10-13 深圳市华星光电半导体显示技术有限公司 显示面板的测试电路及显示装置
CN107331337A (zh) * 2017-07-31 2017-11-07 京东方科技集团股份有限公司 阵列基板及其测试装置、方法以及显示装置
CN108565278A (zh) * 2018-02-28 2018-09-21 京东方科技集团股份有限公司 阵列基板母板、阵列基板、显示装置及其制作方法
CN108807492B (zh) * 2018-06-29 2021-12-28 京东方科技集团股份有限公司 显示面板及其制作方法、检测方法和显示装置
CN208722547U (zh) * 2018-09-30 2019-04-09 惠科股份有限公司 显示面板测试电路和显示面板测试装置
US11073549B2 (en) 2018-09-30 2021-07-27 HKC Corporation Limited Display panel test circuit and display panel test device
CN109256073A (zh) * 2018-11-09 2019-01-22 惠科股份有限公司 一种显示面板检测结构及显示设备
CN109345988B (zh) * 2018-11-21 2021-04-30 惠科股份有限公司 测试电路、显示面板测试装置和显示装置
CN109872667B (zh) * 2019-03-28 2022-10-11 惠科股份有限公司 信号检测系统及显示装置
CN111653226B (zh) * 2020-07-06 2023-05-23 京东方科技集团股份有限公司 检测电路及其驱动方法、显示面板
CN112331118B (zh) * 2020-11-30 2023-09-26 武汉天马微电子有限公司 一种显示面板和显示装置
CN113077726B (zh) * 2021-03-23 2022-06-10 深圳市华星光电半导体显示技术有限公司 显示面板及其制备方法

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05113575A (ja) * 1991-10-23 1993-05-07 Matsushita Electric Ind Co Ltd 液晶表示パネルとその製造方法
US20070132931A1 (en) * 2005-12-12 2007-06-14 Au Optronics Corporation Active matrix substrate
CN101004490A (zh) * 2006-01-18 2007-07-25 中华映管股份有限公司 主动元件阵列基板、液晶显示面板与两者的检测方法
CN101303462A (zh) * 2008-07-04 2008-11-12 友达光电股份有限公司 液晶显示面板的检测电路与方法
CN101334541A (zh) * 2008-07-23 2008-12-31 友达光电股份有限公司 阵列基板及其显示面板
CN101355082A (zh) * 2008-09-12 2009-01-28 友达光电股份有限公司 显示面板及其测试系统
TW200937070A (en) * 2008-02-29 2009-09-01 Emerging Display Tech Corp Wiring layout structure of passive LCD panel
CN101533593A (zh) * 2009-03-26 2009-09-16 福州华映视讯有限公司 具有数组检测及面板检测共享短路杆的液晶显示面板

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5233448A (en) * 1992-05-04 1993-08-03 Industrial Technology Research Institute Method of manufacturing a liquid crystal display panel including photoconductive electrostatic protection
EP0842536B1 (en) * 1995-07-31 2002-09-25 iFire Technology Inc. Semiconductor switch array with electrostatic discharge protection and method of fabricating
JPH10116834A (ja) * 1996-10-11 1998-05-06 Toshiba Corp 半導体装置の製造方法
KR100244182B1 (ko) * 1996-11-29 2000-02-01 구본준 액정표시장치
GB2342213B (en) * 1998-09-30 2003-01-22 Lg Philips Lcd Co Ltd Thin film transistor substrate with testing circuit
KR100900537B1 (ko) * 2002-08-23 2009-06-02 삼성전자주식회사 액정 표시 장치, 그 검사 방법 및 제조 방법
TWI300543B (en) * 2004-06-01 2008-09-01 Au Optronics Corp Liquid crystal display panel having a cell test structure and method for making the same
KR101129618B1 (ko) * 2005-07-19 2012-03-27 삼성전자주식회사 액정 표시 패널 및 이의 검사 방법과 이의 제조방법
TW201020609A (en) * 2008-11-26 2010-06-01 Chunghwa Picture Tubes Ltd LCD panel having shared shorting bars for array test and panel test
TWM357609U (en) * 2008-12-08 2009-05-21 Chunghwa Picture Tubes Ltd LCD panels capable of testing cell defects, line defects and layout defects
CN101847357A (zh) * 2009-03-23 2010-09-29 友达光电股份有限公司 显示面板、显示装置及其测试方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05113575A (ja) * 1991-10-23 1993-05-07 Matsushita Electric Ind Co Ltd 液晶表示パネルとその製造方法
US20070132931A1 (en) * 2005-12-12 2007-06-14 Au Optronics Corporation Active matrix substrate
CN101004490A (zh) * 2006-01-18 2007-07-25 中华映管股份有限公司 主动元件阵列基板、液晶显示面板与两者的检测方法
TW200937070A (en) * 2008-02-29 2009-09-01 Emerging Display Tech Corp Wiring layout structure of passive LCD panel
CN101303462A (zh) * 2008-07-04 2008-11-12 友达光电股份有限公司 液晶显示面板的检测电路与方法
CN101334541A (zh) * 2008-07-23 2008-12-31 友达光电股份有限公司 阵列基板及其显示面板
CN101355082A (zh) * 2008-09-12 2009-01-28 友达光电股份有限公司 显示面板及其测试系统
CN101533593A (zh) * 2009-03-26 2009-09-16 福州华映视讯有限公司 具有数组检测及面板检测共享短路杆的液晶显示面板

Also Published As

Publication number Publication date
CN103325327A (zh) 2013-09-25
US9483969B2 (en) 2016-11-01
US20140375344A1 (en) 2014-12-25
CN103325327B (zh) 2016-03-30

Similar Documents

Publication Publication Date Title
WO2014201729A1 (zh) 一种显示面板、显示面板的检测线路及其检测方法
WO2015058433A1 (zh) 面板检测装置及显示面板
WO2014019248A1 (zh) 一种检测线路及液晶显示面板的制作方法
WO2013152514A1 (zh) 液晶面板、液晶模组和检查方法
WO2013174046A1 (zh) 液晶显示面板
WO2014101304A1 (zh) 显示面板的缺陷检测方法及其检测装置
WO2018010254A1 (zh) 液晶显示面板外围设计电路及采用该电路的液晶显示面板
WO2017177509A1 (zh) 检测单元、阵列基板、液晶显示装置以及检测方法
WO2016165248A1 (zh) 一种驱动芯片、驱动板及其测试方法、显示装置
WO2017045220A1 (zh) 一种goa电路及液晶显示器
WO2018176562A1 (zh) 液晶显示面板及液晶显示装置
WO2020103258A1 (zh) 测试电路、显示面板测试装置和显示装置
WO2020093538A1 (zh) 显示面板中存储器的保护电路及显示装置
WO2016101498A1 (zh) 一种goa电路模块及其测试方法、显示面板和显示装置
WO2020220531A1 (zh) 一种阵列基板行驱动电路及显示面板
WO2020062614A1 (zh) 显示面板及其驱动方法、显示装置
WO2018014412A1 (zh) Goa电路及液晶显示面板
WO2014201717A1 (zh) 主动矩阵显示装置、扫描驱动电路及其扫描驱动方法
WO2018040276A1 (zh) 平面显示装置及其扫描驱动电路
WO2017015979A1 (zh) 测试引出线结构及测试装置
WO2013078784A1 (zh) 显示器、液晶模组以及固定结构
CN103927956B (zh) 一种显示面板的驱动电路、显示面板和显示装置
WO2014086062A1 (zh) 基于三维晶体管设计的液晶屏及液晶显示器
WO2016173030A1 (zh) 一种液晶显示面板的检测安装装置
WO2017020371A1 (zh) 一种液晶显示装置及其栅极驱动电路

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 14006087

Country of ref document: US

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 13887176

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 13887176

Country of ref document: EP

Kind code of ref document: A1