WO2020103258A1 - 测试电路、显示面板测试装置和显示装置 - Google Patents

测试电路、显示面板测试装置和显示装置

Info

Publication number
WO2020103258A1
WO2020103258A1 PCT/CN2018/122184 CN2018122184W WO2020103258A1 WO 2020103258 A1 WO2020103258 A1 WO 2020103258A1 CN 2018122184 W CN2018122184 W CN 2018122184W WO 2020103258 A1 WO2020103258 A1 WO 2020103258A1
Authority
WO
WIPO (PCT)
Prior art keywords
display panel
test
circuit
signal
control
Prior art date
Application number
PCT/CN2018/122184
Other languages
English (en)
French (fr)
Inventor
吴川
Original Assignee
惠科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 惠科股份有限公司 filed Critical 惠科股份有限公司
Publication of WO2020103258A1 publication Critical patent/WO2020103258A1/zh

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present application relates to the technical field of display panels, in particular to a test circuit, a display panel test device, and a display device.
  • Panel test refers to a simple screen test after cutting out a single panel on a large substrate through some traces set on the panel to detect some bad problems of the panel and facilitate subsequent repairs.
  • the scan line and the data line will be divided into odd and even designs, which are respectively connected to the test equipment through a short circuit ring, the test equipment contacts the pad through the probe, and the test signal is input into the panel to complete the test on the panel.
  • connection line between the pad and the panel needs a process-laser cutting, disconnecting all data lines and scanning lines from the short circuit ring, so that a production process will be added in the panel production process, Increased production costs.
  • the main purpose of the present application is to provide a test circuit, which aims to solve the problem of adding a laser cutting production process in the panel production process and increasing the production cost.
  • the present application proposes a test circuit.
  • the display panel includes N scan lines and M data lines.
  • the test circuit includes:
  • At least one scanning line pad arranged to correspond to N scanning lines of the display panel through a short-circuit ring;
  • At least one data line pad configured to correspondingly connect M data lines of the display panel through a short-circuit ring
  • the M first switch circuits are correspondingly arranged on the M data lines;
  • N second switch circuits, and the N second switch circuits are correspondingly arranged on N scan lines;
  • the test device is configured to output a first control signal to control M of the first switching circuits and N of the second switching circuits to be turned on, and output the test via the scan line pad and the data line pad Test signals from the display panel to the display panel;
  • a first control pad including a first signal input terminal, a second signal input terminal, and a signal output terminal, the first signal input terminal is configured to receive the first control output from the test equipment Signal, and output the first control signal to the first switch circuit and the second switch circuit through the signal output terminal; the second signal input terminal is set to receive after the display panel test is completed The second control signal output by the signal generator provided on the display panel is output to the first switch circuit and the second switch circuit via the signal output terminal.
  • the second signal input terminal of the first control pad is suspended when the first signal input terminal receives the first control signal.
  • the signal generator is bonded to the display panel after the display panel is tested, and is connected to the second signal input terminal of the first control pad through a connection line.
  • the first switch circuit and the second switch circuit are thin film transistors.
  • the first control signal is at a first level
  • the second control signal is at a second level
  • the first control signal is high level and the second control signal is low level.
  • the voltage value of the first control signal is greater than or equal to 10V and less than or equal to 40V
  • the voltage value of the second control signal is greater than or equal to -20V and less than or equal to -3V.
  • the first switch circuit and the second switch circuit are NPN transistors.
  • the present application also proposes a display panel testing device, including the test circuit as described above, the test circuit being configured to test a display panel, the display panel including N scan lines and M data lines, wherein the test circuit include:
  • At least one scanning line pad arranged to correspond to N scanning lines of the display panel through a short-circuit ring;
  • At least one data line pad configured to correspondingly connect M data lines of the display panel through a short-circuit ring
  • the M first switch circuits are correspondingly arranged on the M data lines;
  • N second switch circuits, and the N second switch circuits are correspondingly arranged on N scan lines;
  • the test device is configured to output a first control signal to control M of the first switching circuits and N of the second switching circuits to be turned on, and output the test via the scan line pad and the data line pad Test signals from the display panel to the display panel;
  • a first control pad including a first signal input terminal, a second signal input terminal, and a signal output terminal, the first signal input terminal is configured to receive the first control output from the test equipment Signal, and output the first control signal to the first switch circuit and the second switch circuit through the signal output terminal; the second signal input terminal is set to receive after the display panel test is completed The second control signal output by the signal generator provided on the display panel is output to the first switch circuit and the second switch circuit via the signal output terminal.
  • the second signal input terminal of the first control pad is suspended when the first signal input terminal receives the first control signal.
  • the signal generator is bonded to the display panel after the display panel is tested, and is connected to the second signal input terminal of the first control pad through a connection line.
  • the first switch circuit and the second switch circuit are thin film transistors.
  • the first control signal is at a first level
  • the second control signal is at a second level
  • the first control signal is high level and the second control signal is low level.
  • the first switch circuit and the second switch circuit are NPN transistors.
  • the present application also proposes a display device including a display panel and the display panel test device as described above.
  • the display panel test device includes the test circuit, the test circuit is configured to test the display panel, and the display panel includes N Scanning lines and M data lines, wherein the test circuit includes:
  • At least one scanning line pad arranged to correspond to N scanning lines of the display panel through a short-circuit ring;
  • At least one data line pad configured to correspondingly connect M data lines of the display panel through a short-circuit ring
  • the M first switch circuits are correspondingly arranged on the M data lines;
  • N second switch circuits, and the N second switch circuits are correspondingly arranged on N scan lines;
  • the test device is configured to output a first control signal to control M of the first switching circuits and N of the second switching circuits to be turned on, and output the test via the scan line pad and the data line pad Test signals from the display panel to the display panel;
  • a first control pad including a first signal input terminal, a second signal input terminal, and a signal output terminal, the first signal input terminal is configured to receive the first control output from the test equipment Signal, and output the first control signal to the first switch circuit and the second switch circuit through the signal output terminal; the second signal input terminal is set to receive after the display panel test is completed The second control signal output by the signal generator provided on the display panel is output to the first switch circuit and the second switch circuit via the signal output terminal.
  • the display panel is further provided with a second control pad, and the second control pad is connected in series between the first control pad and the signal generator.
  • the second control pad is connected to the first control pad through a metal wire.
  • a plurality of mounting pads are further provided on the display panel, and the M first switch circuits and the N second switch circuits respectively pass through the plurality of mounting pads and M pieces of data
  • the line is connected to the N scanning lines.
  • the technical solution of the present application constitutes a test circuit by using at least one scan line pad, at least one data line pad, M first switch circuits, N second switch circuits, first control pads, and test equipment.
  • M data lines are connected to the data line pads through M first switch circuits
  • N scan lines of the display panel are connected to the scan line pads through N second switch circuits
  • the controlled terminals of the N second switching circuits are connected to the first control pad through a short-circuit ring.
  • the first control pad includes a first signal input terminal, a second signal input terminal and a signal output terminal, and the first signal input terminal and the test The device is connected, and the second control signal remains floating before the display panel is tested.
  • the first signal input terminal receives the first control signal of the test device and outputs it to the first switch circuit and the second switch through the signal output terminal
  • the circuit controls the conduction of the first switch circuit and the second switch circuit, and the test equipment outputs test signals to the display panel via the first switch circuit and the second switch circuit for testing.
  • the signal generator is installed On the display panel, and connected to the second signal input terminal of the first control pad through the connection line, the signal generator outputs the second control signal to the first switch circuit and the second switch circuit, the first switch circuit and the second switch
  • the circuit is turned off to control the data line, scanning line and short circuit ring of the display panel to be disconnected, thereby solving the problem of adding a laser cutting production process in the production process of the panel and increasing the production cost.
  • 1 is a schematic diagram of functional modules of an embodiment of the test circuit of the application.
  • FIG. 2 is a schematic diagram of functional modules of an embodiment of a display device of the present application.
  • FIG. 3 is a schematic diagram of a circuit structure of an embodiment of a display device of the present application.
  • This application proposes a test circuit 100.
  • FIG. 1 is a schematic diagram of functional modules of an embodiment of a test circuit of the present application.
  • the present application proposes a test circuit 100.
  • the display panel 200 includes N scan lines and N data lines.
  • the test circuit 100 includes:
  • At least one scanning line pad 20 which is configured to correspond to N scanning lines of the display panel through a short-circuit ring;
  • At least one data line pad 10 configured to correspondingly connect M data lines of the display panel through a short-circuit ring;
  • M first switch circuits 30, the M first switch circuits 30 are arranged one-to-one on the M data lines;
  • N second switching circuits 40, the N second switching circuits 40 are arranged one-to-one on the N scanning lines;
  • the test device 60 is configured to output a first control signal to control the M first switch circuits 30 and the N second switch circuits 40 to be turned on, and pass through the scan line pad 20 and the data line pad 10 Output a test signal for testing the display panel 200 to the display panel 200;
  • a first control pad 50, the first control pad 50 includes a first signal input terminal, a second signal input terminal, and a signal output terminal;
  • the first signal input terminal is configured to receive the first control signal output by the test device 60 and output the first control signal to the first switch circuit 30 and the second switch via the signal output terminal Circuit 40;
  • the second signal input terminal is configured to receive a second control signal output by a signal generator provided on the display panel after the display panel test is completed, and output to the first control signal via the signal output terminal A switch circuit 30 and the second switch circuit 40.
  • the display panel 200 includes but is not limited to a liquid crystal display panel, an organic light emitting diode display panel, a field emission display panel, a plasma display panel, and a curved panel.
  • the liquid crystal panel includes a thin film transistor liquid crystal display panel, TN ( Twisted Nematic (twisted nematic) panel, VA (Vertical Alignment) panel, IPS (In-Plane Switching, plane switching, etc.
  • each data line of the display panel 200 is connected to the data line pad 10 through the short-circuit ring B1.
  • the scan lines are also connected to the scan line pad 20 through the short-circuit ring B1
  • the test device 60 applies a test signal to the scan line pad 20 and the data line pad 10 through the probe to achieve charging.
  • the scan line and the data line of the display panel 200 can be divided into a parity connection design, that is, the data line of the display panel 200 or Scan line odd-numbered rows or odd-numbered columns are connected by the same short-circuit ring B1, and even-numbered rows or even-numbered columns are connected by the same short-circuit ring B1.
  • Scan line pads 20 and data line pads 10 can be set correspondingly.
  • the scan line pad 20 is the scan line odd pad and the scan line even pad
  • the data line pad 10 is the data line odd pad and the data line even pad
  • the data line of the display panel 200 and
  • the data lines can also be divided into scan lines or data lines 123/456/789 ... that is in units of 3 lines, or 1234/5678 ... that is, units of 4 lines, scan line pad 20 and data lines
  • the pads 10 are correspondingly set according to the design of the data lines and the scanning lines, and may be set to three, four, or more respectively, which is not specifically limited herein.
  • the short-circuit ring B1 is set to shield external signal interference during the testing process of the display panel 200 to avoid the influence of external signals on the internal circuit connection.
  • the first switching circuit 30 and the second switching circuit 40 may use switching components or circuits with an on-off function.
  • the first switching circuit 30 and the second switching circuit 40 respectively correspond to the data lines of the display panel 200
  • the signal input terminals of the M first switch circuits 30 are connected to the data line pad 10 through the short-circuit ring B1
  • the signal input terminals of the N second switch circuits 40 are connected to the scan line pad through the short-circuit ring B1 20.
  • Both the controlled end of the first switch circuit 30 and the controlled end of the second switch circuit 40 are connected to the first control pad 50.
  • the first control pad 50 includes two signal input terminals and a signal output terminal. Before the display panel 200 is tested, the first signal signal input terminal and the test device 60 are connected to the first signal input terminal through the probe, and the second signal input The terminal remains floating and no signal is input. During the test of the test circuit 100, the test device 60 outputs the first control signal to the first switch circuit 30 and the second switch circuit 40. The first control signal is set to control the first switch circuit 30 and The two switch circuits 40 are turned on. After the switch circuit is turned on, the test device 60 outputs a test signal to the display panel 200 for testing. The test device 60 has a first signal terminal, a second signal terminal, and a third signal terminal.
  • the first signal terminal It is set to output an analog gray-scale voltage signal to the data line pad 10, and the second signal terminal is set to output a line scan control signal to the scan line pad 20, so as to realize uniform charging of pixels on the display panel 200 and complete the test of the display panel 200
  • the third signal terminal is configured to output the first control signal to the first signal input terminal of the first control pad 50, and then output the first control signal to the first switch circuit 30 and the second switch circuit 40.
  • the test device 60 may include a data driving integrated circuit configured to output an analog gray scale voltage and a voltage, a scan driving integrated circuit configured to output a line scanning control signal, and a signal output module outputting a first control signal, the data driving integrated circuit, the driving integrated circuit It is integrated with the signal output module on the same circuit board and connected to the pad through the probe respectively.
  • the test device 60 can also be set as a single control chip to output the test signal and the first control signal respectively.
  • the test device 60 can be tested according to the manufacturing process and test The mode corresponds to the setting, and no specific requirements are made here.
  • the signal generator is bonded on the display panel and connected to the second signal input terminal of the first control pad through the connecting line, and the signal generator 210 is set to output the second control signal, the second The control signal is set to control the first switch circuit 30 and the second switch circuit 40 to be turned off, and the signal generator 210 can be set to a single control chip or a specific circuit composed of components, etc., and no specific requirements are made here.
  • the working process of the test circuit 100 is:
  • the display panel 200 flows into the panel test process.
  • the M data lines of the display panel 200 are connected one-to-one to the data line pads 10 through the M first switch circuits 30, and the N scan lines of the display panel 200 are paired One is connected to the scanning line pad 20 through N second switch circuits 40, the controlled end of the first switch circuit 30 and the controlled end of the second switch circuit 40 are connected to the first control pad 50, the first control pad
  • the first signal input terminal of 50 is connected to the signal generator 210 of the test equipment 60 signal generator 210;
  • the test device 60 outputs the first control signal to the first signal input terminal of the first control pad 50, the M first switch circuits 30 and the N second switch circuits 40 are all turned on, and the test device 60 passes the data respectively
  • the line pad 10 and the scan line pad 20 output test signals to the pixels of the display panel 200 for uniform charging, thereby completing the panel test;
  • the signal generator 210 is bonded to the display panel and connected to the second signal input terminal of the first control pad 50 through the signal line.
  • the second control signal output by the signal generator 210 is passed through
  • the two signal input terminals are output to the first switching circuit 30 and the second switching circuit 40, the first switching circuit 30 and the second switching circuit 40 are turned off, the data line and the scanning line of the display panel 200 are separated from the short-circuit ring B1, respectively, and the display panel
  • the 200 data lines and scanning lines can work normally without laser cutting, which improves the production efficiency of the panel, thereby solving the problem of adding a laser cutting production process in the panel production process and increasing the production cost.
  • the technical solution of the present application is constituted by using at least one scan line pad 20, at least one data line pad 10, M first switch circuits 30, N second switch circuits 40, first control pads 50, and test equipment 60
  • M data lines of the display panel 200 are connected to the data line pad 10 via M first switch circuits 30, and N scan lines of the display panel 200 are connected to the scan line pad via N second switch circuits 40 20.
  • the controlled terminals of the M first switch circuits 30 and the controlled terminals of the N second switch circuits 40 are connected to the first control pad 50 through a short-circuit ring.
  • the first control pad 50 includes a first signal input terminal, The second signal input terminal and the signal output terminal, the first signal input terminal is connected to the test equipment 60, the second control signal remains in a floating state before the display panel 200 is tested, and when the test circuit 100 works, the first signal input terminal receives the test equipment 60 The first control signal, and output to the first switch circuit 30 and the second switch circuit 40 via the signal output terminal to control the first switch circuit 30 and the second switch circuit 40 to be turned on, and the test device 60 passes the first switch circuit 30 and the second switch circuit 40 respectively output test signals to the display panel 200 for testing.
  • the signal generator is installed on the display panel 200, and the second control pad 50 is connected to the second The signal input terminal is connected, and the signal generator outputs a second control signal to the first switch circuit 30 and the second switch circuit 40, and the first switch circuit 30 and the second switch circuit 40 are turned off to control the data line and scan of the display panel 200
  • the line is disconnected from the short-circuit ring Bar, thereby solving the problem of adding a laser cutting production process in the production process of the panel and increasing the production cost.
  • the first switch circuit 30 and the second switch circuit 40 are thin film transistors.
  • the structure and working principle of the thin film transistor are similar to the field effect transistor, mainly including the gate, the source and the drain, which can be divided into N-type and P-type.
  • the thin-film transistor is an N-type transistor, it is set in the data
  • the drain of each thin film transistor is correspondingly connected to the data line pad 10
  • the source of each thin film transistor is connected to the display panel 200
  • the gate of each thin film transistor is connected to the first control pad 50.
  • a signal input terminal is connected, and the gate of the thin film transistor is turned on when receiving the high level output from the testing device 60, that is, the first control signal, and the test signal is input to the display panel 200 through the thin film transistor for charging test.
  • the thin film transistor The gate of the LED is turned off at the low level output by the receiving signal generator 210, that is, the second control signal, so that the short-circuit ring B1 is separated from the data line, and the display panel 200 can work normally.
  • the first control signal is at a first level
  • the second control signal is at a second level
  • both the first switch circuit 30 and the second switch circuit 40 are turned on at the first level, the second level is turned off, and the voltage value of the first level is generally a positive voltage of 10V ⁇ 40V, the second The level voltage value is generally -20V ⁇ 3V, and the high and low level voltage values may vary according to the switch types or start voltages selected by the first switch circuit 30 and the second switch circuit 40, and no specific limitation is made here.
  • the first switching circuit 30 and the second switching circuit 40 are NPN transistors.
  • the first switching circuit 30 and the second switching circuit 40 may also use NPN transistors, the base of the NPN transistor is connected to the signal output terminal of the first control pad 50, and the collector of the NPN transistor is respectively lined with the scanning line
  • the pad is connected to the data line pad.
  • the emitter of the NPN transistor is connected to the data line and the scan line respectively.
  • the NPN transistor is turned on when receiving a high level.
  • the test device 60 outputs a test signal to the display panel 200 for testing.
  • the NPN transistor receives The low level turns off, and both the data line and the scanning line are disconnected from the short-circuit ring Bar.
  • the present application also proposes a display panel testing device 300.
  • the display panel testing device 300 includes a test circuit 100.
  • the specific structure of the test circuit 100 refers to the above embodiments. Since the display panel testing device 300 adopts all the technologies of all the above embodiments The solution therefore has at least all the technical effects brought by the technical solutions of the above embodiments, which will not be repeated here.
  • FIG. 2 is a schematic diagram of a functional module of an embodiment of the display device of the present application.
  • the display The data line and the scanning line of the panel 200 are correspondingly connected to the display panel test device 300, and receive the test signal output by the display panel test device 300 to perform the panel test, and can also receive the driving signal to drive and display the display panel 200 after the test is completed, the display panel The test device 300 can also be bonded on the display panel 200, and the display panel 200 can be driven after the display panel 200 is tested.
  • the display panel 200 is further provided with a second control pad 220 which is connected in series between the first control pad 50 and the signal generator 210 .
  • a second control pad 220 is further provided on the display panel 200, and the second control pad 220 is provided.
  • the second control pad 220 is bonded on the display panel, and is connected to the first control through the connecting line The pad 50 is connected.
  • the second control pad 220 is connected to the first control pad 50 through a metal wire.
  • the metal wire receives the second control signal output by the signal generator 210, the metal wire and the second signal input end of the first control pad 50 can be connected by welding, the material of the metal wire can be aluminum wire, Copper wire or metal wire of other materials, metal wire has the advantages of high temperature resistance, small resistance, good conductivity, corrosion resistance, etc., which can effectively reduce signal attenuation.
  • FIG. 3 is a schematic diagram of a circuit structure of an embodiment of a display device of the present application.
  • the display panel 200 is further provided with a plurality of mounting pads 230, and the M first switching circuits 30 and the N second switch circuits 40 are connected to the M data lines and the N scan lines through the plurality of mounting pads 230, respectively.
  • the scan line and the data line are respectively bonded to the display panel through the mounting pad 230, and the other end of the mounting pad 230 is connected to each pixel through the data line and the scan line, thereby forming the structure of the display panel 200, which can ensure data
  • the lines and the scan lines are stably connected to each pixel to avoid movement of pixels caused by displacement of data lines or scan lines around the display panel 200, thereby ensuring the overall stability of the display panel 200.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

一种测试电路、显示面板测试装置和显示装置，其中，测试电路（100）包括至少一个扫描线衬垫（20）、至少一个数据线衬垫（10）、N个第一开关电路（30）、N个第二开关电路（40）、测试设备（60）和信号发生器（210）。测试设备（60），设置为控制N个第一开关电路（30）及N个第二开关电路（40）导通，并输出测试信号，控制衬垫（50）的第二信号输入端接收控制信号控制N个第一开关电路（30）及N个第二开关电路（40）关断。

Description

测试电路、显示面板测试装置和显示装置
相关申请
本申请要求2018年11月21日申请的，申请号为201811395116.4，名称为“测试电路、显示面板测试装置和显示装置”的中国专利申请的优先权，在此将其全文引入作为参考。
技术领域
本申请涉及显示面板技术领域，特别涉及一种测试电路、显示面板测试装置和显示装置。
背景技术
这里的陈述仅提供与本申请有关的背景信息，而不必然地构成现有技术。
面板测试是指在大基板上将单个面板切出来之后，通过设置在面板上的一些走线，进行简单的画面测试，以检测面板的一些不良问题，方便后续的修补等工作。通常为了提高检出率，扫描线和数据线会分成奇偶相连的设计，分别通过短路环与测试设备连接，测试设备通过探针接触衬垫，将测试信号输入面板中，完成对面板的测试，除了分奇偶数行外，还可以将扫描线或者数据线分成123/456/789……即以3行为单位，或者1234/5678……即4行为单位。
在面板测试完毕后，衬垫与面板之间的连接线需要进行一道工序-激光切割，将所有数据线及扫描线与短路环断开，这样，在面板生产过程中就会增加一道生产工序，增加了生产成本。
申请内容
本申请的主要目的是提供一种测试电路，旨在解决在面板生产过程中增加一道激光切割的生产工序，增加生产成本的问题。
为实现上述目的，本申请提出一种测试电路，所述显示面板包括N条扫描线以及M条数据线，所述测试电路包括：
至少一个扫描线衬垫，设置为通过短路环对应连接所述显示面板的N条扫描线；
至少一个数据线衬垫，设置为通过短路环对应连接所述显示面板的M条数据线；
M个第一开关电路，所述M个第一开关电路对应设置在M条所述数据线上；
N个第二开关电路，所述N个第二开关电路对应设置在N条所述扫描线上；
测试设备，设置为输出第一控制信号控制M个所述第一开关电路及N个所述第二开关电路导通，并经所述扫描线衬垫和所述数据线衬垫输出测试所述显示面板的测试信号至所述显示面板；以及
第一控制衬垫，所述第一控制衬垫包括第一信号输入端和第二信号输入端以及信号输出端，所述第一信号输入端，设置为接收所述测试设备输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路和所述第二开关电路；所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路和所述第二开关电路。可选地，所述第一控制衬垫的第二信号输入端在所述第一信号输入端接收到所述第一控制信号时悬空。
可选地，所述信号发生器在显示面板测试完毕后邦定在显示面板上，并通过连接线与所述第一控制衬垫的第二信号输入端连接。
可选地，所述第一开关电路及所述第二开关电路为薄膜晶体管。
可选地，所述第一控制信号为第一电平，所述第二控制信号为第二电平。可选地，所述第一控制信号为高电平，所述第二控制信号为低电平。
可选地，所述第一控制信号的电压值大于或者等于10V且小于或者等于40V，所述第二控制信号的电压值大于或者等于-20V且小于或者等于-3V。
可选地，所述第一开关电路及所述第二开关电路为NPN三极管。
本申请还提出一种显示面板测试装置，包括如上所述的测试电路，所述测试电路设置为测试显示面板，所述显示面板包括N条扫描线以及M条数据线，其中，所述测试电路包括：
至少一个扫描线衬垫，设置为通过短路环对应连接所述显示面板的N条扫描线；
至少一个数据线衬垫，设置为通过短路环对应连接所述显示面板的M条数据线；
M个第一开关电路，所述M个第一开关电路对应设置在M条所述数据线上；
N个第二开关电路，所述N个第二开关电路对应设置在N条所述扫描线上；
测试设备，设置为输出第一控制信号控制M个所述第一开关电路及N个所述第二开关电路导通，并经所述扫描线衬垫和所述数据线衬垫输出测试所述显示面板的测试信号至所述显示面板；以及
第一控制衬垫，所述第一控制衬垫包括第一信号输入端和第二信号输入端以及信号输出端，所述第一信号输入端，设置为接收所述测试设备输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路和所述第二开关电路；所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路和所述第二开关电路。
可选地，所述第一控制衬垫的第二信号输入端在所述第一信号输入端接收到所述第一控制信号时悬空。
可选地，所述信号发生器在显示面板测试完毕后邦定在显示面板上，并通过连接线与所述第一控制衬垫的第二信号输入端连接。
可选地，所述第一开关电路及所述第二开关电路为薄膜晶体管。
可选地，所述第一控制信号为第一电平，所述第二控制信号为第二电平。
可选地，所述第一控制信号为高电平，所述第二控制信号为低电平。
可选地，所述第一开关电路及所述第二开关电路为NPN三极管。
本申请还提出一种显示装置，包括显示面板和如上所述的显示面板测试装置，该显示面板测试装置包括所述测试电路，所述测试电路设置为测试显示面板，所述显示面板包括N条扫描线以及M条数据线，其中，所述测试电路包括：
至少一个扫描线衬垫，设置为通过短路环对应连接所述显示面板的N条扫描线；
至少一个数据线衬垫，设置为通过短路环对应连接所述显示面板的M条数据线；
M个第一开关电路，所述M个第一开关电路对应设置在M条所述数据线上；
N个第二开关电路，所述N个第二开关电路对应设置在N条所述扫描线上；
测试设备，设置为输出第一控制信号控制M个所述第一开关电路及N个所述第二开关电路导通，并经所述扫描线衬垫和所述数据线衬垫输出测试所述显示面板的测试信号至所述显示面板；以及
第一控制衬垫，所述第一控制衬垫包括第一信号输入端和第二信号输入端以及信号输出端，所述第一信号输入端，设置为接收所述测试设备输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路和所述第二开关电路；所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路和所述第二开关电路。
可选地，所述显示面板还设置有第二控制衬垫，所述第二控制衬垫串联在所述第一控制衬垫和所述信号发生器之间。
可选地，所述第二控制衬垫通过金属线与所述第一控制衬垫连接。
可选地，所述显示面板上还设置有多个安装衬垫，所述M个第一开关电路和所述N个第二开关电路分别通过多个所述安装衬垫与M条所述数据线和N条所述扫描线连接。
本申请技术方案通过采用至少一个扫描线衬垫、至少一个数据线衬垫、M个第一开关电路、N个第二开关电路、第一控制衬垫和测试设备构成了测试电路，显示面板的M条数据线经M个第一开关电路连接至数据线衬垫，显示面板的N条扫描线经N个第二开关电路连接至扫描线衬垫，M个第一开关电路的受控端及N个第二开关电路的受控端通过短路环与第一控制衬垫连接，第一控制衬垫包括第一信号输入端、第二信号输入端和信号输出端，第一信号输入端与测试设备连接，第二控制信号在显示面板测试前保持悬空状态，测试电路工作时，第一信号输入端接收测试设备的第一控制信号，并经信号输出端输出至第一开关电路和第二开关电路以控制第一开关电路和第二开关电路导通，测试设备经所述第一开关电路和第二开关电路分别输出测试信号至显示面板进行测试，在显示面板测试完毕后，信号发生器安装在显示面板上，并通过连接线与第一控制衬垫的第二信号输入端连接，信号发生器输出第二控制信号至第一开关电路和第二开关电路，第一开关电路和第二开关电路关断，以控制显示面板的数据线、扫描线与短路环断开，从而解决了在面板生产过程中增加一道激光切割的生产工序，增加生产成本的问题。
附图说明
为了更清楚地说明本申请实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图示出的结构获得其他的附图。
图1为本申请测试电路一实施例的功能模块示意图；
图2为本申请显示装置一实施例的功能模块示意图；
图3为本申请显示装置一实施例的电路结构示意图。
本申请目的的实现、功能特点及优点将结合实施例，参照附图做进一步说明。
具体实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本申请的一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
需要说明，在本申请中涉及“第一”、“第二”等的描述仅设置为描述目的，而不能理解为指示或暗示其相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。另外，全文中出现的“和/或”的含义为：包括三个并列的方案，以“A/B”为例，包括A方案，或B方案，或A和B同时满足的方案，另外，各个实施例之间的技术方案可以相互结合，但是必须是以本领域普通技术人员能够实现为基础，当技术方案的结合出现相互矛盾或无法实现时应当认为这种技术方案的结合不存在，也不在本申请要求的保护范围之内。
本申请提出一种测试电路100。
如图1所示，图1为本申请测试电路一实施例的功能模块示意图，本申请提出一种测试电路100，所述显示面板200包括N条扫描线以及N条数据线，所述测试电路100包括：
至少一个扫描线衬垫20，设置为通过短路环对应连接所述显示面板的N条扫描线；
至少一个数据线衬垫10，设置为通过短路环对应连接所述显示面板的M条数据线；
M个第一开关电路30，所述M个第一开关电路30一对一设置在M条所述数据线上；
N个第二开关电路40，所述N个第二开关电路40一对一设置在N条所述扫描线上；
测试设备60，设置为输出第一控制信号控制M个所述第一开关电路30及N个所述第二开关电路40导通，并经所述扫描线衬垫20和所述数据线衬垫10输出测试所述显示面板200的测试信号至所述显示面板200；
第一控制衬垫50，所述第一控制衬垫50包括第一信号输入端和第二信号输入端以及信号输出端；
所述第一信号输入端，设置为接收所述测试设备60输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路30和所述第二开关电路40；
所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路30和所述第二开关电路40。
本实施例中，所述显示面板200包括但不限于液晶显示面板、有机发光二极管显示面板、场发射显示面板、等离子显示面板、曲面型面板，所述液晶面板包括薄膜晶体管液晶显示面板、TN(Twisted Nematic，扭曲向列型)面板、VA(Vertical Alignment，垂直配向技术)类面板、IPS(In-Plane Switching，平面转换)面板等。
为了实现对显示面板200上的所有像素统一充电检测，显示面板200的各个数据线通过短路环B1与数据线衬垫10连接，同理，扫描线同样通过短路环B1与扫描线衬垫20连接，然后测试设备60通过探针施加测试信号至扫描线衬垫20以及数据线衬垫10实现充电，显示面板200的扫描线和数据线可以分成奇偶相连的设计，即将显示面板200的数据线或者扫描线奇数行或者奇数列采用同一短路环B1连接，偶数行或者偶数列采用同一短路环B1连接，扫描线衬垫20以及数据线衬垫10可以对应设置，当显示面板200的数据线以及扫描线均采用奇偶相连时，扫描线衬垫20为扫描线奇数衬垫和扫描线偶数衬垫，数据线衬垫10为数据线奇数衬垫和数据线偶数衬垫，显示面板200的数据线和数据线除了分奇偶数行外，还可以将扫描线或者数据线分成123/456/789……即以3行为单位，或者1234/5678……即4行为单位，扫描线衬垫20和数据线衬垫10根据数据线和扫描线的设计对应设置，可以分别设置三个、四个或者更多，在此不作具体限制。
需要说明的是，短路环B1设置为在显示面板200测试过程中屏蔽外部信号干扰，避免外部信号对内部电路连接的影响。
本实施例中，第一开关电路30和第二开关电路40可采用具有通断功能的开关元器件或者电路，第一开关电路30及第二开关电路40分别对应设置在显示面板200的数据线上和扫描线上，M个第一开关电路30的信号输入端通过短路环B1连接至数据线衬垫10，N个第二开关电路40的信号输入端通过短路环B1连接至扫描线衬垫20，第一开关电路30的受控端和第二开关电路40的受控端均与第一控制衬垫50连接。
第一控制衬垫50包括有两个信号输入端和一个信号输出端，显示面板200测试前，第一信号信号输入端与测试设备60通过探针与第一信号输入端连接，第二信号输入端保持悬空，无信号输入，在测试电路100测试时，测试设备60输出第一控制信号至第一开关电路30和第二开关电路40，第一控制信号设置为控制第一开关电路30和第二开关电路40导通，在开关电路导通后，测试设备60输出测试信号至显示面板200进行测试，测试设备60具有第一信号端、第二信号端和第三信号端，第一信号端设置为输出模拟灰阶电压信号至数据线衬垫10，第二信号端设置为输出行扫描控制信号至扫描线衬垫20，从而实现显示面板200上的像素统一充电，完成显示面板200的测试，第三信号端设置为输出第一控制信号至第一控制衬垫50的第一信号输入端，进而将第一控制信号输出至第一开关电路30和第二开关电路40。
测试设备60可包括设置为输出模拟灰阶电压电压的数据驱动集成电路、设置为输出行扫描控制信号的扫描驱动集成电路以及输出第一控制信号的信号输出模块，数据驱动集成电路、驱动集成电路和信号输出模块集成在同一电路板上，并分别通过探针与衬垫连接，测试设备60还可设置为单一控制芯片，分别输出测试信号和第一控制信号，测试设备60可根据制程以及测试方式对应设置，在此不做具体要求。
在显示面板200测试完毕后，信号发生器邦定在显示面板上，并通过连接线与第一控制衬垫的第二信号输入端连接，信号发生器210设置为输出第二控制信号，第二控制信号设置为控制第一开关电路30和第二开关电路40关断，信号发生器210可设置为单一控制芯片或者元器件组成的具体电路等，在此不做具体要求。
本实施例中，测试电路100工作过程为：
测试前，显示面板200流入面板测试工序，显示面板200的M条数据线分别一对一通过M个第一开关电路30连接至数据线衬垫10，显示面板200的N条扫描线分别一对一通过N个第二开关电路40连接至扫描线衬垫20，第一开关电路30的受控端和第二开关电路40的受控端连接至第一控制衬垫50，第一控制衬垫50的第一信号输入端与测试设备60信号发生器210连接信号发生器210；
测试时，测试设备60输出第一控制信号至第一控制衬垫50的第一信号输入端，M个第一开关电路30和N个第二开关电路40均导通，测试设备60分别通过数据线衬垫10和扫描线衬垫20输出测试信号至显示面板200的像素进行统一充电，进而完成面板测试；
显示面板200测试完毕后，将信号发生器210邦定在显示面板上，并通过信号线与第一控制衬垫50的第二信号输入端连接，信号发生器210输出的第二控制信号经第二信号输入端输出至第一开关电路30和第二开关电路40，第一开关电路30和第二开关电路40关断，显示面板200的数据线和扫描线分别与短路环B1分开，显示面板200的数据线和扫描线可正常工作，无需进行激光切割工作，提高了面板生产效率，从而解决了在面板生产过程中增加一道激光切割的生产工序，增加生产成本的问题。
本申请技术方案通过采用至少一个扫描线衬垫20、至少一个数据线衬垫10、M个第一开关电路30、N个第二开关电路40、第一控制衬垫50和测试设备60构成了测试电路100，显示面板200的M条数据线经M个第一开关电路30连接至数据线衬垫10，显示面板200的N条扫描线经N个第二开关电路40连接至扫描线衬垫20，M个第一开关电路30的受控端及N个第二开关电路40的受控端通过短路环与第一控制衬垫50连接，第一控制衬垫50包括第一信号输入端、第二信号输入端和信号输出端，第一信号输入端与测试设备60连接，第二控制信号在显示面板200测试前保持悬空状态，测试电路100工作时，第一信号输入端接收测试设备60的第一控制信号，并经信号输出端输出至第一开关电路30和第二开关电路40以控制第一开关电路30和第二开关电路40导通，测试设备60经所述第一开关电路30和第二开关电路40分别输出测试信号至显示面板200进行测试，在显示面板200测试完毕后，信号发生器安装在显示面板200上，并通过连接线与第一控制衬垫50的第二信号输入端连接，信号发生器输出第二控制信号至第一开关电路30和第二开关电路40，第一开关电路30和第二开关电路40关断，以控制显示面板200的数据线、扫描线与短路环Bar断开，从而解决了在面板生产过程中增加一道激光切割的生产工序，增加生产成本的问题。
在一可选实施例中，所述第一开关电路30及所述第二开关电路40为薄膜晶体管。
需要说明的是，薄膜晶体管的结构和工作原理与场效应管类似，主要包括栅极、源极和漏极，可分为N型和P型，假设薄膜晶体管为N型晶体管，以设置在数据线上的薄膜晶体管为例，各薄膜晶体管的漏极对应与数据线衬垫10连接，各薄膜晶体管的源极与显示面板200连接，各薄膜晶体管的栅极与第一控制衬垫50的第一信号输入端连接，薄膜晶体管的栅极在接收测试设备60输出的高电平即第一控制信号导通，测试信号经薄膜晶体管输入至显示面板200进行充电测试，在测试完毕后，薄膜晶体管的栅极在接收信号发生器210输出的低电平即第二控制信号关断，从而使短路环B1与数据线分离，显示面板200可正常进行工作。
在一可选实施例中，所述第一控制信号为第一电平，所述第二控制信号为第二电平。
本实施例中，第一开关电路30和第二开关电路40均在第一电平时导通，第二电平关断，并且第一电平电压值一般为10V~40V的正电压，第二电平电压值一般为-20V~3V，根据第一开关电路30和第二开关电路40选择的开关类型或者开启电压不同高低电平电压值可以变化，在此不做具体限制。
在一可选实施例中，所述第一开关电路30及所述第二开关电路40为NPN三极管。
本实施例中，第一开关电路30和第二开关电路40还可采用NPN三极管，NPN三极管的基极与第一控制衬垫50的信号输出端连接，NPN三极管的集电极分别与扫描线衬垫和数据线衬垫连接，NPN三极管的发射极则分别与数据线和扫描线对应连接，NPN三极管接收高电平时导通，测试设备60输出测试信号输出至显示面板200进行测试，NPN三极管接收低电平关断，数据线和扫描线均与短路环Bar断开。
本申请还提出一种显示面板测试装置300，该显示面板测试装置300包括测试电路100，该测试电路100的具体结构参照上述实施例，由于显示面板测试装置300采用了上述所有实施例的全部技术方案，因此至少具有上述实施例的技术方案所带来的所有技术效果，在此不再一一赘述。
本申请还提出一种显示装置1000，包括显示面板200和如上的显示面板测试装置300，如图2所示，图2为本申请显示装置一实施例的功能模块示意图，本实施例中，显示面板200的数据线和扫描线与显示面板测试装置300对应连接，并接收显示面板测试装置300输出的测试信号进行面板测试，在测试完毕后还可接收驱动信号进行显示面板200驱动显示，显示面板测试装置300还可邦定在显示面板200上，在完成显示面板200测试后实现显示面板200的驱动。
在一可选实施例中，所述显示面板200还设置有第二控制衬垫220，所述第二控制衬垫220串联在所述第一控制衬垫50和所述信号发生器210之间。
本实施例中，为了避免信号发生器210与第一控制衬垫50之间因面板位移造成的接触不良，在显示面板200上还设置有第二控制衬垫220，第二控制衬垫220设置为传输第二控制信号至第一控制衬垫50以控制第一控制电路30和第二控制电路40关断，第二控制衬垫220邦定在显示面板上，并通过连接线与第一控制衬垫50连接。
在一可选实施例中，所述第二控制衬垫220通过金属线与所述第一控制衬垫50连接。
本实施例中，金属线接收信号发生器210输出的第二控制信号，金属线与第一控制衬垫50的第二信号输入端可通过焊接的方式连接，金属线的材质可采用铝线、铜线或者其他材质的金属线，金属线具有耐高温、电阻小、导电性佳、耐腐蚀等优点，可有效减小信号衰减。
如图3所示，图3为本申请显示装置一实施例的电路结构示意图，本实施例中，所述显示面板200上还设置有多个安装衬垫230，所述M个第一开关电路30和所述N个第二开关电路40分别通过多个所述安装衬垫230与M条所述数据线和N条所述扫描线连接。
本实施例中，扫描线和数据线分别通过安装衬垫230邦定在显示面板上，安装衬垫230另一端通过数据线和扫描线连接至各个像素，从而构成显示面板200结构，可保证数据线和扫描线与各个像素之间稳定连接，避免显示面板200外围的数据线或者扫描线位移造成像素的移动，从而保证显示面板200的整体稳定性。
以上所述仅为本申请的可选实施例，并非因此限制本申请的专利范围，凡是在本申请的发明构思下，利用本申请说明书及附图内容所作的等效结构变换，或直接/间接运用在其他相关的技术领域均包括在本申请的专利保护范围内。

Claims (20)

  1. 一种测试电路，设置为测试显示面板，所述显示面板包括N条扫描线以及M条数据线，其中，所述测试电路包括：
    至少一个扫描线衬垫，设置为通过短路环对应连接所述显示面板的N条扫描线；
    至少一个数据线衬垫，设置为通过短路环对应连接所述显示面板的M条数据线；
    M个第一开关电路，所述M个第一开关电路对应设置在M条所述数据线上；
    N个第二开关电路，所述N个第二开关电路对应设置在N条所述扫描线上；
    测试设备，设置为输出第一控制信号控制M个所述第一开关电路及N个所述第二开关电路导通，并经所述扫描线衬垫和所述数据线衬垫输出测试所述显示面板的测试信号至所述显示面板；以及
    第一控制衬垫，所述第一控制衬垫包括第一信号输入端和第二信号输入端以及信号输出端，所述第一信号输入端，设置为接收所述测试设备输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路和所述第二开关电路；所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路和所述第二开关电路。
  2. 如权利要求1所述的测试电路，其中，所述第一控制衬垫的第二信号输入端在所述第一信号输入端接收到所述第一控制信号时悬空。
  3. 如权利要求1所述的测试电路，其中，所述信号发生器在显示面板测试完毕后邦定在显示面板上，并通过连接线与所述第一控制衬垫的第二信号输入端连接。
  4. 如权利要求1所述的测试电路，其中，所述第一开关电路及所述第二开关电路为薄膜晶体管。
  5. 如权利要求4所述的测试电路，其中，所述第一控制信号为第一电平，所述第二控制信号为第二电平。
  6. 如权利要求5所述的测试电路，其中，所述第一控制信号为高电平，所述第二控制信号为低电平。
  7. 如权利要求5所述的测试电路，其中，所述第一控制信号的电压值大于或者等于10V且小于或者等于40V，所述第二控制信号的电压值大于或者等于-20V且小于或者等于-3V。
  8. 如权利要求1所述的测试电路，其中，所述第一开关电路及所述第二开关电路为NPN三极管。
  9. 一种显示面板测试装置，其中，包括所述测试电路，所述测试电路设置为测试显示面板，所述显示面板包括N条扫描线以及M条数据线，其中，所述测试电路包括：
    至少一个扫描线衬垫，设置为通过短路环对应连接所述显示面板的N条扫描线；
    至少一个数据线衬垫，设置为通过短路环对应连接所述显示面板的M条数据线；
    M个第一开关电路，所述M个第一开关电路对应设置在M条所述数据线上；
    N个第二开关电路，所述N个第二开关电路对应设置在N条所述扫描线上；
    测试设备，设置为输出第一控制信号控制M个所述第一开关电路及N个所述第二开关电路导通，并经所述扫描线衬垫和所述数据线衬垫输出测试所述显示面板的测试信号至所述显示面板；以及
    第一控制衬垫，所述第一控制衬垫包括第一信号输入端和第二信号输入端以及信号输出端，所述第一信号输入端，设置为接收所述测试设备输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路和所述第二开关电路；所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路和所述第二开关电路。
  10. 如权利要求9所述的显示面板测试装置，其中，所述第一控制衬垫的第二信号输入端在所述第一信号输入端接收到所述第一控制信号时悬空。
  11. 如权利要求9所述的显示面板测试装置，其中，所述信号发生器在显示面板测试完毕后邦定在显示面板上，并通过连接线与所述第一控制衬垫的第二信号输入端连接。
  12. 如权利要求9所述的显示面板测试装置，其中，所述第一开关电路及所述第二开关电路为薄膜晶体管。
  13. 如权利要求12所述的显示面板测试装置，其中，所述第一控制信号为第一电平，所述第二控制信号为第二电平。
  14. 如权利要求13所述的显示面板测试装置，其中，所述第一控制信号为高电平，所述第二控制信号为低电平。
  15. 如权利要求13所述的显示面板测试装置，其中，所述第一控制信号的电压值大于或者等于10V且小于或者等于40V，所述第二控制信号的电压值大于或者等于-20V且小于或者等于-3V。
  16. 如权利要求9所述的显示面板测试装置，其中，所述第一开关电路及所述第二开关电路为NPN三极管。
  17. 一种显示装置，其中，包括显示面板和所述显示面板测试装置，该显示面板测试装置包括所述测试电路，所述测试电路设置为测试显示面板，所述显示面板包括N条扫描线以及M条数据线，其中，所述测试电路包括：
    至少一个扫描线衬垫，设置为通过短路环对应连接所述显示面板的N条扫描线；
    至少一个数据线衬垫，设置为通过短路环对应连接所述显示面板的M条数据线；
    M个第一开关电路，所述M个第一开关电路对应设置在M条所述数据线上；
    N个第二开关电路，所述N个第二开关电路对应设置在N条所述扫描线上；
    测试设备，设置为输出第一控制信号控制M个所述第一开关电路及N个所述第二开关电路导通，并经所述扫描线衬垫和所述数据线衬垫输出测试所述显示面板的测试信号至所述显示面板；以及
    第一控制衬垫，所述第一控制衬垫包括第一信号输入端和第二信号输入端以及信号输出端，所述第一信号输入端，设置为接收所述测试设备输出的第一控制信号，并经所述第一控制信号经所述信号输出端输出至第一开关电路和所述第二开关电路；所述第二信号输入端，设置为在所述显示面板测试完毕后，接收设置在所述显示面板上的信号发生器输出的第二控制信号，并经所述信号输出端输出至所述第一开关电路和所述第二开关电路。
  18. 如权利要求17所述的显示装置，其中，所述显示面板还设置有第二控制衬垫，所述第二控制衬垫串联在所述第一控制衬垫和所述信号发生器之间。
  19. 如权利要求18所述的显示装置，其中，所述第二控制衬垫通过金属线与所述第一控制衬垫连接。
  20. 如权利要求19所述的显示装置，其中，所述显示面板上还设置有多个安装衬垫，所述M个第一开关电路和所述N个第二开关电路分别通过多个所述安装衬垫与M条所述数据线和N条所述扫描线连接。
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