WO2014122111A3 - ROHLING AUS TiO2-SiO2-GLAS FÜR EIN SPIEGELSUBSTRAT FÜR DEN EINSATZ IN DER EUV-LITHOGRAPHIE SOWIE VERFAHREN FÜR DESSEN HERSTELLUNG - Google Patents
ROHLING AUS TiO2-SiO2-GLAS FÜR EIN SPIEGELSUBSTRAT FÜR DEN EINSATZ IN DER EUV-LITHOGRAPHIE SOWIE VERFAHREN FÜR DESSEN HERSTELLUNG Download PDFInfo
- Publication number
- WO2014122111A3 WO2014122111A3 PCT/EP2014/052106 EP2014052106W WO2014122111A3 WO 2014122111 A3 WO2014122111 A3 WO 2014122111A3 EP 2014052106 W EP2014052106 W EP 2014052106W WO 2014122111 A3 WO2014122111 A3 WO 2014122111A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- blank
- euv lithography
- mirror substrate
- tio2
- production
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/06—Glass compositions containing silica with more than 90% silica by weight, e.g. quartz
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1453—Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1469—Means for changing or stabilising the shape or form of the shaped article or deposit
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B25/00—Annealing glass products
- C03B25/02—Annealing glass products in a discontinuous way
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B32/00—Thermal after-treatment of glass products not provided for in groups C03B19/00, C03B25/00 - C03B31/00 or C03B37/00, e.g. crystallisation, eliminating gas inclusions or other impurities; Hot-pressing vitrified, non-porous, shaped glass products
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/0891—Ultraviolet [UV] mirrors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70316—Details of optical elements, e.g. of Bragg reflectors, extreme ultraviolet [EUV] multilayer or bilayer mirrors or diffractive optical elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2201/00—Type of glass produced
- C03B2201/06—Doped silica-based glasses
- C03B2201/20—Doped silica-based glasses doped with non-metals other than boron or fluorine
- C03B2201/21—Doped silica-based glasses doped with non-metals other than boron or fluorine doped with molecular hydrogen
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2201/00—Type of glass produced
- C03B2201/06—Doped silica-based glasses
- C03B2201/20—Doped silica-based glasses doped with non-metals other than boron or fluorine
- C03B2201/23—Doped silica-based glasses doped with non-metals other than boron or fluorine doped with hydroxyl groups
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2201/00—Type of glass produced
- C03B2201/06—Doped silica-based glasses
- C03B2201/30—Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi
- C03B2201/40—Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
- C03B2201/42—Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn doped with titanium
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2201/00—Glass compositions
- C03C2201/06—Doped silica-based glasses
- C03C2201/20—Doped silica-based glasses containing non-metals other than boron or halide
- C03C2201/21—Doped silica-based glasses containing non-metals other than boron or halide containing molecular hydrogen
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2201/00—Glass compositions
- C03C2201/06—Doped silica-based glasses
- C03C2201/20—Doped silica-based glasses containing non-metals other than boron or halide
- C03C2201/23—Doped silica-based glasses containing non-metals other than boron or halide containing hydroxyl groups
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2201/00—Glass compositions
- C03C2201/06—Doped silica-based glasses
- C03C2201/30—Doped silica-based glasses containing metals
- C03C2201/40—Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
- C03C2201/42—Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn containing titanium
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2203/00—Production processes
- C03C2203/40—Gas-phase processes
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2203/00—Production processes
- C03C2203/50—After-treatment
- C03C2203/52—Heat-treatment
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Thermal Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Public Health (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Environmental & Geological Engineering (AREA)
- Optics & Photonics (AREA)
- Glass Compositions (AREA)
- Glass Melting And Manufacturing (AREA)
- Optical Elements Other Than Lenses (AREA)
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201480008162.8A CN104995557B (zh) | 2013-02-11 | 2014-02-04 | 用于EUV-光刻中的镜面基材的由TiO2-SiO2玻璃构成的坯料及其制造方法 |
US14/766,276 US9522840B2 (en) | 2013-02-11 | 2014-02-04 | Blank of TiO2-SiO2 glass for a mirror substrate for use in EUV lithography and method for the production thereof |
EP14702598.5A EP2954372A2 (de) | 2013-02-11 | 2014-02-04 | ROHLING AUS TiO2-SiO2-GLAS FÜR EIN SPIEGELSUBSTRAT FÜR DEN EINSATZ IN DER EUV-LITHOGRAPHIE SOWIE VERFAHREN FÜR DESSEN HERSTELLUNG |
JP2015556463A JP6328665B2 (ja) | 2013-02-11 | 2014-02-04 | EUVリソグラフィに使用されるミラー基板用のTiO2−SiO2ガラスのブランクの製造方法 |
KR1020157023004A KR101922765B1 (ko) | 2013-02-11 | 2014-02-04 | EUV 리소그래피에서의 사용을 위한 미러 기판용 TiO2-SiO2 유리의 블랭크 및 그 생산을 위한 방법 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102013101328.7 | 2013-02-11 | ||
DE102013101328.7A DE102013101328B3 (de) | 2013-02-11 | 2013-02-11 | Rohling aus TiO2-SiO2-Glas für ein Spiegelsubstrat für den Einsatz in der EUV-Lithographie sowie Verfahren für dessen Herstellung |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2014122111A2 WO2014122111A2 (de) | 2014-08-14 |
WO2014122111A3 true WO2014122111A3 (de) | 2014-10-23 |
Family
ID=49999451
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2014/052106 WO2014122111A2 (de) | 2013-02-11 | 2014-02-04 | ROHLING AUS TiO2-SiO2-GLAS FÜR EIN SPIEGELSUBSTRAT FÜR DEN EINSATZ IN DER EUV-LITHOGRAPHIE SOWIE VERFAHREN FÜR DESSEN HERSTELLUNG |
Country Status (8)
Country | Link |
---|---|
US (1) | US9522840B2 (de) |
EP (1) | EP2954372A2 (de) |
JP (1) | JP6328665B2 (de) |
KR (1) | KR101922765B1 (de) |
CN (1) | CN104995557B (de) |
DE (1) | DE102013101328B3 (de) |
TW (1) | TWI624435B (de) |
WO (1) | WO2014122111A2 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013219808A1 (de) * | 2013-09-30 | 2015-04-02 | Heraeus Quarzglas Gmbh & Co. Kg | Spiegelblank für EUV Lithographie ohne Ausdehnung unter EUV-Bestrahlung |
EP2960219B1 (de) | 2014-06-27 | 2019-01-16 | Heraeus Quarzglas GmbH & Co. KG | Rohling aus Titan-dotiertem Kieselglas für ein Spiegelsubstrat für den Einsatz in der EUV-Lithographie und Verfahren für seine Herstellung |
CN107074609B (zh) | 2014-09-25 | 2019-11-22 | 南通斯密特森光电科技有限公司 | 轻型大尺寸望远镜镜坯的制造方法及根据该方法制造的镜坯 |
US20170362115A1 (en) * | 2014-11-26 | 2017-12-21 | Corning Incorporated | Method of making halogen doped optical element |
CN111238461B (zh) * | 2020-03-09 | 2022-05-06 | 中国建筑材料科学研究总院有限公司 | 一种谐振子及其制备方法 |
CN113340504B (zh) * | 2021-07-13 | 2022-03-01 | 中国工程物理研究院激光聚变研究中心 | 一种从熔石英假想温度分布获取残余应力分布的方法 |
CN113737278B (zh) * | 2021-07-29 | 2022-05-03 | 达高工业技术研究院(广州)有限公司 | 氧化钛掺杂旋涂玻璃固化装置 |
Citations (5)
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DE10359102A1 (de) * | 2003-12-17 | 2005-07-21 | Carl Zeiss Smt Ag | Optische Komponente umfassend ein Material mit einer vorbestimmten Homogenität der thermischen Längsausdehnung |
US20090143213A1 (en) * | 2007-11-30 | 2009-06-04 | Kenneth Edward Hrdina | Low expansion glass material having low expansivity gradient |
DE102010039924A1 (de) * | 2009-08-31 | 2011-03-03 | Corning Inc. | Einstellen der Tzc durch Aushärten von Glas mit ultraniedriger Expansion |
DE102010009589A1 (de) * | 2010-02-26 | 2011-09-01 | Heraeus Quarzglas Gmbh & Co. Kg | Rohling aus Titan-dotiertem, hochkieselsäurehaltigem Glas für ein Spiegelsubstrat für den Einsatz in der EUV-Lithographie und Verfahren für seine Herstellung |
DE102011085358B3 (de) * | 2011-10-28 | 2012-07-12 | Carl Zeiss Smt Gmbh | Optische Anordnung für die EUV-Lithographie und Verfahren zum Konfigurieren einer solchen optischen Anordnung |
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JP3194667B2 (ja) | 1994-03-26 | 2001-07-30 | 信越石英株式会社 | 光学用合成石英ガラス成形体及びその製造方法 |
JP2960716B2 (ja) * | 1997-05-30 | 1999-10-12 | 信越化学工業株式会社 | 光ファイバプリフォームの延伸方法および延伸装置 |
JP3274821B2 (ja) * | 1997-06-27 | 2002-04-15 | 信越化学工業株式会社 | 光ファイバプリフォームの溶断方法及びその溶断装置 |
US6377655B1 (en) * | 1998-05-08 | 2002-04-23 | Nikon Corporation | Reflective mirror for soft x-ray exposure apparatus |
JP4792705B2 (ja) * | 2003-04-03 | 2011-10-12 | 旭硝子株式会社 | TiO2を含有するシリカガラスおよびその製造法 |
DE102004015766B4 (de) | 2004-03-23 | 2016-05-12 | Asahi Glass Co., Ltd. | Verwendung eines SiO2-TiO2-Glases als strahlungsresistentes Substrat |
US7506521B2 (en) * | 2004-12-29 | 2009-03-24 | Corning Incorporated | High transmission synthetic silica glass and method of making same |
US7506522B2 (en) * | 2004-12-29 | 2009-03-24 | Corning Incorporated | High refractive index homogeneity fused silica glass and method of making same |
US7928026B2 (en) * | 2005-06-30 | 2011-04-19 | Corning Incorporated | Synthetic silica material with low fluence-dependent-transmission and method of making the same |
EP2250133A1 (de) * | 2008-02-29 | 2010-11-17 | Asahi Glass Company, Limited | TiO2-HALTIGES QUARZGLAS UND OPTISCHES ELEMENT FÜR LITHOGRAFIE DAMIT |
JP2011162359A (ja) * | 2008-05-29 | 2011-08-25 | Asahi Glass Co Ltd | TiO2を含有するシリカガラスおよびそれを用いたリソグラフィ用光学部材 |
JP2010135732A (ja) * | 2008-08-01 | 2010-06-17 | Asahi Glass Co Ltd | Euvマスクブランクス用基板 |
JPWO2010131662A1 (ja) * | 2009-05-13 | 2012-11-01 | 旭硝子株式会社 | TiO2−SiO2ガラス体の製造方法及び熱処理方法、TiO2−SiO2ガラス体、EUVL用光学基材 |
JP5510308B2 (ja) * | 2009-12-25 | 2014-06-04 | 旭硝子株式会社 | Euvl光学部材用基材 |
WO2011105517A1 (ja) * | 2010-02-24 | 2011-09-01 | 国立大学法人東北大学 | 超低膨張ガラスの製造方法 |
US8541325B2 (en) * | 2010-02-25 | 2013-09-24 | Corning Incorporated | Low expansivity, high transmission titania doped silica glass |
DE102010028488A1 (de) * | 2010-05-03 | 2011-11-03 | Carl Zeiss Smt Gmbh | Substrate für Spiegel für die EUV-Lithographie und deren Herstellung |
KR101013223B1 (ko) * | 2010-09-06 | 2011-02-10 | 주식회사 정관 | 음의 열팽창 계수를 가지는 결정화 유리 및 그 제조방법 |
-
2013
- 2013-02-11 DE DE102013101328.7A patent/DE102013101328B3/de active Active
-
2014
- 2014-01-23 TW TW103102457A patent/TWI624435B/zh active
- 2014-02-04 US US14/766,276 patent/US9522840B2/en active Active
- 2014-02-04 WO PCT/EP2014/052106 patent/WO2014122111A2/de active Application Filing
- 2014-02-04 KR KR1020157023004A patent/KR101922765B1/ko active IP Right Grant
- 2014-02-04 JP JP2015556463A patent/JP6328665B2/ja active Active
- 2014-02-04 CN CN201480008162.8A patent/CN104995557B/zh active Active
- 2014-02-04 EP EP14702598.5A patent/EP2954372A2/de not_active Withdrawn
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---|---|---|---|---|
DE10359102A1 (de) * | 2003-12-17 | 2005-07-21 | Carl Zeiss Smt Ag | Optische Komponente umfassend ein Material mit einer vorbestimmten Homogenität der thermischen Längsausdehnung |
US20090143213A1 (en) * | 2007-11-30 | 2009-06-04 | Kenneth Edward Hrdina | Low expansion glass material having low expansivity gradient |
DE102010039924A1 (de) * | 2009-08-31 | 2011-03-03 | Corning Inc. | Einstellen der Tzc durch Aushärten von Glas mit ultraniedriger Expansion |
DE102010009589A1 (de) * | 2010-02-26 | 2011-09-01 | Heraeus Quarzglas Gmbh & Co. Kg | Rohling aus Titan-dotiertem, hochkieselsäurehaltigem Glas für ein Spiegelsubstrat für den Einsatz in der EUV-Lithographie und Verfahren für seine Herstellung |
DE102011085358B3 (de) * | 2011-10-28 | 2012-07-12 | Carl Zeiss Smt Gmbh | Optische Anordnung für die EUV-Lithographie und Verfahren zum Konfigurieren einer solchen optischen Anordnung |
Non-Patent Citations (1)
Title |
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See also references of EP2954372A2 * |
Also Published As
Publication number | Publication date |
---|---|
CN104995557B (zh) | 2019-03-05 |
JP2016511211A (ja) | 2016-04-14 |
WO2014122111A2 (de) | 2014-08-14 |
EP2954372A2 (de) | 2015-12-16 |
CN104995557A (zh) | 2015-10-21 |
TW201446670A (zh) | 2014-12-16 |
KR101922765B1 (ko) | 2018-11-27 |
US9522840B2 (en) | 2016-12-20 |
JP6328665B2 (ja) | 2018-05-23 |
TWI624435B (zh) | 2018-05-21 |
DE102013101328B3 (de) | 2014-02-13 |
KR20150117675A (ko) | 2015-10-20 |
US20150376049A1 (en) | 2015-12-31 |
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