WO2013183703A1 - 化学蒸着用の有機ルテニウム化合物のリサイクル方法 - Google Patents
化学蒸着用の有機ルテニウム化合物のリサイクル方法 Download PDFInfo
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- WO2013183703A1 WO2013183703A1 PCT/JP2013/065682 JP2013065682W WO2013183703A1 WO 2013183703 A1 WO2013183703 A1 WO 2013183703A1 JP 2013065682 W JP2013065682 W JP 2013065682W WO 2013183703 A1 WO2013183703 A1 WO 2013183703A1
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- raw material
- organic ruthenium
- ruthenium compound
- used raw
- recycling
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- 150000003304 ruthenium compounds Chemical class 0.000 title claims abstract description 76
- 238000000034 method Methods 0.000 title claims abstract description 71
- 238000004064 recycling Methods 0.000 title claims abstract description 25
- 238000005229 chemical vapour deposition Methods 0.000 title claims abstract description 17
- 230000008569 process Effects 0.000 claims abstract description 40
- 239000003054 catalyst Substances 0.000 claims abstract description 30
- 239000010409 thin film Substances 0.000 claims abstract description 30
- 238000001179 sorption measurement Methods 0.000 claims abstract description 29
- 239000012535 impurity Substances 0.000 claims abstract description 25
- 238000005984 hydrogenation reaction Methods 0.000 claims abstract description 16
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000003463 adsorbent Substances 0.000 claims abstract description 14
- 239000001257 hydrogen Substances 0.000 claims abstract description 10
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 10
- 238000000354 decomposition reaction Methods 0.000 claims abstract description 9
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 7
- 239000002994 raw material Substances 0.000 claims description 105
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 39
- 238000002407 reforming Methods 0.000 claims description 25
- 150000001875 compounds Chemical class 0.000 claims description 23
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 22
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 20
- 229910052707 ruthenium Inorganic materials 0.000 claims description 20
- 229910052763 palladium Inorganic materials 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 8
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 8
- 125000001424 substituent group Chemical group 0.000 claims description 7
- 125000000217 alkyl group Chemical group 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 238000004821 distillation Methods 0.000 claims description 3
- 239000000284 extract Substances 0.000 claims description 3
- 229910000564 Raney nickel Inorganic materials 0.000 claims description 2
- NPXOKRUENSOPAO-UHFFFAOYSA-N Raney nickel Chemical compound [Al].[Ni] NPXOKRUENSOPAO-UHFFFAOYSA-N 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- 229910021536 Zeolite Inorganic materials 0.000 claims description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 2
- HNPSIPDUKPIQMN-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Al]O[Al]=O HNPSIPDUKPIQMN-UHFFFAOYSA-N 0.000 claims description 2
- 239000000741 silica gel Substances 0.000 claims description 2
- 229910002027 silica gel Inorganic materials 0.000 claims description 2
- 239000010457 zeolite Substances 0.000 claims description 2
- 230000004048 modification Effects 0.000 abstract description 5
- 238000012986 modification Methods 0.000 abstract description 5
- 239000007858 starting material Substances 0.000 abstract 7
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 27
- 238000010438 heat treatment Methods 0.000 description 21
- 230000008859 change Effects 0.000 description 19
- 239000010408 film Substances 0.000 description 13
- 238000002290 gas chromatography-mass spectrometry Methods 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 11
- 238000005259 measurement Methods 0.000 description 11
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- 238000005755 formation reaction Methods 0.000 description 10
- 238000005160 1H NMR spectroscopy Methods 0.000 description 9
- 150000002902 organometallic compounds Chemical class 0.000 description 8
- YAYGSLOSTXKUBW-UHFFFAOYSA-N ruthenium(2+) Chemical compound [Ru+2] YAYGSLOSTXKUBW-UHFFFAOYSA-N 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- 238000000425 proton nuclear magnetic resonance spectrum Methods 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- MWDNTFTWUNZWNS-UHFFFAOYSA-N [Ru].C1CCC=CC=CC1 Chemical compound [Ru].C1CCC=CC=CC1 MWDNTFTWUNZWNS-UHFFFAOYSA-N 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 5
- 239000003446 ligand Substances 0.000 description 4
- 238000001819 mass spectrum Methods 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- 230000006837 decompression Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- SYSQUGFVNFXIIT-UHFFFAOYSA-N n-[4-(1,3-benzoxazol-2-yl)phenyl]-4-nitrobenzenesulfonamide Chemical class C1=CC([N+](=O)[O-])=CC=C1S(=O)(=O)NC1=CC=C(C=2OC3=CC=CC=C3N=2)C=C1 SYSQUGFVNFXIIT-UHFFFAOYSA-N 0.000 description 3
- 238000000746 purification Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000005587 bubbling Effects 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000002441 reversible effect Effects 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- QNLGITAXXBYCNU-UHFFFAOYSA-N C12=CC=C(CC1)C2.[Ru] Chemical compound C12=CC=C(CC1)C2.[Ru] QNLGITAXXBYCNU-UHFFFAOYSA-N 0.000 description 1
- 238000005481 NMR spectroscopy Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- GKIRPKYJQBWNGO-OCEACIFDSA-N clomifene Chemical compound C1=CC(OCCN(CC)CC)=CC=C1C(\C=1C=CC=CC=1)=C(\Cl)C1=CC=CC=C1 GKIRPKYJQBWNGO-OCEACIFDSA-N 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 238000004042 decolorization Methods 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000010970 precious metal Substances 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008929 regeneration Effects 0.000 description 1
- 238000011069 regeneration method Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000007086 side reaction Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
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-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/0006—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table compounds of the platinum group
- C07F15/0046—Ruthenium compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/38—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals
- B01J23/40—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals of the platinum group metals
- B01J23/42—Platinum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/38—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals
- B01J23/40—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals of the platinum group metals
- B01J23/44—Palladium
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/38—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals
- B01J23/40—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals of the platinum group metals
- B01J23/46—Ruthenium, rhodium, osmium or iridium
- B01J23/462—Ruthenium
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J25/00—Catalysts of the Raney type
- B01J25/02—Raney nickel
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C45/00—Preparation of compounds having >C = O groups bound only to carbon or hydrogen atoms; Preparation of chelates of such compounds
- C07C45/78—Separation; Purification; Stabilisation; Use of additives
- C07C45/79—Separation; Purification; Stabilisation; Use of additives by solid-liquid treatment; by chemisorption
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C45/00—Preparation of compounds having >C = O groups bound only to carbon or hydrogen atoms; Preparation of chelates of such compounds
- C07C45/78—Separation; Purification; Stabilisation; Use of additives
- C07C45/85—Separation; Purification; Stabilisation; Use of additives by treatment giving rise to a chemical modification
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/0006—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table compounds of the platinum group
- C07F15/0046—Ruthenium compounds
- C07F15/0053—Ruthenium compounds without a metal-carbon linkage
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
- B01J20/02—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof comprising inorganic material
- B01J20/20—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof comprising inorganic material comprising free carbon; comprising carbon obtained by carbonising processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
- B01J20/28—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof characterised by their form or physical properties
- B01J20/28054—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof characterised by their form or physical properties characterised by their surface properties or porosity
- B01J20/28057—Surface area, e.g. B.E.T specific surface area
- B01J20/28064—Surface area, e.g. B.E.T specific surface area being in the range 500-1000 m2/g
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
- B01J20/28—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof characterised by their form or physical properties
- B01J20/28054—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof characterised by their form or physical properties characterised by their surface properties or porosity
- B01J20/28057—Surface area, e.g. B.E.T specific surface area
- B01J20/28066—Surface area, e.g. B.E.T specific surface area being more than 1000 m2/g
Definitions
- the present invention relates to a method for recycling an organic ruthenium compound used as a raw material in a chemical vapor deposition method such as a CVD method or an ALD method. More specifically, the present invention relates to a method for making a used raw material used and recovered for thin film production reusable.
- Ruthenium or ruthenium compounds are used as thin film electrode materials for semiconductor devices such as DRAM and FERAM.
- a chemical vapor deposition method such as a CVD method (chemical vapor deposition method) or an ALD method (atomic layer vapor deposition method) is applied.
- CVD method chemical vapor deposition method
- ALD method atomic layer vapor deposition method
- Many organic ruthenium compounds have been known as raw material compounds used in such chemical vapor deposition.
- the manufacturing cost of a thin film using an organic ruthenium compound by a CVD method or the like is based on the price of the organic ruthenium compound as a raw material and the use efficiency of the organic ruthenium compound raw material.
- the utilization efficiency is the ratio of the amount of the compound consumed in the film formation reaction to the mass of the raw material introduced on the substrate surface, but the utilization efficiency of the organic ruthenium compound by the CVD method or the like is often as low as 10% or less. . If this problem of low utilization efficiency is left unattended, the production cost of the ruthenium thin film and thus the price of various devices will rise, and it may also cause the depletion of the precious metal resource ruthenium.
- the applicant of the present application can extract the unreacted organometallic compound component from the used raw material that has been disposed of up to now and reuse it as a method of reducing the film formation cost and avoiding the problem of resource depletion.
- Patent Document 1 a recycling technology of an organometallic compound to be purified to a simple state has been developed (Patent Document 1).
- Patent Document 1 the raw material gas after thin film formation is cooled and condensed by passing it through a cold trap or the like and recovered, and further, the recovered metal is distilled under appropriate conditions to purify the organometallic compound.
- this recycling technology it is possible to reduce the manufacturing cost of the thin film by avoiding wasteful disposal of the organometallic compound.
- the applicant of the present application indicates that the organometallic compound recovered as described above has a problem of mixing and coloring of products due to side reactions with respect to the film formation reaction, and that they are not purified by purification means such as distillation. It has also been found that it is difficult to remove and cannot be reused as a thin film raw material. And it is developing also about the recycling method containing the refinement
- the organic ruthenium compound for forming a thin film has long been required to have properties such as a low melting point and a liquid at room temperature and a high vapor pressure that can be easily vaporized. This emphasizes the handling of raw materials and the efficiency during thin film production.
- properties such as a low melting point and a liquid at room temperature and a high vapor pressure that can be easily vaporized.
- This emphasizes the handling of raw materials and the efficiency during thin film production.
- Patent Document 3 These relatively new organoruthenium compounds are more complicated than the previous ones, such as the specificity of ligands that coordinate and the asymmetry that coordinates with different ligands.
- the conventional recycling technique does not completely correspond to those relatively new organic ruthenium compounds.
- the present inventors examined the components and structure of the recovered dicarbonyl-bis (5-methyl-2,4-hexanedionato) ruthenium (II) after the film formation reaction. The following three events were found as obstacles to be excluded for use.
- the first is a structural change due to oxidation of the ligand of the organoruthenium compound.
- dicarbonyl-bis (5-methyl-2,4-hexanedionato) ruthenium (II) a compound in which hydrogen at the ligand terminal is eliminated is formed as follows. This compound is considered to be due to a partial structural change due to the atmosphere during the production of the thin film.
- the second is that the organic ruthenium compound completely changes to a compound having a different structure.
- dicarbonyl-bis (5-methyl-2,4-hexanedionato) ruthenium (II) a change to an organic ruthenium compound having the following structure has been observed. This change can be regarded as complete alteration due to thermal decomposition or the like.
- the present inventors have taken further measures, and as a result, the organoruthenium compound in which the isomer ratio has been changed can be adjusted by heat treatment at a predetermined temperature for a relatively long time, before the original use. It was found that the isomer ratio of the raw material can be restored. Then, in combination with specific means for the first and second events described above, the inventors have found a method for making the used organic ruthenium compound completely recyclable and have arrived at the present invention.
- the present invention is a method for recycling an organic ruthenium compound for chemical vapor deposition that extracts an unreacted organic ruthenium compound from a used raw material that has undergone a thin film formation step, and includes the following steps.
- B An adsorption step of removing impurities in the used raw material by bringing the used raw material into contact with the adsorbent.
- C The spent raw material is heated at a temperature not lower than ⁇ 100 ° C. and not higher than ⁇ 10 ° C. with respect to the decomposition temperature of the organic ruthenium compound for 8 hours or longer to obtain isomerism in the organic ruthenium compound in the used raw material. Restoration process to adjust the body ratio.
- the reforming step of bringing the recovered used raw material into contact with hydrogen and a hydrogenation catalyst is a step of reducing (hydrogenating) the oxidized (hydrogen desorbed) organic ruthenium compound to return it to an unreacted organic ruthenium compound. is there.
- the organic ruthenium compound that may affect the film forming process can be eliminated.
- the yield of the organic ruthenium compound can be improved to a small extent.
- the present invention is intended to treat organic ruthenium compounds mixed with isomers, but the organic ruthenium compounds to be treated in this step are not limited to which isomers are derived. Absent. For example, if there are organic ruthenium compounds that are evenly desorbed from each isomer, they can all be reacted and are expected to return to the organic ruthenium compound from which they are derived.
- the hydrogenation catalyst used in the reforming step it is preferable to use any one of a platinum catalyst, a palladium catalyst, a ruthenium catalyst, and a Raney nickel catalyst.
- the amount of catalyst for hydrogenation is preferably 1/1000 to the equivalent of the weight of the used raw material, but considering the cost of the catalyst and the efficiency in this step, the weight of the used raw material In particular, the ratio is preferably 1/60 to 1/40.
- the catalyst component (platinum, palladium, ruthenium, etc.) supported in each catalyst can be applied in a general range (5 to 10% by mass). In this step, it is necessary to pass hydrogen gas through the used raw material. Hydrogen is preferably high-purity hydrogen.
- the reason why the used raw material is brought into contact with the adsorbent in the adsorption process is to remove impurities generated by the complete change of the organic ruthenium compound during film formation. This impurity not only affects the film formation reaction but also has no reversibility, so it must be removed.
- the adsorbent include activated carbon, silica gel, zeolite, alumina, and the like, and preferably activated carbon.
- an adsorbent having a specific surface area of 500 m 2 / g to 1500 m 2 / g is used, and the amount used is preferably 1/10 to 10 times the weight of the used raw material.
- the amount of the adsorbent used depends on the content of impurities in the used raw material, but it is more preferable that the amount is 1/5 to the equivalent of the weight of the used raw material.
- the reforming process and the adsorption process can be performed simultaneously.
- the catalyst used in the reforming step is one in which activated carbon is used as a carrier and a catalytic metal (palladium, platinum, etc.) is supported, and this carrier can act as an adsorbent. Therefore, the hydrogenation treatment and the adsorption treatment can be performed simultaneously by setting the usage amount of the hydrogenation catalyst based on the amount of activated carbon (support) required in the adsorption step.
- the most characteristic step in the recycling method of the organic ruthenium compound according to the present invention is a restoration step of adjusting the isomer ratio by heating the used raw material.
- heating is performed at a temperature of ⁇ 100 ° C. or higher and ⁇ 10 ° C. or lower based on the decomposition temperature of the organoruthenium compound. This is because the isomer ratio does not change when the temperature is lower than ⁇ 100 ° C., and the organic ruthenium compound may be decomposed when the temperature exceeds ⁇ 10 ° C.
- the heating temperature is preferably set to a decomposition temperature of ⁇ 50 ° C. or higher in order to improve the efficiency of restoration.
- the heating time In this step, the adjustment of the isomer ratio cannot be completed unless a considerable time has elapsed after heating. Specifically, it must be heated for 8 hours or more. Preferably it is 12 hours or more. There is no particular need to set the upper limit of the heating time. However, since the variation in the isomer ratio of the used raw material after 24 hours is reduced by making the heating temperature appropriate, it is preferably 48 hours or less in consideration of work efficiency.
- the heating atmosphere for the restoration step is an inert gas atmosphere such as nitrogen gas or argon gas, and heating with stirring is performed. Further, this restoration step may be performed before the reforming step and the adsorption step. However, since an organic ruthenium compound is slightly generated by the hydrogenation treatment in the reforming step, it is preferable to adjust the isomer ratio after the hydrogenation treatment.
- the organic ruthenium compound in the used raw material that has undergone the reforming step, the adsorption step, and the restoration step described above is such that impurities that are difficult to separate are removed and the isomer ratio is restored to the state before use. .
- the used raw material after a process can isolate
- organic ruthenium compound useful in the recycling method according to the present invention include dicarbonyl-bis (5-methyl-2,4-hexanedionato) ruthenium (II) of Chemical Formula 1 as shown below. Compounds.
- organic ruthenium compounds may be mentioned as further specific examples of the organic ruthenium compounds listed in Chemical Formulas 5 to 7 (substituent R has 2 to 4 carbon atoms).
- the method for recycling an organic ruthenium compound according to the present invention is useful for a used raw material comprising a mixture of isomers as described above, but does not prevent application of the organic ruthenium compound used in the past. Absent.
- a reforming step and an adsorption step are provided, which are useful for the regeneration of an organic ruthenium compound having no isomer.
- the recycling method of the organic ruthenium compound according to the present invention restores the isomer ratio and reuses it even for the organic ruthenium compound that is composed of a plurality of isomers and whose isomer ratio changes after use. Can be recycled to a possible state.
- 1 is an entire view of 1 H-NMR spectrum of a used raw material.
- 1 H-NMR spectrum enlarged view of used raw materials.
- Second Embodiment dicarbonyl-bis (5-methyl-2,4-hexanedionate) ruthenium (II) of Chemical Formula 1 is used as an organic ruthenium compound for chemical vapor deposition (hereinafter referred to as the trade name of this compound).
- a ruthenium thin film was formed by the above method and a used raw material in which exhaust gas was recovered with a cold trap was prepared. Then, each of the used raw materials was subjected to a modification process, an adsorption process, and a restoration process, and the reusability was examined.
- the former mass spectrum is based on the molecular weight value of an organic ruthenium compound from which the hydrogen atom at the terminal of Carish has been eliminated (compound of the above chemical formula 2: hereinafter referred to as impurity ⁇ for convenience). It is thought that it comes from.
- the latter is presumed to be a diene-arene complex of ruthenium produced by Carish decomposition (compound of the above chemical formula 3; hereinafter referred to as impurity ⁇ for convenience). From this GC-MS analysis, it was confirmed that the used raw material had two impurities generated by partial or total change of Carish.
- FIG. 2 shows the 1 H-NMR spectrum of the used raw material
- FIG. 3 is an enlarged view thereof.
- the peak near the chemical shift value ( ⁇ ) of 5.15 to 5.60 ppm in the 1 H-NMR spectrum is a peak derived from Carish, and the peak near ⁇ is from 5.6 to 5.8 ppm is derived from the impurity ⁇ .
- the peak around ⁇ of 4.4 to 4.6 ppm is estimated to be derived from impurity ⁇ .
- the Carish isomer ratio in the used raw material can be estimated.
- those having a peak in the vicinity of ⁇ 5.42 ppm are “isomer A” and ⁇ 5.40 ppm.
- Those having a peak near and around ⁇ 5.38 ppm were designated as “isomer B”, and those having a peak around ⁇ 5.39 ppm were designated as “isomer C”.
- the names of isomers A to C are in accordance with Chemical formula 4.
- the isomer ratio can be calculated from the area ratio of each peak. The identification of each isomer based on the above 1 H-NMR spectrum is described in detail in Patent Document 3.
- the isomer ratio of the impurity ⁇ of the raw material before use and the used raw material calculated based on the 1 H-NMR spectrum is as follows. As shown in Table 4, it was confirmed that the isomer ratio of the used raw material changed from the raw material before use.
- the used raw material having undergone the above-described reforming step, adsorption step, and restoration step was distilled to extract Carish, and a ruthenium thin film was manufactured to confirm the possibility of reuse.
- the used raw material was distilled under the conditions of a heating temperature of 160 ° C. and a pressure of 80 Pa.
- the yield of extracted Carish was 95% (based on the weight of the used raw material collected in the trap).
- FIG. 5 is a photograph of the ruthenium film formed on the substrate. It can be seen from FIG. 5 that the ruthenium film by Carish after recycling can form a ruthenium film having the same form as Carish, which is a raw material before use. FIG. 5 also shows specific resistance values measured for each ruthenium film. It can be confirmed from the measurement results of the specific resistance that a ruthenium film equivalent to the raw material before use can be formed. From the above, it can be seen that the organic ruthenium compound in the used raw material that has undergone the reforming step, the adsorption step, and the restoration step can be sufficiently reused.
- Second Embodiment Next, the processing order of the reforming process and the adsorption process was switched to perform the recycling process. Applying the same conditions as in the first embodiment, an adsorption process was performed first, followed by a reforming process. GC-MS and 1 H-NMR measurements were performed on the used raw material after the treatment, and both peaks derived from impurities ⁇ and ⁇ disappeared. After that, the used raw material is recycled through the restoration process as in the first embodiment. And when the ruthenium thin film was formed using Carish extracted from this used raw material, the thin film of the favorable characteristic was obtained.
- activated carbon B (trade name: SX-1G, specific surface area 1000 m 2 / g)
- activated carbon C (trade name: SX-II, specific surface area 900 m 2 / g)
- the column was packed with activated carbon B (100 g) and activated carbon C (200 g), and the used raw material after the modification treatment was passed through the column, and the adsorption treatment was performed on each of the used raw materials after the GC-MS, 1 H-NMR.
- the amount of hydrogenation catalyst used in the reforming process was increased, and the reforming process and the adsorption process were performed simultaneously to treat the used raw material.
- the amount of the palladium catalyst used in the reforming process of the first embodiment was 100 g, and the other processes were performed under the same conditions as in the first embodiment (the simultaneous adsorption process).
- GC-MS and 1 H-NMR measurements were performed on the used raw material after this treatment, and both peaks derived from impurities ⁇ and ⁇ disappeared. After that, the used raw material is recycled through the restoration process as in the first embodiment. And when the ruthenium thin film was formed using Carish extracted from this used raw material, the thin film of the favorable characteristic was obtained.
- This embodiment includes bis (5-methyl-2,4-hexanedionate) (norbornadiene) ruthenium (hereinafter referred to as the trade name Runish) as a used raw material to be treated. Recycled things. Runish has a decomposition temperature of 210 ° C., and the following three isomers are mixed.
- FIG. 6 shows the change in isomer ratio with heating time. From FIG. 6, it was confirmed that the isomer ratio was restored by the heat treatment for used raw materials containing Runish as the organic ruthenium compound. From the GC-MS and 1 H-NMR measurements on the used raw material after the restoration step, no peaks other than Runish were observed.
- FIG. 7 shows the change in isomer ratio with heating time. From FIG. 7, it was confirmed that the used isomers containing bis (5-methyl-2,4-hexanedionato) (cyclooctadiene) ruthenium as the organic ruthenium compound also restored the isomer ratio by the heat treatment.
- peaks other than bis (5-methyl-2,4-hexanedionate) (cyclooctadiene) ruthenium are found from GC-MS and 1 H-NMR measurements on the used raw material after the restoration step. Not observed.
- an unreacted organic ruthenium compound in a used raw material that has undergone a chemical vapor deposition step can be effectively reusable without being discarded.
- the present invention can also be applied to organic ruthenium compounds developed in recent years. Therefore, according to the present invention, no material loss occurs even when the utilization efficiency of the organic ruthenium compound in the chemical vapor deposition process is low. As a result, the manufacturing cost of the ruthenium thin film can be reduced. Further, by reusing an organic ruthenium compound that has been conventionally discarded as in the present invention, it is useful for the problem of depletion of useful resources without wasting useful resources.
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Abstract
Description
(b)前記使用済み原料と吸着剤とを接触させることにより、使用済み原料中の不純物を除去する吸着工程。
(c)前記使用済み原料を、有機ルテニウム化合物の分解温度に対して-100℃以上でありかつ-10℃以下の温度で、8時間以上加熱して、使用済み原料中の有機ルテニウム化合物における異性体の比率を調整する復元工程。
使用済み原料100gとパラジウム触媒(カーボン担体)2gにヘキサン2Lを加え、これを50℃で攪拌しつつ水素ガス2時間バブリングさせ水素添加処理を行った。反応液をろ過してパラジウム触媒を除去した後、ロータリーエバポレータでヘキサンを減圧留去した。この改質処理後の使用済み原料をGC-MS、1H-NMR測定を行ったところ、いずれの分析においても不純物α由来のピークが消失した。但し、不純物βのピークは残存していた。
次に、改質工程後の使用済み原料100gをヘキサン2Lに溶解させた。そして、100gの活性炭(商品名:SX-plus、比表面積1100m2/g)が充填されたカラムフィルターに使用済み原料のヘキサン溶液を通過させて吸着処理した。その後ロータリーエバポレータでヘキサンを減圧留去した。吸着処理後の使用済み原料をGC-MS、1H-NMR測定を行ったところ、いずれの分析においても不純物β由来のピークが消失した。
以上の改質工程、吸着工程後の使用済み原料について、加熱処理による復元工程に供した。使用済み原料100gをアルゴンガスの雰囲気中、150℃に加熱した。この処理温度は、Carishの分解温度200℃を考慮するものである。ここでは、加熱開始から2時間、8時間、24時間経過した段階で使用済み原料について1H-NMR測定を行い、時間経過による異性体比率の変化を測定した。この測定結果を図4に示す。
原料溶液温度 :140℃
基板温度 :230℃
反応容器バ圧力:5.0torr
キャリアガス :アルゴン(流量200sccm)
反応ガス :酸素(流量50sccm)
Claims (6)
- 薄膜形成工程を経た使用済みの原料から未反応の有機ルテニウム化合物を抽出する化学蒸着用の有機ルテニウム化合物のリサイクル方法であって、
下記(a)~(c)の工程を含む方法(但し、(a)~(c)工程の処理順序は任意である。また、(a)工程と(b)工程とは同時に行っても良い。)。
(a)水素雰囲気中、前記使用済み原料と水添触媒とを接触させ、使用済み原料中の酸化した有機ルテニウム化合物に水素添加する改質工程。
(b)前記使用済み原料と吸着剤とを接触させることにより、使用済み原料中の不純物を除去する吸着工程。
(c)前記使用済み原料を、有機ルテニウム化合物の分解温度に対して-100℃以上でありかつ-10℃以下の温度で、8時間以上加熱して、使用済み原料中の有機ルテニウム化合物における異性体の比率を調整する復元工程。 - (a)工程の水添触媒は、パラジウム触媒、白金触媒、ルテニウム触媒、ラネーニッケル触媒のいずれかである請求項1記載の有機ルテニウム化合物のリサイクル方法。
- (b)工程の吸着剤は、活性炭、シリカゲル、ゼオライト、アルミナのいずれかである請求項1又は請求項2記載の有機ルテニウム化合物のリサイクル方法。
- (b)工程の吸着剤との反応条件として、比表面積が500m2/g~1500m2/gの吸着剤を用い、その使用量を使用済み原料の重量に対して10分の1~10倍とする請求項1~請求項3のいずれかに記載の有機ルテニウム化合物のリサイクル方法。
- (a)~(c)工程による処理後、蒸留により有機ルテニウム化合物を抽出する請求項1~請求項4のいずれかに記載の有機ルテニウム化合物のリサイクル方法。
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