WO2013136667A1 - 有機エレクトロルミネセンスデバイス及びその製造方法 - Google Patents
有機エレクトロルミネセンスデバイス及びその製造方法 Download PDFInfo
- Publication number
- WO2013136667A1 WO2013136667A1 PCT/JP2013/000879 JP2013000879W WO2013136667A1 WO 2013136667 A1 WO2013136667 A1 WO 2013136667A1 JP 2013000879 W JP2013000879 W JP 2013000879W WO 2013136667 A1 WO2013136667 A1 WO 2013136667A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- organic
- light emitting
- layer
- emitting layer
- hole transport
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 14
- 238000000034 method Methods 0.000 claims abstract description 121
- 230000005525 hole transport Effects 0.000 claims abstract description 75
- 239000000463 material Substances 0.000 claims abstract description 73
- 229920000642 polymer Polymers 0.000 claims abstract description 40
- 239000011159 matrix material Substances 0.000 claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 36
- 238000000576 coating method Methods 0.000 claims abstract description 26
- 239000002904 solvent Substances 0.000 claims description 26
- 238000005192 partition Methods 0.000 claims description 21
- 238000007639 printing Methods 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 8
- 238000009835 boiling Methods 0.000 claims description 6
- 238000004020 luminiscence type Methods 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 abstract description 13
- 239000010410 layer Substances 0.000 description 189
- 239000010408 film Substances 0.000 description 75
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 33
- 238000002347 injection Methods 0.000 description 28
- 239000007924 injection Substances 0.000 description 28
- 230000015572 biosynthetic process Effects 0.000 description 18
- -1 polypropylene Polymers 0.000 description 16
- 229920005989 resin Polymers 0.000 description 16
- 239000011347 resin Substances 0.000 description 16
- 239000004793 Polystyrene Substances 0.000 description 15
- 229910052751 metal Inorganic materials 0.000 description 15
- 239000002184 metal Substances 0.000 description 15
- 229920002223 polystyrene Polymers 0.000 description 15
- 238000002156 mixing Methods 0.000 description 14
- 238000007740 vapor deposition Methods 0.000 description 13
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 12
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 12
- 229910052782 aluminium Inorganic materials 0.000 description 11
- 238000007789 sealing Methods 0.000 description 11
- 239000010409 thin film Substances 0.000 description 11
- RDOXTESZEPMUJZ-UHFFFAOYSA-N anisole Chemical compound COC1=CC=CC=C1 RDOXTESZEPMUJZ-UHFFFAOYSA-N 0.000 description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 8
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 8
- 239000007789 gas Substances 0.000 description 8
- 238000000059 patterning Methods 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 239000007983 Tris buffer Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 7
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 7
- 239000002861 polymer material Substances 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 239000004925 Acrylic resin Substances 0.000 description 6
- 229920000178 Acrylic resin Polymers 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 6
- 239000004840 adhesive resin Substances 0.000 description 6
- 229920006223 adhesive resin Polymers 0.000 description 6
- 230000000903 blocking effect Effects 0.000 description 6
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 6
- 239000011368 organic material Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 239000002985 plastic film Substances 0.000 description 6
- 229920005591 polysilicon Polymers 0.000 description 6
- 239000003566 sealing material Substances 0.000 description 6
- 238000001771 vacuum deposition Methods 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000008096 xylene Substances 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 230000004888 barrier function Effects 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 5
- UZKWTJUDCOPSNM-UHFFFAOYSA-N methoxybenzene Substances CCCCOC=C UZKWTJUDCOPSNM-UHFFFAOYSA-N 0.000 description 5
- 239000012046 mixed solvent Substances 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 238000002161 passivation Methods 0.000 description 5
- 238000007650 screen-printing Methods 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 4
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 4
- 239000004952 Polyamide Substances 0.000 description 4
- 239000004743 Polypropylene Substances 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 238000007646 gravure printing Methods 0.000 description 4
- 238000007733 ion plating Methods 0.000 description 4
- 229910044991 metal oxide Inorganic materials 0.000 description 4
- 150000004706 metal oxides Chemical class 0.000 description 4
- 230000035699 permeability Effects 0.000 description 4
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 4
- 229920002647 polyamide Polymers 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 239000004926 polymethyl methacrylate Substances 0.000 description 4
- 229920001155 polypropylene Polymers 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 229920000089 Cyclic olefin copolymer Polymers 0.000 description 3
- 101000653679 Homo sapiens Translationally-controlled tumor protein Proteins 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- ZBZXYUYUUDZCNB-UHFFFAOYSA-N N-cyclohexa-1,3-dien-1-yl-N-phenyl-4-[4-(N-[4-[4-(N-[4-[4-(N-phenylanilino)phenyl]phenyl]anilino)phenyl]phenyl]anilino)phenyl]aniline Chemical compound C1=CCCC(N(C=2C=CC=CC=2)C=2C=CC(=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=CC(=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=CC(=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=CC=CC=2)=C1 ZBZXYUYUUDZCNB-UHFFFAOYSA-N 0.000 description 3
- 239000004695 Polyether sulfone Substances 0.000 description 3
- 102100029887 Translationally-controlled tumor protein Human genes 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000003963 antioxidant agent Substances 0.000 description 3
- 239000000969 carrier Substances 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 238000005401 electroluminescence Methods 0.000 description 3
- 229910052741 iridium Inorganic materials 0.000 description 3
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 3
- 238000010030 laminating Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 229920006255 plastic film Polymers 0.000 description 3
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 3
- 229920001230 polyarylate Polymers 0.000 description 3
- 239000004417 polycarbonate Substances 0.000 description 3
- 229920000515 polycarbonate Polymers 0.000 description 3
- 229920006393 polyether sulfone Polymers 0.000 description 3
- 239000011112 polyethylene naphthalate Substances 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000004094 surface-active agent Substances 0.000 description 3
- CXWXQJXEFPUFDZ-UHFFFAOYSA-N tetralin Chemical compound C1=CC=C2CCCCC2=C1 CXWXQJXEFPUFDZ-UHFFFAOYSA-N 0.000 description 3
- 239000004034 viscosity adjusting agent Substances 0.000 description 3
- IRPGOXJVTQTAAN-UHFFFAOYSA-N 2,2,3,3,3-pentafluoropropanal Chemical compound FC(F)(F)C(F)(F)C=O IRPGOXJVTQTAAN-UHFFFAOYSA-N 0.000 description 2
- QLZJUIZVJLSNDD-UHFFFAOYSA-N 2-(2-methylidenebutanoyloxy)ethyl 2-methylidenebutanoate Chemical compound CCC(=C)C(=O)OCCOC(=O)C(=C)CC QLZJUIZVJLSNDD-UHFFFAOYSA-N 0.000 description 2
- KJNZQKYSNAQLEO-UHFFFAOYSA-N 2-(4-methylphenyl)pyridine Chemical compound C1=CC(C)=CC=C1C1=CC=CC=N1 KJNZQKYSNAQLEO-UHFFFAOYSA-N 0.000 description 2
- GEQBRULPNIVQPP-UHFFFAOYSA-N 2-[3,5-bis(1-phenylbenzimidazol-2-yl)phenyl]-1-phenylbenzimidazole Chemical compound C1=CC=CC=C1N1C2=CC=CC=C2N=C1C1=CC(C=2N(C3=CC=CC=C3N=2)C=2C=CC=CC=2)=CC(C=2N(C3=CC=CC=C3N=2)C=2C=CC=CC=2)=C1 GEQBRULPNIVQPP-UHFFFAOYSA-N 0.000 description 2
- KLZUFWVZNOTSEM-UHFFFAOYSA-K Aluminum fluoride Inorganic materials F[Al](F)F KLZUFWVZNOTSEM-UHFFFAOYSA-K 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 230000003078 antioxidant effect Effects 0.000 description 2
- 239000002635 aromatic organic solvent Substances 0.000 description 2
- 239000002585 base Substances 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- VPUGDVKSAQVFFS-UHFFFAOYSA-N coronene Chemical compound C1=C(C2=C34)C=CC3=CC=C(C=C3)C4=C4C3=CC=C(C=C3)C4=C2C3=C1 VPUGDVKSAQVFFS-UHFFFAOYSA-N 0.000 description 2
- 238000004132 cross linking Methods 0.000 description 2
- 238000001723 curing Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 125000005678 ethenylene group Chemical group [H]C([*:1])=C([H])[*:2] 0.000 description 2
- 229920006244 ethylene-ethyl acrylate Polymers 0.000 description 2
- 239000005042 ethylene-ethyl acrylate Substances 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000005468 ion implantation Methods 0.000 description 2
- YERGTYJYQCLVDM-UHFFFAOYSA-N iridium(3+);2-(4-methylphenyl)pyridine Chemical compound [Ir+3].C1=CC(C)=CC=C1C1=CC=CC=N1.C1=CC(C)=CC=C1C1=CC=CC=N1.C1=CC(C)=CC=C1C1=CC=CC=N1 YERGTYJYQCLVDM-UHFFFAOYSA-N 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 239000011777 magnesium Substances 0.000 description 2
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 2
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 2
- 229910001512 metal fluoride Inorganic materials 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 239000012044 organic layer Substances 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 2
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 2
- 229920000412 polyarylene Polymers 0.000 description 2
- 229920001225 polyester resin Polymers 0.000 description 2
- 239000004645 polyester resin Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000002952 polymeric resin Substances 0.000 description 2
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 2
- 229920000123 polythiophene Polymers 0.000 description 2
- BBEAQIROQSPTKN-UHFFFAOYSA-N pyrene Chemical compound C1=CC=C2C=CC3=CC=CC4=CC=C1C2=C43 BBEAQIROQSPTKN-UHFFFAOYSA-N 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000003870 refractory metal Substances 0.000 description 2
- 229910052706 scandium Inorganic materials 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 229920005992 thermoplastic resin Polymers 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical class C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 2
- 239000006097 ultraviolet radiation absorber Substances 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- JCXLYAWYOTYWKM-UHFFFAOYSA-N (2,3,4-triphenylcyclopenta-1,3-dien-1-yl)benzene Chemical compound C1C(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)C(C=2C=CC=CC=2)=C1C1=CC=CC=C1 JCXLYAWYOTYWKM-UHFFFAOYSA-N 0.000 description 1
- KLCLIOISYBHYDZ-UHFFFAOYSA-N 1,4,4-triphenylbuta-1,3-dienylbenzene Chemical compound C=1C=CC=CC=1C(C=1C=CC=CC=1)=CC=C(C=1C=CC=CC=1)C1=CC=CC=C1 KLCLIOISYBHYDZ-UHFFFAOYSA-N 0.000 description 1
- MQRCTQVBZYBPQE-UHFFFAOYSA-N 189363-47-1 Chemical compound C1=CC=CC=C1N(C=1C=C2C3(C4=CC(=CC=C4C2=CC=1)N(C=1C=CC=CC=1)C=1C=CC=CC=1)C1=CC(=CC=C1C1=CC=C(C=C13)N(C=1C=CC=CC=1)C=1C=CC=CC=1)N(C=1C=CC=CC=1)C=1C=CC=CC=1)C1=CC=CC=C1 MQRCTQVBZYBPQE-UHFFFAOYSA-N 0.000 description 1
- UPSWHSOSMRAWEH-UHFFFAOYSA-N 2-n,3-n,4-n-tris(3-methylphenyl)-1-n,1-n,2-n,3-n,4-n-pentakis-phenylbenzene-1,2,3,4-tetramine Chemical compound CC1=CC=CC(N(C=2C=CC=CC=2)C=2C(=C(N(C=3C=CC=CC=3)C=3C=C(C)C=CC=3)C(N(C=3C=CC=CC=3)C=3C=CC=CC=3)=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)=C1 UPSWHSOSMRAWEH-UHFFFAOYSA-N 0.000 description 1
- MTUBTKOZCCGPSU-UHFFFAOYSA-N 2-n-naphthalen-1-yl-1-n,1-n,2-n-triphenylbenzene-1,2-diamine Chemical compound C1=CC=CC=C1N(C=1C(=CC=CC=1)N(C=1C=CC=CC=1)C=1C2=CC=CC=C2C=CC=1)C1=CC=CC=C1 MTUBTKOZCCGPSU-UHFFFAOYSA-N 0.000 description 1
- MGADZUXDNSDTHW-UHFFFAOYSA-N 2H-pyran Chemical compound C1OC=CC=C1 MGADZUXDNSDTHW-UHFFFAOYSA-N 0.000 description 1
- DIVZFUBWFAOMCW-UHFFFAOYSA-N 4-n-(3-methylphenyl)-1-n,1-n-bis[4-(n-(3-methylphenyl)anilino)phenyl]-4-n-phenylbenzene-1,4-diamine Chemical compound CC1=CC=CC(N(C=2C=CC=CC=2)C=2C=CC(=CC=2)N(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)=C1 DIVZFUBWFAOMCW-UHFFFAOYSA-N 0.000 description 1
- CRHRWHRNQKPUPO-UHFFFAOYSA-N 4-n-naphthalen-1-yl-1-n,1-n-bis[4-(n-naphthalen-1-ylanilino)phenyl]-4-n-phenylbenzene-1,4-diamine Chemical compound C1=CC=CC=C1N(C=1C2=CC=CC=C2C=CC=1)C1=CC=C(N(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C3=CC=CC=C3C=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C3=CC=CC=C3C=CC=2)C=C1 CRHRWHRNQKPUPO-UHFFFAOYSA-N 0.000 description 1
- NWUAFVKGPOBCOA-UHFFFAOYSA-N 8-hydroxy-2-methylquinoline-5-carbonitrile Chemical compound N#CC1=CC=C(O)C2=NC(C)=CC=C21 NWUAFVKGPOBCOA-UHFFFAOYSA-N 0.000 description 1
- 229910017073 AlLi Inorganic materials 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 101000679365 Homo sapiens Putative tyrosine-protein phosphatase TPTE Proteins 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- ZCQWOFVYLHDMMC-UHFFFAOYSA-N Oxazole Chemical compound C1=COC=N1 ZCQWOFVYLHDMMC-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 102100022578 Putative tyrosine-protein phosphatase TPTE Human genes 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 229910000611 Zinc aluminium Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- HXFVOUUOTHJFPX-UHFFFAOYSA-N alumane;zinc Chemical compound [AlH3].[Zn] HXFVOUUOTHJFPX-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- IMALFSHRMABADU-UHFFFAOYSA-K aluminum 4-(4-cyanophenyl)phenolate 2-methyl-5-(trifluoromethyl)quinolin-8-olate Chemical compound [Al+3].C(#N)C1=CC=C(C=C1)C1=CC=C(C=C1)[O-].CC1=NC2=C(C=CC(=C2C=C1)C(F)(F)F)[O-].CC1=NC2=C(C=CC(=C2C=C1)C(F)(F)F)[O-] IMALFSHRMABADU-UHFFFAOYSA-K 0.000 description 1
- ANAJSSMBLXCCSM-UHFFFAOYSA-K aluminum;4-(4-cyanophenyl)phenolate Chemical compound [Al+3].C1=CC([O-])=CC=C1C1=CC=C(C#N)C=C1.C1=CC([O-])=CC=C1C1=CC=C(C#N)C=C1.C1=CC([O-])=CC=C1C1=CC=C(C#N)C=C1 ANAJSSMBLXCCSM-UHFFFAOYSA-K 0.000 description 1
- 150000005010 aminoquinolines Chemical class 0.000 description 1
- RJGDLRCDCYRQOQ-UHFFFAOYSA-N anthrone Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3CC2=C1 RJGDLRCDCYRQOQ-UHFFFAOYSA-N 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- IVMYJDGYRUAWML-UHFFFAOYSA-N cobalt(II) oxide Inorganic materials [Co]=O IVMYJDGYRUAWML-UHFFFAOYSA-N 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- OPHUWKNKFYBPDR-UHFFFAOYSA-N copper lithium Chemical compound [Li].[Cu] OPHUWKNKFYBPDR-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000007607 die coating method Methods 0.000 description 1
- 239000000539 dimer Substances 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 239000005038 ethylene vinyl acetate Substances 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- GVEPBJHOBDJJJI-UHFFFAOYSA-N fluoranthrene Natural products C1=CC(C2=CC=CC=C22)=C3C2=CC=CC3=C1 GVEPBJHOBDJJJI-UHFFFAOYSA-N 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 238000013007 heat curing Methods 0.000 description 1
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 1
- 238000004050 hot filament vapor deposition Methods 0.000 description 1
- 239000012943 hotmelt Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- NJWNEWQMQCGRDO-UHFFFAOYSA-N indium zinc Chemical compound [Zn].[In] NJWNEWQMQCGRDO-UHFFFAOYSA-N 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000011344 liquid material Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- FUJCRWPEOMXPAD-UHFFFAOYSA-N lithium oxide Chemical compound [Li+].[Li+].[O-2] FUJCRWPEOMXPAD-UHFFFAOYSA-N 0.000 description 1
- 229910001947 lithium oxide Inorganic materials 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 description 1
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 239000002905 metal composite material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- FGGAOQTXQHKQOW-UHFFFAOYSA-N n,n-diphenylnaphthalen-1-amine Chemical class C1=CC=CC=C1N(C=1C2=CC=CC=C2C=CC=1)C1=CC=CC=C1 FGGAOQTXQHKQOW-UHFFFAOYSA-N 0.000 description 1
- IBHBKWKFFTZAHE-UHFFFAOYSA-N n-[4-[4-(n-naphthalen-1-ylanilino)phenyl]phenyl]-n-phenylnaphthalen-1-amine Chemical compound C1=CC=CC=C1N(C=1C2=CC=CC=C2C=CC=1)C1=CC=C(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C3=CC=CC=C3C=CC=2)C=C1 IBHBKWKFFTZAHE-UHFFFAOYSA-N 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N nickel(II) oxide Inorganic materials [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- AHLBNYSZXLDEJQ-FWEHEUNISA-N orlistat Chemical compound CCCCCCCCCCC[C@H](OC(=O)[C@H](CC(C)C)NC=O)C[C@@H]1OC(=O)[C@H]1CCCCCC AHLBNYSZXLDEJQ-FWEHEUNISA-N 0.000 description 1
- WCPAKWJPBJAGKN-UHFFFAOYSA-N oxadiazole Chemical compound C1=CON=N1 WCPAKWJPBJAGKN-UHFFFAOYSA-N 0.000 description 1
- JMANVNJQNLATNU-UHFFFAOYSA-N oxalonitrile Chemical compound N#CC#N JMANVNJQNLATNU-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 125000001037 p-tolyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])([H])[H] 0.000 description 1
- CSHWQDPOILHKBI-UHFFFAOYSA-N peryrene Natural products C1=CC(C2=CC=CC=3C2=C2C=CC=3)=C3C2=CC=CC3=C1 CSHWQDPOILHKBI-UHFFFAOYSA-N 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 238000000016 photochemical curing Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920002098 polyfluorene Polymers 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- QRDZFPUVLYEQTA-UHFFFAOYSA-N quinoline-8-carboxylic acid Chemical compound C1=CN=C2C(C(=O)O)=CC=CC2=C1 QRDZFPUVLYEQTA-UHFFFAOYSA-N 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 230000002940 repellent Effects 0.000 description 1
- 239000005871 repellent Substances 0.000 description 1
- YYMBJDOZVAITBP-UHFFFAOYSA-N rubrene Chemical compound C1=CC=CC=C1C(C1=C(C=2C=CC=CC=2)C2=CC=CC=C2C(C=2C=CC=CC=2)=C11)=C(C=CC=C2)C2=C1C1=CC=CC=C1 YYMBJDOZVAITBP-UHFFFAOYSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 150000003377 silicon compounds Chemical class 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 229920003051 synthetic elastomer Polymers 0.000 description 1
- 239000005061 synthetic rubber Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 125000003396 thiol group Chemical class [H]S* 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 150000003852 triazoles Chemical class 0.000 description 1
- PWYVVBKROXXHEB-UHFFFAOYSA-M trimethyl-[3-(1-methyl-2,3,4,5-tetraphenylsilol-1-yl)propyl]azanium;iodide Chemical compound [I-].C[N+](C)(C)CCC[Si]1(C)C(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)C(C=2C=CC=CC=2)=C1C1=CC=CC=C1 PWYVVBKROXXHEB-UHFFFAOYSA-M 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
- H10K50/155—Hole transporting layers comprising dopants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
- H10K50/12—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising dopants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/06—Luminescent, e.g. electroluminescent, chemiluminescent materials containing organic luminescent materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/13—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K2211/00—Chemical nature of organic luminescent or tenebrescent compounds
- C09K2211/10—Non-macromolecular compounds
- C09K2211/1003—Carbocyclic compounds
- C09K2211/1011—Condensed systems
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K2211/00—Chemical nature of organic luminescent or tenebrescent compounds
- C09K2211/10—Non-macromolecular compounds
- C09K2211/1018—Heterocyclic compounds
- C09K2211/1025—Heterocyclic compounds characterised by ligands
- C09K2211/1029—Heterocyclic compounds characterised by ligands containing one nitrogen atom as the heteroatom
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K2211/00—Chemical nature of organic luminescent or tenebrescent compounds
- C09K2211/18—Metal complexes
- C09K2211/185—Metal complexes of the platinum group, i.e. Os, Ir, Pt, Ru, Rh or Pd
Definitions
- the present invention relates to an organic EL device using electroluminescence (hereinafter referred to as EL) and a manufacturing method thereof.
- FIG. 3 shows a schematic diagram of a general organic electroluminescence display device 300.
- One pixel (pixel) 301 includes sub-pixels 302 for the three primary colors R (red), G (green), and B (blue).
- Each sub-pixel 302 is formed with an organic EL device of each emission color, and in the case of active driving, a thin film transistor (hereinafter also referred to as TFT) is formed.
- TFT thin film transistor
- a display substrate in which an insulating material such as patterned photosensitive polyimide is formed in a partition shape so as to partition the subpixel 302 is used.
- the barrier rib pattern is formed so as to cover the edge portion of the transparent electrode formed as an anode, and the barrier rib pattern defines the subpixel 302 region.
- a hole injection layer is formed on the transparent electrode and the barrier rib pattern.
- a method for forming a hole injection layer for injecting hole carriers there are two types, a dry film formation method and a wet film formation method.
- a wet film forming method a polythiophene derivative dispersed in water is generally used.
- a hole transport layer may be formed on the hole injection layer.
- dry film formation and wet film formation methods there are two types of methods for forming the organic light emitting layer.
- a thin film by a wet film forming method by dissolving a polymer material or a low molecular material in a solvent to form a coating solution.
- a light emitting medium layer including an organic light emitting layer is formed by a wet film forming method using a coating material of a polymer material or a low molecular material
- the layer structure is laminated with a hole transport layer and an organic light emitting layer from the anode side.
- a layer structure is common.
- the organic light emitting layer is formed by dissolving or stably dispersing an organic light emitting material having each emission color of red (R), green (G), and blue (B) in a solvent to form a color device. It can be applied separately using organic luminescent ink (Patent Documents 1 and 2).
- the ink jet method is a method of obtaining a desired pattern by ejecting a light emitting layer material dissolved in a solvent from an ink jet nozzle onto a substrate and drying it on the substrate (Patent Document 3).
- a crosslinkable material may be used for the lower layer, and insolubilization may be performed by crosslinking after film formation.
- the introduction of a highly reactive cross-linking group is likely to adversely affect device characteristics, and material synthesis becomes difficult and expensive.
- the method of forming into a laminated structure by forming by the wet method using the mixed solvent which consists of a good solvent and a poor solvent is disclosed.
- this method has a problem that the good solvent dissolves the lower layer, and the solubility of the ink is lowered by reducing the good solvent ratio, so that it can be formed only with a thin film thickness (Patent Document 6). .
- Patent Document 7 Also disclosed is a method for preventing dissolution of the lower layer by raising the temperature of the film formation surface above the boiling point of the solvent during coating.
- this method has a problem that the solvent is dried very quickly, so that non-uniform precipitation is likely to occur in the coating film, and the film thickness distribution in the substrate becomes large because leveling is not performed.
- the present invention has been made in view of the above problems, and in the method of manufacturing an organic EL device, the coating method is excellent in productivity, but there is a problem that the coating solution dissolves in the lower layer, and efficiency and stability are improved. Lack. To solve this problem and provide a method for producing a high-efficiency, long-life organic EL device without dissolving the hole transport layer located on the coated surface even if a light-emitting layer is applied and formed.
- the first aspect of the present invention is such that a first electrode formed on a substrate, a light-emitting medium layer including at least an organic light-emitting layer, and the light-emitting medium layer are sandwiched between them.
- An organic electroluminescent device comprising at least a second electrode formed to face the first electrode, The light emitting medium layer has at least an organic light emitting layer and a hole transport layer adjacent to the organic light emitting layer, and the hole transport layer has at least a low molecular weight hole transport material and a weight average molecular weight of 200,000 to 5,000.
- An organic electroluminescent device comprising 10,000 or less insulating matrix polymer.
- the second aspect of the present invention is the organic electroluminescent device according to the first aspect of the present invention, wherein a partition wall is formed so as to partition the light emitting region.
- a third aspect of the present invention is the organic electroluminescent device according to the first or second aspect of the present invention, wherein the insulating matrix polymer has a weight average molecular weight of 1 million to 50 million. is there.
- the organic light emitting layer includes at least a low molecular weight light emitting material and an insulating matrix polymer having a weight average molecular weight of 200,000 to 50 million.
- the organic electroluminescence device according to any one of aspects 1 to 3.
- the organic light emitting layer includes at least a low molecular light emitting material and an insulating matrix polymer having a weight average molecular weight of 1 million to 50 million. It is an organic electroluminescent device of 4 aspects.
- the sixth aspect of the present invention is the organic electroluminescent device according to any one of the first to fifth aspects of the present invention, wherein the hole transport layer and the organic light emitting layer contain the same insulating matrix polymer. It is a sense device.
- the seventh aspect of the present invention is the organic electroluminescent device according to any one of the first to sixth aspects of the present invention, wherein the hole transport layer and the organic light emitting layer are formed by a coating method. It is a manufacturing method.
- An eighth aspect of the present invention is the method for manufacturing an organic electroluminescent device according to the seventh aspect of the present invention, wherein the substrate is heated in the step of applying the organic light emitting layer.
- the temperature at which the substrate is heated is not higher than the boiling point of the solvent of the ink forming the organic light emitting layer. It is a manufacturing method.
- the tenth aspect of the present invention is the manufacture of an organic electroluminescent device according to any one of the first to ninth aspects of the present invention, wherein the step of applying the organic light emitting layer is a nozzle printing method. Is the method.
- the eleventh aspect of the present invention is the process for producing an organic electroluminescent device according to any one of the first to ninth aspects of the present invention, wherein the step of applying the organic light emitting layer is a relief printing method. Is the method.
- the combination of the low molecular weight hole transport material and the macromolecular weight insulating polymer of the present invention causes the hole transport layer to be violated even when a light emitting layer is formed by coating on the hole transport layer constituting the EL device.
- a simple and highly productive coating method can be used, and a highly efficient and long-life organic EL device can be obtained.
- FIG. 1 An example of an embodiment of the organic EL device of the present invention is shown in FIG.
- a) the first electrode 101 is formed on the substrate 100.
- the hole injection layer 102 is formed on the first electrode 101.
- a hole transport layer 103 is formed on the hole injection layer 102 by a coating method.
- the hole transport layer 103 contains at least a hole transport material and a matrix polymer having a weight average molecular weight of 200,000 or more.
- an organic light emitting layer 104 is formed on the hole transport layer 103 by a coating method.
- the organic light emitting layer 104 is coated on the hole transport layer 103 by reducing the fluidity of the organic material contained in the hole transport layer 103 by including a matrix polymer in the hole transport layer 103.
- the mixing of the hole transport layer 103 and the organic light emitting layer 104 is suppressed.
- the matrix polymer has a weight average molecular weight of 200,000 to 50 million.
- the weight average molecular weight of the matrix polymer is preferably 1 million or more.
- the hole mobility is lowered by mixing the matrix polymer with the hole transport layer 103.
- the weight average molecular weight of the matrix polymer is 1 million or more, the fluidity is lowered even if the mixing ratio of the matrix polymer is low. Since an effect can be obtained, a decrease in mobility can be suppressed. If the weight average molecular weight of the matrix polymer is more than 50 million, it will not dissolve in the solvent.
- the matrix polymer included in the hole transport layer 103 be insulative. Insulation is that there is no conductivity or charge transport.
- the hole transport layer 103 includes a low molecular hole transport material. Low molecular hole transport materials have a higher degree of freedom in material design than polymer hole transport materials, and since the band gap is easily increased, exciton blocking properties and electron blocking properties are high, resulting in high device efficiency and durability. high.
- the mixing ratio of the matrix polymer contained in the hole transport layer 103 is preferably 5% to 70%, more preferably 10% to 50%. This is because if the mixing ratio is too low, the effect of lowering the fluidity cannot be sufficiently obtained, and if the mixing ratio is too high, the hole transporting ability of the hole transporting layer is greatly reduced.
- the organic light emitting layer 104 preferably contains at least a low molecular light emitting material and a matrix polymer having a weight average molecular weight of 200,000 or more. Mixing of the hole transport layer 103 and the organic light emitting layer 104 when the organic light emitting layer 104 is coated on the hole transport layer 103 by reducing the fluidity of the material contained in the organic light emitting layer by including the matrix polymer. Can be suppressed.
- the weight average molecular weight of the matrix polymer is 1 million or more.
- the hole mobility and electron mobility are reduced by mixing the matrix polymer in the organic light emitting layer.
- the weight average molecular weight of the matrix polymer is 1 million or more, the fluidity can be achieved even if the mixing ratio of the matrix polymer is low. Since a reduction effect can be obtained, a reduction in mobility can be suppressed.
- the hole transport layer 103 and the organic light emitting layer 104 preferably contain the same matrix polymer. By including the same matrix polymer in the hole transport layer 103 and the organic light emitting layer 104, the interface at the interface between the hole transport layer 103 and the organic light emitting layer 104 is improved and carrier injection is improved.
- the mixing ratio of the matrix polymer included in the organic light emitting layer 104 is preferably 5% to 70%, more preferably 10% to 50%. This is because if the mixing ratio is too low, the effect of lowering the fluidity cannot be sufficiently obtained, and if the mixing ratio is too high, the charge transporting ability of the organic light emitting layer is greatly reduced, and the light emission efficiency is further reduced.
- the substrate heating temperature at this time is preferably not more than the boiling point of the solvent of the ink forming the organic light emitting layer 104. This is because if the heating is performed at a temperature higher than the boiling point, the solvent is dried very quickly, so that non-uniform deposition is likely to occur in the coating film, and since the leveling is not performed, the film thickness distribution in the substrate becomes large.
- an electron transport layer 105 is formed on the organic light emitting layer 104 by, for example, a vacuum deposition method.
- the second electrode 106 is formed on the electron transport layer 105.
- An organic electroluminescent device is formed by the above steps.
- partition walls are formed so as to partition the light emitting region. By forming the partition, the flow of the solution in the direction of the substrate surface when the organic light emitting layer is applied can be suppressed, and the organic light emitting layer 104 can be formed more uniformly.
- the organic EL device in the present invention can be applied to both passive driving and active driving. Further, the present invention can be applied to the device 300, the lighting device, and the like.
- the substrate 200 used in the embodiment of the present invention may be any substrate that can support an organic EL device, but in the case of an active matrix method, a TFT substrate on which a thin film transistor is formed is used.
- FIG. 2 shows an example of a TFT-coated TFT substrate that can be used in the present invention.
- a TFT and a pixel electrode (first electrode) 207 of the organic EL display device are provided, and the TFT and the first electrode 207 are electrically connected.
- the TFT and the active matrix driving type organic EL device formed thereon are supported by a support. Any material can be used as the support as long as it has mechanical strength and insulation and is excellent in dimensional stability.
- plastic film or sheet such as glass, quartz, polypropylene, polyethersulfone, polycarbonate, cycloolefin polymer, polyarylate, polyamide, polymethyl methacrylate, polyethylene terephthalate, polyethylene naphthalate, etc., or oxidation to these plastic films or sheets
- Metal oxides such as silicon and aluminum oxide, metal fluorides such as aluminum fluoride and magnesium fluoride, metal nitrides such as silicon nitride and aluminum nitride, metal oxynitrides such as silicon oxynitride, acrylic resins and epoxy resins
- Translucent base material with a single layer or laminated polymer resin film such as silicon resin or polyester resin, metal foil such as aluminum or stainless steel, sheet or plate, and aluminum film on the plastic film or sheet. It can be used beam, copper, nickel, stainless steel and metal film non-translucent substrate as a laminate of such.
- the light-transmitting property of the support may be selected depending on which surface the light extraction is performed from.
- the support made of these materials is formed with an inorganic film or a fluororesin, and is subjected to moisture-proof treatment or hydrophobic treatment. Preferably there is.
- a known thin film transistor can be used as the thin film transistor provided on the support. Specifically, a thin film transistor including an active layer 201 in which a source / drain region and a channel region are formed, a gate insulating film 202, and a gate electrode 205 is mainly mentioned.
- the structure of the thin film transistor is not particularly limited, and examples thereof include a staggered type, an inverted staggered type, a top gate type, and a coplanar type.
- the active layer 201 is not particularly limited, and examples thereof include inorganic semiconductor materials such as amorphous silicon, polycrystalline silicon, microcrystalline silicon, and cadmium selenide, metal oxide semiconductor materials such as ZnO and IGZO, or thiol. It can be formed of an organic semiconductor material such as a fuen oligomer or poly (p-ferylene vinylene).
- These active layers are, for example, Amorphous silicon is laminated by plasma CVD method, Ion doping method: Amorphous silicon is formed by LPCVD using SiH 4 gas, and amorphous silicon is crystallized by solid phase growth to obtain polysilicon.
- a method of ion doping by ion implantation amorphous silicon is formed by LPCVD using Si 2 H 6 gas or PECVD using SiH 4 gas, and annealed by a laser such as an excimer laser. After crystallizing to obtain polysilicon, Method of ion doping by ion doping method (low temperature process); polysilicon is laminated by low pressure CVD method or LPCVD method, thermally oxidized at 1000 ° C. or more to form a gate insulating film, and n + polysilicon gate electrode thereon And then ion doping by an ion implantation method (high temperature process).
- the gate insulating film 202 a film normally used as a gate insulating film can be used.
- the gate insulating film 202 is obtained by thermally oxidizing SiO 2 formed by PECVD, LPCVD, or the like, or a polysilicon film. SiO 2 or the like can be used.
- the gate electrode 205 those normally used as the gate electrode can be used, for example, metals such as aluminum and copper; refractory metals such as titanium, tantalum and tungsten; polysilicon; silicide of refractory metals Polycide; and the like.
- the thin film transistor may have a single gate structure, a double gate structure, or a multi-gate structure having three or more gate electrodes. Moreover, you may have a LDD (Lightly Doped Drain) structure and an offset structure. Further, two or more thin film transistors may be arranged in one pixel.
- the display device of the present invention needs to be connected so that the thin film transistor functions as a switching device of the organic EL device, and the drain electrode 204 of the transistor and the pixel electrode of the organic EL display device are electrically connected.
- a pixel electrode (first electrode) 207 is formed on the substrate, and patterning is performed as necessary.
- metal composite oxides such as ITO (indium tin composite oxide), indium zinc composite oxide and zinc aluminum composite oxide, metal materials such as gold and platinum, and these metal oxides and metals Either a single layer or a laminate of fine particle dispersion films in which fine particles of a material are dispersed in an epoxy resin or an acrylic resin can be used.
- the pixel electrode 207 When the pixel electrode 207 is used as an anode, it is preferable to select a material having a high work function such as ITO. In the case of a so-called bottom emission structure in which light is extracted from below, it is necessary to select a light-transmitting material.
- the pixel electrode is formed by a resistance heating vapor deposition method, an electron beam vapor deposition method, a reactive vapor deposition method, an ion plating method, a sputtering method, or a dry film forming method, a gravure printing method, or a screen printing method.
- a wet film forming method such as can be used.
- an existing patterning method such as a mask vapor deposition method, a photolithography method, a wet etching method, or a dry etching method can be used depending on a material and a film forming method.
- a photolithography method is preferable.
- the partition 208 is formed so as to partition the light emitting region corresponding to the pixel.
- a partition wall is formed to form an opening for containing a solution in which an organic material is dissolved when an organic layer is formed by a coating method.
- a method for forming the partition wall 208 an inorganic film is uniformly formed on a substrate, masked with a resist, dry etching is performed, or a photosensitive resin is laminated on the substrate, and a predetermined pattern is formed by photolithography. The method of doing is mentioned.
- a preferable height of the partition wall is 0.1 ⁇ m to 10.0 ⁇ m, and more preferably about 0.5 ⁇ m to 4.0 ⁇ m.
- a photosensitive resin can be suitably used.
- the photosensitive resin either a positive resist or a negative resist may be used, and specific examples include polyimide, acrylic resin, and novolak resin photosensitive resins.
- a water repellent can be added, or plasma or UV can be irradiated to impart liquid repellency to the ink after formation.
- a hole injection layer 102, a hole transport layer 103, an organic light emitting layer 104, and an electron transport layer 105 are sequentially provided on the first electrode 101 as a light emitting medium layer.
- the formed structure is mentioned. A part of these layers sandwiched between the electrodes can be omitted, and a layer such as a hole blocking layer can be further added, and is appropriately selected from known ones.
- the hole injection layer 102 has a function of injecting holes from the first electrode.
- the physical property value of the hole injection layer 102 preferably has a work function equal to or higher than that of the pixel electrode 207. This is because holes are efficiently injected from the pixel electrode. Although it varies depending on the material of the pixel electrode 207, 4.5 eV or more and 6.5 eV or less can be used. When the pixel electrode is ITO or IZO, 5.0 eV or more and 6.0 eV or less can be suitably used.
- the specific resistance of the hole injection layer is preferably 1 ⁇ 10 3 to 2 ⁇ 10 6 ⁇ ⁇ m, more preferably 5 ⁇ 10 3 to 1 ⁇ 10 6 ⁇ ⁇ m in a thickness of 30 nm or more. Further, in the bottom emission structure, emitted light is extracted from the pixel electrode side. If the light transmittance is low, the extraction efficiency is lowered. Therefore, the total average in the visible light wavelength region is preferably 75% or more, and if it is 85% or more. It can be suitably used.
- a material constituting the hole injection layer 102 for example, a polymer material such as polyaniline, polythiophene, polyvinyl carbazole, a mixture of poly (3,4-ethylenedioxythiophene) and polystyrenesulfonic acid can be used.
- a conductive polymer having a conductivity of 10 ⁇ 2 S / cm or more and 10 ⁇ 6 S / cm or less can be preferably used.
- the polymer material can be used in a film forming process by a wet method. For this reason, it is preferable to use a polymer material when forming the hole injection layer.
- Such a polymer material is dispersed or dissolved in water or a solvent and used as a dispersion or solution.
- the hole transport material 103 Cu 2 O, Cr 2 O 3 , Mn 2 O 3 , FeO X (X to 0.1), NiO, CoO, Bi 2 O 3 , SnO 2 , ThO 2, Nb 2 O 5, Pr 2 O 3, Ag 2 O, MoO 2, ZnO, TiO 2, V 2 O 5, Nb 2 O 5, Ta 2 O 5, MoO 3, WO 3, MnO 2 or the like can be used.
- a method for forming the hole injection layer 102 the entire surface of the display area on the pixel electrode 207 is formed by a simple method such as a slit coating method, a spin coating method, a die coating method, a dipping method, a blade coating method, or a spray method.
- existing film forming methods such as a relief printing method, a gravure printing method, and a wet film forming method such as a screen printing method can also be used.
- an ink (liquid material) in which the hole transport material is dissolved in water, an organic solvent, or a mixed solvent thereof is used.
- an organic solvent toluene, xylene, anisole, mesitylene, tetralin, acetone, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone, methanol, ethanol, isopropyl alcohol, ethyl acetate, butyl acetate and the like can be used.
- surfactants, antioxidants, viscosity modifiers, ultraviolet absorbers and the like may be added to the ink.
- the hole injection layer 102 is an inorganic material, it can be formed using a dry process such as a resistance heating vapor deposition method, an electron beam vapor deposition method, a reactive vapor deposition method, an ion plating method, or a sputtering method.
- a dry process such as a resistance heating vapor deposition method, an electron beam vapor deposition method, a reactive vapor deposition method, an ion plating method, or a sputtering method.
- the hole transport layer 103 has a function of improving the light emission lifetime of the device by being laminated between the organic light emitting layer 104 and the hole injection layer 102.
- a low molecular hole transport material can be suitably used as the material of the hole transport layer 103.
- aromatic amine (triphenylamine) dimer derivative (TPD), ( ⁇ -naphthyldiphenylamine) dimer ( ⁇ -NPD), [(triphenylamine) dimer] spirodimer (Spiro-TAD), TPTE represented by Formula 1, TPT1 represented by Formula 2, and the like, 4,4 ', 4'- Stars such as tris [3-methylphenyl (phenyl) amino] triphenylamine (m-MTDATA), 4,4 ′, 4 ′′ -tris [1-naphthyl (phenyl) amino] triphenylamine (1-TNATA) Burstamines and 5,5′- ⁇ -bis- ⁇ 4- [bis (4-methylphenyl) amino] phenyl ⁇ -2,2 ′: 5 ′, 2′- ⁇ terthiophene (BMA-3T Oligothiophenes etc., but and the like but are not limited to these.
- TPD aromatic amine
- the hole transport layer 103 includes a matrix polymer having a weight average molecular weight of 200,000 to 50 million.
- the matrix polymer for example, polycarbonate, polystyrene, polymethyl methacrylate, polypropylene, polyethersulfone, cycloolefin polymer, polyarylate, polyamide, polyethylene terephthalate, polyethylene naphthalate and the like can be preferably used.
- organic materials are dissolved or stably dispersed in a solvent to form an ink for the organic hole transport layer 103.
- the solvent for dissolving or dispersing the organic hole transport layer material include toluene, xylene, acetone, anisole, methyl ethyl ketone, methyl isobutyl ketone, and cyclohexanone alone or a mixed solvent thereof.
- aromatic organic solvents such as toluene, xylene, and anisole are preferable from the viewpoint of solubility of the organic hole transport layer material.
- a surfactant, an antioxidant, a viscosity modifier, an ultraviolet absorber, and the like may be added to the organic hole transport layer ink as necessary.
- the band gap is preferably 3.0 eV or more, more preferably 3.5 eV or more.
- the entire surface of the display region on the pixel electrode 207 is collectively formed by a simple method such as a slit coat method, a spin coat method, a die coat method, a dipping method, a blade coat method, or a spray method.
- a simple method such as a slit coat method, a spin coat method, a die coat method, a dipping method, a blade coat method, or a spray method.
- an existing film formation method such as a relief printing method, an ink jet method, a nozzle printing method, a gravure printing method, a wet film forming method such as a screen printing method can also be used.
- the organic light emitting layer 104 is formed.
- the organic light emitting layer 104 is a layer that emits light by passing an electric current.
- the organic light emitting layer 104 is formed so as to cover the hole transport layer 103. Can be suitably used by performing patterning as necessary.
- Examples of the organic light emitting material for forming the organic light emitting layer 104 include 9,10-diarylanthracene derivatives, pyrene, coronene, rubrene, 1,1,4,4-tetraphenylbutadiene, tris (8-quinolato) aluminum complex, tris.
- the organic light emitting layer 104 can include a matrix polymer.
- the matrix polymer for example, polycarbonate, polystyrene, polymethyl methacrylate, polypropylene, polyethersulfone, cycloolefin polymer, polyarylate, polyamide, polyethylene terephthalate, polyethylene naphthalate and the like can be suitably used.
- organic light emitting materials are dissolved or stably dispersed in a solvent to form an organic light emitting ink.
- the solvent for dissolving or dispersing the organic light emitting material include toluene, xylene, acetone, anisole, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone, or a mixed solvent thereof.
- aromatic organic solvents such as toluene, xylene, and anisole are preferable from the viewpoint of the solubility of the organic light emitting material.
- surfactant, antioxidant, a viscosity modifier, a ultraviolet absorber, etc. may be added to organic luminescent ink as needed.
- a wet film formation method is preferable.
- an existing film formation method such as an ink jet method, a nozzle printing method, a relief printing method, a gravure printing method, or a screen printing method is used.
- a membrane method can be used.
- the nozzle printing method or the relief printing method is preferable.
- the entire surface of the display area on the pixel electrode 207 is slit coated, spin coated, die coated, dipped, bladed It can form in a lump by a simple method such as a coating method or a spray method.
- a hole blocking layer, an electron injection layer, and the like can be formed.
- the material used for the hole blocking layer and the electron injection layer may be any material that is generally used as an electron transport material, such as triazole, oxazole, oxadiazole, silole, and boron.
- a film can be formed by a vacuum deposition method using a material, an alkali metal such as lithium fluoride or lithium oxide, or a salt or oxide of an alkaline earth metal.
- these electron transport materials or those obtained by mixing these electron transport materials in polymers such as polystyrene, polymethyl methacrylate, and polyvinyl carbazole are toluene, xylene, acetone, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone, methanol, ethanol, isopropyl
- a film can be formed by a printing method by dissolving or dispersing in alcohol, ethyl acetate, butyl acetate, water or the like alone or in a mixed solvent to form an electron injection coating solution.
- a counter electrode (second electrode) 106 is formed.
- the counter electrode is a cathode
- a material having a high electron injection efficiency into the organic light emitting layer and a low work function is used.
- a single metal such as Mg, Al, or Yb is used, or a compound such as Li, oxidized Li, or LiF is sandwiched by about 1 nm at the interface contacting the light emitting medium layer, and Al or Cu having high stability and conductivity is placed. You may use it, laminating
- one or more metals such as Li, Mg, Ca, Sr, La, Ce, Er, Eu, Sc, Y, Yb and the like having a low work function and stable Ag, Al
- an alloy system with a metal element such as Cu may be used.
- alloys such as MgAg, AlLi, and CuLi can be used.
- a resistance heating vapor deposition method, an electron beam vapor deposition method, a reactive vapor deposition method, an ion plating method, or a sputtering method can be used depending on the material.
- ⁇ Sealing> As an organic EL display device, it is possible to emit light by sandwiching a light emitting material between electrodes and passing an electric current. However, since an organic light emitting material is easily deteriorated by moisture or oxygen in the atmosphere, it is usually externally connected. Seal for blocking. ⁇ Can sealing> For sealing, for example, a sealing can may be bonded onto the substrate. The sealing can needs to be low in gas permeability and can be made of glass or metal such as stainless steel. As the adhesive, a UV curable adhesive is preferable.
- a passivation layer may be formed on the counter electrode.
- the passivation layer includes metal oxides such as silicon oxide and aluminum oxide, metal fluorides such as aluminum fluoride and magnesium fluoride, metal nitrides such as silicon nitride, aluminum nitride and carbon nitride, and metal acids such as silicon oxynitride.
- Laminates, metal carbides such as silicon carbide, and laminated films with polymer resin films such as acrylic resin, epoxy resin, silicon resin, and polyester resin may be used as required.
- a laminated film or a gradient film having a variable film density a film having both step coverage and barrier properties can be obtained. .
- a resistance heating vapor deposition method As a method for forming the passivation layer, a resistance heating vapor deposition method, an electron beam vapor deposition method, a reactive vapor deposition method, an ion plating method, a sputtering method, or a CVD method can be used depending on the material.
- the CVD method is preferably used because the film density and film composition can be easily varied depending on the step coverage and the film forming conditions.
- a thermal CVD method, a plasma CVD method, a catalytic CVD method, a VUV-CVD method, or the like can be used.
- a gas such as N 2 , O 2 , NH 3 , H 2 , N 2 O is added to an organic silicon compound such as monosilane, hexamethyldisilazane (HMDS), or tetraethoxysilane.
- HMDS hexamethyldisilazane
- the film density may be changed by changing the gas flow rate of silane or the like, or the plasma power, if necessary.
- Hydrogen or carbon may be added to the film by the reactive gas used. It can also be contained.
- the thickness of the passivation layer is preferably 5 ⁇ m or less, more preferably 1 ⁇ m or less.
- a resin layer may be provided on the sealing material and bonded together.
- the sealing material needs to be a base material having low moisture and oxygen permeability.
- the material include ceramics such as alumina, silicon nitride, and boron nitride, glass such as alkali-free glass and alkali glass, quartz, and moisture resistant film.
- moisture-resistant films include films in which SiO X is formed on both sides of a plastic substrate by CVD, films with low permeability and water-absorbing films, or polymer films coated with a water-absorbing agent.
- the water vapor transmission rate of the film is preferably 10 ⁇ 6 g / m 2 / day or less.
- a photo-curing adhesive resin As an example of the material of the resin layer, a photo-curing adhesive resin, a thermosetting adhesive resin, a two-component curable adhesive resin, or an ethylene ethyl acrylate (EEA) made of epoxy resin, acrylic resin, silicon resin, or the like
- ESA ethylene ethyl acrylate
- acrylic resins such as polymers, vinyl resins such as ethylene vinyl acetate (EVA), thermoplastic resins such as polyamide and synthetic rubber, and thermoplastic adhesive resins such as acid-modified products of polyethylene and polypropylene.
- Examples of methods for forming a resin layer on a sealing material include solvent solution method, extrusion lamination method, melting / hot melt method, calendar method, nozzle coating method, screen printing method, vacuum laminating method, hot roll laminating method, etc. Can be mentioned. A material having a hygroscopic property or an oxygen absorbing property may be contained as necessary.
- the thickness of the resin layer formed on the sealing material is arbitrarily determined depending on the size and shape of the organic EL display device to be sealed, but is preferably about 5 to 500 ⁇ m.
- it can also form directly in an organic EL device side.
- the organic EL display device and the sealing body are bonded together in a sealing chamber.
- the sealing body has a two-layer structure of a sealing material and a resin layer, and a thermoplastic resin is used for the resin layer, it is preferable to perform only pressure bonding with a heated roll.
- a thermosetting adhesive resin it is preferable to perform heat curing at a curing temperature after pressure bonding with a heated roll.
- curing can be performed by further irradiating light after pressure bonding with a roll.
- the substrate 100 glass having a thickness of 0.7 mm and a side of 40 mm square was used.
- ITO was formed as a first electrode (anode) 101 by sputtering with a film thickness of 150 nm and patterned in a line shape.
- a partition pattern was formed in a shape having an opening of 2 mm square on the ITO line.
- the hole injection layer 102 a mixture of poly (3,4-ethylenedioxythiophene) and polystyrenesulfonic acid was formed to a thickness of 60 nm by spin coating.
- the hole transport layer 103 was formed.
- TPT1 represented by Formula 2 as a hole transport material was mixed with polystyrene having a weight average molecular weight of 200,000 at a ratio of 7: 3 and applied by spin coating using ink dissolved in toluene. The film thickness after drying the solvent was 20 nm.
- an organic light emitting layer was formed.
- 2,2 ', 2 "-(1,3,5-Benzenetriyl) tris (1-phenyl-1H-benzimidazole) (TPBi) as host material and tris (2- (p-tolyl) pyridine as doping material ) Iridium III (Ir (mppy) 3) was applied by a blade coating method using an ink mixed in a ratio of 94: 6 and dissolved in toluene, and the substrate was heated to 70 ° C. during coating. The subsequent film thickness was 60 nm.
- TPBi was formed with a thickness of 20 nm by vacuum deposition.
- the second electrode (cathode) 106 a LiF film having a thickness of 0.5 nm was formed by a vacuum deposition method, and then an aluminum film was formed to a thickness of 150 nm.
- a line-shaped metal mask that is formed in the opening portion of the partition wall pattern on the ITO line was used, and this metal mask was placed so as to be orthogonal to the ITO line. Thus, an organic EL light emitting region was formed in the opening portion of the partition wall pattern.
- An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 500,000 was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 33 cd / A.
- An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 1,000,000 was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 39 cd / A.
- An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 2 million was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 41 cd / A.
- organic light emitting layer 2,2 ′, 2 ′′-(1,3,5-benzenetriyl) tris (1-phenyl-1H-benzimidazole) (TPBi) as a host material and Tris (2 -(P-Tolyl) pyridine) Iridium III (Ir (mppy) 3) and polystyrene having a weight average molecular weight of 1 million were mixed at a ratio of 75.2: 4.8: 20 and dissolved in toluene.
- the organic EL device was produced in the same manner as in Example 3. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 45 cd / A.
- An organic EL device was produced in the same manner as in Example 3 except that the substrate was not heated when the organic light emitting layer was applied. When the obtained organic EL device was driven, green light emission was obtained. The maximum luminous efficiency was 29 cd / A.
- An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 7 million was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 41 cd / A.
- An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 20 million was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 38 cd / A.
- An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 30 million was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, and the maximum light emission efficiency was 39 cd / A.
- ⁇ Comparative Example 1> An organic EL device was produced in the same manner as in Example 1 except that the hole transporting layer was coated with an ink in which TPT1 as a hole transporting material was dissolved in toluene. When the obtained organic EL device was driven, green light emission was obtained, but the maximum light emission efficiency was as low as 17 cd / A.
- ⁇ Comparative example 2> An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 10,000 was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, but the maximum light emission efficiency was as low as 17 cd / A.
- ⁇ Comparative Example 3> An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 100,000 was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, but the maximum light emission efficiency was as low as 22 cd / A.
- ⁇ Comparative Example 4> An organic EL device was produced in the same manner as in Example 1 except that polystyrene having a weight average molecular weight of 150,000 was used for the hole transport layer. When the obtained organic EL device was driven, green light emission was obtained, but the maximum light emission efficiency was as low as 22 cd / A.
- Example 5 When the organic light emitting layer was applied, the substrate was organically treated in the same manner as in Example 3 except that the substrate was heated to 130 ° C., which is higher than 110 ° C., the boiling point of toluene, which is the solvent used in the ink for forming the organic light emitting layer. An EL device was produced. When the obtained organic EL device was driven, green light emission was obtained. The maximum luminous efficiency was 25 cd / A. Luminescence was non-uniform. This is probably because the organic light-emitting layer became a non-uniform film. Table 1 shows the respective maximum luminous efficiencies.
- Electron transport layer 106 Counter electrode (2nd electrode) 200 ... substrate 201 ... active layer 202 ... gate insulating film 203 ... source electrode 204 ... drain electrode 205 ... gate electrode 206 ... insulating film 207 ... pixel electrode (first electrode) One electrode) 208: Partition 209 ... Scanning line 300 ... Organic EL display device 301 ... Pixel 302 ... Sub-pixel
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
図3に一般的な有機エレクトロルミネセンスディスプレイデバイス300の模式図を示した。一つのピクセル(画素)301は、3原色のR(赤色)、G(緑色)、B(青色)それぞれのサブピクセル302からなる。サブピクセル302にはそれぞれの発光色の有機ELデバイスが形成されており、アクティブ駆動の場合には更に薄膜トランジスタ(以下、TFTとも呼ぶ)が形成されている。
有機発光層を形成する方法も同様にドライ成膜とウェット成膜法の2種類があるが、均一な成膜が容易なドライ成膜である真空蒸着法を用いる場合、微細パターンのマスクを用いてパターニングする必要があり、大型基板や微細パターニングが非常に困難である。
ウェット成膜法によるパターニング成膜には、インクジェット法、印刷法、ノズルプリント法によるパターン形成が提案されている。インクジェット法は、インクジェットノズルから溶剤に溶かした発光層材料を基板上に噴出させ、基板上で乾燥させることで所望のパターンを得る方法である(特許文献3)。
これに対して、良溶媒と貧溶媒とからなる混合溶媒を用いた湿式法で形成することで積層構造にする方法が開示されている。しかし、この方法では良溶媒が下層を溶解してしまい、また、良溶媒比率を小さくすることでインキの溶解度が低くなるために薄い膜厚でしか形成できないという問題があった(特許文献6)。
前記発光媒体層の中に少なくとも有機発光層と前記有機発光層に隣接する正孔輸送層とを有し、前記正孔輸送層に少なくとも低分子正孔輸送材料と重量平均分子量が20万以上5000万以下の絶縁性マトリクスポリマーとを含むことを特徴とする有機エレクトロルミネセンスデバイスである。
また、本発明の第3の態様は、前記絶縁性マトリクスポリマーの重量平均分子量が100万以上5000万以下であることを特徴とする本発明の第1又は2の態様の有機エレクトロルミネセンスデバイスである。
また、本発明の第5の態様は、前記有機発光層に、少なくとも低分子発光材料と重量平均分子量が100万以上5000万以下の絶縁性マトリクスポリマーとを含むことを特徴とする本発明の第4の態様の有機エレクトロルミネセンスデバイスである。
また、本発明の第7の態様は、前記正孔輸送層及び前記有機発光層を塗布法により形成することを特徴とする本発明の第1~6のいずれかの態様の有機エレクトロルミネセンスデバイスの製造方法である。
また、本発明の第9の態様は、基板を加熱する温度が前記有機発光層を形成するインキの溶媒の沸点以下であることを特徴とする本発明の第8の態様の有機エレクトロルミネセンスデバイスの製造方法である。
また、本発明の第11の態様は、前記有機発光層を塗布する工程が凸版印刷法であることを特徴とする本発明の第1~9のいずれかの態様の有機エレクトロルミネセンスデバイスの製造方法である。
正孔輸送層103には、低分子正孔輸送材料が含まれる。低分子正孔輸送材料は高分子正孔輸送材料よりも材料設計の自由度が高く、バンドギャップを大きくしやすいため励起子ブロック性、電子ブロック性が高くデバイス効率が高くなり、また耐久性も高い。
有機ELデバイスは発光領域を区画するように隔壁が形成されていることが好ましい。隔壁を形成することによって有機発光層塗布時の基板面方向の溶液の流動を抑制することができ、より均一に有機発光層104を形成できる。
本発明における有機ELデバイスはパッシブ駆動、アクティブ駆動のいずれにも適用することができる。
また、本発明はデバイス300、及び照明デバイス、等に適用が可能である。
<基板>
本発明の実施の形態に用いられる基板200としては、有機ELデバイスを担持できるものであればよいが、アクティブマトリクス方式の場合には薄膜トランジスタを形成したTFT基板を用いる。図2は本発明に用いることができる隔壁付きTFT基板の例である。TFTと有機EL表示装置の画素電極(第一電極)207が設けられており、かつ、TFTと第一電極207とが電気接続している。
TFTや、その上方に構成されるアクティブマトリクス駆動型有機ELデバイスは支持体で支持される。支持体としては機械的強度、絶縁性を有し寸法安定性に優れた支持体であれば如何なる材料も使用することができる。
これらの活性層は、例えば、
アモルファスシリコンをプラズマCVD法により積層し、
イオンドーピングする方法;SiH4ガスを用いてLPCVD法によりアモルファスシリコンを形成し、固相成長法によりアモルファスシリコンを結晶化してポリシリコンを得た後、
イオン打ち込み法によりイオンドーピングする方法;Si2H6ガスを用いてLPCVD法により、また、SiH4ガスを用いてPECVD法によりアモルファスシリコンを形成し、エキシマレーザー等のレーザーによりアニールし、アモルファスシリコンを結晶化してポリシリコンを得た後、
イオンドーピング法によりイオンドーピングする方法(低温プロセス);減圧CVD法又はLPCVD法によりポリシリコンを積層し、1000℃以上で熱酸化してゲート絶縁膜を形成し、その上にn+ポリシリコンのゲート電極を形成し、その後、イオン打ち込み法によりイオンドーピングする方法(高温プロセス)等が挙げられる。
ゲート電極205としては、通常、ゲート電極として使用されているものを用いることができ、例えば、アルミ、銅等の金属;チタン、タンタル、タングステン等の高融点金属;ポリシリコン;高融点金属のシリサイド;ポリサイド;等が挙げられる。
本発明の表示デバイスは薄膜トランジスタが有機ELデバイスのスイッチングデバイスとして機能するように接続されている必要があり、トランジスタのドレイン電極204と有機EL表示装置の画素電極が電気的に接続されている。
基板の上に画素電極(第一電極)207を成膜し、必要に応じてパターニングを行う。画素電極の材料としては、ITO(インジウムスズ複合酸化物)やインジウム亜鉛複合酸化物、亜鉛アルミニウム複合酸化物などの金属複合酸化物や、金、白金などの金属材料や、これら金属酸化物や金属材料の微粒子をエポキシ樹脂やアクリル樹脂などに分散した微粒子分散膜を、単層もしくは積層したものをいずれも使用することができる。
隔壁208は画素に対応した発光領域を区画するように形成する。塗布法により有機層を形成する際に有機材料を溶かした溶液を入れるための開口を形成するために隔壁は形成される。
隔壁208の形成方法としては、基体上に無機膜を一様に形成し、レジストでマスキングした後、ドライエッチングを行う方法や、基体上に感光性樹脂を積層し、フォトリソ法により所定のパターンとする方法が挙げられる。隔壁の好ましい高さは0.1μm~10.0μmであり、より好ましくは0.5μm~4.0μm程度である。高すぎると対向電極の形成及び封止を妨げ、低すぎると発光媒体層形成時に隣接する画素と混色してしまうからである。隔壁としては、感光性樹脂が好適に用いることができる。感光性樹脂としてはポジ型レジスト、ネガ型レジストのどちらでもよく、具体的にはポリイミド系、アクリル樹脂系、ノボラック樹脂系の感光性樹脂が挙げられる。必要に応じて撥水剤を添加したり、プラズマやUVを照射して形成後にインクに対する撥液性を付与することもできる。
有機ELデバイスの一例として、第一電極101上に、発光媒体層として正孔注入層102、正孔輸送層103、有機発光層104、電子輸送層105が順次設けられ、更に第二電極106が形成された構成が挙げられる。電極間に挟まれたこれらの層は一部省略することも可能であり、また、更に正孔ブロック層等の層を追加することも可能であり、公知のものから適宜選択される。
正孔注入層102は第一電極から正孔を注入する機能を有する。正孔注入層102の物性値としては、画素電極207の仕事関数と同等以上の仕事関数を有することが好ましい。これは画素電極から効率的に正孔注入を行うためである。画素電極207の材料により異なるが4.5eV以上6.5eV以下を用いることができ、画素電極がITOやIZOの場合、5.0eV以上6.0eV以下が好適に用いることが可能である。正孔注入層の比抵抗に関しては、膜厚30nm以上の状態で、1×103~2×106Ω・mであることが好ましく、より好ましくは5×103~1×106Ω・mである。また、ボトムエミッション構造では画素電極側から放出光を取り出すため、光透過性が低いと取り出し効率が低下してしまうため、可視光波長領域の全平均で75%以上が好ましく、85%以上ならば好適に用いることが可能である。
正孔注入層102を形成する方法としては、画素電極207上の表示領域全面にスリットコート法、スピンコート法、ダイコート法、ディッピング法、ブレードコート法、又はスプレー法等の簡便な方法で一括形成することもできるが、凸版印刷法、グラビア印刷法、スクリーン印刷法などの湿式成膜法など既存の成膜法を用いることもできる。
正孔注入層102が無機材料である場合には抵抗加熱蒸着法、電子ビーム蒸着法、反応性蒸着法、イオンプレーティング法、スパッタリング法等のドライプロセスを用いて形成することができる。
上記正孔輸送層103は、有機発光層104と正孔注入層102の間に積層することで、デバイスの発光寿命を向上させる機能を有する。
正孔輸送層103の材料としては、低分子正孔輸送材料が好適に用いることができ、例例えば、芳香族アミン、(トリフェニルアミン)ダイマー誘導体(TPD)、(α-ナフチルジフェニルアミン)ダイマー(α-NPD)、[(トリフェニルアミン)ダイマー]スピロダイマー(Spiro-TAD)、化式1に示すTPTE、化式2に示すTPT1等のトリアリールアミン類、4,4',4''-トリス[3-メチルフェニル(フェニル)アミノ]トリフェニルアミン(m-MTDATA)、4,4',4''-トリス[1-ナフチル(フェニル)アミノ]トリフェニルアミン(1-TNATA)等のスターバーストアミン類及び5,5'-α-ビス-{4-[ビス(4-メチルフェニル)アミノ]フェニル}-2,2':5',2'-αターチオフェン(BMA-3T)等のオリゴチオフェン類、等が挙げられるが本発明ではこれらに限定されるわけではない。
正孔輸送層形成後、有機発光層104を形成する。有機発光層104は電流を通すことにより発光する層であり、有機発光層104から放出される表示光が単色の場合、正孔輸送層103を被覆するように形成するが、多色の表示光を得るには必要に応じてパターニングを行うことにより好適に用いることができる。
有機発光層104には、マトリクスポリマーを含むことができる。マトリクスポリマーとしては、例えば、ポリカーボネート、ポリスチレン、ポリメチルメタクリレート、ポリプロピレン、ポリエーテルサルフォン、シクロオレフィンポリマー、ポリアリレート、ポリアミド、ポリエチレンテレフタレート、ポリエチレンナフタレート等を好適に用いることができる。
また、単色の有機ELデバイスや照明デバイス等で有機発光層104のパターニング成膜が必要ない場合は、画素電極207上の表示領域全面にスリットコート法、スピンコート法、ダイコート法、ディッピング法、ブレードコート法、又はスプレー法等の簡便な方法で一括形成することができる。
有機発光層を形成した後、正孔ブロック層や電子注入層等を形成することができる。正孔ブロック層及び電子注入層に用いる材料としては、一般に電子輸送材料として用いられているものであれば良く、トリアゾール系、オキサゾール系、オキサジアゾール系、シロール系、ボロン系等の低分子系材料、フッ化リチウムや酸化リチウム等のアルカリ金属やアルカリ土類金属の塩や酸化物等を用いて真空蒸着法による成膜が可能である。
次に、対向電極(第二電極)106を形成する。対向電極を陰極とする場合には、有機発光層への電子注入効率の高い、仕事関数の低い物質を用いる。具体的にはMg、Al、Yb等の金属単体を用いたり、発光媒体層と接する界面にLiや酸化Li、LiF等の化合物を1nm程度挟んで、安定性・導電性の高いAlやCuを積層して用いてもよい。又は電子注入効率と安定性を両立させるため、仕事関数が低いLi、Mg、Ca、Sr、La、Ce、Er、Eu、Sc、Y、Yb等の金属1種以上と、安定なAg、Al、Cu等の金属元素との合金系を用いてもよい。具体的にはMgAg、AlLi、CuLi等の合金が使用できる。
対向電極106の形成方法は、材料に応じて、抵抗加熱蒸着法、電子ビーム蒸着法、反応性蒸着法、イオンプレーティング法、スパッタリング法を用いることができる。
有機EL表示装置としては電極間に発光材料を挟み、電流を流すことで発光させることが可能であるが、有機発光材料は大気中の水分や酸素によって容易に劣化してしまうため通常は外部と遮断するための封止をする。
<缶封止>
封止は例えば封止缶を基板上に接着しても良い。封止缶としては、ガスの透過性の低いものである必要があり、その材質は、ガラス、あるいはステンレス等の金属、等を用いることができる。接着剤としては、UV硬化性の接着剤が好ましい。
有機ELデバイスを外部からの酸素や水分から保護するために、対向電極上にパッシベーション層を形成しても良い。パッシベーション層としては、酸化珪素、酸化アルミニウム等の金属酸化物、弗化アルミニウム、弗化マグネシウム等の金属弗化物、窒化珪素、窒化アルミニウム、窒化炭素などの金属窒化物、酸窒化珪素などの金属酸窒化物、炭化ケイ素などの金属炭化物、必要に応じて、アクリル樹脂、エポキシ樹脂、シリコン樹脂、ポリエステル樹脂などの高分子樹脂膜との積層膜を用いてもよいが、特に、バリア性と透明性の面から、酸化ケイ素、酸窒化ケイ素、窒化ケイ素を用いることが好ましく、更には、膜密度を可変した積層膜や勾配膜を使用することにより、段差被覆性とバリア性を両立する膜となる。
パッシベーション層の膜厚としては、5μm以下、より好ましくは1μm以下とすることが好ましい。
封止のために、封止材上に樹脂層を設けてこれを貼り合わせることもできる。
封止材としては、水分や酸素の透過性が低い基材である必要がある。また、材料の一例として、アルミナ、窒化ケイ素、窒化ホウ素等のセラミックス、無アルカリガラス、アルカリガラス等のガラス、石英、耐湿性フィルムなどを挙げることができる。耐湿性フィルムの例として、プラスチック基材の両面にSiOXをCVD法で形成したフィルムや、透過性の小さいフィルムと吸水性のあるフィルム又は吸水剤を塗布した重合体フィルムなどがあり、耐湿性フィルムの水蒸気透過率は、10-6g/m2/day以下であることが好ましい。
基板100として厚さが0.7mm、一辺が40mm四方のガラスを用いた。この上に、第一電極(陽極)101としてITOを膜厚150nmでスパッタリングにより形成し、ライン状にパターニングした。次にITOライン上に2mm角の開口を有する形状で隔壁パターンを形成した。
次に、正孔輸送層103を形成した。正孔輸送材料である化式2に示すTPT1を重量平均分子量20万のポリスチレンと7:3の比率で混合してトルエンに溶解させたインキを用いスピンコート法により塗布した。溶媒を乾燥させた後の膜厚は20nmであった。
正孔輸送層として正孔輸送材料であるTPT1をトルエンに溶解させたインキを用いて塗布した以外は実施例1と同様にして有機ELデバイスを作製した。得られた有機ELデバイスを駆動したところ、緑色発光が得られたが、最大発光効率は17cd/Aと低いものであった。
<比較例2>
正孔輸送層に重量平均分子量が1万のポリスチレンを用い、他の条件は実施例1と同様にして有機ELデバイスを作製した。得られた有機ELデバイスを駆動したところ、緑色発光が得られたが、最大発光効率は17cd/Aと低いものであった。
正孔輸送層に重量平均分子量が10万のポリスチレンを用い、他の条件は実施例1と同様にして有機ELデバイスを作製した。得られた有機ELデバイスを駆動したところ、緑色発光が得られたが、最大発光効率は22cd/Aと低いものであった。
<比較例4>
正孔輸送層に重量平均分子量が15万のポリスチレンを用い、他の条件は実施例1と同様にして有機ELデバイスを作製した。得られた有機ELデバイスを駆動したところ、緑色発光が得られたが、最大発光効率は22cd/Aと低いものであった。
有機発光層を塗布するときに基板を、有機発光層を形成するインキに使用されている溶媒であるトルエンの沸点、110℃より高い130℃に加熱した以外は、実施例3と同様にして有機ELデバイスを作製した。得られた有機ELデバイスを駆動したところ、緑色発光が得られた。最大発光効率は25cd/Aであった。発光は不均一であった。有機発光層が不均一な膜になったためと考えられる。
それぞれの最大発光効率を表1に示した。
101・・・画素電極(第一電極)
102・・・正孔注入層
103・・・正孔輸送層
104・・・有機発光層
105・・・電子輸送層
106・・・対向電極(第二電極)
200・・・基板
201・・・活性層
202・・・ゲート絶縁膜
203・・・ソース電極
204・・・ドレイン電極
205・・・ゲート電極
206・・・絶縁膜
207・・・画素電極(第一電極)
208・・・隔壁
209・・・走査線
300・・・有機ELディスプレイデバイス
301・・・ピクセル
302・・・サブピクセル
Claims (11)
- 基板上に形成された第一電極と、少なくとも有機発光層を含む発光媒体層と、前記発光媒体層を挟むように前記第一電極と対向して形成された第二電極を少なくとも備える有機エレクトロルミネセンスデバイスであって、
前記発光媒体層の中に少なくとも有機発光層と前記有機発光層に隣接する正孔輸送層とを有し、前記正孔輸送層に少なくとも低分子正孔輸送材料と重量平均分子量が20万以上5000万以下の絶縁性マトリクスポリマーとを含むことを特徴とする有機エレクトロルミネセンスデバイス。 - 発光領域を区画するように隔壁が形成されていることを特徴とする請求項1に記載の有機エレクトロルミネセンスデバイス。
- 前記絶縁性マトリクスポリマーの重量平均分子量が100万以上5000万以下であることを特徴とする請求項1又は2に記載の有機エレクトロルミネセンスデバイス。
- 前記有機発光層に、少なくとも低分子発光材料と重量平均分子量が20万以上5000万以下の絶縁性マトリクスポリマーとを含むことを特徴とする請求項1~3のいずれか1項に記載の有機エレクトロルミネセンスデバイス。
- 前記有機発光層に、少なくとも低分子発光材料と重量平均分子量が100万以上5000万以下の絶縁性マトリクスポリマーとを含むことを特徴とする請求項4に記載の有機エレクトロルミネセンスデバイス。
- 前記正孔輸送層と前記有機発光層に同じ絶縁性マトリクスポリマーを含むことを特徴とする請求項1~5のいずれか1項に記載の有機エレクトロルミネセンスデバイス。
- 前記正孔輸送層及び前記有機発光層を塗布法により形成することを特徴とする請求項1~6のいずれか1項に記載の有機エレクトロルミネセンスデバイスの製造方法。
- 前記有機発光層を塗布する工程において基板を加熱することを特徴とする請求項7に記載の有機エレクトロルミネセンスデバイスの製造方法。
- 基板を加熱する温度が前記有機発光層を形成するインキの溶媒の沸点以下であることを特徴とする請求項8に記載の有機エレクトロルミネセンスデバイスの製造方法。
- 前記有機発光層を塗布する工程がノズルプリント法であることを特徴とする請求項7~9のいずれか1項に記載の有機エレクトロルミネセンスデバイスの製造方法。
- 前記有機発光層を塗布する工程が凸版印刷法であることを特徴とする請求項7~9のいずれか1項に記載の有機エレクトロルミネセンスデバイスの製造方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201380014085.2A CN104170112A (zh) | 2012-03-15 | 2013-02-18 | 有机电致发光元件及其制造方法 |
KR1020147024043A KR20140135174A (ko) | 2012-03-15 | 2013-02-18 | 유기 일렉트로루미네센스 디바이스 및 그 제조 방법 |
JP2014504658A JP6252469B2 (ja) | 2012-03-15 | 2013-02-18 | 有機エレクトロルミネセンスデバイス |
US14/474,840 US20140367671A1 (en) | 2012-03-15 | 2014-09-02 | Organic electroluminescent device and method for producing same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012-058531 | 2012-03-15 | ||
JP2012058531 | 2012-03-15 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/474,840 Continuation US20140367671A1 (en) | 2012-03-15 | 2014-09-02 | Organic electroluminescent device and method for producing same |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013136667A1 true WO2013136667A1 (ja) | 2013-09-19 |
Family
ID=49160619
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2013/000879 WO2013136667A1 (ja) | 2012-03-15 | 2013-02-18 | 有機エレクトロルミネセンスデバイス及びその製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20140367671A1 (ja) |
JP (1) | JP6252469B2 (ja) |
KR (1) | KR20140135174A (ja) |
CN (1) | CN104170112A (ja) |
TW (1) | TWI511340B (ja) |
WO (1) | WO2013136667A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6375600B2 (ja) * | 2013-09-03 | 2018-08-22 | セイコーエプソン株式会社 | 有機el素子の製造方法、有機el素子、有機el装置、電子機器 |
KR102364708B1 (ko) * | 2017-07-12 | 2022-02-21 | 삼성디스플레이 주식회사 | 표시 장치의 제조 방법 |
JP6470476B1 (ja) * | 2017-11-28 | 2019-02-13 | 堺ディスプレイプロダクト株式会社 | 有機el発光素子及びその製造方法 |
JP6530144B1 (ja) * | 2017-11-28 | 2019-06-12 | 堺ディスプレイプロダクト株式会社 | 有機el発光素子及びその製造方法 |
US11031244B2 (en) * | 2018-08-14 | 2021-06-08 | Lam Research Corporation | Modification of SNO2 surface for EUV lithography |
CN111384278B (zh) * | 2018-12-29 | 2021-07-16 | Tcl科技集团股份有限公司 | 一种量子点发光二极管及其制备方法 |
CN112802972A (zh) * | 2020-12-31 | 2021-05-14 | 湖南鼎一致远科技发展有限公司 | 一种聚碳酸酯基材的电致发光器件及制备方法 |
CN114280869B (zh) * | 2021-12-29 | 2024-04-02 | 湖南鼎一致远科技发展有限公司 | 一种无机电致发光器件及其uv喷绘打印制备方法 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH042096A (ja) * | 1989-10-20 | 1992-01-07 | Asahi Chem Ind Co Ltd | 塗布型有機電界発光素子 |
JPH10162955A (ja) * | 1996-11-28 | 1998-06-19 | Seiko Precision Kk | 有機el素子の製造方法 |
JP2000252072A (ja) * | 1999-03-03 | 2000-09-14 | Honda Motor Co Ltd | 有機エレクトロルミネッセンス素子とその製造方法 |
JP2006190995A (ja) * | 2004-12-06 | 2006-07-20 | Semiconductor Energy Lab Co Ltd | 有機化合物と無機化合物とを含む複合材料、前記複合材料を用いた発光素子および発光装置、並びに前記発光素子の作製方法 |
JP2007119763A (ja) * | 2005-09-29 | 2007-05-17 | Sumitomo Chemical Co Ltd | 高分子材料及び高分子発光素子 |
JP2008078447A (ja) * | 2006-09-22 | 2008-04-03 | Toppan Printing Co Ltd | 有機エレクトロルミネッセンス素子及び有機エレクトロルミネッセンス素子の製造方法 |
JP2008189759A (ja) * | 2007-02-02 | 2008-08-21 | Sumitomo Chemical Co Ltd | 高分子発光素子、高分子化合物、組成物、液状組成物及び導電性薄膜 |
JP2008266605A (ja) * | 2007-03-23 | 2008-11-06 | Semiconductor Energy Lab Co Ltd | 組成物、発光素子の作製方法、発光素子、発光装置、電子機器 |
JP2010061822A (ja) * | 2008-09-01 | 2010-03-18 | Seiko Epson Corp | 有機el装置の製造方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6597012B2 (en) * | 2001-05-02 | 2003-07-22 | Junji Kido | Organic electroluminescent device |
JP5107747B2 (ja) * | 2007-03-09 | 2012-12-26 | 富士フイルム株式会社 | 放射線画像検出器 |
KR20100072265A (ko) * | 2007-09-21 | 2010-06-30 | 도판 인사츠 가부시키가이샤 | 유기 전계 발광 디스플레이 및 그의 제조 방법 |
WO2010018851A1 (ja) * | 2008-08-13 | 2010-02-18 | 三菱化学株式会社 | 有機電界発光素子、有機el表示装置及び有機el照明 |
TWI393283B (zh) * | 2008-12-04 | 2013-04-11 | Univ Nat Chiao Tung | 有機光電元件 |
KR102229736B1 (ko) * | 2009-08-27 | 2021-03-18 | 미쯔비시 케미컬 주식회사 | 모노아민 화합물, 전하 수송 재료, 전하 수송막용 조성물, 유기 전계 발광 소자, 유기 el 표시 장치 및 유기 el 조명 |
KR20120103571A (ko) * | 2009-10-05 | 2012-09-19 | 손 라이팅 리미티드 | 다층구조의 유기 장치 |
JP2011175910A (ja) * | 2010-02-25 | 2011-09-08 | Sumitomo Chemical Co Ltd | 発光装置の製造方法 |
US20120286251A1 (en) * | 2011-05-09 | 2012-11-15 | Soo-Jin Park | Novel compound and organic light-emitting device including the same |
-
2013
- 2013-02-18 WO PCT/JP2013/000879 patent/WO2013136667A1/ja active Application Filing
- 2013-02-18 JP JP2014504658A patent/JP6252469B2/ja not_active Expired - Fee Related
- 2013-02-18 KR KR1020147024043A patent/KR20140135174A/ko not_active Withdrawn
- 2013-02-18 CN CN201380014085.2A patent/CN104170112A/zh active Pending
- 2013-03-15 TW TW102109275A patent/TWI511340B/zh not_active IP Right Cessation
-
2014
- 2014-09-02 US US14/474,840 patent/US20140367671A1/en not_active Abandoned
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH042096A (ja) * | 1989-10-20 | 1992-01-07 | Asahi Chem Ind Co Ltd | 塗布型有機電界発光素子 |
JPH10162955A (ja) * | 1996-11-28 | 1998-06-19 | Seiko Precision Kk | 有機el素子の製造方法 |
JP2000252072A (ja) * | 1999-03-03 | 2000-09-14 | Honda Motor Co Ltd | 有機エレクトロルミネッセンス素子とその製造方法 |
JP2006190995A (ja) * | 2004-12-06 | 2006-07-20 | Semiconductor Energy Lab Co Ltd | 有機化合物と無機化合物とを含む複合材料、前記複合材料を用いた発光素子および発光装置、並びに前記発光素子の作製方法 |
JP2007119763A (ja) * | 2005-09-29 | 2007-05-17 | Sumitomo Chemical Co Ltd | 高分子材料及び高分子発光素子 |
JP2008078447A (ja) * | 2006-09-22 | 2008-04-03 | Toppan Printing Co Ltd | 有機エレクトロルミネッセンス素子及び有機エレクトロルミネッセンス素子の製造方法 |
JP2008189759A (ja) * | 2007-02-02 | 2008-08-21 | Sumitomo Chemical Co Ltd | 高分子発光素子、高分子化合物、組成物、液状組成物及び導電性薄膜 |
JP2008266605A (ja) * | 2007-03-23 | 2008-11-06 | Semiconductor Energy Lab Co Ltd | 組成物、発光素子の作製方法、発光素子、発光装置、電子機器 |
JP2010061822A (ja) * | 2008-09-01 | 2010-03-18 | Seiko Epson Corp | 有機el装置の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20140367671A1 (en) | 2014-12-18 |
JPWO2013136667A1 (ja) | 2015-08-03 |
JP6252469B2 (ja) | 2017-12-27 |
TWI511340B (zh) | 2015-12-01 |
KR20140135174A (ko) | 2014-11-25 |
TW201405906A (zh) | 2014-02-01 |
CN104170112A (zh) | 2014-11-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6252469B2 (ja) | 有機エレクトロルミネセンスデバイス | |
JP5326289B2 (ja) | 有機el素子およびそれを備えた表示装置 | |
CN104078485B (zh) | 有机发光显示装置及其制造方法及供体基底和供体基底组 | |
JP5633516B2 (ja) | 有機エレクトロルミネセンス素子、有機エレクトロルミネセンスディスプレイパネルおよび有機エレクトロルミネセンスディスプレイパネル製造方法 | |
JP5526610B2 (ja) | 有機elディスプレイの構造とその製造方法 | |
WO2012132863A1 (ja) | インク組成物とそれを用いた有機el素子及びその製造方法 | |
WO2012133206A1 (ja) | 有機エレクトロルミネセンスディスプレイパネル及びその製造方法 | |
JP5278686B2 (ja) | 有機elディスプレイパネルおよびその製造方法 | |
JP4736676B2 (ja) | アクティブマトリクス駆動型有機エレクトロルミネッセンス表示装置 | |
JP2012074559A (ja) | 有機エレクトロルミネセンスディスプレイパネル及びその製造方法 | |
JP2014063699A (ja) | 有機elディスプレイパネル及びその製造方法 | |
JP5233598B2 (ja) | 有機elディスプレイパネル及びその製造方法 | |
JP2014165261A (ja) | 有機発光表示装置およびその製造方法 | |
JP2007095518A (ja) | 有機エレクトロルミネッセンス表示装置 | |
JP2014067868A (ja) | 有機elパネル及びその製造方法 | |
JP2012216309A (ja) | 有機エレクトロルミネッセンスディスプレイパネル及びその製造方法 | |
JP2013206631A (ja) | 有機エレクトロルミネッセンス素子の製造方法および有機エレクトロルミネッセンス装置 | |
JP5663853B2 (ja) | 有機elパネル及びその製造方法 | |
JP5573545B2 (ja) | 有機el表示装置の製造方法 | |
WO2012132292A1 (ja) | 有機el表示素子、有機el表示装置、及びこれらの製造方法 | |
JP2011204504A (ja) | 有機el表示装置の製造方法及び有機el表示装置 | |
JP2014063701A (ja) | 有機elディスプレイパネルの製造方法 | |
JP2011141981A (ja) | 有機エレクトロルミネッセンス素子およびその製造方法 | |
JP2014199857A (ja) | 有機el表示装置およびその製造方法 | |
JP2014067627A (ja) | 有機elディスプレイパネル及びその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 13760321 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2014504658 Country of ref document: JP Kind code of ref document: A |
|
ENP | Entry into the national phase |
Ref document number: 20147024043 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 13760321 Country of ref document: EP Kind code of ref document: A1 |