Classifications

• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
  • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
  • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
  • H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
  • H10P14/6302—Non-deposition formation processes
  • H10P14/6316—Formation by nitridation, e.g. nitridation of the substrate
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
  • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
  • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
  • C23C16/40—Oxides
  • C23C16/401—Oxides containing silicon
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
  • C23C16/56—After-treatment
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
  • H01J37/32—Gas-filled discharge tubes
  • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
  • H01J37/32018—Glow discharge
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
  • H10D64/00—Electrodes of devices having potential barriers
  • H10D64/118—Electrodes comprising insulating layers having particular dielectric or electrostatic properties, e.g. having static charges
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
  • H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
  • H10K77/10—Substrates, e.g. flexible substrates
  • H10K77/111—Flexible substrates
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
  • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
  • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
  • H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
  • H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
  • H10P14/6518—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer
  • H10P14/6524—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being nitrogen
  • H10P14/6526—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being nitrogen introduced into an oxide material, e.g. changing SiO to SiON
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
  • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
  • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
  • H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
  • H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
  • H10P14/6548—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by forming intermediate materials, e.g. capping layers or diffusion barriers
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
  • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
  • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
  • H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
  • H10P14/665—Porous materials
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
  • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
  • Y02E10/00—Energy generation through renewable energy sources
  • Y02E10/50—Photovoltaic [PV] energy
  • Y02E10/549—Organic PV cells
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
  • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
  • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
  • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T428/00—Stock material or miscellaneous articles
  • Y10T428/249921—Web or sheet containing structurally defined element or component
  • Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
  • Y10T428/249967—Inorganic matrix in void-containing component
  • Y10T428/249969—Of silicon-containing material [e.g., glass, etc.]

Definitions

• the invention relates to a method for manufacturing a barrier layer on a substrate.
• the present invention further relates to a device for manufacturing such a barrier layer.
• the invention relates to a substrate having an inorganic oxide barrier layer.
• Nitridation techniques using a nitrogen plasma have been widely studied for application to integrated electronics devices such as gate insulators of metal oxide semiconductor field effect transistors.
• US 7 619 356 describes an anode for an OLED device wherein the anode comprises an Indium Tin Oxide (ITO) film on a glass substrate and the ITO surface is being treated in a plasma treatment at low pressure (14 mTorr) at 50 W power for 5 minutes. As a result of this treatment 13.3% nitrogen atoms are observed from the surface, which amount corresponds to about 275 oxygen atoms.
• ITO Indium Tin Oxide
• US 7 132 373 discloses a method for producing a crystalline metal oxide film (for example a film containing ITO) using a nitrogen or oxygen plasma at a low pressure (50- 100 Pa) for at least 3 minutes.
• US 7 898 082 discloses a semiconductor device having a barrier metal nitride layer, the layer formed using a nitrogen plasma at high temperatures of 350-750 degrees Celsius.
• JP 4 249 520 discloses the improvement of using a nitridation step with an Argon and Nitrogen plasma treatment at low pressure.
• a method for manufacturing a barrier layer on a substrate comprising:
• the treating of the substrate in said treatment space is done at a temperature below 150°C, e.g. below 100°C.
• the treatment is done until a barrier with a top layer comprising between 1 to 3% Nitrogen-atom concentration is formed on the substrate.
• the generated plasma is a high frequency or radio frequency (RF) plasma or discharge.
• RF radio frequency
• the gas comprising Nitrogen compounds comprises N 2 (nitrogen) and/or ⁇ 3 ⁇ 4 (ammonia) and/or NO.
• the gas comprising Nitrogen compounds has a pressure between 0.1 and 10 atmosphere, e.g. between 0.5 and 5 atmosphere (between 5xl0 4 Pa and 5xl0 5 Pa), e.g. between 0.6 and 2 atmosphere (between 6xl0 4 Pa and 2xl0 5 Pa), e.g. substantially 1 atmosphere.
• the barrier is advantageously formed in less time.
• the treating of the substrate in said treatment space is done for a duration of less than 20 minutes, e.g. less than 10 minutes. Given the conditions outlined above, this is enough time to form a suitable barrier layer, in particular a barrier having a top layer with 1 to 3% Nitrogen atom concentration.
• the substrate is a flexible substrate, in particular a flexible polymeric substrate.
• the electrodes are roll-electrodes, and the flexible layer is moved through the treatment space at a linear speed.
• the inorganic oxide layer of the provided substrate is an silicon-oxide layer.
• the top layer of the barrier that is formed is between 5 and 15 nm, e.g. between 7 and 12 nm, thick.
• the invention further provides a device for manufacturing a barrier layer on a substrate, the device comprising:
• a gas supply device arranged to provide a gas comprising Nitrogen compounds to the treatment space;
• the treatment space if further arranged to hold and treat at least one substrate having an inorganic oxide layer, and the device is arranged for treating of the substrate in said treatment space at a temperature below 150°C, e.g. below 100°C.
• the device can further have any of the previously mentioned features of embodiments of the invention.
• the invention further provides a substrate having a barrier layer, the barrier layer comprising an inorganic oxide layer originally, that is, prior to a nitridation step, having a pore size between 0.3 and 10 vol. %, the inorganic oxide layer further having a top layer comprising between 1 to 3% Nitrogen-atom concentration.
• the substrate and/or the barrier layer may further have any of the abovementioned substrate and/or barrier layer features.
• the method and device described in this invention gives a remarkable improvement, which is not known from the prior art, using a nitridation step at atmospheric pressure and relatively low temperatures resulting in a product having a small amount concentration N-atoms built-in in the metal oxide surface.
• the method and device according the invention thus allows the manufacturing of an excellent barrier film, wherein said film may essentially consist of a flexible substrate having a thin inorganic oxide layer having a pore volume from e.g. 0.1 to 20 volume %, e.g. 0.3 to 10 volume %.
• the method can yield a sealed inorganic oxide layer having between 1 and 3% nitrogen atom concentration in the first 10 nm top layer of the inorganic film.
• the method comprises at least a treatment step wherein said substrate with the inorganic oxide layer is treated in a plasma, such as an atmospheric plasma, more in particular an atmospheric pressure glow discharge plasma that is generated in a treatment space formed between at least two electrodes, by applying an electrical power from a power supply to the at least two electrodes, resulting in the treatment space in a high frequency electromagnetic field.
• Said treatment step e.g. lasts for less than 10 minutes at a temperature below 150°C, during which the treatment space being filled with a gas composition comprising a nitrogen compound such as N 2 (nitrogen) or NH 3 (ammonia) or NO or a combination thereof.
• the gas composition may in addition contain a small amount of H 2 (hydrogen) gas, which may influence the plasma and barrier properties advantageously.
• the inorganic oxide layer becomes sealed and gains a barrier improvement of a factor 1000, which was an unforeseen and surprising effect.
• the method is preferably practiced on a flexible substrate with an inorganic oxide layer having a pore size of 0.1 to 20 volume %, e.g. 0.3 to 10 volume %.
• a variety of methods are possible for the provision of said substrate, which may be a sputtering method, an ion plating method, and a vacuum evaporation method.
• the inorganic oxide film can be formed by application of a precursor solution, that is, a wet deposition. In the latter case, the above-mentioned inorganic oxide layer may also be pretreated by ultraviolet light irradiation prior to exposing to plasma.
• the inorganic oxide film substantially is, for example, a thin layer containing a silicon oxide, titanium oxide, aluminum oxide, film containing ITO and the like.
• the inorganic oxide film thickness may vary between 10 and 1000 nm. Examplary ranges may be between 15 and 100 nm.
• the inorganic oxide film is prepared by exposing a flexible polymeric substrate to an atmospheric plasma deposition apparatus using a precursor as disclosed in EP 1 917 842 by applicant and which is hereby incorporated as reference.
• Preferred precursors which may be used for forming an inorganic oxide layer on a flexible substrate by using an atmospheric plasma as described in WO 2009 104 957 are TEOS, HMDSO, TPOT, TEOT, TMA, TEA.
• the flexible substrate may be any kind of polymeric film.
• PET or PEN film is used having a thickness of 50 to 200 ⁇ .
• substrate which may be used are transparent sheets of ethylene vinyl acetate (EVA), of polyvinyl butyral (PVB), of polytetrafluoroethylene (PTFE), perfluoroalcoxy resins (PFA), i.e., copolymers of tetrafluoroethylene and
• EVA ethylene vinyl acetate
• PVB polyvinyl butyral
• PTFE polytetrafluoroethylene
• PFA perfluoroalcoxy resins
• FEP perfluoroalkyl vinyl ether, tetafluoroethylene-hexafluoropropylene copolymers
• EPE tetrafluoroethylene-perfluoroalkyl vinyl ether-hexafluoro -propylene copolymers
• ETFE tetrafluoroethylene-ethylene or propylenecopolymers
• PCTFE polychlorotrifluoroethylene resins
• ECTFE ethylene-chlorotrifluoroethylene copolymers
• PVDF vinylidene fluoride resins
• PVDF polyvinyl fluorides
• coextruded sheets from polyester with EVA polycarbonate, polyolefm, polyurethane, liquid crystal polymer, aclar, aluminum, of sputtered aluminum oxide polyester, sputtered silicon oxide or silicon nitride polyester, sputtered aluminum oxide polycarbonate, and sputtered silicon oxide or silicon nitride polycarbonate.
• Figures la, lb, and lc show schematic views of a plasma generation device according the invention.
• Figure 2 shows the Electron Spectroscopy for Chemical Analysis (ESCA) or X- ray Photoelectron Spectroscopy (XPS) result of the top surface of an embodiment after an atmospheric pressure glow discharge nitridation treatment.
• ESA Electron Spectroscopy for Chemical Analysis
• XPS X- ray Photoelectron Spectroscopy
• Figure 3 shows the ESCA (XPS) result of the top surface of a corona N 2 treatment of example 1.
• FIG. 1 shows a schematic view of a plasma apparatus with which the present invention may be practiced.
• a treatment space 5 which may be a treatment chamber within an enclosure (not shown in figure la), or a treatment space 5 with an open structure, comprises two electrodes 2, 3.
• the electrodes 2, 3 are provided with a dielectric barrier 2a, 3a (see figure lb) in order to be able to generate and sustain a glow discharge at atmospheric pressure in the treatment space.
• the electrodes 2, 3 are planar electrodes, and the treatment space 5 is a rectangular space.
• a side tab 6 is provided to close off the treatment space 5 on one side.
• the electrodes 2, 3 and of the gap or treatment space 5 are possible, e.g. as part of a cylindrical arrangement of the plasma treatment apparatus.
• the treatment space may be cylindrical, or elliptic, or have another form adapted to treat a specific type of substrate 1. Both electrodes 2, 3 may have the same
• the configuration being flat orientated (as shown in figure la) or both being roll-electrodes (as shown in figure lc).
• different configurations may be applied using a roll electrode and a flat or cylinder segment shaped electrode opposing each other.
• the electrodes may be multi-segment electrodes. Embodiments using more than two electrodes are also imaginable.
• the atmospheric pressure plasma is generated between the two electrodes 2, 3 in the treatment space 5.
• a plurality of electrodes 2, 3 is provided.
• the electrodes 2, 3 have a surface area which is at least as big as the substrate 1 , the substrate 1 can be fixed in the treatment space 5 between the two electrodes 2, 3.
• Figure lb shows a variant wherein two substrates la, lb are treated
• Both electrodes 2, 3 can be provided with a dielectric barrier layer 2a, 3a (see figure lb).
• the dielectric layer 2a on the first electrode 2 has a thickness of dl (mm)
• the dielectric layer 3a on the second electrode 3 has a thickness of d2 (mm).
• the total dielectric distance d of the electrode configuration also includes the thickness of the (one or two) substrates la, lb to be treated, indicated by fl (mm) and f2 (mm).
• both dl and d2 are 0 and only one substrate 1 is used.
• electrode 3 is not covered with a dielectric material it is possible to obtain a stable atmospheric glow discharge plasma.
• the gap distance g in figure lc indicates the smallest gap between the electrodes 2, 3 where an atmospheric pressure glow discharge plasma can exist in operation (i.e. in the treatment space 5), also called the free inter-electrode space.
• the dimensions of the electrodes 2, 3, dielectric barrier layers 2a, 3a, and gap g between the electrodes 2, 3, are predetermined in order to generate and sustain a glow discharge plasma at atmospheric pressure in the treatment space 5.
• the dimensions of the electrodes 2, 3, dielectric barrier layers 2a, 3a, and gap g between the electrodes 2, 3 and the total dielectric distance (d) which is the total dielectric thickness of the dielectric barrier are controlled in a further embodiment, such that the product of gap distance and the total dielectric distance is arranged to be less than or equal to 1.0 mm 2 or even more preferred less than 0.5 mm 2 as disclosed in WO 2009/104 957 by applicant and is hereby incorporated as reference.
• the substrate 1 may be moved through the treatment space 5, e. g. at a linear speed using a roll-to-roll configuration, an example of which is shown in the embodiment of figure lc.
• the substrates la, lb are guided in close contact with the roller shaped (roll) electrodes 2, 3, using guiding rollers 9.
• a roll-electrode is e.g. implemented as a cylinder shaped electrode, mounted to allow rotation in operation e.g. using a mounting shaft or bearings. Such a roll-electrode may be freely rotating, or may be driven at a certain angular speed, e.g. using well known controller and drive units.
• the side tabs 6a, 6b are positioned at the roller end faces, thereby creating a closed off treatment space 5 between the electrodes 2, 3.
• the electrodes 2, 3 are connected to a power supply 4, which is arranged to provide electrical power to the electrodes for generating the atmospheric (glow discharge) plasma.
• a gas supply device 8 may be arranged for the substrate treatment in order to direct the gas for the nitridation step towards an inner region of the substrate to be processed.
• the supply device 8 also acts as the main carrier gas supply.
• a carrier gas may be used such as Argon, Helium, etc., to form the plasma, as an additive or mixture to reduce the breakdown voltage.
• a gas supply inlet 8a may be used to direct the gas into the treatment space 5 as shown in EP 2 226 832 by applicant and hereby incorporated as reference.
• the gas supply device 8 may be provided with storage, supply and mixing components as known to the skilled person.
• the gas directed to the treatment space for the nitration step is essentially consisting of N 2 (nitrogen) or N3 ⁇ 4 (ammonia) or NO or combination thereof.
• the gas composition may consist besides the presence of N 2 (nitrogen) or N3 ⁇ 4 (ammonia) or NO or combination thereof a small amount of H 2 .
• the total amount of gas supplied to the substrate for the nitridation step is in the range of 1 to 30 slm.
• the temperature in the treatment space 5 during the nitridation step is preferably below 150°C and even preferably below 100°C ; the time of plasma treatment is preferably below the 10 minutes , preferably below 5 and even more preferably below 2 minutes. Excellent results have been found using at most 60 seconds of plasma treatment. As a result excellent barriers can be prepared at very mild conditions i.e. at atmospheric pressure at low temperature and high speed giving high economical value.
• a substrate After the nitridation a substrate remains having a thin inorganic oxide film having a low N-atom concentration amount between 2 and 3%.
• the nitrogen concentration is determined by X-ray Photoelectron Spectroscopy (XPS), using Amicon Electron Spectroscopy for Chemical Analysis (ESCA) equipment manufactured by Kratos.
• XPS X-ray Photoelectron Spectroscopy
• ESCA Amicon Electron Spectroscopy for Chemical Analysis
• Water vapour transmission rate (WVTR) of a typical 50 nm inorganic silicon oxide layer on a PEN 100 ⁇ sheet film may change remarkably going from about 2 to about 0.002 g/m 2 *day and typical barrier improvement factors after the plasma treatment is 400, 500 or 1000, which is an unforeseen and surprising effect.
• Barrier properties for such thin layers of comparable quality have previously only been reported for thin layers (about 50 nm) prepared by ALD (Atomic Layer Deposition) in a plasma process which is much less efficient and takes much more time as each atomic layer formed in an ALD cycle comprises 4 different steps.
• WVTR is determined using a Mocon Aquatran Model 1 which uses a coloumetric cell (electrochemical cell) with a minimum detection limit of 5* 10 "4 g/m 2 *day. This method provides a more sensitive and accurate permeability evaluation than the permeation measurement by using IR absorption. All measurements were done at 40°C/90%RH.
• the free pore volume of the inorganic oxides was determined using the Lorentz-
• Lorenz equations by measuring the optical density difference of the material. Optical density difference was measured using a Woollam Spectroscopic Ellipsometer equipped with an vacuum chamber and heating stage.
• Typical WVTR of the PET samples after deposition is 5 g/m2*day and for PEN the WVTR is 2 g/m2*day. These WVTR values are similar to the values of the bare polymer film.
• Figure 2 shows N Is signal of example 1 before and after the APGD nitridation step (post-treatment).
• FIG. 3005 corona discharge treatment equipment under the same gas compositions 1 - 4 described as above.
• Figure 3 shows the ESCA (XPS) result of the top surface of the corona N 2 treatment.
• Table 2 shows the WVTR (in g/m 2 *day) and barrier improvement factor (BIF) results for the 12 examples treated under the APGD or the corona treatment as nitidation step. The nitrogen atom concentration was determined on the examples after the APGD post-treatment.

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• 2011
  • 2011-06-16 GB GBGB1110117.7A patent/GB201110117D0/en not_active Ceased
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