WO2012093606A1 - 銅張積層板及びその製造方法 - Google Patents
銅張積層板及びその製造方法 Download PDFInfo
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- WO2012093606A1 WO2012093606A1 PCT/JP2011/079996 JP2011079996W WO2012093606A1 WO 2012093606 A1 WO2012093606 A1 WO 2012093606A1 JP 2011079996 W JP2011079996 W JP 2011079996W WO 2012093606 A1 WO2012093606 A1 WO 2012093606A1
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- clad laminate
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B7/00—Insulated conductors or cables characterised by their form
- H01B7/40—Insulated conductors or cables characterised by their form with arrangements for facilitating mounting or securing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
- B32B15/09—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin comprising polyesters
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/20—Layered products comprising a layer of metal comprising aluminium or copper
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/16—Layered products comprising a layer of synthetic resin specially treated, e.g. irradiated
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/12—Chemical modification
- C08J7/123—Treatment by wave energy or particle radiation
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1655—Process features
- C23C18/1664—Process features with additional means during the plating process
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2310/00—Treatment by energy or chemical effects
- B32B2310/14—Corona, ionisation, electrical discharge, plasma treatment
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2367/00—Characterised by the use of polyesters obtained by reactions forming a carboxylic ester link in the main chain; Derivatives of such polymers
- C08J2367/02—Polyesters derived from dicarboxylic acids and dihydroxy compounds
- C08J2367/03—Polyesters derived from dicarboxylic acids and dihydroxy compounds the dicarboxylic acids and dihydroxy compounds having the hydroxy and the carboxyl groups directly linked to aromatic rings
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12535—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.] with additional, spatially distinct nonmetal component
- Y10T428/12556—Organic component
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24355—Continuous and nonuniform or irregular surface on layer or component [e.g., roofing, etc.]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31678—Of metal
Definitions
- the present invention relates to a copper clad laminate having excellent high frequency characteristics and a method for producing the same.
- thermoplastic liquid crystal polymer film is subjected to a gas discharge plasma treatment in the presence of a gaseous oxygen atom-containing compound, and the molar ratio of oxygen atoms to carbon atoms in the surface portion is set to the internal molar ratio. It is described that the surface is modified to 1.2 times or more (Patent Document 1). In this case, modification by introducing oxygen into the liquid crystal polymer film is an essential requirement. Moreover, only the surface modification by oxygen is mentioned, and it is a plasma treatment in the presence of an oxygen-containing compound, and the surface modification effect with other gases is not described.
- Patent Document 2 describes that a discharge treatment is performed on a thermoplastic liquid crystal polymer film in an atmosphere having an oxygen gas pressure of 0.6 to 2.5 Pa. This is defined in terms of the roughness of the liquid crystal polymer film, but the increase in surface roughness only describes the effect of hindering uniform coating of the metal seed layer.
- Patent Document 1 and Patent Document 2 have found the surface modification effect of a liquid crystal polymer film by plasma treatment with oxygen gas, but aimed to modify the surface by plasma treatment including other gas species. It is. Patent Documents 1 and 2 disclose the contents of the present invention described below, that the surface roughness is not changed before and after the treatment, and that the excellent high-frequency characteristics inherent to the liquid crystal polymer film are maintained. There is no disclosure.
- the interface roughness between the liquid crystal polymer and the metal conductor layer is maintained at the same level as the original film roughness, and the chemical adhesion is enhanced by plasma treatment, thereby providing a liquid crystal polymer having excellent high frequency characteristics. It is to provide a tension laminate.
- the present invention 1) The surface of a liquid crystal polymer film is plasma-treated in an oxygen atmosphere or a nitrogen atmosphere at a gas pressure of 2.6 to 15 Pa, and a metal conductor layer formed by dry plating and / or wet plating is provided. 2) The surface roughness after the plasma treatment of the liquid crystal polymer film is such that the arithmetic average roughness Ra is 0.15 ⁇ m or less and the root mean square roughness Rq is 0.20 ⁇ m or less.
- the present invention also provides: 6) Any one of 1) to 5) above, wherein a barrier layer is provided between the surface of the plasma-treated liquid crystal polymer film and the metal conductor layer formed by dry plating and / or wet plating. 7) The copper-clad laminate as described in 6) above, wherein the barrier layer is a tie coat layer made of nickel or nickel alloy, cobalt or cobalt alloy, or chromium or chromium alloy. 8) The copper-clad laminate according to any one of 1) to 7) above, wherein the metal conductor layer is a copper sputtering layer and an electrolytic copper plating layer formed on the sputtering layer. ,I will provide a.
- the surface of the liquid crystal polymer film is plasma-treated in an oxygen atmosphere or a nitrogen atmosphere at a gas pressure of 2.6 to 15 Pa, and then a metal conductor layer is formed by dry plating and / or wet plating.
- Plasma treatment of a liquid crystal polymer film characterized in that the surface roughness of the liquid crystal polymer film is reduced to an arithmetic average roughness Ra of 0.15 ⁇ m or less and a root mean square roughness.
- the transmission loss per unit length of the copper clad laminate is 20 dB / m or less at 5 GHz.
- a copper sputtering layer is formed in advance as the metal conductor layer, and an electrolytic copper plating layer is formed on the sputtering layer.
- the surface of the liquid crystal polymer film of the present invention is subjected to plasma treatment in an oxygen atmosphere or a nitrogen atmosphere at a gas pressure of 2.6 to 15 Pa, and then a metal conductor layer is formed by dry plating and / or wet plating, whereby liquid crystal Providing a copper-clad laminate of liquid crystal polymer with excellent high-frequency characteristics by maintaining the interface roughness between the polymer and metal conductor layer at the same level as the original film roughness and strengthening the chemical adhesion by plasma treatment It has an excellent effect of being able to.
- the liquid crystal polymer film-based copper-clad laminate according to the present invention includes, as an example, oxygen or nitrogen in order to provide adhesion to the metal conductor layer on both sides or one side of the liquid crystal polymer film as shown in FIG.
- Plasma treatment is performed under an atmosphere, and a barrier layer is applied to a metal or alloy having a barrier effect by a dry plating method or a wet plating method such as a sputtering method or an evaporation method.
- a copper or copper alloy conductor layer is stacked on the barrier layer by a dry plating method such as sputtering or vapor deposition, or a conductor layer is formed by a wet plating method such as electroless copper plating or electrolytic copper plating.
- a dry plating method such as sputtering or vapor deposition
- a conductor layer is formed by a wet plating method such as electroless copper plating or electrolytic copper plating.
- liquid crystal polymer there are a rheotropic liquid crystal polymer represented by aromatic polyamide and a thermotropic liquid crystal polymer represented by aromatic polyester.
- the copper-clad laminate is preferably a thermotropic liquid crystal polymer that has low moisture absorption and a small dimensional change rate due to moisture absorption.
- This thermotropic liquid crystal polymer is classified as a super engineering plastic excellent in heat resistance, although it is inferior in heat resistance to polyimide and aromatic polyamide as a thermoplastic resin.
- thermotropic liquid crystal polymer film used in the present invention is of a type consisting of p-hydroxybenzoic acid and polyethylene terephthalate, a type consisting of p-hydroxybenzoic acid and terephthalic acid, 4,4′-dihydroxybiphenyl, and p-hydroxybenzoic acid. And a type comprising 2,6-hydroxynaphthoic acid have been developed and are commercially available, and these can be used. However, it is not limited to these types.
- liquid crystal polymer films films such as Bexter CT-Z, CT-F, FB and OC are commercially available from Kuraray, and films such as BIAC BA and BC are commercially available from Japan Gore-Tex.
- the liquid crystal polymer film is subjected to plasma treatment for adhesion to the metal conductor layer.
- This plasma treatment does not expect the anchor effect due to the increase in surface roughness by applying it, but the surface roughness hardly changes, that is, by strengthening the chemical bond between polymer and metal. It is important to provide adhesion.
- the present invention is not characterized by introducing oxygen into the liquid crystal polymer film.
- Plasma treatment with oxygen gas can be expected to improve the adhesion between the activated polymer surface and the metal by radicals acting on the polymer surface, but the plasma treatment with nitrogen gas can remove nitrogen originally not present in the liquid crystal polymer film. By introducing it, it can be expected that a new polymer-metal bond will be formed.
- the increase in surface roughness has a negative effect on transmission loss in the high-frequency region, and the surface roughness must be reduced in order to obtain the intended high-frequency characteristics with a copper-clad laminate using liquid crystal polymer. Is desirable.
- the oxygen gas described in Patent Document 1 and Patent Document 2 can be used.
- the adhesion between the polymer and the metal can be improved. It can also be strengthened.
- the plasma gas pressure when the gas pressure is low, the plasma discharge becomes unstable and cannot be processed. On the other hand, when the gas pressure is high, the plasma discharge is stabilized, but the leak gas is increased and the gas is wasted. Therefore, even if the gas pressure is increased excessively, there is no point and it is not economical. Therefore, it can be said that the gas pressure is preferably 2.6 to 15 Pa.
- the tie coat layer shown in FIG. 1 corresponds to a barrier layer, but a metal such as nickel, cobalt, or chromium that exhibits a barrier effect, or a nickel alloy, cobalt alloy, or chromium alloy is preferable. These have lower conductivity than copper of the conductor layer, and in the high frequency region, current flows through the surface due to the skin effect, and the tie coat layer becomes the resistance layer.
- tie coat layer As a copper clad laminate for printed circuit boards, if there is no barrier layer such as a tie coat layer, copper will be a polymer in the long term. The effect of spreading to the side and breaking the bond may occur. Therefore, in practice, it is desirable that the tie coat layer is made as thin as possible from a metal or alloy having a high conductivity. Moreover, this tie coat layer does not need to be applied when it is considered unnecessary depending on the use conditions of the element. Sputtering, vapor deposition, and electroless plating can be applied to the tie coat layer, but it is better from the viewpoint of production efficiency to perform sputtering in the same chamber as the plasma treatment in a series of flows from the plasma treatment. is there.
- a metal conductor layer for allowing an original current to flow is formed.
- a copper layer can be formed by a sputtering method.
- the target copper thickness exceeds 1 ⁇ m, it is disadvantageous in cost to form a metal conductor layer to a prescribed copper thickness by sputtering, and in that case, several hundred nm of sputtering is performed on the tie coat layer.
- it can be said that it is preferable to perform copper plating to a prescribed copper thickness by a wet plating method.
- the surface roughness of the liquid crystal polymer film can be reduced to an arithmetic average roughness Ra of 0.15 ⁇ m or less and a root mean square roughness Rq of 0.20 ⁇ m or less.
- plasma treatment is not an essential purpose to roughen the surface of the liquid crystal polymer film.
- the surface roughness of the liquid crystal polymer film needs to be at least an arithmetic average roughness Ra of 0.05 ⁇ m or more, preferably 0.1 ⁇ m or more.
- the transmission loss per unit length of the copper-clad laminate is set to 20 dB / m or less at 5 GHz, 50 dB / m or less at 20 GHz, and further to 130 dB / m or less at 40 GHz. be able to.
- Example 1 to Example 8 As the liquid crystal polymer film, BIAC, BC, 50 ⁇ m manufactured by Japan Gore-Tex Corporation and Bexter, CT-Z, 50 ⁇ m manufactured by Kuraray Co., Ltd. were used.
- the liquid crystal polymer film was subjected to plasma treatment under the conditions of gas type, gas pressure, and power density shown in Table 1.
- the plasma intensity is expressed in terms of power density, the process conditions such as target size, current-voltage characteristics, and processing speed differ depending on the individual device, so it is meaningless to define the applied voltage and processing time as a whole.
- the power density when the condition for plasma treatment of the polyimide film was 1 was described.
- Example 1 the above BIAC was used as a liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 13 Pa, gas type: nitrogen, power density: 4.3.
- Example 2 the BIAC was used as a liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 13 Pa, gas type: nitrogen, power density: 4.3.
- Example 3 the above BIAC was used as the liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 10 Pa, gas type: nitrogen, power density: 8.1.
- Example 4 the above BIAC was used as the liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 10 Pa, gas type: nitrogen, power density: 8.1.
- Example 5 the above BIAC was used as the liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 10 Pa, gas type: nitrogen, power density: 8.1.
- Example 6 the BIAC was used as a liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 10 Pa, gas type: oxygen, power density: 5.3.
- Example 7 the above-mentioned Bexter was used as the liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 10 Pa, gas type: oxygen, power density: 5.3.
- Example 8 the above-mentioned Bexter was used as the liquid crystal polymer film.
- the plasma conditions are as follows. Gas pressure: 10 Pa, gas type: nitrogen, power density: 5.3.
- the surface shape of the liquid crystal polymer film after the plasma treatment was measured with a surface shape measuring instrument of Wyco NT1100 manufactured by Veeco, in a field of view of 120 ⁇ m ⁇ 92 ⁇ m, and arithmetic mean roughness Ra and root mean square roughness Rq was determined.
- the arithmetic average roughness Ra and root mean square roughness Rq of Examples 1 to 8 were as follows. A list of the results is similarly shown in Table 1.
- Example 1 Ra: 0.11 ⁇ m, Rq: 0.14 ⁇ m
- Example 2 Ra: 0.10 ⁇ m, Rq: 0.14 ⁇ m
- Example 3 Ra: 0.12 ⁇ m, Rq: 0.15 ⁇ m
- Example 4 Ra: 0.12 ⁇ m, Rq: 0.14 ⁇ m
- Example 5 Ra: 0.11 ⁇ m, Rq: 0.15 ⁇ m
- Example 6 Ra: 0.12 ⁇ m, Rq: 0.15 ⁇ m
- Example 7 Ra: 0.11 ⁇ m, Rq: 0.14 ⁇ m
- Example 8 Ra: 0.10 ⁇ m, Rq: 0.14 ⁇ m
- the film after the plasma treatment was formed by sputtering to form a tie coat layer shown in Table 1 and a copper sputter layer to become a seed layer for wet plating with a thickness of 200 nm.
- the conditions of the tie coat layers of Examples 1 to 8 are as follows. A list of the results is also shown in Table 1.
- Example 1 Tie coat layer: none, thickness:-
- Example 2 Type and thickness of tie coat layer, type: Cr, thickness: 3 nm
- Example 3 Type and thickness of tie coat layer, type: Cr, thickness: 3 nm
- Example 4 Type and thickness of tie coat layer, type: Cr, thickness: 7 nm
- Example 5 Type and thickness of tie coat layer, type: NiCr, thickness: 3 nm
- Example 6 Type and thickness of tie coat layer, type: NiCr, thickness: 3 nm
- Example 7 Type and thickness of tie coat layer, type: NiCr, thickness: 3 nm
- Example 8 Type and thickness of tie coat layer, type: NiCr, thickness: 3 nm
- a copper layer was grown up to 18 ⁇ m by electrolytic plating on the copper sputtered layer to prepare a sample.
- plasma treatment, tie coat layer, copper sputtering, and electrolytic copper plating were performed on both sides of the liquid crystal polymer film.
- the schematic view of the copper-clad laminate in FIG. 1 shows the structure of this example.
- the samples of each example were measured for peel strength for evaluation of adhesion.
- a pattern having a width of 3 mm was formed with a copper chloride etching solution, and then the peel strength was measured using a bond tester 4000 manufactured by Dage.
- the peel strengths of Examples 1 to 8 are as follows. A list of the results is also shown in Table 1.
- Example 1 0.9 kN / m
- Example 2 0.9 kN / m
- Example 3 0.6 kN / m
- Example 4 0.7 kN / m
- Example 5 0.8 kN / m
- Example 6 0.6 kN / m
- Example 7 0.5 kN / m
- Example 8 0.5 kN / m
- a microstrip line having a characteristic impedance of 50 ⁇ was formed, and the transmission coefficient was measured with a network analyzer HP8510C manufactured by HP, and the transmission loss at each frequency was obtained.
- the copper layer was electrolytically plated up to 12 ⁇ m for measurement.
- the results of transmission loss measurement in Examples 1 to 8 are as follows. A list of the results is also shown in Table 1.
- Example 1 5 GHz: 14 dB / m, 20 GHz: 36 dB / m, 40 GHz: 76 dB / m
- Example 2 5 GHz: 15 dB / m, 20 GHz: 38 dB / m, 40 GHz: 92 dB / m
- Example 3 5 GHz: 15 dB / m, 20 GHz: 38 dB / m, 40 GHz: 92 dB / m
- Example 4 5 GHz: 16 dB / m, 20 GHz: 40 dB / m, 40 GHz: 110 dB / m
- Example 5 5 GHz: 17 dB / m, 20 GHz: 43 dB / m, 40 GHz: 124 dB / m
- Example 6 5 GHz: 17 dB / m, 20 GHz: 43 dB / m, 40 GHz: 124 dB /
- Fig. 2 shows the relationship between the plasma processing power density and the peel strength.
- the power density here normally defines the power density when processing a polyimide film as 1, and the liquid crystal polymer film is multiplied by a power density greater than 1 in each example. As the power density increases, the peel strength tends to increase.
- FIG. 3 shows the result of transmission loss. From the examples, it can be seen that if the transmission loss is the same tie coat, the thinner the tie coat thickness is, the smaller the transmission loss is. . In addition, about the relationship between transmission loss and film surface roughness, since there is no big difference in surface roughness, description is abbreviate
- Example 1 The film is the same as Example 6 except that Kapton E, 50 microns manufactured by DuPont was used as the polyimide film and the plasma power density was changed.
- Table 1 and FIG. 2 in the case of a polyimide film, although the surface roughness is small compared to the liquid crystal polymer (Ra: 0.04 ⁇ m, Rq: 0.06 ⁇ m), the peel strength is a high value ( 1.0 kN / m) was obtained. However, the transmission loss was larger than that of the liquid crystal polymer (5 GHz: 27 dB / m, 65 GHz: 45 dB / m, 40 GHz: ⁇ ), and the result was poor.
- Comparative Example 2 When a liquid crystal polymer is used as a copper clad laminate, thermal lamination is performed as a general method.
- the comparative example 2 is a result at the time of using rolled copper foil (JX Nippon Mining & Metals BHY 12micron) as a copper clad laminated board produced by thermal lamination using BIAC as a liquid crystal polymer.
- rolled copper foil JX Nippon Mining & Metals BHY 12micron
- BIAC a liquid crystal polymer.
- the surface roughness of the film reflects the surface shape of the rolled copper foil. As shown in Table 1, the surface roughness is Ra: 0.18 ⁇ m, Rq: 0.23 ⁇ m. And it became bigger.
- the applied liquid crystal polymer film is not subjected to plasma treatment, and the roughening treatment of the copper foil bites into the softened film.
- the anchor effect is the main component of the adhesion, strong adhesion cannot be obtained, and the peel strength is 0.3 kN / m, which is inferior to the examples.
- the transmission loss was also increased by 5 GHz: 18 dB / m, 20 GHz: 48 dB / m, and 40 GHz: 137 dB / m as compared with the example. From the above, the copper clad laminate using the liquid crystal polymer of Comparative Example 2 could not achieve the object of the present invention.
- Example 5 is the same as Example 5 except that no power is applied during the plasma treatment and the gas is passed through the treatment gas (nitrogen).
- the peel strength when a tie coat layer and a copper sputter layer are formed on a liquid crystal polymer that is not plasma-treated, and the copper layer is grown by electrolytic plating, the adhesion between the liquid crystal polymer and the metal conductor layer is insufficient (the peel strength is 0 kN / m), and electroplating could not be performed.
- Comparative Example 4 The power density of the plasma treatment is the same as that of Comparative Example 3 using a liquid crystal polymer (BIAC) except that the power density of the plasma treatment is the same as that of the polyimide of Comparative Example 1.
- the liquid crystal polymer was not sufficiently activated, and even though an 18 ⁇ m copper layer could be formed by electrolytic plating, as shown in Table 1 and FIG. 2, the peel strength was low (the peel strength was 0). 0.1 kN / m). It can be seen that in order to obtain adhesion by performing plasma treatment with a liquid crystal polymer film as in the Examples, it is necessary to perform treatment with a power density stronger than the plasma conditions of normal polyimide.
- Example 5 As shown in Table 1, except that the gas pressure of the plasma treatment was 2 Pa, the same as Example 6 (plasma gas: oxygen, power density: 5.3). By reducing the plasma gas pressure, the plasma discharge became unstable and could not be processed. The results are similarly shown in Table 1.
- Laminate is a liquid crystal polymer copper that has excellent high-frequency characteristics by maintaining the interface roughness between the liquid crystal polymer and the metal conductor layer at the same level as the original film roughness and strengthening the chemical adhesion by plasma treatment. Since it has the outstanding effect that a tension laminate can be provided, it can be applied to a high-frequency circuit board, a high-speed transmission line circuit, and the like.
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Abstract
Description
しかし、液晶ポリマーと金属導体層の密着性や親和性が乏しいため、金属導体層として一般的に用いられる銅箔の表面粗さを粗くする、又は粗化処理の粒子形状を変更することによって、アンカー効果により物理的な密着を強化しているのが現状である。
1)液晶ポリマーフィルムの表面を、2.6~15Paのガス圧の酸素雰囲気又は窒素雰囲気下でプラズマ処理した面に、乾式めっき及び/又は湿式めっきにより形成された金属導体層を備えることを特徴とする銅張積層板
2)液晶ポリマーフィルムのプラズマ処理後の表面粗さが、算術平均粗さRaが0.15μm以下であり、かつ二乗平均平方根粗さRqが0.20μm以下であることを特徴とする上記1)記載の銅張積層板
3)単位長さあたりの伝送損失が、5GHzで20dB/m以下であることを特徴とする上記1)又は2)記載の銅張積層板
4)単位長さあたりの伝送損失が、20GHzで50dB/m以下であることを特徴とする上記1)又は2)記載の銅張積層板
5)単位長さあたりの伝送損失が、40GHzで130dB/m以下であることを特徴とする上記1)又は2)記載の銅張積層板、を提供する。
6)プラズマ処理された液晶ポリマーフィルムの表面と乾式めっき及び/又は湿式めっきにより形成された金属導体層との間に、バリア層を有することを特徴とする上記1)~5)のいずれか一項に記載の銅張積層板
7)バリア層が、ニッケル若しくはニッケル合金、コバルト若しくはコバルト合金、又はクロム若しくはクロム合金からなるタイコート層であることを特徴とする上記6)記載の銅張積層板
8)前記金属導体層が、銅スパッタリング層及び該スパッタリング層の上に形成された電解銅めっき層であることを特徴とする上記1)~7)のいずれか一項に記載の銅張積層板、を提供する。
9)液晶ポリマーフィルムの表面を、2.6~15Paのガス圧の酸素雰囲気又は窒素雰囲気下でプラズマ処理したした後、乾式めっき及び/又は湿式めっきにより金属導体層を形成することを特徴とする銅張積層板の製造方法
10)液晶ポリマーフィルムをプラズマ処理することにより、液晶ポリマーフィルムの表面粗さを、算術平均粗さRaを0.15μm以下に、かつ二乗平均平方根粗さRqを0.20μm以下にすることを特徴とする上記9)記載の銅張積層板の製造方法
11)銅張積層板の単位長さあたりの伝送損失を、5GHzで20dB/m以下とすることを特徴とする上記9)又は10)記載の銅張積層板の製造方法
12)銅張積層板の単位長さあたりの伝送損失を、20GHzで50dB/m以下とすることを特徴とする上記9)又は10)記載の銅張積層板の製造方法、を提供する。
13)銅張積層板の単位長さあたりの伝送損失を、40GHzで130dB/m以下とすることを特徴とする上記9)又は10)記載の銅張積層板の製造方法
14)プラズマ処理された液晶ポリマーフィルムの表面と乾式めっき及び/又は湿式めっきにより形成された金属導体層との間に、バリア層を形成することを特徴とする上記9)~13)のいずれか一項に記載の銅張積層板
15)バリア層として、ニッケル若しくはニッケル合金、コバルト若しくはコバルト合金、又はクロム若しくはクロム合金からなるタイコート層を形成することを特徴とする上記14)記載の銅張積層板の製造方法
16)前記金属導体層として、予め銅スパッタリング層を形成し、このスパッタリング層上に電解銅めっき層を形成することを特徴とする上記9)~15)のいずれか一項に記載の銅張積層板の製造方法、を提供する。
銅張積層板としては、吸湿が少なく、吸湿による寸法変化率が小さいサーモトロピック液晶ポリマーが好ましい。このサーモトロピック液晶ポリマーは、熱可塑性樹脂としてはポリイミドや芳香族ポリアミドには耐熱性は劣るが、耐熱性に優れたスーパーエンジニアリングプラスチックに分類される。
本発明に使用するサーモトロピック液晶ポリマーフィルムについては、p-ヒドロキシ安息香酸とポリエチレンテレフタレートからなるタイプ、p-ヒドロキシ安息香酸とテレフタル酸,4,4’―ジヒドロキシビフェニルからなるタイプ、p-ヒドロキシ安息香酸と2,6―ヒドロキシナフトエル酸からなるタイプなどが開発され、市販されているので、これらを使用することができる。しかし、これらの種類に限定されるものではない。
表面粗さの増大は、高周波領域での伝送損失に対して負の効果を示し、液晶ポリマーを用いた銅張積層板で本来目的とする高周波特性を得るために、表面粗さは小さくすることが望ましい。
プラズマガス圧については、ガス圧が低い場合、プラズマ放電が不安定になり、処理することができなくなる。一方、ガス圧が高い場合、プラズマ放電は安定化するが、リークガスが多くなりガスの無駄となる。したがって、むやみにガス圧を高くしても意味がなく、経済的に得策でない。したがって、2.6~15Paのガス圧にするのが望ましいと言える。
このため、現実的にはタイコート層は導電率が大きな金属又は合金を、できるだけ薄くすることが望ましい。また、このタイコート層は、素子の使用条件によって、不必要と考えられる場合には、施工する必要はない。
タイコート層はスパッタリング法、蒸着法、無電解めっき法などが適用できるが、プラズマ処理からの一連の流れの中で、プラズマ処理と同一チャンバー内でスパッタリングする方が、生産効率の面から得策である。
しかし、目的とする銅厚が1μmを超える場合、スパッタリング法で規定の銅厚に金属導体層を形成するのはコスト的に不利であり、その場合、タイコート層上にスパッタリングで数百nmの銅シード層を形成後、湿式めっき法で規定の銅厚まで銅めっきする方が好ましいと言える。
ただし、銅層の密着性を得るためには、液晶ポリマーフィルムの表面粗さとして、少なくとも算術平均粗さRa0.05μm以上、好ましくは0.1μm以上が必要である。
以上の処理によって、銅張積層板の単位長さあたりの伝送損失を、5GHzで20dB/m以下とすること、また20GHzで50dB/m以下とすること、さらには40GHzで130dB/m以下とすることができる。
液晶ポリマーフィルムとしては、ジャパンゴアテックス社製のBIAC,BC,50μm、及びクラレ社製のベクスター,CT-Z,50μmを使用した。
この液晶ポリマーフィルム上に、表1に示したガス種、ガス圧、パワー密度の各条件でプラズマ処理を施した。プラズマの強度をパワー密度で表現したが、個々の装置によりターゲットのサイズや電流―電圧特性、処理速度などのプロセス条件が異なるため、一概に印加電圧と処理時間で定義しても無意味なため、ポリイミドフィルムをプラズマ処理する条件を1とした場合のパワー密度として記載した。
実施例2は、液晶ポリマーフィルムとして上記BIACを使用した。プラズマ条件は次の通りである。ガス圧:13Pa、ガス種:窒素、パワー密度:4.3。
実施例3では、液晶ポリマーフィルムとして上記BIACを使用した。プラズマ条件は次の通りである。ガス圧:10Pa、ガス種:窒素、パワー密度:8.1。
実施例4では、液晶ポリマーフィルムとして上記BIACを使用した。プラズマ条件は次の通りである。ガス圧:10Pa、ガス種:窒素、パワー密度:8.1。
実施例6は、液晶ポリマーフィルムとして上記BIACを使用した。プラズマ条件は次の通りである。ガス圧:10Pa、ガス種:酸素、パワー密度:5.3。
実施例7では、液晶ポリマーフィルムとして上記ベクスターを使用した。プラズマ条件は次の通りである。ガス圧:10Pa、ガス種:酸素、パワー密度:5.3。
実施例8では、液晶ポリマーフィルムとして上記ベクスターを使用した。プラズマ条件は次の通りである。ガス圧:10Pa、ガス種:窒素、パワー密度:5.3。
実施例1~実施例8の算術平均粗さRaと二乗平均平方根粗さRqは、次の通りであった。また、この結果の一覧を、同様に表1に示す。
実施例2:Ra:0.10μm、Rq:0.14μm
実施例3:Ra:0.12μm、Rq:0.15μm
実施例4:Ra:0.12μm、Rq:0.14μm
実施例5:Ra:0.11μm、Rq:0.15μm
実施例6:Ra:0.12μm、Rq:0.15μm
実施例7:Ra:0.11μm、Rq:0.14μm
実施例8:Ra:0.10μm、Rq:0.14μm
実施例2:タイコート層の種類と厚み、種類:Cr、厚み:3nm
実施例3:タイコート層の種類と厚み、種類:Cr、厚み:3nm
実施例4:タイコート層の種類と厚み、種類:Cr、厚み:7nm
実施例5:タイコート層の種類と厚み、種類:NiCr、厚み:3nm
実施例6:タイコート層の種類と厚み、種類:NiCr、厚み:3nm
実施例7:タイコート層の種類と厚み、種類:NiCr、厚み:3nm
実施例8:タイコート層の種類と厚み、種類:NiCr、厚み:3nm
実施例1~実施例8のピール強度は、次の通りである。この結果の一覧を、同様に表1に示す。
実施例2:0.9kN/m
実施例3:0.6kN/m
実施例4:0.7kN/m
実施例5:0.8kN/m
実施例6:0.6kN/m
実施例7:0.5kN/m
実施例8:0.5kN/m
実施例2:5GHz:15dB/m、20GHz:38dB/m、40GHz:92dB/m
実施例3:5GHz:15dB/m、20GHz:38dB/m、40GHz:92dB/m
実施例4:5GHz:16dB/m、20GHz:40dB/m、40GHz:110dB/m
実施例5:5GHz:17dB/m、20GHz:43dB/m、40GHz:124dB/m
実施例6:5GHz:17dB/m、20GHz:43dB/m、40GHz:124dB/m
実施例7:5GHz:18dB/m、20GHz:45dB/m、40GHz:128dB/m
実施例8:5GHz:18dB/m、20GHz:45dB/m、40GHz:128dB/m
(比較例1)
フィルムにはポリイミドフィルムとして、DuPont社製のカプトンE,50ミクロンを使用し、プラズマのパワー密度を変更した以外は実施例6と同じである。
表1及び図2に示すように、ポリイミドフィルムの場合、液晶ポリマーと比較して表面粗さが小さい(Ra:0.04μm、Rq:0.06μm)にもかかわらず、ピール強度は高い値(1.0kN/m)が得られた。しかし、伝送損失は液晶ポリマーより大きく(5GHz:27dB/m、65GHz:45dB/m、40GHz:-)、結果としては不良であった。
液晶ポリマーを銅張積層板として使用する際、一般的な方法として熱ラミネーションが行われる。比較例2は、液晶ポリマーとしてBIACを使用し、熱ラミネーションで作製された銅張積層板として、圧延銅箔(JX日鉱日石金属株式会社製 BHY 12ミクロン)を使用した場合の結果である。
圧延銅箔を熱ラミネーションすることで、フィルムの表面粗さは圧延銅箔の表面形状を反映する結果となり、表1に示すように表面粗さは、Ra:0.18μm、Rq:0.23μmと、大きくなった。
また、表面粗さが大きいことに起因して、実施例と比較し、伝送損失も5GHz:18dB/m、20GHz:48dB/m、40GHz:137dB/m大きくなった。以上から、比較例2の液晶ポリマーを使用した銅張積層板は、本願発明の目的を達成することができなかった。
プラズマ処理中にパワーを掛けず、処理ガス(窒素)中を通過させたこと以外、実施例5と同じである。ピール強度については、プラズマ処理をしない液晶ポリマーにタイコート層、銅スパッタ層を形成して、電解めっきで銅層を成長させる際、液晶ポリマーと金属導体層の密着力が不十分(ピール強度は0kN/m)であり、電解めっきをすることができなかった。
プラズマ処理のパワー密度を、比較例1のポリイミドの場合と同様に処理した以外、液晶ポリマー(BIAC)を使用した比較例3と同じである。
ポリイミドと同じパワー密度では液晶ポリマーは十分に活性化しておらず、電解めっきで18μmの銅層は形成できても、表1及び図2に示すように、ピール強度は低い結果(ピール強度は0.1kN/m)であった。
実施例のように、液晶ポリマーフィルムでプラズマ処理を施すことで密着性を得るためには、通常のポリイミドのプラズマ条件より、強いパワー密度で処理する必要があることがわかる。
プラズマ処理のガス圧2Paとした以外、表1に示すように、実施例6と同じである(プラズマガス:酸素、パワー密度:5.3)。プラズマガス圧を低くすることで、プラズマ放電が不安定になり、処理不可能であった。この結果を同様に、表1に示す。
Claims (16)
- 液晶ポリマーフィルムの表面を、2.6~15Paのガス圧の酸素雰囲気又は窒素雰囲気下でプラズマ処理した面に、乾式めっき及び/又は湿式めっきにより形成された金属導体層を備えることを特徴とする銅張積層板。
- 液晶ポリマーフィルムのプラズマ処理後の表面粗さが、算術平均粗さRaが0.15μm以下であり、かつ二乗平均平方根粗さRqが0.20μm以下であることを特徴とする請求項1記載の銅張積層板。
- 単位長さあたりの伝送損失が、5GHzで20dB/m以下であることを特徴とする請求項1又は2記載の銅張積層板。
- 単位長さあたりの伝送損失が、20GHzで50dB/m以下であることを特徴とする請求項1又は2記載の銅張積層板。
- 単位長さあたりの伝送損失が、40GHzで130dB/m以下であることを特徴とする請求項1又は2記載の銅張積層板。
- プラズマ処理された液晶ポリマーフィルムの表面と乾式めっき及び/又は湿式めっきにより形成された金属導体層との間に、バリア層を有することを特徴とする請求項1~5のいずれか一項に記載の銅張積層板。
- バリア層が、ニッケル若しくはニッケル合金、コバルト若しくはコバルト合金、又はクロム若しくはクロム合金からなるタイコート層であることを特徴とする請求項6記載の銅張積層板。
- 前記金属導体層が、銅スパッタリング層及び該スパッタリング層の上に形成された電解銅めっき層であることを特徴とする請求項1~7のいずれか一項に記載の銅張積層板。
- 液晶ポリマーフィルムの表面を、2.6~15Paのガス圧の酸素雰囲気又は窒素雰囲気下でプラズマ処理したした後、乾式めっき及び/又は湿式めっきにより金属導体層を形成することを特徴とする銅張積層板の製造方法。
- 液晶ポリマーフィルムをプラズマ処理することにより、液晶ポリマーフィルムの表面粗さを、算術平均粗さRaを0.15μm以下に、かつ二乗平均平方根粗さRqを0.20μm以下にすることを特徴とする請求項9記載の銅張積層板の製造方法。
- 銅張積層板の単位長さあたりの伝送損失を、5GHzで20dB/m以下とすることを特徴とする請求
項9又は10記載の銅張積層板の製造方法。 - 銅張積層板の単位長さあたりの伝送損失を、20GHzで50dB/m以下とすることを特徴とする請求項9又は10記載の銅張積層板の製造方法。
- 銅張積層板の単位長さあたりの伝送損失を、40GHzで130dB/m以下とすることを特徴とする請求項9又は10記載の銅張積層板の製造方法。
- プラズマ処理された液晶ポリマーフィルムの表面と乾式めっき及び/又は湿式めっきにより形成された金属導体層との間に、バリア層を形成することを特徴とする請求項9~13のいずれか一項に記載の銅張積層板。
- バリア層として、ニッケル若しくはニッケル合金、コバルト若しくはコバルト合金、又はクロム若しくはクロム合金からなるタイコート層を形成することを特徴とする請求項14記載の銅張積層板の製造方法。
- 前記金属導体層として、予め銅スパッタリング層を形成し、このスパッタリング層上に電解銅めっき層を形成することを特徴とする請求項9~15のいずれか一項に記載の銅張積層板の製造方法。
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Also Published As
Publication number | Publication date |
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TW201230913A (en) | 2012-07-16 |
KR20130049827A (ko) | 2013-05-14 |
JP2012140552A (ja) | 2012-07-26 |
JP5746866B2 (ja) | 2015-07-08 |
EP2662208A4 (en) | 2016-08-31 |
EP2662208A1 (en) | 2013-11-13 |
US20130252019A1 (en) | 2013-09-26 |
CN103221213A (zh) | 2013-07-24 |
KR101344952B1 (ko) | 2013-12-24 |
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