WO2012063406A1 - 荷電粒子線装置 - Google Patents
荷電粒子線装置 Download PDFInfo
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- WO2012063406A1 WO2012063406A1 PCT/JP2011/005748 JP2011005748W WO2012063406A1 WO 2012063406 A1 WO2012063406 A1 WO 2012063406A1 JP 2011005748 W JP2011005748 W JP 2011005748W WO 2012063406 A1 WO2012063406 A1 WO 2012063406A1
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- particle beam
- charged particle
- sound
- sound absorber
- cover
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/16—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/172—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using resonance effects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/16—Vessels; Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/0216—Means for avoiding or correcting vibration effects
Definitions
- the present invention relates to a charged particle beam apparatus in which image disturbance occurs due to acoustic excitation. It relates to a soundproof cover for reducing noise and vibration from the external environment, and is intended especially for use in a clean room.
- a soundproof cover is installed as a means for interrupting transmission of sound waves irradiated to the apparatus for the purpose of preventing an image failure caused by irradiation of installation environment sound.
- the soundproof cover takes into account the property of sound waves to wrap around, and in addition, in view of workability and cost reduction, it usually forms a hexahedral surface having upper, lower, left, and upper surfaces.
- Patent Document 1 discloses a technique for covering a sound absorbing material with a dustproof fiber and attaching it to an exterior cover.
- Patent Document 2 discloses a sound absorbing structure made of a box member having a large number of small holes.
- the present invention provides a sound absorbing structure for a soundproof cover structure for a charged particle beam device, and a charged particle beam device in which the sound absorbing structure is arranged so that a sound absorbing effect can be obtained efficiently. For the purpose.
- One or both of the second sound absorbers specialized for the second frequency region based on the wave frequency are provided in the cover of the charged particle beam apparatus.
- the present invention it is possible to configure a soundproof cover that efficiently absorbs the natural vibration of the charged particle beam device and the acoustic standing wave generated in the cover, and the charged particle beam device including the soundproof cover is installed. It is possible to reduce image disturbance caused by environmental sound.
- FIG. 3 is a diagram illustrating Example 1.
- FIG. 6 is a diagram illustrating Example 2.
- FIG. 6 is a diagram for explaining a third embodiment.
- FIG. 10 is a diagram for explaining a fourth embodiment. It is a figure explaining the acoustic standing wave which generate
- FIG. 10 is a diagram for explaining a fifth embodiment. It is the figure which showed sectional drawing of the charged particle beam apparatus which has a sample conveyance apparatus.
- FIG. 10 is a diagram illustrating Example 6.
- FIG. 10 is a three-dimensional view of a configuration described in a sixth embodiment.
- FIG. 10 is a diagram illustrating Example 7.
- the charged particle beam device referred to below is a general-purpose scanning electron microscope, length measuring device (CD-SEM), review device, defect inspection device, sample processing device using a charged particle beam, etc. It refers to a device that performs processing, and refers to all devices in which a failure occurs due to minute vibrations of the device.
- FIG. 1 is a schematic diagram showing an overall configuration of a scanning electron microscope which is an example of a charged particle beam apparatus.
- the scanning electron microscope of FIG. 1 includes a column having an electron optical system composed of optical elements such as an electron gun 100, a lens 101, a scanning deflector 102, an objective lens 103, a sample 104, a secondary particle detector 105, and an observation target.
- the stage 106 for moving the sample stage holding the sample to be in the XY plane, the electron optical system control unit 107 for controlling various optical elements included in the electron optical system, and the output signal of the secondary particle detector 105 are quantized.
- the electron optical system, the electron optical system control unit 107, the A / D conversion unit 108, the stage 104, and the stage control unit 109 described above constitute a scanning electron microscope that is an imaging unit for SEM images.
- the sample 104 is set on the sample stage 106 by a loader (not shown) that conveys the sample, and is conveyed from the sample preparation chamber 115 into the electron microscope 116.
- the primary electron beam 117 emitted from the electron gun 100 is focused by the lens 101, deflected by the scanning deflector 102, focused by the objective lens 103, and irradiated on the sample 104.
- secondary particles 118 such as secondary electrons and reflected electrons are generated according to the shape and material of the sample.
- the generated secondary particles 118 are detected by the secondary particle detector 105 and then converted into a digital signal by the A / D converter 108.
- the output signal of the secondary particle detector converted into a digital signal may be referred to as an image signal.
- the output signal of the A / D conversion unit 108 is input to the image processing unit 111 to form an SEM image.
- the image processing unit 111 executes various image processing such as defect detection and defect analysis by image comparison.
- the overall control unit 110 is a control unit that comprehensively controls the entire apparatus.
- the overall control unit 110 interprets inputs from the operation unit 112 and the storage unit 113, and includes an electron optical system control unit 107, a stage control unit 109, an image processing unit 111, and the like. And the processing result is output to a display unit (not shown) included in the operation unit 112 and the storage unit 113 as necessary.
- Part or all of the overall control unit 110 and the image processing unit 111 described above can be realized by either hardware or software.
- it can be realized by integrating a plurality of arithmetic units for executing necessary processes on a wiring board or in one semiconductor chip or package.
- it can be realized by causing a high-speed general-purpose CPU to execute a program that performs processing configured by software such as image processing.
- FIG. 2 is an external view showing an example of a charged particle beam apparatus.
- An outer cover 202 is provided on the outer periphery of the electron microscope 201 so as to surround the whole.
- the exterior cover 202 is made of a steel plate or resin material.
- An operation door 203 and an operation window 204 are attached to the exterior cover 202 for operation and can be opened and closed.
- the operation window 204 is made of a material such as a steel plate, resin, or glass.
- An observation window 205 for observing the inside is attached.
- the observation window 205 is made of a glass or resin material so that the inside can be monitored.
- the operation door 203, the operation window 204, and the observation window 205 are a part of the exterior cover 202, and these are collectively referred to as the exterior cover 202.
- the observation window 205 may be made of a metal material as long as it can be opened and closed.
- the sample preparation chamber 206 may naturally be included in the exterior cover.
- the overall control unit 110, the image processing unit 111, and the like are partially or wholly configured by hardware, so that the portion configured by hardware is surrounded by the same exterior casing as the electron microscope. Alternatively, it may be handled as a separate casing surrounded by an exterior plate different from the electron microscope.
- the loader or the control board with the cooling fan that transports the sample should be either a separate housing or partitioned within the housing so that no vibration source is included in the same housing. It seems better to have a wall.
- FIG. 3 is a cross-sectional view of the electron microscope and the exterior cover shown in FIG.
- a charged particle beam apparatus having a cover 301 and a load plate 302 is shown.
- a load plate 302 is installed via a vibration isolation table 304 to a gantry 303 having a plurality of columns installed on the ground, and a column 306 including an electron optical system and a sample are installed.
- the charged particle beam apparatus main body 300 including the sample chamber 307 to be placed is constructed on the load plate 302.
- the cover 301 is configured on the outside thereof, and covers the gantry 303, the load plate 302, and the apparatus main body 300.
- the apparatus generates heat, but an opening 305 is provided at the bottom of the cover 301 for the purpose of discharging the heat.
- the sound absorbing body includes a part of the structure of the soundproof cover integrally formed with the soundproof cover, in addition to a part having a sound absorbing structure formed independently of the soundproof cover.
- sound absorbers are generally made of an organic porous material, but these organic porous materials are dusty and cannot be used in a clean room. Therefore, by forming the sound absorber from a metallic material, the dust generation can be reduced as much as possible so that there is no problem even if it is used in a clean room.
- the sound absorber 400 as shown in FIG. 4 may be formed of a metal material.
- FIG. 4 specifically illustrates the sound absorber 400 using a perforated plate.
- a front plate 402 provided with an opening 401 is fixed to a back plate 403 by a partition wall 404, and the front plate 402, the back plate 403, and A structure having a cavity 405 formed by the partition 404 is formed.
- a soundproof cover specialized for the frequency of the noise can be formed.
- the sound absorption frequency can be adjusted by embedding a cylindrical object in the opening 401 so that the length of the hole of the opening 401 can be varied.
- the noise frequency referred to here is the frequency of the vibration to be absorbed, for example, the natural frequency of the device or the frequency of the acoustic standing wave inside the cover. These can be estimated in advance from the size and mass of the device and cover. Therefore, a high sound absorption effect can be obtained by adjusting the absorption frequency of the sound absorber to these noise frequencies.
- the sound absorber 400 can be more effectively soundproofed by designing the sound absorber 400 so that the frequency of the maximum value matches the frequency of the sound absorption target. Can do. It is desirable that the frequency of the maximum value and the frequency of the sound absorption target coincide with each other. However, even if the frequency is not exactly the same, the sound absorption target frequency has a sound absorption rate of 70% or more at the maximum value. If this is done, the effects of the present invention are sufficiently obtained.
- a frequency band having a sound absorption rate of 70% or more at the maximum value is set as an absorption frequency band, and a sound absorption structure specialized for a specific frequency band is a sound absorption coefficient of 70% or more in a specific frequency body.
- one opening 401 is indicated for one cavity 405, but a plurality of openings 401 may be provided for one cavity 405. That is, the interval between the adjacent openings 401 may be shorter than the interval between the adjacent partition walls 404. At that time, by making the interval between the partition walls 404 shorter than the wavelength of the sound wave at the sound absorption frequency, the surface plate 402 becomes difficult to be vibrated by the sound wave, and inherently occurs due to energy dissipation due to friction between the air and the member in the opening 401. This is effective because it can exhibit the sound absorbing performance.
- the sound absorber as described above is used as a sound absorber for a soundproof cover, for example, by arranging so as to effectively absorb a specific frequency as shown in the following embodiments, thereby providing a soundproof cover specialized for the specific frequency. Can do.
- the sound absorber is arranged inside the soundproof cover.
- an apparatus main body such as a scanning electron microscope, a sample chamber in which a sample is placed, a load plate, a frame, and the like that support these.
- a power source and a control board for operating the apparatus main body may be included. Therefore, the empty space inside the soundproof cover is limited, and it is necessary to efficiently absorb noise.
- the sound absorber is arranged near the opening of the soundproof cover as shown in the following examples.
- the opening here refers to the gap between the cover provided for heat dissipation, piping, and wiring and the outside of the device.
- the vicinity of the opening absorbs external noise that enters through the opening when the sound absorber is installed. This refers to the range where the effect is achieved. “To produce an effect” means, for example, a sound absorption rate of 70% or more.
- a plurality of sound absorbers having different absorption frequency bands are arranged inside the soundproof cover. Different absorption frequency bands indicate that the maximum value of the absorption frequency is different, for example.
- FIG. 5 shows an example of the arrangement of sound absorbers.
- the sound absorbing body 501 is installed in a space formed between the inner surface of the cover 301 and the support column 303.
- the sound absorber 501 may have a structure specialized for frequency components close to the natural frequency of the apparatus main body 300.
- a sound absorber may be arranged around the entrance.
- a sound absorber may be disposed so as to surround the opening.
- the installation range of the sound absorber may be anywhere as long as it is within the range shown in FIG. 5, and Examples 2 to 5 are shown as specific examples.
- FIG. 6 shows a modification of the first embodiment shown in FIG. 5.
- a sound absorber 601 is attached to the inside of the cover near the opening 305.
- the sound absorbing surface 602 is installed so as to face inward.
- the sound absorbing surface is, for example, the surface on the surface plate 402 side in FIG. 4, and the inward direction is a state facing the space side where the sound is to be absorbed, that is, the space side where the apparatus main body 300 is installed.
- the state in which the sound absorber is disposed in the vicinity of the opening 305 indicates a state in which the sound absorber is disposed in a range in which the effect of absorbing external noise entering from the opening is achieved. It means a state where a part of the sound absorber faces at least a part.
- the sound absorber 501 may be arranged in any manner in a horizontal plane. That is, you may arrange
- FIG. 7 is one of the modifications of the first embodiment shown in FIG. 5, and in this example, a sound absorbing body is attached to a column constituting the gantry 303. Further, the sound absorbing surface 602 is installed so as to face the cover inner surface, that is, facing the cover 301.
- FIG. 8 is one of the modifications of the first embodiment shown in FIG. 5 and shows the cross section between the adjacent struts and the top view in FIG. 5 in an easy-to-understand manner.
- the sound absorber 801 is installed in a space formed between adjacent columns among the plurality of columns constituting the gantry 303.
- the sound absorbing body 801 is arranged in a wall shape so as to connect adjacent struts.
- the sound absorbing surface 802 of the sound absorbing body 801 faces the inner and outer surfaces of the space surrounded by the mount 303 as shown in FIG. 8, not only the sound wave entering from the opening 305 but also the column of the mount 50 is used. Since sound waves in the enclosed space are also absorbed, it is more effective. That is, the first sound absorbing surface of the sound absorbing body 801 having a plurality of sound absorbing surfaces is installed to face the inner surface of the cover 301, and the second sound absorbing surface is installed in the same direction as the inner surface of the cover 301. As a result, as shown in FIG. 8, the first sound absorbing surface and the second sound absorbing surface are installed in opposite directions.
- Embodiments 1 to 4 by installing the sound absorber having the natural frequency of the apparatus main body in the absorption band in the space formed between the inner surface of the cover and the column of the gantry, the opening that usually exists in the lower part of the cover The sound wave that leaks from the unit 305 can be absorbed by the sound absorber before reaching the main body of the frequency component close to the natural frequency of the apparatus main body 300. As a result, the vibration of the apparatus main body 300 is reduced and the image is reduced. It is possible to suppress obstacles.
- the sound absorber having the natural frequency of the apparatus main body in the absorption frequency band has been described.
- the sound absorber is not limited to the natural frequency as long as it is specialized for a specific frequency.
- FIG. 10 shows an example in which two sound absorbers having different functions are installed inside the soundproof cover.
- a soundproof cover such as a charged particle beam device
- an acoustic standing wave as shown in FIG. 9 is generated in a space surrounded by the cover 301.
- the generation of this acoustic standing wave is about 100 to 500 Hz, which is lower than the natural frequency of the charged particle beam apparatus main body 300 having the general cover 301 and load plate 302.
- the arrangement of the sound absorber specialized for the natural frequency of the device has been described. However, in the configuration described so far, the acoustic standing wave can be efficiently absorbed due to the difference in the sound absorption frequency. I can't.
- the thickness of the sound absorber installed there can be made thicker than the sound absorber described in the first to fourth embodiments. It is.
- a second sound absorber 1003 having a sound absorbing performance specialized for the frequency of the acoustic standing wave in the cover is installed inside the cover vertically above the load plate 302.
- the installation position of the second sound absorber 1003 may be anywhere as long as there is a space for installation inside the soundproof cover, but there are many cases where the space above the load plate is vacant as described above. It is good to install in the part which is an upper surface and is located above the surface which a load board makes. For example, it can be installed on the ceiling surface of the cover 301.
- the second sound absorbing body 1003 has an absorption frequency band different from that of the first sound absorbing body 1001 specialized in the natural frequency of the device, so that the opening diameter, the opening length, the hole area ratio, the size of the cavity portion, and the like. Is designed.
- the two sound absorbers having different functions are provided inside the cover in this manner, noises having different frequencies can be absorbed simultaneously, so that a higher sound absorbing effect can be expected. Further, the first sound absorber having a high frequency absorption frequency band is located near the opening 305 of the cover 301, and the second sound absorber having a low frequency absorption frequency band is located far from the opening 305 of the cover 301. By arranging, the sound absorber can be efficiently arranged in a limited space, and thus the entire apparatus can be saved in space.
- the second sound absorber 1003 has a structure specialized in the frequency of the acoustic standing wave, but is not limited to the acoustic standing wave, and may have a structure specialized in the frequency of another noise source.
- the sixth embodiment and the seventh embodiment will be described as another modification in accordance with the structure of a charged particle beam apparatus having a sample transport device 40 typified by a semiconductor measurement / inspection / observation apparatus.
- FIG. 11 shows a general charged particle beam apparatus having a cover 1101 and a sample transport device 1102.
- the cover 1101 has an opening 1103 in which one of the side surfaces is open.
- a gantry 1104 having a plurality of columns is arranged on the bottom surface of the cover 1101, and the charged particle beam apparatus main body 1100 is fixed on the gantry 1104 via a vibration isolation table 1105 and the like.
- the apparatus main body 1100 is covered with a cover in directions other than the opening 1103, and the sample loading / unloading unit 1106 is provided in the direction of the opening 1103.
- a sample transport apparatus 1102 that transports a sample to the inside of the apparatus main body 1100 via a sample carry-in / out section 1106.
- the opening 1103 is installed on the front side.
- FIG. 12 is an example in which a sound absorbing structure is attached to the charged particle beam apparatus having the cover and the sample transport apparatus 1102 described in FIG.
- the sound absorber 1201 is arranged so as to protrude from the wall surface on the side facing the opening 1103 of the sample transport apparatus 1102 to the apparatus main body 1100 side through the opening 1103. It has become.
- the sound absorbing surface 1202 is installed so as to be substantially perpendicular to the wall surface on the apparatus main body side of the sample transport device 1102 and substantially parallel to the ceiling surface or the floor surface of the cover 1101.
- the sound absorbing surface 1202 is disposed in the gap 1109 between the cover 1101 and the sample transport device 1102 so as to face the outside of the cover, so that it effectively absorbs noise entering from the outside of the gap 1109. be able to.
- the length of the sound absorbing surface 1202 in the direction perpendicular to the wall surface of the sample transport device 1102 on the apparatus main body is at least longer than the length of the gap 1109 in the same direction. It is necessary to be installed so as to protrude.
- a frequency component close to the natural frequency of the apparatus main body 1100 is transmitted to the apparatus main body 1100 with respect to the sound wave that leaks from the gap between the cover 1101 and the sample transport apparatus 1102 and enters the inside through the opening 1103. It can be absorbed by the sound absorber 1201 before reaching, and as a result, the vibration of the apparatus main body 1100 can be reduced and image disturbance can be suppressed.
- FIG. 13 is a three-dimensional representation of the state in which FIG. 12 is separated into the cover 1101 and the sample transport device 1102.
- FIG. 13 shows an example in which the sound absorber 1201 is attached to the sample transport device 1102, it may be formed integrally with the wall surface of the sample transport device. Further, the sound absorber 1201 may be fixed to the cover 1101 or the sample carry-in unit 1106. Further, the sound absorber 1201 may be fixed to the floor surface of the cover independently of the sample transport device 1102 and the cover 1101.
- FIG. 14 shows a second sound absorber 1403 having a sound absorbing performance specialized for the frequency of the acoustic standing wave generated in the cover, as compared with the sixth embodiment described in FIG. The example which installed is shown.
- the installation position of the second sound absorber 1403 is not limited to the ceiling surface of the cover 1101 and may be the side surface of the cover. Also in the present embodiment, by providing two sound absorbers having different functions in the cover as in the fifth embodiment, it is possible to absorb noise having different frequency bands and to expect a higher sound absorption effect.
- the sound absorbers can be arranged efficiently in a limited space inside the cover, Without significantly increasing the installation space and cost, it is possible to configure a soundproof cover that can be used in a charged particle beam device and has a high sound absorption effect.
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Abstract
Description
400 吸音体
Claims (21)
- 試料の画像を取得する走査電子顕微鏡を少なくとも有する装置本体と、
前記装置本体の周囲に配置されるカバーとを備え、
前記装置本体の固有周波数、または前記カバーの内部に発生する音響定在波の周波数を吸音周波数帯にもつ吸音体を前記カバーの内部に設けられたことを特徴とする荷電粒子線装置。 - 請求項1に記載の荷電粒子線装置において、
前記装置本体は、前記走査電子顕微鏡を支持する荷重板と、当該荷重板を支える複数の支柱を備えた架台とを備え、
前記吸音体は、前記カバーと前記支柱との間に配置されることを特徴とする荷電粒子線装置。 - 請求項2に記載の荷電粒子線装置において、
前記吸音体は、前記カバーの内側または前記支柱に設置されることを特徴とする荷電粒子線装置。 - 請求項2に記載の荷電粒子線装置において、
前記吸音体は、前記架台を形成する複数の支柱の間に配置されることを特徴とする荷電粒子線装置。 - 請求項1に記載の荷電粒子線装置において、
前記吸音体は、複数の吸音面を備えることを特徴とする荷電粒子線装置。 - 請求項1に記載の荷電粒子線装置において、
前記吸音体は、金属性材料からなることを特徴とする荷電粒子線装置。 - 請求項6に記載の荷電粒子線装置において、
前記吸音体は複数の開口部を有する多孔板を有し、
前記開口部の長さが可変であることを特徴とする荷電粒子線装置。 - 請求項6に記載の荷電粒子線装置において、
前記吸音体は複数の開口部を有する多孔板と、前記多孔板に対向して設けられる背面板と、前記多孔板と前記背面板の間に構成される空洞部を仕切る複数の仕切り板からなり、
前記仕切り板の間隔は前記吸音体の吸音周波数帯における音波の波長よりも短いことを特徴とする荷電粒子線装置。 - 請求項1に記載の荷電粒子線装置において、さらに、
前記装置本体の試料搬入出部に対向する位置に設置された試料搬送装置を備え、
前記カバーは、前記装置本体の試料搬入出部に対向する面に開口を有し、
前記吸音体は、前記試料搬送装置の前記装置本体側の壁面から前記開口を通って前記装置本体側に突出するよう配置されることを特徴とする荷電粒子線装置。 - 請求項9に記載の荷電粒子線装置において、
前記吸音体は、前記試料搬送装置の前記装置本体側の壁面に対して略垂直方向であって、前記カバーの天井面に対して略平行方向になるように設置されることを特徴とする荷電粒子線装置。 - 請求項9に記載の荷電粒子線装置において、
前記吸音体の吸音面は前記カバーの内面と対向するように設けられることを特徴とする荷電粒子線装置。 - 試料の画像を取得する走査電子顕微鏡を少なくとも有する装置本体と、
前記装置本体の側面および天井面を覆うように配置されるカバーとを備え、
前記カバーの内部に吸音周波数帯の異なる第一の吸音体と第二の吸音体を備えることを特徴とする荷電粒子線装置。 - 請求項12に記載の荷電粒子線装置において、
前記第一の吸音体は前記装置本体の固有周波数である第一の周波数領域を吸音周波数帯に持ち、前記第二の吸音体は前記カバーの内部に発生する音響定在波の周波数である第二の周波数領域を吸音周波数帯に持つことを特徴とする荷電粒子線装置。 - 請求項12に記載の荷電粒子線装置において、
前記装置本体は、前記走査電子顕微鏡を支持する荷重板と、当該荷重板を支える複数の支柱を備えた架台とを備え、
前記第一の吸音体が、前記カバーと前記支柱との間に配置されたことを特徴とする荷電粒子線装置。 - 請求項14に記載の荷電粒子線装置において、
前記第一の吸音体は、前記カバーの内側または前記支柱に設置されることを特徴とする荷電粒子線装置。 - 請求項14に記載の荷電粒子線装置において、
前記第一の吸音体が、前記架台を形成する複数の支柱の間に配置されることを特徴とする荷電粒子線装置。 - 請求項12に記載の荷電粒子線装置において、
前記第一の吸音体は、複数の吸音面を備えることを特徴とする荷電粒子線装置。 - 請求項14に記載の荷電粒子線装置において、
前記第一の吸音体は前記荷重板の下部に配置され、前記第二の吸音体は前記荷重板の上部に配置されることを特徴とする荷電粒子線装置。 - 請求項12に記載の荷電粒子線装置において、
前記第一の吸音体または前記第二の吸音体は、金属性材料からなることを特徴とする荷電粒子線装置。 - 請求項19に記載の荷電粒子線装置において、
前記第一の吸音体または前記第二の吸音体は、複数の開口部を有する多孔板を有し、
前記開口部の長さが可変であることを特徴とする荷電粒子線装置。 - 請求項19に記載の荷電粒子線装置において、
前記第一の吸音体または前記第二の吸音体は複数の開口部を有する多孔板と、前記多孔板に対向して設けられる背面板と、前記多孔板と前記背面板の間に構成される空洞部を仕切る複数の仕切り板からなり、
前記仕切り板の間隔は前記第一の吸音体または前記第二の吸音体の吸音周波数帯における音波の波長よりも短いことを特徴とする荷電粒子線装置。
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JP5838106B2 (ja) * | 2012-03-13 | 2015-12-24 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置用防音カバー及び荷電粒子線装置 |
JP6002561B2 (ja) * | 2012-12-05 | 2016-10-05 | 株式会社日立ハイテクノロジーズ | 電子顕微鏡 |
US9261852B2 (en) | 2014-02-27 | 2016-02-16 | Ricoh Company, Ltd. | Acoustic device, and electronic device and image forming apparatus incorporating same |
US10114299B2 (en) | 2014-06-05 | 2018-10-30 | Asml Netherlands B.V. | Lithographic apparatus |
JP2017050046A (ja) | 2015-08-31 | 2017-03-09 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
JP6633986B2 (ja) * | 2016-07-20 | 2020-01-22 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
JP7326256B2 (ja) | 2017-10-26 | 2023-08-15 | パーティクル・メージャーリング・システムズ・インコーポレーテッド | 粒子計測システム及び方法 |
JP6749544B2 (ja) * | 2018-08-10 | 2020-09-02 | 株式会社メルビル | カバー |
US11237095B2 (en) | 2019-04-25 | 2022-02-01 | Particle Measuring Systems, Inc. | Particle detection systems and methods for on-axis particle detection and/or differential detection |
CN114729868A (zh) | 2019-11-22 | 2022-07-08 | 粒子监测系统有限公司 | 先进的用于干涉测量颗粒检测和具有小大小尺寸的颗粒的检测的系统和方法 |
JP7360308B2 (ja) | 2019-11-25 | 2023-10-12 | キヤノン株式会社 | 露光装置、露光方法、および物品製造方法 |
DE102021114238A1 (de) | 2021-06-01 | 2022-12-01 | Allgaier Werke Gmbh | Schallabsorber für industrielle Maschinen |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001306078A (ja) * | 2000-04-20 | 2001-11-02 | Jeol Ltd | 精密機器の遮音装置 |
JP2005018042A (ja) * | 2003-05-30 | 2005-01-20 | Kobe Steel Ltd | 多孔質防音構造体 |
JP2006079870A (ja) * | 2004-09-08 | 2006-03-23 | Hitachi High-Technologies Corp | 荷電粒子線装置 |
JP2007226216A (ja) * | 2006-02-01 | 2007-09-06 | Fei Co | 装置を内部に含む音響遮断用の筐体 |
JP2008052946A (ja) * | 2006-08-23 | 2008-03-06 | Jeol Ltd | ビーム応用装置 |
JP2009016283A (ja) * | 2007-07-09 | 2009-01-22 | Hitachi High-Technologies Corp | Guiを備えた電子顕微鏡及びそのノイズ除去方法 |
WO2011158458A1 (ja) * | 2010-06-16 | 2011-12-22 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置および防音カバー |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2744680C2 (de) * | 1977-09-30 | 1979-11-22 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Korpuskularstrahloptisches Gerät mit einem in mindestens einem Lager sitzenden Objekthalter |
JPS595179B2 (ja) * | 1979-05-18 | 1984-02-03 | 富士通株式会社 | 真空機器の防振構造 |
US5179516A (en) * | 1988-02-18 | 1993-01-12 | Tokkyo Kiki Kabushiki Kaisha | Variation control circuit having a displacement detecting function |
US5765800A (en) * | 1995-10-04 | 1998-06-16 | Ebara Corporation | Vibration damping apparatus |
JPH10208679A (ja) * | 1997-01-27 | 1998-08-07 | Hitachi Ltd | 荷電粒子線装置 |
JP3825869B2 (ja) * | 1997-03-19 | 2006-09-27 | キヤノン株式会社 | 能動除振装置 |
JP5308006B2 (ja) | 2006-11-02 | 2013-10-09 | 株式会社神戸製鋼所 | 吸音構造体 |
EP2091062A1 (en) * | 2008-02-13 | 2009-08-19 | FEI Company | TEM with aberration corrector and phase plate |
JP5364462B2 (ja) * | 2009-06-19 | 2013-12-11 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
-
2010
- 2010-11-09 JP JP2010250386A patent/JP5537386B2/ja active Active
-
2011
- 2011-10-14 US US13/883,764 patent/US8822952B2/en active Active
- 2011-10-14 WO PCT/JP2011/005748 patent/WO2012063406A1/ja active Application Filing
- 2011-10-14 DE DE112011103712T patent/DE112011103712T5/de not_active Ceased
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001306078A (ja) * | 2000-04-20 | 2001-11-02 | Jeol Ltd | 精密機器の遮音装置 |
JP2005018042A (ja) * | 2003-05-30 | 2005-01-20 | Kobe Steel Ltd | 多孔質防音構造体 |
JP2006079870A (ja) * | 2004-09-08 | 2006-03-23 | Hitachi High-Technologies Corp | 荷電粒子線装置 |
JP2007226216A (ja) * | 2006-02-01 | 2007-09-06 | Fei Co | 装置を内部に含む音響遮断用の筐体 |
JP2008052946A (ja) * | 2006-08-23 | 2008-03-06 | Jeol Ltd | ビーム応用装置 |
JP2009016283A (ja) * | 2007-07-09 | 2009-01-22 | Hitachi High-Technologies Corp | Guiを備えた電子顕微鏡及びそのノイズ除去方法 |
WO2011158458A1 (ja) * | 2010-06-16 | 2011-12-22 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置および防音カバー |
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