WO2012056806A1 - 発電装置、熱発電方法および太陽光発電方法 - Google Patents
発電装置、熱発電方法および太陽光発電方法 Download PDFInfo
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Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S10/00—PV power plants; Combinations of PV energy systems with other systems for the generation of electric power
- H02S10/30—Thermophotovoltaic systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/054—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
- H01L31/0543—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means comprising light concentrating means of the refractive type, e.g. lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/054—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
- H01L31/0547—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means comprising light concentrating means of the reflecting type, e.g. parabolic mirrors, concentrators using total internal reflection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/52—PV systems with concentrators
Definitions
- the present invention relates to an apparatus for generating electric power using heat source and solar energy, and more particularly to a small-sized electric generator having high conversion efficiency.
- Patent Documents 1 to 3 disclose thermoelectric conversion elements that convert thermal energy into electrical energy. These thermal conversion elements have a configuration in which a p-type semiconductor material and an n-type semiconductor material are joined by a metal or the like. When the junction is heated, electric power is generated by the Seebeck effect. Bi-Te based materials are used as the p-type and n-type semiconductor materials.
- Non-Patent Documents 1 to 3 solar cells using silicon semiconductors or compound semiconductors are disclosed as devices for converting solar energy into electrical energy.
- Patent Document 4 discloses a solar heat collecting power generation technology that converts sunlight into heat, vaporizes water with the heat, and rotates a turbine to generate power.
- a receiver in which a heat medium (sodium nitrite 40%, sodium nitrate 7%, potassium nitrate 53%) is arranged, and sunlight is collected to collect light.
- a heat medium sodium nitrite 40%, sodium nitrate 7%, potassium nitrate 53%) is arranged, and sunlight is collected to collect light.
- a heliostat or the like is used.
- JP-A-8-111546 Japanese Patent Laid-Open No. 11-317547 JP 2005-260089 A International Publication WO2009 / 104347
- thermoelectric conversion elements described in Patent Documents 1 to 3 since the figure of merit of the semiconductor material is not high, the efficiency of converting heat into electricity can be obtained only about several percent to 10%.
- Bi and Te are expensive and are toxic heavy metals, which increases the cost of the thermoelectric conversion element and has a large environmental load.
- Non-Patent Documents 1 to 3 have a power generation efficiency of 20%, and the solar cells using compound semiconductors still have a power generation efficiency of 30%.
- the silicon semiconductor solar cells described in Non-Patent Documents 1 to 3 have a power generation efficiency of 20%, and the solar cells using compound semiconductors still have a power generation efficiency of 30%.
- the solar cells using compound semiconductors still have a power generation efficiency of 30%.
- a large number of different types of compound semiconductor films having different band gaps are stacked, and thus manufacturing costs are increased.
- the solar thermal power generation system described in Patent Document 4 has a large-scale device configuration.
- the power generation efficiency is less than 30%, which increases the power generation cost.
- An object of the present invention is to provide a power generator that is small and has high power generation efficiency.
- the following power generator is provided. That is, a power generation device having a heat-light conversion element that converts heat into infrared light and a semiconductor power generation cell that converts infrared light into electrical energy, wherein the heat-light conversion element has a wavelength greater than a predetermined infrared wavelength. It contains a material having a higher reflectance on the long wavelength side than that on the short wavelength side, and emits infrared light when the material is heated.
- heat is converted into infrared light having a predetermined wavelength, and the infrared light is converted into electrical energy by the semiconductor power generation element, so loss due to Stokes shift can be reduced. Therefore, power generation can be performed with high efficiency.
- the graph for showing the principle of the infrared-light radiation of the material which has the predetermined reflective characteristic of this invention The graph which shows the Stokes shift at the time of converting sunlight and infrared light into electrical energy with a semiconductor power generation cell.
- 1 is a cross-sectional view of a thermoelectric generator according to Embodiment 1.
- FIG. 1 is a perspective view of a thermoelectric generator according to Embodiment 1.
- FIG. The perspective view which shows the state which fixed the multiple thermoelectric generator of Embodiment 1 to the heat source, and connected the several thermoelectric generator in series.
- FIG. The graph which shows the infrared-light spectrum which the thermoelectric conversion element of the thermoelectric generator of Embodiment 1 radiates
- FIG. 1 is a block diagram showing a configuration of a thermoelectric generator system according to Embodiment 1.
- FIG. The block diagram which shows the structure of the solar power generation device of Embodiment 2.
- FIG. Sectional drawing of the heat-light conversion element of the solar power generation device of FIG.
- the block diagram which shows the structure of the solar power generation device of Embodiment 3.
- FIG. Sectional drawing of the heat-light conversion element of the solar power generation device of FIG.
- the graph which shows the measurement result of the power generation efficiency of the solar power generation device of Embodiment 2,3.
- the graph which shows the reflective characteristic of the infrared radiation material of FIG. The graph which shows the wavelength dependence of the refractive index and extinction coefficient (absorption rate) of the cermet film
- membrane of FIG. The graph which shows the reflection characteristic at the time of laminating
- the graph which shows the reflective characteristic of a graphite compound which equips the surface with the micro uneven structure of this embodiment The graph which shows the reflective characteristic of a graphite compound which equips the surface with the micro uneven structure of this embodiment.
- a power generator according to an embodiment of the present invention will be described.
- a material whose reflectance on the long wavelength side is higher than the reflectance on the short wavelength side than the predetermined infrared wavelength emits infrared light of the predetermined infrared wavelength when heated This material (hereinafter referred to as infrared radiation material) is used for the heat-light conversion element. Heat is converted into infrared light by heating the infrared radiation material. The converted infrared light is converted into electrical energy by a semiconductor power generation cell having a band gap in the infrared region.
- the cutoff wavelength on the long wavelength side of the emissivity is a wavelength at which the emissivity rapidly decreases as the wavelength increases and becomes an emissivity of 0 in the graph of the wavelength dependence of emissivity.
- the cut-off wavelength may be obtained by extrapolating the slope curve.
- Infrared radiation material is an ideal black body with the long-wavelength cut-off wavelength of the emissivity at the temperature of the infrared radiation material at the time of radiation It is designed to be positioned on the longer wavelength side than the cutoff wavelength on the shorter wavelength side of the radiation. As a result, infrared light having a wavelength band equal to or longer than the cutoff wavelength on the short wavelength side of black body radiation and equal to or shorter than the longer wavelength side cutoff wavelength of the emissivity of the infrared radiation material is emitted.
- the cut-off wavelength on the short wavelength side of black body radiation is a wavelength at which the spectrum intensity sharply decreases and the spectrum intensity becomes 0 as the wavelength becomes shorter in the black body radiation spectrum. Because of the Planck's radiation law, the spectral intensity is never completely zero, so here, for convenience, a wavelength that is 1/100 or less of the blackbody radiation spectral peak intensity is a short wavelength where the spectral intensity is zero. (If the measured value is to be evaluated, the cut-off wavelength may be obtained by covering the slope curve of the spectrum.)
- the infrared light spectrum emitted from the infrared radiation material of the heat-light conversion element is longer than the ideal black body radiation spectrum wavelength at the temperature of the infrared radiation material at the time of radiation. Since light (long wavelength infrared light) longer than the cutoff wavelength on the wavelength side can be completely suppressed, by setting this cutoff wavelength to the same value as the energy gap of the semiconductor power generation cell, It is possible to convert and absorb heat into infrared light having an energy gap or more with an efficiency of approximately 100%.
- the infrared light emitted from the heat-light conversion element of the present invention is efficiently absorbed by the semiconductor power generation cell. Can be converted into electrical energy with high efficiency.
- the heat-light conversion element and the semiconductor power generation cell are disposed to face each other with a space therebetween, and the space is decompressed to a predetermined degree of vacuum. Thereby, it is possible to prevent the energy of the heat-light conversion element from being lost due to air convection heat transfer.
- the heating method of the heat-light conversion element may be any method.
- Thermoelectric power generation can be performed by transferring heat to the thermo-optic conversion element by heat conduction or radiation.
- solar power generation can be performed by irradiating the heat-light conversion element with sunlight and heating the heat-light conversion element.
- the heat-light conversion element can be fixed on the substrate, and heat can be conducted to the heat-light conversion element through the substrate.
- a condensing optical system that collects sunlight toward the heat-light conversion element is arranged.
- Examples of the infrared radiation material having the above-described reflectance characteristics of the heat-light conversion element include a metal oxide laminate, a cermet film (for example, a cermet film in which tungsten fine particles are dispersed in magnesium oxide), and a surface.
- a graphite compound having a concavo-convex structure (for example, one having a periodic micrometer order concavo-convex structure and a periodic nanometer order concavo-convex structure) can be used.
- the surface of these infrared radiation materials may be provided with an antireflection film.
- a tin oxide layer or a film of a low refractive index material containing MgF 2 can be used as the antireflection film.
- the heat-light conversion element is heated by sunlight, and is converted into infrared light by the heat-light conversion element with high efficiency.
- the converted infrared light is led to a semiconductor power generation cell (solar cell) and converted into electrical energy.
- solar cell semiconductor power generation cell
- sunlight can be converted into electric energy with high efficiency using a semiconductor power generation cell having a band gap in the infrared light region.
- a material (infrared radiation material) having a predetermined reflection characteristic is used for a heat-light conversion element that converts sunlight into infrared light.
- the predetermined reflection characteristic is a high reflectance (ideally a reflectance close to 100%) in which a light reflectance of a predetermined wavelength or more is a predetermined reflectance or more, and reflects light having a wavelength shorter than the predetermined wavelength.
- the reflectivity is a low reflectivity (ideally a reflectivity of approximately 0%) below a predetermined reflectivity.
- the infrared radiation material of FIG. 1 has a reflectance of approximately 100% for a wavelength region of 3 ⁇ m or more, and a reflectance of approximately 0% for a wavelength region of 2 ⁇ m or less. That is, the reflectance graph 10 decreases rapidly as the wavelength is shortened in the vicinity of the wavelength from 3 ⁇ m to 2 ⁇ m, and the cutoff wavelength ⁇ Rcutoff obtained by extrapolating the slope curve of the graph is about 2 ⁇ m. As shown in FIG.
- the spectrum of sunlight is generally located in the wavelength region of 300 nm to 1500 nm, so that the cutoff wavelength of the reflectance of the infrared radiation material is longer than the long wavelength side end (1500 nm) of the spectrum of sunlight.
- ⁇ Rcutoff about 2 ⁇ m is located on the longer wavelength side. Therefore, when this infrared radiation material is irradiated with sunlight, it can be absorbed almost 100% without reflecting sunlight. The infrared radiation material is heated by the absorbed solar energy.
- the infrared radiation material When the infrared radiation material is placed in a vacuum, the heat of the infrared radiation material is not dissipated in the air, so the infrared radiation material absorbs the absorbed solar energy with the efficiency of approximately 100% as shown by the thick solid line in FIG. Radiates as infrared light of spectrum 11 as shown in the graph. That is, the infrared radiation material is heated by sunlight and can convert heat into infrared light. This principle is based on Kirchhoff's law in blackbody radiation. This will be further described.
- P (total) P (conduction) + P (radiation) (1)
- P (total) the total input energy
- P (conduction) the energy lost through the substrate contact body, such as the substrate support
- P (radiation) the substrate heated. It is the energy lost by radiating light to the external space at temperature.
- Equation (2) the term of P (radiation) in the equation (1) can be expressed by the following equation (2).
- ⁇ ( ⁇ ) is the emissivity at each wavelength
- ⁇ ⁇ 5 / (exp ( ⁇ / ⁇ T) ⁇ 1) is Planck's radiation law
- ⁇ 3.747 ⁇ 10 8 W ⁇ m 4 / m 2
- ⁇ 1.4387 ⁇ 10 4 ⁇ mK.
- ⁇ ( ⁇ ) can be expressed as reflectance R ( ⁇ ) by the following equation (3) according to Kirchhoff's law.
- the emissivity ⁇ ( ⁇ ) is expressed by 1 ⁇ R ( ⁇ ) from the above equation (3).
- a heat radiation state in which a material having an emissivity ⁇ ( ⁇ ) of approximately 0% in an infrared light region having a wavelength of 3 ⁇ m or more and approximately 100% in a wavelength region of 2 ⁇ m or less in a vacuum is heated in the following (4 ) Expression.
- ⁇ ( ⁇ 0 ) is a function indicating a step-like behavior that is almost 0 from the long wavelength to the predetermined wavelength ⁇ 0 and takes 1 in the region from the predetermined wavelength ⁇ 0 to the short wavelength. is there.
- the obtained radiation spectrum has a shape obtained by convolving the step function emissivity and the black body radiation spectrum 13 (thick broken line graph in FIG. 1), and the calculation result is the spectrum 11 in FIG. That is, the infrared radiation spectrum 11 radiated from the infrared radiation material is a region surrounded by the cutoff region on the long wavelength side of the change curve 12 of the emissivity ⁇ ( ⁇ ) and the black body radiation spectrum 13. And a wavelength band between the short wavelength cutoff wavelength ⁇ Bcutoff of blackbody radiation and the long wavelength cutoff wavelength ⁇ ⁇ cutoff of emissivity .
- solar energy located at a wavelength of 300 nm to 1500 nm is once converted into infrared radiation, and the infrared radiation is converted into electrical energy by the semiconductor power generation cell.
- the difference referred to as Stokes shift
- a semiconductor power generation cell absorbs all of solar energy having a wavelength of 300 nm to 1500 nm
- a semiconductor having a band gap in the vicinity of a wavelength of 1500 nm for example, a power generation cell of an InGaAs semiconductor (short wavelength) is used.
- the band gap energy at a wavelength of 1500 nm is about 0.8 eV, and as shown in FIG. 2, the energy difference (Stokes shift) from sunlight with a wavelength of 300 nm (band gap energy 4.1 eV) becomes large, resulting in a large loss. That is, a semiconductor power generation cell having a band gap energy of about 0.8 eV can only absorb 0.8 eV of high energy ultraviolet light (wavelength 300 nm, band gap energy 4.1 eV) included in sunlight.
- infrared radiation (spectrum 11 in FIG. 1) is generated by sunlight using an infrared radiation material having a predetermined reflectance characteristic as shown by the change curve 10 in FIG.
- the wavelength of this infrared radiation light is in the range of 0.5 to 1 eV as shown in FIG. 2, and thus, for example, semiconductor (InGaAs semiconductor (long wavelength)) power generation having a band gap energy of 0.5 eV
- semiconductor InGaAs semiconductor (long wavelength)
- the Stokes shift loss can be suppressed to about 0.5 eV at the maximum.
- a straight line 31 indicates an energy loss due to heat conduction of the substrate supporting the infrared radiation material
- a curve 32 indicates a total energy loss due to infrared radiation and heat conduction.
- the sunlight energy is mostly used to increase the temperature of the substrate that supports the infrared radiation material. .
- the radiation loss is suppressed in the low temperature region and the input energy is used to increase the temperature of the substrate due to the emissivity ⁇ characteristic of the infrared radiation material in FIG.
- the temperature of the substrate and the infrared radiation material increases.
- it enters an energy region in which infrared light can be radiated region in which the reflectance at a wavelength of 2 ⁇ m or less in FIG.
- the energy obtained as the infrared radiation is obtained by subtracting the straight line 31 corresponding to the loss due to heat conduction from the curve 32 in FIG. 3, and is the amount indicated by the length of the dotted arrow 33 in FIG. This result clearly shows that the higher the temperature, the greater the proportion of infrared radiation.
- thermoelectric generator Next, the principle of the thermoelectric generator of the present invention will be described.
- the solar power generation device described above is configured to heat infrared radiation material of the heat-light conversion element by sunlight and emit infrared light, but the thermoelectric power generation device directly transfers heat to the infrared radiation material, Infrared light is emitted.
- any method such as heat conduction or radiation may be used.
- heat conduction a heat-light conversion element is brought into close contact with a heat source, and heat energy is transferred to the infrared radiation material by heat conduction and heated.
- the infrared radiation material as already described with reference to FIG. 2 in the principle of the solar power generation device, a material having a reflectance higher on the longer wavelength side than a predetermined infrared wavelength than the reflectance on the shorter wavelength side is used. Use. Thereby, the infrared radiation spectrum 11 of FIG. 1 can be radiated.
- thermoelectric generators unlike solar power generators, it is not necessary to set the cutoff wavelength ⁇ Rcutoff of the reflectance of the infrared radiation material according to the sunlight spectrum because it is not heated by sunlight.
- the reflectance cutoff wavelength ⁇ Rcutoff is shifted to the short wavelength side.
- the cutoff wavelength lambda Rcutoff reflectance is set to 8 [mu] m
- the case of 1000 ° C. the heat source to set the cut-off wavelength lambda Rcutoff of reflectance 2.5 [mu] m.
- the energy gap of the cells that can efficiently generate power at room temperature is located at a short wavelength of about 1500 nm or less as described in the solar power generation apparatus.
- the high-temperature heat source that emits can generate power more efficiently than the low-temperature heat source.
- thermoelectric generator of the present invention heats the infrared radiation material of the heat-light conversion element by the heat source, emits infrared light, and converts the infrared light into electricity by the semiconductor power generation cell. Generate electricity.
- thermoelectric generator of the present invention will be described with reference to FIGS. 4 is a cross-sectional view of the thermoelectric generator 50, and FIG. 5 is a perspective view.
- FIG. 6 is a perspective view showing a state in which the thermoelectric generator 50 is fixed to the heat source 51.
- thermoelectric generator of the present invention includes the thermo-optic conversion element 2 and the semiconductor power generation cell 3 that are arranged to face each other, a vacuum vessel 11 that seals the periphery thereof, and a reflective film 7 that is arranged on the inner wall of the vacuum vessel 11. ing.
- the heat-light conversion element 2 includes a base material 20 and an infrared radiation material layer 21 mounted on the surface of the base material 20 on the semiconductor power generation cell 3 side as described in FIG.
- the infrared radiation material layer 21 has an infrared radiation having a reflection characteristic in which the reflectance on the longer wavelength side than the predetermined infrared wavelength is higher than the reflectance on the short wavelength side. It is composed of materials. It is particularly desirable that the reflectance on the shorter wavelength side than the predetermined infrared wavelength is 5% or less, and the reflectance on the longer wavelength side than the predetermined wavelength is 95% or more.
- the infrared radiation material layer 21 is a single layer or a multilayer structure of an infrared radiation material, and emits infrared light with high efficiency when heated.
- the material (infrared radiation material) layer 21 whose reflectivity (emissivity) changes in a stepwise manner as described above, (i) a laminate of one or more metal oxides, (ii) oxide or nitridation
- a thin film (so-called cermet film) containing fine particles of metal or semiconductor, (iii) a graphite compound substrate having a fine concavo-convex structure on the surface, or the like can be used.
- the base material 20 can be made of a highly heat conductive material (for example, W or Cu).
- the semiconductor power generation cell 3 uses a cell having an energy gap close to the infrared wavelength emitted by the infrared radiation material layer 21 of the heat-light conversion element 2 in order to reduce the Stokes shift.
- a cell having an energy gap close to the infrared wavelength emitted by the infrared radiation material layer 21 of the heat-light conversion element 2 in order to reduce the Stokes shift.
- an InGaAs semiconductor power generation cell having an energy gap of about 2.5 ⁇ m is used.
- the reflective film 7 plays a role of reflecting the infrared light emitted by the heat-light conversion element 2 and entering the semiconductor power generation cell 3.
- an Au film, an Ag film, a dielectric multilayer film, or the like can be used as the reflective film 7.
- the actual degree of vacuum is about 10 ⁇ 3 to 10 ⁇ 4 Pa.
- the vacuum vessel 11 is made of a material that has a low thermal conductivity and can withstand the high temperature of the heat source (for example, a metal such as quartz glass, a low thermal conductivity aluminum sintered body, a low thermal conductivity stainless steel material). Further, by depositing the getter 6 on the tube wall, it is possible to maintain the degree of vacuum inside for a long period of time, thereby extending the life of the thermoelectric generator. Further, when the reflective film 7 includes a Ti film, Ti has a getter function, so that it can also be used as a getter.
- the size of the semiconductor power generation cell 3 is approximately the same as that of the heat-light conversion element 2, but the area of the upper surface of the semiconductor power generation cell 3 is that of the heat-light conversion element 2 as shown in FIG. 8. It may be smaller than the area of the lower surface.
- the infrared light emitted from the heat-light conversion element 2 can be condensed on the semiconductor power generation cell 3 by making the vacuum vessel 11 hemispherical.
- thermoelectric generator 50 The operation of each part of the thermoelectric generator 50 in FIG. 4 will be described.
- the one or more thermoelectric generators 50 are fixed to the heat source 51 with a high heat conductive material (for example, ceramic paste) so that the heat conversion element 2 is in close contact with the heat source 51.
- the heat of the heat source 51 is conducted to the infrared radiation material layer 21 to heat the infrared radiation material layer 21.
- the heated infrared radiation material layer 21 emits infrared light having a predetermined wavelength with high efficiency. Infrared light is irradiated directly or on the inner wall of the vacuum vessel 1 to irradiate the semiconductor power generation cell 3.
- FIG. Comparing FIG. 9 and FIG. 10 the peak wavelength of the infrared light spectrum emitted by the infrared radiation material layer 21 of the present invention is closer to the absorption band 81 of the semiconductor power generation cell 3 than the black body radiation spectrum. Therefore, it can be seen that the area of the spectrum overlapping with the band 81 is large and is efficiently absorbed.
- FIG. 11 shows, for each temperature, the power generation efficiency of the thermoelectric generator of the present invention and the power generation efficiency of the thermoelectric generator using the black body radiation material instead of the infrared radiation material layer.
- the thermoelectric generator of the present invention is 100 times more efficient in the low temperature region of 400 ° C. and more than three times more effective in the high temperature region of 700 ° C. than the thermoelectric generator using the black body radiation material. I understand that.
- thermoelectric generators 50 are fixed in advance on a single substrate 52 with a high thermal conductivity material, and the substrate 52 is fixed to the heat source 51 with a high thermal conductivity material. It is also possible to do.
- a power generation system 66 can be configured by sequentially connecting a booster 61, a DC / AC converter 62, and a protection and switching circuit 63 to one or more thermoelectric generators 50.
- the booster circuit 61 boosts the voltage of DC power extracted from one or more thermoelectric generators 50 to a predetermined voltage (for example, 100 V).
- the DC / AC converter 62 converts the power boosted by the booster circuit 61 into AC power having a predetermined frequency (for example, 50 Hz or 60 Hz).
- the protection and switching circuit 63 selectively supplies this AC power to one of the load circuit 64 and the power company transmission line 65, or supplies surplus power from the load circuit 64 to the transmission line 65.
- the electric power generated by the power generation system 66 can be used by supplying it to a predetermined load circuit in a factory or home where the power generation system 66 is disposed. It can also be supplied to the power company's transmission line 65 for sale.
- the protection and switching circuit 63 is not only a switching operation, but also serves as a protective relay that protects the power generation system 66 by separating it from the load circuit 64 and the transmission line 65 when an abnormal large current flows through the load circuit 64 or the transmission line 65. Also works.
- thermoelectric generator 50 of the present invention since one size is the size of the thermoelectric generator 2 and the semiconductor power generation cell 3, a plurality of these can be used to form a small power generation system 66.
- thermoelectric generator 50 can be attached to a heat source of various sizes from a small heat source to a large heat source, it is possible to generate power with high efficiency by using a difficult heat source that can be used as a heat source for power generation using a conventional steam turbine.
- the thermoelectric generator 50 can be fixed to the side wall of a blast furnace or a waste incinerator and power can be generated by surplus heat.
- thermoelectric generator since it is a principle that uses infrared light radiation, waste that becomes an environmental burden such as exhaust gas does not occur in the process of power generation, and an environment-friendly thermoelectric generator can be provided.
- Embodiment 2 As Embodiment 2, the structure of the solar power generation device of the present invention will be described with reference to FIG.
- the solar power generation device of FIG. 13 includes a vacuum vessel 1 whose inner wall surface is a spheroid shape, and a heat-light conversion element 2 and a semiconductor power generation cell 3 that are respectively arranged at an elliptical focal position in the internal space of the vacuum vessel 1. ing.
- a window 4 for transmitting sunlight is disposed on one wall surface on the long axis of the vacuum vessel 1.
- the window 4 is preferably formed of a material that transmits the sunlight spectrum in a wide range including the ultraviolet light region having a large energy.
- the window 4 made of quartz glass is used.
- a lens 5 is disposed outside the vacuum vessel 1 at a position facing the window 4.
- the lens 5 collects sunlight on the heat-light conversion element 2.
- a lens 5 having a condensing magnification of 20 times or more is used as the lens 5, and a polycarbonate lens having a high transmittance is used as the material.
- the aperture diameter of the window 4 is designed to a size that does not block the light beam collected by the lens 5 in consideration of the aperture and magnification of the lens 5.
- the inner wall of the vacuum vessel 1 is covered with a reflective film 7.
- a short circuit that transmits approximately 100% of sunlight inside the window 4 and reflects approximately 100% of the infrared light generated from the infrared radiation material 21.
- a pass filter may be coated. This can be realized by a generally used dielectric multilayer coating method.
- the material of the reflective film 7 and the degree of vacuum of the vacuum container 1 are the same as in the first embodiment.
- the operation of the getter 6 is the same as that of the first embodiment.
- the heat-light conversion element 2 includes a base material 20, an infrared radiation material layer 21 mounted on each of the upper surface and the lower surface of the base material 20, and the infrared radiation material layer 21. And an antireflection layer 22 laminated thereon.
- the structure of the infrared radiation material layer 21 is the same as that of the first embodiment. A configuration without the antireflection layer 22 is also possible. Since the heat-light conversion element 2 and the semiconductor power generation cell 3 are respectively arranged at the focal positions of the spheroid vacuum container 1, infrared light emitted from both surfaces of the heat-light conversion element 2 The light is reflected by the inner wall and collected on the semiconductor power generation cell 3.
- the infrared radiation material constituting the infrared radiation material layer 21 has reflection characteristics similar to those of the infrared radiation material of the first embodiment. Further, in order to absorb the sunlight spectrum with high efficiency, The reflectance R ( ⁇ ) is lower on the short wavelength side than the vicinity of the predetermined wavelength ⁇ 0 at the end of the long wavelength region. Reflectance on the short wavelength side of the predetermined wavelength lambda 0 is 5% or less, the reflectance on the long wavelength side of the predetermined wavelength lambda 0 is particularly preferably 95% or more.
- the predetermined wavelength ⁇ 0 is set to a wavelength between 1 ⁇ m and 5 ⁇ m.
- a metal oxide laminate, a cermet film, a graphite compound substrate having a fine uneven structure, and the like can be used. It will be described later.
- the semiconductor power generation cell 3 uses a cell having an energy gap close to the infrared wavelength emitted by the heat-light conversion element 2 in order to reduce the Stokes shift.
- an InGaAs semiconductor power generation cell having an energy gap of about 2.5 ⁇ m is used.
- the size of the semiconductor power generation cell 3 is set to the same size as the heat-light conversion element 2. Infrared light is reflected by the inner wall of the vacuum vessel 1 and condensed on the heat-light conversion element 2, so that the surface image of the heat-light conversion element 2 is just mapped onto the upper surface of the semiconductor power generation cell 3. is there.
- it is about 1 cm 2 as an example.
- Sunlight is collected by the lens 5, passes through the window 4, and is collected on the upper surface of the heat-light conversion element 2.
- the light passes through the antireflection layer 22 and reaches the infrared radiation material layer 21.
- the heat-light conversion element 2 disposed inside the vacuum vessel 1 is designed to reduce energy loss due to heat conduction, it is heated to a high temperature by sunlight.
- the infrared radiation material layer 21 having a predetermined reflection characteristic radiates infrared light having a predetermined wavelength with high efficiency as described with reference to FIGS. 1 and 3.
- the infrared light spectrum is a spectrum with a tail on the short wavelength side as shown in FIGS.
- Infrared light respectively emitted from the infrared radiation material layers 21 on both surfaces of the heat-light conversion element 2 is reflected by the reflection film 7 on the inner wall of the vacuum vessel 1 and is disposed at the focal point of the elliptical rotator 1.
- 3 is condensed on the upper surface of the substrate. Since the semiconductor power generation cell 3 has an energy gap close to the emitted infrared light, it efficiently absorbs infrared light and generates power. The converted electricity can be taken out from the terminals 3a and 3b.
- Embodiment 3 As Embodiment 3, the photovoltaic power generation apparatus of FIG. 15 will be described.
- the vacuum vessel 101 of Embodiment 3 is spherical, and the heat-light conversion element 102 and the semiconductor power generation cell 3 are respectively located at 1 / 4a and 4 / 4a from the window 4 in the optical axis direction as shown in FIG. Has been placed. That is, the semiconductor power generation cell 3 is arranged on the wall surface of the vacuum vessel 101. This position is a position obtained from paraxial ray approximate calculation. Thereby, the infrared light radiated from the heat-light conversion element 102 can be reflected by the inner wall of the vacuum vessel 101 and condensed on the semiconductor power generation cell 3.
- the heat-light conversion element 102 includes the infrared radiation material layer 21 and the antireflection layer 22 only on the upper surface side (side facing the window 4) of the base material 20.
- the vacuum vessel 101 is spherical, so that infrared light radiated from the lower surface side cannot be condensed on the semiconductor power generation cell 3.
- the lower surface of the substrate 20 is coated with a material layer 120 having a low emissivity over the entire wavelength region, for example, an Ag layer, in order to suppress radiation loss due to black body radiation from the lower surface of the substrate 20. ing.
- the geometric shape of the vacuum vessel is not limited to these and is not limited.
- Various objects such as an object surface rotating body can be used.
- the efficiency ⁇ can be obtained from the infrared radiation spectrum S (x) (here, x is energy) emitted from the infrared radiation material layer 21 and the following equation (5) as shown in FIG.
- cells having high band gap energy and low band gap energy may be stacked as in the case of a compound semiconductor power generation cell conventionally used.
- a conversion efficiency of nearly 90% it is possible to obtain a conversion efficiency of nearly 90%.
- a single junction cell (InGaAs) was used with a solar simulator at AM 1.5 (100 mW / cm 2 irradiation intensity) and a light collection magnification of 10 times.
- the discrepancy between the conversion efficiency (42.3%) of the experimental result and the theoretically predicted conversion efficiency (54.6%) described above is due to the reflection loss (3%) at the condenser lens 5 and the vacuum container. 1 incident loss (3%), reflection loss of solar infrared conversion element 2 (2%), light guide / reflection loss (5%) in reflection film 7, reflection loss on semiconductor power generation cell 3 (5) %) And the wavelength dependency (5%) of the spectral sensitivity characteristics of the semiconductor power generation cell.
- the reflection loss at the condenser lens 5 (5%), the incident loss to the vacuum vessel 1 (3%), the light guide / reflection loss (5%) in the reflective film 7 and the semiconductor power generation cell 3
- the reflection loss (5%) can be reduced to approximately 0% by adopting a non-reflective coating or optimizing the geometric shape of the vacuum vessel 1.
- the reflection loss on the semiconductor power generation cell 3 can be reduced to approximately 0% by using a texture structure or the like generally used in the solar cell technology.
- thermoelectric generator 2 of the first embodiment thermoelectric generator 2 of the first embodiment
- thermoelectric generator 2 of the solar power generator of the second and third embodiments thermoelectric generator 2 of the solar power generator of the second and third embodiments
- an infrared radiation material layer 21 is formed by sequentially laminating a CrO layer as an infrared radiation material layer 21 and a SnO 2 layer as an antireflection film 22 on a base material 20.
- a CrO layer as an infrared radiation material layer 21
- a SnO 2 layer as an antireflection film 22
- Cu is used as the base material
- the film thickness of the CrO layer that is the infrared radiation material layer 21 is about 100 nm
- the film thickness of the SnO 2 layer that is the antireflection film 22 is about 50 nm.
- the wavelength ⁇ Rcutoff at which the reflectance changes stepwise can be changed.
- Example 2 of infrared radiation material A thin film (so-called cermet film) containing fine particles of metal or semiconductor in a dielectric that is an oxide or a nitride can be used as the infrared radiation material layer 21.
- MgO melting point: 3100K
- W 3700K
- Re 3500K
- a material in which MgO and W are simultaneously sputtered on both surfaces of a W substrate 20 and a cermet film (thickness of about 800 mm) containing W fine particles in MgO is used as the infrared radiation material layer 21 is used.
- a cermet film (thickness of about 800 mm) containing W fine particles in MgO is used as the infrared radiation material layer 21 is used.
- the reflection characteristics can be maintained even in the temperature range of 3000 K, and an efficient and long-life heat-light conversion element 2 can be obtained.
- the cermet film In order to increase the adhesion between the cermet film (infrared radiation material layer 21) and the W base material 20, the cermet film has a high concentration of W metal in the region close to the W base material 20, It is also possible to adopt a concentration gradient film in which the concentration of W metal decreases with increasing distance.
- the concentration ratio (volume ratio of W to MgO) of the cermet film (infrared radiation material layer 21) is preferably about 5 to 50%.
- FIG. 21 shows the wavelength dependence of the refractive index and extinction coefficient (absorption rate) of the cermet film 21 of MgO + W (800 ⁇ ).
- the result of calculating the wavelength dependence of the reflectance based on this optical constant is shown in FIG.
- W and MgO materials are used, the reflection characteristics as shown in FIG. 22 can be stably maintained even in a high temperature region of 3000 K, and the thermo-optic conversion element 2 that is stable even at high temperature heating can be provided.
- the antireflection film 22 a low refractive index of MgF 2 or the like by depositing a (visible region at about 1.4) material on the cermet film, more reflectivity in the visible region, as shown in FIG. 23 Thus, it is possible to obtain a reflectance curve in which Thereby, the more efficient heat-light conversion element 2 is obtained.
- Example 3 of infrared radiation material A graphite compound substrate having a fine concavo-convex structure on the surface can be used as the infrared radiation material layer 21. Since the melting point of the graphite compound exceeds 4000 K, it is possible to obtain a stable infrared radiation material layer 21 that is not easily deteriorated even at high temperature heating.
- This concavo-convex structure is a structure in which a periodic nanometer-order concavo-convex structure is formed on a periodic micrometer-order concavo-convex structure.
- a regular periodic structure (uneven structure) on the order of micrometers produces a two-dimensional photonic crystal effect, which increases the reflection of long wavelength components of a predetermined wavelength (for example, 2 ⁇ m) and suppresses absorption. Is obtained.
- the reflectance is close to 1 at a predetermined wavelength (for example, 2 ⁇ m) or more, and the reflectance is close to 0 at a shorter wavelength.
- a predetermined wavelength for example, 2 ⁇ m
- the infrared radiation material layer 21 having a high reflectance of 95% or more at a wavelength of 5 ⁇ m rising from the extent can be provided.
- a method for forming a nanometer-order fine structure as shown in FIG. 24 or FIG. 25 on the surface of the graphite compound substrate will be described.
- a micrometer-order concavo-convex structure is formed as a first step, and this is further processed in a second step to form a nanometer-order concavo-convex structure on the surface of the micrometer-order concavo-convex structure.
- the average reflectance at a wavelength of 0.3-2 ⁇ m can be lowered (about 20-30%), and the average reflectance at a wavelength of 2-15 ⁇ m can be reduced. Can be high.
- the average reflectance at a wavelength of 0.3-2 ⁇ m can be further lowered (1.5% or less), and the average at a wavelength of 2-15 ⁇ m
- the reflectance can be further increased.
- a concavo-convex structure having a regular period of micrometer order is formed.
- a formation method photolithography using a metal mask and an etching technique are used.
- an etching technique plasma etching using H 2 and O 2 gas capable of etching a carbon-based material, reactive ion etching (RIE) capable of realizing a higher aspect ratio, or the like is used.
- RIE reactive ion etching
- a rough concavo-convex structure on the order of micrometers can be produced on a graphite compound substrate by applying mechanical micromachining and polishing techniques using a cutting tooth having a very steep inclination and a grindstone. .
- a nanometer-order periodic structure is formed by further performing hydrogen plasma etching using microwave plasma on the micrometer-order uneven structure produced in the first step.
- the hydrogen plasma etching conditions can be, for example, RF power: 100 to 1000 W, pressure: 1 to 100 torr, hydrogen flow rate: 5 to 500 sccm, etching time: 1 to 100 min. Since the conditions of the hydrogen plasma treatment depend on the apparatus, the above parameter values are examples.
- the reactive gas used for the etching in the second step is not limited to H 2 gas, and the same effect can be expected even when Ar, N 2 , O 2 , CF 4 or the like is used.
- the spectrophotometer having an integrating sphere whose inner surface is coated with BaSO 4 particles or the like in order to collect all the surface reflected light in the region of 0.3 to 2 ⁇ m.
- an FTIR (Fourier Transform Infrared Spectrometer) spectrometer with an integrating sphere coated with gold on the inner surface was used to collect all infrared reflected light.
- the infrared radiation material layer 21 may be any layer having a predetermined step-like reflection characteristic, and is not limited to the material layers of Examples 1 to 3 described above.
- the following materials (a) to (d) can be used.
- a structure in which a chromium film is formed on a nickel substrate by a predetermined method such as electroplating for example, see G. Zajac, et al. J. Appl. Phys. 51, 5544 (1980).
Abstract
Description
(太陽光発電装置)
以下、本発明の発電装置の原理について説明する。まず、発電装置が、太陽光発電装置である場合の原理について説明する。
(1)式において、P(total)は全入力エネルギー、P(conduction)は基材の支持体等、基材の接触体を経て損失されるエネルギー、P(radiation)は基材が加熱された温度で外部空間に光を放射して損失するエネルギーである。
つぎに、本発明の熱発電装置の原理について説明する。上述の太陽光発電装置は、太陽光により熱光変換素子の赤外放射材料を加熱し、赤外光を放射させる構成であるが、熱発電装置は、赤外放射材料に直接熱を受け渡し、赤外光を放射させる。
以下、実施形態1として、本発明の熱発電装置を図4、図5等を用いて説明する。図4は、熱発電装置50の断面図、図5は斜視図である。図6は、熱発電装置50を熱源51に固定した状態を示す斜視図である。
実施形態2として、本発明の太陽光発電装置の構成を図13を用いて説明する。
実施形態3として、図15の太陽光発電装置について説明する。
実施形態1の熱発電装置および実施形態2,3の太陽光発電装置の熱発電素子2に用いる赤外放射材料層21の具体例について以下説明する。
酸化物もしくは窒化物である誘電体中に、金属もしくは半導体の微粒子を含有した薄膜(いわゆるサーメット膜)を赤外放射材料層21として用いることができる。サーメット膜を構成する誘電体としては、MgO(融点3100K)が、金属としては、W(3700K)、Mo(2900K)、Re(3500K)が、高融点であるため好ましい。
表面に微細な凹凸構造を有するグラファイト化合物基板を赤外放射材料層21として用いることができる。グラファイト化合物の融点は4000Kを越えるので、高温加熱においても劣化しにくい安定な赤外放射材料層21を得ることができる。
赤外放射材料層21としては、所定の階段状の反射特性を有する層であればよく、上記した例1~3の材料層に限定されるものではない。例えば、以下の(a)~(d)に示す材料を用いることも可能である。
(b)アルミを陽極酸化することにより得た、表面に多孔質ナノ構造を有する酸化アルミナ。孔径、孔深さ等を制御することにより反射率を制御することができる。(例えば、A.Anderson、et al.J.Appl.Phys.51、754(1980).参照)
(c)CrとCr2O3のサーメット膜の上に、反射防止膜としてCr2O3を積層した構造(例えば、J.C.C.Fan and S.A.Spura、Appl.Phys.ett.30、511(1977).)
(d)Wの表面にマイクロキャビティ構造を作製し反射率を制御した構造(例えば、F.Kusunoki et al.、Jpn.J.Appl.Phys.43、8A、5253(2004).)
(e)金属基材上に、窒化膜and/or酸化膜を形成して反射率を制御した構造(例えば、C.E.Kennedy、NREL/TP-520-31267)
Claims (26)
- 熱を赤外光に変換する熱光変換素子と、前記赤外光を電気エネルギーに変換する半導体発電セルとを有し、
熱光変換素子は、所定の赤外波長よりも長波長側の反射率が短波長側の反射率よりも高い材料を含み、該材料が加熱されることにより前記赤外光を放射することを特徴とする発電装置。 - 請求項1に記載の発電装置において、前記赤外光の波長は、前記材料の放射率の長波長側カットオフ波長以下であることを特徴とする発電装置。
- 請求項2に記載の発電装置において、放射される前記材料の放射率の長波長側カットオフ波長は、その放射時の当該材料の温度における理想的な黒体放射の短波長側のカットオフ波長よりも長波長側に位置することを特徴とする発電装置。
- 請求項3に記載の発電装置において、前記赤外光の波長帯域は、前記黒体放射の短波長側のカットオフ波長以上、前記材料の放射率の長波長側カットオフ波長以下であることを特徴とする発電装置。
- 請求項1ないし4のいずれか1項に記載の発電装置において、前記熱光変換素子の前記材料の放射する前記赤外光のピーク波長は、その放射時の前記材料の温度における理想的な黒体放射のピーク波長よりも短波長であることを特徴とする発電装置。
- 請求項1ないし5のいずれか1項に記載の発電装置において、前記熱光変換素子と前記半導体発電セルは、空間を挟んで対向配置され、前記空間は、所定の真空度に減圧されていることを特徴とする発電装置。
- 請求項1ないし6のいずれか1項に記載の発電装置において、前記熱光変換素子は、前記熱を当該熱光変換素子に受け渡す基板上に固定されていることを特徴とする発電装置。
- 請求項1ないし6のいずれか1項に記載の発電装置において、前記熱光変換素子を加熱するために、太陽光を前記熱光変換素子に向かって集光する集光光学系をさらに有することを特徴とする発電装置。
- 請求項1ないし6、および、8のいずれか1項に記載の発電装置において、前記所定の赤外波長は、太陽光の長波長側端部であることを特徴とする発電装置。
- 請求項1項に記載の発電装置において、前記所定の赤外波長は、1μm以上5μm以下であることを特徴とする発電装置。
- 請求項1ないし10のいずれか1項に記載の発電装置において、前記材料は、金属酸化物の積層体であることを特徴とする発電装置。
- 請求項1ないし10のいずれか1項に記載に発電装置において、前記材料の上に反射防止膜を積層したことを特徴とする発電装置。
- 請求項12に記載の発電装置において、前記反射防止膜として、酸化錫層を含む膜が配置されていることを特徴とする発電装置。
- 請求項1ないし10のいずれか1項に記載の発電装置において、前記材料は、サーメット膜であることを特徴とする発電装置。
- 請求項14に記載の発電装置において、前記赤外光放射材料は、酸化マグネシウムの中に、タングステン微粒子が分散したサーメット膜を含むことを特徴とする発電装置。
- 請求項14または15に記載に発電装置において、前記材料の上には、反射防止膜として、MgF2を含む低屈折率材料の膜が配置されていることを特徴とする発電装置。
- 請求項1ないし10のいずれか1項に記載の発電装置において、前記赤外光放射材料は、表面に凹凸構造を備えたグラファイト化合物であることを特徴とする発電装置。
- 請求項17に記載の発電装置において、前記グラファイト化合物の凹凸構造は、周期的なマイクロメートルオーダーの凹凸構造と、周期的なナノメートルオーダーの凹凸構造とを含むことを特徴とする発電装置。
- 請求項6に記載の発電装置において、前記熱光変換素子と前記半導体発電セルの外周部を密閉する容器を備えることを特徴とする発電装置。
- 請求項7に記載の発電装置において、前記熱光変換素子は、真空容器内に配置され、
前記真空容器には、前記集光光学系から光を透過するための窓が備えられていることを特徴とする発電装置。 - 請求項20に記載の発電装置において、前記窓は、真空内壁側に、太陽光を透過し、前記熱光変換素子から発生した前記赤外光を反射する光学的フィルターが備えられていることを特徴とする発電装置。
- 請求項20に記載の発電装置において、前記真空容器は、回転楕円体であり、前記熱光変換素子および前記半導体発電セルは、前記回転楕円体の2つの焦点位置にそれぞれ配置され、
前記熱光変換素子は、基材と、当該基材の両面に配置された前記材料の層とを含む構成であることを特徴とする発電装置。 - 請求項20に記載の発電装置において、前記真空容器は、球体であり、前記熱光変換素子および前記半導体発電セルは、前記球体の直径方向に沿って、壁面から直径の1/4、4/4の位置にそれぞれ配置され、
前記熱光変換素子は、基材と、当該基材の片面に配置された前記材料の層とを含む構成であることを特徴とする発電装置。 - 熱源の熱を、所定の赤外波長に反射率のカットオフ波長を有する材料に伝導し、
前記材料から放射された赤外光を半導体発電セルを用いて電気エネルギーに変換することを特徴とする熱発電方法。 - 太陽光を、所定の赤外波長に反射率のカットオフ波長を有する材料に集光し、
前記材料から放射された赤外光を半導体発電セルを用いて電気エネルギーに変換することを特徴とする太陽光発電方法。 - 請求項25に記載の太陽光発電方法において、前記所定の赤外波長は、太陽光の長波長側端部であることを特徴とする太陽光発電方法。
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