WO2010143590A1 - β型サイアロン蛍光体、その用途及びその製造方法 - Google Patents
β型サイアロン蛍光体、その用途及びその製造方法 Download PDFInfo
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- WO2010143590A1 WO2010143590A1 PCT/JP2010/059508 JP2010059508W WO2010143590A1 WO 2010143590 A1 WO2010143590 A1 WO 2010143590A1 JP 2010059508 W JP2010059508 W JP 2010059508W WO 2010143590 A1 WO2010143590 A1 WO 2010143590A1
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- type sialon
- sialon phosphor
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- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 title claims abstract description 82
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 18
- 239000013078 crystal Substances 0.000 claims abstract description 33
- 239000000203 mixture Substances 0.000 claims abstract description 18
- 239000006104 solid solution Substances 0.000 claims abstract description 14
- 239000012190 activator Substances 0.000 claims abstract description 4
- 239000007789 gas Substances 0.000 claims description 26
- 238000000137 annealing Methods 0.000 claims description 24
- 238000010306 acid treatment Methods 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 20
- 239000002994 raw material Substances 0.000 claims description 20
- 239000012298 atmosphere Substances 0.000 claims description 18
- 239000002253 acid Substances 0.000 claims description 17
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 15
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 13
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 12
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 8
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 7
- 239000012299 nitrogen atmosphere Substances 0.000 claims description 7
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 7
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 6
- 229910017604 nitric acid Inorganic materials 0.000 claims description 6
- 150000001875 compounds Chemical class 0.000 claims description 5
- 238000010304 firing Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 229910052786 argon Inorganic materials 0.000 claims description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 3
- YZCKVEUIGOORGS-IGMARMGPSA-N Protium Chemical compound [1H] YZCKVEUIGOORGS-IGMARMGPSA-N 0.000 claims description 2
- 239000011159 matrix material Substances 0.000 abstract 1
- 239000000843 powder Substances 0.000 description 28
- 230000000052 comparative effect Effects 0.000 description 13
- 238000010521 absorption reaction Methods 0.000 description 10
- 239000002245 particle Substances 0.000 description 9
- 238000002253 near-edge X-ray absorption fine structure spectrum Methods 0.000 description 6
- 239000012071 phase Substances 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 229910052582 BN Inorganic materials 0.000 description 4
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 238000004998 X ray absorption near edge structure spectroscopy Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 239000011812 mixed powder Substances 0.000 description 4
- 150000004767 nitrides Chemical class 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 229910001940 europium oxide Inorganic materials 0.000 description 3
- AEBZCFFCDTZXHP-UHFFFAOYSA-N europium(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Eu+3].[Eu+3] AEBZCFFCDTZXHP-UHFFFAOYSA-N 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 238000010298 pulverizing process Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000006228 supernatant Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 150000007513 acids Chemical class 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000007857 degradation product Substances 0.000 description 2
- 238000004880 explosion Methods 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 101000575029 Bacillus subtilis (strain 168) 50S ribosomal protein L11 Proteins 0.000 description 1
- 102100035793 CD83 antigen Human genes 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- 101000946856 Homo sapiens CD83 antigen Proteins 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229920000995 Spectralon Polymers 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010908 decantation Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000007580 dry-mixing Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000002189 fluorescence spectrum Methods 0.000 description 1
- 150000002222 fluorine compounds Chemical class 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000012442 inert solvent Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000007561 laser diffraction method Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000000634 powder X-ray diffraction Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000000790 scattering method Methods 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 238000010334 sieve classification Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/0883—Arsenides; Nitrides; Phosphides
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/59—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing silicon
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/64—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing aluminium
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7728—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing europium
- C09K11/77348—Silicon Aluminium Nitrides or Silicon Aluminium Oxynitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
Definitions
- the present invention relates to a ⁇ -type sialon phosphor that can be used in a light emitting device such as a white light emitting LED (white LED) using a blue light emitting LED (Light Emitting Diode) or an ultraviolet light emitting LED (ultraviolet LED), its use, and It relates to the manufacturing method.
- a white light emitting LED white LED
- a blue light emitting LED Light Emitting Diode
- an ultraviolet light emitting LED ultraviolet light emitting LED
- An object of the present invention is to provide an Eu-activated ⁇ -sialon phosphor exhibiting high luminance, a use of the phosphor, and a manufacturing method thereof.
- the present inventors do not necessarily dissolve all of the Eu present in the raw material in the ⁇ -type sialon during the firing process.
- Eu exists as two types of ions, Eu 2+ and Eu 3+ , and that it is affected by manufacturing conditions, and that the brightness increases when the ratio of Eu 2+ is a certain level or more.
- the ⁇ -sialon phosphor of the present invention has a ⁇ -sialon crystal represented by the general formula: Si 6-z Al z O z N 8-z (0 ⁇ z ⁇ 4.2) as a base material and is activated.
- Eu as an agent is dissolved in the ⁇ -sialon crystal, and the composition of Eu is Eu 2+ / (Eu 2+ + Eu 3+ ) of 0.8 or more.
- the solid solution amount of Eu is preferably 0.1 to 1% by mass with respect to the mass of the ⁇ -type sialon crystal.
- the present invention includes an LED and a phosphor layer laminated on the light emitting surface side of the LED, and the phosphor layer provides a light-emitting element containing the ⁇ -sialon phosphor described above. .
- the present invention provides a lighting device having the above-described light emitting element.
- the present invention provides a firing step of obtaining a fired product by firing the raw material mixture of the ⁇ -sialon phosphor described above at a temperature of 1820 ° C. to 2200 ° C. in a nitrogen atmosphere,
- a method for producing a ⁇ -type sialon phosphor comprising an annealing step of annealing at a temperature of 1100 ° C. or higher in a reducing atmosphere.
- the raw material mixture preferably contains silicon nitride, aluminum nitride, and an Eu-containing compound.
- the raw material mixture preferably further contains at least one of silicon oxide and aluminum oxide.
- the reducing atmosphere is preferably a hydrogen gas atmosphere or a mixed gas atmosphere containing a rare gas and a hydrogen gas.
- the rare gas is preferably argon gas.
- the reducing atmosphere is a mixed gas containing a rare gas and hydrogen gas, and 1% or more and less than 100% of the atmosphere is hydrogen gas.
- the annealing step is preferably performed at a temperature of 1500 ° C. or lower.
- the method for producing the ⁇ -type sialon phosphor it is preferable to further include an acid treatment step of acid-treating the fired product.
- the acid treatment step is preferably performed by immersing and heating the fired product in a mixed acid composed of hydrofluoric acid and nitric acid.
- the heating is preferably performed at a temperature of the mixed acid of 50 ° C. to 80 ° C.
- the ⁇ -sialon phosphor of the present invention is excited in a wide wavelength range from ultraviolet to visible light, emits green light with high fluorescence emission efficiency, and is excellent as a green phosphor.
- This ⁇ -sialon phosphor has little change in luminance with respect to changes in the use environment, and can be used for various light emitting devices, particularly white LEDs using ultraviolet LEDs or blue LEDs as a light source, alone or in combination with other phosphors.
- Beta-sialon phosphor of an embodiment of the present invention have the general formula: Si 6-z Al z the O z N 8-z ⁇ -sialon crystal represented by (0 ⁇ z ⁇ 4.2) as a host material, Eu as an activator is dissolved in the ⁇ -type sialon crystal, and the composition of Eu is Eu 2+ / (Eu 2+ + Eu 3+ ) of 0.8 or more.
- the ⁇ -type sialon crystal has a general formula: Si 6-z Al z O z N 8-z (0 ⁇ z ⁇ 4.2), where z is, for example, 0.1, 0.5, 1 1.5, 2, 2.5, 3, 3.5, 4, 4.1, and may be in the range of any two of the numerical values exemplified here.
- Eu present in the ⁇ -type sialon phosphor exists as Eu 2+ or Eu 3+ ions, and the higher the ratio of Eu 2+ , the more preferable, and Eu 2+ / (Eu 2+ + Eu 3+ ) needs to be 0.8 or more.
- Eu 3+ present in the ⁇ -type sialon phosphor does not contribute to fluorescence emission at all. Therefore, the ratio of Eu 2+ and Eu 3+ is 0.8 or more in terms of Eu 2+ / Eu 2+ + Eu 3+ , and the upper limit is 1 in the theoretical value.
- the incidence of Eu 2+, the temperature of annealing, holding time, may be adjusted by reducing the adjustment of the atmosphere.
- Eu 2+ / (Eu 2+ + Eu 3+ ) is 0.8 to 1, specifically 0.8, 0.81, 0.82, 0.83, 0.84, 0.85, 0.86. , 0.88, 0.9, 0.95, 0.99, and 1.
- Eu 2+ / (Eu 2+ + Eu 3+ ) may be within any two of the numerical values exemplified here.
- the quantification of the ratio of Eu 2+ and Eu 3+ can be calculated, for example, by measuring the XANES spectrum at the Eu-L3 absorption edge.
- XANES is an abbreviation of X-ray Absorption Near Edge Structure (X-ray absorption near edge structure), and is a kind of analysis method in the X-ray absorption fine structure (XAFS) measurement method.
- the ⁇ -type sialon phosphor is obtained by baking a mixture of silicon nitride powder, aluminum nitride powder, europium oxide powder and / or oxide of silicon or aluminum as necessary at a high temperature in a nitrogen atmosphere.
- Oxides (including the surface oxide layer of nitride powder) present in the system react in the early stage of heating to form a liquid phase, and each constituent element diffuses through the liquid phase to form ⁇ -sialon crystals. Then, grain growth proceeds.
- the raw material system is synthesized with a composition in the vicinity of the ⁇ -type sialon crystal, a small amount of AlN polytypoid, which is a layered compound having a structure similar to AlN, other than the ⁇ -type sialon crystal is by-produced. That is, the ⁇ -type sialon phosphor obtained by the above method includes a ⁇ -type sialon crystal and an AlN polytypoid. Eu, which is an activator, is also dissolved in the AlN polytypoid, which is a by-product.
- Eu preferentially dissolves in AlN polytypoid over ⁇ -type sialon crystal, and therefore Eu solid solution in the actual ⁇ -type sialon crystal with respect to the Eu design concentration in the raw material composition. The concentration is lowered.
- Eu-containing AlN polytypoid is It was found that it can be removed by treatment.
- the synthetic powder of ⁇ -sialon phosphor when the synthetic powder of ⁇ -sialon phosphor is heat-treated in a mixed acid composed of hydrofluoric acid and nitric acid, most of the AlN polytypoid is dissolved in the acid, and a part of the AlN polytypoid is submicron-sized fluoride. It precipitates as a fluoride or oxyfluoride. Since this fluoride or oxyfluoride has a large particle size difference from the ⁇ -type sialon crystal particles, it is easily removed by sedimentation classification or the like.
- the treatment reduces the Eu content of the synthetic powder of ⁇ -sialon phosphor by 10 to 40%, but the fluorescence characteristics hardly change. That is, the presence or absence of the AlN polytypoid does not affect the characteristics of the ⁇ -type sialon phosphor.
- the amount of Eu solid solution in the ⁇ -type sialon crystal can be determined by removing the second phase from the ⁇ -type sialon phosphor by the above method.
- the Eu solid solution amount is preferably 0.1 to 1% by mass, more preferably 0.3 to 1% by mass with respect to the mass of the ⁇ -type sialon crystal. If the Eu solid solution amount is smaller than 0.1% by mass, it is not preferable because sufficient luminance cannot be obtained as a ⁇ -type sialon phosphor. In addition, since Eu is difficult to dissolve in ⁇ -sialon crystals, a solid solution amount substantially exceeding 1% by mass cannot be obtained.
- Eu solid solution amount is, for example, 0.1, 0.2, 0.3, 0.35, 0.4, 0.45, 0.5, 0.55, 0.6, 0.7,. 8, 0.9, and 1.0 mass%. This Eu solid solution amount may be within any two of the numerical values exemplified here.
- the ⁇ -sialon phosphor of this embodiment preferably contains as much of the ⁇ -sialon crystal as possible with high purity from the viewpoint of fluorescence emission, and is preferably composed of a single phase if possible. Even a mixture containing an unavoidable amorphous phase and another crystal phase may be used as long as the characteristics do not deteriorate. According to the study of the present inventor, it is preferable that the ⁇ -sialon phosphor of the present embodiment contains 90% by mass or more of ⁇ -sialon crystal. Conversely, if the content of ⁇ -type sialon crystals is less than 90% by mass, the fluorescence emission characteristics deteriorate, which is not preferable.
- silicon nitride (Si 3 N 4 ), aluminum nitride (AlN), and an Eu compound selected from Eu metal, oxide, carbonate, nitride, or oxynitride are used as a raw material.
- silicon nitride (Si 3 N 4 ), aluminum nitride (AlN), and an Eu compound selected from Eu metal, oxide, carbonate, nitride, or oxynitride are used. Using these, they are blended so as to have a predetermined ⁇ -sialon phosphor composition after the reaction. At that time, the amount of oxide contained in the silicon nitride powder or the aluminum nitride powder is also taken into consideration. Silicon oxide (SiO 2 ) and / or aluminum oxide (Al 2 O 3 ) may be mixed into the raw material.
- the compounds and simple substances used for the raw materials are not limited to those shown here. For example, only silicon metal or a mixture of metal silicon and silicon nitride may be used
- a dry mixing method a wet mixing method in an inert solvent that does not substantially react with each component of the raw material, and a method of removing the solvent can be employed.
- a V-type mixer, a rocking mixer, a ball mill, a vibration mill or the like is preferably used as the mixing device.
- the above raw material mixed powder is filled in a crucible or the like having at least the surface in contact with the raw material made of boron nitride, and heated in a nitrogen atmosphere, so that the solid solution reaction in the raw material powder proceeds, and ⁇ -type sialon fluorescence Get the body.
- the temperature in the nitrogen atmosphere is different depending on the composition and cannot be defined unconditionally, but generally it is preferably 1820 ° C. or higher and 2200 ° C. or lower. If the temperature in the nitrogen atmosphere is too low, Eu tends to not dissolve in the crystal structure of the ⁇ -type sialon phosphor, and if too high, the decomposition of the raw material and the ⁇ -type sialon phosphor is suppressed. This requires a very high nitrogen pressure and is not industrially preferable.
- the average particle size is preferably 6 to 30 ⁇ m.
- the “average particle diameter” means a particle diameter at a volume integrated value of 50% in a particle size distribution obtained by a laser diffraction / scattering method.
- a method is used in which a bulk ⁇ -sialon phosphor is subjected to a sieve classification process with an opening of about 45 ⁇ m, and the powder that has passed through the sieve is passed to the next process, or Examples thereof include a method of pulverizing the ⁇ -type sialon phosphor to a predetermined particle size using a general pulverizer such as a ball mill, a vibration mill, or a jet mill.
- a general pulverizer such as a ball mill, a vibration mill, or a jet mill.
- the production method of the ⁇ -type sialon phosphor of the present embodiment is obtained by subjecting the ⁇ -type sialon phosphor containing Eu synthesized by the above-described exemplary method to an annealing step at 1100 ° C. or higher in a reducing atmosphere.
- the ratio of Eu 2+ in Eu dissolved in the sialon crystal is increased.
- the reducing atmosphere is, for example, an atmosphere of a reducing gas alone or a mixed gas containing a rare gas and a reducing gas.
- the rare gas is, for example, a gas of an 18th group element such as argon or helium.
- the reducing gas is a gas having a reducing power, such as ammonia, hydrocarbon gas, carbon monoxide, or hydrogen.
- the concentration of the reducing gas is preferably 1% or more and less than 100%. This is because if the concentration is too low, the reducing power is not sufficient. Specifically, the hydrogen concentration is 99% or less, 90% or less, 50% or less, 20% or less, or 10% or less. From the viewpoint of preventing explosion, the hydrogen concentration is preferably 4% or less, which is the explosion limit.
- the temperature in the annealing step is lower than 1100 ° C., the change from Eu 3+ to Eu 2+ is not preferable.
- the upper limit of the temperature in the annealing step is not particularly specified, but is, for example, 1600 ° C., and preferably about 1500 ° C. This is because if the annealing temperature is too high, ⁇ -sialon will release nitrogen and decompose.
- the annealing temperature is, for example, 1100, 1150, 1200, 1250, 1300, 1350, 1400, 1450, 1500, 1550, 1600 ° C., and is within the range of any two of the numerical values exemplified here. May be.
- the treatment time for the annealing step is preferably 2 hours or more and 24 hours or less. If the treatment time in the annealing process is short, the ratio of Eu 2+ tends to be small, and if it is long, the ratio of Eu 2+ tends to be large. It is preferably 24 hours or less and more preferably 2 hours or more and 8 hours or less.
- the processing time of the annealing process is, for example, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24 hours, and is within any two ranges of the numerical values exemplified here. May be.
- the ⁇ -sialon phosphor after the annealing step is further subjected to an acid treatment step.
- the acid treatment results in an acid cleaning and improves the fluorescence characteristics.
- the acid used for the acid treatment one or more acids selected from hydrofluoric acid, sulfuric acid, phosphoric acid, hydrochloric acid and nitric acid are used, and they are used in the form of an aqueous solution containing these acids.
- the main purpose of this acid treatment is to remove a degradation product of ⁇ -sialon crystal that is generated in a very small amount during the annealing process, and to use a mixed acid composed of hydrofluoric acid and nitric acid suitable for removal of this degradation product. preferable.
- the ⁇ -sialon phosphor is dispersed in an aqueous solution containing the above-mentioned acid and reacted with the above-mentioned acid by stirring for several minutes to several hours (eg, 10 minutes to 3 hours). Do.
- the temperature of the acid may be room temperature, preferably 50 to 80 ° C.
- the phosphor particles and the acid are preferably separated with a filter or the like and then washed with water.
- the ⁇ -type sialon phosphor of the present embodiment is suitably used as a material for the phosphor layer of the light emitting element.
- An example of the light emitting element includes an LED and a phosphor layer laminated on the light emitting surface side of the LED.
- the LED of the light emitting element it is preferable to use an ultraviolet LED or a blue LED that emits light having a wavelength of 350 to 500 nm, particularly preferably a blue LED that emits light having a wavelength of 440 to 480 nm.
- the light emitting element can be incorporated in a lighting device. As a lighting device, there is a backlight of a liquid crystal display
- the raw material mixed powder obtained here was filled in a cylindrical boron nitride container with a lid (N-1 grade, manufactured by Denki Kagaku Kogyo Co., Ltd.), and in a pressurized nitrogen atmosphere of 0.8 MPa in an electric furnace of a carbon heater, Heat treatment was performed at 2000 ° C. for 12 hours.
- the raw material mixed powder becomes a loosely agglomerated lump after the heat treatment. After loosening this lump and carrying out mild crushing, it passed through a sieve having an opening of 45 ⁇ m.
- the powder obtained by passing through a sieve was subjected to an acid treatment in which the powder was immersed in a 1: 1 mixed acid of 50% hydrofluoric acid and 70% nitric acid at 75 ° C. for 30 minutes.
- the acid-treated powder is precipitated, the supernatant and fine powder produced by the acid treatment are removed, distilled water is added, the mixture is stirred and allowed to stand, and the decantation that removes the supernatant and fine powder is performed at a pH of 8 or less. Then, the supernatant liquid was repeated until it became transparent, and the finally obtained precipitate was filtered and dried to obtain the ⁇ -sialon phosphor of Comparative Example 1.
- FIG. 1 shows the results of powder X-ray diffraction measurement (XRD) using Cu K ⁇ rays on ⁇ -sialon phosphors before and after acid treatment.
- the diffraction line of AlN polytypoid seen at 2 ⁇ 30-40 ° disappeared by the above treatment.
- the Eu content was reduced from 0.80% by mass to 0.45% by mass.
- the Eu content was measured using “SPECTRO CIROS-120” manufactured by Rigaku Corporation using an ICP emission spectroscopic analyzer.
- Example 1 The ⁇ -sialon phosphor of Comparative Example 1 was filled in a cylindrical boron nitride container, and an annealing process was performed at 1450 ° C. for 8 hours in an atmosphere of argon + 4% hydrogen mixed gas at atmospheric pressure in an electric furnace of a carbon heater. .
- the same acid treatment as in Comparative Example 1 was performed on the ⁇ -type sialon phosphor after the annealing step. After the annealing step, the ⁇ -type sialon phosphor changed from green to dark green and became bright green after acid treatment.
- Example 2 The ⁇ -sialon phosphor obtained in Example 1 was filled in an alumina crucible, and an annealing process was performed at 900 ° C. in the atmosphere using a muffle furnace. The same acid treatment as in Comparative Example 1 was performed on the powder after the annealing step. After the annealing step, the ⁇ -type sialon phosphor changed from green to blue-green, but the powder color of the ⁇ -type sialon phosphor after acid treatment did not change.
- Example 2 The ⁇ -sialon phosphor of Comparative Example 1 is filled in a cylindrical boron nitride container, and the annealing process is performed at 1450 ° C. for 8 hours in a hydrogen gas atmosphere at atmospheric pressure in an all-metal electric furnace inside a tungsten heater furnace. I did it.
- the obtained powder was subjected to the same acid treatment as in Comparative Example 1. In this case, the same change in powder color as in Example 1 was shown.
- the luminous efficiency of the ⁇ -type sialon phosphor was determined as follows. A standard reflector with a reflectivity of 99% (Labsphere manufactured by Spectralon) is set on an integrating sphere, and monochromatic light having a wavelength of 455 nm, which is spectrally separated from a light emission source (Xe lamp), is introduced into the integrating sphere using an optical fiber. did. The monochromatic light was irradiated onto the standard reflector, and the spectrum of the reflected light was measured using a spectrophotometer (MCPD-7000, manufactured by Otsuka Electronics Co., Ltd.).
- MCPD-7000 spectrophotometer
- a cell filled with ⁇ -type sialon phosphor powder in the concave portion was set at the position of the standard reflector, and the same monochromatic light separated at a wavelength of 455 nm was irradiated, and the reflection spectrum and fluorescence spectrum were measured.
- the calculation of luminous efficiency was performed as follows.
- the excitation light photon number (Qex) was calculated from the reflection spectrum of the standard reflector in the wavelength range of 450 to 465 nm.
- the number of reflected photons (Qref) of the phosphor was calculated in the wavelength range of 450 to 465 nm, and the number of fluorescent photons (Qem) was calculated in the range of 465 to 800 nm.
- the external quantum efficiency (Qem / Qex ⁇ 100), the absorption rate ((Qex ⁇ Qref) ⁇ 100), and the internal quantum efficiency (Qem / (Qex ⁇ Qref) ⁇ 100) were determined from the obtained three types of photons.
- the XANES spectrum measurement of the Eu-L3 absorption edge of ⁇ -sialon phosphor was performed with the XAFS measurement device installed at BL11 of Saga Kyushu Synchrotron Light Research Center (SAGA-LS).
- SAGA-LS Saga Kyushu Synchrotron Light Research Center
- the incident X-ray energy was scanned between 6950 eV and 7020 eV at approximately 0.4 eV intervals.
- the transmission X-ray intensity I is a 31 cm ionization chamber with a N 2 gas flow, with an integration time of 2 seconds. / Measured by transmission method as a point.
- Table 1 shows the Eu content measured by ICP emission spectroscopic analysis of the phosphors of Examples 1 and 2 and Comparative Examples 1 and 2, the internal quantum efficiency and the external quantum efficiency when excited with monochromatic light having a wavelength of 455 nm, and XANES measurement. The obtained Eu 2+ / (Eu 2+ + Eu 3+ ) value is shown.
- the example was a ⁇ -type sialon phosphor having higher luminance than the comparative example due to its configuration.
- the ⁇ -type sialon phosphor of the present invention is excited at a wide wavelength from ultraviolet to blue light and exhibits high-luminance green light emission. Therefore, it can be suitably used as a phosphor of a white LED using blue or ultraviolet light as a light source.
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Abstract
Description
即ち、本発明のβ型サイアロン蛍光体は、一般式:Si6-zAlzOzN8-z(0<z<4.2)で示されるβ型サイアロン結晶を母体材料とし、付活剤としてのEuが前記β型サイアロン結晶中に固溶されており、前記Euの組成は、Eu2+/(Eu2++Eu3+)が0.8以上であることを特徴とする。
Eu2+とEu3+の比率の定量は、例えばEu-L3吸収端のXANESスペクトルを測定することにより算出できる。XANESとは、X-ray Absorption Near Edge Structure(X線吸収端近傍微細構造)の略であり、X線吸収微細構造(XAFS)測定法の中の一種の分析法である。希土類元素のL3吸収端XANESスペクトルに現れる強い吸収ピークエネルギーは、希土類の価数によって決まることが知られており、Euの場合、Eu2+は6970eV近傍に、Eu3+は6980eV近傍に、それぞれピークが現れるため、2つを分離して定量することが可能である。
原料は、例えば窒化ケイ素(Si3N4)と、窒化アルミニウム(AlN)と、Euの金属、酸化物、炭酸塩、窒化物又は酸窒化物から選ばれるEu化合物を用いる。これらを用いて反応後に所定のβ型サイアロン蛍光体の組成になるように配合する。その際、窒化ケイ素粉末や窒化アルミニウム粉末に含まれる酸化物量も考慮する。酸化ケイ素(SiO2)及び/又は酸化アルミニウム(Al2O3)を原料に混合してもよい。原料に用いる化合物や単体はここで示したものに限定されない。例えば、原料のケイ素源には、金属シリコンのみや、金属シリコンと窒化ケイ素の混合物を用いてもよい。
アニール工程の処理時間は、2時間以上24時間以下が好ましい。アニール工程での処理時間が短いと、Eu2+の割合が少ない傾向にあり、長いとEu2+割合が大きくなる傾向にあるが、長すぎてもアニール工程での効果が頭打ちになるため、2時間以上24時間以下が好ましく、より好ましくは2時間以上8時間以下である。アニール工程の処理時間は、例えば、2、4、6、8、10、12、14、16、18、20、22、24時間であり、ここで例示した数値の何れか2つの範囲内であってもよい。
宇部興産株式会社製α型窒化ケイ素粉末(SN-E10グレード、酸素含有量1.0質量%)95.43質量%、トクヤマ株式会社製窒化アルミニウム粉末(Fグレード、酸素含有量0.8質量%)3.04質量%、大明化学株式会社製酸化アルミニウム粉末(TM-DARグレード)0.74質量%、信越化学工業株式会社製酸化ユーロピウム粉末(RUグレード)0.79質量%を、V型混合機(筒井理化学器械株式会社製S-3)を用い混合し、更に目開き250μmの篩を全通させ凝集を取り除き、原料混合粉末を得た。ここでの配合比は、β型サイアロンの一般式:Si6-zAlzOzN8-zにおいて、酸化ユーロピウムを除いて、z=0.25となるように設計したものである。
比較例1のβ型サイアロン蛍光体を、円筒型窒化ホウ素製容器に充填し、カーボンヒーターの電気炉で大気圧のアルゴン+4%水素混合ガス雰囲気中、1450℃で8時間のアニール工程を行った。アニール工程後のβ型サイアロン蛍光体に対して、比較例1と同様の酸処理を行った。アニール工程後、β型サイアロン蛍光体は緑色から深緑色に変化し、酸処理後、鮮やかな緑色となった。
実施例1で得られたβ型サイアロン蛍光体を、アルミナ坩堝に充填し、マッフル炉を用いて、大気中、900℃でのアニール工程を行った。アニール工程後の粉末に対して、比較例1と同様の酸処理を行った。アニール工程後、β型サイアロン蛍光体は緑色から青緑色に変化したが、酸処理後のβ型サイアロン蛍光体の粉体色は変化しなかった。
比較例1のβ型サイアロン蛍光体を、円筒型窒化ホウ素製容器に充填し、タングステンヒーターの炉内が全てメタル製の電気炉で大気圧の水素ガス雰囲気中、1450℃で8時間のアニール工程をおこなった。得られた粉末に対して、比較例1と同様の酸処理を行った。この場合は、実施例1と同様の粉体色の変化を示した。
β型サイアロン蛍光体の発光効率は次の様に求めた。反射率が99%の標準反射板(Labsphere社製、スペクトラロン)を積分球にセットし、この積分球に、発光光源(Xeランプ)から分光した波長455nmの単色光を、光ファイバーを用いて導入した。
この単色光を標準反射板に照射し、分光光度計(大塚電子株式会社製、MCPD-7000)を用いて、反射光のスペクトル測定を行った。次に、標準反射板の位置に凹部にβ型サイアロン蛍光体粉末を充填したセルをセットし、同じく波長455nmに分光した単色光を照射し、その反射スペクトル及び蛍光スペクトルを測定した。
B. Ravel and M. Newville, J. Synchrotron Rad. (2005), 12, p.537-541.
Claims (15)
- 一般式:Si6-zAlzOzN8-z(0<z<4.2)で示されるβ型サイアロン結晶を母体材料とし、付活剤としてのEuが前記β型サイアロン結晶中に固溶されており、
前記Euの組成は、Eu2+/(Eu2++Eu3+)が0.8以上であるβ型サイアロン蛍光体。 - 前記Euの固溶量は、前記β型サイアロン結晶の質量に対して、0.1~1質量%である請求項1に記載の蛍光体。
- 前記β型サイアロン結晶が90質量%以上含有される請求項1に記載の蛍光体。
- LEDと、LEDの発光面側に積層された蛍光体層とを備え、前記蛍光体層は、請求項1に記載のβ型サイアロン蛍光体を含有する発光素子。
- 請求項4に記載の発光素子を有する照明装置。
- 請求項1に記載のβ型サイアロン蛍光体の原料混合物を窒素雰囲気下で1820℃~2200℃の温度で焼成して焼成物を得る焼成工程と、
前記焼成物を還元性雰囲気下で1100℃以上の温度でアニールするアニール工程を備えるβ型サイアロン蛍光体の製造方法。 - 前記原料混合物は、窒化ケイ素と、窒化アルミニウムと、Eu含有化合物を含む請求項6に記載のβ型サイアロン蛍光体の製造方法。
- 前記原料混合物は、酸化ケイ素と酸化アルミニウムの少なくとも一方をさらに含む請求項7に記載のβ型サイアロン蛍光体の製造方法。
- 前記還元性雰囲気は、水素ガスのみ、又は希ガスと水素ガスとを含む混合ガスの雰囲気である請求項6に記載のβ型サイアロン蛍光体の製造方法。
- 前記希ガスは、アルゴンガスである請求項9に記載のβ型サイアロン蛍光体の製造方法。
- 前記還元性雰囲気が希ガスと水素ガスとを含む混合ガスであり、雰囲気中の1%以上100%未満が水素ガスである請求項9に記載のβ型サイアロン蛍光体の製造方法。
- 前記アニール工程は、1500℃以下の温度で行われる請求項6に記載のβ型サイアロン蛍光体の製造方法。
- 前記焼成物を酸処理する酸処理工程をさらに備える請求項6に記載のβ型サイアロン蛍光体の製造方法。
- 前記酸処理工程は、フッ化水素酸と硝酸からなる混酸中に前記焼成物を浸漬させて加熱することによって行われる請求項13に記載のβ型サイアロン蛍光体の製造方法。
- 請求項14の加熱は、前記混酸の温度が50℃~80℃で行われる請求項14に記載のβ型サイアロン蛍光体の製造方法。
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- 2010-06-04 CN CN201080003227.1A patent/CN102216418B/zh active Active
- 2010-06-08 TW TW099118484A patent/TWI477584B/zh active
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Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2012033013A1 (ja) * | 2010-09-09 | 2012-03-15 | 電気化学工業株式会社 | β型サイアロンの製造方法 |
US9163175B2 (en) * | 2010-09-16 | 2015-10-20 | Denki Kagaku Kogyo Kabushiki Kaisha | β-sialon and method of manufacturing thereof, and light-emitting device |
US20130300014A1 (en) * | 2010-09-27 | 2013-11-14 | Denki Kagaku Kogyo Kabushiki Kaisha | PROCESS FOR PRODUCTION OF beta-SIALON |
US20130120691A1 (en) * | 2010-12-10 | 2013-05-16 | Denki Kagaku Kogyo Kabushiki Kaisha | Beta-sialon, and light emitting device and applications thereof |
US9028719B2 (en) * | 2010-12-10 | 2015-05-12 | Denki Kagaku Kogyo Kabushiki Kaisha | β- sialon, and light emitting device and applications thereof |
WO2012086505A1 (ja) * | 2010-12-20 | 2012-06-28 | 電気化学工業株式会社 | β型サイアロンの製造方法 |
US10563124B2 (en) | 2016-06-30 | 2020-02-18 | Nichia Corporation | Method of producing nitride fluorescent material |
JP2018150487A (ja) * | 2017-03-15 | 2018-09-27 | デンカ株式会社 | 蛍光体の製造方法、蛍光体及び発光素子と発光装置 |
WO2020218109A1 (ja) * | 2019-04-23 | 2020-10-29 | デンカ株式会社 | 蛍光体粉末および発光装置 |
KR20220002390A (ko) | 2019-04-23 | 2022-01-06 | 덴카 주식회사 | 형광체 분말 및 발광 장치 |
US11781064B2 (en) | 2019-04-23 | 2023-10-10 | Denka Company Limited | Phosphor powder and light-emitting device |
JP7394125B2 (ja) | 2019-04-23 | 2023-12-07 | デンカ株式会社 | 蛍光体粉末および発光装置 |
KR20230062846A (ko) | 2020-09-10 | 2023-05-09 | 덴카 주식회사 | 유로퓸 부활 β형 사이알론 형광체 및 발광 장치 |
KR20230157500A (ko) | 2021-03-31 | 2023-11-16 | 덴카 주식회사 | 유로퓸 부활 β형 사이알론 형광체 및 발광 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR101251138B1 (ko) | 2013-04-05 |
EP2365047A4 (en) | 2012-07-18 |
EP2365047A1 (en) | 2011-09-14 |
JPWO2010143590A1 (ja) | 2012-11-22 |
JP5368557B2 (ja) | 2013-12-18 |
CN102216418A (zh) | 2011-10-12 |
EP2365047B1 (en) | 2014-02-26 |
US20110198656A1 (en) | 2011-08-18 |
TW201107453A (en) | 2011-03-01 |
KR20110096067A (ko) | 2011-08-26 |
TWI477584B (zh) | 2015-03-21 |
CN102216418B (zh) | 2014-01-15 |
US8487393B2 (en) | 2013-07-16 |
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