WO2009078482A1 - 半導体発光素子 - Google Patents
半導体発光素子 Download PDFInfo
- Publication number
- WO2009078482A1 WO2009078482A1 PCT/JP2008/073189 JP2008073189W WO2009078482A1 WO 2009078482 A1 WO2009078482 A1 WO 2009078482A1 JP 2008073189 W JP2008073189 W JP 2008073189W WO 2009078482 A1 WO2009078482 A1 WO 2009078482A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- type gan
- gan layer
- layer
- transparent electrode
- type
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
- H01S5/04253—Electrodes, e.g. characterised by the structure characterised by the material having specific optical properties, e.g. transparent electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04254—Electrodes, e.g. characterised by the structure characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/16—Window-type lasers, i.e. with a region of non-absorbing material between the active region and the reflecting surface
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2214—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on oxides or nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
- H01S5/3213—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities asymmetric clading layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
- H01S5/3214—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities comprising materials from other groups of the periodic system than the materials of the active layer, e.g. ZnSe claddings and GaAs active layer
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009546301A JPWO2009078482A1 (ja) | 2007-12-19 | 2008-12-19 | 半導体発光素子 |
EP08861844A EP2237382A4 (en) | 2007-12-19 | 2008-12-19 | SEMICONDUCTOR LIGHT EMITTING DEVICE |
CN2008801218853A CN101904064A (zh) | 2007-12-19 | 2008-12-19 | 半导体发光元件 |
US12/809,233 US8411718B2 (en) | 2007-12-19 | 2008-12-19 | Semiconductor light-emitting device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007327927 | 2007-12-19 | ||
JP2007-327927 | 2007-12-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009078482A1 true WO2009078482A1 (ja) | 2009-06-25 |
Family
ID=40795593
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/073189 WO2009078482A1 (ja) | 2007-12-19 | 2008-12-19 | 半導体発光素子 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8411718B2 (ja) |
EP (1) | EP2237382A4 (ja) |
JP (1) | JPWO2009078482A1 (ja) |
KR (1) | KR20100098565A (ja) |
CN (1) | CN101904064A (ja) |
WO (1) | WO2009078482A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010004974A1 (ja) * | 2008-07-09 | 2010-01-14 | シャープ株式会社 | 窒化物半導体レーザ素子 |
WO2012101686A1 (ja) * | 2011-01-26 | 2012-08-02 | パナソニック株式会社 | 半導体発光素子及び発光装置 |
JP2016048776A (ja) * | 2014-08-25 | 2016-04-07 | 株式会社東芝 | 半導体発光素子及びその製造方法 |
JP6910580B1 (ja) * | 2020-11-06 | 2021-07-28 | 三菱電機株式会社 | 光半導体装置およびその製造方法 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103380551A (zh) * | 2011-03-17 | 2013-10-30 | 松下电器产业株式会社 | 半导体发光元件以及使用它的发光装置 |
DE102012106687B4 (de) * | 2012-07-24 | 2019-01-24 | Osram Opto Semiconductors Gmbh | Steglaser |
JP2014170825A (ja) * | 2013-03-04 | 2014-09-18 | Sumitomo Electric Ind Ltd | 量子カスケード半導体レーザ |
JP6700019B2 (ja) * | 2015-10-20 | 2020-05-27 | スタンレー電気株式会社 | 半導体発光素子 |
JP6700027B2 (ja) | 2015-11-20 | 2020-05-27 | スタンレー電気株式会社 | 垂直共振器型発光素子 |
JP6990499B2 (ja) * | 2016-04-18 | 2022-01-12 | スタンレー電気株式会社 | 垂直共振器型発光素子及び垂直共振型発光素子の製造方法 |
CN109346578B (zh) * | 2018-12-04 | 2023-07-07 | 西安赛富乐斯半导体科技有限公司 | 形成半极性氮化镓单量子阱蓝光发光器件的方法 |
JP2020126995A (ja) * | 2019-02-06 | 2020-08-20 | シャープ株式会社 | 半導体レーザ素子及びその製造方法 |
US20210313760A1 (en) * | 2020-04-06 | 2021-10-07 | Asahi Kasei Kabushiki Kaisha | Method for manufacturing semiconductor laser diode and semiconductor laser diode |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04103187A (ja) * | 1990-08-22 | 1992-04-06 | Mitsubishi Electric Corp | 半導体レーザ及びその製造方法 |
JPH0730194A (ja) * | 1993-07-14 | 1995-01-31 | Rohm Co Ltd | 半導体レーザ |
JPH10256657A (ja) | 1997-03-07 | 1998-09-25 | Sharp Corp | 窒化ガリウム系半導体発光素子、及び半導体レーザ光源装置 |
JPH11214788A (ja) | 1998-01-26 | 1999-08-06 | Sharp Corp | 窒化ガリウム系半導体レーザ素子 |
JP2002204031A (ja) | 2000-12-20 | 2002-07-19 | Samsung Electro Mech Co Ltd | 半導体レーザーダイオード及びその製造方法 |
JP2004048080A (ja) * | 2000-05-17 | 2004-02-12 | Sony Corp | 半導体レーザの製造方法 |
JP2006041491A (ja) * | 2004-06-21 | 2006-02-09 | Matsushita Electric Ind Co Ltd | 半導体レーザ素子及びその製造方法 |
WO2006134717A1 (ja) * | 2005-06-16 | 2006-12-21 | Sharp Kabushiki Kaisha | 窒化物半導体レーザ装置およびその製造方法 |
Family Cites Families (15)
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US245540A (en) * | 1881-08-09 | Table | ||
US26307A (en) * | 1859-11-29 | Alfred f | ||
US4930132A (en) * | 1987-12-28 | 1990-05-29 | Canon Kabushiki Kaisha | Second harmonic wave generating device having active layer and second harmonic wave generating layer on same substrate |
US5394421A (en) | 1993-01-11 | 1995-02-28 | Rohm Co., Ltd. | Semiconductor laser device including a step electrode in a form of eaves |
JP3464853B2 (ja) * | 1995-09-06 | 2003-11-10 | 株式会社東芝 | 半導体レーザ |
JP3688843B2 (ja) * | 1996-09-06 | 2005-08-31 | 株式会社東芝 | 窒化物系半導体素子の製造方法 |
JP3533995B2 (ja) * | 1999-07-01 | 2004-06-07 | 住友電気工業株式会社 | 発光ダイオードおよびその製造方法 |
JP2001223384A (ja) | 2000-02-08 | 2001-08-17 | Toshiba Corp | 半導体発光素子 |
JP2001339121A (ja) * | 2000-05-29 | 2001-12-07 | Sharp Corp | 窒化物半導体発光素子とそれを含む光学装置 |
JP2003046197A (ja) | 2001-08-01 | 2003-02-14 | Matsushita Electric Ind Co Ltd | 半導体レーザおよびその製造方法 |
US7372077B2 (en) | 2003-02-07 | 2008-05-13 | Sanyo Electric Co., Ltd. | Semiconductor device |
US6990132B2 (en) * | 2003-03-20 | 2006-01-24 | Xerox Corporation | Laser diode with metal-oxide upper cladding layer |
US7279751B2 (en) * | 2004-06-21 | 2007-10-09 | Matsushita Electric Industrial Co., Ltd. | Semiconductor laser device and manufacturing method thereof |
KR101124290B1 (ko) * | 2005-11-03 | 2012-03-27 | 삼성엘이디 주식회사 | 질화물 반도체 레이저 소자 및 그 제조 방법 |
JP5521478B2 (ja) * | 2008-10-22 | 2014-06-11 | 日亜化学工業株式会社 | 窒化物半導体発光素子の製造方法及び窒化物半導体発光素子 |
-
2008
- 2008-12-19 WO PCT/JP2008/073189 patent/WO2009078482A1/ja active Application Filing
- 2008-12-19 EP EP08861844A patent/EP2237382A4/en not_active Withdrawn
- 2008-12-19 US US12/809,233 patent/US8411718B2/en not_active Expired - Fee Related
- 2008-12-19 JP JP2009546301A patent/JPWO2009078482A1/ja active Pending
- 2008-12-19 CN CN2008801218853A patent/CN101904064A/zh active Pending
- 2008-12-19 KR KR1020107015987A patent/KR20100098565A/ko not_active Application Discontinuation
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04103187A (ja) * | 1990-08-22 | 1992-04-06 | Mitsubishi Electric Corp | 半導体レーザ及びその製造方法 |
JPH0730194A (ja) * | 1993-07-14 | 1995-01-31 | Rohm Co Ltd | 半導体レーザ |
JPH10256657A (ja) | 1997-03-07 | 1998-09-25 | Sharp Corp | 窒化ガリウム系半導体発光素子、及び半導体レーザ光源装置 |
JPH11214788A (ja) | 1998-01-26 | 1999-08-06 | Sharp Corp | 窒化ガリウム系半導体レーザ素子 |
JP2004048080A (ja) * | 2000-05-17 | 2004-02-12 | Sony Corp | 半導体レーザの製造方法 |
JP2002204031A (ja) | 2000-12-20 | 2002-07-19 | Samsung Electro Mech Co Ltd | 半導体レーザーダイオード及びその製造方法 |
JP2006041491A (ja) * | 2004-06-21 | 2006-02-09 | Matsushita Electric Ind Co Ltd | 半導体レーザ素子及びその製造方法 |
WO2006134717A1 (ja) * | 2005-06-16 | 2006-12-21 | Sharp Kabushiki Kaisha | 窒化物半導体レーザ装置およびその製造方法 |
Non-Patent Citations (1)
Title |
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See also references of EP2237382A4 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010004974A1 (ja) * | 2008-07-09 | 2010-01-14 | シャープ株式会社 | 窒化物半導体レーザ素子 |
JP2010021271A (ja) * | 2008-07-09 | 2010-01-28 | Sharp Corp | 窒化物半導体レーザ素子 |
WO2012101686A1 (ja) * | 2011-01-26 | 2012-08-02 | パナソニック株式会社 | 半導体発光素子及び発光装置 |
JP2016048776A (ja) * | 2014-08-25 | 2016-04-07 | 株式会社東芝 | 半導体発光素子及びその製造方法 |
JP6910580B1 (ja) * | 2020-11-06 | 2021-07-28 | 三菱電機株式会社 | 光半導体装置およびその製造方法 |
WO2022097258A1 (ja) * | 2020-11-06 | 2022-05-12 | 三菱電機株式会社 | 光半導体装置およびその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
EP2237382A1 (en) | 2010-10-06 |
CN101904064A (zh) | 2010-12-01 |
US20110121337A1 (en) | 2011-05-26 |
US8411718B2 (en) | 2013-04-02 |
EP2237382A4 (en) | 2011-01-26 |
JPWO2009078482A1 (ja) | 2011-05-06 |
KR20100098565A (ko) | 2010-09-07 |
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