WO2009017200A1 - 回路接続材料、それを用いた回路部材の接続構造及び回路部材の接続方法 - Google Patents
回路接続材料、それを用いた回路部材の接続構造及び回路部材の接続方法 Download PDFInfo
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- WO2009017200A1 WO2009017200A1 PCT/JP2008/063781 JP2008063781W WO2009017200A1 WO 2009017200 A1 WO2009017200 A1 WO 2009017200A1 JP 2008063781 W JP2008063781 W JP 2008063781W WO 2009017200 A1 WO2009017200 A1 WO 2009017200A1
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- H—ELECTRICITY
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
- H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
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- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
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- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
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- C09J11/04—Non-macromolecular additives inorganic
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- C09J9/00—Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
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- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
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- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
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- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/52—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
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- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
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- H05K2201/0218—Composite particles, i.e. first metal coated with second metal
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0206—Materials
- H05K2201/0221—Insulating particles having an electrically conductive coating
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
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- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/25—Web or sheet containing structurally defined element or component and including a second component containing structurally defined particles
- Y10T428/256—Heavy metal or aluminum or compound thereof
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Organic Chemistry (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Conductive Materials (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Wire Bonding (AREA)
- Non-Insulated Conductors (AREA)
- Connections Effected By Soldering, Adhesion, Or Permanent Deformation (AREA)
Abstract
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
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KR1020137016319A KR20130088187A (ko) | 2007-08-02 | 2008-07-31 | 회로 접속 재료, 그것을 이용한 회로 부재의 접속 구조체 및 회로 부재의 접속 방법 |
US12/671,804 US20110267791A1 (en) | 2007-08-02 | 2008-07-31 | Circuit connection material, and connection structure of circuit member and connection method of circuit member using the circuit connection material |
KR1020107004375A KR101302778B1 (ko) | 2007-08-02 | 2008-07-31 | 회로 접속 재료, 그것을 이용한 회로 부재의 접속 구조체 및 회로 부재의 접속 방법 |
JP2009525451A JP5316410B2 (ja) | 2007-08-02 | 2008-07-31 | 回路部材の接続構造 |
CN2008800220733A CN101689410B (zh) | 2007-08-02 | 2008-07-31 | 电路连接材料、使用它的电路构件的连接结构及电路构件的连接方法 |
EP08791996A EP2178094A4 (en) | 2007-08-02 | 2008-07-31 | SWITCHING CONNECTING MATERIAL AND CONNECTING STRUCTURE OF A SWITCHING ELEMENT AND CONNECTION METHOD OF A SWITCHING ELEMENT ON THE SWITCHING CONNECTING MATERIAL |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2007-201800 | 2007-08-02 | ||
JP2007201800 | 2007-08-02 |
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US (1) | US20110267791A1 (ja) |
EP (1) | EP2178094A4 (ja) |
JP (2) | JP5316410B2 (ja) |
KR (2) | KR20130088187A (ja) |
CN (2) | CN101689410B (ja) |
TW (1) | TWI396205B (ja) |
WO (1) | WO2009017200A1 (ja) |
Cited By (6)
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JP2011012180A (ja) * | 2009-07-02 | 2011-01-20 | Hitachi Chem Co Ltd | 回路接続材料及び回路接続構造体 |
WO2012137335A1 (ja) * | 2011-04-07 | 2012-10-11 | 日立化成工業株式会社 | 回路接続材料及びその使用並びに接続構造体及びその製造方法 |
JP2015057757A (ja) * | 2013-08-09 | 2015-03-26 | 積水化学工業株式会社 | 導電性粒子、導電材料及び接続構造体 |
JP2017126463A (ja) * | 2016-01-13 | 2017-07-20 | 株式会社山王 | 導電性微粒子及び導電性微粒子の製造方法 |
WO2017142086A1 (ja) * | 2016-02-18 | 2017-08-24 | 積水化学工業株式会社 | 電気モジュール及び電気モジュールの製造方法 |
JP2021509526A (ja) * | 2017-12-29 | 2021-03-25 | ククド ケミカル カンパニー リミテッド | 異方導電性フィルム、これを含むディスプレイ装置及び/又はこれを含む半導体装置 |
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JP4737177B2 (ja) * | 2006-10-31 | 2011-07-27 | 日立化成工業株式会社 | 回路接続構造体 |
US20100139947A1 (en) * | 2007-05-15 | 2010-06-10 | Hitachi Chemical Company, Ltd. | Circuit-connecting material, and connection structure for circuit member |
JP5293779B2 (ja) * | 2010-07-20 | 2013-09-18 | 日立化成株式会社 | 接着剤組成物、回路接続構造体、半導体装置及び太陽電池モジュール |
KR101151366B1 (ko) | 2011-11-24 | 2012-06-08 | 한화케미칼 주식회사 | 도전성 입자 및 이의 제조방법 |
JP6044261B2 (ja) * | 2012-10-22 | 2016-12-14 | 日立化成株式会社 | 異方導電性接着剤組成物 |
TWI495074B (zh) * | 2012-11-30 | 2015-08-01 | Ind Tech Res Inst | 減能結構 |
US8815725B2 (en) | 2013-01-18 | 2014-08-26 | International Business Machines Corporation | Low alpha particle emission electrically-conductive coating |
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US9490067B2 (en) * | 2013-11-08 | 2016-11-08 | Cooper Technologies Company | Joining dissimilar materials using an epoxy resin composition |
KR101388604B1 (ko) * | 2013-11-25 | 2014-04-23 | 덕산하이메탈(주) | 금속입자, 이를 이용하는 도전입자 및 그 제조방법 |
JP2016009087A (ja) * | 2014-06-24 | 2016-01-18 | セイコーエプソン株式会社 | 表示装置および表示装置の製造方法 |
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US20160343684A1 (en) * | 2015-05-18 | 2016-11-24 | Innovative Micro Technology | Thermocompression bonding with raised feature |
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WO2018199329A1 (ja) * | 2017-04-28 | 2018-11-01 | 日立化成株式会社 | 接着剤組成物、及び接続体の製造方法 |
JP7185252B2 (ja) | 2018-01-31 | 2022-12-07 | 三国電子有限会社 | 接続構造体の作製方法 |
JP7160302B2 (ja) * | 2018-01-31 | 2022-10-25 | 三国電子有限会社 | 接続構造体および接続構造体の作製方法 |
JP2020095941A (ja) * | 2018-10-03 | 2020-06-18 | デクセリアルズ株式会社 | 異方性導電フィルム、接続構造体、接続構造体の製造方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000195339A (ja) * | 1998-12-25 | 2000-07-14 | Sony Chem Corp | 異方導電性接着フィルム |
JP2004164874A (ja) * | 2002-11-08 | 2004-06-10 | Osugi Kk | 異方性導電接着剤用導電微粒子 |
JP2005166438A (ja) * | 2003-12-02 | 2005-06-23 | Hitachi Chem Co Ltd | 回路接続材料、及びこれを用いた回路部材の接続構造 |
JP2005327509A (ja) * | 2004-05-12 | 2005-11-24 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
JP2006107881A (ja) * | 2004-10-04 | 2006-04-20 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
JP2006196411A (ja) * | 2005-01-17 | 2006-07-27 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
WO2007058159A1 (ja) * | 2005-11-18 | 2007-05-24 | Hitachi Chemical Company, Ltd. | 接着剤組成物、回路接続材料、接続構造及び回路部材の接続方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3696429B2 (ja) * | 1999-02-22 | 2005-09-21 | 日本化学工業株式会社 | 導電性無電解めっき粉体とその製造方法並びに該めっき粉体からなる導電性材料 |
JP2004155957A (ja) * | 2002-11-07 | 2004-06-03 | Three M Innovative Properties Co | 異方導電性接着剤及びフィルム |
CN100380741C (zh) * | 2003-06-25 | 2008-04-09 | 日立化成工业株式会社 | 电路连接材料、电路构件的连接结构及其制造方法 |
JP4282417B2 (ja) * | 2003-09-12 | 2009-06-24 | ソニーケミカル&インフォメーションデバイス株式会社 | 接続構造体 |
US20100025089A1 (en) * | 2004-01-07 | 2010-02-04 | Jun Taketatsu | Circuit connection material, film-shaped circuit connection material using the same, circuit member connection structure, and manufacturing method thereof |
US7410698B2 (en) * | 2004-01-30 | 2008-08-12 | Sekisui Chemical Co., Ltd. | Conductive particle with protrusions and anisotropic conductive material therefrom |
JP2005327510A (ja) * | 2004-05-12 | 2005-11-24 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
JP2006339160A (ja) * | 2006-06-02 | 2006-12-14 | Hitachi Chem Co Ltd | 熱硬化性回路接続部材及びそれを用いた電極の接続構造、電極の接続方法 |
-
2008
- 2008-07-31 KR KR1020137016319A patent/KR20130088187A/ko not_active Application Discontinuation
- 2008-07-31 KR KR1020107004375A patent/KR101302778B1/ko active IP Right Grant
- 2008-07-31 JP JP2009525451A patent/JP5316410B2/ja active Active
- 2008-07-31 CN CN2008800220733A patent/CN101689410B/zh active Active
- 2008-07-31 US US12/671,804 patent/US20110267791A1/en not_active Abandoned
- 2008-07-31 CN CN201310425247.3A patent/CN103484035A/zh active Pending
- 2008-07-31 WO PCT/JP2008/063781 patent/WO2009017200A1/ja active Application Filing
- 2008-07-31 EP EP08791996A patent/EP2178094A4/en not_active Withdrawn
- 2008-08-01 TW TW097129410A patent/TWI396205B/zh active
-
2013
- 2013-03-18 JP JP2013055002A patent/JP2013209648A/ja not_active Withdrawn
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000195339A (ja) * | 1998-12-25 | 2000-07-14 | Sony Chem Corp | 異方導電性接着フィルム |
JP2004164874A (ja) * | 2002-11-08 | 2004-06-10 | Osugi Kk | 異方性導電接着剤用導電微粒子 |
JP2005166438A (ja) * | 2003-12-02 | 2005-06-23 | Hitachi Chem Co Ltd | 回路接続材料、及びこれを用いた回路部材の接続構造 |
JP2005327509A (ja) * | 2004-05-12 | 2005-11-24 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
JP2006107881A (ja) * | 2004-10-04 | 2006-04-20 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
JP2006196411A (ja) * | 2005-01-17 | 2006-07-27 | Sekisui Chem Co Ltd | 導電性微粒子及び異方性導電材料 |
WO2007058159A1 (ja) * | 2005-11-18 | 2007-05-24 | Hitachi Chemical Company, Ltd. | 接着剤組成物、回路接続材料、接続構造及び回路部材の接続方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP2178094A4 * |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011012180A (ja) * | 2009-07-02 | 2011-01-20 | Hitachi Chem Co Ltd | 回路接続材料及び回路接続構造体 |
WO2012137335A1 (ja) * | 2011-04-07 | 2012-10-11 | 日立化成工業株式会社 | 回路接続材料及びその使用並びに接続構造体及びその製造方法 |
JP2015057757A (ja) * | 2013-08-09 | 2015-03-26 | 積水化学工業株式会社 | 導電性粒子、導電材料及び接続構造体 |
JP2017126463A (ja) * | 2016-01-13 | 2017-07-20 | 株式会社山王 | 導電性微粒子及び導電性微粒子の製造方法 |
WO2017122423A1 (ja) * | 2016-01-13 | 2017-07-20 | 株式会社山王 | 導電性微粒子及び導電性微粒子の製造方法 |
WO2017142086A1 (ja) * | 2016-02-18 | 2017-08-24 | 積水化学工業株式会社 | 電気モジュール及び電気モジュールの製造方法 |
CN108475583A (zh) * | 2016-02-18 | 2018-08-31 | 积水化学工业株式会社 | 电组件及电组件的制造方法 |
JPWO2017142086A1 (ja) * | 2016-02-18 | 2018-12-06 | 積水化学工業株式会社 | 電気モジュール及び電気モジュールの製造方法 |
JP2021509526A (ja) * | 2017-12-29 | 2021-03-25 | ククド ケミカル カンパニー リミテッド | 異方導電性フィルム、これを含むディスプレイ装置及び/又はこれを含む半導体装置 |
Also Published As
Publication number | Publication date |
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KR101302778B1 (ko) | 2013-09-02 |
EP2178094A4 (en) | 2013-02-20 |
JP2013209648A (ja) | 2013-10-10 |
CN101689410B (zh) | 2013-10-16 |
CN101689410A (zh) | 2010-03-31 |
US20110267791A1 (en) | 2011-11-03 |
KR20100039894A (ko) | 2010-04-16 |
JPWO2009017200A1 (ja) | 2010-10-21 |
TW200929266A (en) | 2009-07-01 |
JP5316410B2 (ja) | 2013-10-16 |
CN103484035A (zh) | 2014-01-01 |
KR20130088187A (ko) | 2013-08-07 |
TWI396205B (zh) | 2013-05-11 |
EP2178094A1 (en) | 2010-04-21 |
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