WO2006004000A1 - 導電性ボールの搭載方法および装置 - Google Patents
導電性ボールの搭載方法および装置 Download PDFInfo
- Publication number
- WO2006004000A1 WO2006004000A1 PCT/JP2005/012095 JP2005012095W WO2006004000A1 WO 2006004000 A1 WO2006004000 A1 WO 2006004000A1 JP 2005012095 W JP2005012095 W JP 2005012095W WO 2006004000 A1 WO2006004000 A1 WO 2006004000A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- mask
- head
- area
- conductive balls
- substrate
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 92
- 238000010408 sweeping Methods 0.000 claims description 8
- 241001417527 Pempheridae Species 0.000 claims description 7
- 238000007664 blowing Methods 0.000 claims description 6
- 229910000679 solder Inorganic materials 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 230000033001 locomotion Effects 0.000 description 17
- 239000010419 fine particle Substances 0.000 description 10
- 239000007789 gas Substances 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 230000008569 process Effects 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000004907 flux Effects 0.000 description 6
- 230000007423 decrease Effects 0.000 description 4
- 238000003825 pressing Methods 0.000 description 4
- 238000009826 distribution Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005429 filling process Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000011859 microparticle Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 241000269350 Anura Species 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 241000692870 Inachis io Species 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 210000001015 abdomen Anatomy 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 230000004886 head movement Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L24/742—Apparatus for manufacturing bump connectors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/06—Solder feeding devices; Solder melting pans
- B23K3/0607—Solder feeding devices
- B23K3/0623—Solder feeding devices for shaped solder piece feeding, e.g. preforms, bumps, balls, pellets, droplets
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4853—Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3478—Applying solder preforms; Transferring prefabricated solder patterns
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/42—Printed circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
- H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
- H01L2224/11334—Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
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- H01L2924/01005—Boron [B]
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- H01L2924/01006—Carbon [C]
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- H01L2924/01033—Arsenic [As]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01—ELECTRIC ELEMENTS
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
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- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/04—Soldering or other types of metallurgic bonding
- H05K2203/041—Solder preforms in the shape of solder balls
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0548—Masks
- H05K2203/0557—Non-printed masks
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
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- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49144—Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
- Y10T29/49149—Assembling terminal to base by metal fusion bonding
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49174—Assembling terminal to elongated conductor
- Y10T29/49179—Assembling terminal to elongated conductor by metal fusion bonding
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
- Y10T29/53178—Chip component
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
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- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/532—Conductor
Definitions
- the present invention relates to an apparatus and method for attaching a conductive ball to a predetermined position of a substrate.
- Solder balls are used to obtain electrical connections when mounting semiconductor devices or optical devices such as LSI (Large Scale Integration) and LCD (Liquid Crystal Display).
- semiconductor devices or optical devices such as LSI (Large Scale Integration) and LCD (Liquid Crystal Display).
- LSI Large Scale Integration
- LCD Liquid Crystal Display
- JP-A-9 148332 discloses an example of a technique for arranging microparticles at intended positions.
- a fine particle is moved by a moving means called a squeegee having a predetermined softness on a mask having apertures for arranging the fine particles. It is disclosed that it is inserted into the aperture of the mask and arranged and adsorbed on the perforated plate by the sucked air.
- the squeegee in Document 1 moves extra fine particles that are not inserted into the aperture, and in Document 1, the squeegee is attached to a belt that moves in a linear direction on the mask. It is described to do.
- Document 1 describes that a squeegee attached to a disk-shaped holding member is moved along a groove on a mask having a ring-shaped groove. In either case, however, the microparticles are moved in one predetermined direction by the squeegee.
- a reciprocating squeegee is also disclosed, but even in that case, the moving direction is two directions, the forward direction and the backward direction.
- the fine particles are appropriately arranged at necessary positions by sucking and inserting the fine particles into the openings.
- one of the conditions for filling fine particles, that is, conductive balls, into the openings or openings patterned in the mask without error is the number of openings (opening density).
- a sufficiently large number of conductive balls Supply As the number of conductive balls increases with respect to the number of openings, the time for the conductive balls to move on the surface of the mask becomes longer. Therefore, various factors such as contact with the atmosphere, contact between balls, contact between the ball and the mask, and friction and contact between the ball and the squeegee can cause the surface of the ball to wear or deform, The performance as an electrode is reduced.
- the entire surface of the mask is moved to the front surface of the mask.
- the ball is collected in a part of the surface by rotating the head, etc., and the group of conductive balls is held in the part, and the part is moved so that a part of the locus of the part overlaps.
- Such movement of the area then covers the surface of the mask and fills the mask openings with conductive balls. That is, in one embodiment of the present invention, a conductive ball is provided on the substrate.
- a group of conductive balls is held in a partial area of the surface of the mask by a process of setting a mask having a plurality of openings for placement on the substrate and a head that moves along the surface of the mask. Furthermore, the conductive ball mounting method further includes a filling step of moving the area so that a part of the locus of the area overlaps.
- One embodiment of the present invention is an apparatus for filling a plurality of openings with conductive balls in a state in which a mask having a plurality of openings for disposing the conductive balls on the substrate is set on the substrate.
- a conductive ball filling apparatus comprising: a head for holding a group of conductive balls in a partial area of the surface of the mask; and a head support means for supporting the head to move along the surface of the mask. It is. Furthermore, one embodiment of the present invention is a mounting apparatus having the filling apparatus and an apparatus for setting a mask on a substrate.
- Moving the head and the area along the surface of the mask means that the relative position between the substrate on which the mask is set and the head and the area is changed. Or move both.
- a substrate refers to a target on which conductive balls are mounted, and includes a semiconductor wafer, a circuit board, a transfer substrate, and other work pieces.
- An area trajectory is the portion or path that the area has passed through as it moves across the surface of the mask. In addition, the passage of the area does not require that the opening of the portion corresponding to the trajectory of the mask has a clear mark indicating that it has passed on the surface of the mask or the like that is filled with conductive balls. .
- the conductive ball on the mask moves while being held in a limited area rather than simply moving. This prevents the conductive balls from freely spreading on the surface of the mask and limits the range in which the conductive ball population exists. Therefore, with a relatively small number of conductive balls, the density of the conductive balls in the area can be increased, and the conductive balls can be efficiently filled into the opening of the mask in the portion through which the area passes. For this reason, the incidence rate of filling mistakes can be reduced. Then, by moving the area with a high filling rate so that a part of the track overlaps, the entire surface of the mask can be covered without omission and the occurrence rate of filling mistakes of the conductive balls can be extremely reduced.
- the number of conductive balls to be held in a limited area on the mask is compared with the amount of fine particles required to uniformly fill the opening of the entire mask. Rub If there is very little. Therefore, the amount of conductive balls that can be damaged by moving on the mask is reduced, and the amount of conductive balls that are lost when filling is reduced.
- the entire surface of the mask is covered without omission by moving an area having a high filling rate so that a part of the locus thereof overlaps.
- moving the area will reveal a newly filled opening.
- the conductive balls held in the area are in a fresh state. Can be kept in.
- a new conductive ball can be refilled in the area and filled into the opening of the force mask, shortening the lifetime (time to be consumed) until it is placed in place on the substrate, and the mask
- the variation in the lifetime of the conductive ball until it is filled in the opening of the metal can be reduced.
- the area can be moved in a zigzag or sine curve.
- the area may be moved spirally or spirally.
- the overlap rate of adjacent portions of the trajectory By setting the overlap rate of adjacent portions of the trajectory to 50% or more, the mask surface can be finally covered with an overlap rate of 100% or more depending on the area.
- the overlapping rate of the adjacent parts of the trajectory is increased, the number of balls filled in the opening decreases as the area moves, the lifetime increases, and the probability of damage to the balls increases. Therefore, high-quality conductive balls can be filled without mistakes in the mask openings where it is desirable that the trajectory overlap ratio be about 50%. Improves the probability of filling.
- the conductive ball may be filled so as to drop into the mask opening due to gravity, that is, its own weight. desirable. If the conductive ball is continuously pushed in one direction, a large number of balls may concentrate and the balls may interfere with each other and not drop into the opening. Furthermore, it is not preferable to force the ball in such a state into the opening with a squeegee.
- the present invention by holding a conductive ball in an area, the area can be moved in any direction. At the same time, it is possible to prevent the conductive balls from being unevenly distributed in the area by appropriately changing the moving direction of the area. Therefore, filling of the conductive ball into the opening due to its own weight can be promoted.
- One way to hold a conductive ball in an area is to enclose the area so that the area force ball does not escape.
- the effort to enclose the area force ball so that it does not escape completely creates several problems. For example, it is necessary to apply pressure so that the means for moving the ball, such as a squeegee, comes into close contact with the surface of the mask, which may cause the ball filled in the opening to pop out or damage the mask. is there. Also, if the ball escapes from the area force, the ball may remain on the mask or become a lost ball and adhere to an unexpected place on the substrate.
- the group of conductive balls is held in the area by using the head to pull the conductive balls from the periphery of the area toward the area. That is, in one form of the present invention, a mask having a plurality of openings for disposing conductive balls on a substrate is set on the substrate, and a head movable along the surface of the mask is used. In this mounting method, a conductive ball is collected in a partial area on the surface of the mask, and the surrounding force of the area is collected and the filling process moves in the area. Also, one form of the present invention includes a head for holding a group of conductive balls in a partial area of the mask surface, and a head support means for supporting the head so as to move along the surface of the mask. A filling device having
- the shape of the area where the conductive balls are easily collected by force toward the area is a circle or a polygon circumscribing the circle.
- force the area around The head can be vibrated to sweep the sex balls.
- the conductive balls can be swept up by blowing air or other gas from the head in the area where the balls are filled.
- One preferred method for collecting the conductive balls is to collect the conductive balls by rotating the head to force the conductive balls toward the central area of the head. By rotating the head around an axis perpendicular to the mask, moving the vertical axis along the surface of the mask and collecting the conductive balls in the area by rotating the head, the conductive ball population is collected. Can be moved while holding in the area.
- the head support means of the filling apparatus of the present invention includes means for rotating the head about an axis perpendicular to the mask and means for moving the vertical axis along the surface of the mask. Is desirable.
- the head includes means for collecting the conductive balls by moving the conductive balls in the direction of a concentric circular area (inner circle) around the rotation center of the head by the rotation of the head. It is desirable.
- the means for collecting the conductive balls may use a repulsive force as long as it is a magnetic body or a charged body.
- One preferred means of gathering is a member that also projects head force, or a sweeper that sweeps the surface of the mask around a circular area by blowing a gas.
- the sweeper may be any arrangement or shape that moves the conductive ball in the direction of the area. For example, there are a spirally curved shape, a shape oriented toward the center of rotation with respect to the radial direction, and the like.
- One form of the member protruding from the head is a so-called squeegee that provides an effect of sweeping the surface of the mask.
- the tangentially extending shape of the circular area collecting the conductive balls is one of the simple straight-line shaped squeegees.
- the member blown out by the head force or the gas blown from the head card also functions to hold the mask around the area against the substrate.
- the substrate on which the conductive balls are mounted is a semiconductor device wafer or workpiece ( ⁇ - In the case of a peacock), the substrate tends to increase in size, and the mask increases in size accordingly.
- conductive balls tend to be smaller. Examples of conductive balls are solder balls, gold balls, or copper balls with a diameter of about 30 to 300 / ⁇ ⁇ . is there. Therefore, when mounting the ball on the substrate, it is important to reduce the influence of the gap generated between the substrate and the mask due to distortion and warpage of the mask.
- the mask While it is relatively easy to obtain surface accuracy by sucking from the back side of the substrate, it is difficult to obtain surface accuracy because the mask cannot be reinforced both front and back. In particular, it becomes difficult to eliminate distortion and warping when the mask is large, and when the ball is small in diameter, the ball may enter a minute gap and become a lost ball. In addition, it is desirable that the mask is in close contact with the conductive ball, but the substrate may be printed with flux for mechanically and electrically connecting the ball, and the mask is in close contact with the substrate. This may not be desirable.
- the flatness of the mask is partially reduced by pressing around the area that is a part of the mask surface. Improve .
- the flatness of the mask is improved within a limited area where the conductive balls are filled, so that it is possible to prevent the occurrence of lost balls.
- by collecting and holding the conductive balls in the area even if there are gaps in other areas of the mask, it is possible to prevent the formation of lost balls. Therefore, one form of the mask used in the mounting method and apparatus of the present invention has such flexibility that the flatness is improved by being pressed by the member protruding from the head or the gas blown from the head. It is a thing.
- FIG. 1 is a plan view showing a schematic configuration of a ball mounter of the present invention.
- FIG. 2 is a side view showing a schematic configuration of a head.
- FIG. 3 is a view showing the structure of the head with upward force also transmitted.
- FIG. 4 is a cross-sectional view showing the configuration of the head.
- FIG. 5 is an enlarged view of the squeegee.
- FIG. 6 is a diagram showing an example of a locus of a circular area constituted by the head, and Fig. 6 (b) is an enlarged view showing a part of the locus.
- FIG. 7 is a view showing another example of a locus of a circular area formed by the head.
- FIG. 8 (a) is a diagram showing another example of a locus of a circular area constituted by the head.
- Fig. 8 (b) is an enlarged view of a part of the locus.
- FIG. 9 (a) is a perspective view showing a different example of the head
- FIG. 9 (b) is a view showing the configuration of the head with an upward force.
- FIG. 10 (a) is a perspective view showing still another example of the head
- FIG. 10 (b) is a diagram showing the configuration of the head with upward force transmission.
- FIG. 11 (a) is a perspective view showing still another example of the head
- FIG. 11 (b) is a diagram showing the configuration of the head with upward force transmission.
- FIG. 12 is a view showing a further different example of the head by a partially enlarged cross-sectional view.
- FIG. 13 is a diagram showing a further different example of the head by a partially enlarged cross-sectional view.
- FIG. 14 is a diagram showing the configuration of a further different example of the head with the upward force also transmitted.
- FIG. 1 shows a schematic configuration of an example of the mounting apparatus of the present invention.
- This mounting apparatus 1 is called a ball mounter and is for placing conductive balls at predetermined positions on a semiconductor substrate (wafer or workpiece) 10.
- the current wafer 10 is often about 8 inches or 12 inches in diameter.
- the conductive ball mounted on the substrate 10 has been miniaturized, and it has been studied to mount a ball having a diameter of lmm or less and a diameter of about 10 to 500 / ⁇ ⁇ . Currently, the diameter is 30 to 300 It is required to mount a ball of about ⁇ m.
- the conductive ball includes a solder ball, a metal ball such as gold or silver, a ceramic ball, or a plastic ball that has been subjected to a treatment such as conductive plating.
- This ball mounter 1 has a table (table) 2 for setting the substrate 10 in a horizontal state in which the warp has been corrected by a method such as suction, and a conductive ball placed at a predetermined position on the substrate 10.
- a mask nozzle (mask carrier) 3 for setting a mask 11 having a plurality of openings on the substrate 10 and a filling device 5 for filling the openings of the mask 11 with conductive balls.
- the mask handler 3 includes a transport unit 31 for moving the mask 11 between the substrate 10 and a retracted position indicated by a broken line, and positions of the substrate 10 and the mask 11. Alignment unit 32 for matching. Even if the device for setting the mask 11 on the substrate 10 fixes the position of the mask 11, and the substrate 10 moves up and down and Z or horizontally, the mask 11 and the substrate 10 are aligned. good.
- the mask 11 includes a plurality of openings having a size suitable for inserting minute conductive balls one by one.
- the substrate 10 typically includes a plurality of semiconductor devices, and the plurality of openings in the mask 11 have a repetitive design that follows the rules for placing conductive balls in place on those semiconductor devices. Formed.
- These openings provided in the mask 11 are referred to as openings, pattern holes, opening patterns, and the like. In this specification, when describing a plurality of openings, they are referred to as opening patterns. There are things to do.
- the filling device 5 moves along the surface 11a of the mask 11 set on the substrate 10, and a head 20 for filling the openings of the mask 11 with conductive balls, and the head 20 on the mask 11 And a head support device 50 for supporting the surface 1 la so as to be movable in any direction.
- the head support device 50 includes a motor 56 that supports rotation about an axis 55 that is perpendicular to the mask 11, and a carriage 52 that supports the motor 56 via an arm 53 that can expand and contract in the Y direction.
- the carriage 52 moves along the carriage shaft 51 in the X direction. Therefore, the head 20 can set the surface 11a of the mask 11 at an arbitrary position in the XY direction from the arm 53, the carriage 52, and the carriage shaft 51 of the support device 50. Further, the support device 50 can move the head 20 so as to draw an arbitrary trajectory along the surface 11 a of the mask 11.
- the mounting apparatus 1 includes a step of setting a mask 11 having a plurality of openings 12 for disposing conductive balls on a substrate 10 and a head 20 that moves along a surface 11a of the mask 11. And filling the opening 12 of the mask with the conductive ball, and mounting the conductive ball at a predetermined position of the substrate 10.
- a mask 11 having a plurality of openings 12 for disposing conductive balls on a substrate 10 and a head 20 that moves along a surface 11a of the mask 11.
- filling the opening 12 of the mask with the conductive ball and mounting the conductive ball at a predetermined position of the substrate 10.
- FIG. 2 shows an enlarged view of the head 20 of the filling device 5 as seen from the side force.
- the head 20 includes a disk-shaped squeegee support 21 and six sets of squeegees 22 protruding from the lower surface 21a of the squeegee support 21 toward the surface 11a of the mask 11. Squeegee Sapo
- the center of the seat 21 is connected to a shaft 55 extending perpendicularly to the mask 11!
- the head 20 is driven to rotate clockwise around the shaft 55 by the motor 56 when the squeegee support 21 is viewed from above.
- the motor 56 serves as means for rotationally driving the squeegee support 21 along the surface 1 la of the mask 11 with the shaft 55 as the center.
- the shaft 55 is driven by the arm 53, the carriage 52 and the carriage shaft 51. Moved along surface 1 la in any direction of XY. Therefore, the head support device 50 can move the head 20 so as to draw an arbitrary locus on the surface 11a of the mask 11 while rotating the head 20.
- a ball supply device 60 mounted on the carriage 52 is a ball supply device 60 for supplying conductive balls to the mask 11 through the inside of the shaft 55 with the central force of the squeegee support 21.
- FIG. 3 shows the arrangement of six sets of squeegees 22 attached to the lower surface of the squeegee support 21 in a state where the squeegee support 21 is seen through the upward force.
- FIG. 4 shows the configuration of the head 20 by a cross section cut in the diameter direction of the squeegee support 21.
- the 6-set squeegee 22 includes a plurality of sweep members 23 each attached so as to be rectangular when viewed from above. The sweep member 23 only needs to be able to relatively softly contact the surface 11a of the mask 11 and sweep up the conductive balls 15 remaining on the surface 11a.
- These squeegees 22 are linearly arranged around the inner circle 26 that is concentric with the rotary shaft 55, in a circumferentially equal pitch, in a clockwise direction tangential to the inner circle 26, up to the outer circle 27. It is arranged to extend. Therefore, when the squeegee 22 is in contact with the surface 11a of the mask 11 and the squeegee support 21 is rotated clockwise as viewed from above, the conductive balls 15 in the traveling direction (rotation direction) of the squeegee 22 are Push away in the direction of the inner circle 26, as in 18. Therefore, the conductive balls 15 remaining on the surface 11 a of the mask 11 are moved in the direction of the inner circle 26 and collected inside the inner circle 26.
- the areas shown as the inner circle 26 and the outer circle 27 are virtual. It is a thing. However, when the head 20 is moved on the surface 11a of the mask 11 while being rotated by the head support device 50, the excessive conductive balls remaining on the mask 11 within the range of the inner circle 26 and the outer circle 27 are left. 15 are collected in the direction of the inner circle 26 at the center of the head 20. Since the plurality of squeegees 22 are arranged in multiple directions in the direction of rotation (traveling direction), the conductive balls 15 that protrude around the inner circle 26 due to the movement of the head 20 are successively located within the destination. Collected in the direction of circle 26.
- the conductive ball 15 is held in the circular area 26 around the center of rotation of the head 20, and the circular area 26 moves along with the movement of the head 20, and the plurality of conductive balls 15 held therein are moved. Group 16 also moves.
- the virtual circular area 26 in the center of the head 20 has a partial area 26 on the surface 11a of the mask 11 on which the group 16 of conductive balls 15 is held. In other words, the movement of the head 20 moves the area 26.
- FIG. 5 shows an enlarged view of the state where the tip of the squeegee 22 is in contact with the surface 11 a of the mask 11.
- Each squeegee 22 includes a plurality of sweep members 23, which are arranged in a multiple manner in the traveling direction of the squeegee 22.
- the plurality of sweep members 23 are attached to the support 21 so that the front end of the squeegee 22 that contacts the surface 1 la of the mask moves backward.
- the sweep member 23 moves by gently pushing or sweeping the conductive ball 15 on the mask 11 in the direction of the circular area 26 inside the traveling direction A. Therefore, a group 16 of conductive balls 15 is formed and maintained in a circular region 26 inside the head 20.
- the ball 15 collected in the area 26 falls by its own weight into the opening 12 of the mask 11 in the area 26, and the opening 15 is filled with the ball 15.
- the surface of the substrate 10 is screen-printed with soldering flux 17 in advance corresponding to the opening pattern 12 of the mask 11. Therefore, the conductive ball 15 filled in the opening 12 is in close contact with the flux 17 and temporarily fixed at a predetermined position on the substrate 10. Thereafter, the substrate 10 on which the conductive ball 15 is mounted is fixed to the substrate 10 through a known reflow process.
- balls 15 for filling a limited area of a circular area 26 are always collected. Therefore, by monitoring the state of the conductive balls 15 collected in the area 26, the situation where the balls 15 are filled in the openings 12 of the mask 11 is controlled. can do. For example, the conductive ball 15 held in the area 26 is consumed by filling the opening 2. For this reason, the balls 15 are thrown into the area 26 from the ball supply device 60 based on the amount of balls consumed. For example, the balls 15 can be supplied at predetermined time intervals based on the amount of balls consumed per hour. Therefore, the density of the population 16 of the conductive balls 15 in the area 26 is maintained, and the decrease in the probability of filling the opening 12 due to the decrease in the ball density is prevented.
- the ball supply device 60 mounted on the carriage 52. It is also possible to provide a mechanism for periodically renewing the ball 15. If the situation continues for a long time without being transferred to the opening 12 of the mask 11, the ball 15 may be damaged due to factors such as contact and wear. The balls 15 held in the area 26 can be collected to remove such degraded balls and only normal balls 15 can be returned to the area 26 for filling.
- An appropriate area of the area 26 that moves while holding the ball 15 varies depending on conditions such as the diameter of the conductive ball and the density of the openings of the mask 11. If the diameter of the conductive ball 15 is about 10 to 500 ⁇ m, it is desirable to use a head 20 that can form a circular area 26 having a diameter of 10 to 100 mm on the mask. If the area 26 for holding the ball is too small, the time required to fill the entire mask opening with the ball will increase. Therefore, the diameter of the area 26 is preferably 10 mm or more. On the other hand, if the area 26 is too large, the movement of the ball 15 inside the area 26 becomes insufficient, and the density unevenness of the ball 15 held inside the area 26 becomes large. Therefore, the diameter of the area 26 is preferably 100 mm or less. A more preferable range of the circular area 26 is 20 to 60 mm.
- the rotational speed of the head 20 is preferably 10 rpm or more.
- the rotation speed of the head 20 is 120rp m or less is preferable.
- a more preferable range of the rotation speed of the head is 30 to 90 rpm.
- the head 20 has a circular area 26 in which balls are collected, the diameter of which is 40 mm, and the rotation speed is 45 rpm.
- the head support device 50 of the filling device 5 can move the head 20 in any direction of the XY plane with the surface 1 la of the mask 11 as the XY plane. Further, the moving direction of the head 20 can be dynamically changed arbitrarily. Furthermore, the head 20 can hold and hold the conductive ball 15 in the circular area 26 by rotating regardless of the moving direction of the head 20. For this reason, the filling device 5 can move the area 26 in any direction of the surface 11a of the mask 11 while holding the conductive ball 15 in the circular area 26, and can move the movement direction in any direction. Can be changed dynamically.
- FIG. 6 (a) schematically shows an example in which the head 20 is moved on the surface 11a of the mask 11 so as to draw a spiral or spiral trajectory.
- the circular area 26 to fill the ball 15 also moves along the entire surface of the mask 11 with a spiral or spiral trajectory 71 and places the conductive ball 15 in place on the substrate 10.
- the spiral or spiral locus 71 is suitable when the substrate 10 is circular, the mask 11 is circular, or the entire region filled with the conductive balls 15 is circular.
- the movement locus 71 of the area 26 is represented by a line on which the rotation center moves.
- the head 20 and the area 26 are both shown in the same circle.
- the area 26 is formed concentrically with the head 20 and has the same size. It is not a thing.
- the trajectory of the area 26 indicates a trace or path having a width in which the area 26 that does not indicate the movement of the center moves on the surface 11a of the mask 11.
- trajectory of area 26 shows some trace on the surface 11a of the mask 11, even though it can be said that the trace is physically left as a result of the mask opening 12 being filled with conductive balls 15. It doesn't have to be a thing.
- One of the specific forms of the trajectory of the area 26 is a program for automatically moving the head 20 to the head support device 50 of the filling device 5 and given as a function Is.
- FIG. 6 (b) shows a part of the locus 71 in an enlarged manner.
- the head 20 is driven by the head support device 50 of the filling device 5 so that a part of the trajectory of the area 26 overlaps.
- the trajectory 71 is selected such that adjacent portions T (n) and ⁇ ( ⁇ + 1) of the trajectory 71 overlap by almost 50%.
- the area 26 consequently moves over the entire surface of the mask 11 with a 100% overlap rate and fills the openings 15 in the mask 11 with the balls 15.
- FIG. 7 shows different examples of the trajectories of the head 20 and the circular area 26.
- the head 20 is driven to move the area 26 so as to draw a zigzag, sine curve or meandering trajectory 72, and the area 26 covers the entire surface 1 la of the mask 11! / RU Even when this locus 72 is employed, it is desirable to set the overlap rate of adjacent portions of the locus 72 appropriately as described above.
- a conductive ball 15 is arranged on a rectangular electronic circuit board 80 with a mask 81 having a filling region that is rectangular in its entirety.
- the area 26 is moved so as to draw a zigzag, sine curve, or meandering locus 73 by driving the head 20, and the area 26 covers the entire surface 81a of the mask 81.
- the adjacent portions T (n) and ⁇ ( ⁇ + 1) of the locus 73 overlap by about 50%.
- the zigzag trajectory 73 is one of the trajectories suitable for covering a rectangular filling area.
- a spiral trajectory that draws a route along the outer periphery of the square is one of the trajectories that is suitable for covering the rectangular filling region.
- the moving speed of the head 20 is preferably in the range of 2 to 60 mmZs, and more preferably in the range of 5 to 40 mmZs. In the filling device 5 of this example, the moving speed of the head 20 is set to 20 mm Zs.
- the inner surface of the mask 11 1 la, the inner circle area 26 of the head 20, and the limited portion are conductive. Hold the ball 15.
- the conductive ball 15 is filled in the opening 12 of the mask 11 while moving the area 26 on the surface 1 la of the mask so that a part of the locus 51 overlaps, and the ball 15 is arranged at a predetermined position of the substrate 10 as a workpiece.
- This filling device 5 collects the balls on the mask to fill the next opening instead of letting the balls that have not filled the opening escape from the mask, thus preventing the conductive ball 15 from being wasted or wasted. it can.
- the opening (opening density) of the area to be filled can be obtained without supplying a huge amount of balls 15 at once. )
- the area can be covered by a sufficient amount (a sufficient excess) of a group 16 of balls 15. That is, in a small area 26 on a part of the surface of the mask, while collecting excess balls around it, and tracking the consumed balls, Maintain a sufficient excess rate of 15.
- This method makes it possible to reduce the ball loss rate with respect to the opening 12 of the entire mask, prevent the balls 15 from being wasted, and obtain a high filling rate.
- the head 20 of the filling device 5 can collect the conductive balls 15 in the inner circular area 26 by rotating the squeegee support 21 without being influenced by the moving direction of the head 20. Therefore, the function (capability) of collecting the ball 15 of the head 20 in the inner circle area 26 does not change even if the head 20 is moved in any direction of X—Y on the mask 11. Thus, whenever the head 20 is moving, excess balls 15 on the mask 11 around the area 26 are collected in the inner circle area 26. In addition, the distribution of the entire ball 15 in the inner circle area 26 where the balls 15 are not allowed to gather at a part of the inner circle area 26 is almost uniform, and the area 26 having a two-dimensional extent 26 As a result, the conductive balls 15 can be filled into the opening pattern 12.
- zone 26 the concentration of extreme balls 15 is almost constant and the excess ratio of balls 15 and the extreme imbalance of distribution are almost constant. For this reason, by moving the area 26 so that a part of the trajectory overlaps, it is possible to reliably reduce filling mistakes without duplicating the whole trajectory.
- a head 20 that, by rotating, captures a force moving in the direction of the area 26 relative to the conductive ball 15 is one of the most preferred embodiments of the present invention.
- a method of conducting the ball in the direction of the area 26 there is a system in which the head is vibrated and the ball 15 is swept in the direction of the area 26 by a squeegee attached under the head.
- the area 26 is not limited to a circle but a polygon that circumscribes the circle. If area 26 is polygonal, the ability to collect ball 15 may be inferior depending on the direction of head movement.
- the circular area 26 is superior in that the ability to collect and hold the ball 15 in the direction of movement of the head 20 is not superior or inferior, and the direction of movement of the head 20 can be arbitrarily selected.
- the squeegee 22 of the head 20 of the filling device 5 collects the balls 15 from around the filling area 26 and presses the portion corresponding to the filling area 26 of the mask 11 to make it flat (capacity). ). As shown in FIG. 3, the squeegee 22 is disposed between the inner circle 26 and the outer circle 27 of the head 20, that is, around the circumference 28 of the circular area 26. Squeegee 22 ahead The ends are pressed against the surface 11a of the mask 11 with an appropriate pressure in order to collect the balls 15 remaining on the surface 11a of the mask 11 without leaving them. Therefore, even if the area 26 of the mask 11 is warped or distorted, it can be corrected to a flat (horizontal) state by pressing the area 28 around the area 26 with the squeegee 22.
- the mask 11 is a thin plate-like member having a thickness similar to that of the ball 15 in order to prevent the balls from being overfilled. Therefore, while warping and distortion are likely to occur, warping and distortion can be corrected by pressing the squeegee 22 against the mask surface 11a with an appropriate pressure. If the mask 11 is warped or distorted, a gap is generated between the substrate 10 and the mask 11. If the substrate 10 is held on the highly parallel table 2 by the vacuum suction method, the warpage and distortion can be corrected and the surface can be made parallel.
- the mask thickness is several millimeters and the mask strength is high. Therefore, it is difficult for warpage and distortion to occur, and it is not easy to force warpage with the pressure applied by the squeegee when there is warpage or distortion. Furthermore, if the ball diameter is several mm, the ball does not get lost even if the gap between the substrate and the mask can be adjusted in mm units. However, if the ball diameter is in ⁇ m units, the gap between the substrate and the mask must be adjusted in ⁇ m units. In order not to generate a gap between the mask 11 and the substrate 10, it is desirable that the mask 11 is completely adhered to the substrate 10. However, the substrate 10 is printed with a flux 17 for fixing the balls 15. ing. Therefore, it is preferable that the mask 11 and the substrate 10 are completely adhered to each other.
- the portion of the mask that the squeegee strikes may not have a force that can correct the distortion and warpage of the mask.
- the ball is accumulated by being pushed by the squeegee and the mask portion cannot be corrected, and there is a gap that allows the ball to move between the substrate and the mask, the mask Since the ball filled in the opening of the ball passes through the mask, the ball cannot be placed at a predetermined position on the substrate.
- the ball that passes through the mask strays on the surface of the board and is not intended. However, it may be disposed between the mask and the substrate, and may interfere with filling the other openings with balls.
- the periphery of the area 26 where the conductive balls 15 are present is pressed by the squeegee 22 of the head 20 of the filling device 5 of this example. Therefore, in the area 26 where the conductive ball 15 exists, the level of the mask 11 is corrected, the mask 11 and the substrate 10 are kept parallel, and the ball 15 does not flow out of the gap between them. Can be a value. Head 20 force S In the part after moving, the mask 11 may be bent or return to the warped state. While doing so, the conductive balls 15 are collected in the area 26 and move with the head 20.
- the conductive ball 15 is not left after the head 20 is moved, and even if the mask 11 is distorted or warped, there is no fear that the conductive ball 15 is lost. Further, the conductive ball 15 filled in the opening 12 of the mask 11 is held at a predetermined position by the flux 17 on the surface of the substrate 10. Therefore, there is no problem even if the head 20 moves and the surface of the mask 11 is lifted up. As described above, in the filling apparatus 5 of this example, the fine particles can be reliably arranged at a predetermined position of the workpiece 10 without any error without being affected by the warp or distortion of the mask 11.
- the member 23 constituting the squeegee 22 may be any member as long as it can push the fine particles such as conductive balls functioning as connection terminals of the semiconductor device with an appropriate force and can sweep the region 26 to the force. . Further, it is desirable that the sweep member 23 is provided with an elasticity that does not squeeze out the ball 15 once inserted into the opening 12.
- One suitable sweep member 23 is made of grease extending in the longitudinal direction of the squeegee 22 as shown in FIGS. 3 to 5 and is a metal wire. In the member 23 having a configuration in which both ends of the wire extending in the longitudinal direction along the surface of the mask 11 are bent into a U shape and attached to the squeegee support 21, the abdomen of the U shape wire is in contact with the mask 11.
- the U-shaped wire 23 is pressed against the mask 11 with appropriate elasticity without damaging the mask 11, and enters the hole of the mask 11 to move the ball 15 into the tip of the wire. Don't start out! Further, since the U-shaped wire 23 extends in a direction perpendicular to the traveling direction of the squeegee 22, it is suitable as a member for pushing off the ball 15. Wires 23 placed in multiple or multiple layers on one squeegee 22 are securely in contact with the mask 11 and securely Suitable for sweeping ball 15. Also, the plurality of squeegees 22 arranged around the circular area 26 of the head 20 collect the balls 15 evenly around the area 26, and further securely hold the mask 11 around the area 26. Suitable for
- FIGS. 9 to 14 show different examples of the head.
- FIG. 9A shows a state in which the side force on the bottom surface of the head 20a of another example is also seen
- FIG. 9B shows the state in which the head 20a is seen through the upward force of the squeegee support 21 as well.
- the head 20a includes a squeegee support 21 and twelve squeegees 22a projecting from the lower surface 21a to the surface 11a of the mask 11 by force.
- This head 20a can be used by being attached to the head support device 50 of the filling device 5 instead of the head 20 described above.
- Each squeegee 22a is a bundle of a plurality of ultrafine wires, and is configured to function as a single squeegee by applying force to both ends 22r.
- the squeegee 22a is formed in a U shape as a whole, and is attached around the inner circle 26 of the back surface 2 la of the support 21 so as to extend almost in the tangential direction of the inner circle 26! /
- FIG. 10 (a) shows a state in which the side force on the bottom surface of the head 20b of another example is seen
- FIG. 10 (b) shows the head 20b in a state seen through the upward force of the squeegee support 21.
- the head 20 b includes a squeegee support 21 and seven sets of squeegees 22 b protruding from the lower surface 21 a toward the surface 11 a of the mask 11.
- the head 20b can be used by being attached to the head support device 50 of the filling device 5 instead of the head 20 described above.
- These squeegees 22b are formed by laminating a plurality of polyimide thin plates in a U shape.
- Examples of this type of squeegee include one using a single sheet of resin or metal, or one using layers.
- a suitable example of a squeegee is made of metal.
- the plastic squeegee be coated with a conductive thin film such as a copper foil on the surface, or to provide conductivity by containing carbon.
- the tip of the squeegee that touches the mask 11 may be an edge. If the squeegee is composed of a thin film, the folded surface may be in contact with the mask 11 by folding the thin film.
- Fig. 11 (a) shows a state in which the head 20c of another example is seen from the side force on the bottom surface
- Fig. 11 (b) shows the head 20c seen through the upward force of the squeegee support 21. It is.
- This head 20c is directed toward the surface 11a of the mask 11 from the squeegee support 21 and its lower surface 21a.
- This head 20c can also be used by being attached to the head support device 50 of the filling device 5 in place of the head 20 described above.
- the squeegee As another example of the squeegee, mention may be made of an ultrafine wire or metal wire attached to the squeegee support 21 like brush hair.
- the number of squeegee sets is not limited to the above.
- setting the squeegee in the tangential direction of the inner circle 26 is one of the preferred forms of the present invention, but the present invention is not limited to that form.
- the form of the squeegee only needs to function as a sweeper that sweeps the ball 15 in the direction of the inner circle 26 by rotating the head 20.
- the squeegee that can be arranged obliquely with respect to the tangential direction of the inner circle 26 can be curved or spiraled.
- FIG. 12 shows a further different head 20d configuration.
- the head 20d includes an air nozzle 92 that blows a gas 91 for sweeping the ball 15 onto the surface 11a of the mask 11.
- This head 20d can also be used by being attached to the head support device 50 of the filling device 5 instead of the head 20 described above.
- the air nozzle 92 is attached to the support 21 instead of the squeegee.
- An example of the air nozzle 92 is provided with a linear nozzle end 93 extending to the outer circle 27 in the tangential direction of the inner circle 26 of the back surface 21a of the support 21 like each type of squeegee shown in the above drawing. It is.
- a filter 94 made of sintered metal or the like is attached to the nozzle end 93, and air 91 is jetted obliquely downward toward the surface 11 a of the mask 11 through the filter 94. Therefore, the blown air 91 flows in the direction of the inner circle 26 on the surface 11a of the mask 11. For this reason, the head 20 can be moved while the conductive balls 15 are blown away in the direction of the inner circle area 26 by the air 91. Further, the pressure of the air 91 blown to the mask surface 11a can suppress the mask surface 1la around the area 26 where the ball is filled, thereby correcting the distortion and warping of the mask 11.
- the air discharge portion of the air nozzle 92 may be configured by a collection of slits and minute cylindrical holes instead of the filter 94. It is also effective to use an inert gas combined with nitrogen gas or argon gas or ionized gas to control the charging property of the conductive ball instead of air 91.
- the ball 15 can be driven by the pressure of air. Therefore, the filling device 5 can collect the balls 15 in the filling area 26 only by moving the head 2 Od in an arbitrary direction by the head support device 50 without rotating the head 20d. It is also possible to rotate the head 20d and bring it into the area 26 of the inner circle. Therefore, the filling device 5 using only the head 20d that blows out the gas can omit the motor 56 that rotationally drives the head, and the configuration of the head support device 50 can be simplified.
- FIG. 13 shows a different example of a head that blows air.
- the head 20e includes a squeegee support 21 and a squeegee-type nozzle 92 protruding from the lower surface 21a toward the surface 11a of the mask 11.
- the nozzle 92 is formed of, for example, an elastic member such as rubber, and presses the mask in contact with the surface 11a of the mask 11.
- Nozzle 92 has an inward outlet 93 that collects conductive balls 15 in area 26 by inwardly releasing air 91.
- the head 20e can also be used by being attached to the head support device 50 of the filling device 5 instead of the head 20 described above.
- the conductive ball 15 can be moved by the air 91 blown out, the conductive ball 15 can be collected without rotating the head.
- the substrate 10 shown in FIG. 13 includes a conductive layer 10a on the surface thereof, and the conductive layer 10a is covered with a protective film 13, and a conductive ball 15 is attached thereto. Part of the resist 13 has been removed by etching or the like. Therefore, the mask 11 can be set on the substrate 10 so as to be in close contact with the resist layer 13. Then, the conductive balls 15 filled in the openings 12 of the mask 11 are mounted with electrical contact on the surface 10a of the substrate, and the individual conductive balls 15 function as connection terminals.
- FIG. 14 shows a state in which another example of the head is viewed through the upward force of the squeegee support.
- the head 20f includes a rectangular squeegee support 21 and two sets of squeegees 22f having a V shape in plan view extending from the back surface 21a of the squeegee support 21 toward the front surface 11a of the mask 11.
- the two V-shaped squeegees 22f are attached to the support 21 so that a square area 26 is formed therebetween. Therefore, the conductive ball 15 is squeezed 2 by vibrating the head 20f in the horizontal direction of the drawing. In the area 26 between 2f, the conductive balls 15 are filled in the openings 12 of the mask 11 by their own weight.
- the distortion of the mask 11 is corrected.
- the head 20f can move in any direction in the XY plane while holding the conductive ball 15 in the area 26 while vibrating. Since the conductive balls 15 are collected while vibrating the squeegee 22f, the distribution of the conductive balls 15 in the area 26 can be reduced.
- the shape of the area 26 where the conductive balls 15 are collected has a clear shape in most cases because the head rotates or vibrates (oscillates), and the head moves in an arbitrary direction. It does not become a geometric figure with a simple boundary.
- the area 26 can be said to be substantially circular.
- the area 26 can be said to be a circle depending on the shape of the squeegee or a polygon circumscribing the circle.
- the polygons of the present invention are not limited to squares, but include triangles and polygons that are pentagons or more.
- the head of the present invention moves the surface of the mask while holding the conductive balls for filling in a two-dimensional area having a limited spread, and one suitable form thereof is Also, the peripheral forces in the filling area can sweep away the conductivity. Then, by moving the head surface of the mask so that a part of its trajectory overlaps, the conductive ball can be efficiently filled into the opening of the entire mask, and filling errors can be reduced.
- the ball mounter 1 in this example is a device that transports the substrate 10 and sets it on the table 2 in addition to the force with which the mask handler 3 and the filling device 5 are mounted. It is also possible to mount a device or the like. With these apparatuses, it is possible to perform a process of setting a substrate on a table, a process of applying a flux, and the like prior to a process of setting a mask and a process of filling a ball. It is also possible to provide a system that performs these processes in series.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Ceramic Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020067027841A KR101145023B1 (ko) | 2004-06-30 | 2005-06-30 | 도전성 볼의 탑재방법 및 장치 |
JP2006528815A JP4557979B2 (ja) | 2004-06-30 | 2005-06-30 | 導電性ボールの搭載方法および装置 |
CN2005800219357A CN1977369B (zh) | 2004-06-30 | 2005-06-30 | 安装导电球的方法和设备 |
US10/576,787 US20070130764A1 (en) | 2004-06-30 | 2005-06-30 | Method and apparatus for mounting conductive ball |
US12/484,516 US8387236B2 (en) | 2004-06-30 | 2009-06-15 | Apparatus for mounting conductive balls |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-192364 | 2004-06-30 | ||
JP2004192364 | 2004-06-30 | ||
JP2004369087 | 2004-12-21 | ||
JP2004-369087 | 2004-12-21 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/576,787 A-371-Of-International US20070130764A1 (en) | 2004-06-30 | 2005-06-30 | Method and apparatus for mounting conductive ball |
US12/484,516 Division US8387236B2 (en) | 2004-06-30 | 2009-06-15 | Apparatus for mounting conductive balls |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006004000A1 true WO2006004000A1 (ja) | 2006-01-12 |
Family
ID=35782807
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/012095 WO2006004000A1 (ja) | 2004-06-30 | 2005-06-30 | 導電性ボールの搭載方法および装置 |
Country Status (6)
Country | Link |
---|---|
US (2) | US20070130764A1 (ja) |
JP (3) | JP4557979B2 (ja) |
KR (1) | KR101145023B1 (ja) |
CN (2) | CN1977369B (ja) |
TW (1) | TWI273666B (ja) |
WO (1) | WO2006004000A1 (ja) |
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JP2007157740A (ja) * | 2005-11-30 | 2007-06-21 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
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JP2007287893A (ja) * | 2006-04-17 | 2007-11-01 | Athlete Fa Kk | ボール搭載装置およびマスク |
JP2007299835A (ja) * | 2006-04-28 | 2007-11-15 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
JP2007329158A (ja) * | 2006-06-06 | 2007-12-20 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
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JP2008153319A (ja) * | 2006-12-15 | 2008-07-03 | Hitachi Plant Technologies Ltd | スクリーン印刷装置及びバンプ形成方法 |
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Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2007157740A (ja) * | 2005-11-30 | 2007-06-21 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
JP2007157992A (ja) * | 2005-12-05 | 2007-06-21 | Athlete Fa Kk | 導電性ボールの搭載方法、装置、およびその制御方法 |
JP2007287893A (ja) * | 2006-04-17 | 2007-11-01 | Athlete Fa Kk | ボール搭載装置およびマスク |
EP2012569A1 (en) * | 2006-04-26 | 2009-01-07 | Ibiden Co., Ltd. | Method for mounting solder ball and apparatus for mounting solder ball |
US8001683B2 (en) | 2006-04-26 | 2011-08-23 | Ibiden Co., Ltd. | Solder ball loading method |
EP2012569A4 (en) * | 2006-04-26 | 2010-06-02 | Ibiden Co Ltd | METHOD FOR ASSEMBLING A SOLDERING BALL AND DEVICE FOR ASSEMBLING A SOLDERING BALL |
JP2007299835A (ja) * | 2006-04-28 | 2007-11-15 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
JP2007329158A (ja) * | 2006-06-06 | 2007-12-20 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
JP2008042172A (ja) * | 2006-07-12 | 2008-02-21 | Athlete Fa Kk | ボールを充填するための装置および方法 |
JP2008153319A (ja) * | 2006-12-15 | 2008-07-03 | Hitachi Plant Technologies Ltd | スクリーン印刷装置及びバンプ形成方法 |
JP2008182117A (ja) * | 2007-01-25 | 2008-08-07 | Texas Instr Japan Ltd | マイクロボールの振込み方法 |
WO2008090803A1 (ja) * | 2007-01-25 | 2008-07-31 | Texas Instruments Japan Limited | マイクロボールの振込み方法 |
JP2008305893A (ja) * | 2007-06-06 | 2008-12-18 | Shibuya Kogyo Co Ltd | 導電性ボールの配列装置 |
JP2009016695A (ja) * | 2007-07-09 | 2009-01-22 | Athlete Fa Kk | ヘッドおよびボールを充填するための装置 |
JP2010177230A (ja) * | 2009-01-27 | 2010-08-12 | Minami Kk | ボール供給装置 |
JP2011129806A (ja) * | 2009-12-21 | 2011-06-30 | Athlete Fa Kk | ボール誘導装置、ボール誘導方法およびボール搭載装置 |
WO2014207835A1 (ja) * | 2013-06-26 | 2014-12-31 | 千住金属工業株式会社 | はんだボール供給方法、はんだボール供給装置およびはんだバンプ形成方法 |
JP5880785B2 (ja) * | 2013-06-26 | 2016-03-09 | 千住金属工業株式会社 | はんだボール供給方法、はんだボール供給装置およびはんだバンプ形成方法 |
US10722965B2 (en) | 2013-06-26 | 2020-07-28 | Senju Metal Industry Co., Ltd. | Solder ball supplying method, solder ball supplying device, and solder bump forming method |
Also Published As
Publication number | Publication date |
---|---|
TW200601476A (en) | 2006-01-01 |
KR20070029764A (ko) | 2007-03-14 |
CN101944488A (zh) | 2011-01-12 |
US20090307899A1 (en) | 2009-12-17 |
CN1977369A (zh) | 2007-06-06 |
JPWO2006004000A1 (ja) | 2008-04-17 |
US8387236B2 (en) | 2013-03-05 |
JP5490932B2 (ja) | 2014-05-14 |
JP4557979B2 (ja) | 2010-10-06 |
JP2013093636A (ja) | 2013-05-16 |
TWI273666B (en) | 2007-02-11 |
US20070130764A1 (en) | 2007-06-14 |
JP2010206228A (ja) | 2010-09-16 |
CN101944488B (zh) | 2012-09-19 |
KR101145023B1 (ko) | 2012-05-11 |
CN1977369B (zh) | 2010-08-25 |
JP5298274B2 (ja) | 2013-09-25 |
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