WO2005105943A1 - ダイボンディング用樹脂ペースト - Google Patents
ダイボンディング用樹脂ペースト Download PDFInfo
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- WO2005105943A1 WO2005105943A1 PCT/JP2005/002229 JP2005002229W WO2005105943A1 WO 2005105943 A1 WO2005105943 A1 WO 2005105943A1 JP 2005002229 W JP2005002229 W JP 2005002229W WO 2005105943 A1 WO2005105943 A1 WO 2005105943A1
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- Prior art keywords
- resin
- weight
- bis
- parts
- solvent
- Prior art date
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- 229920005989 resin Polymers 0.000 title claims abstract description 79
- 239000011347 resin Substances 0.000 title claims abstract description 79
- 229920001721 polyimide Polymers 0.000 claims abstract description 90
- 239000009719 polyimide resin Substances 0.000 claims abstract description 85
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims abstract description 65
- 239000002904 solvent Substances 0.000 claims abstract description 44
- 150000004985 diamines Chemical class 0.000 claims abstract description 21
- 239000000945 filler Substances 0.000 claims abstract description 17
- 125000006158 tetracarboxylic acid group Chemical group 0.000 claims abstract description 16
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 4
- 125000002947 alkylene group Chemical group 0.000 claims abstract description 3
- 125000000951 phenoxy group Chemical group [H]C1=C([H])C([H])=C(O*)C([H])=C1[H] 0.000 claims abstract description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims abstract description 3
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 claims abstract description 3
- 229920001187 thermosetting polymer Polymers 0.000 claims description 15
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims description 10
- 230000009974 thixotropic effect Effects 0.000 claims description 9
- 239000000126 substance Substances 0.000 claims description 7
- 238000013329 compounding Methods 0.000 claims description 4
- 238000009835 boiling Methods 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 125000004432 carbon atom Chemical group C* 0.000 claims description 3
- -1 siloxane diamine Chemical class 0.000 abstract description 28
- 238000000034 method Methods 0.000 abstract description 17
- 239000007787 solid Substances 0.000 abstract description 6
- 230000001105 regulatory effect Effects 0.000 abstract 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 30
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 21
- 239000000758 substrate Substances 0.000 description 18
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 17
- 239000003822 epoxy resin Substances 0.000 description 15
- 229920000647 polyepoxide Polymers 0.000 description 15
- 125000005591 trimellitate group Chemical group 0.000 description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 12
- 239000000853 adhesive Substances 0.000 description 11
- 230000001070 adhesive effect Effects 0.000 description 11
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 11
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- 230000002087 whitening effect Effects 0.000 description 8
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- 229920003192 poly(bis maleimide) Polymers 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 description 6
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 6
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 239000008096 xylene Substances 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 5
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- 238000006243 chemical reaction Methods 0.000 description 5
- 239000005011 phenolic resin Substances 0.000 description 5
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 4
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 4
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- 229920005575 poly(amic acid) Polymers 0.000 description 4
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- 239000000377 silicon dioxide Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- YFNKIDBQEZZDLK-UHFFFAOYSA-N triglyme Chemical compound COCCOCCOCCOC YFNKIDBQEZZDLK-UHFFFAOYSA-N 0.000 description 4
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 3
- KMKWGXGSGPYISJ-UHFFFAOYSA-N 4-[4-[2-[4-(4-aminophenoxy)phenyl]propan-2-yl]phenoxy]aniline Chemical compound C=1C=C(OC=2C=CC(N)=CC=2)C=CC=1C(C)(C)C(C=C1)=CC=C1OC1=CC=C(N)C=C1 KMKWGXGSGPYISJ-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 229910002012 Aerosil® Inorganic materials 0.000 description 3
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- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- RWRDLPDLKQPQOW-UHFFFAOYSA-N Pyrrolidine Chemical compound C1CCNC1 RWRDLPDLKQPQOW-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 239000002518 antifoaming agent Substances 0.000 description 3
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- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 229930003836 cresol Natural products 0.000 description 3
- 230000018044 dehydration Effects 0.000 description 3
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 3
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 3
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- 238000001035 drying Methods 0.000 description 3
- 239000006023 eutectic alloy Substances 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 238000004898 kneading Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000002243 precursor Substances 0.000 description 3
- 239000001294 propane Substances 0.000 description 3
- 238000010526 radical polymerization reaction Methods 0.000 description 3
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- 229910000679 solder Inorganic materials 0.000 description 3
- IWXCYYWDGDDPAC-UHFFFAOYSA-N 4-[(3,4-dicarboxyphenyl)methyl]phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1CC1=CC=C(C(O)=O)C(C(O)=O)=C1 IWXCYYWDGDDPAC-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229930185605 Bisphenol Natural products 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
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- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
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- 150000001412 amines Chemical class 0.000 description 2
- 150000008064 anhydrides Chemical class 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
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- VHRGRCVQAFMJIZ-UHFFFAOYSA-N cadaverine Chemical compound NCCCCCN VHRGRCVQAFMJIZ-UHFFFAOYSA-N 0.000 description 2
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- DMEGYFMYUHOHGS-UHFFFAOYSA-N cycloheptane Chemical group C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 description 2
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- ZQMIGQNCOMNODD-UHFFFAOYSA-N diacetyl peroxide Chemical compound CC(=O)OOC(C)=O ZQMIGQNCOMNODD-UHFFFAOYSA-N 0.000 description 2
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- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 2
- KZTYYGOKRVBIMI-UHFFFAOYSA-N diphenyl sulfone Chemical compound C=1C=CC=CC=1S(=O)(=O)C1=CC=CC=C1 KZTYYGOKRVBIMI-UHFFFAOYSA-N 0.000 description 2
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- 150000003457 sulfones Chemical class 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
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- ZQTYRTSKQFQYPQ-UHFFFAOYSA-N trisiloxane Chemical compound [SiH3]O[SiH2]O[SiH3] ZQTYRTSKQFQYPQ-UHFFFAOYSA-N 0.000 description 2
- OLQWMCSSZKNOLQ-ZXZARUISSA-N (3s)-3-[(3r)-2,5-dioxooxolan-3-yl]oxolane-2,5-dione Chemical compound O=C1OC(=O)C[C@H]1[C@@H]1C(=O)OC(=O)C1 OLQWMCSSZKNOLQ-ZXZARUISSA-N 0.000 description 1
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
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- 125000001140 1,4-phenylene group Chemical group [H]C1=C([H])C([*:2])=C([H])C([H])=C1[*:1] 0.000 description 1
- HRPHBJSWDLCUDG-UHFFFAOYSA-N 1-[3-[4-[4-[3-(2,5-dioxopyrrol-1-yl)phenoxy]phenyl]sulfonylphenoxy]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C1=CC=CC(OC=2C=CC(=CC=2)S(=O)(=O)C=2C=CC(OC=3C=C(C=CC=3)N3C(C=CC3=O)=O)=CC=2)=C1 HRPHBJSWDLCUDG-UHFFFAOYSA-N 0.000 description 1
- WYEOPIGTAMXOST-UHFFFAOYSA-N 1-[4-[2-[4-(2,5-dioxopyrrol-1-yl)phenyl]propan-2-yl]phenyl]pyrrole-2,5-dione Chemical compound C=1C=C(N2C(C=CC2=O)=O)C=CC=1C(C)(C)C(C=C1)=CC=C1N1C(=O)C=CC1=O WYEOPIGTAMXOST-UHFFFAOYSA-N 0.000 description 1
- PYTZZNUKESXWLN-UHFFFAOYSA-N 1-[4-[4-[2-[4-[4-(2,5-dioxopyrrol-1-yl)phenoxy]phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]phenoxy]phenyl]pyrrole-2,5-dione Chemical compound C=1C=C(OC=2C=CC(=CC=2)N2C(C=CC2=O)=O)C=CC=1C(C(F)(F)F)(C(F)(F)F)C(C=C1)=CC=C1OC(C=C1)=CC=C1N1C(=O)C=CC1=O PYTZZNUKESXWLN-UHFFFAOYSA-N 0.000 description 1
- XAZPKEBWNIUCKF-UHFFFAOYSA-N 1-[4-[4-[2-[4-[4-(2,5-dioxopyrrol-1-yl)phenoxy]phenyl]propan-2-yl]phenoxy]phenyl]pyrrole-2,5-dione Chemical compound C=1C=C(OC=2C=CC(=CC=2)N2C(C=CC2=O)=O)C=CC=1C(C)(C)C(C=C1)=CC=C1OC(C=C1)=CC=C1N1C(=O)C=CC1=O XAZPKEBWNIUCKF-UHFFFAOYSA-N 0.000 description 1
- MWVPSAKHPCVPHF-UHFFFAOYSA-N 1-[4-[4-[4-[4-(2,5-dioxopyrrol-1-yl)phenoxy]benzoyl]phenoxy]phenyl]pyrrole-2,5-dione Chemical compound C=1C=C(OC=2C=CC(=CC=2)N2C(C=CC2=O)=O)C=CC=1C(=O)C(C=C1)=CC=C1OC(C=C1)=CC=C1N1C(=O)C=CC1=O MWVPSAKHPCVPHF-UHFFFAOYSA-N 0.000 description 1
- LZNGBBXVZZYWMT-UHFFFAOYSA-N 1-[4-[4-[4-[4-(2,5-dioxopyrrol-1-yl)phenoxy]phenoxy]phenoxy]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1OC(C=C1)=CC=C1OC(C=C1)=CC=C1OC1=CC=C(N2C(C=CC2=O)=O)C=C1 LZNGBBXVZZYWMT-UHFFFAOYSA-N 0.000 description 1
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- OBPBQKFGLIVSKR-UHFFFAOYSA-N 1-[4-[4-[[4-[4-(2,5-dioxopyrrol-1-yl)phenoxy]phenyl]methyl]phenoxy]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1OC(C=C1)=CC=C1CC(C=C1)=CC=C1OC1=CC=C(N2C(C=CC2=O)=O)C=C1 OBPBQKFGLIVSKR-UHFFFAOYSA-N 0.000 description 1
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- NOGFHTGYPKWWRX-UHFFFAOYSA-N 2,2,6,6-tetramethyloxan-4-one Chemical compound CC1(C)CC(=O)CC(C)(C)O1 NOGFHTGYPKWWRX-UHFFFAOYSA-N 0.000 description 1
- SDWGBHZZXPDKDZ-UHFFFAOYSA-N 2,6-dichloronaphthalene-1,4,5,8-tetracarboxylic acid Chemical compound C1=C(Cl)C(C(O)=O)=C2C(C(=O)O)=CC(Cl)=C(C(O)=O)C2=C1C(O)=O SDWGBHZZXPDKDZ-UHFFFAOYSA-N 0.000 description 1
- JZWGLBCZWLGCDT-UHFFFAOYSA-N 2,7-dichloronaphthalene-1,4,5,8-tetracarboxylic acid Chemical compound ClC1=CC(C(O)=O)=C2C(C(=O)O)=CC(Cl)=C(C(O)=O)C2=C1C(O)=O JZWGLBCZWLGCDT-UHFFFAOYSA-N 0.000 description 1
- XMNIXWIUMCBBBL-UHFFFAOYSA-N 2-(2-phenylpropan-2-ylperoxy)propan-2-ylbenzene Chemical compound C=1C=CC=CC=1C(C)(C)OOC(C)(C)C1=CC=CC=C1 XMNIXWIUMCBBBL-UHFFFAOYSA-N 0.000 description 1
- PXXUHFVEJQHLSK-UHFFFAOYSA-N 2-[[2-aminoethyl(dimethyl)silyl]oxy-dimethylsilyl]ethanamine Chemical compound NCC[Si](C)(C)O[Si](C)(C)CCN PXXUHFVEJQHLSK-UHFFFAOYSA-N 0.000 description 1
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- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- PWSKHLMYTZNYKO-UHFFFAOYSA-N heptane-1,7-diamine Chemical compound NCCCCCCCN PWSKHLMYTZNYKO-UHFFFAOYSA-N 0.000 description 1
- 125000004836 hexamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 1
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 1
- 150000002431 hydrogen Chemical group 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 150000002460 imidazoles Chemical class 0.000 description 1
- 125000005462 imide group Chemical group 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229940018564 m-phenylenediamine Drugs 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- GZORJAFFPJJJQU-UHFFFAOYSA-N n,n-dimethylacetamide;1-methylpyrrolidin-2-one Chemical compound CN(C)C(C)=O.CN1CCCC1=O GZORJAFFPJJJQU-UHFFFAOYSA-N 0.000 description 1
- KADGVXXDDWDKBX-UHFFFAOYSA-N naphthalene-1,2,4,5-tetracarboxylic acid Chemical compound OC(=O)C1=CC=CC2=C(C(O)=O)C(C(=O)O)=CC(C(O)=O)=C21 KADGVXXDDWDKBX-UHFFFAOYSA-N 0.000 description 1
- OBKARQMATMRWQZ-UHFFFAOYSA-N naphthalene-1,2,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 OBKARQMATMRWQZ-UHFFFAOYSA-N 0.000 description 1
- DOBFTMLCEYUAQC-UHFFFAOYSA-N naphthalene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C(O)=O)C(C(=O)O)=CC2=C1 DOBFTMLCEYUAQC-UHFFFAOYSA-N 0.000 description 1
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 description 1
- SXJVFQLYZSNZBT-UHFFFAOYSA-N nonane-1,9-diamine Chemical compound NCCCCCCCCCN SXJVFQLYZSNZBT-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- RGSFGYAAUTVSQA-UHFFFAOYSA-N pentamethylene Natural products C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 1
- 125000004817 pentamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 1
- 239000003209 petroleum derivative Substances 0.000 description 1
- JGGWKXMPICYBKC-UHFFFAOYSA-N phenanthrene-1,8,9,10-tetracarboxylic acid Chemical compound C1=CC=C(C(O)=O)C2=C(C(O)=O)C(C(O)=O)=C3C(C(=O)O)=CC=CC3=C21 JGGWKXMPICYBKC-UHFFFAOYSA-N 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- CLYVDMAATCIVBF-UHFFFAOYSA-N pigment red 224 Chemical compound C=12C3=CC=C(C(OC4=O)=O)C2=C4C=CC=1C1=CC=C2C(=O)OC(=O)C4=CC=C3C1=C42 CLYVDMAATCIVBF-UHFFFAOYSA-N 0.000 description 1
- 239000006187 pill Substances 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- WYVAMUWZEOHJOQ-UHFFFAOYSA-N propionic anhydride Chemical compound CCC(=O)OC(=O)CC WYVAMUWZEOHJOQ-UHFFFAOYSA-N 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- RTHVZRHBNXZKKB-UHFFFAOYSA-N pyrazine-2,3,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=NC(C(O)=O)=C(C(O)=O)N=C1C(O)=O RTHVZRHBNXZKKB-UHFFFAOYSA-N 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 239000011541 reaction mixture Substances 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 1
- LUEGQDUCMILDOJ-UHFFFAOYSA-N thiophene-2,3,4,5-tetracarboxylic acid Chemical compound OC(=O)C=1SC(C(O)=O)=C(C(O)=O)C=1C(O)=O LUEGQDUCMILDOJ-UHFFFAOYSA-N 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- NJMOHBDCGXJLNJ-UHFFFAOYSA-N trimellitic anhydride chloride Chemical compound ClC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 NJMOHBDCGXJLNJ-UHFFFAOYSA-N 0.000 description 1
- 125000003258 trimethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])[*:1] 0.000 description 1
- KLNPWTHGTVSSEU-UHFFFAOYSA-N undecane-1,11-diamine Chemical compound NCCCCCCCCCCCN KLNPWTHGTVSSEU-UHFFFAOYSA-N 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1057—Polyimides containing other atoms than carbon, hydrogen, nitrogen or oxygen in the main chain
- C08G73/106—Polyimides containing other atoms than carbon, hydrogen, nitrogen or oxygen in the main chain containing silicon
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L77/00—Compositions of polyamides obtained by reactions forming a carboxylic amide link in the main chain; Compositions of derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J179/00—Adhesives based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen, with or without oxygen, or carbon only, not provided for in groups C09J161/00 - C09J177/00
- C09J179/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C09J179/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J183/00—Adhesives based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Adhesives based on derivatives of such polymers
- C09J183/10—Block or graft copolymers containing polysiloxane sequences
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
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- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
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- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
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- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
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- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15738—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
- H01L2924/15747—Copper [Cu] as principal constituent
Definitions
- the present invention relates to a resin bonding die for use as a bonding material (die bonding material) between a semiconductor element such as an IC or an LSI and a support member such as a lead frame or an insulating support substrate.
- a bonding material die bonding material
- Au-Si eutectic alloy, solder or silver paste and the like have been conventionally known as a bonding material between an IC or LSI and a lead frame.
- the present applicant has previously proposed an adhesive film using a specific polyimide resin, and an adhesive film for die bonding in which a conductive filler or an inorganic filler is added to a specific polyimide resin (see, for example, Japanese Patent Application Laid-Open No. H11-157556). JP-A 07-228697, JP-A 06-145639, JP-A 06-264035, etc.).
- the above Au-Si eutectic alloy has high heat resistance and high moisture resistance, but has a high elastic modulus! /, And therefore is easily broken when applied to a large chip. There are also disadvantages that are expensive.
- Solder is inexpensive, but has poor heat resistance, and its elastic modulus is as high as Au-Si eutectic alloy.
- Silver paste is inexpensive, has high moisture resistance, and has the lowest elastic modulus among these, and has heat resistance applicable to thermocompression bonding wire bonders at 350 ° C, so it is currently the mainstream of die bonding materials.
- the use of silver paste to bond the ICs and LSIs to the lead frame has to spread all over the chip. Must be applied, which is difficult.
- the adhesive film for die bonding proposed by the applicant of the present invention can be bonded at a relatively low temperature and has a good adhesive strength at the time of heat, so that it can be suitably used for die bonding for 42 alloy lead frames.
- the use of insulating supporting substrates has become widespread.
- die-bonding materials have been used for mass production and printing. Attention has been focused on how to supply in In order to efficiently supply the adhesive film to the insulating support substrate and attach it, it is necessary to cut out (or punch out) the adhesive film in advance and attach the adhesive film. In the method of cutting out the adhesive film and attaching it to the substrate, an attaching device is required to increase production efficiency.
- the method of punching out an adhesive film and pasting a plurality of chips at a time tends to waste the adhesive film.
- the insulating support substrate has an inner layer wiring formed inside the substrate, the surface on which the adhesive film is adhered has a large amount of irregularities.
- An object of the present invention is to provide a resin paste for die bonding that can be easily supplied and applied by a printing method to a substrate that needs to be attached at a relatively low temperature.
- the present invention has the following configuration. That is,
- the present invention provides the following formula (I)
- PI polyimide resin
- the above viscosity is a value measured at 25 ° C. and 0.5 rpm using an E-type rotational viscometer.
- the solid content is less than 20% by weight, the shape change due to the volume decrease after drying of the paste becomes large. Therefore, if it is more than 70% by weight, the fluidity of the paste deteriorates and the printing workability deteriorates.
- the paste applied by the printing method will be sagged and the printed shape will be poor. If the thixotropy index exceeds 8.0, the paste applied by the printing method tends to have “chips” or fuzz.
- the viscosity of the resin paste is less than 5 Pa's or more than 100 POA's, the printing workability deteriorates.
- the viscosity of the fat paste should be 5 lOOPa ⁇ s if the mesh or the like is stretched at the mask opening, such as a screen mesh plate, in consideration of the removability of the mesh. In the case of a stencil plate or the like, it is preferably adjusted to a range of 20 to 500 Pa ⁇ s. If many voids remain in the paste after drying, it is effective to adjust the viscosity to 150 Pa's or less.
- the printing solvent (S) is a solvent different from the reaction solvent of the polyimide resin used, can dissolve the polyimide resin (PI), and removes moisture in the air.
- the compounding amount of the filler (F) is 5 to 1000 parts by weight and the compounding amount of the printing solvent (S) is 50 to 1000 parts by weight with respect to 100 parts by weight of the polyimide resin (PI).
- the above resin paste for die bonding is 5 to 1000 parts by weight and the compounding amount of the printing solvent (S) is 50 to 1000 parts by weight with respect to 100 parts by weight of the polyimide resin (PI).
- the present invention is the above-mentioned resin paste for die bonding, further comprising 200 parts by weight or less of a thermosetting resin with respect to 100 parts by weight of a polyimide resin (PI).
- PI polyimide resin
- the resin paste for die bonding of the present invention comprises a tetracarboxylic dianhydride (A) containing the tetracarboxylic dianhydride of the formula (I) and a diamine (B) containing a siloxane-based diamine of the formula (II).
- A tetracarboxylic dianhydride
- B diamine
- siloxane-based diamine of the formula (II) Is reacted in a reaction solvent to obtain a polyimide resin from the polyimide resin solution, so that the solid content of the final resin paste is in the range of 20 to 70% by weight, and thixotropy.
- the polyimide resin separated above is dissolved in a printing solvent so that the index is 1.5-8.0 and the viscosity is within the range of 5—100 POO's, and if necessary, the thermosetting resin is further added. , followeded by the addition and kneading of a filler.
- FIG. 1 is a schematic cross-sectional view of an apparatus for measuring peel adhesion.
- the above tetracarboxylic dianhydride can be synthesized by trimellitic anhydride monochloride and the corresponding diol force.
- the content of the tetracarboxylic dianhydride is preferably at least 10 mol%, more preferably at least 15 mol%, based on the total tetracarboxylic dianhydride, so as not to cause a decrease in the adhesive strength of the cured product. is there.
- Examples of the tetracarboxylic dianhydride usable together with the tetracarboxylic dianhydride of the formula (I) include pyromellitic dianhydride, 3, 3 ', 4, A'-diphenyltetra Carboxylic acid dianhydride, 2, 2 ', 3, 3'-diphenyltetracarboxylic dianhydride, 2,2 bis (3,4 dicarboxyphenyl) propane dianhydride, 2,2 bis (2,3-dicarboxyphenyl) propane dianhydride, 1,1 bis (2,3-dicarboxyphenyl) ethaneni anhydride, 1,1 bis (3,4-dicarboxyphenyl) Ethani dianhydride, bis (2,3-dicarboxyphenyl) methane dianhydride, bis (3,4-dicarboxyphenyl) methane dianhydride, bis (3,4-dicarboxyphenyl) methane Sulfone
- siloxane-based diamine of the formula (II) as another raw material for producing a polyimide resin, when 1, is 1,1,3,3-tetramethyl-1,3bis (4-aminophenyl) diamine Siloxane, 1, 1 1,3,3-tetraphenoxy 1,3 bis (4aminoethyl) disiloxane, 1,1,3,3-tetrafluoro-1,3-bis (2-aminoethyl) disiloxane, 1, 1 1,3,3-Tetraphenyl-1,3-bis (3-aminopropyl) disiloxane, 1,1,3,3-tetramethyl-1,3bis (2-aminoethyl) disiloxane, 1,1,3,3- Tetramethyl-1,3-bis (3-aminopropyl) disiloxane, 1,1,3,3-tetramethyl-1,3-bis (3-aminobutyl) disiloxane, 1,3 dimethyl-1,3-dimethoxy-1,
- the content of these siloxane-based diamines is low stress, low-temperature adhesion (adhesion at a relatively low temperature), or preferably 3 mol% or more based on the total diamine in order to exhibit low moisture absorption. It is more preferably at least 5 mol%, more preferably at least 10 mol%.
- diamines can be used in combination with the siloxane-based diamine.
- Other diamines that can be used in combination are 1,2-diaminoethane, 1,3-diaminopropane, 1,4-diaminobutane, 1,5-diaminopentane, 1,6-diaminohexane, 1,7-diaminoheptane, Aliphatic diamines such as 8-diaminooctane, 1, 9-diaminononane, 1,10-diaminodecane, 1,11-diaminoundecane, 1,12-diaminododecane, o-phenylenediamine, m-phenylenediamine, p-phenylene Rangeamine, 3, 3 '-diaminodiphenyl ether, 3, 4'-diaminodiphenyl ether, 4, 4 'diaminodiphenyl
- reaction solvent dimethylacetamide, dimethylformamide, N-methyl-2
- reaction temperature is 80 ° C or lower, preferably 0-50 ° C.
- Reaction solution as the reaction proceeds Gradually increases in viscosity.
- polyamic acid which is a polyimide precursor is generated
- Polyimide can be obtained by subjecting the above reactant (polyamic acid) to dehydration ring closure.
- the dehydration ring closure can be carried out by a heat treatment at 120 ° C. to 250 ° C. or by using a danikari method.
- the heat treatment is performed while removing the water generated by the dehydration reaction out of the system. At this time, water may be azeotropically removed using benzene, toluene, xylene, or the like.
- polyimide resin is a general term for polyimide and its precursor.
- Polyimide precursors include, in addition to polyamic acid, polyamic acid partially imidized.
- acetic anhydride, propionic anhydride, acid anhydrides of benzoic anhydride, carbodiimide compounds such as dicyclohexylcarbodiimide and the like are used as a ring closing agent.
- a ring-closing catalyst such as pyridine, isoquinoline, trimethylamine, aminoviridine and imidazole may be used, if necessary.
- the ring-closing agent the ring-closing catalyst in the range of 118 moles per mole of tetracarboxylic dianhydride.
- a silane coupling agent, a titanium-based coupling agent, a non-ionic surfactant, a fluorine-based surfactant, a silicone-based additive, and the like may be appropriately added to the polyimide resin.
- the filler (F) used in the present invention includes a conductive (metal) filler such as silver powder, gold powder, and copper powder, and an inorganic filler such as silica, alumina, titer, glass, iron oxide, and ceramic. There is.
- a conductive (metal) filler such as silver powder, gold powder, and copper powder
- an inorganic filler such as silica, alumina, titer, glass, iron oxide, and ceramic.
- conductive (metal) fillers such as silver powder, gold powder, and copper powder are added for the purpose of imparting conductivity, heat conductivity, or thixotropy to the adhesive.
- Inorganic material filters such as silica, alumina, titania, glass, iron oxide, and ceramic are added for the purpose of imparting a low thermal expansion property, a low moisture absorption rate, and a thixotropic property to the adhesive.
- These conductive or inorganic substance fillers can be used as a mixture of two or more kinds. Further, a conductive filler and an inorganic material filler may be mixed and used within a range of V which does not impair the physical properties!
- the amount of the filler is usually 5 to 1000 parts by weight, preferably 10 to 500 parts by weight, based on 100 parts by weight of the polyimide resin. If the amount is less than 5 parts by weight, it is difficult to impart sufficient thixotropic property (thixotropic index: 1.5 or more) to the paste. If the amount exceeds 1000 parts by weight, Adhesion decreases.
- the mixing and kneading of the filler are carried out by appropriately combining ordinary dispersing machines such as a stirrer, a grinder, a three-roll mill, and a ball mill.
- the printing solvent (S) used in the present invention is a solvent capable of dissolving the polyimide resin used, and is selected from solvents capable of uniformly kneading or dispersing the filler. Also, select a solvent that is different from the polyimide resin reaction solvent that absorbs moisture in the air. Further, it is preferable to select a solvent having a boiling point of 100 ° C. or higher in consideration of prevention of evaporation of the solvent during printing.
- the reaction solvent used in the synthesis of the polyimide resin should be removed in advance so as not to be brought into the resin paste as it is, or even if brought in, the amount should not exceed the weight of the printing solvent (S).
- the printing solvent (S) is preferably 50% by weight or more of the total solvent contained in the resin paste.
- thermosetting resin when a thermosetting resin described later (epoxy resin + phenol resin + curing accelerator, etc.) is used. Remove the solvent in the thermosetting resin in advance so as not to be brought into the resin paste as it is, or suppress the weight of the printing solvent (S) even if it is brought in.
- a thermosetting resin described later epoxy resin + phenol resin + curing accelerator, etc.
- reaction solvent used for the synthesis of the polyimide resin and the solvent of the thermosetting resin are generally polar solvents, and if these solvents remain after absorbing the moisture in the air, This is because the polyimide resin and the solvent are separated by absorbing moisture therein, and the resin paste becomes white.
- Examples of the printing solvent (S) include diethylene glycol dimethyl ether (also called diglyme), triethylene glycol dimethyl ether (also called triglyme), diethylene glycol dimethyl ether, isophorone, carbitol acetate, and acetic acid 2- (2- In addition to butoxyethoxy) ethyl, cyclohexanone, and solvents, there are solvents based on petroleum distillates used as solvents for printing inks. These may be used in combination of two or more.
- the solvent of polyimide resin has a higher dissolving power for absorbing moisture in the air, and a solvent is preferably used.
- the amount of the printing solvent (S) is usually 5 to 100 parts by weight of the polyimide resin. 0-1000 parts by weight.
- the amount of addition is preferably in the range of 0.01 to 10% by weight in the solvent. If the content is less than 0.01% by weight, the defoaming effect is not exhibited.
- the resin paste of the present invention has a range of not more than 200 parts by weight (more preferably, 100 parts by weight (based on solid content)) of the polyimide resin in order to increase the shear adhesive strength when hot. Is within 100 parts by weight), and a thermosetting resin can be further blended. If the amount exceeds 200 parts by weight, the storage stability of the resin paste decreases.
- the thermosetting resin is a resin which forms a three-dimensional network structure and is cured by heating. Depending on the purpose of use, a thermosetting resin-containing or non-containing resin paste may be used.
- thermosetting resins are resins containing an epoxy resin, a phenol resin, and a curing accelerator.
- the epoxy resin includes at least two epoxy resins in a molecule.
- Phenol glycidyl ether type epoxy resin is preferred from the viewpoint of curability and cured product properties.
- examples of such resins include bisphenol A, bisphenol AD, bisphenol S, Examples include condensates of bisphenol F or bisphenol A halide and epichlorohydrin, glycidyl ether of phenol novolak resin, glycidyl ether of talesol novolak resin, and glycidyl ether of bisphenol A novolak resin.
- the amount of the epoxy resin should not exceed 200 parts by weight, preferably not exceed 100 parts by weight, based on 100 parts by weight of the polyimide resin. If the amount is more than 200 parts by weight, the storage stability of the paste tends to decrease.
- the phenolic resin used has at least two phenolic hydroxyl groups in the molecule.
- examples of such a resin include phenol novolak resin, cresol novolak resin, and bisphenol A novolak. Resins, poly p-bulfenol, phenol aralkyl resins, etc.
- the amount of the phenol resin is preferably 0 to 150 parts by weight with respect to 100 parts by weight of the epoxy resin. Or 0-120 parts by weight. If it exceeds 150 parts by weight, the curability becomes insufficient.
- the curing accelerator may be any one used for curing the epoxy resin.
- Such compounds include, for example, imidazoles, dicyandiamide derivatives, dicarboxylic dihydrazide, triphenylphosphine, tetraphenylphospho-dimethyltetraphenyl-borate, 2-ethyl-4-methylimidazole-tetraphenolate, 1,8 Diazabisik Mouth [5,4,0] ndecene 7-tetraphenolate or the like is used. These may be used in combination of two or more.
- the amount of the curing accelerator is 0 to 50 parts by weight, preferably 0 to 20 parts by weight based on 100 parts by weight of the epoxy resin. If the amount exceeds 50 parts by weight, the storage stability of the paste tends to decrease.
- thermosetting resin an imidized conjugate having at least two thermosetting imide groups in one molecule can also be used.
- examples of such compounds include: o Bismaleimide benzene, m bismaleimide benzene, p bismaleimide benzene, 1,4 bis (p maleimide cumyl) benzene, 1,4 bis (m maleimide cumyl) benzene
- imide compound represented by the following formula (III)-(V).
- X and Y represent 0, CH, CF, SO, S, CO, C (CH) or C (CF), and R
- R, R, R, R, R, R and R are each independently hydrogen, a lower alkyl group
- D represents a dicarboxylic acid residue having an ethylenically unsaturated double bond
- m represents an integer of 0-4.
- the amount of the imido conjugate is 0 to 200 parts by weight, preferably 0 to 100 parts by weight, based on 100 parts by weight of the polyimide resin. If the amount exceeds 200 parts by weight, the storage stability of the paste tends to decrease.
- Examples of the imide compound of the formula (III) include 4,4-bismaleimide diphenyl ether, 4,4 bismaleimide diphenylmethane, and 4,4 bismaleimide-3,3 ′ dimethyl diphenyl Methane, 4,4 bismaleimide diphenyl sulfone, 4,4 bismaleimide diphenyl sulfide, 4,4 bismaleimide diphenyl ketone, 2,2'bis (4-maleimide phenyl) propane, 4, 4- Bismaleimidodiphenylfluoromethane, 1,1,1,3,3,3-hexafluoro mouth—2,2 bis (4 maleimidophenyl) propane.
- Examples of the imide compound of the formula (IV) include bis [4 (4maleimidophenoxy) phenyl] ether, bis [4- (4maleimidophenoxy) phenyl] methane, bis [ 4- (4-maleimidophenoxy) phenyl] fluoromethane, bis [4- (4-maleimidophenoxy) phenyl] sulfone, bis [4- (3-maleimidophenoxy) phenyl] sulfone, bis [4 — (4-maleimidophenoxy) phenyl] sulfide, bis [4- (4-maleimidophenoxy) phenyl] ketone, 2,2-bis [4- (4maleimidophenoxy) phenyl] propane, 1 , 1,1,3,3,3-hexafluoro-2,2-bis [4- (4maleimidophenoxy) phenyl] propane.
- Radical polymerization agents include acetylcyclohexylsulfol-peroxide, isobutylyl peroxide, benzoyl peroxide, otatanyl peroxide, acetyl peroxide, dicumyl peroxide, cumenehydride peroxide, azobisisobutyl mouth-tolyl, and the like. is there.
- the amount of the radical polymerization agent used is preferably approximately 0.01 to 1.0 part by weight based on 100 parts by weight of the imidized conjugate.
- the obtained resin paste for die bonding is a lead frame such as a 42 alloy lead frame or a copper lead frame, or a plastic film such as a polyimide resin, an epoxy resin, or a polyimide resin.
- the present invention may be applied to a base material such as glass non-woven fabric or the like which is impregnated and cured with a plastic such as polyimide resin, epoxy resin or polyimide resin, or a support member (plate) made of ceramics such as alumina.
- the resin paste is supplied and applied by a printing method, and dried to form a support substrate with an adhesive. Thereafter, semiconductor elements (chips) such as ICs and LSIs are attached to the adhesive-supported substrate, and the chips are bonded to the support substrate by heating.
- the resin paste of the present invention can be applied by a potting method instead of a printing method, although the working efficiency is low.
- knock reliability may be affected. If there is no resonance, the semiconductor element can be attached without drying and then heated to join the chip to the supporting substrate.
- a resin paste for die bonding can be provided that can be easily supplied and applied by a printing method to a substrate that needs to be attached at a relatively low temperature.
- the resin paste for die bonding of the present invention has heat resistance and whitening resistance, is easy to handle, and has excellent low stress properties and low temperature adhesiveness.
- the adhesiveness to the substrate is improved as compared with the film adhesive, so that the cage reliability is improved. It can be suitably used for an insulating support substrate such as an organic substrate and a copper lead frame for die bonding, and can also be used for a 42 alloy lead frame.
- Silicone diamine X22-161AS (Shin-Etsu Chemical Co., Ltd., amine equivalent: 450) as a siloxane-based diamine of the formula (II) in a 500 ml four-necked flask equipped with a thermometer, a stirrer and a calcium salt tube. 54. Og (0.06 mol) and 2,4-bis (4- (4-aminophenoxy) phenyl) propane (16.4 g, 0.04 mol) were weighed out, and N-methyl-2- 150 g of pyrrolidone was added and stirred.
- PI is only soluble in NMP and completely soluble in TG and CA printing solvents.
- Polyimide resin PI for PI, whitening resistance after dissolving in printing solvent and reaction solvent
- Examples 2-10, Comparative Examples 1-3 The same procedure as in Example 1 was carried out except that the types and the amounts of the polyimide resin, thermosetting resin, filler and Z or the solvent were changed, and the resin paste for die bonding (resin paste) of the present invention was used.
- YDCH-702 Toto Kasei Co., Ltd., Cresol novolak type epoxy resin (epoxy equivalent 220)
- VH-4170 Dainippon Ink and Chemicals, Inc., bisphenol A novolak resin (OH (Amount 118)
- TPPK Tokyo Chemical Industry Co., Ltd., tetraphenylphospho-dimethyltetraphenolate
- AEROSIL Nippon AEROSIL Corporation, 380 (fine silica powder)
- CA Carbitol acetate
- Table 2 shows the viscosity and thixotropic index of the mixed and mixed resin paste.
- the methods for measuring the viscosity and thixotropic index are as follows.
- Viscosity The viscosity of the fat paste was measured at 25 ° C using a 3 ° cone with a diameter of 19.4 mm using a ⁇ -type viscometer manufactured by Tokimec (0.5 rpm).
- Thixotropic index Measured using the above viscometer, and determined by the following equation.
- Thixotropic index (viscosity at lrpm) Z (viscosity at lOrpm)
- the peel adhesive strength was measured when the chip attaching temperature was set to 180 ° C or 250 ° C, respectively.
- the peel adhesion is as shown in Table 2.
- the resin pastes No. 1-10 exhibited the same high peel adhesion even at 180 ° C as the adhesive strength at 250 ° C (slightly lower). .
- the method for measuring the peel adhesion is as follows.
- a resin paste is printed on an organic substrate coated with TAIYO INK solder resist PSR-4000AUS-5, dried at 60 ° C for 15 minutes, and dried at 100 ° C for 30 minutes.
- a load of 100 g was applied on a hot plate at ° C or 250 ° C for 5 seconds. Then, after curing at 180 ° C for 1 hour, the peel strength at the time of heating at 250 ° C for 20 seconds was measured using the apparatus shown in FIG.
- 1 is a silicon chip
- 2 is a die bonding material
- 3 is a substrate
- 4 is a push-pull gauge
- 5 is a hot plate.
- the method of measuring chip warpage is as follows.
- a resin paste is printed on a 150 m thick Furukawa Electric EF-TEC64T copper plate, dried at 60 ° C for 15 minutes, and then at 100 ° C for 30 minutes to dry the die bond material with a film thickness of 40 m.
- a silicon chip having a size of 13 mm ⁇ 13 mm and a thickness of 400 ⁇ m was mounted thereon, and was pressed at 250 ° C. for 5 seconds under a load of 100 g. After the temperature was returned to room temperature (25 ° C), a 1 lmm scan was performed linearly using a surface roughness meter, and the maximum height m from the baseline was determined.
- the resin paste for die bonding of the present invention has heat resistance and whitening resistance, and is excellent in low stress property and low-temperature adhesion immediately after handling.
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Abstract
Description
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US11/587,049 US20070225438A1 (en) | 2004-04-27 | 2005-02-15 | Resin Paste for Die Bonding |
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JP2004131359A JP2005105251A (ja) | 2003-08-27 | 2004-04-27 | ダイボンディング用樹脂ペースト |
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US8212370B2 (en) | 2006-10-04 | 2012-07-03 | Hitachi Chemical Company, Ltd. | Resin paste for die bonding, containing a polyurethaneimide resin and thermosetting resin method for manufacturing semiconductor device, and semiconductor device, using the resin paste |
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TWI370833B (en) * | 2006-12-29 | 2012-08-21 | Ind Tech Res Inst | Composition with high transparency, high thermal-resistant, and low coefficient of thermal expansion, and flexible transparent film and optoelectronic device employing the same |
TWI496168B (zh) * | 2008-07-03 | 2015-08-11 | Henkel IP & Holding GmbH | 觸變型導電組合物 |
CN102174241B (zh) * | 2010-12-31 | 2015-04-22 | 东莞市阿比亚能源科技有限公司 | 一种用于光伏组件的银浆 |
JP6010531B2 (ja) * | 2011-04-20 | 2016-10-19 | 株式会社カネカ | ポリアミドイミド溶液およびポリアミドイミド膜の製造方法 |
US9141157B2 (en) * | 2011-10-13 | 2015-09-22 | Texas Instruments Incorporated | Molded power supply system having a thermally insulated component |
JP5768023B2 (ja) * | 2012-08-29 | 2015-08-26 | 日東電工株式会社 | 電子部品封止用熱硬化性樹脂シート、樹脂封止型半導体装置、及び樹脂封止型半導体装置の製造方法 |
CN104293277B (zh) * | 2014-09-24 | 2016-07-06 | 中国科学院长春应用化学研究所 | 一种聚酰亚胺胶粘剂及其制备方法 |
CN110628346A (zh) * | 2018-06-25 | 2019-12-31 | 昆山雅森电子材料科技有限公司 | 超薄高透明pi膜、含该pi膜的保护膜及制备方法 |
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- 2005-02-15 WO PCT/JP2005/002229 patent/WO2005105943A1/ja active Application Filing
- 2005-02-15 CN CNA2005800129401A patent/CN1950475A/zh active Pending
- 2005-02-15 US US11/587,049 patent/US20070225438A1/en not_active Abandoned
- 2005-02-15 KR KR1020067022249A patent/KR20070005698A/ko not_active Application Discontinuation
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US8212370B2 (en) | 2006-10-04 | 2012-07-03 | Hitachi Chemical Company, Ltd. | Resin paste for die bonding, containing a polyurethaneimide resin and thermosetting resin method for manufacturing semiconductor device, and semiconductor device, using the resin paste |
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