WO2005095999A1 - 検査ブロック - Google Patents
検査ブロック Download PDFInfo
- Publication number
- WO2005095999A1 WO2005095999A1 PCT/JP2005/005774 JP2005005774W WO2005095999A1 WO 2005095999 A1 WO2005095999 A1 WO 2005095999A1 JP 2005005774 W JP2005005774 W JP 2005005774W WO 2005095999 A1 WO2005095999 A1 WO 2005095999A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- probing
- land
- lands
- wiring board
- inspection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
Definitions
- the present invention relates to an inspection block used when electrically inspecting an LCD panel or the like, and electrically connecting a probe and an inspection device with each other.
- connection terminal of the LCD panel is electrically contacted via a conductive contact (probe), and further electrically connected to the other end of each probe.
- the LCD panel was inspected by connecting it to a flat cable or the like via a contact block and applying various test signals from an inspection device connected to the flat cable.
- FIG. 8A is a cross-sectional view showing a connection state of a part of an inspection unit including a conventional contact block.
- the LCD panel 1 is connected to the contact block 4 via the probe block 2.
- the probe block 2 a plurality of probes 3 arranged in accordance with the arrangement of connection terminals (not shown) provided on the periphery of the LCD panel 1 are provided in an insulating plate (see Patent Document 1).
- the lower contact needle 3a of each probe 3 electrically contacts each connection terminal of the LCD panel 1, and the upper contact needle 3b electrically contacts the probing land 4a of the contact block 4.
- the contact block 4 is composed of a multilayer rigid wiring board, and wiring is connected between each probing land 4a and the lands 4b of the flat cables 5 and 6. As a result, each connection terminal of the LCD panel 1 and each wiring of the flat cables 5 and 6 are electrically connected.
- Patent Document 1 Japanese Patent No. 3442137
- Patent Document 2 Japanese Patent Application Laid-Open No. 2001-4662
- FIG. 8-2 is a diagram showing an arrangement state in the vicinity of the probing land 4a shown in FIG. 8-1, and is provided in the contact block 4 in order to make the group of the probing lands 4 dense.
- the through hole 4c—1, 4c 2 is a through hole formed directly in the probing land 4a, and the through hole 4c 2 is formed due to the presence of the through hole 4c 2.
- the contact area of the provided probing land 4a is smaller than the contact area of the other probing lands 4a. As a result, the reliability of contact with the upper contact needle 3b is reduced.
- the distance Y2 between the respective probing lands 4a where the through holes 4c 2 exist is different from the distance between the probing lands 4a and the through holes 4c 2!
- the interval between them is wider than Y1 and Y3. Therefore, the presence of the through-holes 4c-2 makes it difficult to reduce the density of the probing lands 4a and reduce the density of the probing lands 4a. There was a problem that it was not possible to achieve the density of the group, and even if the inspection could be performed, the time and labor required for contact for the inspection were increased.
- the above-described contact block 4 includes the probing lands CI, C3, C5, C7, and the probing lands in the upper two rows among the probing lands 4a. ... Are connected to the upper lands Tl, T3, T5, T7,... of the land 4b, respectively, and the probing lands that are the lower two rows of the probing lands of the probing lands 4a are connected. Grounds C2, C4, C6, C8,... to lower lands T2, T4, T6, T8,... of lands 4b Wiring connection according to each.
- the present invention has been made in view of the above, and provides an inspection block that can form a probing land corresponding to the density of connection terminals to be inspected such as an LCD panel and that is easy to manufacture.
- the purpose is to:
- an inspection block electrically connects a plurality of probes that electrically connect an inspection target and an inspection device.
- a flexible wiring board which is a test block to be connected and has a plurality of probing lands electrically contacting each probe and a land group provided at least at one end and connected to each probing land. Bent while forming a curved surface, forming and fixing the land group on the surface opposite to the surface forming the plurality of probing land, and connecting a flat cable connected to the inspection device to the land group. It is characterized.
- the flexible wiring substrate is bent along the peripheral surface of the holding material, and is fixed by bonding with an adhesive.
- the flexible wiring substrate is fixed by solidifying a liquid resin.
- the flexible wiring board is provided with the land group to which one group of the probing lands is connected at one end,
- the land group is provided on the opposite surface and is connected to one flat cable, and a land group is provided at the other end for connecting the other group of the probing lands, and the other end extends to the inspection apparatus. Characterized in that a flat cable is formed.
- each of the flexible wiring boards is provided with a land group connecting each group of the probing lands at each end. And a pair of flat cables extending at both ends to the inspection device.
- the flexible wiring board is configured such that the flat cable portion of the flexible wiring board is in an expanded state. It is characterized by being bent in the plane of the flexible wiring board.
- each of the land groups has a width in which the plurality of probing lands are formed. It is characterized by being smaller than the width.
- An inspection block is a flexible wiring board having a plurality of probe grounds electrically contacting each probe and a land group provided at least at one end and connected to each probing land.
- the lands were formed and fixed on the surface opposite to the surface on which the plurality of probe grounds were formed, and the flat cable connected to the inspection device was connected to the lands.
- FIG. 1 is a cross-sectional view showing a connection state of a part of an inspection unit including a contact block according to Embodiment 1 of the present invention.
- FIG. 2-1 is an expanded view of the flexible wiring board shown in FIG.
- FIG. 2-2 is a diagram showing a state in which a flexible wiring board is wound around and fixed to metal as a holding material.
- FIG. 2-3 is a cross-sectional view of the completed contact block.
- FIG. 2-4 is a diagram showing a modification of the flexible wiring board.
- FIG. 3-1 is a cross-sectional view showing a connection state of a part of an inspection unit including a contact block according to a second embodiment of the present invention.
- FIG. 3-2 is an expanded view of the flexible wiring board used for the contact block shown in FIG. 3-1.
- FIG. 4 is a cross-sectional view showing a connection state of a part of an inspection unit including a modified example of the contact block according to the second embodiment of the present invention.
- FIG. 5-1 is a cross-sectional view showing a connection state of a part of an inspection unit including another modified example of the contact block according to the second embodiment of the present invention.
- Fig. 5-2 is an expanded view of the contact block shown in Fig. 5-1.
- FIG. 6-1 is a development view of a flexible wiring board used for a contact block according to Embodiment 3 of the present invention.
- FIG. 6-2 is a perspective view showing a use form of a contact block using the flexible wiring board shown in FIG. 6-1.
- FIG. 7 is a diagram showing a cross-sectional view of a contact block according to Embodiment 4 of the present invention.
- FIG. 8-1 is a cross-sectional view showing a connection state of a part of a test unit including a conventional contact block.
- FIG. 8-2 is a diagram showing an arrangement state near the probing land shown in FIG. 8-1.
- FIG. 9 is a view showing wiring correspondence between probing lands and lands.
- an inspection block which is the best mode for carrying out the present invention will be described.
- a contact block which is an inspection block in an inspection unit used for inspection of an LCD panel will be described.
- a plurality of inspection blocks are arranged on an array.
- FIG. 1 is a sectional view showing a connection state of a part of an inspection unit including a contact block according to Embodiment 1 of the present invention.
- the LCD panel 1 is connected through a probe block 2 to a contact block 14 as an inspection block.
- a plurality of probes 3 arranged in accordance with the arrangement of connection terminals (not shown) provided on the periphery of the LCD panel 1 are provided in an insulating plate.
- the contact block 14 has a flexible wiring board 7, and as shown in FIG. 2A, the flexible wiring board 7 has lands 7a for forming the probing lands 7a and lands 7b for the flat cables 9 and 10.
- the groups TT9 and TT10 are wired and connected by wiring groups L9 and L10.
- FIG. 2-1 is an expanded view of the flexible wiring board 7.
- FIG. 2-2 is a diagram showing a state in which the flexible wiring board 7 is bent while forming a curved surface on the insulator 8 as a holding material, and specifically, is wound and fixed.
- FIG. 2-3 is a sectional view of the completed contact block 14.
- the flexible wiring board 7 shown in FIG. 2-1 is manufactured.
- This flexible wiring base The plate 7 is a strip-shaped flexible wiring board, and a plurality of probing lands 7a corresponding to the positions of the upper contact needles 3b are formed substantially at the center in the longitudinal direction.
- land groups TT9 and TT10 are formed at both ends in the longitudinal direction, and are connected to the corresponding probing lands 7a by the wiring groups L9 and L10.
- the land area due to the presence of the through hole and the like can be made uniform, and the contact with the upper contact needle 3b can be reliably performed.
- the flexible wiring board 7 is wound around the insulator 8, and is adhered and fixed to the insulator 8 by an adhesive 8a.
- the length in the longitudinal direction of the flexible wiring board 7 is set to a force that is almost the same as the peripheral length of the insulator 8 and slightly shorter, so that the land groups TT9 and TT10 (lands 7b) do not come into contact with each other.
- the probe ground 7a is formed on the surface of the probe 3 on which the upper contact needle 3b is provided, and the land groups TT9 and TT10 are formed on the surface opposite to the probing land 7a.
- the cross-sectional shape of the insulator 8 is a rectangular force.
- the contact block 14 is for an LCD panel, and as shown in FIG. 2-2, the probing lands CI, C3, C5, C7 located in the upper half of the probing land 7a in the drawing. , ⁇ Probing lands C2, C4 connected to the lands of T9, Tl, T3, T5, T7,..., respectively, and located in the lower half of the drawing of probing lands 7a , C6, C8, ⁇ , Connected to the lands of group TT10, T2, T4, T6, T8,....
- the insulator 8 is not limited to an insulator, and may be, for example, a metal.
- one ends of the flat cables 9, 10 corresponding to the respective land groups TT9, TT10 are crimp-connected, and the other ends of the flat cables 9, 10 have a length extending to an inspection device (not shown). ing.
- a flexible wiring board 17 as shown in FIGS. 2-4 may be used.
- This flexible wiring board 17 has the same distance between the probing land 17a and the land groups TT9 and TT10 in the width direction as the probing land 17a corresponding to the probing land 7a. Instead, the distance between the land groups TT9 and TT10 is wider than the distance between the probing lands 17a. This makes it easy and reliable to manufacture and connect the flat cables 9, 10 and the land groups TT9, TT10.
- the length between the probing land 7a and the land groups TT9 and TT10 is substantially the same, but is not limited thereto, and may be different.
- the determination of the length is performed based on the arrangement position of the probing land 7a and the arrangement positions of the land groups TT9 and TT10.
- the flexible wiring boards 7 and 17 are used instead of the conventional multilayer rigid wiring board, and are not affected by through holes or the like. Therefore, the density of the probing lands 7a and 17a can be easily increased, and reliable contact can be obtained.
- the manufacturing time of the contact block 14 can be reduced, and the inspection of various LCD panels can be performed. Units can be manufactured quickly and flexible responses can be taken. For example, when the multilayer rigid wiring board has five layers, the flexible wiring board has one layer, so even if a simple manufacturing time comparison is performed, in the first embodiment, the manufacturing can be performed with the manufacturing time of 1Z5. .
- connection to at least one of the lands 7b is not performed.
- FIG. 3-1 is a cross-sectional view showing a connection state of a part of the inspection unit including the contact block according to the second embodiment of the present invention.
- FIG. 2-2 is an expanded view of the flexible wiring board used for the contact block shown in FIG. 3-1.
- the contact block 24 extends the length of the probing land 7a and one of the land groups TT9 irrespective of the peripheral length of the insulator 8, and reaches the inspection device (not shown). L1.
- the length L2 between the probing land 7a and the other land group TT10 is the same as in the first embodiment, and this land group TT10 is formed on the back surface of the probing land 7a.
- the contact block 24 has the same length L2 as the length of the probing land 7a and one land group TT9 as in the first embodiment, and the land group TT9 has the length of the probing land 7a.
- the length between the probe ground 7a and the other land group TT10 is extended irrespective of the peripheral length of the insulator 8, and is set to a length L1 that reaches an inspection device (not shown).
- the structure may be reverse to the relationship shown in FIG. 3-1, FIG. 3-2.
- FIG. 5-1 is a cross-sectional view showing a connection state of a part of an inspection unit including another modified example of the contact block according to the second embodiment of the present invention.
- FIG. 5-2 is an expanded view of the contact block shown in FIG. 5-1.
- the contact block 34 extends the lengths of the probing land 7a and the land groups TT9 and TT10 independently of the peripheral length of the insulator 8, and has a length LI, L1 'that reaches an inspection device (not shown). I have.
- the length between one or both of the probing lands and the land group is extended irrespective of the peripheral length of the insulator 8 so as to reach the inspection device.
- the number of connection points is reduced, the number of parts is also reduced, and the manufacturing time can be further reduced.
- the reliability of the contact block can be improved.
- Each of the flexible wiring boards 7 in the above-described first and second embodiments has a substantially linear band-like force.
- a flexible band-like flexible wiring board 7 having a bend is used.
- the bow I can be turned flexibly.
- FIG. 6-1 is a developed view of a flexible wiring board used for a contact block according to Embodiment 3 of the present invention.
- FIG. 6B is a perspective view of a contact block using the flexible wiring board shown in FIG.
- the flexible wiring substrate 47 has a shape that is bent at 90 degrees in the plane of the flexible wiring substrate 47 in the longitudinal direction, which is not a linear shape.
- the flexible wiring board 47 is provided between the probing land and the land group. Is extended to the inspection device and is not connected to the flat cable around the insulator 8.
- FIG. 7 is a sectional view showing a contact block according to Embodiment 4 of the present invention.
- the contact block 54 has the same configuration as the contact block 4 shown in FIG. 1 except that the insulator 8 and the adhesive 8a are not used.
- the contact block 54 first holds the flexible wiring board 7 in a predetermined shape, in this state, pours the liquid resin 18 into the space formed by the flexible wiring board 7, and then solidifies the liquid resin. .
- the flexible wiring board 7 may be formed before the liquid resin 18 is completely solidified.
- the surface on the probing land 7a side should be flat.
- the present invention relates to an inspection block used when electrically inspecting an LCD panel or the like, and electrically connecting a probe and an inspection device with each other.
- it is useful for contact blocks that can form a probing land corresponding to the density of connection terminals to be inspected such as LCD panels and are easy to manufacture.
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004107428A JP4738752B2 (ja) | 2004-03-31 | 2004-03-31 | 検査ブロック |
JP2004-107428 | 2004-03-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005095999A1 true WO2005095999A1 (ja) | 2005-10-13 |
Family
ID=35063917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/005774 WO2005095999A1 (ja) | 2004-03-31 | 2005-03-28 | 検査ブロック |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4738752B2 (ja) |
CN (1) | CN100565216C (ja) |
TW (1) | TWI362494B (ja) |
WO (1) | WO2005095999A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101509937B (zh) * | 2008-02-15 | 2012-01-11 | 日本麦可罗尼克斯股份有限公司 | 探针单元及检查装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01502451A (ja) * | 1987-01-20 | 1989-08-24 | ヒユーズ・エアクラフト・カンパニー | 電気装置用の試験コネクタ |
JP2000147005A (ja) * | 1998-11-13 | 2000-05-26 | Micronics Japan Co Ltd | コンタクトユニット及び電気的接続装置 |
JP2000150595A (ja) * | 1998-11-09 | 2000-05-30 | Micronics Japan Co Ltd | コンタクトユニット及び電気的接続装置 |
JP2001318116A (ja) * | 2000-05-11 | 2001-11-16 | Micronics Japan Co Ltd | 表示用パネル基板の検査装置 |
JP2002323516A (ja) * | 2001-04-26 | 2002-11-08 | Mitsubishi Materials Corp | プローブ装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2852943B2 (ja) * | 1989-09-28 | 1999-02-03 | 株式会社リコー | 複写装置 |
US5166609A (en) * | 1990-05-24 | 1992-11-24 | Tektronix, Inc. | Adapter and test fixture for an integrated circuit device package |
JPH08298356A (ja) * | 1995-04-27 | 1996-11-12 | Toppan Printing Co Ltd | プリント配線板 |
JP2001102705A (ja) * | 1999-09-30 | 2001-04-13 | Eitekku Kk | フレキシブル基板 |
JP2001102704A (ja) * | 1999-09-30 | 2001-04-13 | Eitekku Kk | フレキシブル基板 |
JP2001156216A (ja) * | 1999-11-26 | 2001-06-08 | Nippon Circuit Kogyo Kk | 半導体パッケージ用基板 |
JP2002319750A (ja) * | 2001-04-23 | 2002-10-31 | Toshiba Chem Corp | プリント配線基板、半導体装置、及び、これらの製造方法 |
-
2004
- 2004-03-31 JP JP2004107428A patent/JP4738752B2/ja not_active Expired - Fee Related
-
2005
- 2005-03-28 CN CNB2005800103308A patent/CN100565216C/zh not_active Expired - Fee Related
- 2005-03-28 WO PCT/JP2005/005774 patent/WO2005095999A1/ja active Application Filing
- 2005-03-30 TW TW94109935A patent/TWI362494B/zh not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01502451A (ja) * | 1987-01-20 | 1989-08-24 | ヒユーズ・エアクラフト・カンパニー | 電気装置用の試験コネクタ |
JP2000150595A (ja) * | 1998-11-09 | 2000-05-30 | Micronics Japan Co Ltd | コンタクトユニット及び電気的接続装置 |
JP2000147005A (ja) * | 1998-11-13 | 2000-05-26 | Micronics Japan Co Ltd | コンタクトユニット及び電気的接続装置 |
JP2001318116A (ja) * | 2000-05-11 | 2001-11-16 | Micronics Japan Co Ltd | 表示用パネル基板の検査装置 |
JP2002323516A (ja) * | 2001-04-26 | 2002-11-08 | Mitsubishi Materials Corp | プローブ装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101509937B (zh) * | 2008-02-15 | 2012-01-11 | 日本麦可罗尼克斯股份有限公司 | 探针单元及检查装置 |
Also Published As
Publication number | Publication date |
---|---|
CN100565216C (zh) | 2009-12-02 |
TW200535504A (en) | 2005-11-01 |
CN1938594A (zh) | 2007-03-28 |
JP2005291922A (ja) | 2005-10-20 |
TWI362494B (en) | 2012-04-21 |
JP4738752B2 (ja) | 2011-08-03 |
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