WO2005085492A1 - Film forming equipment and film forming method - Google Patents

Film forming equipment and film forming method Download PDF

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Publication number
WO2005085492A1
WO2005085492A1 PCT/JP2005/003171 JP2005003171W WO2005085492A1 WO 2005085492 A1 WO2005085492 A1 WO 2005085492A1 JP 2005003171 W JP2005003171 W JP 2005003171W WO 2005085492 A1 WO2005085492 A1 WO 2005085492A1
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WO
WIPO (PCT)
Prior art keywords
substrate
mask
film forming
magnet
tray
Prior art date
Application number
PCT/JP2005/003171
Other languages
French (fr)
Japanese (ja)
Inventor
Hisato Tanaka
Original Assignee
Ulvac, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac, Inc. filed Critical Ulvac, Inc.
Publication of WO2005085492A1 publication Critical patent/WO2005085492A1/en

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/12Light sources with substantially two-dimensional radiating surfaces
    • H05B33/14Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source

Definitions

  • the present invention relates to a film forming apparatus and a film forming method for forming a film after aligning a substrate and a mask in the same vacuum chamber.
  • an alignment technique for aligning the substrate and the mask with high precision is important.
  • an organic EL (Electro Luminescence) display device using an organic thin film when forming three types of organic thin films that generate light of the three primary colors on the same substrate, a predetermined mask pattern (opening) is required.
  • the mask on which is formed) is positioned with high precision on the film forming surface of the substrate, and a predetermined film forming process such as vapor deposition or sputtering is performed.
  • an alignment chamber for aligning a substrate and a mask and a film forming chamber are formed in separate chambers. For example, when transferring a (mask) or forming a multilayer film, the substrate was unloaded Z from one deposition chamber to the other deposition chamber (see Patent Document 2 below).
  • Patent Document 1 Japanese Patent Application Laid-Open No. 2001-358202
  • Patent Document 2 JP 2002-367781 A
  • the present invention has been made in view of the above-described problems, and enables a film forming process to be performed quickly after alignment of a substrate and a mask, and eliminates the need for a substrate transfer system between different types of chambers, and is also applicable to continuous film forming. It is an object to provide a film forming apparatus and a film forming method that can be used.
  • the above-mentioned problems are caused by an alignment unit for aligning a substrate and a mask in the same vacuum chamber, a transfer tray for receiving the substrate and the mask from the alignment unit, and a transfer tray for the transfer unit. And a film forming means arranged along the transfer path.
  • the above problem is caused by an alignment step of aligning a substrate and a mask by an alignment unit in the same vacuum chamber, and transferring the substrate and the mask from the alignment unit to a transfer tray.
  • the problem is solved by a film forming method comprising a transfer step and a film forming step of forming a film on a film forming surface of the substrate while transferring the transfer tray along a transfer path.
  • an alignment unit for aligning a substrate and a mask in the same vacuum chamber, a transfer tray for receiving the substrate and the mask from the alignment unit,
  • the substrate transported into the vacuum chamber is transferred to a transport tray after alignment with a mask because the film transport means is provided along the transport path of the tray.
  • the transfer process by the tray it becomes possible to form a film on the substrate film formation surface via a mask.
  • a rapid film forming process can be performed after the alignment of the substrate, so that the productivity can be improved while eliminating the need for a complicated substrate transfer system between different types of chambers.
  • a plurality of evaporation sources / sputtering targets or other film forming means may be arranged in the film forming chamber. Thereby, continuous film formation of the substrate becomes possible, and it is possible to cope with formation of a multilayer film.
  • the process can be continuously shifted to the film formation process, so that the productivity can be improved and the single vacuum chamber can be used.
  • an alignment process and a film forming process of the substrate can be realized, and it is possible to sufficiently cope with multilayer film formation.
  • FIG. 1 is a schematic configuration diagram of a film forming apparatus 1 according to an embodiment of the present invention.
  • FIG. 2 is a front sectional view showing a main part of the alignment unit 3.
  • FIG. 3 is a side view showing a main part of the alignment unit 3.
  • FIG. 4 is a plan view showing a main part of the alignment unit 3.
  • FIG. 5 is a cross-sectional view when the transport tray 4 is viewed from the transport direction.
  • FIG. 6 is a plan view of a transport tray 4.
  • FIG. 7 is a front sectional view for explaining one operation of the alignment unit 3.
  • FIG. 8 is a side sectional view for explaining one operation of the transport tray 4.
  • Support plate 21 hooks
  • FIG. 1 is a side sectional view showing a schematic configuration of a film forming apparatus 1 according to an embodiment of the present invention.
  • the film forming apparatus 1 transports the substrate 5 and the mask 6 into one vacuum chamber 2 by aligning the substrate 5 and the mask 6 with each other and maintaining the alignment state.
  • a transport tray 4 and a film forming unit 8 for forming a film on a substrate 5 on the transport tray 4 via a mask 6 are provided.
  • FIG. 2 to FIG. 4 show a schematic configuration of the alignment unit 3, FIG. 2 is a front sectional view of the main part, FIG. 3 is a side view of the main part, and FIG. 4 is a plan view of the main part. is there.
  • the alignment unit 3 includes a substrate support unit 10 that supports the substrate 5, a mask holder 11 that supports the mask 6, and a magnet elevating mechanism 12 that elevates and lowers a magnet 7 (see FIG. 5) that tightly contacts the substrate 5 and the mask 6. And
  • the substrate supporting units 10 are respectively disposed at two locations (a total of four locations) on a pair of opposing side edges of the substrate 5, and each have a hook 21 that supports the lower surface of the peripheral edge of the substrate 5. ing.
  • Each of these hooks 21 is vertically movable by a vertically extending shaft 21A extending in the vertical direction.
  • Each of these substrate support units 10 is provided with a substrate lifting / lowering mechanism unit 31 that simultaneously raises and lowers each hook 21.
  • the substrate elevating mechanism 31 includes a guide plate 23 fixed integrally to the outer periphery of the elevating shaft 21 A, and a guide erecting on a support plate 13 mounted on the top plate 2 a of the vacuum chamber 2. It has a rail 24 and a linear bearing 25 for moving the guide plate 23 along the guide rail 24!
  • the guide plate 23 supports lifting shafts 21 A, 21 A of a pair of substrate support units 10, 10 adjacent to each other, and the guide plate 23 is provided with the rotational movement of the ball screw 14.
  • a block member 15 that converts the movement into vertical movement is attached (Fig. 3).
  • the ball screw 14 is supported by a base plate 16 attached to the upper end of the guide rail 24 and the support plate 13 and extends in the vertical direction.
  • the base plate 16 is further provided with a first drive unit 41 for driving the ball screw 14 to rotate (FIG. 3).
  • a pulley 41b is fixed to the drive shaft 41a of the first drive unit 41, and a belt 26A is stretched between the pulley 41b and the pulley 14a fixed to the upper end of the ball screw 14.
  • a pair of pulleys 41b on the first drive unit 41 side are provided, and the other pulley 41b is provided with a guide plate 23 that supports the lifting shaft 21A of the remaining substrate support unit 10 located on the opposite side to the direction shown in FIG. Belt 26B that rotates the ball screw 14 for lifting and lowering Is stretched out.
  • each substrate support unit 10 can be moved up and down at the same time by driving the first drive unit 41.
  • the substrate support unit 10 is provided with a second drive unit 42 such as a rotary actuator for rotating the hook 21 around the elevating shaft 21A (FIG. 3).
  • the second drive unit 42 is connected to the upper end of the elevating shaft 21A via a magnetic fluid seal 27, and
  • the substrate supporting unit 10 is configured as described above, and these constitute the “substrate supporting mechanism” according to the present invention.
  • the substrate 5 is placed inside the vacuum chamber 2 by this substrate support mechanism! In addition, it is vertically movable relative to the mask 6 supported by the mask holder 11 at a position directly below.
  • the mask holder 11 includes a plurality of support claws 51 for supporting, for example, four corner lower surfaces of the periphery of the mask 6 made of magnetic metal, a plurality of support rods 52 for supporting the support claws 51 at lower ends thereof, An attachment plate 53 to which the support rods 52 are attached, and a hollow shaft 54 that supports the attachment plate 53 are provided.
  • the hollow shaft 54 is inserted into a hollow support shaft 34 that supports a guide rod 33 that guides the elevation of the mounting plate 53, and is movable up and down relatively to the support shaft 34. I have.
  • the guide rod 33 is held at a fixed position inside the vacuum chamber 2, and is connected to the mounting plate 53 via a guide bush 35.
  • the mask holder 11 including the hollow shaft 54 is supported on the upper surface of a suspension plate 60 of a magnet lifting mechanism 12 described later, and rises with the lifting movement of the suspension plate 60.
  • the plate 60 is lowered by its own weight as the plate 60 moves downward.
  • the lowermost position of the mask holder 11 is regulated by a stopper 36 provided at the lower end of the guide rod 33.
  • the support shaft 34 is rotatable by a motor 56 on the support plate 13, and is connected to an XY direction moving unit 58 via a magnetic fluid seal 57.
  • the motor 56 and the XY direction moving unit 58 By driving the motor 56 and the XY direction moving unit 58, the mask holder 11 and the mask 6 supported by the mask rod 11 together with the guide rod 33 are relatively movable in the X, Y and ⁇ directions. Yes.
  • the motor 56, the XY direction moving section 58, the CCD camera 59, and the like constitute an "alignment mechanism" of the present invention.
  • the magnet elevating mechanism 12 includes a magnet 7 (see FIG. 5) for closely adhering the substrate 5 and the mask 6 precisely aligned with each other, a magnet holder 61 for holding the magnet 7 on the lower surface, and a magnet holder 61.
  • the system includes a hanging plate 60 to be hung, a magnet elevating shaft 62 for elevating and lowering the hanging plate 60, and a third drive unit 43 connected to the magnet elevating shaft 62 to elevate the magnet holder 61.
  • the magnet elevating shaft 62 is inserted so as to be relatively movable with respect to the axis of the hollow shaft 54 of the mask holder 11, and has a third driving unit such as a hydraulic or pneumatic reciprocating cylinder at the upper end thereof. 43 are linked.
  • a suspension plate 60 is fixed to the lower end of the magnet elevating shaft 62.
  • the suspending plate 60 supports the mask holder 11 on its upper surface, and moves the mask holder 11 up and down in conjunction with the up and down movement of the magnet elevating shaft 62.
  • a plurality of suspension hooks 66 having a substantially L-shaped cross section for suspending the magnet holder 61 are attached at predetermined positions. This hanging hook 66 is bent in the standby position force transfer direction of the transfer tray 4 as described later.
  • a plate-shaped magnet 7 is attached to the lower surface of the magnet holder 61, and a locking portion 67 that detachably locks to the hanging hook 66 of the hanging plate 60 is provided on the upper surface thereof.
  • a plurality are attached corresponding to the formation positions of the bosses 66.
  • the locking portion 67 is formed in a substantially annular shape, and the direction of detachment from the hanging hook 66 is a direction in which the transport tray 4 moves toward the film forming portion 8 as described later.
  • the magnet holder 61 is provided with a substrate holder 64 for restricting the displacement of the substrate 5 when the magnet 7 is attached to or detached from the substrate 5.
  • the board holder 64 is a thin plate made of a non-magnetic metal material such as aluminum, and is suspended via a plurality of stepped pins 63 so as to be vertically movable by a predetermined distance relative to the magnet holder 61. Yes.
  • the alignment unit 3 is configured as described above.
  • the transport tray 4 will be described.
  • 5 and 6 are views showing the configuration of the transport tray 4, FIG. 5 is a cross-sectional view as viewed from the transport direction, and FIG. 6 is a plan view thereof.
  • the transport tray 4 is provided on both sides of the rectangular tray main body 70 having an opening 71 for exposing the film-forming surface of the substrate 5 to the outside of the tray downward at the center, and on both sides of the tray main body.
  • Wheel brackets 72A and 72B, and wheels 73A and 73B respectively attached to the wheel brackets 72A and 72B.
  • the opening 71 of the transfer tray 4 has a substantially rectangular shape, and is tapered in an inverted mortar shape from the upper surface side to the lower surface side of the tray main body 70.
  • the upper surface of the periphery of the opening 71 serves as a mounting surface for the mask 6 and the substrate 5 and the magnet 7 to be superimposed thereon.
  • a deposition prevention plate 78 is attached to the lower surface of the peripheral edge of the opening 71.
  • Escape grooves 75, 75 for avoiding interference with the support claws 51 of the mask holder 11 supporting the mask 6 are provided on both sides of the opening 71 in the tray conveyance direction, respectively, at the rear end of the tray body 70. It is formed. Thus, after the mask 6 and the substrate 5 and the magnet 7 laid thereon are mounted on the mounting surface of the tray main body 70, as the tray main body 70 moves in the transport direction of the transport tray 4, these The support claw 51 also comes out of the rear end force of the tray body 4 via the escape groove 75.
  • the hook 21 of the substrate support unit 10 that supports the substrate 5 is provided with a support claw of the mask holder 11 via a predetermined clearance formed on a side edge of the mask 6 that is superimposed on the substrate 5. Along with 51, the rear end force of the tray body 70 is also released with the transport of the transport tray 4.
  • the wheels 73A and 73B are supported by a pair of transport rails 74A and 74B constituting a transport path of the transport tray 4.
  • a substantially V-shaped groove is formed on the rolling contact surface of the transfer rail 74A, and the transfer rail 74A that supports the groove is also formed with a corresponding protrusion having a substantially triangular cross section.
  • the other wheel 73B has a flat rolling contact surface with the transfer rail 74B, and the transfer rail 74B supporting the transfer rail 74B also has a corresponding flat shape. This allows the transport tray 4 to be positioned with reference to one wheel 73A. It has become.
  • guide rollers 76A and 76B that are in rolling contact with the respective wheel brackets 72A and 72B of the transport tray 4 are provided.
  • the guide rollers 76A, 76B can be advanced and retracted to a retreat position shown by a solid line in FIG. 2 and a guide position shown by a dashed line in FIG. 2 by drive units 77A, 77B attached to both side walls of the vacuum chamber 2.
  • the transport system of the transport tray 4 employs a rack “and” pinion mechanism. That is, a rack 79 attached to the lower end of one wheel bracket 72A is configured to engage with a pinion gear (not shown) arranged in parallel with the transport rail 74A. The precise feed operation of Tray 4 becomes possible.
  • the wheels 73A and 73B, the transport rails 74A and 74B, the guide rollers 76A and 76B, and the like constitute the “guide mechanism” of the present invention.
  • Each of the wheels 73A, 73B is attached inwardly to the outer wall of the substantially U-shaped wheel bracket 72A, 72B. Then, in order to prevent the film-forming material from adhering to the wheels 73A, 73B and the transport rails 74A, 74B, the transport path of the transport tray 4 is so covered as to cover the wheels 73A, 73B and the transport rails 74A, 74B from the inside.
  • the shield plates 75A and 75B are respectively provided along.
  • the film forming section 8 is configured in a linear tubular tube 80 of the vacuum chamber 2, and a plurality of film forming means are arranged adjacent to each other along the transport path of the transport tray 4.
  • a sputtering target unit 81A to 81F are provided to deposit a film-forming material on a substrate by a sputtering method.
  • an evaporation source is provided instead of a unit, and a film formation source corresponding to the film formation method will be installed.
  • the sputter target units 81A-81F are provided on a film forming source mounting base 82 disposed below the transfer renoles 74A and 74B, and the film forming source can be easily changed according to the application. It is like that.
  • Each sputter target unit 81A-81F is composed of targets of the same material, and may be composed of targets of different materials. May be.
  • a maintenance outlet 83 for removing the transport tray 4 out of the system is provided.
  • the film forming apparatus 1 of the present embodiment is configured as described above.
  • the alignment unit 3 of the film forming apparatus 1 is formed on a support plate 13 placed on a top plate 2a of the vacuum chamber 2 as a whole.
  • the alignment operation is not affected by the deformation of the top plate 2a due to the pressure difference or the like.
  • the film forming apparatus 1 performs an alignment step in which the substrate 5 and the mask 6 are aligned by the alignment unit 3 inside the vacuum chamber 2, and transports the substrate 5 and the mask 6 from the alignment unit 3. And a film forming step of forming a film on the film forming surface of the substrate 5 by the film forming unit 8 while transferring the transfer tray 4 along the transfer path.
  • the operation of the film forming apparatus 1 will be described.
  • the substrate 5 carried into the vacuum chamber 2 with the film-forming surface facing downward by a robot has its peripheral lower surface fixed by the hooks 21 of each substrate support unit 10. Supported.
  • the deposition surface (lower surface) of the substrate 5 supported by the substrate support unit 10 faces the mask 6 supported by the mask holder 11, and the opposite non-deposition surface (upper surface) is suspended from the magnet holder 61. It faces the lowered substrate holder 64.
  • the alignment of the substrate 5 and the mask 6 is performed by the alignment unit 3.
  • the alignment between the substrate 5 and the mask 6 is performed by using the mask holder 11 supporting the mask 6 with respect to the substrate 5 stationary by the substrate support unit 10 by using the motor 56 and the X-Y direction moving unit 58 for ⁇ , X, and Y.
  • the substrate 5 and the mask 6 are aligned by relative movement in the directions.
  • each image of the alignment mark of the substrate 5 and the alignment mark of the mask 6 is acquired by the CCD camera 59, and based on these alignment marks, the motor 56 and the XY direction moving unit 58 are operated. Drive and move the mask holder 11 in each of the ⁇ , X and Y directions.
  • each of the substrate support units 10 is simultaneously lowered by driving the substrate lifting / lowering mechanism unit 31, and suspended by driving the third driving unit 43. Lower the mask holder 11 supported by the lowering plate 60, and Then, the mask 6 and the substrate 5 are transferred onto the mounting surface of the transfer tray 4 in this order. At this time, the mask holder 11 descends with the guide action of the guide rod 33, and a predetermined alignment accuracy is secured.
  • the operation is not limited to the above-described operation example in which the substrate 5 is moved down toward the transport tray 4 together with the mask 6, but the substrate 5 is once superimposed on the mask 6, and the substrate supporting unit 10 releases the substrate 5 supporting action. After that, the mask 6 and the substrate 5 supported by the mask holder 6 may be integrally transferred to the transport tray 4. In this case, if each substrate support unit 10 superimposes the substrate 5 on the mask 6 and turns each hook 21 to the outside of the substrate 5 by driving the second driving unit 42, the substrate The transfer operation of 5 to the transfer tray 4 is not obstructed.
  • the third drive section 43 is further driven to move the suspension plate 60 downward relative to the mask holder 11 as shown in FIG.
  • the magnet holder 61 is placed on the non-deposition surface (upper surface) of the substrate 5.
  • the substrate holder 64 suspended by the magnet holder 61 reaches the upper surface of the substrate 5 before the magnet 7 attached to the lower surface of the magnet holder 61, and the weight of the substrate holder 64 The action of pressing the substrate 5 toward the mask 6 is performed. Then, the magnet 7 is overlapped on the substrate holder 64 in contact with the substrate 5 while suppressing the deformation of the mask 6 toward the magnet 7 due to the magnetic force of the magnet 7. Thus, precise alignment and close contact between the substrate 5 and the mask 6 can be achieved (FIG. 5).
  • the step of transferring the substrate 5 and the mask 6 to the transport tray 4 is completed. Subsequently, a step of forming a film on the film formation surface of the substrate 5 while transferring the transfer tray 4 along the transfer path is performed.
  • the transport tray 4 is waiting at a transfer position immediately below the alignment unit 3, as shown in FIGS. After the substrate 5 and the mask 6 integrated by the magnet 7 are mounted on the mounting surface of the transfer tray 4, the transfer direction is performed by the guide rollers 76A and 76B extended by the driving units 77A and 77B. The wafer is transported to the film forming unit 8 along the transport rails 74A and 74B while being properly guided to the film forming unit 8.
  • the transfer tray 4 moves in the direction indicated by the arrow A in the locking portion 67 of the magnet holder 61 locked by the hanging hook 66 of the hanging plate 60 as shown in FIG. Occasionally The locking action with the suspension hook 66 is released.
  • the suspension plate 60 and the magnet holder 61 are separated from each other, and the magnet holder 61 is supported on the transport tray 4 together with the magnet 7.
  • the film is formed on the substrate 5 through the opening 71 of the carrying tray 4 at a position directly above the sputter target units 81A-81F, and a film pattern having a shape corresponding to the opening pattern of the mask 6 is formed. It is formed on the deposition surface of the substrate 5.
  • the transport tray 4 may be intermittently sent to a position immediately above each of the sputter target units 81A-81F, or the position directly above each of the sputter target units 81A-81F may be fixed. It may be sent continuously at a speed.
  • a thick film deposition pattern can be obtained.
  • a sputter target of a different material is applied, a multilayer film structure can be obtained. Can be obtained.
  • the transfer system is different from the conventional substrate transfer system between different vacuum chambers. Can be simplified, thereby reducing the device manufacturing cost and improving the maintainability.
  • the transfer tray 4 is moved to the transfer rail.
  • the process returns to the original transfer position along 74A and 74B, and the process of transferring the film-formed substrate 5 together with the mask 6 and the magnet 7 to the transport tray 4 force alignment unit 3 is performed.
  • the support claws 51 of the mask holder 11 and the hooks 21 of the substrate support unit 10 are on standby, and when the transport tray 4 returns to the transfer position, the transfer tray 4 returns to the lower surface of the periphery of the substrate 5 and the mask 6.
  • the support claw 51 and the hook 21 face each other. Further, the locking portion 67 of the magnet holder 61 and the hanging hook 66 of the hanging plate 60 are locked. Then, the magnet elevating shaft 62 is raised to lift the magnet holder 61 via the suspension plate 60 (FIG. 7).
  • the substrate 5 is lifted by raising the substrate support unit 10, and the mask holder 11 is lifted integrally with the suspension plate 60, so that the transport tray 4 also moves the substrate 5 and the mask 6 to the alignment unit 3. Is completed. Thereafter, a robot (not shown) enters below the substrate 5 and is carried out of the vacuum chamber 2, and a new substrate 5 to be processed next is placed on the hook 21 of the substrate support unit 10.
  • the present invention is not limited to the power described in the embodiment of the present invention, and various modifications are possible based on the technical idea of the present invention.
  • the force for bringing the substrate 5 and the mask 6 into close contact by the magnet 7 is used instead.
  • the configuration of the magnet lifting mechanism 12 is changed so that the substrate 5 is superimposed on the mask 6 and adhered by the magnet 7 before transfer to the transport tray 4. It may be. In this case, the substrate 5 and the mask 6 are transferred to the transport tray 4 in a state where they are integrated by the magnet 7.

Abstract

Film forming equipment and a film forming method, by which a film forming process can be performed immediately after aligning a substrate with a mask, a substrate transfer system between different types of chambers is eliminated and a film can be continuously formed. In a same vacuum chamber (2), an alignment unit (3) for aligning the substrate (5) with the mask (6), a transfer tray (4) for receiving the substrate (5) and the mask (6) from the alignment unit (3), and a plurality of film forming sources (81A)-(81F) which are arranged along a transfer path of the transfer tray (4) are provided. To transfer the substrate (5) and the mask (6) between the alignment unit (3) and the transfer tray (4), a magnet holder (61) is separated from a magnet lifting mechanism (12) through a locking part (67).

Description

成膜装置及び成膜方法  Film forming apparatus and film forming method
技術分野  Technical field
[0001] 本発明は、同一の真空チャンバにおいて、基板とマスクとをァライメントした後成膜 する成膜装置及び成膜方法に関する。  The present invention relates to a film forming apparatus and a film forming method for forming a film after aligning a substrate and a mask in the same vacuum chamber.
背景技術  Background art
[0002] 基板にマスクを重ねて成膜する成膜装置においては、基板とマスクを高精度に位 置合わせするァライメント技術が重要とされている。例えば、有機薄膜を用いた有機 EL (Electro Luminescence)表示装置の製造においては、三原色の各色の光を発生 させる三種類の有機薄膜を同一の基板上に形成する際、所定のマスクパターン (開 口)が形成されたマスクを基板の成膜面に高精度に位置決めして蒸着あるいはスパ ッタ等の所定の成膜処理が行われて 、る。  [0002] In a film forming apparatus that forms a film by overlapping a mask on a substrate, an alignment technique for aligning the substrate and the mask with high precision is important. For example, in the manufacture of an organic EL (Electro Luminescence) display device using an organic thin film, when forming three types of organic thin films that generate light of the three primary colors on the same substrate, a predetermined mask pattern (opening) is required. The mask on which is formed) is positioned with high precision on the film forming surface of the substrate, and a predetermined film forming process such as vapor deposition or sputtering is performed.
[0003] ところで、従来より、有機 EL表示装置の製造に用いられる成膜装置においては、マ スクとして磁性材料製のメタルマスクが用いられており、マスクの上に基板を位置合わ せした後、基板の上にマグネットを重ね、このマグネットとマスクとの間で基板を挟む ことによって、互いに位置合わせされた基板とマスクの密着状態を保持している(下 記特許文献 1, 2参照)。  [0003] By the way, conventionally, in a film forming apparatus used for manufacturing an organic EL display device, a metal mask made of a magnetic material is used as a mask, and after a substrate is positioned on the mask, By placing a magnet on the substrate and sandwiching the substrate between the magnet and the mask, the aligned state of the substrate and the mask aligned with each other is maintained (see Patent Documents 1 and 2 below).
[0004] また、従来の成膜装置においては、基板とマスクとを位置合わせするァライメント室 と成膜室とが別々のチャンバに構成され、搬送ロボット等でァライメント室力 成膜室 へ基板 (及びマスク)を搬送したり、多層膜を形成する場合等には、一方の成膜室か ら他方の成膜室へ基板を搬出 Z入して ヽた (下記特許文献 2参照)。  In a conventional film forming apparatus, an alignment chamber for aligning a substrate and a mask and a film forming chamber are formed in separate chambers. For example, when transferring a (mask) or forming a multilayer film, the substrate was unloaded Z from one deposition chamber to the other deposition chamber (see Patent Document 2 below).
[0005] 特許文献 1:特開 2001— 358202号公報  [0005] Patent Document 1: Japanese Patent Application Laid-Open No. 2001-358202
特許文献 2 :特開 2002-367781号公報  Patent Document 2: JP 2002-367781 A
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0006] し力しながら、従来の成膜装置にお!、ては、上述のようにァライメント室と成膜室と が異なるチャンバで構成されているので、これらのチャンバ間における基板の搬送シ ステムが必要となり、ァライメント後の迅速な成膜処理が行えず、生産性に劣るという 問題がある。 [0006] In a conventional film forming apparatus, since the alignment chamber and the film forming chamber are composed of different chambers as described above, the transfer system for the substrate between these chambers may be used. Since a stem is required, a rapid film formation process after the alignment cannot be performed, and there is a problem that productivity is poor.
[0007] また、従来の成膜装置においては、多層膜を形成する場合、複数の成膜室に亘っ て基板を搬送する必要があるので、この場合にも異種チャンバ間における基板搬送 システムが必須となり、装置構成の複雑化、生産性の低下を引き起こすという問題が ある。  [0007] Further, in the conventional film forming apparatus, when a multilayer film is formed, it is necessary to transfer the substrate over a plurality of film forming chambers. In this case, a substrate transfer system between different types of chambers is indispensable. As a result, there is a problem that the device configuration becomes complicated and productivity is reduced.
[0008] 本発明は上述の問題に鑑みてなされ、基板とマスクのァライメント後迅速に成膜処 理を可能とし、異種チャンバ間における基板搬送システムを不要として、連続成膜に も対応することができる成膜装置及び成膜方法を提供することを課題とする。  [0008] The present invention has been made in view of the above-described problems, and enables a film forming process to be performed quickly after alignment of a substrate and a mask, and eliminates the need for a substrate transfer system between different types of chambers, and is also applicable to continuous film forming. It is an object to provide a film forming apparatus and a film forming method that can be used.
課題を解決するための手段  Means for solving the problem
[0009] 以上の課題は、同一の真空チャンバ内に、基板とマスクとを位置合わせするァライ メントユニットと、このァライメントユニットから前記基板と前記マスクとを受け取る搬送 用トレイと、この搬送用トレイの搬送経路に沿って配置される成膜手段とを備えたこと を特徴とする成膜装置、によって解決される。 [0009] The above-mentioned problems are caused by an alignment unit for aligning a substrate and a mask in the same vacuum chamber, a transfer tray for receiving the substrate and the mask from the alignment unit, and a transfer tray for the transfer unit. And a film forming means arranged along the transfer path.
[0010] また、以上の課題は、同一の真空チャンバにおいて、ァライメントユニットにより基板 とマスクとを位置合わせするァライメント工程と、前記ァライメントユニットから前記基板 及び前記マスクを搬送用トレイへ移載する移載工程と、前記搬送用トレィを搬送経路 に沿って搬送しながら前記基板の成膜面に成膜する成膜工程とを有することを特徴 とする成膜方法、によって解決される。 [0010] Further, the above problem is caused by an alignment step of aligning a substrate and a mask by an alignment unit in the same vacuum chamber, and transferring the substrate and the mask from the alignment unit to a transfer tray. The problem is solved by a film forming method comprising a transfer step and a film forming step of forming a film on a film forming surface of the substrate while transferring the transfer tray along a transfer path.
[0011] 本発明によれば、同一の真空チャンバ内に、基板とマスクとを位置合わせするァラ ィメントユニットと、このァライメントユニットから基板とマスクとを受け取る搬送用トレイと 、この搬送用トレイの搬送経路に沿って配置される成膜手段とを備えているので、真 空チャンバ内に搬送された基板は、マスクとの位置合わせ後、搬送用トレイに移載さ れ、この搬送用トレイによる搬送過程で、基板成膜面に対し、マスクを介して成膜を行 うことが可能となる。これにより、基板のァライメント後、迅速な成膜処理が可能となる ので、異種チャンバ間における複雑な基板搬送システムを不要としながら、生産性の 向上を図ることができる。  According to the present invention, an alignment unit for aligning a substrate and a mask in the same vacuum chamber, a transfer tray for receiving the substrate and the mask from the alignment unit, The substrate transported into the vacuum chamber is transferred to a transport tray after alignment with a mask because the film transport means is provided along the transport path of the tray. In the transfer process by the tray, it becomes possible to form a film on the substrate film formation surface via a mask. As a result, a rapid film forming process can be performed after the alignment of the substrate, so that the productivity can be improved while eliminating the need for a complicated substrate transfer system between different types of chambers.
[0012] また、成膜室内に複数の蒸発源ゃスパッタターゲット等の成膜手段を配置すること により、基板の連続成膜が可能となり、多層膜形成にも対応することができる。 [0012] Further, a plurality of evaporation sources / sputtering targets or other film forming means may be arranged in the film forming chamber. Thereby, continuous film formation of the substrate becomes possible, and it is possible to cope with formation of a multilayer film.
発明の効果  The invention's effect
[0013] 以上のように、本発明によれば、基板とマスクの位置合わせ後、連続して成膜処理 に移行できるので、生産性の向上を図ることができると共に、一台の真空チャンバで 、基板のァライメント工程及び成膜工程が実現でき、多層成膜にも十分に対応するこ とがでさる。  [0013] As described above, according to the present invention, after the alignment between the substrate and the mask, the process can be continuously shifted to the film formation process, so that the productivity can be improved and the single vacuum chamber can be used. In addition, an alignment process and a film forming process of the substrate can be realized, and it is possible to sufficiently cope with multilayer film formation.
図面の簡単な説明  Brief Description of Drawings
[0014] [図 1]本発明の実施の形態による成膜装置 1の概略構成図である。 FIG. 1 is a schematic configuration diagram of a film forming apparatus 1 according to an embodiment of the present invention.
[図 2]ァライメントユニット 3の要部を示す正面断面図である。  FIG. 2 is a front sectional view showing a main part of the alignment unit 3.
[図 3]ァライメントユニット 3の要部を示す側面図である。  FIG. 3 is a side view showing a main part of the alignment unit 3.
[図 4]ァライメントユニット 3の要部を示す平面図である。  FIG. 4 is a plan view showing a main part of the alignment unit 3.
[図 5]搬送トレィ 4をその搬送方向から見たときの断面図である。  FIG. 5 is a cross-sectional view when the transport tray 4 is viewed from the transport direction.
[図 6]搬送トレィ 4の平面図である。  FIG. 6 is a plan view of a transport tray 4.
[図 7]ァライメントユニット 3の一作用を説明する正面断面図である。  FIG. 7 is a front sectional view for explaining one operation of the alignment unit 3.
[図 8]搬送トレィ 4の一作用を説明する側断面図である。  FIG. 8 is a side sectional view for explaining one operation of the transport tray 4.
符号の説明  Explanation of symbols
1 成膜装置  1 Film forming equipment
2 真空チャンノ  2 Vacuum Channo
3 ァライメントユニット  3 Alignment unit
4 搬送トレィ  4 Transport tray
5 基板  5 substrate
6 マスク  6 Mask
7 マグネット  7 Magnet
8 成膜部  8 Deposition unit
10 基板支持ユニット  10 Board support unit
11 マスクホノレダ  11 Mask Honoreda
12 マグネット昇降機構  12 Magnet lifting mechanism
13 支持プレート 21 フック 13 Support plate 21 hooks
21A 昇降軸  21A lifting shaft
31 基板昇降機構部  31 Substrate lifting mechanism
33 ガイドロッド  33 Guide rod
34 支軸  34 spindle
41 第 1駆動部  41 1st drive part
42 第 2駆動部  42 2nd drive part
43 第 3駆動部  43 3rd drive
51 支持爪  51 Supporting claws
54 中空軸  54 hollow shaft
56 モータ  56 motor
58 X— Y方向移動部  58 X—Y direction moving part
59 CCDカメラ  59 CCD camera
60 吊下げプレート  60 Suspension plate
61 マグネットホルダ  61 Magnet holder
62 マグネット昇降軸  62 Magnet lifting shaft
64 基板押え  64 PCB holder
67 係止部  67 Lock
70 トレイ本体  70 Tray body
71 開口部  71 Opening
73A, 73B 車輪  73A, 73B wheels
74A, 74B 搬送レール  74A, 74B Transfer rail
81A—81F スパッタターゲットユニット  81A-81F Sputter target unit
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0016] 以下、本発明の実施の形態について図面を参照して説明する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0017] 図 1は、本発明の実施の形態による成膜装置 1の概略構成を示す側断面図である 。成膜装置 1は、一つの真空チャンバ 2内に、基板 5とマスク 6とを互いにァライメントし てその状態を保持するァライメントユニット 3と、これら基板 5及びマスク 6を搬送する 搬送トレィ 4と、搬送トレィ 4上の基板 5に対しマスク 6を介して成膜する成膜部 8とを備 えている。 FIG. 1 is a side sectional view showing a schematic configuration of a film forming apparatus 1 according to an embodiment of the present invention. The film forming apparatus 1 transports the substrate 5 and the mask 6 into one vacuum chamber 2 by aligning the substrate 5 and the mask 6 with each other and maintaining the alignment state. A transport tray 4 and a film forming unit 8 for forming a film on a substrate 5 on the transport tray 4 via a mask 6 are provided.
[0018] 図 2—図 4はァライメントユニット 3の概略構成を示しており、図 2はその要部の正面 断面図、図 3はその要部側面図、図 4はその要部平面図である。ァライメントユニット 3 は、基板 5を支持する基板支持ユニット 10と、マスク 6を支持するマスクホルダ 11と、 基板 5とマスク 6とを密着させるマグネット 7 (図 5参照)を昇降させるマグネット昇降機 構 12とを備えている。  FIG. 2 to FIG. 4 show a schematic configuration of the alignment unit 3, FIG. 2 is a front sectional view of the main part, FIG. 3 is a side view of the main part, and FIG. 4 is a plan view of the main part. is there. The alignment unit 3 includes a substrate support unit 10 that supports the substrate 5, a mask holder 11 that supports the mask 6, and a magnet elevating mechanism 12 that elevates and lowers a magnet 7 (see FIG. 5) that tightly contacts the substrate 5 and the mask 6. And
[0019] 基板支持ユ ット 10は、基板 5の相対向する一対の側辺部に各々 2箇所ずつ(計 4 箇所)に配置され、基板 5の周縁下面を支持するフック 21をそれぞれ有している。こ れらフック 21はそれぞれ鉛直方向に延在する昇降軸 21Aにより昇降自在とされてい る。  The substrate supporting units 10 are respectively disposed at two locations (a total of four locations) on a pair of opposing side edges of the substrate 5, and each have a hook 21 that supports the lower surface of the peripheral edge of the substrate 5. ing. Each of these hooks 21 is vertically movable by a vertically extending shaft 21A extending in the vertical direction.
[0020] これら各基板支持ユニット 10は、各々のフック 21を同時に昇降させる基板昇降機 構部 31を備えている。  [0020] Each of these substrate support units 10 is provided with a substrate lifting / lowering mechanism unit 31 that simultaneously raises and lowers each hook 21.
[0021] 基板昇降機構部 31は、昇降軸 21Aの外周部に一体固定されたガイドプレート 23と 、真空チャンバ 2の天板部 2aの上に取り付けられた支持プレート 13上に立設された ガイドレール 24と、ガイドプレート 23をガイドレール 24に沿って移動させるリニア軸受 25とを有して!/ヽる。  The substrate elevating mechanism 31 includes a guide plate 23 fixed integrally to the outer periphery of the elevating shaft 21 A, and a guide erecting on a support plate 13 mounted on the top plate 2 a of the vacuum chamber 2. It has a rail 24 and a linear bearing 25 for moving the guide plate 23 along the guide rail 24!
[0022] ガイドプレート 23は、互いに隣接する一対の基板支持ユニット 10, 10の昇降軸 21 A, 21Aをそれぞれ支持しており、このガイドプレート 23には、ボールネジ 14の回転 運動を当該ガイドプレート 23の昇降運動に変換するブロック部材 15が取り付けられ ている(図 3)。ボールネジ 14は、ガイドレール 24の上端に取り付けられるベースプレ ート 16と支持プレート 13とに支持されて鉛直方向に延在している。  The guide plate 23 supports lifting shafts 21 A, 21 A of a pair of substrate support units 10, 10 adjacent to each other, and the guide plate 23 is provided with the rotational movement of the ball screw 14. A block member 15 that converts the movement into vertical movement is attached (Fig. 3). The ball screw 14 is supported by a base plate 16 attached to the upper end of the guide rail 24 and the support plate 13 and extends in the vertical direction.
[0023] ベースプレート 16には更に、ボールネジ 14を回転駆動する第 1駆動部 41が取り付 けられている(図 3)。この第 1駆動部 41の駆動軸 41aにはプーリ 41bが固定されてお り、これとボールネジ 14の上端に固定されたプーリ 14aとの間にベルト 26Aが張設さ れている。第 1駆動部 41側のプーリ 41bは一対設けられ、他方のプーリ 41bは、図 3 に示す方向とは反対側に位置する残余の基板支持ユニット 10の昇降軸 21 Aを支持 するガイドプレート 23を昇降させるためのボールネジ 14を回転駆動させるベルト 26B が張設されている。これにより、第 1駆動部 41の駆動によって、各基板支持ユニット 1 0を同時に昇降させることができる。 The base plate 16 is further provided with a first drive unit 41 for driving the ball screw 14 to rotate (FIG. 3). A pulley 41b is fixed to the drive shaft 41a of the first drive unit 41, and a belt 26A is stretched between the pulley 41b and the pulley 14a fixed to the upper end of the ball screw 14. A pair of pulleys 41b on the first drive unit 41 side are provided, and the other pulley 41b is provided with a guide plate 23 that supports the lifting shaft 21A of the remaining substrate support unit 10 located on the opposite side to the direction shown in FIG. Belt 26B that rotates the ball screw 14 for lifting and lowering Is stretched out. Thus, each substrate support unit 10 can be moved up and down at the same time by driving the first drive unit 41.
[0024] また、これら基板支持ユニット 10には、フック 21を昇降軸 21Aの周りに旋回させる ためのロータリーアクチユエータ等でなる第 2駆動部 42が設けられている(図 3)。この 第 2駆動部 42は、昇降軸 21Aの上端に磁性流体シール 27を介して連結されて 、る Further, the substrate support unit 10 is provided with a second drive unit 42 such as a rotary actuator for rotating the hook 21 around the elevating shaft 21A (FIG. 3). The second drive unit 42 is connected to the upper end of the elevating shaft 21A via a magnetic fluid seal 27, and
[0025] 基板支持ユニット 10は以上のように構成され、これらにより本発明に係る「基板支持 機構」が構成される。基板 5は、この基板支持機構によって真空チャンバ 2の内部に お!ヽて、その直下方位置でマスクホルダ 11に支持されるマスク 6に対して相対的に 昇降移動自在とされている。 [0025] The substrate supporting unit 10 is configured as described above, and these constitute the "substrate supporting mechanism" according to the present invention. The substrate 5 is placed inside the vacuum chamber 2 by this substrate support mechanism! In addition, it is vertically movable relative to the mask 6 supported by the mask holder 11 at a position directly below.
[0026] 次に、このマスクホルダ 11の構成について説明する。  Next, the configuration of the mask holder 11 will be described.
[0027] マスクホルダ 11は、磁性金属でなるマスク 6の周縁の例えば四隅下面を支持する 複数の支持爪 51と、これら支持爪 51を下端部で各々支持する複数本の支持ロッド 5 2と、これら支持ロッド 52が取り付けられる取付プレート 53と、この取付プレート 53を 支持する中空軸 54とを備えて 、る。  [0027] The mask holder 11 includes a plurality of support claws 51 for supporting, for example, four corner lower surfaces of the periphery of the mask 6 made of magnetic metal, a plurality of support rods 52 for supporting the support claws 51 at lower ends thereof, An attachment plate 53 to which the support rods 52 are attached, and a hollow shaft 54 that supports the attachment plate 53 are provided.
[0028] 中空軸 54は、取付プレート 53の昇降をガイドするガイドロッド 33を支持する中空状 の支軸 34の内部に挿通され、この支軸 34に対して相対的に昇降移動自在とされて いる。ガイドロッド 33は真空チャンバ 2の内部において一定位置に保持されており、 取付プレート 53とはガイドブッシュ 35を介して連結されている。  [0028] The hollow shaft 54 is inserted into a hollow support shaft 34 that supports a guide rod 33 that guides the elevation of the mounting plate 53, and is movable up and down relatively to the support shaft 34. I have. The guide rod 33 is held at a fixed position inside the vacuum chamber 2, and is connected to the mounting plate 53 via a guide bush 35.
[0029] これら中空軸 54を含むマスクホルダ 11は、後述するマグネット昇降機構 12の吊下 げプレート 60の上面に支持され、この吊下げプレート 60の上昇移動に伴って上昇し 、また、吊下げプレート 60の下降移動に伴って自重により下降するようになっている。 なお、マスクホルダ 11の最下降位置は、ガイドロッド 33の下端に設けられたストッパ 3 6によって規制される。  The mask holder 11 including the hollow shaft 54 is supported on the upper surface of a suspension plate 60 of a magnet lifting mechanism 12 described later, and rises with the lifting movement of the suspension plate 60. The plate 60 is lowered by its own weight as the plate 60 moves downward. The lowermost position of the mask holder 11 is regulated by a stopper 36 provided at the lower end of the guide rod 33.
[0030] ところで、支軸 34は、支持プレート 13上においてモータ 56により回動自在とされて いると共に、磁性流体シール 57を介して X— Y方向移動部 58に連結されている。これ らモータ 56及び X— Y方向移動部 58の各駆動により、ガイドロッド 33と共に、マスクホ ルダ 11及びこれに支持されるマスク 6は、 X, Y及び Θ方向に相対移動可能とされて いる。これにより、 CCD (Charge Coupled Device)カメラ 59 (図 1)による基板 5及びマ スク 6間の位置合わせ画像に基づき、基板支持ユニット 10に支持されている基板 5に 対して、マスク 6が高精度に位置合わせされる。 Incidentally, the support shaft 34 is rotatable by a motor 56 on the support plate 13, and is connected to an XY direction moving unit 58 via a magnetic fluid seal 57. By driving the motor 56 and the XY direction moving unit 58, the mask holder 11 and the mask 6 supported by the mask rod 11 together with the guide rod 33 are relatively movable in the X, Y and Θ directions. Yes. This allows the mask 6 to be highly accurate with respect to the substrate 5 supported by the substrate support unit 10 based on the alignment image between the substrate 5 and the mask 6 by a CCD (Charge Coupled Device) camera 59 (FIG. 1). Is aligned with
[0031] なお、これらモータ 56、 X— Y方向移動部 58、 CCDカメラ 59等により、本発明の「ァ ライメント機構」が構成されて 、る。  [0031] The motor 56, the XY direction moving section 58, the CCD camera 59, and the like constitute an "alignment mechanism" of the present invention.
[0032] 一方、マグネット昇降機構 12は、互いに精密ァライメントした基板 5及びマスク 6を 密着させるマグネット 7 (図 5参照)と、マグネット 7を下面に保持するマグネットホルダ 6 1と、このマグネットホルダ 61を吊り下げる吊下げプレート 60と、この吊下げプレート 6 0を昇降させるマグネット昇降軸 62と、マグネット昇降軸 62に連結されマグネットホル ダ 61を昇降させる第 3駆動部 43とを備えている。  On the other hand, the magnet elevating mechanism 12 includes a magnet 7 (see FIG. 5) for closely adhering the substrate 5 and the mask 6 precisely aligned with each other, a magnet holder 61 for holding the magnet 7 on the lower surface, and a magnet holder 61. The system includes a hanging plate 60 to be hung, a magnet elevating shaft 62 for elevating and lowering the hanging plate 60, and a third drive unit 43 connected to the magnet elevating shaft 62 to elevate the magnet holder 61.
[0033] マグネット昇降軸 62は、マスクホルダ 11の中空軸 54の軸心部に対して相対移動自 在に挿通され、その上端部には、油圧又は空圧往復シリンダ等でなる第 3駆動部 43 が連結されている。また、マグネット昇降軸 62の下端部には吊下げプレート 60が固 定されている。  [0033] The magnet elevating shaft 62 is inserted so as to be relatively movable with respect to the axis of the hollow shaft 54 of the mask holder 11, and has a third driving unit such as a hydraulic or pneumatic reciprocating cylinder at the upper end thereof. 43 are linked. A suspension plate 60 is fixed to the lower end of the magnet elevating shaft 62.
[0034] 吊下げプレート 60は、その上面でマスクホルダ 11を支持しており、マグネット昇降 軸 62の昇降移動に連動してマスクホルダ 11を昇降させる。吊下げプレート 60の下面 には、マグネットホルダ 61を懸吊する断面略 L字形状の吊下げフック 66が所定箇所 に複数取り付けられている。この吊下げフック 66は、後述するように、搬送トレィ 4の 待機位置力 搬送方向に向かって屈曲されて 、る。  The suspending plate 60 supports the mask holder 11 on its upper surface, and moves the mask holder 11 up and down in conjunction with the up and down movement of the magnet elevating shaft 62. On the lower surface of the suspension plate 60, a plurality of suspension hooks 66 having a substantially L-shaped cross section for suspending the magnet holder 61 are attached at predetermined positions. This hanging hook 66 is bent in the standby position force transfer direction of the transfer tray 4 as described later.
[0035] マグネットホルダ 61の下面には板状のマグネット 7が取り付けられ、その上面には、 吊下げプレート 60の吊下げフック 66に離脱自在に係止する係止部 67が、吊下げフ ック 66の形成位置に対応して複数取り付けられている。係止部 67は略環状に形成さ れ、後述するように、吊下げフック 66からの離脱方向は、成膜部 8に向けて搬送トレィ 4が移動する方向とされている。  A plate-shaped magnet 7 is attached to the lower surface of the magnet holder 61, and a locking portion 67 that detachably locks to the hanging hook 66 of the hanging plate 60 is provided on the upper surface thereof. A plurality are attached corresponding to the formation positions of the bosses 66. The locking portion 67 is formed in a substantially annular shape, and the direction of detachment from the hanging hook 66 is a direction in which the transport tray 4 moves toward the film forming portion 8 as described later.
[0036] また、マグネットホルダ 61には、基板 5に対してマグネット 7を着脱する際に、基板 5 の位置ズレを規制する基板押え 64が取り付けられている。この基板押え 64は、例え ばアルミニウム等の非磁性金属材料でなる薄板形状で、マグネットホルダ 61に対して 相対的に所定距離だけ昇降移動自在に複数の段付ピン 63を介して吊り下げられて いる。 [0036] The magnet holder 61 is provided with a substrate holder 64 for restricting the displacement of the substrate 5 when the magnet 7 is attached to or detached from the substrate 5. The board holder 64 is a thin plate made of a non-magnetic metal material such as aluminum, and is suspended via a plurality of stepped pins 63 so as to be vertically movable by a predetermined distance relative to the magnet holder 61. Yes.
[0037] ァライメントユニット 3は、以上のように構成される。次に、搬送トレィ 4について説明 する。図 5及び図 6は搬送トレィ 4の構成を示す図で、図 5はその搬送方向から見た 断面図、図 6はその平面図である。  [0037] The alignment unit 3 is configured as described above. Next, the transport tray 4 will be described. 5 and 6 are views showing the configuration of the transport tray 4, FIG. 5 is a cross-sectional view as viewed from the transport direction, and FIG. 6 is a plan view thereof.
[0038] 搬送トレィ 4は、中央部に基板 5の成膜面をトレイ外部の下方へ露出させる開口部 7 1が形成された矩形状のトレィ本体 70と、このトレィ本体の両側方に設けられた車輪 ブラケット 72A, 72Bと、これら車輪ブラケット 72A, 72Bに各々取り付けられた車輪 7 3A, 73Bとを備えている。  [0038] The transport tray 4 is provided on both sides of the rectangular tray main body 70 having an opening 71 for exposing the film-forming surface of the substrate 5 to the outside of the tray downward at the center, and on both sides of the tray main body. Wheel brackets 72A and 72B, and wheels 73A and 73B respectively attached to the wheel brackets 72A and 72B.
[0039] 搬送トレィ 4の開口部 71は略矩形状とされ、トレイ本体 70の上面側から下面側に向 けて逆すり鉢状にテーパが設けられている。開口部 71の周縁上面部は、マスク 6及 びこれに重ねられる基板 5やマグネット 7等の載置面となっている。また、開口部 71の 周縁下面部には防着板 78が取り付けられている。  The opening 71 of the transfer tray 4 has a substantially rectangular shape, and is tapered in an inverted mortar shape from the upper surface side to the lower surface side of the tray main body 70. The upper surface of the periphery of the opening 71 serves as a mounting surface for the mask 6 and the substrate 5 and the magnet 7 to be superimposed thereon. In addition, a deposition prevention plate 78 is attached to the lower surface of the peripheral edge of the opening 71.
[0040] そして、開口 71のトレイ搬送方向両側部には、マスク 6を支持するマスクホルダ 11 の支持爪 51との干渉を回避する逃げ溝 75, 75が、それぞれトレイ本体 70の後端に わたって形成されている。これにより、トレイ本体 70の載置面へマスク 6及びこれに重 ねられる基板 5やマグネット 7等を載置した後、搬送トレィ 4の搬送方向にトレイ本体 7 0が移動するに伴って、これら逃げ溝 75を介してトレイ本体 4の後端部力も支持爪 51 が抜け出るようになっている。  Escape grooves 75, 75 for avoiding interference with the support claws 51 of the mask holder 11 supporting the mask 6 are provided on both sides of the opening 71 in the tray conveyance direction, respectively, at the rear end of the tray body 70. It is formed. Thus, after the mask 6 and the substrate 5 and the magnet 7 laid thereon are mounted on the mounting surface of the tray main body 70, as the tray main body 70 moves in the transport direction of the transport tray 4, these The support claw 51 also comes out of the rear end force of the tray body 4 via the escape groove 75.
[0041] なお、基板 5を支持する基板支持ユニット 10のフック 21にあっては、基板 5に重ね られるマスク 6の側縁に形成された所定の逃げ部を介して、マスクホルダ 11の支持爪 51と共に搬送トレィ 4の搬送に伴ってトレイ本体 70の後端力も抜け出るようになって いる。  The hook 21 of the substrate support unit 10 that supports the substrate 5 is provided with a support claw of the mask holder 11 via a predetermined clearance formed on a side edge of the mask 6 that is superimposed on the substrate 5. Along with 51, the rear end force of the tray body 70 is also released with the transport of the transport tray 4.
[0042] 車輪 73A, 73Bは、搬送トレィ 4の搬送経路を構成する一対の搬送レール 74A, 7 4Bに支持されている。一方の車輪 73Aは、搬送レール 74Aの転接面に略 V字形状 の溝が形成され、これを支持する搬送レール 74Aもこれに対応する断面略三角形状 の突部が形成されている。他方の車輪 73Bは、搬送レール 74Bの転接面は平坦とな つており、これを支持する搬送レール 74Bもこれに対応する平坦形状を呈している。 これにより、一方の車輪 73A側を基準として搬送トレィ 4の位置決めがなされるように なっている。 [0042] The wheels 73A and 73B are supported by a pair of transport rails 74A and 74B constituting a transport path of the transport tray 4. On one wheel 73A, a substantially V-shaped groove is formed on the rolling contact surface of the transfer rail 74A, and the transfer rail 74A that supports the groove is also formed with a corresponding protrusion having a substantially triangular cross section. The other wheel 73B has a flat rolling contact surface with the transfer rail 74B, and the transfer rail 74B supporting the transfer rail 74B also has a corresponding flat shape. This allows the transport tray 4 to be positioned with reference to one wheel 73A. It has become.
[0043] 搬送トレィ 4の位置決めに関しては、更に、図 2に示すように、搬送トレィ 4の各車輪 ブラケット 72A, 72Bに転接するガイドローラ 76A, 76Bがそれぞれ設けられている。 ガイドローラ 76A, 76Bは、真空チャンバ 2の両側壁に取り付けられた駆動部 77A, 7 7Bにより図 2において実線で示す待避位置と、一点鎖線で示すガイド位置とに進退 可能とされている。  As for the positioning of the transport tray 4, as shown in FIG. 2, guide rollers 76A and 76B that are in rolling contact with the respective wheel brackets 72A and 72B of the transport tray 4 are provided. The guide rollers 76A, 76B can be advanced and retracted to a retreat position shown by a solid line in FIG. 2 and a guide position shown by a dashed line in FIG. 2 by drive units 77A, 77B attached to both side walls of the vacuum chamber 2.
[0044] 搬送トレィ 4の搬送方式には、ラック 'アンド'ピニオン機構が採用されている。すな わち、一方の車輪ブラケット 72Aの下端に取り付けられたラック 79が、搬送レール 74 Aと平行して配設されたピ-オンギヤ(図示略)に嚙み合う構成とされており、搬送トレ ィ 4の精密な送り動作が可能となって 、る。  The transport system of the transport tray 4 employs a rack “and” pinion mechanism. That is, a rack 79 attached to the lower end of one wheel bracket 72A is configured to engage with a pinion gear (not shown) arranged in parallel with the transport rail 74A. The precise feed operation of Tray 4 becomes possible.
[0045] 以上、車輪 73A, 73B、搬送レール 74A, 74B、ガイドローラ 76A, 76B等により、 本発明の「ガイド機構」が構成される。  As described above, the wheels 73A and 73B, the transport rails 74A and 74B, the guide rollers 76A and 76B, and the like constitute the “guide mechanism” of the present invention.
[0046] また、各車輪 73A, 73Bは、略コの字形状の車輪ブラケット 72A, 72Bの外側壁に 対して、それぞれ内向きに取り付けられている。そして、車輪 73A, 73B及び搬送レ ール 74A, 74Bへの成膜材料の付着を防止するために、車輪 73A, 73B及び搬送 レール 74A, 74Bを内側から覆うように、搬送トレィ 4の搬送経路に沿って遮蔽板 75 A, 75Bがそれぞれ設けられている。  [0046] Each of the wheels 73A, 73B is attached inwardly to the outer wall of the substantially U-shaped wheel bracket 72A, 72B. Then, in order to prevent the film-forming material from adhering to the wheels 73A, 73B and the transport rails 74A, 74B, the transport path of the transport tray 4 is so covered as to cover the wheels 73A, 73B and the transport rails 74A, 74B from the inside. The shield plates 75A and 75B are respectively provided along.
[0047] 次に、成膜部 8について図 1を参照して説明する。  Next, the film forming unit 8 will be described with reference to FIG.
[0048] 成膜部 8は、真空チャンバ 2の直線的な筒状管 80内に構成されており、搬送トレィ 4 の搬送経路に沿って複数の成膜手段が隣接配置されている。本実施の形態では、 6 式のスパッタターゲットユニット 81 A— 81Fを設けて成膜材料をスパッタリング法で基 板成膜する例を示すが、真空蒸着法で基板成膜する場合には、スパッタターゲットュ ニットに代わって蒸発源が設けられる等、成膜法に対応した成膜源が設置されること になる。  The film forming section 8 is configured in a linear tubular tube 80 of the vacuum chamber 2, and a plurality of film forming means are arranged adjacent to each other along the transport path of the transport tray 4. In this embodiment mode, an example is shown in which six sputtering target units 81A to 81F are provided to deposit a film-forming material on a substrate by a sputtering method. For example, an evaporation source is provided instead of a unit, and a film formation source corresponding to the film formation method will be installed.
[0049] スパッタターゲットユニット 81A— 81Fは、搬送レーノレ 74A, 74Bの下方位置に配 置された成膜源取付台 82上に設けられており、用途に合わせて成膜源が容易に変 更できるようになつている。各スパッタターゲットユニット 81 A— 81Fは、共に同一の 材料のターゲットで構成されて 、てもよ 、し、異種の材料のターゲットで構成されて 、 てもよい。 [0049] The sputter target units 81A-81F are provided on a film forming source mounting base 82 disposed below the transfer renoles 74A and 74B, and the film forming source can be easily changed according to the application. It is like that. Each sputter target unit 81A-81F is composed of targets of the same material, and may be composed of targets of different materials. May be.
[0050] なお、筒状管 80の後端には、搬送トレィ 4を系外へ取り出すためのメンテナンス用 の取出口 83力 S設けられて 、る。  [0050] At the rear end of the cylindrical tube 80, a maintenance outlet 83 for removing the transport tray 4 out of the system is provided.
[0051] 本実施の形態の成膜装置 1は以上のように構成されている。この成膜装置 1のァラ ィメントユニット 3は、全体的に、真空チャンバ 2の天板部 2aの上に載置された支持プ レート 13上に構成されており、真空チャンバ 2の内外の圧力差等に起因する天板部 2aの変形でァライメント動作が影響を受けな 、ようにして 、る。  [0051] The film forming apparatus 1 of the present embodiment is configured as described above. The alignment unit 3 of the film forming apparatus 1 is formed on a support plate 13 placed on a top plate 2a of the vacuum chamber 2 as a whole. The alignment operation is not affected by the deformation of the top plate 2a due to the pressure difference or the like.
[0052] そして、成膜装置 1は、真空チャンバ 2の内部において、ァライメントユニット 3により 基板 5とマスク 6とを位置合わせするァライメント工程と、ァライメントユニット 3から基板 5及びマスク 6を搬送トレィ 4へ移載する移載工程と、搬送トレィ 4を搬送経路に沿って 搬送しながら成膜部 8により基板 5の成膜面に成膜する成膜工程を行う。以下、成膜 装置 1の動作について説明する。  Then, the film forming apparatus 1 performs an alignment step in which the substrate 5 and the mask 6 are aligned by the alignment unit 3 inside the vacuum chamber 2, and transports the substrate 5 and the mask 6 from the alignment unit 3. And a film forming step of forming a film on the film forming surface of the substrate 5 by the film forming unit 8 while transferring the transfer tray 4 along the transfer path. Hereinafter, the operation of the film forming apparatus 1 will be described.
[0053] まず、図 2を参照して、図示しないロボットにより、成膜面を下向きにして真空チャン ノ 2内に搬入された基板 5は、各基板支持ユニット 10のフック 21により周縁部下面が 支持される。基板支持ユニット 10に支持された基板 5の成膜面(下面)側はマスクホ ルダ 11に支持されたマスク 6と対向し、反対側の非成膜面(上面)側はマグネットホル ダ 61から吊り下げられた基板押え 64に対向している。  First, referring to FIG. 2, the substrate 5 carried into the vacuum chamber 2 with the film-forming surface facing downward by a robot (not shown) has its peripheral lower surface fixed by the hooks 21 of each substrate support unit 10. Supported. The deposition surface (lower surface) of the substrate 5 supported by the substrate support unit 10 faces the mask 6 supported by the mask holder 11, and the opposite non-deposition surface (upper surface) is suspended from the magnet holder 61. It faces the lowered substrate holder 64.
[0054] 次に、図 2に示した状態で、ァライメントユニット 3により基板 5とマスク 6の位置合わ せが行われる。基板 5とマスク 6の位置合わせは、基板支持ユニット 10によって静止 されている基板 5に対し、マスク 6を支持するマスクホルダ 11を、モータ 56及び X— Y 方向移動部 58による Θ、 X及び Y方向に相対移動させることによって基板 5とマスク 6 のァライメントが行われる。  Next, in the state shown in FIG. 2, the alignment of the substrate 5 and the mask 6 is performed by the alignment unit 3. The alignment between the substrate 5 and the mask 6 is performed by using the mask holder 11 supporting the mask 6 with respect to the substrate 5 stationary by the substrate support unit 10 by using the motor 56 and the X-Y direction moving unit 58 for Θ, X, and Y. The substrate 5 and the mask 6 are aligned by relative movement in the directions.
[0055] 具体的には、 CCDカメラ 59によって基板 5のァライメントマークとマスク 6のァライメ ントマークの各画像を取得し、これらのァライメントマークに基づ 、てモータ 56及び X Y方向移動部 58を駆動し、マスクホルダ 11を Θ、 X及び Yの各方向に移動させる。  Specifically, each image of the alignment mark of the substrate 5 and the alignment mark of the mask 6 is acquired by the CCD camera 59, and based on these alignment marks, the motor 56 and the XY direction moving unit 58 are operated. Drive and move the mask holder 11 in each of the Θ, X and Y directions.
[0056] 以上のようにして基板 5とマスク 6のァライメントが行われた後、基板昇降機構部 31 の駆動により各基板支持ユニット 10を各々同時に下降させると共に、第 3駆動部 43 の駆動により吊下げプレート 60により支持されているマスクホルダ 11を下降させ、下 方で待機して 、る搬送トレィ 4の載置面へマスク 6及び基板 5の順で移載する。このと き、マスクホルダ 11は、ガイドロッド 33によるガイド作用を得て下降し、所定のァラィメ ント精度が確保される。 After the alignment of the substrate 5 and the mask 6 is performed as described above, each of the substrate support units 10 is simultaneously lowered by driving the substrate lifting / lowering mechanism unit 31, and suspended by driving the third driving unit 43. Lower the mask holder 11 supported by the lowering plate 60, and Then, the mask 6 and the substrate 5 are transferred onto the mounting surface of the transfer tray 4 in this order. At this time, the mask holder 11 descends with the guide action of the guide rod 33, and a predetermined alignment accuracy is secured.
[0057] なお、基板 5をマスク 6と共に搬送トレィ 4に向けて下降させる上述の動作例に限ら ず、基板 5を一度マスク 6の上に重ね、基板支持ユニット 10による基板 5の支持作用 を解除した後、マスクホルダ 6に支持されるマスク 6及び基板 5を一体的に搬送トレィ 4 へ移載するようにしてもよい。この場合、各基板支持ユニット 10は、基板 5をマスク 6の 上に重ねた後、第 2駆動部 42の駆動により各々のフック 21を基板 5の外方へ旋回さ せるようにすれば、基板 5の搬送トレィ 4への移載動作を阻害することがなくなる。  The operation is not limited to the above-described operation example in which the substrate 5 is moved down toward the transport tray 4 together with the mask 6, but the substrate 5 is once superimposed on the mask 6, and the substrate supporting unit 10 releases the substrate 5 supporting action. After that, the mask 6 and the substrate 5 supported by the mask holder 6 may be integrally transferred to the transport tray 4. In this case, if each substrate support unit 10 superimposes the substrate 5 on the mask 6 and turns each hook 21 to the outside of the substrate 5 by driving the second driving unit 42, the substrate The transfer operation of 5 to the transfer tray 4 is not obstructed.
[0058] 次に、第 3駆動部 43を更に駆動し、図 7に示すように吊下げプレート 60をマスクホ ルダ 11に対して相対的に下方移動させ、吊下げプレート 60に懸吊されているマグネ ットホルダ 61を基板 5の非成膜面(上面)に重ねる。  Next, the third drive section 43 is further driven to move the suspension plate 60 downward relative to the mask holder 11 as shown in FIG. The magnet holder 61 is placed on the non-deposition surface (upper surface) of the substrate 5.
[0059] このとき、マグネットホルダ 61に吊り下げられた基板押え 64は、マグネットホルダ 61 の下面に取り付けられているマグネット 7よりも先に基板 5の上面に到達し、この基板 押え 64の自重により基板 5をマスク 6側へ押圧する作用を行う。そして、マグネット 7の 磁力によるマスク 6のマグネット 7側への変形を抑止しながら、マグネット 7を基板 5に 当接した基板押え 64上に重ねる。これにより、基板 5とマスク 6との間の精密ァラィメ ント及び密着を図ることができる(図 5)。  At this time, the substrate holder 64 suspended by the magnet holder 61 reaches the upper surface of the substrate 5 before the magnet 7 attached to the lower surface of the magnet holder 61, and the weight of the substrate holder 64 The action of pressing the substrate 5 toward the mask 6 is performed. Then, the magnet 7 is overlapped on the substrate holder 64 in contact with the substrate 5 while suppressing the deformation of the mask 6 toward the magnet 7 due to the magnetic force of the magnet 7. Thus, precise alignment and close contact between the substrate 5 and the mask 6 can be achieved (FIG. 5).
[0060] 以上のようにして、基板 5及びマスク 6の搬送トレィ 4への移載工程が完了する。続 いて、この搬送トレィ 4を搬送経路に沿って搬送しながら基板 5の成膜面に成膜を行 う工程が行われる。  As described above, the step of transferring the substrate 5 and the mask 6 to the transport tray 4 is completed. Subsequently, a step of forming a film on the film formation surface of the substrate 5 while transferring the transfer tray 4 along the transfer path is performed.
[0061] 搬送トレィ 4は、図 1及び図 2に示すように、ァライメントユニット 3の直下方である移 載位置に待機している。この搬送トレィ 4の載置面に、マグネット 7により一体ィ匕されて いる基板 5及びマスク 6が載置された後、駆動部 77A, 77Bにより伸長されたガイド口 ーラ 76A, 76Bにより搬送方向へ適正にガイドされながら、搬送レール 74A, 74Bに 沿って成膜部 8へ搬送される。  The transport tray 4 is waiting at a transfer position immediately below the alignment unit 3, as shown in FIGS. After the substrate 5 and the mask 6 integrated by the magnet 7 are mounted on the mounting surface of the transfer tray 4, the transfer direction is performed by the guide rollers 76A and 76B extended by the driving units 77A and 77B. The wafer is transported to the film forming unit 8 along the transport rails 74A and 74B while being properly guided to the film forming unit 8.
[0062] このとき、吊下げプレート 60の吊下げフック 66に係止されているマグネットホルダ 6 1の係止部 67は、図 8に示すように矢印 Aで示す方向に搬送トレィ 4が移動する際に 吊下げフック 66との係止作用が解除される。これにより、吊下げプレート 60とマグネッ トホルダ 61とは互いに分離され、マグネットホルダ 61はマグネット 7と共に搬送トレィ 4 上に支持される。 At this time, the transfer tray 4 moves in the direction indicated by the arrow A in the locking portion 67 of the magnet holder 61 locked by the hanging hook 66 of the hanging plate 60 as shown in FIG. Occasionally The locking action with the suspension hook 66 is released. Thus, the suspension plate 60 and the magnet holder 61 are separated from each other, and the magnet holder 61 is supported on the transport tray 4 together with the magnet 7.
[0063] 基板 5への成膜は、スパッタターゲットユニット 81A— 81Fの直上位置において、搬 送トレイ 4の開口部 71を介して行われ、マスク 6の開口パターンに対応した形状の成 膜パターンが基板 5の成膜面に形成される。この成膜部 8における成膜工程は、搬送 トレイ 4を各スパッタターゲットユニット 81A— 81Fの直上位置に間欠的に送るようにし てもよいし、各スパッタターゲットユニット 81 A— 81Fの直上位置を一定速度で連続 的に送るようにしてもよい。  The film is formed on the substrate 5 through the opening 71 of the carrying tray 4 at a position directly above the sputter target units 81A-81F, and a film pattern having a shape corresponding to the opening pattern of the mask 6 is formed. It is formed on the deposition surface of the substrate 5. In the film forming process in the film forming section 8, the transport tray 4 may be intermittently sent to a position immediately above each of the sputter target units 81A-81F, or the position directly above each of the sputter target units 81A-81F may be fixed. It may be sent continuously at a speed.
[0064] また、各スパッタターゲットユニット 81A— 81Fに同一材料のスパッタターゲットを適 用すれば、厚膜の成膜パターンを得ることができ、異種材料のスパッタターゲットを適 用すれば、多層膜構造の成膜パターンを得ることができる。  When a sputter target of the same material is applied to each of the sputter target units 81A-81F, a thick film deposition pattern can be obtained. When a sputter target of a different material is applied, a multilayer film structure can be obtained. Can be obtained.
[0065] 以上のように、本実施の形態によれば、基板 5とマスク 6とを高精度に位置合わせす るァライメントユニット 3と、基板 5に所定材料の成膜パターンを形成する成膜部 8とが 同一の真空チャンバ 2内に装備されているので、ァライメント工程後、迅速に成膜ェ 程に移行することができ、これにより生産性の向上を図ることが可能となる。  As described above, according to the present embodiment, alignment unit 3 for positioning substrate 5 and mask 6 with high precision, and film formation for forming a film formation pattern of a predetermined material on substrate 5 Since the unit 8 and the unit 8 are provided in the same vacuum chamber 2, it is possible to promptly shift to the film formation step after the alignment step, thereby improving productivity.
[0066] また、ァライメントユニット 3から成膜部 8への基板 5の搬送は搬送トレィ 4で行うように しているので、異なる真空チャンバ間における従来の基板搬送システムに比べて、搬 送系の構成を簡素化でき、これにより装置製造コストの低減およびメンテナンス性の 向上を図ることができる。  Further, since the transfer of the substrate 5 from the alignment unit 3 to the film forming unit 8 is performed by the transfer tray 4, the transfer system is different from the conventional substrate transfer system between different vacuum chambers. Can be simplified, thereby reducing the device manufacturing cost and improving the maintainability.
[0067] 続いて、成膜部 8における基板 5の成膜が行われた後、搬送トレィ 4を、搬送レール  Subsequently, after the film formation of the substrate 5 in the film forming unit 8 is performed, the transfer tray 4 is moved to the transfer rail.
74A, 74Bに沿って当初の移載位置へ戻し、搬送トレィ 4力 ァライメントユニット 3へ 成膜済の基板 5をマスク 6及びマグネット 7と共に移載する工程が行われる。  The process returns to the original transfer position along 74A and 74B, and the process of transferring the film-formed substrate 5 together with the mask 6 and the magnet 7 to the transport tray 4 force alignment unit 3 is performed.
[0068] 移載位置には、マスクホルダ 11の支持爪 51及び基板支持ユニット 10のフック 21が 待機しており、搬送トレィ 4の移載位置への復帰により基板 5及びマスク 6の周縁下面 に支持爪 51及びフック 21が対向する。また、マグネットホルダ 61の係止部 67と、吊 下げプレート 60の吊下げフック 66とが係止する。そして、マグネット昇降軸 62を上昇 させて、吊下げプレート 60を介してマグネットホルダ 61を吊り上げる(図 7)。 [0069] このとき、基板押え 64により基板 5の上面が押圧されているので、マグネット 7の磁 力によるマスク 6の橈み変形が抑止され、基板 5とマスク 6との間の位置ズレが防止さ れる。これにより、基板 5とマスク 6の位置ズレによる基板 5の成膜面に形成されたパタ ーンの損傷を回避でき、基板 5の成膜面を保護することができる。 At the transfer position, the support claws 51 of the mask holder 11 and the hooks 21 of the substrate support unit 10 are on standby, and when the transport tray 4 returns to the transfer position, the transfer tray 4 returns to the lower surface of the periphery of the substrate 5 and the mask 6. The support claw 51 and the hook 21 face each other. Further, the locking portion 67 of the magnet holder 61 and the hanging hook 66 of the hanging plate 60 are locked. Then, the magnet elevating shaft 62 is raised to lift the magnet holder 61 via the suspension plate 60 (FIG. 7). At this time, since the upper surface of the substrate 5 is pressed by the substrate presser 64, radial deformation of the mask 6 due to the magnetic force of the magnet 7 is suppressed, and positional displacement between the substrate 5 and the mask 6 is prevented. Is done. Thus, it is possible to avoid the damage of the pattern formed on the film-forming surface of the substrate 5 due to the misalignment between the substrate 5 and the mask 6, and to protect the film-forming surface of the substrate 5.
[0070] 次に、基板支持ユニット 10の上昇により基板 5を引き上げると共に、マスクホルダ 11 を吊下げプレート 60と一体的に引き上げることにより、搬送トレィ 4カもァライメントュ ニット 3への基板 5及びマスク 6の移載が完了する。その後、図示しないロボットが基 板 5の下方に進入し、真空チャンバ 2の外部へ搬出されると共に、次に処理するべき 新しい基板 5が基板支持ユニット 10のフック 21上へ載置される。  Next, the substrate 5 is lifted by raising the substrate support unit 10, and the mask holder 11 is lifted integrally with the suspension plate 60, so that the transport tray 4 also moves the substrate 5 and the mask 6 to the alignment unit 3. Is completed. Thereafter, a robot (not shown) enters below the substrate 5 and is carried out of the vacuum chamber 2, and a new substrate 5 to be processed next is placed on the hook 21 of the substrate support unit 10.
[0071] 以上、本発明の実施の形態について説明した力 勿論、本発明はこれに限定され ることなく、本発明の技術的思想に基づいて種々の変形が可能である。  [0071] As described above, the present invention is not limited to the power described in the embodiment of the present invention, and various modifications are possible based on the technical idea of the present invention.
[0072] 例えば以上の実施の形態では、搬送トレィ 4上に基板 5及びマスク 6を載置した後、 マグネット 7による基板 5とマスク 6との密着を行うようにした力 これに代えて、基板 5と マスク 6とのァライメント完了後、基板 5をマスク 6の上に重ね合わせ、搬送トレィ 4への 移載前にマグネット 7による密着を行うように、マグネット昇降機構 12の構成を変更す るようにしてもよい。この場合、基板 5及びマスク 6はマグネット 7により一体ィ匕された状 態で、搬送トレィ 4へ移載されることになる。  For example, in the above-described embodiment, after the substrate 5 and the mask 6 are placed on the transport tray 4, the force for bringing the substrate 5 and the mask 6 into close contact by the magnet 7 is used instead. After the alignment of the mask 5 and the mask 6 is completed, the configuration of the magnet lifting mechanism 12 is changed so that the substrate 5 is superimposed on the mask 6 and adhered by the magnet 7 before transfer to the transport tray 4. It may be. In this case, the substrate 5 and the mask 6 are transferred to the transport tray 4 in a state where they are integrated by the magnet 7.

Claims

請求の範囲 The scope of the claims
[1] 同一の真空チャンバ内に、基板とマスクとを位置合わせするァライメントユニットと、 このァライメントユニットから前記基板と前記マスクとを受け取る搬送用トレイと、この搬 送用トレイの搬送経路に沿って配置される成膜手段とを備えたことを特徴とする成膜 装置。  [1] An alignment unit for aligning a substrate and a mask in the same vacuum chamber, a transport tray for receiving the substrate and the mask from the alignment unit, and a transport path for the transport tray. A film forming apparatus comprising:
[2] 前記ァライメントユニットは、マスクホルダに支持されている磁性材料製の前記マス クに対して前記基板を昇降自在に支持する基板支持機構と、前記マスクと前記基板 とを位置合わせするァライメント機構と、前記マスクと前記基板とを密着させるマグネ ットを前記基板に対して昇降させるマグネット昇降機構とを有し、前記マグネットには 、前記マグネット昇降機構に対して離脱可能な係止部が設けられて ヽる請求の範囲 第 1項に記載の成膜装置。  [2] The alignment unit includes a substrate support mechanism that supports the substrate so as to be able to move up and down with respect to the mask made of a magnetic material supported by a mask holder, and an alignment that aligns the mask with the substrate. A mechanism for raising and lowering a magnet for bringing the mask and the substrate into close contact with each other with respect to the substrate, wherein the magnet has a locking portion detachable from the magnet lifting mechanism. The film forming apparatus according to claim 1, wherein the film forming apparatus is provided.
[3] 前記マグネット昇降機構は、昇降軸の下端に固定され前記マグネットを保持するマ グネットホルダと、このマグネットホルダに対して相対移動自在に吊り下げられ前記基 板の上面に対向配置される基板押えとを有している請求の範囲第 2項に記載の成膜 装置。  [3] The magnet lifting mechanism includes a magnet holder fixed to a lower end of a lifting shaft and holding the magnet, and a substrate suspended so as to be relatively movable with respect to the magnet holder and arranged to face the upper surface of the substrate. 3. The film forming apparatus according to claim 2, comprising a presser.
[4] 前記搬送用トレイは、前記基板の成膜面をトレイ外部へ露出させる開口部が形成さ れたトレイ本体と、このトレィ本体を前記搬送経路に案内するガイド機構とを備えてい る請求の範囲第 1項に記載の成膜装置。  [4] The transfer tray includes a tray main body having an opening for exposing the film-forming surface of the substrate to the outside of the tray, and a guide mechanism for guiding the tray main body to the transfer path. 2. The film forming apparatus according to item 1, wherein
[5] 前記成膜手段は、前記搬送経路に沿って配置される複数の蒸発源又はスパッタタ 一ゲットである請求の範囲第 1項に記載の成膜装置。  5. The film forming apparatus according to claim 1, wherein the film forming means is a plurality of evaporation sources or a sputter target arranged along the transport path.
[6] 前記ァライメントユニットは、前記真空チャンバの天板上に配置された支持プレート 上に支持されている請求の範囲第 1項に記載の成膜装置。  6. The film forming apparatus according to claim 1, wherein the alignment unit is supported on a support plate arranged on a top plate of the vacuum chamber.
[7] 同一の真空チャンバにおいて、ァライメントユニットにより基板とマスクとを位置合わ せするァライメント工程と、前記ァライメントユニットから前記基板及び前記マスクを搬 送用トレイへ移載する移載工程と、前記搬送用トレイを搬送経路に沿って搬送しなが ら前記基板の成膜面に成膜する成膜工程とを有することを特徴とする成膜方法。  [7] In the same vacuum chamber, an alignment step of aligning the substrate and the mask by an alignment unit, a transfer step of transferring the substrate and the mask from the alignment unit to a transport tray, A film forming step of forming a film on a film forming surface of the substrate while transferring the transfer tray along a transfer path.
[8] 前記基板の成膜後、前記基板及び前記マスクを前記搬送用トレイから前記ァラィメ ントユニットへ移載する工程を更に有する請求の範囲第 7項に記載の成膜方法。 8. The film forming method according to claim 7, further comprising a step of transferring the substrate and the mask from the transfer tray to the alignment unit after forming the film on the substrate.
[9] 前記ァライメント工程では、磁性材料でなる前記マスクに対し前記基板を介してマ グネットを取り付けることにより前記基板と前記マスクとが密着され、前記移載工程で は、前記マグネットを保持し前記基板と前記マスクとを位置合わせするァライメントュ ニットから前記マグネットを分離する工程が含まれる請求の範囲第 7項に記載の成膜 方法。 [9] In the alignment step, by attaching a magnet to the mask made of a magnetic material via the substrate, the substrate and the mask are brought into close contact with each other, and in the transfer step, the magnet is held and held. The film forming method according to claim 7, further comprising a step of separating the magnet from an alignment unit for aligning a substrate and the mask.
[10] 前記成膜工程では、前記基板は、前記搬送経路に沿って配置された複数の蒸発 源又はスパッタターゲット上を搬送される請求の範囲第 7項に記載の成膜方法。  10. The film forming method according to claim 7, wherein in the film forming step, the substrate is transferred on a plurality of evaporation sources or sputter targets arranged along the transfer path.
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