WO2003093902A3 - Beleuchtungssystem, insbesondere für die euv-lithographie - Google Patents
Beleuchtungssystem, insbesondere für die euv-lithographie Download PDFInfo
- Publication number
- WO2003093902A3 WO2003093902A3 PCT/EP2003/003616 EP0303616W WO03093902A3 WO 2003093902 A3 WO2003093902 A3 WO 2003093902A3 EP 0303616 W EP0303616 W EP 0303616W WO 03093902 A3 WO03093902 A3 WO 03093902A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical element
- screen elements
- screen
- elements
- euv
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003227574A AU2003227574A1 (en) | 2002-04-30 | 2003-04-08 | Lighting system, particularly for use in extreme ultraviolet (euv) lithography |
JP2004502061A JP2005524236A (ja) | 2002-04-30 | 2003-04-08 | 特には極端紫外線(euv)リソグラフィに用いる、照明システム |
EP03724973A EP1499925A2 (de) | 2002-04-30 | 2003-04-08 | Beleuchtungssystem, insbesondere f r die euv-lithographie |
US10/512,100 US7196841B2 (en) | 2002-04-30 | 2003-04-08 | Lighting system, particularly for use in extreme ultraviolet (EUV) lithography |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10219514.5 | 2002-04-30 | ||
DE10219514A DE10219514A1 (de) | 2002-04-30 | 2002-04-30 | Beleuchtungssystem, insbesondere für die EUV-Lithographie |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003093902A2 WO2003093902A2 (de) | 2003-11-13 |
WO2003093902A3 true WO2003093902A3 (de) | 2004-03-11 |
Family
ID=29224960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2003/003616 WO2003093902A2 (de) | 2002-04-30 | 2003-04-08 | Beleuchtungssystem, insbesondere für die euv-lithographie |
Country Status (7)
Country | Link |
---|---|
US (1) | US7196841B2 (de) |
EP (1) | EP1499925A2 (de) |
JP (1) | JP2005524236A (de) |
CN (1) | CN1650234A (de) |
AU (1) | AU2003227574A1 (de) |
DE (1) | DE10219514A1 (de) |
WO (1) | WO2003093902A2 (de) |
Families Citing this family (56)
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JP4817702B2 (ja) * | 2005-04-14 | 2011-11-16 | キヤノン株式会社 | 光学装置及びそれを備えた露光装置 |
WO2007045434A2 (de) * | 2005-10-18 | 2007-04-26 | Carl Zeiss Smt Ag | Kollektor für beleuchtungssysteme mit einer wellenlänge ≤ 193 nm |
DE102006020734A1 (de) * | 2006-05-04 | 2007-11-15 | Carl Zeiss Smt Ag | Beleuchtungssystem für die EUV-Lithographie sowie erstes und zweites optisches Element zum Einsatz in einem derartigen Beleuchtungssystem |
WO2007138805A1 (ja) * | 2006-05-25 | 2007-12-06 | Nikon Corporation | 照明光学装置、露光装置、およびデバイス製造方法 |
US9250536B2 (en) | 2007-03-30 | 2016-02-02 | Asml Netherlands B.V. | Lithographic apparatus and method |
US8937706B2 (en) | 2007-03-30 | 2015-01-20 | Asml Netherlands B.V. | Lithographic apparatus and method |
DE102007047446A1 (de) * | 2007-10-04 | 2009-04-09 | Carl Zeiss Smt Ag | Optisches Element mit wenigstens einem elektrisch leitenden Bereich und Beleuchtungssystem mit einem solchen Element |
DE102008013229B4 (de) * | 2007-12-11 | 2015-04-09 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Mikrolithographie |
EP2243047B1 (de) * | 2008-02-15 | 2021-03-31 | Carl Zeiss SMT GmbH | Facettenspiegel zur verwendung in einer projektionsbelichtungsvorrichtung für die mikrolithografie |
JP5074226B2 (ja) * | 2008-02-16 | 2012-11-14 | エスアイアイ・ナノテクノロジー株式会社 | 荷電粒子ビーム装置 |
DE102008000788A1 (de) * | 2008-03-20 | 2009-09-24 | Carl Zeiss Smt Ag | Beleuchtungssystem für eine Mikrolithographie-Projektionsbelichtungsanlage |
DE102008000967B4 (de) * | 2008-04-03 | 2015-04-09 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsanlage für die EUV-Mikrolithographie |
DE102008049586A1 (de) * | 2008-09-30 | 2010-04-08 | Carl Zeiss Smt Ag | Feldfacettenspiegel zum Einsatz in einer Beleuchtungsoptik einer Projektionsbelichtungsanlage für die EUV-Mikrolithographie |
DE102009045135A1 (de) * | 2009-09-30 | 2011-03-31 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Mikrolithographie |
DE102009045694B4 (de) * | 2009-10-14 | 2012-03-29 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Mikrolithographie sowie Beleuchtungssystem und Projektionsbelichtungsanlage mit einer derartigen Beleuchtungsoptik |
DE102009054540B4 (de) * | 2009-12-11 | 2011-11-10 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Mikrolithographie |
DE102009054888A1 (de) | 2009-12-17 | 2011-06-22 | Carl Zeiss SMT GmbH, 73447 | Optisches Element mit einer Mehrzahl von refletiven Facettenelementen |
US9052605B2 (en) | 2009-12-23 | 2015-06-09 | Asml Netherlands B.V. | Illumination system for lithographic apparatus with control system to effect an adjustment of an imaging parameter |
DE102011004615A1 (de) | 2010-03-17 | 2011-09-22 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Projektionslithografie |
JP5469778B2 (ja) * | 2010-04-22 | 2014-04-16 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 結像光学系及びそのような結像光学系を有するマイクロリソグラフィのための投影露光装置 |
DE102010029765A1 (de) | 2010-06-08 | 2011-12-08 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithografie |
JP5644416B2 (ja) * | 2010-11-24 | 2014-12-24 | 株式会社ニコン | 光学ユニット、光学系、露光装置、及びデバイスの製造方法 |
DE102011076145B4 (de) | 2011-05-19 | 2013-04-11 | Carl Zeiss Smt Gmbh | Verfahren zum Zuordnen einer Pupillenfacette eines Pupillenfacettenspiegels einer Beleuchtungsoptik einer Projektionsbelichtungsanlage zu einer Feldfacette eines Feldfacettenspiegels der Beleuchtungsoptik |
DE102011076460A1 (de) * | 2011-05-25 | 2012-11-29 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik |
DE102011076549A1 (de) * | 2011-05-26 | 2012-11-29 | Carl Zeiss Smt Gmbh | Optische Anordnung in einer mikrolithographischen Projektionsbelichtungsanlage |
DE102011076658A1 (de) * | 2011-05-30 | 2012-05-10 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithographie |
DE102011086328A1 (de) | 2011-11-15 | 2013-05-16 | Carl Zeiss Smt Gmbh | Spiegel zum Einsatz zur Führung von Beleuchtungs- und Abbildungslicht in der EUV-Projektionslithografie |
DE102012213368A1 (de) | 2012-07-30 | 2013-12-05 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithographie |
DE102012220597A1 (de) * | 2012-11-13 | 2014-05-28 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithographie |
DE102012220596A1 (de) | 2012-11-13 | 2014-05-15 | Carl Zeiss Smt Gmbh | Verfahren zum Zuordnen einer Pupillenfacette eines Pupillenfacettenspiegels einer Beleuchtungsoptik einer Projektionsbelichtungsanlage zu einer Feldfacette eines Feldfacettenspiegels der Beleuchtungsoptik |
EP2754524B1 (de) | 2013-01-15 | 2015-11-25 | Corning Laser Technologies GmbH | Verfahren und Vorrichtung zum laserbasierten Bearbeiten von flächigen Substraten, d.h. Wafer oder Glaselement, unter Verwendung einer Laserstrahlbrennlinie |
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EP2781296B1 (de) | 2013-03-21 | 2020-10-21 | Corning Laser Technologies GmbH | Vorrichtung und verfahren zum ausschneiden von konturen aus flächigen substraten mittels laser |
DE102013206981A1 (de) | 2013-04-18 | 2013-12-24 | Carl Zeiss Smt Gmbh | Facettenspiegel mit im Krümmungsradius einstellbaren Spiegel-Facetten und Verfahren hierzu |
DE102013212363A1 (de) * | 2013-06-27 | 2014-07-31 | Carl Zeiss Smt Gmbh | Facettenspiegel, insbesondere für die EUV-Projektionslithografie |
US9517963B2 (en) | 2013-12-17 | 2016-12-13 | Corning Incorporated | Method for rapid laser drilling of holes in glass and products made therefrom |
US11556039B2 (en) | 2013-12-17 | 2023-01-17 | Corning Incorporated | Electrochromic coated glass articles and methods for laser processing the same |
US9815144B2 (en) | 2014-07-08 | 2017-11-14 | Corning Incorporated | Methods and apparatuses for laser processing materials |
CN104142613B (zh) * | 2014-07-11 | 2016-08-17 | 广东工业大学 | 一种大面积数字光刻光学系统 |
CN107073642B (zh) * | 2014-07-14 | 2020-07-28 | 康宁股份有限公司 | 使用长度和直径可调的激光束焦线来加工透明材料的系统和方法 |
DE102014217608A1 (de) | 2014-09-03 | 2014-11-20 | Carl Zeiss Smt Gmbh | Verfahren zum Zuordnen einer zweiten Facette eines im Strahlengang zweiten facettierten Elements einer Beleuchtungsoptik |
DE102014223326B4 (de) | 2014-11-14 | 2018-08-16 | Carl Zeiss Smt Gmbh | Verfahren zur Vorhersage mindestens eines Beleuchtungsparameters zur Bewertung eines Beleuchtungssettings und Verfahren zur Optimierung eines Beleuchtungssettings |
HUE055461T2 (hu) | 2015-03-24 | 2021-11-29 | Corning Inc | Kijelzõ üveg kompozíciók lézeres vágása és feldolgozása |
DE102016202736A1 (de) | 2015-04-17 | 2016-05-25 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für eine Projektionsbelichtungsanlage |
WO2018064409A1 (en) | 2016-09-30 | 2018-04-05 | Corning Incorporated | Apparatuses and methods for laser processing transparent workpieces using non-axisymmetric beam spots |
WO2018081031A1 (en) | 2016-10-24 | 2018-05-03 | Corning Incorporated | Substrate processing station for laser-based machining of sheet-like glass substrates |
DE102018207103A1 (de) * | 2018-05-08 | 2019-03-21 | Carl Zeiss Smt Gmbh | Feldfacettenspiegel |
DE102018220625A1 (de) | 2018-11-29 | 2020-06-04 | Carl Zeiss Smt Gmbh | Optisches Beleuchtungssystem für Projektionslithographie |
DE102018221128A1 (de) | 2018-12-06 | 2020-06-10 | Carl Zeiss Smt Gmbh | Verfahren zum Tauschen eines Spiegels in einer Projektionsbelichtungsanlage sowie Lagedaten-Messeinrichtung zum Durchführen des Verfahrens |
DE102020210771A1 (de) | 2020-08-26 | 2021-08-19 | Carl Zeiss Smt Gmbh | Facettenspiegel für eine projektionsbelichtungsanlage und projektionsbelichtungsanlage mit entsprechendem facettenspiegel sowie verfahren zum betrieb derselben |
DE102021202768A1 (de) * | 2021-03-22 | 2022-09-22 | Carl Zeiss Smt Gmbh | Facettensystem und lithographieanlage |
DE102021213168A1 (de) * | 2021-11-23 | 2023-05-25 | Carl Zeiss Smt Gmbh | Verfahren |
CN114660880A (zh) * | 2022-04-11 | 2022-06-24 | 长沙沃默科技有限公司 | 一种反射式投影成像装置及其设计方法 |
DE102022209214A1 (de) | 2022-09-05 | 2024-03-07 | Carl Zeiss Smt Gmbh | Einzelspiegel eines Pupillenfacettenspiegels und Pupillenfacettenspiegel für eine Beleuchtungsoptik einer Projektionsbelichtungsanlage |
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- 2003-04-08 CN CN03809609.9A patent/CN1650234A/zh active Pending
- 2003-04-08 US US10/512,100 patent/US7196841B2/en not_active Expired - Fee Related
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Also Published As
Publication number | Publication date |
---|---|
US7196841B2 (en) | 2007-03-27 |
CN1650234A (zh) | 2005-08-03 |
DE10219514A1 (de) | 2003-11-13 |
WO2003093902A2 (de) | 2003-11-13 |
AU2003227574A8 (en) | 2003-11-17 |
AU2003227574A1 (en) | 2003-11-17 |
EP1499925A2 (de) | 2005-01-26 |
US20050174650A1 (en) | 2005-08-11 |
JP2005524236A (ja) | 2005-08-11 |
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