WO2002017694A1 - Dispositif d'installation - Google Patents
Dispositif d'installation Download PDFInfo
- Publication number
- WO2002017694A1 WO2002017694A1 PCT/JP2001/006735 JP0106735W WO0217694A1 WO 2002017694 A1 WO2002017694 A1 WO 2002017694A1 JP 0106735 W JP0106735 W JP 0106735W WO 0217694 A1 WO0217694 A1 WO 0217694A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- workpiece
- bonding
- joining
- cleaning
- unit
- Prior art date
Links
- 238000009434 installation Methods 0.000 title abstract 2
- 238000005304 joining Methods 0.000 claims abstract description 53
- 230000007246 mechanism Effects 0.000 claims abstract description 21
- 238000005406 washing Methods 0.000 claims abstract description 8
- 238000004140 cleaning Methods 0.000 claims description 79
- 239000002245 particle Substances 0.000 claims description 22
- 238000010438 heat treatment Methods 0.000 claims description 11
- 230000032258 transport Effects 0.000 claims description 11
- 230000001678 irradiating effect Effects 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 238000010884 ion-beam technique Methods 0.000 claims description 4
- 230000006837 decompression Effects 0.000 claims description 3
- 239000007789 gas Substances 0.000 description 25
- 238000000034 method Methods 0.000 description 19
- 239000000758 substrate Substances 0.000 description 12
- 230000008569 process Effects 0.000 description 9
- 230000000694 effects Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 229910000679 solder Inorganic materials 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- JQJCSZOEVBFDKO-UHFFFAOYSA-N lead zinc Chemical compound [Zn].[Pb] JQJCSZOEVBFDKO-UHFFFAOYSA-N 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000006722 reduction reaction Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
Definitions
- the present invention relates to a mounting apparatus for bonding objects to be bonded, such as a chip mounting apparatus, and more particularly to a mounting apparatus provided with a step of cleaning a bonding surface.
- a substrate is fixed at a predetermined position on a substrate stage, and one or more chips whose relative positional relationship is adjusted with respect to the substrate are mounted on the substrate.
- sputter etching is performed by irradiating the bonding surface of both silicon wafers with an inert gas ion beam or an inert gas fast atom beam in a vacuum at room temperature prior to bonding.
- a room temperature bonding method for silicon wafers is disclosed. In this cold bonding method, oxides and organic substances on the bonding surface of the silicon wafer are blown off by the above-mentioned beam to form a surface with activated silicon atoms, and the surfaces are bonded to each other by a high bonding force between atoms. Joined by. Therefore, this method eliminates the need for heating for bonding, and enables bonding at room temperature. Also, when the surface unevenness is small (If the flatness is high), it is also possible to eliminate the need for pressurizing for bonding.
- this method can fly oxides and organic substances on the bonding surface by irradiating energy waves or energy particles, so that even in cases where room temperature bonding is not aimed, for example, solder bonding as a metal bonding part
- the present invention can be applied to the cleaning of the bonding surface of the workpiece even if it has a part and is basically premised on heat bonding.
- Such cleaning by irradiation with energy waves or energetic particles can provide a highly-cleaned joint surface, and if the joint is maintained while maintaining that condition, the joint surface will be maintained until the actual joint is performed.
- an extremely reliable bonding state can be realized.
- the bonding surface is cleaned by the normal temperature bonding or the irradiation of the energy wave or the energy particles as described above, the irradiation of the energy wave or the energy particles and the bonding are performed in substantially the same place. As described above, it becomes difficult to reduce the total time of a series of operations, and it becomes difficult to reduce the tact time in mass production. In addition, since the joint surface cleaned by irradiation with energy waves or energy particles becomes a highly-cleaned joint surface, handling of the workpiece after cleaning is necessary to maintain the clean state immediately before joining. Will be difficult and special measures will be required.
- an object of the present invention is to provide a mounting apparatus suitable for mass production, which can efficiently perform cleaning of a bonding surface and can greatly reduce a total time of a series of operations from cleaning to bonding completion. Is to do.
- Another object of the present invention is to focus on the advantages of the already known excellent room temperature bonding method and the excellent cleaning effect of the bonding surface by irradiation of energy waves or energy particles. In addition, even for equipment that has an energy particle irradiation process, it is possible to properly handle highly cleaned bonding surfaces, to enable bonding without impairing the cleaning effect, and to complete bonding from cleaning of bonding surfaces.
- An object of the present invention is to provide a mounting device suitable for mass production, which can greatly reduce the total time of a series of operations up to that point. .
- a mounting device according to the present invention is a mounting device for bonding a first workpiece to a second workpiece, and at least a bonding surface of the first workpiece.
- first object and the second object are not particularly limited.
- the first object is made of a chip
- the second object is made of a substrate on which the chip is joined and mounted. Become.
- this mounting apparatus it is configured to have a transporting means for holding and transporting the first workpiece and the second workpiece on a tray between the cleaning section and the bonding section.
- a transporting means for holding and transporting the first workpiece and the second workpiece on a tray between the cleaning section and the bonding section.
- the tray can be divided into a plurality according to the type of the first object and the second object. By providing such a tray, even when there are a plurality of first and second workpieces, they can be transported simultaneously, so that the transport mechanism can be simplified and the transport time can be reduced. You can also measure. For example, a robot hand can be used as the transport mechanism.
- the reversing mechanism for example, a mechanism having an attachment attached to the tip of the reversing mechanism and holding the first workpiece can be adopted.
- this attachment is preferably provided so as to be exchangeable in accordance with the type of the first workpiece, and is automatically exchanged in accordance with the type of the first workpiece to be joined by the attachment. Is preferably performed.
- an exchangeable attachment for holding the work piece can be provided according to the type of the second work piece, and this should also be able to be automatically replaced. Is preferred. Even when the first and second objects are of a single type, a dedicated attachment can be provided for each of them so that they can be automatically replaced.
- the joining portion is provided with a recognition unit that reads a recognition mark for alignment between the first workpiece side and the second workpiece side.
- This recognition means is composed of, for example, a two-field-of-view recognition means, and is disposed between the first object and the second object before joining so as to advance and retreat.
- a recognition means for reading the mark From the information read by each recognition mark by the recognition means, the parallelism between the first workpiece and the second workpiece can be calculated, and accordingly, for example, in the three-axis directions of X, Y, ⁇ and around the ⁇ -axis.
- the position adjustment mechanism By adjusting the direction of rotation, high-accuracy positioning is possible. If the position adjustment mechanism adopts a structure in which a coarse adjustment mechanism and a fine adjustment mechanism using, for example, a piezo element or the like are used, alignment with even higher precision can be achieved.
- the cleaning unit may have a configuration having a special gas replacement unit, and the cleaning may be performed in a special gas atmosphere.
- the special gas in the present invention is, for example, an inert gas such as argon gas, a gas that does not react with the article to be joined such as nitrogen gas, a gas that can replace a surface oxide with a fluorine group or the like on the surface of the article to be joined, A gas containing hydrogen and capable of a reduction reaction on the surface of the object, a gas containing oxygen and capable of removing carbon (organic components) and the like on the surface of the object.
- the joint is also provided with a gas replacement means for replacing the atmosphere with a special gas similar to the above, and the joining is performed in a special gas atmosphere. You can also.
- a decompression means can be provided in the cleaning section or Z and the bonding section.
- the cleaning section and the joining section can be configured separately in one chamber, but in order to perform the cleaning and the joining by completely independent operations, the cleaning section and the joining section are required.
- the parts are preferably housed in separate chambers. In this case, for example, if a shutter means that can be opened and closed is provided between the chamber containing the cleaning section and the chamber containing the connection section, the inside of each chamber can be quickly and easily brought into a desired atmosphere. Can be formed.
- the cleaning section may have a means for irradiating an energy wave or energy particles for cleaning to the surface of the workpiece.
- the mounting apparatus can be configured as an apparatus on the premise of heat bonding, regardless of the presence or absence of an energy wave or energy particle irradiation unit.
- the first object has a metal joint
- the joint of the mounting apparatus has means for heating and joining the metal joint to the object of the second object.
- the metal joint means not only a normal lead-zinc solder joint, but also a so-called alternative solder such as tin-Z silver, Bi-Zin, gold Z ⁇ , gold /
- alternative solder such as tin-Z silver, Bi-Zin, gold Z ⁇ , gold /
- gold joints including gold joints.
- the cleaning unit and the joining unit are configured as separate parts, in the cleaning unit, the first bonded object and the second bonded unit at the bonding unit are provided. Irrespective of the arrangement of the conjugate, the most efficient arrangement for cleaning can be achieved. For example, when cleaning both the first workpiece and the second workpiece, the bonding surfaces of the first and second workpieces to be cleaned are oriented in the same direction. From this direction, it is possible to efficiently perform cleaning in a short time by the cleaning means.
- first and second articles to be cleaned can be transported together to the joint as a set (even when there are a plurality of articles to be joined, as one set). It is easy to transport and requires only a short time.
- the joint it is necessary to make the joining surface of the first workpiece and the joining surface of the second workpiece face each other, but the reversing mechanism easily and quickly reverses the joining surface on the first workpiece side And the two joining surfaces are opposed to each other.
- the reversing mechanism especially the attachment holding the first workpiece, does not touch the bonding surface of the cleaned first workpiece, so that the cleaning effect on the bonding surface is not impaired.
- the desired good bonding is performed without adversely affecting the subsequent bonding.
- the washing is performed efficiently, and a series of operations from the washing to the joining are performed smoothly and promptly, while a clean and clean joint surface is secured. .
- the cleaning part and the bonding part separately, especially by configuring the cleaning part and the bonding part in separate chambers, it becomes possible to perform the cleaning operation and the bonding operation completely independently.
- the next object to be joined can be washed at the same time.
- the tact time of the cleaning / joining process can be significantly reduced in a mass-production manufacturing process in which the workpiece flows continuously.
- the atmosphere in the cleaning section and the atmosphere in the joining section can be set to respective optimum atmospheres, so that cleaning and bonding can be performed under optimum conditions.
- the flow of the predetermined cleaning, joining step and subsequent steps may be substantially one-way transport from the cleaning step to the joining step, and from the joining step to the subsequent step.
- the cleaning step It can also be transported to a subsequent process through a bonding process, a cleaning process once in the bonding process, or a location near the cleaning process.
- Subsequent steps may include a step of permanently joining the first article and the second article. That is, in the mounting apparatus according to the present invention, the joint having the above-described reversing mechanism is used as a temporary joint, and the final joint that permanently joins both objects is temporarily joined to the temporary joint. It is also possible to adopt a configuration in which both articles are connected so as to be able to be transported.
- At least one of a heating unit, a pressurizing unit, and an ultrasonic joining unit can be provided in the main joint. That is, in the final bonding step, the final bonding can be performed individually or by appropriately combining the heating, the pressurizing, and the vibration by the ultrasonic wave. In this way, by performing heating, pressurization, and vibration by ultrasonic waves individually at the main joint, or by combining these as appropriate, the fine gap or residual space at the interface between the two objects can be obtained. Stress can be removed, and throughput can be improved.
- the mounting apparatus of the present invention it is possible to efficiently clean the bonding surface, and to start the bonding without impairing the state of the cleaned bonding surface. High joining state can be obtained.
- a series of operations from cleaning to the completion of joining can be performed efficiently and smoothly, so that the total time of the series of operations can be reduced, and the tact time can be significantly reduced.
- the present invention can be applied to the case where room-temperature bonding is performed.
- FIG. 1 is a schematic longitudinal sectional view of a mounting device according to an embodiment of the present invention.
- FIG. 2 is an enlarged perspective view of a tray holding an object to be joined in the apparatus of FIG.
- FIG. 3 is an enlarged partial front view of the apparatus of FIG.
- FIG. 4 is an enlarged cross-sectional view of the attachment holding the first workpiece in the apparatus of FIG.
- FIG. 5 is a cross-sectional view showing a modification of the attachment.
- FIG. 6 is a sectional view showing another example of the attachment.
- FIG. 7 is a schematic configuration diagram of a mounting device according to another embodiment of the present invention.
- FIG. 1 shows a mounting device according to an embodiment of the present invention.
- the mounting apparatus 1 has a cleaning part 3 of the workpiece 2 and a bonding part 4 of the workpieces 2.
- the cleaning part 3 is housed in the cleaning chamber 5.
- Part 4 is housed in junction chamber 6.
- the two chambers 5 and 6 are connected via a transfer path 7 so that the article 2 can be transferred.
- a shutter means 8 that can be opened and closed between the two chambers 5 and 6 is provided.
- Shutter means 9 is also provided on the inlet side of chamber 15.
- the chip 2 a and the chip 2 b as the first article and the substrate 2 c as the second article as the article 2 in this embodiment.
- a first object (chip) 2a is bonded on the substrate 2c in a state where the first object (chip) 2a is turned upside down from the state of FIG. 2, and another first object (chip) 2b is joined in a state where it is turned upside down from the state shown in FIG.
- FIG. 2 shows a plurality of sets of the first workpieces 2a and 2b and the second workpiece 2 joined in this manner. The state held above is shown.
- FIG. 2 shows a plurality of sets of the first workpieces 2a and 2b and the second workpiece 2 joined in this manner. The state held above is shown. As shown in FIG.
- the tray 10 holding the plurality of sets of workpieces 2 is introduced into the cleaning unit 3 by the transport robot 11a as a transport means, and after the cleaning, the transport robot 1 By 1 b, it is conveyed to the joint 4.
- the tray 10 holding the article 2 introduced into the cleaning unit 3 is held at a predetermined position on the cleaning stage 12.
- the cleaning unit 3 includes an energy wave irradiating means 14 for irradiating an energy wave or energy particles 13 for cleaning the bonding surface of the workpiece 2 4 (Or means for irradiating energetic particles).
- any one of plasma, ion beam, atomic beam, radial beam, and laser can be used as the energy wave or energy particle.
- both the bonding surfaces of the first workpieces 2a, 2b and the second workpiece 2c held on the tray 10 are irradiated with energy waves or energy particles 13.
- energy waves or energy particles 13 For example, if the joint surface of the second article 2c does not need to be cleaned, at least only the joint surface of the first articles 2a and 2b is cleaned. You only need to wash it.
- the cleaning stage 12 is translated in the direction of the arrow or in the plane, and
- the c- cleaning chamber 5, which is preferably adjusted so that the position can be adjusted, may be provided with a special gas replacement means (not shown) for changing the atmosphere of the cleaning section 3 to the above-described special gas atmosphere.
- Cleaning by irradiation of energy waves or energetic particles in a special gas atmosphere makes it possible to enhance the cleaning effect.
- a pressure reducing means such as a vacuum pump can be provided together with the special gas replacing means or without providing the special gas replacing means. Cleaning by irradiating energy waves or energy particles under reduced pressure can also enhance the cleaning effect.
- the joining chamber 6 can also be provided with a special gas replacement means (not shown) for replacing the atmosphere in the joining section 4 with a special gas.
- a special gas replacement means for replacing the atmosphere in the joining section 4 with a special gas.
- the bonding chamber 16 may be provided with a decompression means such as a vacuum pump together with or without the special gas replacement means. By joining under reduced pressure, a better joining state can be obtained.
- the joining section 4 is provided with a table 15 for holding the first articles 2a and 2b and the second article 2c which have been transported by the transport robot 12.
- the tray 10 is first placed at a predetermined position on the table 15 as shown in FIG.
- an attachment corresponding to the type of each workpiece in this embodiment, the first workpiece 2 a , Attachment 16 a, 16 b for holding 2 b and attachment 16 c for holding the second workpiece 2 c Forced to be exchangeable according to the type of workpiece to be held Is provided.
- These attachments 16a to 16c can hold the objects 2a to 2c respectively without touching the cleaned joint surfaces of the objects 2a to 2c. .
- the first articles 2a and 2b are inverted during joining, and the second articles 2c are not inverted.
- Each of the attachments 16a to 16c is attached to the tip (lower end) of the reversing mechanism 17 according to the type of the workpiece to be held, and is attached to the first workpiece 2a, 2b.
- the arm 1 ⁇ a of the reversing mechanism 1 ⁇ is inverted, and the arm 17a is inverted for the second workpiece 2c. Therefore, the second workpiece 2c held by the attachment 16c is transferred and held at a predetermined position on the stage 18.
- the first workpiece 2a is held so that the cleaned bonding surface does not touch the attachment 16a, and the arm 17a is inverted in this state.
- the inverted first workpiece 2a is held on the lower surface of the tool 19 by, for example, suction.
- the reversing mechanism 17 can be moved up and down as shown by the arrow in FIG. 3 so that after performing the reversing and suction operations, it can be retracted upward so as not to disturb the next joining operation. It has become.
- the attachment 16a is spread over the taper. It is formed in a shape having an opening 20, and the first workpiece 2 a is held by the tapered surface, and is held without touching the cleaned bonding surface by suction through the suction hole 21. be able to.
- the bump 22 is particularly a bonding surface.
- the bump 22 is made of, for example, a solder bump as a metal joint that can be heated and joined.
- an appropriate number of pins 23 may be provided upright in the opening 20 of the attachment 16a.
- Pin 2 3 is summer so as to abut against the joining surface other than the portion of the first object to be bonded 2 a (a portion other than the bump 2 2).
- the intermediate portion is By supporting the first workpiece 2a, the radius of the first workpiece 2a can be prevented.
- the attachment 2 a is provided based on feedback information from the gap sensor 34 using an attachment 33 having a gas suction hole 31 and a gas outlet 32.
- a method is adopted in which the force acting on the workpiece 2a is balanced by suction and blowing so that the gap between the workpiece and the workpiece 2a is kept constant, and the workpiece 2a is suction-held in a substantially non-contact state. It is also possible.
- the feedback can be performed not only based on the information from the gap sensor but also by measuring a suction force for sucking the workpiece.
- the tool 19 is configured as a tool with a built-in heater when performing heat bonding, and as a tool without a built-in heater when performing normal temperature bonding.
- the tool 19 is attached to the lower end of a pressurizable cylinder 24 that can move up and down.
- the pressurizing cylinder 24 can be moved up and down by the elevating device 25, or the up and down and rotation can be controlled. After the elevating position is determined, the tool 19 can be moved downward and pressurized.
- the stage 18 is disposed on a position adjustment table 26 that can be controlled in a translational and / or rotational direction, and is held on the stage 18 via the position control of the position adjustment table 26.
- the position and the parallelism between the second workpiece 2c and the first workpiece 2a (2b) held by the tool 19 are adjusted.
- the alignment and the parallelism adjustment are performed on the stage 18 side (the second workpiece 2c side), but are performed on the stage 19 side (the first workpiece 2c side).
- Object 2a) may be performed on both sides, or may be performed on both sides.
- the first workpiece 2a held by the tool 19 and the second workpiece 2c held by the stage 18 are movable back and forth between them.
- Recognition means 27 for reading a recognition mark for positioning is provided.
- the recognition means 27 includes, for example, a two-field camera, and includes a recognition mark on the lower surface of the first workpiece 2 a (2 b) or the tool 19 and a second workpiece 2. Both c and the recognition mark on the top surface of stage 18 can be read.
- the position adjustment table 26 is controlled based on the read information, And the parallelism is adjusted.
- the recognition means 27 can perform position control in the horizontal translation direction in the X and Y directions and / or the elevation direction in the Z direction.
- this recognition means as described above, the first workpiece 2 a held by the tool 19 and the second workpiece 2 c held by the stage 18 are read separately. It may be configured as a means.
- the first bonded objects 2a, 2 Cleaning can be performed by arranging both the b and the second workpiece 2c such that their bonding surfaces face upward, thereby improving the cleaning efficiency and reducing the time.
- the washed first workpieces 2a and 2b and the second workpiece 2c are held on the tray 10 and transported as a set to the bonding section 4, so that transport efficiency is improved.
- the time is short.
- the first workpieces 2a and 2b that need to be inverted for welding are inverted by the inversion mechanism 17 and the tool 19 Is held.
- the first workpieces 2 a and 2 b are held through the attachments 16 a and 16 b without touching the cleaned bonding surface, and are turned upside down in that state and the tool 1 9 Since it is adsorbed and held on the surface, it is possible to keep the cleaned joint surface clean before joining.
- bonding with the second workpiece 2c is performed, so that bonding can be performed with an optimum bonding surface, and a desired good and highly reliable bonding state can be obtained.
- the desired good bonding state can be obtained by maintaining the bonding surface condition of the first and second workpieces required for room temperature bonding until just before bonding. .
- the joint having the reversing mechanism as described above A temporary joint is formed to temporarily join the article and the second article to be joined, and the final joint that permanently joins both articles to this temporary joint can be transported.
- a connected configuration can also be used.
- a cleaning section 41 similar to that described above, a temporary joint section 42 having a reversing mechanism, and a permanent joint section 43 having no reversing mechanism are connected in this order.
- a shutter means 4 4, 4 5, 4 6 is provided in the loading section to the cleaning section 41, between the cleaning section 41 and the temporary joining section 42, and in the unloading section from the main joining section 43.
- the provided configuration can be adopted.
- the main joint 43 is provided with at least one of a heating unit, a pressurizing unit, and an ultrasonic joining unit (not shown). It is preferable that the main bonding can be performed by combining these or an appropriate combination thereof. Even when heating is performed in temporary bonding, it is preferable to perform heating at a higher temperature in the main bonding.
- the main bonding in the present invention can be performed by individually performing the heating, pressurizing, and vibration by the ultrasonic wave or by appropriately combining them to perform the main bonding. It is possible to remove minute gaps and residual stresses at the interface of the joint with the object to be joined in 2, and it is possible to obtain a more desirable joint state.
- the mounting apparatus according to the present invention can be applied to any mounting apparatus in which at least one of the objects to be bonded is cleaned after the surface to be bonded of one of the objects to be bonded, and is efficiently cleaned, desirable bonding, and a cycle time of a series of processes. Can be greatly reduced. Further, the present invention can be suitably applied to an apparatus having a cleaning step by irradiation of energy waves or energy particles.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
- Cleaning In General (AREA)
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2003-7002270A KR20030027031A (ko) | 2000-08-18 | 2001-08-06 | 실장 장치 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000-248654 | 2000-08-18 | ||
JP2000248654A JP4669600B2 (ja) | 2000-08-18 | 2000-08-18 | 実装装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002017694A1 true WO2002017694A1 (fr) | 2002-02-28 |
Family
ID=18738521
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/006735 WO2002017694A1 (fr) | 2000-08-18 | 2001-08-06 | Dispositif d'installation |
Country Status (5)
Country | Link |
---|---|
US (1) | US20030164394A1 (ja) |
JP (1) | JP4669600B2 (ja) |
KR (1) | KR20030027031A (ja) |
TW (1) | TW554386B (ja) |
WO (1) | WO2002017694A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004049428A1 (ja) * | 2002-11-28 | 2004-06-10 | Toray Engineering Co., Ltd. | 接合方法および装置 |
WO2010024681A1 (en) * | 2008-09-01 | 2010-03-04 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Pick- and-place machine |
JP2013506311A (ja) * | 2009-09-28 | 2013-02-21 | ネーデルランドセ・オルガニサティ・フォール・トゥーヘパスト−ナトゥールウェテンスハッペライク・オンデルズーク・テーエヌオー | ピックアンドプレースマシン用プレースステーション |
TWI681698B (zh) * | 2017-09-28 | 2020-01-01 | 日商芝浦機械電子裝置股份有限公司 | 電子零件的安裝裝置與顯示用構件的製造方法 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4036786B2 (ja) * | 2003-04-24 | 2008-01-23 | 唯知 須賀 | 電子部品実装方法 |
JP2005142537A (ja) * | 2003-10-15 | 2005-06-02 | Bondotekku:Kk | 縦振接合方法及び装置 |
JP4162094B2 (ja) * | 2006-05-30 | 2008-10-08 | 三菱重工業株式会社 | 常温接合によるデバイス、デバイス製造方法ならびに常温接合装置 |
KR100864855B1 (ko) * | 2007-03-08 | 2008-10-23 | (주)창조엔지니어링 | 반도체 소자의 실장을 위한 세정 및 본딩의 인라인 처리장치 |
US8528802B2 (en) | 2008-09-04 | 2013-09-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and method of substrate to substrate bonding for three dimensional (3D) IC interconnects |
JP5713157B2 (ja) * | 2010-11-11 | 2015-05-07 | 澁谷工業株式会社 | ボンディング装置 |
JP5890960B2 (ja) * | 2011-02-21 | 2016-03-22 | 積水化学工業株式会社 | フリップチップ実装方法 |
TWI608573B (zh) * | 2016-10-27 | 2017-12-11 | Crystalwise Tech Inc | Composite substrate bonding method |
CN111727494B (zh) * | 2018-02-14 | 2023-09-08 | 库利克和索夫工业公司 | 包含还原气体的使用的将半导体元件焊接到基板的方法及相关焊接机 |
JP7401480B2 (ja) | 2021-03-31 | 2023-12-19 | 東レエンジニアリング株式会社 | チップ部品搬送手段およびこれを備えた実装装置 |
KR102647322B1 (ko) * | 2021-09-23 | 2024-03-13 | 한화정밀기계 주식회사 | 모듈화된 본딩 장치 |
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JPH0437097A (ja) * | 1990-05-31 | 1992-02-07 | Matsushita Electric Ind Co Ltd | フリップチップのボンディング装置 |
JPH08222846A (ja) * | 1995-02-15 | 1996-08-30 | Citizen Watch Co Ltd | 半導体チップ実装方法 |
JPH10163252A (ja) * | 1996-11-28 | 1998-06-19 | Matsushita Electric Ind Co Ltd | フリップチップの実装装置 |
JPH11191576A (ja) * | 1997-12-25 | 1999-07-13 | Seiko Epson Corp | 電子部品の実装方法および装置 |
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JPS63101085A (ja) * | 1986-10-16 | 1988-05-06 | Fuji Electric Co Ltd | 拡散接合方法 |
JPH0168171U (ja) * | 1987-10-16 | 1989-05-02 | ||
JP2876786B2 (ja) * | 1990-12-21 | 1999-03-31 | 株式会社日立製作所 | 高純度雰囲気接合方法及び装置 |
JP2848960B2 (ja) * | 1992-07-31 | 1999-01-20 | リンデ アクチエンゲゼルシヤフト | 低圧下でのプリント配線板の鑞接法 |
JPH1098265A (ja) * | 1996-09-24 | 1998-04-14 | Furukawa Electric Co Ltd:The | 半導体パッケージ部品の実装装置 |
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2000
- 2000-08-18 JP JP2000248654A patent/JP4669600B2/ja not_active Expired - Fee Related
-
2001
- 2001-08-06 US US10/344,939 patent/US20030164394A1/en not_active Abandoned
- 2001-08-06 WO PCT/JP2001/006735 patent/WO2002017694A1/ja active Application Filing
- 2001-08-06 KR KR10-2003-7002270A patent/KR20030027031A/ko not_active Application Discontinuation
- 2001-08-13 TW TW090119748A patent/TW554386B/zh not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US4379218A (en) * | 1981-06-30 | 1983-04-05 | International Business Machines Corporation | Fluxless ion beam soldering process |
JPH0437097A (ja) * | 1990-05-31 | 1992-02-07 | Matsushita Electric Ind Co Ltd | フリップチップのボンディング装置 |
JPH08222846A (ja) * | 1995-02-15 | 1996-08-30 | Citizen Watch Co Ltd | 半導体チップ実装方法 |
JPH10163252A (ja) * | 1996-11-28 | 1998-06-19 | Matsushita Electric Ind Co Ltd | フリップチップの実装装置 |
JPH11191576A (ja) * | 1997-12-25 | 1999-07-13 | Seiko Epson Corp | 電子部品の実装方法および装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004049428A1 (ja) * | 2002-11-28 | 2004-06-10 | Toray Engineering Co., Ltd. | 接合方法および装置 |
WO2010024681A1 (en) * | 2008-09-01 | 2010-03-04 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Pick- and-place machine |
JP2013506311A (ja) * | 2009-09-28 | 2013-02-21 | ネーデルランドセ・オルガニサティ・フォール・トゥーヘパスト−ナトゥールウェテンスハッペライク・オンデルズーク・テーエヌオー | ピックアンドプレースマシン用プレースステーション |
TWI681698B (zh) * | 2017-09-28 | 2020-01-01 | 日商芝浦機械電子裝置股份有限公司 | 電子零件的安裝裝置與顯示用構件的製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20030164394A1 (en) | 2003-09-04 |
TW554386B (en) | 2003-09-21 |
JP2002064266A (ja) | 2002-02-28 |
KR20030027031A (ko) | 2003-04-03 |
JP4669600B2 (ja) | 2011-04-13 |
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