WO1998042620A1 - Procede de production de nanotubes de carbone, procede de production d'une pellicule de nanotubes de carbone et structure pourvue d'une pellicule de nanotubes de carbone - Google Patents
Procede de production de nanotubes de carbone, procede de production d'une pellicule de nanotubes de carbone et structure pourvue d'une pellicule de nanotubes de carbone Download PDFInfo
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- WO1998042620A1 WO1998042620A1 PCT/JP1998/001237 JP9801237W WO9842620A1 WO 1998042620 A1 WO1998042620 A1 WO 1998042620A1 JP 9801237 W JP9801237 W JP 9801237W WO 9842620 A1 WO9842620 A1 WO 9842620A1
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- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/158—Carbon nanotubes
- C01B32/168—After-treatment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/158—Carbon nanotubes
- C01B32/16—Preparation
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- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
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- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/60—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
- C30B29/605—Products containing multiple oriented crystallites, e.g. columnar crystallites
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/734—Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
- Y10S977/742—Carbon nanotubes, CNTs
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/842—Manufacture, treatment, or detection of nanostructure for carbon nanotubes or fullerenes
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/842—Manufacture, treatment, or detection of nanostructure for carbon nanotubes or fullerenes
- Y10S977/843—Gas phase catalytic growth, i.e. chemical vapor deposition
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/888—Shaping or removal of materials, e.g. etching
Definitions
- the present invention relates to a method for producing a carbon nanotube, and a method for producing a carbon nanotube film composed of a plurality of carbon nanotubes well oriented in a thickness direction. Further, the present invention relates to a carbon nanotube having a carbon nanotube film on the surface of a base plate. The present invention relates to a structure with a membrane. Background art
- a carbon nanotube is a cylindrical force obtained by rolling a graphite film.
- an arc discharge SX is irradiated with laser or the like to a material such as a monorefas carbon under an inert gas atmosphere to evaporate ⁇ and evaporate.
- the carbon thus grown is condensed (recombined) on a carbon rod or the like to grow carbon nanotubes on the rod or the like.
- ⁇ rod choice to Amonore amorphous carbon with a force one carbon nanotube, Q where graphite and fullerenes are formed, to increase the yield or the yield force one carbon nanotube, or carbon nanotubes A production method for improving the ⁇ property has been proposed.
- the combined ⁇ method of fullerene and carbon nanotube using high-frequency plasma described in Patent No. 2 546 511 ⁇ , a specific method described in Japanese Patent Application Laid-Open No. 6-2800116, A method for producing carbon nanotubes in which arc discharge is performed in a pressure range is exemplified.
- carbon nanotubes are formed by condensation and recombination of carbon, so that a high temperature close to 300 may be applied to evaporate ⁇ having an extremely high boiling point. Because of manufacturing under such severe conditions, it was difficult to keep the amount of substances other than carbon nanotubes below a certain level. Also, according to the conventional method of growing carbon nanotubes from ⁇ air, There is a problem that a carbon nano-force force sticking to the outer periphery of the carbon nanotube like a bud is easily generated.
- a “carbon nanotube membrane” consisting of a number of carbon nanotubes that are well oriented to extend in the thickness direction of the membrane, is a carbon nanotube membrane that can be used in the fields of electronics and material separation membranes. It is expected that new applications for the tube will open.
- An object of the present invention is to provide a novel method for producing carbon nanotubes.
- Another object of the present invention is to provide a method for producing a film (hereinafter, referred to as a “nanotube film”) composed of a plurality of carbon nanotubes well oriented in a certain direction ((Ao o).
- Still another object of the present invention is to provide a nanotube membrane structure having a nanotube membrane on the surface of a base plate. Disclosure of the invention
- the inventors of the present invention observed the above Si removal layer with a transmission electron microscope (hereinafter, referred to as “ ⁇ ⁇ ”), and surprisingly, the carbon atoms constituting the Si removal layer were not strong enough. For the first time, they found out that they comprised bon nanotubes. Furthermore, the present inventors have found that by heating a SiC crystal under vacuum, it is possible to obtain a nanotube film consisting of carbon nanotubes oriented in a certain direction, and completed the present invention. . That is, the method for producing carbon nanotubes according to claim 1 comprises removing ⁇ ⁇ atoms from the SiC crystal by heating the SiC crystal under vacuum. .
- the heating temperature is not specifically limited, for example in vacuum 1 0 _ 3 ⁇ 1 0 '12 T orr A carbon nanotube can be formed.
- the preferred correct vacuum, 1 (gamma 4 ⁇ according to claim 2: I ( ⁇ 1 () ⁇ ⁇ rr ( more preferred properly 1 0 _ 5-1 0 - in the range of 9 T orr)
- the preferable heating temperature is 120 to 220 (more preferably 140 to 200) according to claim 3.
- a disordered graphite phase may be formed. Therefore, it is difficult to control the size of the carbon nanotube, which is not preferable.
- the SiC crystal used for the production of carbon nanotubes is: SiC, ⁇ -S
- the S i C crystal may be in a state where one S i C, S—S i C and a mixture thereof are misaligned at the stage where the atoms are removed by heating under vacuum.
- a Si removal layer is gradually formed from the surface of the SiC crystal to the center, and carbon nanotubes are formed in this portion. It is also possible to form carbon nanotubes over the entire SiC crystal used as a raw material. However, if the thickness of the Si removal layer is too large, the removal efficiency of crane atoms will be reduced, resulting in reduced production efficiency, and if the heating temperature or the degree of vacuum is set too high to increase the removal rate of silicon atoms, carbon will be removed. Controlling the size of the nanotubes becomes difficult.
- carbon A carbon nanotube in which the attachment of nanocapsules is prevented can be obtained.
- the results of EDS (Energy Transfer X-Ray Analysis)> EELS (Electron Energy Loss Spectroscopy) revealed that extremely pure carbon nanotubes were produced.
- the obtained carbon nanotubes can be used for various applications similar to those obtained by conventional production methods. Examples of this use include S ⁇ agents, tough structural materials, and the like. Further, this carbon nanotube can be further processed, for example, by opening the tip of the carbon nanotube, then introducing other substances into the carbon nanotube from the opening, or by adding a functional group to the carbon nanotube. The ability to introduce Such carbon nanotubes can be used for quantum wires and the like.
- the method of opening the tip of the carbon nanotube and the method of introducing a foreign substance through the opening are described in Japanese Patent Application Laid-Open No. Hei 6-227806, and the method of introducing a functional group into a carbon nanotube.
- a large g of the method for producing carbon nanotubes of the present invention is that a “nanotube film” can be produced.
- the method for producing a nanotube film according to claim 4 is a method for producing a nanotube film composed of various carbon nanotubes oriented so as to extend in the thickness direction of the film. Removing the silicon atoms from the SiC crystal by heating the crystal.
- 50% or more (more preferably 70% or more) of the carbon nanotubes constituting the nanotube film is 45 ° or less (more preferably) with respect to the thickness direction of the nanotube film. Is 30 ° or less, more preferably 15 ° or less. It is possible to obtain a nanotube film extending in the direction forming the angle of (bottom).
- the vacuum heating at the time of removing silicon atoms from the SiC crystal is performed by adjusting the degree of vacuum to 10 ⁇ 5 to: I 0_ 9 To rr (more preferably, 1 ( it mosquito preferable to ⁇ 6 ⁇ 1 0_ 8 T orr ) range, also be in the range of 1 400 to 2000. the heated as placing himself range paragraph 6 word of claims preferred. the heating temperature or true If the heating temperature is higher than the above range, the rate of loss of silicon atoms from the SiC crystal is high, so that the carbon nanotubes constituting the nanotube film are easily oriented. When the nanotubes meet each other, some tubes absorb the others and grow larger, or the growing power of the disordered graphite phase increases. In some cases, nanotubes may not be formed. Over Bed of orientation and Ju - or uniformity are impaired Busaizu, undesirable you may become difficult to control the tube size.
- the production method of the present invention it is possible to form a nanotube film on all surfaces of a SiC crystal used as a raw material.
- the carbon nanotubes constituting the nanotube film tend to be oriented in a direction perpendicular to each surface of the SiC crystal.
- the plane from which a nanotube film with good orientation can be easily obtained is the (000 1) plane for ⁇ of ⁇ -SiC, and the (111) plane for ⁇ -SiC.
- a carbon nanotube film highly oriented in the [000 1] direction and the [11 1] direction, respectively, can be formed.
- the correspondence between the crystal plane and the orientation direction of the carbon nanotubes becomes unclear, and the orientation of the carbon nanotubes is reduced. Therefore, in order to obtain a nanotube film having good orientation, it is preferable to form this near the surface of the SiC crystal.
- the S i C crystal is a cubic ⁇ i S i C with a side of 2.0 / zm
- a highly oriented film is obtained when the thickness of the nanotube film is 0.5 ⁇ m or less. Easy to get.
- silicon atoms are mainly removed from one side of the crystal, such as when a flat SiC crystal is formed on a Si gas impermeable group fe: .
- long-time heating at a relatively low temperature for example, 1500, extends the length of carbon nanotubes, and It is possible to increase the thickness of the membrane.
- a relatively low temperature for example, 1500
- the nanotube film is formed on the (111) plane of SiC by the manufacturing method of the present invention will be described with reference to FIG.
- FIG. 1 (a) when ⁇ —SiC is heated to, for example, 140O ⁇ C by means of laser beam irradiation or the like at a degree of vacuum of 10-7, as shown in FIG.
- a Si removal layer force is formed near the surface of the SiC particles.
- carbon nanotubes highly oriented in the [11] direction are densely formed in the Si removal layer.
- a nanotube film composed of many carbon nanotubes well oriented in the thickness direction of the film can be obtained.
- This nanotube film for example, has a conductivity of a certain m ⁇ ⁇ in the thickness direction of the film, but has little conductivity in the surface direction of the film, so that it can be used as a device or the like, and has high homogeneity. Therefore, it is also useful as a new device, and also as a device using the quantum effect.
- Other applications include transistor emitters and flat panel displays.
- nano-pipe film in which a very large number of extremely small particles extend in the thickness direction of the film.
- This nanopipe membrane can function as an excellent material fraction.
- the directions of the above passages are as uniform as possible in order to reduce resistance during the distribution of the substance.
- a highly-oriented nanotube film is humiliated, and thus a highly-oriented nanopipe film formed therefrom is easy to use as a material separator.
- a functional group may be introduced into the nanopipe membrane, whereby, for example, the material separation characteristics can be adjusted.
- a carbon material suitable as a negative electrode material of a lithium ion battery can be obtained.
- lithium ion batteries Using carbonaceous materials such as the ones that utilize the ability to enter and exit between lithium ionizers (gap between molecules made of carbon), open carbon nanotubes in the nanotube film of the present invention. Since the material is formed to have a high density of carbon nanotubes, it has a small specific surface area, and is composed of a number of fine straight tubes with high orientation, so that lithium ions can easily move.
- a nanotube film having a larger area than before can be obtained.
- the manufacturing method according to claim 7 is an example of a method capable of manufacturing such a large-area nanotube film, comprising forming a Sic single crystal film on a surface of a substrate, and then forming the Sic single crystal film under vacuum. By heating the iC single crystal film, silicon atoms are removed from the SiC single crystal film, and the SiC single crystal film has at least a partial thickness on the surface side thereof.
- a feature is to form a nanotube film composed of a large number of carbon nanotubes oriented so as to extend in the thickness direction of the film.
- the material of the “substrate” for example, a Si single crystal, a carbon substrate, or the like can be used.
- Si is driven into the surface of the carbon substrate to form an S i C phase on the surface first, and then heated by evacuation to remove force from the S i C phase.
- a carbon nanotube can be obtained by forming a carbon nanotube.
- a SiC single crystal film is formed on a substrate made of a Si (111) single crystal by a chemical vapor deposition method (hereinafter, referred to as a “CVD method”).
- the obtained S i C single crystal film has a surface (ie, a side opposite to the substrate) force (1 1 1) plane.
- the substrate oxidation as compared to the S i C single crystal film is first removed as S i 2 0 by heating under vacuum, heating the S i C single crystal film left further
- the 3 ⁇ 4H atoms in the Si Cm 3 ⁇ 4 film are removed from the (1 11) plane side, and the “ ⁇ thickness” of at least the surface side of this Si C single crystal film is [1 1 1].
- a nanotube film composed of the carbon nanotubes oriented toward is obtained. It is also possible to form carbon nanotubes extending in the [11] direction over the entire thickness of the SiC single crystal film, that is, from the surface side to the substrate side.
- SiC single crystal film it is already known to form a SiC single crystal film on a substrate by CVD method, and a technique for forming a relatively large area SiC single crystal film is also known.
- a heating means such as an arc discharge or a laser is used.
- heating under 200 is sufficient, so that a large heating area using a normal heating furnace such as a m furnace, an image furnace (far infrared heating), or the like can be used. It is possible to relatively uniformly heat the entire sic single crystal film.
- the production method of the present invention is useful as a method for producing a large-area nanotube film, which has been conventionally difficult. Further, a practical material separation membrane is required to have an area of 3 cm 2 or more, preferably 5 cm 2 or more. It is suitable as a manufacturing method.
- the method for producing a nanotube film according to claim 8 is characterized in that:
- SiC substrate By heating the SiC substrate, silicon atoms were removed from the SiC substrate, and the SiC substrate was oriented so as to extend in the thickness direction of the SiC substrate to at least the thickness of the surface of the SiC substrate.
- the formation of a nanotube film composed of multiple carbon nanotubes is defined as m.
- SiC substrate Either a single crystal or a polycrystal can be used as the SiC substrate, but it is preferable to use a single crystal in order to form a film that is relatively wide and highly oriented over an area.
- SiC substrate any of SiC, S-SiC, and a mixture thereof may be used, and the SiC substrate is removed at a stage where silicon atoms are removed by heating under vacuum.
- the iC substrate may be in a state of any one of SiC, ⁇ -SiC, and a mixture thereof.
- the shape of S i C ⁇ is not particularly limited, but usually a flat shape is used.
- Claim 9 relates to a structure provided with a nanotube film. That is, a structure with a nanotube film comprising: a base plate portion; and a nanotube film formed on the surface of the base plate portion and formed of a number of carbon nanotubes oriented to extend in the thickness direction.
- the nanotube film is formed by heating a substrate having at least a surface layer made of a SiC crystal under vacuum to remove silicon atoms from the SiC crystal.
- the “substrate having at least a surface layer made of S i C crystal” may be a substrate having a S i C crystal layer on a pedestal layer made of an arbitrary material, It indicates that the substrate may be made of a crystal. Further, when “removing silicon atoms from the SiC crystal” to form a nanotube film, the silicon atoms may be removed from a partial thickness on the surface side of the SiC crystal (ie, S The nanotube film is formed from a part of the thickness of the surface of the iC crystal, and may be removed from the entire thickness of the SiC crystal (that is, the nanotube film extends over the entire thickness of the SiC crystal). Is formed).
- the nanotube film may be formed on only one surface of the bottom plate portion, or may be formed on both one surface and the other surface, and may be formed on the side edge of the base plate portion (that is, the thickness portion). ) And at least one surface.
- the nanotube film may be formed only on the “ ⁇ product” of the surface of the base plate portion, or may be formed over the entire area and may be t ⁇ .
- a method of forming a nanotube film only on a substrate there is a method in which a substrate is heated in a vacuum and a Si gas impermeable material is deposited on a predetermined portion of the Si C crystal surface. .
- the carbon nanotube's crystal orientation depends on the crystal orientation of SiC.
- a part of the surface of the SiC crystal is cut out into, for example, a V-shape and the crystal orientation of the surface is changed (that is, the surface where carbon nanotubes are likely to be
- the nanotubular film is formed on one surface of the base plate over the entire area thereof from the thickness on the surface side of the SiC crystal.
- FIG. 11 (a) shows that a nanotube film 13a is formed on one surface of the base plate portion 12a made of SiC over the entire area from the thickness of the surface side of the SiC crystal.
- FIG. 1 is a schematic diagram showing a nanotube film-attached body 1a obtained.
- FIG. 11 (b) shows a case where a substrate having an SiC crystal layer on a pedestal layer 14b made of Si is used, and a nanotube film 13b is obtained from a partial thickness on the surface side of the SiC crystal.
- FIG. 4 is a schematic diagram showing a force and a formed structure 1b with a nanotube film.
- the base plate portion 12b is composed of a portion of the SiC crystal 11b and the pedestal layer 14b where no nanotube film is formed.
- FIG. 11 (c) shows a nanotube film 13c formed on one surface of a base plate 12c made of SiC and having a nanotube film 13c formed to a partial thickness of a part thereof. It is a schematic diagram showing ⁇ body lc.
- This structure is provided with a nanotube film having the same properties as the nanotube film manufactured by the method according to claims 4 to 8 on the surface of the base plate portion.
- the thickness of the base plate is not particularly limited in the above structure, which can be used as a device utilizing a quantum effect, a transistor emitter, a flat panel display, a negative electrode material of a lithium ion battery, and the like.
- the thickness of the nanotube film is not particularly limited, the thickness of the nanotube film (that is, the length of the carbon nanotube) should be 0.01 to 50 m in order to be used in the above-mentioned applications. , 0.05 to 20 ⁇ , more preferably 0.1 to 10 m.
- 50% or more (more preferably 70% or more) of the carbon nanotubes constituting the nanotube film is 45 ° or less (more preferably 30 ° or less) with respect to the thickness direction of the nanotube film. (More preferably 15 ° or less).
- nanotube membrane Preferably, the area formed by the formation is 3 cm 2 or more, more preferably 5 cm 2 or more.
- a nanotube film which has been conventionally difficult to produce, can be easily produced. According to this method, it is also possible to obtain a relatively large-area nanotube film. Therefore, the method for producing a carbon nanotube and the method for producing a nanotube film of the present invention are extremely useful in the field of electronics, the field of substances, and the like.
- the structure with a nanotube film of the present invention has a nanotube film on the surface of the base plate portion, it is extremely useful in the fields of electronics, material separation, and the like.
- 1 (a) to 1 (c) are schematic diagrams showing the manner in which a nanotube film is formed by the method of the present invention.
- FIG. 2 is a TEM photograph showing the crystal structure of S i C particles having a nanotube film manufactured according to Example 1.
- FIG. 3 is a TEM photograph showing the crystal structure near the surface of the nanotube film shown in FIG.
- FIG. 4 is a TEM photograph showing the crystal structure of the nanotube film formed on the surface 1 of the SiC particles shown in FIG.
- FIG. 5 is a TEM photograph showing the crystal structure of the nanotube film formed on the surface 2 of the SiC particles shown in FIG.
- FIG. 6 is a TEM photograph showing the crystal structure of the nanotube film formed on the surface 3 of the SiC particles shown in FIG.
- Figure 7 shows the crystal structure of the nanotube film formed on surface 4 of the SiC particles shown in Figure 2.
- 7 is a TEM photograph showing
- FIG. 8 is a TEM photograph showing the crystal structure near the surface of the SiC particles when the sample shown in FIG. 2 is further heated.
- FIG. 9 is a TEM photograph showing the crystal structure near the surface of the SiC particles when the sample shown in FIG. 2 is further heated.
- FIG. 10 is a TEM photograph showing the crystal ⁇ near the surface of the SiC particles when the difficulty shown in FIG. 2 is further heated.
- FIGS. 11 (a) to 11 (c) are schematic cross-sectional views showing examples of the TO structure of the nanotube film of the present invention.
- FIG. 12 is a cross-sectional view showing a fiber case used for heating a sample in Difficult Example 2.
- FIG. 13 is an explanatory view schematically showing a carbon heater used for heating a sample in Example 2.
- FIG. 14 (a) is a TEM photograph showing a cross section of the nanotube-coated structure manufactured in Example 2, and FIG. 14 (b) is an enlarged TEM of the tip of the carbon nanotube in FIG. 14 (a). It is a photograph.
- FIG. 15 is a photograph showing an electrodiffraction pattern of the nanotube film structure manufactured in Example 2 including a SiC crystal and a carbon nanotube. Best Mode for Inventing the Invention
- Example 1 is an example in which a YAG laser beam is used as a floating stage.
- a S i C sintered compact lightly sintered at 1650 ⁇ 30 min. cut into a piece of 3 mm long ⁇ 5 mm wide ⁇ 0.1 mm thick was used.
- This S i C sintered body mainly consists of 3-S i C, and is in the process of transition to S i C.
- the measurement was performed in a non-contact manner by radiating radiant energy emitted from a sample heated to a high temperature to a detector using a fiber optical system.
- Figure 2 shows that the sample was heated to 140 at noble seconds at a heating rate of 80 at a vacuum of 10 -7 Torr, and held for 3 minutes at this temperature, within the range of the laser beam. These are the yS-SiC crystal grains observed slightly off the center. It can be seen that the SiC removal layer is formed near the surface of the particle over a thickness of about 0.1 m. The formation of force due to the removal of silicon atoms in the SiC removal layer was observed from the results of EDS, EF-TEM (Energy Regulating Transmission Electron Microscope) observation, EELS, and electron diffraction images.
- the numbers 1 to 4 in FIG. 2 indicate the respective surfaces of the particles, and the surface 1 corresponds to the (1 11) plane of S—SiC.
- G shows a ⁇ -shaped structure extending mainly in the thickness direction of the SiC removal layer.
- Fig. 3 is a high-resolution observation of ⁇ 3 ⁇ 4 on the surface 1 shown in Fig. 2.
- the above ⁇ fibrous structure '' is one in which carbon nanotubes are densely oriented in the thickness direction of the layer. I understand that.
- Figs. 4 to 7 are enlarged views of the particle surfaces 1 to 4 shown in Fig. 2, respectively, and the carbon nanotubes of almost uniform length were oriented in the thickness direction on any surface.
- the nanotube film is formed.
- the orientation of the carbon nanotubes on the surface 1 is particularly high.
- FIGS. 8 to 10 show samples heated to 140 ° C. under the above conditions and further heated to 160 ° C. in true 10 T rr. As the sample temperature rose, it was observed that the carbon nanotubes once formed engaged each other and a part of the carbon nanotubes grew larger. It can be seen from FIGS. 8 to 10 that the grown tube has a hollow and closed-end structure.
- the entire SiC particles are converted into carbon nanotubes due to the high temperature, and the disturbed carbon inside the particles is used as a supply source to promote nanotubes. It is thought that it is.
- FIGS. 2 to 10 show observations of the portion irradiated with the YAG laser beam for heating, even in the case of deviation, and the carbon was heated in the portion outside the laser and heated by conduction. The ability to generate nanotubes was observed. Therefore, even if heating means other than laser irradiation is used, it is considered that carbon nanotubes will be generated if the sample is heated to a predetermined temperature.
- Example 2 is an example in which a heating furnace was used as a heating method.
- a “single SiC single crystal wafer (shape; 5x5x0.4 mm flat plate) was used.
- a carbon case 4 with a lid as a sample case (shape; 0130x (130 mm) at the bottom, place a high-purity carbon plate 41 on top of it, and set the above-mentioned box 5 horizontally with the mirror surface ((0001) ®) facing up, and exhaust 05 mm at the center.
- the lid 43 having the hole 42 was closed and placed in the carbon heater 6 shown in Fig. 13 and heated under the following conditions: In Fig. 13, 61 is a heat generating body, and 62 is a sample case stand.
- Heating furnace Fuji Electric Beni-Kama Shikai-kai's power heater, model name "High Multi-10000 Furnace"
- Heat is m 1200f up to 1200, and above 1200 is measured by a pipe meter provided in the heating furnace.
- FIG. 14 (a) shows a TEM cross-sectional view of the sample prepared by dimpling and ion thinning after heating. The lower black part is the SiC crystal. A streak-like contrast perpendicular to the surface is observed at a uniform thickness of 0.15 / im on the surface. This was formed by the remaining layer as a result of silicon atoms being decomposed and removed by heating the SiC, and was also ⁇ t ⁇ because the analysis was almost ⁇ .
- FIG. 14 (b) is an enlarged image of the tip of the carbon nanotube in FIG. 14 (a). From this image, it was clarified that an alignment film was formed at a low density from carbon nanotubes having a cross-sectional diameter of 2 to 5 nm.
- the carbon nanotube was linear and had a very small length. It was also found that the length of the carbon nanotube (the thickness of the nanotube film) can be easily controlled by 3 ⁇ 43 ⁇ 4, time, and ⁇ . For example, in the above test, the temperature was raised in the same manner except that the temperature was raised from 1200 to 1500 in 30 minutes instead of 1200 ⁇ € to 1700 in 30 minutes. Then, the length of the carbon nanotube was 50 nm (0.05 wm).
- FIG. 15 is an electrodiffraction pattern including the SiC crystal and the carbon nanotube of the sample.
- the light incident direction is parallel to the SiC [110] direction, indicating that the ⁇ f of 002 in the graph item is completely perpendicular to the [001] direction of the SiC.
- the ⁇ of 002 in the graphite is sharp, indicating that the orientation of the carbon nanotube is always high. From this diffraction pattern, it was measured that the lattice constant of graphite constituting the carbon nanotube was 0.344 nm. It should be noted that the present invention is not limited to those shown in the above specific examples, but may be variously modified within the scope of the present invention depending on the purpose and application.
Description
Claims
Priority Applications (3)
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EP98909814A EP0947466B1 (en) | 1997-03-21 | 1998-03-23 | Process for producing carbon nanotubes, process for producing carbon nanotube film, and structure provided with carbon nanotube film |
US09/194,204 US6303094B1 (en) | 1997-03-21 | 1998-03-23 | Process for producing carbon nanotubes, process for producing carbon nanotube film, and structure provided with carbon nanotube film |
DE69802898T DE69802898T2 (de) | 1997-03-21 | 1998-03-23 | Verfahren zur herstellung von kohlenstoffnanoröhren, verfahren zur herstellung von kohlenstoffnanoröhrenfilm und struktur versehen mit kohlenstoffnanoröhrenfilm |
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JP08751897A JP3183845B2 (ja) | 1997-03-21 | 1997-03-21 | カーボンナノチューブ及びカーボンナノチューブ膜の製造方法 |
JP9/87518 | 1997-03-21 |
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US (1) | US6303094B1 (ja) |
EP (1) | EP0947466B1 (ja) |
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US7378075B2 (en) | 2002-03-25 | 2008-05-27 | Mitsubishi Gas Chemical Company, Inc. | Aligned carbon nanotube films and a process for producing them |
US7666708B2 (en) | 2000-08-22 | 2010-02-23 | President And Fellows Of Harvard College | Doped elongated semiconductors, growing such semiconductors, devices including such semiconductors, and fabricating such devices |
US7744793B2 (en) | 2005-09-06 | 2010-06-29 | Lemaire Alexander B | Apparatus and method for growing fullerene nanotube forests, and forming nanotube films, threads and composite structures therefrom |
US7799163B1 (en) | 1999-05-28 | 2010-09-21 | University Of Dayton | Substrate-supported aligned carbon nanotube films |
US7816709B2 (en) | 1999-06-02 | 2010-10-19 | The Board Of Regents Of The University Of Oklahoma | Single-walled carbon nanotube-ceramic composites and methods of use |
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US7850778B2 (en) | 2005-09-06 | 2010-12-14 | Lemaire Charles A | Apparatus and method for growing fullerene nanotube forests, and forming nanotube films, threads and composite structures therefrom |
US7858965B2 (en) | 2005-06-06 | 2010-12-28 | President And Fellows Of Harvard College | Nanowire heterostructures |
US7910064B2 (en) | 2003-06-03 | 2011-03-22 | Nanosys, Inc. | Nanowire-based sensor configurations |
US7911009B2 (en) | 2000-12-11 | 2011-03-22 | President And Fellows Of Harvard College | Nanosensors |
WO2011109473A1 (en) * | 2010-03-02 | 2011-09-09 | The Ohio State University Research Foundation | Molecularly imprinted carbon |
US8058640B2 (en) | 2006-09-11 | 2011-11-15 | President And Fellows Of Harvard College | Branched nanoscale wires |
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US8232584B2 (en) | 2005-05-25 | 2012-07-31 | President And Fellows Of Harvard College | Nanoscale sensors |
US8575663B2 (en) | 2006-11-22 | 2013-11-05 | President And Fellows Of Harvard College | High-sensitivity nanoscale wire sensors |
US9102521B2 (en) | 2006-06-12 | 2015-08-11 | President And Fellows Of Harvard College | Nanosensors and related technologies |
US9297796B2 (en) | 2009-09-24 | 2016-03-29 | President And Fellows Of Harvard College | Bent nanowires and related probing of species |
US9390951B2 (en) | 2009-05-26 | 2016-07-12 | Sharp Kabushiki Kaisha | Methods and systems for electric field deposition of nanowires and other devices |
Families Citing this family (91)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
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US6630772B1 (en) * | 1998-09-21 | 2003-10-07 | Agere Systems Inc. | Device comprising carbon nanotube field emitter structure and process for forming device |
US6713234B2 (en) * | 1999-02-18 | 2004-03-30 | Micron Technology, Inc. | Fabrication of semiconductor devices using anti-reflective coatings |
WO2000051174A1 (en) * | 1999-02-26 | 2000-08-31 | Trikon Holdings Limited | A method of processing a polymer layer |
US7132161B2 (en) * | 1999-06-14 | 2006-11-07 | Energy Science Laboratories, Inc. | Fiber adhesive material |
JP3611503B2 (ja) | 1999-07-21 | 2005-01-19 | シャープ株式会社 | 電子源及びその製造方法 |
US6923946B2 (en) * | 1999-11-26 | 2005-08-02 | Ut-Battelle, Llc | Condensed phase conversion and growth of nanorods instead of from vapor |
WO2001061719A1 (en) * | 2000-02-16 | 2001-08-23 | Fullerene International Corporation | Diamond/carbon nanotube structures for efficient electron field emission |
DE60110605T2 (de) * | 2000-08-09 | 2006-01-19 | Ohio University, Athens | Verbundmaterial mit polymermatrix |
JP4759103B2 (ja) * | 2001-01-15 | 2011-08-31 | 株式会社ノリタケカンパニーリミテド | 電界電子放出装置の製造方法 |
JP4863551B2 (ja) * | 2001-01-22 | 2012-01-25 | 財団法人ファインセラミックスセンター | 量子ドットの製造方法および量子ドット構造体 |
JP4907008B2 (ja) * | 2001-03-02 | 2012-03-28 | 財団法人ファインセラミックスセンター | カーボンナノチューブ、並びにカーボンナノチューブ付ウィスカー及びカーボンナノチューブ付ウィスカーの製造方法 |
JP4907009B2 (ja) * | 2001-03-30 | 2012-03-28 | 財団法人ファインセラミックスセンター | カーボンナノチューブ膜、カーボンナノチューブ膜含有SiC基板、カーボンナノチューブ膜体の製造方法 |
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US20050100499A1 (en) * | 2001-06-25 | 2005-05-12 | Asao Oya | Carbon nanotube and process for producing the same |
US6643165B2 (en) | 2001-07-25 | 2003-11-04 | Nantero, Inc. | Electromechanical memory having cell selection circuitry constructed with nanotube technology |
US6574130B2 (en) | 2001-07-25 | 2003-06-03 | Nantero, Inc. | Hybrid circuit having nanotube electromechanical memory |
US6706402B2 (en) | 2001-07-25 | 2004-03-16 | Nantero, Inc. | Nanotube films and articles |
US6835591B2 (en) | 2001-07-25 | 2004-12-28 | Nantero, Inc. | Methods of nanotube films and articles |
US6743500B2 (en) * | 2001-08-03 | 2004-06-01 | Hitachi Chemical Company, Ltd. | Hollow carbon fiber and production method |
JP4907017B2 (ja) * | 2001-08-29 | 2012-03-28 | 財団法人ファインセラミックスセンター | カーボンナノチューブ膜体の製造方法 |
US6821730B2 (en) | 2001-11-09 | 2004-11-23 | Intel Corporation | Carbon nanotube molecular labels |
US20030124717A1 (en) * | 2001-11-26 | 2003-07-03 | Yuji Awano | Method of manufacturing carbon cylindrical structures and biopolymer detection device |
US6784028B2 (en) | 2001-12-28 | 2004-08-31 | Nantero, Inc. | Methods of making electromechanical three-trace junction devices |
US6764628B2 (en) * | 2002-03-04 | 2004-07-20 | Honeywell International Inc. | Composite material comprising oriented carbon nanotubes in a carbon matrix and process for preparing same |
US20060165988A1 (en) * | 2002-04-09 | 2006-07-27 | Yet-Ming Chiang | Carbon nanoparticles and composite particles and process of manufacture |
CA2385802C (en) * | 2002-05-09 | 2008-09-02 | Institut National De La Recherche Scientifique | Method and apparatus for producing single-wall carbon nanotubes |
US7335908B2 (en) * | 2002-07-08 | 2008-02-26 | Qunano Ab | Nanostructures and methods for manufacturing the same |
AU2003264212A1 (en) * | 2002-09-17 | 2004-04-08 | Ht Innovative Technologies, Llc | Process of controllable synthesis of carbon films with composite structures |
AU2003278852A1 (en) * | 2002-09-20 | 2004-05-13 | Intel Corporation | Controlled alignment of nano-barcodes encoding specific information for scanning probe microscopy (spm) reading |
US7361821B2 (en) * | 2002-09-20 | 2008-04-22 | Intel Corporation | Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (SPM) reading |
EP1560791A1 (en) * | 2002-11-15 | 2005-08-10 | MGill University | Method for producing carbon nanotubes using a dc non-transferred thermal plasma torch |
US20040109813A1 (en) * | 2002-12-05 | 2004-06-10 | National Tsing Hua University | Process and device for upgrading current emission |
US20070041889A1 (en) * | 2002-12-05 | 2007-02-22 | National Tsing Hua University | Process and device for upgrading current emission |
WO2004059298A1 (en) * | 2002-12-20 | 2004-07-15 | Rensselaer Polytechnic Institute | Miniaturized gas sensors featuring electrical breakdown in the vicinity of carbon nanotube tips |
US7858185B2 (en) | 2003-09-08 | 2010-12-28 | Nantero, Inc. | High purity nanotube fabrics and films |
US7666382B2 (en) | 2004-12-16 | 2010-02-23 | Nantero, Inc. | Aqueous carbon nanotube applicator liquids and methods for producing applicator liquids thereof |
US7316061B2 (en) * | 2003-02-03 | 2008-01-08 | Intel Corporation | Packaging of integrated circuits with carbon nano-tube arrays to enhance heat dissipation through a thermal interface |
US7780918B2 (en) | 2003-05-14 | 2010-08-24 | Nantero, Inc. | Sensor platform using a horizontally oriented nanotube element |
US7118941B2 (en) * | 2003-06-25 | 2006-10-10 | Intel Corporation | Method of fabricating a composite carbon nanotube thermal interface device |
US7112472B2 (en) * | 2003-06-25 | 2006-09-26 | Intel Corporation | Methods of fabricating a composite carbon nanotube thermal interface device |
US7375369B2 (en) | 2003-09-08 | 2008-05-20 | Nantero, Inc. | Spin-coatable liquid for formation of high purity nanotube films |
FR2859488B1 (fr) * | 2003-09-10 | 2006-02-17 | Centre Nat Rech Scient | Procede de fabrication d'au moins une cavite dans un materiau |
EP1678741A1 (en) * | 2003-09-12 | 2006-07-12 | Kobenhavns Universitet | Method of fabrication and device comprising elongated nanosize elements |
JP4339657B2 (ja) | 2003-09-30 | 2009-10-07 | 富士通株式会社 | 半導体装置及びその製造方法 |
US7618300B2 (en) * | 2003-12-24 | 2009-11-17 | Duke University | Method of synthesizing small-diameter carbon nanotubes with electron field emission properties |
WO2005110624A2 (en) * | 2003-12-31 | 2005-11-24 | Eikos Inc. | Methods for modifying carbon nanotube structures to enhance coating optical and electronic properties of transparent conductive coatings |
US20050164211A1 (en) * | 2004-01-22 | 2005-07-28 | Hannah Eric C. | Carbon nanotube molecular labels |
US20080292840A1 (en) * | 2004-05-19 | 2008-11-27 | The Regents Of The University Of California | Electrically and thermally conductive carbon nanotube or nanofiber array dry adhesive |
WO2006083282A2 (en) * | 2004-05-19 | 2006-08-10 | The Regents Of The University Of California | Electrically and thermally conductive carbon nanotube or nanofiber array dry adhesive |
US7658869B2 (en) | 2004-06-03 | 2010-02-09 | Nantero, Inc. | Applicator liquid containing ethyl lactate for preparation of nanotube films |
US7744843B2 (en) * | 2004-06-21 | 2010-06-29 | Drexel University | Methods for bulk synthesis of carbon nanotubes |
US7922993B2 (en) * | 2004-07-09 | 2011-04-12 | Clean Technology International Corporation | Spherical carbon nanostructure and method for producing spherical carbon nanostructures |
US7563426B2 (en) * | 2004-07-09 | 2009-07-21 | Clean Technologies International Corporation | Method and apparatus for preparing a collection surface for use in producing carbon nanostructures |
US7550128B2 (en) * | 2004-07-09 | 2009-06-23 | Clean Technologies International Corporation | Method and apparatus for producing carbon nanostructures |
US20060008403A1 (en) * | 2004-07-09 | 2006-01-12 | Clean Technologies International Corporation | Reactant liquid system for facilitating the production of carbon nanostructures |
WO2006085993A2 (en) * | 2004-07-16 | 2006-08-17 | The Trustees Of Boston College | Device and method for achieving enhanced field emission utilizing nanostructures grown on a conductive substrate |
CN100582033C (zh) * | 2004-08-04 | 2010-01-20 | 鸿富锦精密工业(深圳)有限公司 | 陶瓷模仁 |
US7587985B2 (en) * | 2004-08-16 | 2009-09-15 | Clean Technology International Corporation | Method and apparatus for producing fine carbon particles |
CA2500766A1 (en) * | 2005-03-14 | 2006-09-14 | National Research Council Of Canada | Method and apparatus for the continuous production and functionalization of single-walled carbon nanotubes using a high frequency induction plasma torch |
CA2613203C (en) | 2005-06-28 | 2013-08-13 | The Board Of Regents Of The University Of Oklahoma | Methods for growing and harvesting carbon nanotubes |
AU2006287610A1 (en) | 2005-09-06 | 2007-03-15 | Nantero, Inc. | Nanotube fabric-based sensor systems and methods of making same |
EP1973845A4 (en) | 2005-12-19 | 2009-08-19 | Nantero Inc | PREPARATION OF CARBON NANOTUBES |
JP2007214117A (ja) * | 2006-01-12 | 2007-08-23 | Matsushita Electric Ind Co Ltd | 電子放出装置及びこれを用いた電磁波発生装置 |
US7808169B2 (en) | 2006-01-12 | 2010-10-05 | Panasonic Corporation | Electron emitting device and electromagnetic wave generating device using the same |
WO2007110899A1 (ja) | 2006-03-24 | 2007-10-04 | Fujitsu Limited | 炭素系繊維のデバイス構造およびその製造方法 |
US7781635B1 (en) | 2006-08-07 | 2010-08-24 | The United States Of America As Represented By The Secretary Of The Navy | Surfactant-based purification of nanotubes |
JP5355423B2 (ja) * | 2007-02-22 | 2013-11-27 | ダウ コーニング コーポレーション | 伝導性フィルムを調製するためのプロセスおよびそのプロセスを用いて調製した物品 |
FR2915743A1 (fr) * | 2007-05-02 | 2008-11-07 | Sicat Sarl | Composite de nanotubes ou nanofibres sur mousse de beta-sic |
JP5029987B2 (ja) * | 2007-05-16 | 2012-09-19 | 東海カーボン株式会社 | ナノカーボンの製造方法 |
US20090004075A1 (en) * | 2007-06-26 | 2009-01-01 | Viko System Co., Ltd. | Apparatus for mass production of carbon nanotubes using high-frequency heating furnace |
WO2009069684A1 (ja) * | 2007-11-29 | 2009-06-04 | Sumitomo Electric Industries, Ltd. | 放熱構造、該放熱構造の製造方法及び該放熱構造を用いた放熱装置、ダイヤモンドヒートシンク、該ダイヤモンドヒートシンクの製造方法及び該ダイヤモンドヒートシンクを用いた放熱装置、並びに放熱方法 |
US9406985B2 (en) | 2009-01-13 | 2016-08-02 | Nokia Technologies Oy | High efficiency energy conversion and storage systems using carbon nanostructured materials |
US20100178568A1 (en) * | 2009-01-13 | 2010-07-15 | Nokia Corporation | Process for producing carbon nanostructure on a flexible substrate, and energy storage devices comprising flexible carbon nanostructure electrodes |
US20100216023A1 (en) * | 2009-01-13 | 2010-08-26 | Di Wei | Process for producing carbon nanostructure on a flexible substrate, and energy storage devices comprising flexible carbon nanostructure electrodes |
US8273486B2 (en) | 2009-01-30 | 2012-09-25 | Honeywell International, Inc. | Protecting a PEM fuel cell catalyst against carbon monoxide poisoning |
JP5464544B2 (ja) * | 2009-05-12 | 2014-04-09 | 学校法人関西学院 | エピタキシャル成長層付き単結晶SiC基板、炭素供給フィード基板、及び炭素ナノ材料付きSiC基板 |
US8574673B2 (en) | 2009-07-31 | 2013-11-05 | Nantero Inc. | Anisotropic nanotube fabric layers and films and methods of forming same |
US8128993B2 (en) | 2009-07-31 | 2012-03-06 | Nantero Inc. | Anisotropic nanotube fabric layers and films and methods of forming same |
CN102103438A (zh) * | 2009-12-18 | 2011-06-22 | 鸿富锦精密工业(深圳)有限公司 | 触控面板 |
WO2011100661A1 (en) | 2010-02-12 | 2011-08-18 | Nantero, Inc. | Methods for controlling density, porosity, and/or gap size within nanotube fabric layers and films |
CN101898759B (zh) * | 2010-06-29 | 2012-07-18 | 清华大学 | 碳纳米管结构的制备方法 |
WO2012040202A1 (en) | 2010-09-20 | 2012-03-29 | Nantero Inc. | Methods for purifying nanotube solutions |
CN103107315B (zh) | 2011-11-10 | 2016-03-30 | 北京有色金属研究总院 | 一种纳米硅碳复合材料及其制备方法 |
US9634251B2 (en) | 2012-02-27 | 2017-04-25 | Nantero Inc. | Nanotube solution treated with molecular additive, nanotube film having enhanced adhesion property, and methods for forming the nanotube solution and the nanotube film |
US9650732B2 (en) | 2013-05-01 | 2017-05-16 | Nantero Inc. | Low defect nanotube application solutions and fabrics and methods for making same |
JP5688780B2 (ja) * | 2013-05-07 | 2015-03-25 | 学校法人関西学院 | SiC基板、炭素供給フィード基板及び炭素ナノ材料付きSiC基板 |
US10654718B2 (en) | 2013-09-20 | 2020-05-19 | Nantero, Inc. | Scalable nanotube fabrics and methods for making same |
JP6530659B2 (ja) * | 2015-07-16 | 2019-06-12 | イビデン株式会社 | セラミック複合材およびその製造方法 |
US11820663B2 (en) | 2018-02-14 | 2023-11-21 | International Business Machines Corporation | Crystalline film of carbon nanotubes |
DE102019208024A1 (de) * | 2019-06-03 | 2020-12-03 | Robert Bosch Gmbh | Verfahren zur Herstellung einer Rückseite eines Leistungstransistors und Leistungstransistor |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02184511A (ja) * | 1989-01-10 | 1990-07-19 | Sumitomo Electric Ind Ltd | 多孔質グラファイトの製造方法 |
JPH0891818A (ja) * | 1994-09-16 | 1996-04-09 | Sumitomo Osaka Cement Co Ltd | 炭素クラスター含有硬質膜の製造方法 |
JPH09157022A (ja) * | 1995-12-08 | 1997-06-17 | Ekosu Giken:Kk | 黒鉛の製造方法およびリチウム二次電池 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5626650A (en) * | 1990-10-23 | 1997-05-06 | Catalytic Materials Limited | Process for separating components from gaseous streams |
JP2845675B2 (ja) | 1992-06-30 | 1999-01-13 | 日本電気株式会社 | カーボンナノチューブの製造方法 |
JP2546511B2 (ja) | 1993-08-26 | 1996-10-23 | 日本電気株式会社 | フラーレン及びカーボンナノチューブの合成方法 |
-
1997
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1998
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02184511A (ja) * | 1989-01-10 | 1990-07-19 | Sumitomo Electric Ind Ltd | 多孔質グラファイトの製造方法 |
JPH0891818A (ja) * | 1994-09-16 | 1996-04-09 | Sumitomo Osaka Cement Co Ltd | 炭素クラスター含有硬質膜の製造方法 |
JPH09157022A (ja) * | 1995-12-08 | 1997-06-17 | Ekosu Giken:Kk | 黒鉛の製造方法およびリチウム二次電池 |
Non-Patent Citations (3)
Title |
---|
KUSUNOKI M, ROKKAKU M, SUZUKI T: "EPITAXIAL CARBON NANOTUBE FILM SELF-ORGANIZED BY SUBLIMATION DECOMPOSITION OF SILICON CARBIDE", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 71, no. 18, 3 November 1997 (1997-11-03), US, pages 2620 - 2622, XP002917458, ISSN: 0003-6951, DOI: 10.1063/1.120158 * |
KUSUNOKI M: "HIGH TEMPERATURE OBSERVATION OF CERAMICS -TEM OBSERVATION OF THE FORMATION PROCESS FOR CARBON NANOTUBES AT HIGH TEMPERATURE-", JAPAN FINE CERAMICS CENTER REVIEW, FAIN SERAMIKKUSU SENTA, JP, 1 December 1997 (1997-12-01), JP, pages 242 - 247, XP002917459, ISSN: 0916-4553 * |
See also references of EP0947466A4 * |
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Also Published As
Publication number | Publication date |
---|---|
EP0947466A1 (en) | 1999-10-06 |
DE69802898D1 (de) | 2002-01-24 |
US6303094B1 (en) | 2001-10-16 |
DE69802898T2 (de) | 2002-08-01 |
EP0947466A4 (ja) | 1999-10-06 |
JP3183845B2 (ja) | 2001-07-09 |
JPH10265208A (ja) | 1998-10-06 |
EP0947466B1 (en) | 2001-12-12 |
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