TWI899006B - 含有次氯酸離子的半導體晶圓處理液 - Google Patents
含有次氯酸離子的半導體晶圓處理液Info
- Publication number
- TWI899006B TWI899006B TW114106215A TW114106215A TWI899006B TW I899006 B TWI899006 B TW I899006B TW 114106215 A TW114106215 A TW 114106215A TW 114106215 A TW114106215 A TW 114106215A TW I899006 B TWI899006 B TW I899006B
- Authority
- TW
- Taiwan
- Prior art keywords
- ions
- solution
- treatment solution
- hypochlorous acid
- cleaning
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/02—Inorganic compounds ; Elemental compounds
- C11D3/04—Water-soluble compounds
- C11D3/046—Salts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
- H10P70/27—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
- C11D17/0008—Detergent materials or soaps characterised by their shape or physical properties aqueous liquid non soap compositions
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
- C11D17/08—Liquid soap, e.g. for dispensers; capsuled
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/168—Organometallic compounds or orgometallic complexes
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/24—Organic compounds containing halogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/30—Amines; Substituted amines ; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/02—Inorganic compounds
- C11D7/04—Water-soluble compounds
- C11D7/10—Salts
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/28—Organic compounds containing halogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3209—Amines or imines with one to four nitrogen atoms; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/50—Solvents
- C11D7/5004—Organic solvents
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/60—Wet etching
- H10P50/66—Wet etching of conductive or resistive materials
- H10P50/663—Wet etching of conductive or resistive materials by chemical means only
- H10P50/667—Wet etching of conductive or resistive materials by chemical means only by liquid etching only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/50—Cleaning of wafers, substrates or parts of devices characterised by the part to be cleaned
- H10P70/54—Cleaning of wafer edges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/50—Cleaning of wafers, substrates or parts of devices characterised by the part to be cleaned
- H10P70/56—Cleaning of wafer backside
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Inorganic Chemistry (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
- Weting (AREA)
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018-005201 | 2018-01-16 | ||
| JP2018-005202 | 2018-01-16 | ||
| JP2018005201 | 2018-01-16 | ||
| JP2018005202 | 2018-01-16 | ||
| JP2018199949 | 2018-10-24 | ||
| JP2018-199949 | 2018-10-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202521677A TW202521677A (zh) | 2025-06-01 |
| TWI899006B true TWI899006B (zh) | 2025-09-21 |
Family
ID=67301793
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW114106215A TWI899006B (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
| TW108101608A TW201932588A (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
| TW112149234A TWI877955B (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
| TW110141481A TWI843026B (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW108101608A TW201932588A (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
| TW112149234A TWI877955B (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
| TW110141481A TWI843026B (zh) | 2018-01-16 | 2019-01-16 | 含有次氯酸離子的半導體晶圓處理液 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US11390829B2 (https=) |
| EP (1) | EP3726565A4 (https=) |
| JP (3) | JP6798045B2 (https=) |
| KR (2) | KR102766830B1 (https=) |
| CN (1) | CN111684570B (https=) |
| SG (1) | SG11202006733TA (https=) |
| TW (4) | TWI899006B (https=) |
| WO (1) | WO2019142788A1 (https=) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102766830B1 (ko) * | 2018-01-16 | 2025-02-14 | 가부시키가이샤 도쿠야마 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
| JP6982686B2 (ja) * | 2018-05-23 | 2021-12-17 | 株式会社トクヤマ | 次亜塩素酸第4級アルキルアンモニウム溶液の製造方法および半導体ウエハの処理方法 |
| JP7219061B2 (ja) | 2018-11-14 | 2023-02-07 | 関東化学株式会社 | ルテニウム除去用組成物 |
| WO2021060234A1 (ja) | 2019-09-27 | 2021-04-01 | 株式会社トクヤマ | RuO4ガスの発生抑制剤及びRuO4ガスの発生抑制方法 |
| CN120060857A (zh) | 2019-09-27 | 2025-05-30 | 株式会社德山 | 钌的半导体用处理液及其制造方法 |
| KR102769981B1 (ko) * | 2019-11-22 | 2025-02-18 | 가부시끼가이샤 도꾸야마 | 차아염소산 제 4 급 알킬암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 처리 방법 |
| TWI899164B (zh) | 2020-02-25 | 2025-10-01 | 日商德山股份有限公司 | 釕之半導體用處理液 |
| US12509632B2 (en) | 2020-03-31 | 2025-12-30 | Tokuyama Corporation | Treatment liquid for semiconductors and method for producing same |
| WO2022030627A1 (ja) | 2020-08-07 | 2022-02-10 | 株式会社トクヤマ | 半導体ウエハ用処理液 |
| JP7553577B2 (ja) * | 2020-09-03 | 2024-09-18 | 富士フイルム株式会社 | 組成物、基板の処理方法 |
| JP7819114B2 (ja) | 2020-11-26 | 2026-02-24 | 株式会社トクヤマ | 半導体ウェハの処理液及びその製造方法 |
| KR20230104741A (ko) | 2020-12-18 | 2023-07-10 | 가부시끼가이샤 도꾸야마 | 천이 금속의 반도체의 처리 방법, 및 천이 금속 산화물의 환원제 함유 처리액 |
| WO2022131186A1 (ja) * | 2020-12-18 | 2022-06-23 | 株式会社トクヤマ | 遷移金属の半導体の処理方法、および遷移金属酸化物の還元剤含有処理液 |
| KR20220136262A (ko) | 2021-03-31 | 2022-10-07 | 가부시끼가이샤 도꾸야마 | 반도체용 처리액 |
| TW202424172A (zh) | 2022-09-29 | 2024-06-16 | 日商德山股份有限公司 | 乾式蝕刻殘渣去除液 |
| KR102877889B1 (ko) * | 2022-10-03 | 2025-10-28 | 가부시끼가이샤 도꾸야마 | 반도체용 처리액 |
| WO2026004729A1 (ja) * | 2024-06-28 | 2026-01-02 | 株式会社トクヤマ | 半導体用基板の処理液 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102234597A (zh) * | 2010-04-26 | 2011-11-09 | 东友Fine-Chem股份有限公司 | 清洗组合物 |
| TW201641660A (zh) * | 2015-03-04 | 2016-12-01 | 日立化成股份有限公司 | Cmp用研磨液及使用其的研磨方法 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2517187C3 (de) | 1975-04-18 | 1980-11-13 | Aeg-Kanis Turbinenfabrik Gmbh, 8500 Nuernberg | Hydraulische Turbinendrehvorrichtung |
| JPS5523325U (https=) | 1978-07-28 | 1980-02-15 | ||
| IT1203814B (it) * | 1986-06-30 | 1989-02-23 | Fidia Farmaceutici | Esteri dell'acido alginico |
| JP3649771B2 (ja) * | 1995-05-15 | 2005-05-18 | 栗田工業株式会社 | 洗浄方法 |
| JP3619745B2 (ja) * | 1999-12-20 | 2005-02-16 | 株式会社日立製作所 | 固体表面の処理方法及び処理液並びにこれらを用いた電子デバイスの製造方法 |
| JP2001231373A (ja) | 2000-02-22 | 2001-08-28 | Gumma Prefecture | 植物の栽培方法及びその装置 |
| JP4510979B2 (ja) | 2000-02-23 | 2010-07-28 | ルネサスエレクトロニクス株式会社 | ルテニウム又は酸化ルテニウム除去液の使用方法、及びルテニウム又は酸化ルテニウムの除去方法 |
| JP3664967B2 (ja) | 2000-10-20 | 2005-06-29 | シャープ株式会社 | 半導体集積回路 |
| JP3585437B2 (ja) | 2000-11-22 | 2004-11-04 | 株式会社荏原製作所 | ルテニウム膜のエッチング方法 |
| JP2003119494A (ja) | 2001-10-05 | 2003-04-23 | Nec Corp | 洗浄組成物およびこれを用いた洗浄方法と洗浄装置 |
| TW200413522A (en) * | 2002-11-08 | 2004-08-01 | Sumitomo Chemical Co | Washing liquid for semiconductor substrate |
| JP2005101479A (ja) * | 2002-11-08 | 2005-04-14 | Sumitomo Chemical Co Ltd | 半導体基板用洗浄液 |
| JP4232002B2 (ja) * | 2003-01-16 | 2009-03-04 | 日本電気株式会社 | デバイス基板用の洗浄組成物及び該洗浄組成物を用いた洗浄方法並びに洗浄装置 |
| KR101056544B1 (ko) * | 2003-08-19 | 2011-08-11 | 아반토르 퍼포먼스 머티리얼스, 인크. | 마이크로전자 기판용 박리 및 세정 조성물 |
| SG150508A1 (en) | 2004-02-11 | 2009-03-30 | Mallinckrodt Baker Inc | Microelectronic cleaning composition containing halogen oxygen acids, salts and derivatives thereof |
| EP2128897B1 (en) | 2007-03-16 | 2015-05-06 | Fujitsu Limited | Silicon dielectric treating agent for use after etching, process for producing semiconductor device, and semiconductor device |
| JP2009081247A (ja) | 2007-09-26 | 2009-04-16 | Panasonic Corp | ルテニウム膜のエッチング方法 |
| TW200946621A (en) * | 2007-10-29 | 2009-11-16 | Ekc Technology Inc | Chemical mechanical polishing and wafer cleaning composition comprising amidoxime compounds and associated method for use |
| WO2009064745A1 (en) * | 2007-11-13 | 2009-05-22 | Sachem, Inc. | High negative zeta potential polyhedral silsesquioxane composition and method for damage free semiconductor wet clean |
| JP2009231354A (ja) | 2008-03-19 | 2009-10-08 | Fujifilm Corp | 半導体デバイス用洗浄液、および洗浄方法 |
| JP5086893B2 (ja) * | 2008-05-26 | 2012-11-28 | 花王株式会社 | 半導体デバイス用基板用の洗浄液 |
| JP5523325B2 (ja) | 2008-09-09 | 2014-06-18 | 昭和電工株式会社 | チタン系金属、タングステン系金属、チタンタングステン系金属またはそれらの窒化物のエッチング液 |
| EP2514855A1 (en) | 2009-12-17 | 2012-10-24 | Showa Denko K.K. | Composition for etching ruthenium-based metal and method for preparing same |
| US8211800B2 (en) * | 2010-08-23 | 2012-07-03 | Kabushiki Kaisha Toshiba | Ru cap metal post cleaning method and cleaning chemical |
| JP2013001620A (ja) * | 2011-06-20 | 2013-01-07 | Evatech Corp | 弱酸性次亜塩素酸、並びにその製造装置および製造方法 |
| JP2014062297A (ja) | 2012-09-20 | 2014-04-10 | Toshiba Corp | 処理装置、処理液の製造方法、および電子デバイスの製造方法 |
| KR102338550B1 (ko) * | 2013-06-06 | 2021-12-14 | 엔테그리스, 아이엔씨. | 질화 티타늄의 선택적인 에칭을 위한 조성물 및 방법 |
| WO2016042408A2 (en) * | 2014-09-17 | 2016-03-24 | Atmi Taiwan Co., Ltd. | Compositions for etching titanium nitride having compatability with silicon germanide and tungsten |
| CN106796878B (zh) * | 2014-11-13 | 2021-02-09 | 三菱瓦斯化学株式会社 | 抑制了包含钨的材料的损伤的半导体元件的清洗液、及使用其的半导体元件的清洗方法 |
| TWI816635B (zh) * | 2015-10-15 | 2023-10-01 | 日商三菱瓦斯化學股份有限公司 | 半導體元件之洗淨用液體組成物、半導體元件之洗淨方法及半導體元件之製造方法 |
| KR102111307B1 (ko) | 2016-06-02 | 2020-05-15 | 후지필름 가부시키가이샤 | 처리액, 기판의 세정 방법 및 레지스트의 제거 방법 |
| KR102766830B1 (ko) * | 2018-01-16 | 2025-02-14 | 가부시키가이샤 도쿠야마 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
| WO2020049955A1 (ja) * | 2018-09-06 | 2020-03-12 | 富士フイルム株式会社 | 薬液、基板の処理方法 |
| KR102521227B1 (ko) * | 2018-09-12 | 2023-04-13 | 후지필름 가부시키가이샤 | 약액, 기판의 처리 방법 |
| US11898081B2 (en) * | 2019-11-21 | 2024-02-13 | Tokyo Ohka Kogyo Co., Ltd. | Ruthenium-etching solution, method for manufacturing ruthenium-etching solution, method for processing object to be processed, and method for manufacturing ruthenium-containing wiring |
| KR102769981B1 (ko) * | 2019-11-22 | 2025-02-18 | 가부시끼가이샤 도꾸야마 | 차아염소산 제 4 급 알킬암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 처리 방법 |
-
2019
- 2019-01-15 KR KR1020207020591A patent/KR102766830B1/ko active Active
- 2019-01-15 EP EP19741609.2A patent/EP3726565A4/en active Pending
- 2019-01-15 CN CN201980008715.2A patent/CN111684570B/zh active Active
- 2019-01-15 WO PCT/JP2019/000938 patent/WO2019142788A1/ja not_active Ceased
- 2019-01-15 JP JP2019566470A patent/JP6798045B2/ja active Active
- 2019-01-15 US US16/962,260 patent/US11390829B2/en active Active
- 2019-01-15 SG SG11202006733TA patent/SG11202006733TA/en unknown
- 2019-01-15 KR KR1020257003365A patent/KR20250022896A/ko active Pending
- 2019-01-16 TW TW114106215A patent/TWI899006B/zh active
- 2019-01-16 TW TW108101608A patent/TW201932588A/zh unknown
- 2019-01-16 TW TW112149234A patent/TWI877955B/zh active
- 2019-01-16 TW TW110141481A patent/TWI843026B/zh active
-
2020
- 2020-11-18 JP JP2020191395A patent/JP7311477B2/ja active Active
-
2023
- 2023-07-06 JP JP2023111596A patent/JP7590504B2/ja active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102234597A (zh) * | 2010-04-26 | 2011-11-09 | 东友Fine-Chem股份有限公司 | 清洗组合物 |
| TW201641660A (zh) * | 2015-03-04 | 2016-12-01 | 日立化成股份有限公司 | Cmp用研磨液及使用其的研磨方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202210663A (zh) | 2022-03-16 |
| JP7590504B2 (ja) | 2024-11-26 |
| TWI877955B (zh) | 2025-03-21 |
| JP7311477B2 (ja) | 2023-07-19 |
| TW201932588A (zh) | 2019-08-16 |
| TW202417601A (zh) | 2024-05-01 |
| KR20250022896A (ko) | 2025-02-17 |
| TW202521677A (zh) | 2025-06-01 |
| US20210062115A1 (en) | 2021-03-04 |
| EP3726565A4 (en) | 2021-10-13 |
| WO2019142788A1 (ja) | 2019-07-25 |
| TWI843026B (zh) | 2024-05-21 |
| US11390829B2 (en) | 2022-07-19 |
| CN111684570A (zh) | 2020-09-18 |
| US20220325205A1 (en) | 2022-10-13 |
| JP2023126320A (ja) | 2023-09-07 |
| SG11202006733TA (en) | 2020-08-28 |
| CN111684570B (zh) | 2024-02-27 |
| JP6798045B2 (ja) | 2020-12-09 |
| JP2021040151A (ja) | 2021-03-11 |
| JPWO2019142788A1 (ja) | 2020-11-19 |
| KR20200110335A (ko) | 2020-09-23 |
| EP3726565A1 (en) | 2020-10-21 |
| KR102766830B1 (ko) | 2025-02-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI899006B (zh) | 含有次氯酸離子的半導體晶圓處理液 | |
| EP3926662B1 (en) | Onium salt-containing processing solution for semiconductor wafers | |
| JP7735233B2 (ja) | 半導体ウエハ用処理液 | |
| TWI678601B (zh) | 可抑制含鎢材料之損壞的半導體元件之清洗液及利用該清洗液的半導體元件之清洗方法 | |
| JP5037442B2 (ja) | 窒化チタン除去液、窒化チタン被膜の除去方法、及び窒化チタン除去液の製造方法 | |
| TW202124694A (zh) | 次氯酸四級烷基銨溶液、其製造方法及半導體晶圓的處理方法 | |
| EP3926663A1 (en) | Semiconductor wafer treatment liquid containing hypochlorite ions and ph buffer | |
| CN1549798A (zh) | 含有多成分的玻璃基板用的微细加工表面处理液 | |
| TW201622030A (zh) | 可抑制含鉭材料之損壞的半導體元件之清洗液及利用該清洗液的半導體元件之清洗方法 | |
| CN100463117C (zh) | 半导体元件清洗用组合物、半导体元件及其制造方法 | |
| CN116235282A (zh) | 半导体基板清洗用组合物和清洗方法 | |
| US12612580B2 (en) | Treatment liquid for semiconductor wafers, which contains hypochlorite ions | |
| CN114540816A (zh) | 一种厚铜蚀刻组合物及其应用 | |
| WO2024004980A1 (ja) | 半導体基板洗浄用組成物、半導体基板の洗浄方法、及び半導体基板の製造方法 |