TWI755728B - 校準系統及方法 - Google Patents

校準系統及方法 Download PDF

Info

Publication number
TWI755728B
TWI755728B TW109115447A TW109115447A TWI755728B TW I755728 B TWI755728 B TW I755728B TW 109115447 A TW109115447 A TW 109115447A TW 109115447 A TW109115447 A TW 109115447A TW I755728 B TWI755728 B TW I755728B
Authority
TW
Taiwan
Prior art keywords
calibration
electronic device
periodic waveform
control circuit
input
Prior art date
Application number
TW109115447A
Other languages
English (en)
Chinese (zh)
Other versions
TW202111347A (zh
Inventor
提摩西 Ｓ 密爾斯
丹尼爾 Ｇ 格鲁伯
馬克 Ａ 霸特斯
肯尼斯 Ｊ 史威華
Original Assignee
美商西屋電器公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商西屋電器公司 filed Critical 美商西屋電器公司
Publication of TW202111347A publication Critical patent/TW202111347A/zh
Application granted granted Critical
Publication of TWI755728B publication Critical patent/TWI755728B/zh

Links

Images

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Analogue/Digital Conversion (AREA)
  • Programmable Controllers (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing And Monitoring For Control Systems (AREA)
TW109115447A 2019-05-10 2020-05-08 校準系統及方法 TWI755728B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962845980P 2019-05-10 2019-05-10
US62/845,980 2019-05-10

Publications (2)

Publication Number Publication Date
TW202111347A TW202111347A (zh) 2021-03-16
TWI755728B true TWI755728B (zh) 2022-02-21

Family

ID=70779982

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109115447A TWI755728B (zh) 2019-05-10 2020-05-08 校準系統及方法

Country Status (14)

Country Link
US (1) US12013435B2 (enExample)
EP (1) EP3966585B1 (enExample)
JP (1) JP7661239B2 (enExample)
KR (1) KR102870209B1 (enExample)
CN (1) CN114008550B (enExample)
BR (1) BR112021022496A2 (enExample)
CA (1) CA3139887A1 (enExample)
ES (1) ES3006258T3 (enExample)
FI (1) FI3966585T3 (enExample)
PL (1) PL3966585T4 (enExample)
SI (1) SI3966585T1 (enExample)
TW (1) TWI755728B (enExample)
UA (1) UA129058C2 (enExample)
WO (1) WO2020231717A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES3006258T3 (en) 2019-05-10 2025-03-18 Westinghouse Electric Co Llc Calibration system and method
TWI832409B (zh) * 2022-09-02 2024-02-11 廣達電腦股份有限公司 用於校正電池相對電荷狀態的電子裝置及其方法

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200305027A (en) * 2001-07-05 2003-10-16 Intellitech Corp Method and apparatus for optimized parallel testing and access of electronic circuits
TW200813449A (en) * 2006-06-30 2008-03-16 Teradyne Inc Calibration device
US20080109504A1 (en) * 2006-09-29 2008-05-08 Teradyne, Inc. Low cost, high purity sign wave generator
TW201128498A (en) * 2010-02-04 2011-08-16 Chunghwa Picture Tubes Ltd Touch panel sensing circuit
US20120239108A1 (en) * 2010-11-03 2012-09-20 The Cleveland Clinic Foundation Apparatus for energy efficient stimulation
US20140097976A1 (en) * 2012-10-05 2014-04-10 Infineon Technologies Ag Signal generating circuit
US8756029B2 (en) * 2011-01-21 2014-06-17 Schneider Electric USA, Inc. Non-linearity calibration using an internal source in an intelligent electronic device
US20150341158A1 (en) * 2014-05-23 2015-11-26 Mediatek Inc. Loop gain calibration apparatus for controlling loop gain of timing recovery loop and related loop gain calibration method
US20160072491A1 (en) * 2014-09-08 2016-03-10 QUALCOMM Incorporared Automatic calibration circuits for operational calibration of critical-path time delays in adaptive clock distribution systems, and related methods and systems
TW201719187A (zh) * 2015-11-20 2017-06-01 泰瑞達公司 用於自動測試設備之校準裝置

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4581585A (en) * 1983-02-07 1986-04-08 Tektronix, Inc. Apparatus and method for automatically calibrating a sweep waveform generator
JPH0310419A (ja) * 1989-06-07 1991-01-18 Fujitsu Ltd 周波数特性補正方式
US5412481A (en) * 1992-02-24 1995-05-02 Samsung Electronics Co., Ltd. Time-base correction in a video recording/playback system
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters
US7348914B1 (en) * 2006-06-29 2008-03-25 Lattice Semiconductor Corporation Method and systems to align outputs signals of an analog-to-digital converter
JP2008295016A (ja) * 2007-04-25 2008-12-04 Yokogawa Electric Corp Ａｄ変換器の校正システム
EP2081285A2 (en) * 2008-01-18 2009-07-22 Power Integrations, Inc. Cascaded PFC and resonant mode power converters
US8102289B2 (en) * 2009-02-19 2012-01-24 Hitachi, Ltd. Analog/digital converter and semiconductor integrated circuit device
US20110268239A1 (en) * 2010-04-30 2011-11-03 David Jerome Krieg Method of calibrating excore detectors in a nuclear reactor
JP5785611B2 (ja) * 2010-05-17 2015-09-30 コーニンクレッカ フィリップス エヌ ヴェ 不適当な調光器動作を検出し修正するための方法及び装置
US8437974B2 (en) * 2010-10-08 2013-05-07 Westinghouse Electric Company Llc Calibration detection system and method
US9270291B1 (en) * 2015-01-13 2016-02-23 Broadcom Corporation High speed time-interleaved ADC gain offset and skew mitigation
CN104808056B (zh) * 2015-04-19 2018-12-11 华南理工大学 一种基于比较器转换的频率特性测试方法与装置
CN106300576B (zh) * 2015-05-11 2021-04-20 恩智浦美国有限公司 用于无线充电系统的双向通信解调方法
US10056914B2 (en) * 2015-12-18 2018-08-21 Analog Devices Global Frequency-domain ADC flash calibration
US9667407B1 (en) 2016-05-13 2017-05-30 Credo Technology Group Limited Integrated multi-channel receiver having independent clock recovery modules with enhanced inductors
US10502807B2 (en) 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices
CN107861089A (zh) * 2017-09-26 2018-03-30 国网江西省电力公司电力科学研究院 一种适应于特殊运行工况的智能电能表测试方法
ES3006258T3 (en) 2019-05-10 2025-03-18 Westinghouse Electric Co Llc Calibration system and method

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200305027A (en) * 2001-07-05 2003-10-16 Intellitech Corp Method and apparatus for optimized parallel testing and access of electronic circuits
TW200813449A (en) * 2006-06-30 2008-03-16 Teradyne Inc Calibration device
US20080109504A1 (en) * 2006-09-29 2008-05-08 Teradyne, Inc. Low cost, high purity sign wave generator
TW201128498A (en) * 2010-02-04 2011-08-16 Chunghwa Picture Tubes Ltd Touch panel sensing circuit
US20120239108A1 (en) * 2010-11-03 2012-09-20 The Cleveland Clinic Foundation Apparatus for energy efficient stimulation
US8756029B2 (en) * 2011-01-21 2014-06-17 Schneider Electric USA, Inc. Non-linearity calibration using an internal source in an intelligent electronic device
US20140097976A1 (en) * 2012-10-05 2014-04-10 Infineon Technologies Ag Signal generating circuit
US20150341158A1 (en) * 2014-05-23 2015-11-26 Mediatek Inc. Loop gain calibration apparatus for controlling loop gain of timing recovery loop and related loop gain calibration method
US20160072491A1 (en) * 2014-09-08 2016-03-10 QUALCOMM Incorporared Automatic calibration circuits for operational calibration of critical-path time delays in adaptive clock distribution systems, and related methods and systems
TW201719187A (zh) * 2015-11-20 2017-06-01 泰瑞達公司 用於自動測試設備之校準裝置

Also Published As

Publication number Publication date
FI3966585T3 (fi) 2025-01-03
BR112021022496A2 (pt) 2022-01-11
WO2020231717A1 (en) 2020-11-19
SI3966585T1 (sl) 2025-04-30
US20220229111A1 (en) 2022-07-21
PL3966585T3 (pl) 2025-06-09
JP2022533576A (ja) 2022-07-25
CA3139887A1 (en) 2020-11-19
PL3966585T4 (pl) 2026-03-02
KR20220007639A (ko) 2022-01-18
ES3006258T3 (en) 2025-03-18
JP7661239B2 (ja) 2025-04-14
KR102870209B1 (ko) 2025-10-14
UA129058C2 (uk) 2025-01-01
CN114008550B (zh) 2025-03-14
EP3966585B1 (en) 2024-10-02
US12013435B2 (en) 2024-06-18
CN114008550A (zh) 2022-02-01
EP3966585A1 (en) 2022-03-16
TW202111347A (zh) 2021-03-16

Similar Documents

Publication Publication Date Title
JP6204504B2 (ja) Ｒｆ計測学によるｒｆパルスの同期、処理、および制御
TWI755728B (zh) 校準系統及方法
JP6235505B2 (ja) 自動調整機能を有するエンコーダの信号処理装置
EP3596429B1 (en) Interface devices for use with measurement probes with enhanced functionality
CN106383371B (zh) 金属检测机自检控制方法
US9003256B2 (en) System and method for testing integrated circuits by determining the solid timing window
KR102696240B1 (ko) 자체-테스팅 측정 시스템 및 자체-테스팅 측정 시스템을 작동시키기 위한 방법
CN110880933B (zh) 具有一半步级解析度的片载校正电路及方法
RU2814611C2 (ru) Способ и система калибровки
CN114415094B (zh) 触发电平的校准方法、信号测量方法及装置
KR101549845B1 (ko) 전기장 프로브 모듈의 캘리브레이션 시스템 및 그 시스템을 이용한 캘리브레이션 방법
CN117388785A (zh) 一种电压采集装置校准方法及系统
KR20150047280A (ko) 자기학습 알고리즘을 이용한 adc(analog digital converter) 보정 장치 및 그 방법
JP6395874B2 (ja) ジャイロセンサーの駆動振幅を校正する方法とシステム
TWI679399B (zh) 晶片內建曲率校正架構及其方法
CN120686177B (zh) 校准方法、待校准设备、校准装置、校准系统及存储介质
KR100899998B1 (ko) 아날로그 입출력 카드의 캘리브레이션 방법
JP4502448B2 (ja) Ｉｃ試験装置における電圧発生器の校正方法・電圧発生器の校正装置
JP6364909B2 (ja) Ｒｄコンバータおよびｒｄコンバータの補正方法
JP7202989B2 (ja) センサ保守システム、情報処理装置、および、プログラム
RU2358245C1 (ru) Способ и устройство измерения температуры
CN116990582A (zh) Shorting Bar的输出电压校准方法和设备、存储介质
JP6771322B2 (ja) 異常検出装置
KR20150080452A (ko) 전기장 프로브 모듈의 캘리브레이션 시스템 및 그 시스템을 이용한 캘리브레이션 방법
RU2014110003A (ru) Диагностика тока двухпроводного контура управления процессом