JP7661239B2 - 較正システム、電子装置、及び、較正検証方法 - Google Patents

較正システム、電子装置、及び、較正検証方法 Download PDF

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Publication number
JP7661239B2
JP7661239B2 JP2021566599A JP2021566599A JP7661239B2 JP 7661239 B2 JP7661239 B2 JP 7661239B2 JP 2021566599 A JP2021566599 A JP 2021566599A JP 2021566599 A JP2021566599 A JP 2021566599A JP 7661239 B2 JP7661239 B2 JP 7661239B2
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Prior art keywords
calibration
electronic device
periodic waveform
input
analog
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Japanese (ja)
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JP2022533576A5 (enExample
JP2022533576A (ja
Inventor
エス． メイヤーズ ティモシー
ジー． グルーバー ダニエル
エー． バーテルズ マーク
ジェイ． スウィダ ケネス
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Westinghouse Electric Co LLC
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Westinghouse Electric Co LLC
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Analogue/Digital Conversion (AREA)
  • Programmable Controllers (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2021566599A 2019-05-10 2020-05-07 較正システム、電子装置、及び、較正検証方法 Active JP7661239B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962845980P 2019-05-10 2019-05-10
US62/845,980 2019-05-10
PCT/US2020/031758 WO2020231717A1 (en) 2019-05-10 2020-05-07 Calibration system and method

Publications (3)

Publication Number Publication Date
JP2022533576A JP2022533576A (ja) 2022-07-25
JP2022533576A5 JP2022533576A5 (enExample) 2023-05-15
JP7661239B2 true JP7661239B2 (ja) 2025-04-14

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JP2021566599A Active JP7661239B2 (ja) 2019-05-10 2020-05-07 較正システム、電子装置、及び、較正検証方法

Country Status (14)

Country Link
US (1) US12013435B2 (enExample)
EP (1) EP3966585B1 (enExample)
JP (1) JP7661239B2 (enExample)
KR (1) KR102870209B1 (enExample)
CN (1) CN114008550B (enExample)
BR (1) BR112021022496A2 (enExample)
CA (1) CA3139887A1 (enExample)
ES (1) ES3006258T3 (enExample)
FI (1) FI3966585T3 (enExample)
PL (1) PL3966585T4 (enExample)
SI (1) SI3966585T1 (enExample)
TW (1) TWI755728B (enExample)
UA (1) UA129058C2 (enExample)
WO (1) WO2020231717A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES3006258T3 (en) 2019-05-10 2025-03-18 Westinghouse Electric Co Llc Calibration system and method
TWI832409B (zh) * 2022-09-02 2024-02-11 廣達電腦股份有限公司 用於校正電池相對電荷狀態的電子裝置及其方法

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JP2008295016A (ja) 2007-04-25 2008-12-04 Yokogawa Electric Corp Ａｄ変換器の校正システム
WO2010095232A1 (ja) 2009-02-19 2010-08-26 株式会社日立製作所 アナログデジタル変換器および半導体集積回路装置

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JPH0310419A (ja) * 1989-06-07 1991-01-18 Fujitsu Ltd 周波数特性補正方式
US5412481A (en) * 1992-02-24 1995-05-02 Samsung Electronics Co., Ltd. Time-base correction in a video recording/playback system
US6988232B2 (en) * 2001-07-05 2006-01-17 Intellitech Corporation Method and apparatus for optimized parallel testing and access of electronic circuits
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters
US7348914B1 (en) * 2006-06-29 2008-03-25 Lattice Semiconductor Corporation Method and systems to align outputs signals of an analog-to-digital converter
CN101484819B (zh) * 2006-06-30 2012-05-09 泰瑞达公司 自动测试装置及与其配套使用的校准设备和校准方法
US7933942B2 (en) * 2006-09-29 2011-04-26 Teradyne, Inc. Low cost, high purity sign wave generator
EP2081285A2 (en) * 2008-01-18 2009-07-22 Power Integrations, Inc. Cascaded PFC and resonant mode power converters
TWI409683B (zh) * 2010-02-04 2013-09-21 Chunghwa Picture Tubes Ltd 觸控面板偵測電路
US20110268239A1 (en) * 2010-04-30 2011-11-03 David Jerome Krieg Method of calibrating excore detectors in a nuclear reactor
JP5785611B2 (ja) * 2010-05-17 2015-09-30 コーニンクレッカ フィリップス エヌ ヴェ 不適当な調光器動作を検出し修正するための方法及び装置
US8437974B2 (en) * 2010-10-08 2013-05-07 Westinghouse Electric Company Llc Calibration detection system and method
US9014813B2 (en) * 2010-11-03 2015-04-21 Cleveland Clinic Foundation Apparatus for energy efficient stimulation
US8756029B2 (en) 2011-01-21 2014-06-17 Schneider Electric USA, Inc. Non-linearity calibration using an internal source in an intelligent electronic device
DE102013220157B4 (de) 2012-10-05 2017-05-24 Infineon Technologies Ag Signalerzeugungsschaltung
US20150341158A1 (en) 2014-05-23 2015-11-26 Mediatek Inc. Loop gain calibration apparatus for controlling loop gain of timing recovery loop and related loop gain calibration method
US9413344B2 (en) 2014-09-08 2016-08-09 Qualcomm Incorporated Automatic calibration circuits for operational calibration of critical-path time delays in adaptive clock distribution systems, and related methods and systems
US9270291B1 (en) * 2015-01-13 2016-02-23 Broadcom Corporation High speed time-interleaved ADC gain offset and skew mitigation
CN104808056B (zh) * 2015-04-19 2018-12-11 华南理工大学 一种基于比较器转换的频率特性测试方法与装置
CN106300576B (zh) * 2015-05-11 2021-04-20 恩智浦美国有限公司 用于无线充电系统的双向通信解调方法
US10345418B2 (en) * 2015-11-20 2019-07-09 Teradyne, Inc. Calibration device for automatic test equipment
US10056914B2 (en) * 2015-12-18 2018-08-21 Analog Devices Global Frequency-domain ADC flash calibration
US9667407B1 (en) 2016-05-13 2017-05-30 Credo Technology Group Limited Integrated multi-channel receiver having independent clock recovery modules with enhanced inductors
US10502807B2 (en) 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices
CN107861089A (zh) * 2017-09-26 2018-03-30 国网江西省电力公司电力科学研究院 一种适应于特殊运行工况的智能电能表测试方法
ES3006258T3 (en) 2019-05-10 2025-03-18 Westinghouse Electric Co Llc Calibration system and method

Patent Citations (2)

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Publication number Priority date Publication date Assignee Title
JP2008295016A (ja) 2007-04-25 2008-12-04 Yokogawa Electric Corp Ａｄ変換器の校正システム
WO2010095232A1 (ja) 2009-02-19 2010-08-26 株式会社日立製作所 アナログデジタル変換器および半導体集積回路装置

Also Published As

Publication number Publication date
FI3966585T3 (fi) 2025-01-03
BR112021022496A2 (pt) 2022-01-11
WO2020231717A1 (en) 2020-11-19
TWI755728B (zh) 2022-02-21
SI3966585T1 (sl) 2025-04-30
US20220229111A1 (en) 2022-07-21
PL3966585T3 (pl) 2025-06-09
JP2022533576A (ja) 2022-07-25
CA3139887A1 (en) 2020-11-19
PL3966585T4 (pl) 2026-03-02
KR20220007639A (ko) 2022-01-18
ES3006258T3 (en) 2025-03-18
KR102870209B1 (ko) 2025-10-14
UA129058C2 (uk) 2025-01-01
CN114008550B (zh) 2025-03-14
EP3966585B1 (en) 2024-10-02
US12013435B2 (en) 2024-06-18
CN114008550A (zh) 2022-02-01
EP3966585A1 (en) 2022-03-16
TW202111347A (zh) 2021-03-16

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