JP2022533576A5 - - Google Patents
Info
- Publication number
- JP2022533576A5 JP2022533576A5 JP2021566599A JP2021566599A JP2022533576A5 JP 2022533576 A5 JP2022533576 A5 JP 2022533576A5 JP 2021566599 A JP2021566599 A JP 2021566599A JP 2021566599 A JP2021566599 A JP 2021566599A JP 2022533576 A5 JP2022533576 A5 JP 2022533576A5
- Authority
- JP
- Japan
- Prior art keywords
- electronic device
- periodic waveform
- input
- calibration system
- voltage level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962845980P | 2019-05-10 | 2019-05-10 | |
| US62/845,980 | 2019-05-10 | ||
| PCT/US2020/031758 WO2020231717A1 (en) | 2019-05-10 | 2020-05-07 | Calibration system and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2022533576A JP2022533576A (ja) | 2022-07-25 |
| JP2022533576A5 true JP2022533576A5 (enExample) | 2023-05-15 |
| JP7661239B2 JP7661239B2 (ja) | 2025-04-14 |
Family
ID=70779982
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021566599A Active JP7661239B2 (ja) | 2019-05-10 | 2020-05-07 | 較正システム、電子装置、及び、較正検証方法 |
Country Status (14)
| Country | Link |
|---|---|
| US (1) | US12013435B2 (enExample) |
| EP (1) | EP3966585B1 (enExample) |
| JP (1) | JP7661239B2 (enExample) |
| KR (1) | KR102870209B1 (enExample) |
| CN (1) | CN114008550B (enExample) |
| BR (1) | BR112021022496A2 (enExample) |
| CA (1) | CA3139887A1 (enExample) |
| ES (1) | ES3006258T3 (enExample) |
| FI (1) | FI3966585T3 (enExample) |
| PL (1) | PL3966585T4 (enExample) |
| SI (1) | SI3966585T1 (enExample) |
| TW (1) | TWI755728B (enExample) |
| UA (1) | UA129058C2 (enExample) |
| WO (1) | WO2020231717A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ES3006258T3 (en) | 2019-05-10 | 2025-03-18 | Westinghouse Electric Co Llc | Calibration system and method |
| TWI832409B (zh) * | 2022-09-02 | 2024-02-11 | 廣達電腦股份有限公司 | 用於校正電池相對電荷狀態的電子裝置及其方法 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4581585A (en) * | 1983-02-07 | 1986-04-08 | Tektronix, Inc. | Apparatus and method for automatically calibrating a sweep waveform generator |
| JPH0310419A (ja) * | 1989-06-07 | 1991-01-18 | Fujitsu Ltd | 周波数特性補正方式 |
| US5412481A (en) * | 1992-02-24 | 1995-05-02 | Samsung Electronics Co., Ltd. | Time-base correction in a video recording/playback system |
| US6988232B2 (en) * | 2001-07-05 | 2006-01-17 | Intellitech Corporation | Method and apparatus for optimized parallel testing and access of electronic circuits |
| US7148828B2 (en) * | 2005-05-03 | 2006-12-12 | Agilent Technologies, Inc. | System and method for timing calibration of time-interleaved data converters |
| US7348914B1 (en) * | 2006-06-29 | 2008-03-25 | Lattice Semiconductor Corporation | Method and systems to align outputs signals of an analog-to-digital converter |
| CN101484819B (zh) * | 2006-06-30 | 2012-05-09 | 泰瑞达公司 | 自动测试装置及与其配套使用的校准设备和校准方法 |
| US7933942B2 (en) * | 2006-09-29 | 2011-04-26 | Teradyne, Inc. | Low cost, high purity sign wave generator |
| JP2008295016A (ja) * | 2007-04-25 | 2008-12-04 | Yokogawa Electric Corp | Ａｄ変換器の校正システム |
| EP2081285A2 (en) * | 2008-01-18 | 2009-07-22 | Power Integrations, Inc. | Cascaded PFC and resonant mode power converters |
| US8102289B2 (en) * | 2009-02-19 | 2012-01-24 | Hitachi, Ltd. | Analog/digital converter and semiconductor integrated circuit device |
| TWI409683B (zh) * | 2010-02-04 | 2013-09-21 | Chunghwa Picture Tubes Ltd | 觸控面板偵測電路 |
| US20110268239A1 (en) * | 2010-04-30 | 2011-11-03 | David Jerome Krieg | Method of calibrating excore detectors in a nuclear reactor |
| JP5785611B2 (ja) * | 2010-05-17 | 2015-09-30 | コーニンクレッカ フィリップス エヌ ヴェ | 不適当な調光器動作を検出し修正するための方法及び装置 |
| US8437974B2 (en) * | 2010-10-08 | 2013-05-07 | Westinghouse Electric Company Llc | Calibration detection system and method |
| US9014813B2 (en) * | 2010-11-03 | 2015-04-21 | Cleveland Clinic Foundation | Apparatus for energy efficient stimulation |
| US8756029B2 (en) | 2011-01-21 | 2014-06-17 | Schneider Electric USA, Inc. | Non-linearity calibration using an internal source in an intelligent electronic device |
| DE102013220157B4 (de) | 2012-10-05 | 2017-05-24 | Infineon Technologies Ag | Signalerzeugungsschaltung |
| US20150341158A1 (en) | 2014-05-23 | 2015-11-26 | Mediatek Inc. | Loop gain calibration apparatus for controlling loop gain of timing recovery loop and related loop gain calibration method |
| US9413344B2 (en) | 2014-09-08 | 2016-08-09 | Qualcomm Incorporated | Automatic calibration circuits for operational calibration of critical-path time delays in adaptive clock distribution systems, and related methods and systems |
| US9270291B1 (en) * | 2015-01-13 | 2016-02-23 | Broadcom Corporation | High speed time-interleaved ADC gain offset and skew mitigation |
| CN104808056B (zh) * | 2015-04-19 | 2018-12-11 | 华南理工大学 | 一种基于比较器转换的频率特性测试方法与装置 |
| CN106300576B (zh) * | 2015-05-11 | 2021-04-20 | 恩智浦美国有限公司 | 用于无线充电系统的双向通信解调方法 |
| US10345418B2 (en) * | 2015-11-20 | 2019-07-09 | Teradyne, Inc. | Calibration device for automatic test equipment |
| US10056914B2 (en) * | 2015-12-18 | 2018-08-21 | Analog Devices Global | Frequency-domain ADC flash calibration |
| US9667407B1 (en) | 2016-05-13 | 2017-05-30 | Credo Technology Group Limited | Integrated multi-channel receiver having independent clock recovery modules with enhanced inductors |
| US10502807B2 (en) | 2017-09-05 | 2019-12-10 | Fluke Corporation | Calibration system for voltage measurement devices |
| CN107861089A (zh) * | 2017-09-26 | 2018-03-30 | 国网江西省电力公司电力科学研究院 | 一种适应于特殊运行工况的智能电能表测试方法 |
| ES3006258T3 (en) | 2019-05-10 | 2025-03-18 | Westinghouse Electric Co Llc | Calibration system and method |
-
2020
- 2020-05-07 ES ES20727551T patent/ES3006258T3/es active Active
- 2020-05-07 BR BR112021022496A patent/BR112021022496A2/pt not_active Application Discontinuation
- 2020-05-07 CN CN202080042778.2A patent/CN114008550B/zh active Active
- 2020-05-07 PL PL20727551.2T patent/PL3966585T4/pl unknown
- 2020-05-07 UA UAA202107061A patent/UA129058C2/uk unknown
- 2020-05-07 SI SI202030555T patent/SI3966585T1/sl unknown
- 2020-05-07 EP EP20727551.2A patent/EP3966585B1/en active Active
- 2020-05-07 JP JP2021566599A patent/JP7661239B2/ja active Active
- 2020-05-07 CA CA3139887A patent/CA3139887A1/en active Pending
- 2020-05-07 FI FIEP20727551.2T patent/FI3966585T3/fi active
- 2020-05-07 KR KR1020217040068A patent/KR102870209B1/ko active Active
- 2020-05-07 WO PCT/US2020/031758 patent/WO2020231717A1/en not_active Ceased
- 2020-05-07 US US17/595,118 patent/US12013435B2/en active Active
- 2020-05-08 TW TW109115447A patent/TWI755728B/zh active
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