CN114008550B - 校准系统和方法 - Google Patents

校准系统和方法 Download PDF

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Publication number
CN114008550B
CN114008550B CN202080042778.2A CN202080042778A CN114008550B CN 114008550 B CN114008550 B CN 114008550B CN 202080042778 A CN202080042778 A CN 202080042778A CN 114008550 B CN114008550 B CN 114008550B
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CN
China
Prior art keywords
calibration
electronic device
periodic waveform
input
control circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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CN202080042778.2A
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English (en)
Chinese (zh)
Other versions
CN114008550A (zh
Inventor
蒂莫西·S.·迈尔斯
丹尼尔·G.·格鲁伯
马克·A.·巴特尔斯
肯尼斯·J.·斯威德瓦
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Westinghouse Electric Co LLC
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Westinghouse Electric Co LLC
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Publication date
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Publication of CN114008550A publication Critical patent/CN114008550A/zh
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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Analogue/Digital Conversion (AREA)
  • Programmable Controllers (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing And Monitoring For Control Systems (AREA)
CN202080042778.2A 2019-05-10 2020-05-07 校准系统和方法 Active CN114008550B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962845980P 2019-05-10 2019-05-10
US62/845,980 2019-05-10
PCT/US2020/031758 WO2020231717A1 (en) 2019-05-10 2020-05-07 Calibration system and method

Publications (2)

Publication Number Publication Date
CN114008550A CN114008550A (zh) 2022-02-01
CN114008550B true CN114008550B (zh) 2025-03-14

Family

ID=70779982

Family Applications (1)

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CN202080042778.2A Active CN114008550B (zh) 2019-05-10 2020-05-07 校准系统和方法

Country Status (14)

Country Link
US (1) US12013435B2 (enExample)
EP (1) EP3966585B1 (enExample)
JP (1) JP7661239B2 (enExample)
KR (1) KR102870209B1 (enExample)
CN (1) CN114008550B (enExample)
BR (1) BR112021022496A2 (enExample)
CA (1) CA3139887A1 (enExample)
ES (1) ES3006258T3 (enExample)
FI (1) FI3966585T3 (enExample)
PL (1) PL3966585T4 (enExample)
SI (1) SI3966585T1 (enExample)
TW (1) TWI755728B (enExample)
UA (1) UA129058C2 (enExample)
WO (1) WO2020231717A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES3006258T3 (en) 2019-05-10 2025-03-18 Westinghouse Electric Co Llc Calibration system and method
TWI832409B (zh) * 2022-09-02 2024-02-11 廣達電腦股份有限公司 用於校正電池相對電荷狀態的電子裝置及其方法

Citations (1)

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CN105119704A (zh) * 2014-05-23 2015-12-02 联发科技股份有限公司 回路增益校正装置及方法

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US5412481A (en) * 1992-02-24 1995-05-02 Samsung Electronics Co., Ltd. Time-base correction in a video recording/playback system
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US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters
US7348914B1 (en) * 2006-06-29 2008-03-25 Lattice Semiconductor Corporation Method and systems to align outputs signals of an analog-to-digital converter
CN101484819B (zh) * 2006-06-30 2012-05-09 泰瑞达公司 自动测试装置及与其配套使用的校准设备和校准方法
US7933942B2 (en) * 2006-09-29 2011-04-26 Teradyne, Inc. Low cost, high purity sign wave generator
JP2008295016A (ja) * 2007-04-25 2008-12-04 Yokogawa Electric Corp Ａｄ変換器の校正システム
EP2081285A2 (en) * 2008-01-18 2009-07-22 Power Integrations, Inc. Cascaded PFC and resonant mode power converters
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TWI409683B (zh) * 2010-02-04 2013-09-21 Chunghwa Picture Tubes Ltd 觸控面板偵測電路
US20110268239A1 (en) * 2010-04-30 2011-11-03 David Jerome Krieg Method of calibrating excore detectors in a nuclear reactor
JP5785611B2 (ja) * 2010-05-17 2015-09-30 コーニンクレッカ フィリップス エヌ ヴェ 不適当な調光器動作を検出し修正するための方法及び装置
US8437974B2 (en) * 2010-10-08 2013-05-07 Westinghouse Electric Company Llc Calibration detection system and method
US9014813B2 (en) * 2010-11-03 2015-04-21 Cleveland Clinic Foundation Apparatus for energy efficient stimulation
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CN106300576B (zh) * 2015-05-11 2021-04-20 恩智浦美国有限公司 用于无线充电系统的双向通信解调方法
US10345418B2 (en) * 2015-11-20 2019-07-09 Teradyne, Inc. Calibration device for automatic test equipment
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CN107861089A (zh) * 2017-09-26 2018-03-30 国网江西省电力公司电力科学研究院 一种适应于特殊运行工况的智能电能表测试方法
ES3006258T3 (en) 2019-05-10 2025-03-18 Westinghouse Electric Co Llc Calibration system and method

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Also Published As

Publication number Publication date
FI3966585T3 (fi) 2025-01-03
BR112021022496A2 (pt) 2022-01-11
WO2020231717A1 (en) 2020-11-19
TWI755728B (zh) 2022-02-21
SI3966585T1 (sl) 2025-04-30
US20220229111A1 (en) 2022-07-21
PL3966585T3 (pl) 2025-06-09
JP2022533576A (ja) 2022-07-25
CA3139887A1 (en) 2020-11-19
PL3966585T4 (pl) 2026-03-02
KR20220007639A (ko) 2022-01-18
ES3006258T3 (en) 2025-03-18
JP7661239B2 (ja) 2025-04-14
KR102870209B1 (ko) 2025-10-14
UA129058C2 (uk) 2025-01-01
EP3966585B1 (en) 2024-10-02
US12013435B2 (en) 2024-06-18
CN114008550A (zh) 2022-02-01
EP3966585A1 (en) 2022-03-16
TW202111347A (zh) 2021-03-16

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