PL3966585T3 - System i metoda kalibracji - Google Patents

System i metoda kalibracji

Info

Publication number
PL3966585T3
PL3966585T3 PL20727551.2T PL20727551T PL3966585T3 PL 3966585 T3 PL3966585 T3 PL 3966585T3 PL 20727551 T PL20727551 T PL 20727551T PL 3966585 T3 PL3966585 T3 PL 3966585T3
Authority
PL
Poland
Prior art keywords
calibration system
calibration
Prior art date
Application number
PL20727551.2T
Other languages
English (en)
Inventor
Timothy S. Meyers
Daniel G. Gruber
Mark A. Bartels
Kenneth J. Swidwa
Original Assignee
Westinghouse Electric Company Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Company Llc filed Critical Westinghouse Electric Company Llc
Publication of PL3966585T3 publication Critical patent/PL3966585T3/pl

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Analogue/Digital Conversion (AREA)
  • Programmable Controllers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing And Monitoring For Control Systems (AREA)
PL20727551.2T 2019-05-10 2020-05-07 System i metoda kalibracji PL3966585T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962845980P 2019-05-10 2019-05-10
PCT/US2020/031758 WO2020231717A1 (en) 2019-05-10 2020-05-07 Calibration system and method

Publications (1)

Publication Number Publication Date
PL3966585T3 true PL3966585T3 (pl) 2025-06-09

Family

ID=70779982

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20727551.2T PL3966585T3 (pl) 2019-05-10 2020-05-07 System i metoda kalibracji

Country Status (14)

Country Link
US (1) US12013435B2 (pl)
EP (1) EP3966585B1 (pl)
JP (1) JP7661239B2 (pl)
KR (1) KR102870209B1 (pl)
CN (1) CN114008550B (pl)
BR (1) BR112021022496A2 (pl)
CA (1) CA3139887A1 (pl)
ES (1) ES3006258T3 (pl)
FI (1) FI3966585T3 (pl)
PL (1) PL3966585T3 (pl)
SI (1) SI3966585T1 (pl)
TW (1) TWI755728B (pl)
UA (1) UA129058C2 (pl)
WO (1) WO2020231717A1 (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7661239B2 (ja) 2019-05-10 2025-04-14 ウェスティングハウス エレクトリック カンパニー エルエルシー 較正システム、電子装置、及び、較正検証方法
TWI832409B (zh) * 2022-09-02 2024-02-11 廣達電腦股份有限公司 用於校正電池相對電荷狀態的電子裝置及其方法

Family Cites Families (29)

* Cited by examiner, † Cited by third party
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US4581585A (en) * 1983-02-07 1986-04-08 Tektronix, Inc. Apparatus and method for automatically calibrating a sweep waveform generator
JPH0310419A (ja) * 1989-06-07 1991-01-18 Fujitsu Ltd 周波数特性補正方式
US5412481A (en) * 1992-02-24 1995-05-02 Samsung Electronics Co., Ltd. Time-base correction in a video recording/playback system
US6988232B2 (en) * 2001-07-05 2006-01-17 Intellitech Corporation Method and apparatus for optimized parallel testing and access of electronic circuits
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters
US7348914B1 (en) * 2006-06-29 2008-03-25 Lattice Semiconductor Corporation Method and systems to align outputs signals of an analog-to-digital converter
CN101484819B (zh) * 2006-06-30 2012-05-09 泰瑞达公司 自动测试装置及与其配套使用的校准设备和校准方法
US7933942B2 (en) * 2006-09-29 2011-04-26 Teradyne, Inc. Low cost, high purity sign wave generator
JP2008295016A (ja) * 2007-04-25 2008-12-04 Yokogawa Electric Corp Ａｄ変換器の校正システム
EP2081285A2 (en) * 2008-01-18 2009-07-22 Power Integrations, Inc. Cascaded PFC and resonant mode power converters
WO2010095232A1 (ja) * 2009-02-19 2010-08-26 株式会社日立製作所 アナログデジタル変換器および半導体集積回路装置
TWI409683B (zh) * 2010-02-04 2013-09-21 Chunghwa Picture Tubes Ltd 觸控面板偵測電路
US20110268239A1 (en) * 2010-04-30 2011-11-03 David Jerome Krieg Method of calibrating excore detectors in a nuclear reactor
US9572215B2 (en) * 2010-05-17 2017-02-14 Philips Lighting Holding B.V. Method and apparatus for detecting and correcting improper dimmer operation
US8437974B2 (en) * 2010-10-08 2013-05-07 Westinghouse Electric Company Llc Calibration detection system and method
US9014813B2 (en) * 2010-11-03 2015-04-21 Cleveland Clinic Foundation Apparatus for energy efficient stimulation
US8756029B2 (en) * 2011-01-21 2014-06-17 Schneider Electric USA, Inc. Non-linearity calibration using an internal source in an intelligent electronic device
DE102013220157B4 (de) * 2012-10-05 2017-05-24 Infineon Technologies Ag Signalerzeugungsschaltung
US20150341158A1 (en) * 2014-05-23 2015-11-26 Mediatek Inc. Loop gain calibration apparatus for controlling loop gain of timing recovery loop and related loop gain calibration method
US9413344B2 (en) 2014-09-08 2016-08-09 Qualcomm Incorporated Automatic calibration circuits for operational calibration of critical-path time delays in adaptive clock distribution systems, and related methods and systems
US9270291B1 (en) * 2015-01-13 2016-02-23 Broadcom Corporation High speed time-interleaved ADC gain offset and skew mitigation
CN104808056B (zh) * 2015-04-19 2018-12-11 华南理工大学 一种基于比较器转换的频率特性测试方法与装置
CN106300576B (zh) * 2015-05-11 2021-04-20 恩智浦美国有限公司 用于无线充电系统的双向通信解调方法
US10345418B2 (en) * 2015-11-20 2019-07-09 Teradyne, Inc. Calibration device for automatic test equipment
US10056914B2 (en) * 2015-12-18 2018-08-21 Analog Devices Global Frequency-domain ADC flash calibration
US9667407B1 (en) 2016-05-13 2017-05-30 Credo Technology Group Limited Integrated multi-channel receiver having independent clock recovery modules with enhanced inductors
US10502807B2 (en) * 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices
CN107861089A (zh) * 2017-09-26 2018-03-30 国网江西省电力公司电力科学研究院 一种适应于特殊运行工况的智能电能表测试方法
JP7661239B2 (ja) 2019-05-10 2025-04-14 ウェスティングハウス エレクトリック カンパニー エルエルシー 較正システム、電子装置、及び、較正検証方法

Also Published As

Publication number Publication date
TW202111347A (zh) 2021-03-16
CN114008550B (zh) 2025-03-14
CA3139887A1 (en) 2020-11-19
EP3966585A1 (en) 2022-03-16
EP3966585B1 (en) 2024-10-02
KR102870209B1 (ko) 2025-10-14
BR112021022496A2 (pt) 2022-01-11
JP2022533576A (ja) 2022-07-25
WO2020231717A1 (en) 2020-11-19
KR20220007639A (ko) 2022-01-18
ES3006258T3 (en) 2025-03-18
SI3966585T1 (sl) 2025-04-30
UA129058C2 (uk) 2025-01-01
US12013435B2 (en) 2024-06-18
FI3966585T3 (fi) 2025-01-03
TWI755728B (zh) 2022-02-21
CN114008550A (zh) 2022-02-01
JP7661239B2 (ja) 2025-04-14
US20220229111A1 (en) 2022-07-21

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