BR112021022496A2 - Sistema e método de calibração, e, dispositivo eletrônico - Google Patents

Sistema e método de calibração, e, dispositivo eletrônico

Info

Publication number
BR112021022496A2
BR112021022496A2 BR112021022496A BR112021022496A BR112021022496A2 BR 112021022496 A2 BR112021022496 A2 BR 112021022496A2 BR 112021022496 A BR112021022496 A BR 112021022496A BR 112021022496 A BR112021022496 A BR 112021022496A BR 112021022496 A2 BR112021022496 A2 BR 112021022496A2
Authority
BR
Brazil
Prior art keywords
electronic device
calibration system
control circuit
waveform
periodic waveform
Prior art date
Application number
BR112021022496A
Other languages
English (en)
Inventor
G Gruber Daniel
J Swidwa Kenneth
A Bartels Mark
S Meyers Timothy
Original Assignee
Westinghouse Electric Co Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Co Llc filed Critical Westinghouse Electric Co Llc
Publication of BR112021022496A2 publication Critical patent/BR112021022496A2/pt

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Analogue/Digital Conversion (AREA)
  • Programmable Controllers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

sistema e método de calibração, e, dispositivo eletrônico. um sistema de calibração é descrito. o sistema de calibração inclui um gerador de forma de onda configurado para gerar uma forma de onda periódica e um circuito de controle em comunicação de sinal com o gerador de forma de onda. o circuito de controle inclui um conversor analógico-digital configurado para converter a forma de onda periódica em valores digitais e um dispositivo eletrônico em comunicação de sinal com o conversor analógico-digital. o dispositivo eletrônico é configurado para verificar a calibração de (1) temporização do circuito de controle e (2) níveis de voltagem do circuito de controle com base na forma de onda periódica.
BR112021022496A 2019-05-10 2020-05-07 Sistema e método de calibração, e, dispositivo eletrônico BR112021022496A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962845980P 2019-05-10 2019-05-10
PCT/US2020/031758 WO2020231717A1 (en) 2019-05-10 2020-05-07 Calibration system and method

Publications (1)

Publication Number Publication Date
BR112021022496A2 true BR112021022496A2 (pt) 2022-01-11

Family

ID=70779982

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112021022496A BR112021022496A2 (pt) 2019-05-10 2020-05-07 Sistema e método de calibração, e, dispositivo eletrônico

Country Status (9)

Country Link
US (1) US12013435B2 (pt)
EP (1) EP3966585A1 (pt)
JP (1) JP2022533576A (pt)
KR (1) KR20220007639A (pt)
CN (1) CN114008550A (pt)
BR (1) BR112021022496A2 (pt)
CA (1) CA3139887A1 (pt)
TW (1) TWI755728B (pt)
WO (1) WO2020231717A1 (pt)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220007639A (ko) 2019-05-10 2022-01-18 웨스팅하우스 일렉트릭 컴퍼니 엘엘씨 교정 시스템 및 방법

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US4581585A (en) * 1983-02-07 1986-04-08 Tektronix, Inc. Apparatus and method for automatically calibrating a sweep waveform generator
JPH0310419A (ja) * 1989-06-07 1991-01-18 Fujitsu Ltd 周波数特性補正方式
US5412481A (en) * 1992-02-24 1995-05-02 Samsung Electronics Co., Ltd. Time-base correction in a video recording/playback system
US6988232B2 (en) * 2001-07-05 2006-01-17 Intellitech Corporation Method and apparatus for optimized parallel testing and access of electronic circuits
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters
US7348914B1 (en) * 2006-06-29 2008-03-25 Lattice Semiconductor Corporation Method and systems to align outputs signals of an analog-to-digital converter
US7523007B2 (en) * 2006-06-30 2009-04-21 Teradyne, Inc. Calibration device
US7933942B2 (en) 2006-09-29 2011-04-26 Teradyne, Inc. Low cost, high purity sign wave generator
EP2081285A2 (en) * 2008-01-18 2009-07-22 Power Integrations, Inc. Cascaded PFC and resonant mode power converters
TWI409683B (zh) * 2010-02-04 2013-09-21 Chunghwa Picture Tubes Ltd 觸控面板偵測電路
US20110268239A1 (en) * 2010-04-30 2011-11-03 David Jerome Krieg Method of calibrating excore detectors in a nuclear reactor
US8437974B2 (en) * 2010-10-08 2013-05-07 Westinghouse Electric Company Llc Calibration detection system and method
US9014813B2 (en) 2010-11-03 2015-04-21 Cleveland Clinic Foundation Apparatus for energy efficient stimulation
US8756029B2 (en) 2011-01-21 2014-06-17 Schneider Electric USA, Inc. Non-linearity calibration using an internal source in an intelligent electronic device
DE102013220157B4 (de) 2012-10-05 2017-05-24 Infineon Technologies Ag Signalerzeugungsschaltung
US20150341158A1 (en) 2014-05-23 2015-11-26 Mediatek Inc. Loop gain calibration apparatus for controlling loop gain of timing recovery loop and related loop gain calibration method
US9413344B2 (en) * 2014-09-08 2016-08-09 Qualcomm Incorporated Automatic calibration circuits for operational calibration of critical-path time delays in adaptive clock distribution systems, and related methods and systems
US9270291B1 (en) * 2015-01-13 2016-02-23 Broadcom Corporation High speed time-interleaved ADC gain offset and skew mitigation
CN104808056B (zh) * 2015-04-19 2018-12-11 华南理工大学 一种基于比较器转换的频率特性测试方法与装置
US10345418B2 (en) * 2015-11-20 2019-07-09 Teradyne, Inc. Calibration device for automatic test equipment
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US9667407B1 (en) 2016-05-13 2017-05-30 Credo Technology Group Limited Integrated multi-channel receiver having independent clock recovery modules with enhanced inductors
US10502807B2 (en) 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices
CN107861089A (zh) * 2017-09-26 2018-03-30 国网江西省电力公司电力科学研究院 一种适应于特殊运行工况的智能电能表测试方法
KR20220007639A (ko) 2019-05-10 2022-01-18 웨스팅하우스 일렉트릭 컴퍼니 엘엘씨 교정 시스템 및 방법

Also Published As

Publication number Publication date
TW202111347A (zh) 2021-03-16
US20220229111A1 (en) 2022-07-21
JP2022533576A (ja) 2022-07-25
WO2020231717A1 (en) 2020-11-19
KR20220007639A (ko) 2022-01-18
CA3139887A1 (en) 2020-11-19
CN114008550A (zh) 2022-02-01
TWI755728B (zh) 2022-02-21
EP3966585A1 (en) 2022-03-16
US12013435B2 (en) 2024-06-18

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