TWI609251B - 投影光學系統、曝光設備及裝置製造方法 - Google Patents

投影光學系統、曝光設備及裝置製造方法 Download PDF

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Publication number
TWI609251B
TWI609251B TW106111174A TW106111174A TWI609251B TW I609251 B TWI609251 B TW I609251B TW 106111174 A TW106111174 A TW 106111174A TW 106111174 A TW106111174 A TW 106111174A TW I609251 B TWI609251 B TW I609251B
Authority
TW
Taiwan
Prior art keywords
optical system
convex mirror
projection optical
reflective surface
support member
Prior art date
Application number
TW106111174A
Other languages
English (en)
Chinese (zh)
Other versions
TW201734668A (zh
Inventor
佐佐木康人
関美津留
中嶋猛
Original Assignee
佳能股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by 佳能股份有限公司 filed Critical 佳能股份有限公司
Publication of TW201734668A publication Critical patent/TW201734668A/zh
Application granted granted Critical
Publication of TWI609251B publication Critical patent/TWI609251B/zh

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/702Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/0615Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors off-axis or unobscured systems in wich all of the mirrors share a common axis of rotational symmetry
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00Projectors or projection-type viewers; Accessories therefor
    • G03B21/14Details
    • G03B21/28Reflectors in projection beam
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70233Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/709Vibration, e.g. vibration detection, compensation, suppression or isolation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Engineering & Computer Science (AREA)
  • Atmospheric Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lenses (AREA)
  • Optical Elements Other Than Lenses (AREA)
TW106111174A 2014-12-02 2015-11-20 投影光學系統、曝光設備及裝置製造方法 TWI609251B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014244333A JP6386896B2 (ja) 2014-12-02 2014-12-02 投影光学系、露光装置、および、デバイス製造方法

Publications (2)

Publication Number Publication Date
TW201734668A TW201734668A (zh) 2017-10-01
TWI609251B true TWI609251B (zh) 2017-12-21

Family

ID=56091280

Family Applications (2)

Application Number Title Priority Date Filing Date
TW106111174A TWI609251B (zh) 2014-12-02 2015-11-20 投影光學系統、曝光設備及裝置製造方法
TW104138518A TWI588623B (zh) 2014-12-02 2015-11-20 投影光學系統、曝光設備及裝置製造方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW104138518A TWI588623B (zh) 2014-12-02 2015-11-20 投影光學系統、曝光設備及裝置製造方法

Country Status (6)

Country Link
US (1) US10495978B2 (enExample)
JP (1) JP6386896B2 (enExample)
KR (1) KR101968432B1 (enExample)
CN (1) CN107003615B (enExample)
TW (2) TWI609251B (enExample)
WO (1) WO2016088314A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7075302B2 (ja) 2018-07-23 2022-05-25 キヤノン株式会社 光学装置、投影光学系、露光装置、および物品の製造方法
JP7204400B2 (ja) * 2018-09-28 2023-01-16 キヤノン株式会社 露光装置及び物品の製造方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005345582A (ja) * 2004-06-01 2005-12-15 Dainippon Screen Mfg Co Ltd 投影光学系およびパターン描画装置
US20060092393A1 (en) * 2004-10-28 2006-05-04 Asml Holding N.V. Lithographic apparatus having an adjustable projection system and device manufacturing method
TW200935188A (en) * 2007-12-26 2009-08-16 Canon Kk Exposure apparatus and equipment manufacturing method
JP2011108793A (ja) * 2009-11-16 2011-06-02 Canon Inc 露光装置およびデバイス製造方法
TW201350902A (zh) * 2012-06-04 2013-12-16 佳能股份有限公司 光學系統、曝光裝置及製造設備的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0689844A (ja) * 1992-09-09 1994-03-29 Toshiba Corp 露光装置
JP2001326160A (ja) * 2000-05-16 2001-11-22 Seiko Epson Corp 反射投影露光装置の歪み検出機構
TW200841134A (en) * 2007-04-13 2008-10-16 Orc Mfg Co Ltd Projection exposure apparatus
JP2008263092A (ja) 2007-04-13 2008-10-30 Orc Mfg Co Ltd 投影露光装置
JP2008311498A (ja) * 2007-06-15 2008-12-25 Orc Mfg Co Ltd 反射型露光装置
JP5398185B2 (ja) * 2008-07-09 2014-01-29 キヤノン株式会社 投影光学系、露光装置およびデバイス製造方法
US8508735B2 (en) 2008-09-22 2013-08-13 Nikon Corporation Movable body apparatus, movable body drive method, exposure apparatus, exposure method, and device manufacturing method
US8773635B2 (en) 2008-12-19 2014-07-08 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
JP5116726B2 (ja) * 2009-06-01 2013-01-09 キヤノン株式会社 露光装置およびデバイス製造方法
JP5595001B2 (ja) * 2009-10-06 2014-09-24 キヤノン株式会社 投影光学系、露光装置及びデバイス製造方法
JP6410406B2 (ja) 2012-11-16 2018-10-24 キヤノン株式会社 投影光学系、露光装置および物品の製造方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005345582A (ja) * 2004-06-01 2005-12-15 Dainippon Screen Mfg Co Ltd 投影光学系およびパターン描画装置
US20060092393A1 (en) * 2004-10-28 2006-05-04 Asml Holding N.V. Lithographic apparatus having an adjustable projection system and device manufacturing method
TW200935188A (en) * 2007-12-26 2009-08-16 Canon Kk Exposure apparatus and equipment manufacturing method
JP2011108793A (ja) * 2009-11-16 2011-06-02 Canon Inc 露光装置およびデバイス製造方法
TW201350902A (zh) * 2012-06-04 2013-12-16 佳能股份有限公司 光學系統、曝光裝置及製造設備的方法

Also Published As

Publication number Publication date
JP6386896B2 (ja) 2018-09-05
US10495978B2 (en) 2019-12-03
KR101968432B1 (ko) 2019-04-11
JP2016109741A (ja) 2016-06-20
KR20170088938A (ko) 2017-08-02
CN107003615B (zh) 2019-01-25
TW201734668A (zh) 2017-10-01
TW201621476A (zh) 2016-06-16
US20170315448A1 (en) 2017-11-02
WO2016088314A1 (en) 2016-06-09
CN107003615A (zh) 2017-08-01
TWI588623B (zh) 2017-06-21

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