TWI577997B - 印刷基板之絕緣檢查裝置及絕緣檢查方法 - Google Patents

印刷基板之絕緣檢查裝置及絕緣檢查方法 Download PDF

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Publication number
TWI577997B
TWI577997B TW102124769A TW102124769A TWI577997B TW I577997 B TWI577997 B TW I577997B TW 102124769 A TW102124769 A TW 102124769A TW 102124769 A TW102124769 A TW 102124769A TW I577997 B TWI577997 B TW I577997B
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TW
Taiwan
Prior art keywords
voltage
time
current
insulation
spark
Prior art date
Application number
TW102124769A
Other languages
English (en)
Chinese (zh)
Other versions
TW201405148A (zh
Inventor
土田憲吾
三宅康志
Original Assignee
山葉汎提克股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=50048252&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=TWI577997(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by 山葉汎提克股份有限公司 filed Critical 山葉汎提克股份有限公司
Publication of TW201405148A publication Critical patent/TW201405148A/zh
Application granted granted Critical
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/12—Measuring rate of change
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW102124769A 2012-07-31 2013-07-10 印刷基板之絕緣檢查裝置及絕緣檢查方法 TWI577997B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012170642A JP5727976B2 (ja) 2012-07-31 2012-07-31 プリント基板の絶縁検査装置及び絶縁検査方法

Publications (2)

Publication Number Publication Date
TW201405148A TW201405148A (zh) 2014-02-01
TWI577997B true TWI577997B (zh) 2017-04-11

Family

ID=50048252

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102124769A TWI577997B (zh) 2012-07-31 2013-07-10 印刷基板之絕緣檢查裝置及絕緣檢查方法

Country Status (4)

Country Link
JP (1) JP5727976B2 (ja)
KR (1) KR102004842B1 (ja)
CN (1) CN103576058B (ja)
TW (1) TWI577997B (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104898464B (zh) * 2014-03-06 2017-11-07 大族激光科技产业集团股份有限公司 一种绝缘测试的控制模块
KR102132860B1 (ko) 2020-03-17 2020-07-10 주식회사 나노시스 기판 검사 시스템
CN113533909A (zh) * 2020-04-15 2021-10-22 雅马哈精密科技株式会社 检查装置以及检查方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116781A (ja) * 1999-10-18 2001-04-27 Hioki Ee Corp 絶縁抵抗計の制御方法
JP2010175339A (ja) * 2009-01-28 2010-08-12 Mitsubishi Electric Corp 絶縁検査装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS546046A (en) 1977-06-16 1979-01-17 Toray Ind Inc Acrylonitrile polymer compsition
JP3546046B2 (ja) * 2001-09-26 2004-07-21 日本電産リード株式会社 回路基板の絶縁検査装置及び絶縁検査方法
JP3953087B2 (ja) * 2005-10-18 2007-08-01 日本電産リード株式会社 絶縁検査装置及び絶縁検査方法
JP4843071B2 (ja) * 2009-06-04 2011-12-21 マイクロクラフト株式会社 プリント配線板の検査装置及び検査方法
JP2011185702A (ja) * 2010-03-08 2011-09-22 Yamaha Fine Technologies Co Ltd 回路基板の電気検査方法及び電気検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116781A (ja) * 1999-10-18 2001-04-27 Hioki Ee Corp 絶縁抵抗計の制御方法
JP2010175339A (ja) * 2009-01-28 2010-08-12 Mitsubishi Electric Corp 絶縁検査装置

Also Published As

Publication number Publication date
CN103576058B (zh) 2017-11-21
CN103576058A (zh) 2014-02-12
JP2014029311A (ja) 2014-02-13
KR20140016828A (ko) 2014-02-10
JP5727976B2 (ja) 2015-06-03
KR102004842B1 (ko) 2019-07-29
TW201405148A (zh) 2014-02-01

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