TWI449916B - Substrate inspection fixture - Google Patents
Substrate inspection fixture Download PDFInfo
- Publication number
- TWI449916B TWI449916B TW100147380A TW100147380A TWI449916B TW I449916 B TWI449916 B TW I449916B TW 100147380 A TW100147380 A TW 100147380A TW 100147380 A TW100147380 A TW 100147380A TW I449916 B TWI449916 B TW I449916B
- Authority
- TW
- Taiwan
- Prior art keywords
- electrode
- inspection
- contact
- side support
- plate
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011027672 | 2011-02-10 | ||
PCT/JP2011/061792 WO2012108066A1 (ja) | 2011-02-10 | 2011-05-23 | 検査治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201245726A TW201245726A (en) | 2012-11-16 |
TWI449916B true TWI449916B (zh) | 2014-08-21 |
Family
ID=46638302
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103119874A TWI521211B (zh) | 2011-02-10 | 2011-12-20 | Substrate inspection fixture |
TW100147380A TWI449916B (zh) | 2011-02-10 | 2011-12-20 | Substrate inspection fixture |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103119874A TWI521211B (zh) | 2011-02-10 | 2011-12-20 | Substrate inspection fixture |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP4974311B1 (ja) |
KR (1) | KR101795836B1 (ja) |
CN (1) | CN103348255B (ja) |
TW (2) | TWI521211B (ja) |
WO (1) | WO2012108066A1 (ja) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101397373B1 (ko) | 2013-03-27 | 2014-05-20 | 삼성전기주식회사 | 전기검사용 지그 |
JP2015021726A (ja) * | 2013-07-16 | 2015-02-02 | 日置電機株式会社 | プローブユニットおよび基板検査装置 |
JP6255914B2 (ja) | 2013-11-07 | 2018-01-10 | 日本電産リード株式会社 | 検査治具 |
JP2015152391A (ja) * | 2014-02-13 | 2015-08-24 | 日本電産リード株式会社 | 検査用接触子及びそれを備えた検査治具、並びに検査用接触子の製造方法 |
JP6237441B2 (ja) * | 2014-04-24 | 2017-11-29 | 日本電産リード株式会社 | 電極構造体、検査治具、及び電極構造体の製造方法 |
KR101613810B1 (ko) | 2015-01-11 | 2016-04-19 | 김일 | 검사접촉장치 |
KR101656047B1 (ko) * | 2016-03-23 | 2016-09-09 | 주식회사 나노시스 | 기판 검사용 지그 |
CN106932615B (zh) * | 2017-04-28 | 2024-02-13 | 尼得科精密检测设备(浙江)有限公司 | 检查夹具及具备该检查夹具的检查装置 |
JP7075725B2 (ja) * | 2017-05-30 | 2022-05-26 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP7046527B2 (ja) * | 2017-08-15 | 2022-04-04 | 株式会社日本マイクロニクス | 電気的接続装置 |
KR102362283B1 (ko) * | 2017-12-27 | 2022-02-14 | 주식회사 경동원 | 디스플레이를 구비한 전자기기 및 이의 검사방법 |
KR102026411B1 (ko) * | 2018-06-29 | 2019-09-27 | 김현수 | 휴대폰 검사용 지그 |
KR102126200B1 (ko) * | 2018-11-16 | 2020-06-25 | 주식회사 호원 | 패널용 검사구 |
KR102206404B1 (ko) * | 2020-06-23 | 2021-01-25 | (주)뉴씨텍 | 전극부 가동식 지그 |
CN112439714A (zh) * | 2020-12-09 | 2021-03-05 | 庄绍海 | 一种石墨烯芯片加工筛选设备 |
KR20230047817A (ko) | 2021-10-01 | 2023-04-10 | 주식회사 엘지에너지솔루션 | 전극 휨 측정장치 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200848759A (en) * | 2007-04-17 | 2008-12-16 | Nidec Read Corp | Jig for substrate inspection |
JP2009047512A (ja) * | 2007-08-17 | 2009-03-05 | Koyo Technos:Kk | 検査冶具および検査装置 |
CN101900748A (zh) * | 2009-05-29 | 2010-12-01 | 日本电产理德株式会社 | 检查用夹具 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1152000A (ja) * | 1997-07-31 | 1999-02-26 | Mozu Denshi Kogyo Kk | プリント配線基板の検査装置及び検査方法 |
JP3849948B1 (ja) * | 2005-11-16 | 2006-11-22 | 日本電産リード株式会社 | 基板検査用治具及び検査用プローブ |
JP4041831B2 (ja) * | 2006-05-15 | 2008-02-06 | 日本電産リード株式会社 | 基板検査用治具及びこの治具における接続電極部の電極構造 |
JP4965341B2 (ja) | 2007-05-31 | 2012-07-04 | 日置電機株式会社 | プローブユニットおよび回路基板検査装置 |
JP5504698B2 (ja) * | 2009-06-02 | 2014-05-28 | 日本電産リード株式会社 | 検査用治具及び検査用接触子 |
-
2011
- 2011-05-23 KR KR1020137021064A patent/KR101795836B1/ko active IP Right Grant
- 2011-05-23 WO PCT/JP2011/061792 patent/WO2012108066A1/ja active Application Filing
- 2011-05-23 JP JP2011537780A patent/JP4974311B1/ja active Active
- 2011-05-23 CN CN201180067114.2A patent/CN103348255B/zh active Active
- 2011-12-20 TW TW103119874A patent/TWI521211B/zh active
- 2011-12-20 TW TW100147380A patent/TWI449916B/zh active
-
2012
- 2012-01-12 JP JP2012003773A patent/JP5821642B2/ja active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200848759A (en) * | 2007-04-17 | 2008-12-16 | Nidec Read Corp | Jig for substrate inspection |
JP2009047512A (ja) * | 2007-08-17 | 2009-03-05 | Koyo Technos:Kk | 検査冶具および検査装置 |
CN101900748A (zh) * | 2009-05-29 | 2010-12-01 | 日本电产理德株式会社 | 检查用夹具 |
Also Published As
Publication number | Publication date |
---|---|
KR20140043057A (ko) | 2014-04-08 |
JP5821642B2 (ja) | 2015-11-24 |
JP4974311B1 (ja) | 2012-07-11 |
KR101795836B1 (ko) | 2017-11-08 |
CN103348255A (zh) | 2013-10-09 |
JPWO2012108066A1 (ja) | 2014-07-03 |
WO2012108066A1 (ja) | 2012-08-16 |
TW201245726A (en) | 2012-11-16 |
TW201506407A (zh) | 2015-02-16 |
JP2012181186A (ja) | 2012-09-20 |
TWI521211B (zh) | 2016-02-11 |
CN103348255B (zh) | 2015-11-25 |
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