TWI363064B - - Google Patents

Download PDF

Info

Publication number
TWI363064B
TWI363064B TW096130712A TW96130712A TWI363064B TW I363064 B TWI363064 B TW I363064B TW 096130712 A TW096130712 A TW 096130712A TW 96130712 A TW96130712 A TW 96130712A TW I363064 B TWI363064 B TW I363064B
Authority
TW
Taiwan
Prior art keywords
molecular weight
isocyanate
prepolymer
polishing pad
diisocyanate
Prior art date
Application number
TW096130712A
Other languages
English (en)
Chinese (zh)
Other versions
TW200819472A (en
Inventor
Yoshiyuki Nakai
Tsuyoshi Kimura
Atsushi Kazuno
Kazuyuki Ogawa
Tetsuo Shimomura
Original Assignee
Toyo Tire & Rubber Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007184658A external-priority patent/JP4128607B2/ja
Priority claimed from JP2007184644A external-priority patent/JP4128606B2/ja
Application filed by Toyo Tire & Rubber Co filed Critical Toyo Tire & Rubber Co
Publication of TW200819472A publication Critical patent/TW200819472A/zh
Application granted granted Critical
Publication of TWI363064B publication Critical patent/TWI363064B/zh

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/11—Lapping tools
    • B24B37/20—Lapping pads for working plane surfaces
    • B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/22—Rubbers synthetic or natural
    • B24D3/26—Rubbers synthetic or natural for porous or cellular structure
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28—Resins or natural or synthetic macromolecular compounds
    • B24D3/32—Resins or natural or synthetic macromolecular compounds for porous or cellular structure
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00—Polymeric products of isocyanates or isothiocyanates
    • C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/08—Processes
    • C08G18/10—Prepolymer processes involving reaction of isocyanates or isothiocyanates with compounds having active hydrogen in a first reaction step
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00—Polymeric products of isocyanates or isothiocyanates
    • C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
    • C08G18/40—High-molecular-weight compounds
    • C08G18/48—Polyethers
    • C08G18/4854—Polyethers containing oxyalkylene groups having four carbon atoms in the alkylene group
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00—Polymeric products of isocyanates or isothiocyanates
    • C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
    • C08G18/65—Low-molecular-weight compounds having active hydrogen with high-molecular-weight compounds having active hydrogen
    • C08G18/66—Compounds of groups C08G18/42, C08G18/48, or C08G18/52
    • C08G18/6666—Compounds of group C08G18/48 or C08G18/52
    • C08G18/667—Compounds of group C08G18/48 or C08G18/52 with compounds of group C08G18/32 or polyamines of C08G18/38
    • C08G18/6674—Compounds of group C08G18/48 or C08G18/52 with compounds of group C08G18/32 or polyamines of C08G18/38 with compounds of group C08G18/3203
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00—Polymeric products of isocyanates or isothiocyanates
    • C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/70—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
    • C08G18/72—Polyisocyanates or polyisothiocyanates
    • C08G18/721—Two or more polyisocyanates not provided for in one single group C08G18/73 - C08G18/80
    • C08G18/724—Combination of aromatic polyisocyanates with (cyclo)aliphatic polyisocyanates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00—Polymeric products of isocyanates or isothiocyanates
    • C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/08—Processes
    • C08G18/14—Manufacture of cellular products

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polyurethanes Or Polyureas (AREA)
TW096130712A 2006-08-28 2007-08-20 Polishing pad TW200819472A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2006230805 2006-08-28
JP2006234060 2006-08-30
JP2007184658A JP4128607B2 (ja) 2006-08-28 2007-07-13 研磨パッド
JP2007184644A JP4128606B2 (ja) 2006-08-30 2007-07-13 研磨パッド

Publications (2)

Publication Number Publication Date
TW200819472A TW200819472A (en) 2008-05-01
TWI363064B true TWI363064B (enExample) 2012-05-01

Family

ID=39135734

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096130712A TW200819472A (en) 2006-08-28 2007-08-20 Polishing pad

Country Status (5)

Country Link
US (2) US8993648B2 (enExample)
KR (1) KR101107043B1 (enExample)
CN (2) CN102152233B (enExample)
TW (1) TW200819472A (enExample)
WO (1) WO2008026451A1 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101134058B1 (ko) * 2005-05-17 2012-04-16 도요 고무 고교 가부시키가이샤 연마 패드
SG162794A1 (en) 2005-07-15 2010-07-29 Toyo Tire & Rubber Co Layered sheets and processes for producing the same
JP4884725B2 (ja) * 2005-08-30 2012-02-29 東洋ゴム工業株式会社 研磨パッド
JP4884726B2 (ja) * 2005-08-30 2012-02-29 東洋ゴム工業株式会社 積層研磨パッドの製造方法
JP5008927B2 (ja) 2006-08-31 2012-08-22 東洋ゴム工業株式会社 研磨パッド
WO2008029538A1 (en) 2006-09-08 2008-03-13 Toyo Tire & Rubber Co., Ltd. Polishing pad
US20100009611A1 (en) * 2006-09-08 2010-01-14 Toyo Tire & Rubber Co., Ltd. Method for manufacturing a polishing pad
US8257153B2 (en) 2007-01-15 2012-09-04 Toyo Tire & Rubber Co., Ltd. Polishing pad and a method for manufacturing the same
JP5078000B2 (ja) 2007-03-28 2012-11-21 東洋ゴム工業株式会社 研磨パッド
JP4593643B2 (ja) * 2008-03-12 2010-12-08 東洋ゴム工業株式会社 研磨パッド
JP5087439B2 (ja) * 2008-03-18 2012-12-05 東洋ゴム工業株式会社 研磨パッド、研磨パッドの製造方法、及び半導体デバイスの製造方法
JP5087440B2 (ja) * 2008-03-18 2012-12-05 東洋ゴム工業株式会社 研磨パッド、研磨パッドの製造方法、及び半導体デバイスの製造方法
WO2010038725A1 (ja) * 2008-09-30 2010-04-08 Dic株式会社 研磨パッド用ウレタン樹脂組成物、ポリウレタン研磨パッド及びポリウレタン研磨パッドの製造法。
TWI461450B (zh) * 2008-09-30 2014-11-21 Dainippon Ink & Chemicals 研磨墊用２液型胺基甲酸酯樹脂組成物、使用它而成之聚胺基甲酸酯研磨墊、及聚胺基甲酸酯研磨墊之製法
KR20120112476A (ko) * 2009-12-22 2012-10-11 제이에스알 가부시끼가이샤 화학 기계 연마 패드 및 이를 이용한 화학 기계 연마 방법
TWI510328B (zh) * 2010-05-03 2015-12-01 Iv Technologies Co Ltd 基底層、包括此基底層的研磨墊及研磨方法
MY164897A (en) 2010-10-26 2018-01-30 Rohm & Haas Elect Materials Cmp Holdings Inc Polishing pad and method for producing same
WO2012056512A1 (ja) 2010-10-26 2012-05-03 東洋ゴム工業株式会社 研磨パッド及びその製造方法
JP5858576B2 (ja) * 2011-04-21 2016-02-10 東洋ゴム工業株式会社 積層研磨パッド用ホットメルト接着剤シート、及び積層研磨パッド用接着剤層付き支持層
US20140342641A1 (en) * 2011-12-16 2014-11-20 Toyo Tire & Rubber Co., Ltd. Polishing pad
JP5453507B1 (ja) * 2012-10-31 2014-03-26 東洋ゴム工業株式会社 研磨パッド及びその製造方法
JP5629749B2 (ja) * 2012-12-28 2014-11-26 東洋ゴム工業株式会社 研磨パッドの製造方法
CN103333313B (zh) * 2013-06-09 2015-11-18 合肥宏光研磨科技有限公司 一种聚氨酯抛光材料的制造方法
CN106041719B (zh) * 2016-06-03 2018-10-23 湖北鼎龙控股股份有限公司 一种抛光层及其制备方法以及化学机械抛光垫
US20180281149A1 (en) * 2017-03-31 2018-10-04 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
US20180345449A1 (en) * 2017-06-06 2018-12-06 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pads for improved removal rate and planarization
CN107457716B (zh) * 2017-08-29 2019-11-22 湖北鼎龙控股股份有限公司 化学机械抛光垫的抛光层
CN109824854B (zh) * 2018-12-27 2021-09-28 湖北鼎汇微电子材料有限公司 一种抛光垫
US11207757B2 (en) * 2019-06-17 2021-12-28 Skc Solmics Co., Ltd. Composition for polishing pad, polishing pad and preparation method of semiconductor device
CN111793186A (zh) * 2020-06-30 2020-10-20 山东一诺威聚氨酯股份有限公司 聚氨酯抛光垫片层的制备方法
CN113084695B (zh) * 2021-03-12 2022-05-13 安徽禾臣新材料有限公司 一种电子显示屏精抛用缓冲抛光垫及其生产方法
CN114515994A (zh) * 2022-03-03 2022-05-20 上海江丰平芯电子科技有限公司 一种提高晶圆边缘区域研磨率的方法

Family Cites Families (83)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE618837A (enExample) * 1961-06-12
US4410668A (en) * 1982-01-29 1983-10-18 Ppg Industries, Inc. Elastomeric coating compositions
JPH0291279A (ja) 1988-09-29 1990-03-30 Achilles Corp 合成皮革及びその製造方法
JP3137260B2 (ja) 1989-06-12 2001-02-19 凸版印刷株式会社 ラジアルラインスロットアンテナ
WO1993002856A1 (en) * 1991-08-07 1993-02-18 Ppg Industries, Inc. Impregnated fiber bundles having independently crosslinkable polyurethane
GB9216631D0 (en) * 1992-08-05 1992-09-16 Ici Plc Reaction system for preparing microcellular elastomers
MY114512A (en) 1992-08-19 2002-11-30 Rodel Inc Polymeric substrate with polymeric microelements
JPH06220151A (ja) 1993-01-22 1994-08-09 Sanyo Chem Ind Ltd 研磨材用ポリウレタン樹脂
JPH0871378A (ja) 1994-09-09 1996-03-19 Kanegafuchi Chem Ind Co Ltd 中空糸膜ポッティング用ウレタン樹脂
US5670599A (en) * 1995-03-08 1997-09-23 Air Products And Chemicals, Inc. Ultra low voc polyurethane coatings
US5614575A (en) * 1995-04-24 1997-03-25 Rpg. Inc. Sprayable polyurethane compositions
US5587502A (en) 1995-06-02 1996-12-24 Minnesota Mining & Manufacturing Company Hydroxy functional alkoxysilane and alkoxysilane functional polyurethane made therefrom
WO1998045087A1 (en) 1997-04-04 1998-10-15 Rodel Holdings, Inc. Improved polishing pads and methods relating thereto
WO1999007515A1 (en) 1997-08-06 1999-02-18 Rodel Holdings, Inc. Improved polishing pads and methods relating thereto
JP2000017252A (ja) 1998-06-29 2000-01-18 Dainippon Ink & Chem Inc 研磨材組成物及びその研磨材
JP3516874B2 (ja) 1998-12-15 2004-04-05 東洋ゴム工業株式会社 ポリウレタン発泡体の製造方法及び研磨シート
US6354915B1 (en) 1999-01-21 2002-03-12 Rodel Holdings Inc. Polishing pads and methods relating thereto
JP2000248034A (ja) 1999-03-02 2000-09-12 Mitsubishi Chemicals Corp 研磨材用ポリウレタン系樹脂組成物及びその発泡体
JP3316756B2 (ja) 1999-06-04 2002-08-19 富士紡績株式会社 研磨パッド用ウレタン成形物の製造方法及び研磨パッド用ウレタン成形物
JP3880028B2 (ja) 1999-08-06 2007-02-14 Ｊｓｒ株式会社 研磨パッド用重合体組成物及びそれを用いた研磨パッド
JP3558273B2 (ja) 1999-09-22 2004-08-25 東洋ゴム工業株式会社 ポリウレタン発泡体の製造方法及び研磨シート
JP4296655B2 (ja) 1999-10-12 2009-07-15 東レ株式会社 半導体基板用研磨パッド
JP2001277101A (ja) 2000-03-28 2001-10-09 Rodel Nitta Co 研磨布
WO2001096434A1 (en) 2000-06-13 2001-12-20 Toyo Tire & Rubber Co., Ltd. Process for producing polyurethane foam, polyurethane foam, and abrasive sheet
JP2003011066A (ja) 2000-07-25 2003-01-15 Ebara Corp 研磨工具及びその製造方法
US20020016139A1 (en) * 2000-07-25 2002-02-07 Kazuto Hirokawa Polishing tool and manufacturing method therefor
JP2002059358A (ja) 2000-08-24 2002-02-26 Toray Ind Inc 研磨用パッドおよびそれを用いた研磨装置ならびに研磨方法
US6477926B1 (en) * 2000-09-15 2002-11-12 Ppg Industries Ohio, Inc. Polishing pad
US6679769B2 (en) * 2000-09-19 2004-01-20 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
US6641471B1 (en) 2000-09-19 2003-11-04 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
JP3826702B2 (ja) 2000-10-24 2006-09-27 Ｊｓｒ株式会社 研磨パッド用組成物及びこれを用いた研磨パッド
US6706383B1 (en) * 2001-11-27 2004-03-16 Psiloquest, Inc. Polishing pad support that improves polishing performance and longevity
EP1354913B1 (en) * 2000-12-08 2016-10-26 Kuraray Co., Ltd. Thermoplastic polyurethane foam, process for production thereof and polishing pads made of the foam
WO2002059175A2 (en) * 2001-01-24 2002-08-01 Huntsman International Llc Molded foam articles prepared with reduced mold residence time and improved quality
JP3455187B2 (ja) 2001-02-01 2003-10-14 東洋ゴム工業株式会社 研磨パッド用ポリウレタン発泡体の製造装置
JP2002239905A (ja) 2001-02-21 2002-08-28 Allied Material Corp Ｃｍｐ用パッドコンディショナー及びその製造方法
JP3359629B1 (ja) 2001-04-09 2002-12-24 東洋紡績株式会社 ポリウレタン組成物からなる研磨パッド
US7378454B2 (en) * 2001-04-09 2008-05-27 Toyo Tire & Rubber Co., Ltd. Polyurethane composition and polishing pad
JP2003062748A (ja) 2001-08-24 2003-03-05 Inoac Corp 研磨用パッド
JP2003089051A (ja) 2001-09-17 2003-03-25 Tokyo Seimitsu Co Ltd 研磨装置
JP3851135B2 (ja) 2001-10-17 2006-11-29 ニッタ・ハース株式会社 研磨パッド
JP3325562B1 (ja) 2001-12-07 2002-09-17 東洋ゴム工業株式会社 発泡ポリウレタン研磨パッドの製造方法
KR100877390B1 (ko) 2001-11-13 2009-01-07 도요 고무 고교 가부시키가이샤 연마 패드 및 그 제조 방법
JP2003145414A (ja) 2001-11-13 2003-05-20 Toyobo Co Ltd 研磨パッド及びその製造方法
JP3455208B2 (ja) 2001-11-13 2003-10-14 東洋紡績株式会社 半導体ウエハ研磨パッド、半導体ウエハの研磨方法、研磨パッド用研磨シート、及び研磨シート用発泡体ブロック
JP3494641B1 (ja) 2001-12-12 2004-02-09 東洋紡績株式会社 半導体ウエハ研磨用研磨パッド
US6866565B2 (en) * 2002-01-29 2005-03-15 Ebara Corporation Polishing tool and polishing apparatus
JP2003224094A (ja) 2002-01-29 2003-08-08 Ebara Corp 研磨工具
KR100467765B1 (ko) 2002-02-04 2005-01-24 에스케이씨 주식회사 고경도 및 우수한 내마모성을 갖는 폴리우레탄 탄성체제조용 조성물
JP3571334B2 (ja) 2002-05-20 2004-09-29 東洋紡績株式会社 研磨パッド
JP2004167680A (ja) 2002-05-20 2004-06-17 Toyobo Co Ltd 研磨パッド
US6824854B2 (en) * 2002-07-29 2004-11-30 E. I. Du Pont De Nemours And Company Carpets treated for soil resistance
JP4101584B2 (ja) 2002-08-09 2008-06-18 東洋ゴム工業株式会社 研磨シート用ポリウレタン発泡体及びその製造方法、研磨パッド用研磨シート、並びに研磨パッド
KR100697904B1 (ko) 2002-09-25 2007-03-20 피피지 인더스트리즈 오하이오 인코포레이티드 평탄화를 위한 연마 패드
US7094811B2 (en) * 2002-10-03 2006-08-22 Bayer Corporation Energy absorbing flexible foams produced in part with a double metal cyanide catalyzed polyol
US8845852B2 (en) * 2002-11-27 2014-09-30 Toyo Tire & Rubber Co., Ltd. Polishing pad and method of producing semiconductor device
JP4078643B2 (ja) 2002-12-10 2008-04-23 東洋ゴム工業株式会社 研磨パッドの製造方法、研磨パッド、及び半導体デバイスの製造方法
JP4233319B2 (ja) 2002-12-12 2009-03-04 東洋ゴム工業株式会社 研磨パッドの製造方法及び研磨パッド
JP3637568B2 (ja) 2002-12-17 2005-04-13 大日本インキ化学工業株式会社 二液硬化型発泡砥石用ポリオール組成物、二液硬化型発泡砥石用組成物、発泡砥石、及び発泡砥石の製造法
JP2004235446A (ja) 2003-01-30 2004-08-19 Toyobo Co Ltd 研磨パッド
US20040224622A1 (en) * 2003-04-15 2004-11-11 Jsr Corporation Polishing pad and production method thereof
JP4324785B2 (ja) 2003-04-15 2009-09-02 Ｊｓｒ株式会社 研磨パッドの製造方法
JP2005052907A (ja) 2003-08-07 2005-03-03 Diatex Co Ltd 研磨パッド用下地材
JP4189963B2 (ja) * 2003-08-21 2008-12-03 東洋ゴム工業株式会社 研磨パッド
JP4189962B2 (ja) 2003-08-21 2008-12-03 東洋ゴム工業株式会社 研磨パッドの製造方法
JP4265366B2 (ja) 2003-10-17 2009-05-20 日本ポリウレタン工業株式会社 軟質ポリウレタンフォームの製造方法
US20050171224A1 (en) * 2004-02-03 2005-08-04 Kulp Mary J. Polyurethane polishing pad
CN1926666A (zh) * 2004-03-11 2007-03-07 东洋橡胶工业株式会社 研磨垫及半导体器件的制造方法
JP4627149B2 (ja) 2004-05-10 2011-02-09 東洋ゴム工業株式会社 研磨パッド及び半導体デバイスの製造方法
US7018581B2 (en) * 2004-06-10 2006-03-28 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of forming a polishing pad with reduced stress window
EP1647588A3 (en) 2004-10-13 2006-11-02 Rohm and Haas Company Surface promoted Michael Cure Compositions
US20060089095A1 (en) * 2004-10-27 2006-04-27 Swisher Robert G Polyurethane urea polishing pad
JP2006190826A (ja) 2005-01-06 2006-07-20 Toyo Tire & Rubber Co Ltd 研磨パッド及び半導体デバイスの製造方法
US7871309B2 (en) * 2004-12-10 2011-01-18 Toyo Tire & Rubber Co., Ltd. Polishing pad
JP2006231429A (ja) 2005-02-22 2006-09-07 Inoac Corp 研磨パッドおよびその製造方法
KR100909605B1 (ko) 2005-03-08 2009-07-27 도요 고무 고교 가부시키가이샤 연마 패드 및 그 제조 방법
KR101134058B1 (ko) * 2005-05-17 2012-04-16 도요 고무 고교 가부시키가이샤 연마 패드
JP4884725B2 (ja) * 2005-08-30 2012-02-29 東洋ゴム工業株式会社 研磨パッド
JP4884726B2 (ja) * 2005-08-30 2012-02-29 東洋ゴム工業株式会社 積層研磨パッドの製造方法
CN101268111B (zh) * 2005-09-22 2012-07-18 可乐丽股份有限公司 高分子材料、由其得到的发泡体以及使用它们的研磨垫
JP5031236B2 (ja) * 2006-01-10 2012-09-19 東洋ゴム工業株式会社 研磨パッド
JP5008927B2 (ja) * 2006-08-31 2012-08-22 東洋ゴム工業株式会社 研磨パッド
JP5078000B2 (ja) * 2007-03-28 2012-11-21 東洋ゴム工業株式会社 研磨パッド

Also Published As

Publication number Publication date
US8993648B2 (en) 2015-03-31
WO2008026451A1 (fr) 2008-03-06
CN101489721A (zh) 2009-07-22
KR20090025375A (ko) 2009-03-10
KR101107043B1 (ko) 2012-01-25
US20150059253A1 (en) 2015-03-05
US9358661B2 (en) 2016-06-07
CN102152233B (zh) 2013-10-30
US20100003896A1 (en) 2010-01-07
TW200819472A (en) 2008-05-01
CN101489721B (zh) 2014-06-18
CN102152233A (zh) 2011-08-17

Similar Documents

Publication Publication Date Title
TWI363064B (enExample)
TWI364430B (enExample)
TWI352726B (enExample)
JP5088865B2 (ja) 研磨パッド
CN103764346B (zh) 研磨垫及半导体器件的制造方法
JP5661129B2 (ja) 研磨パッド
JP5276502B2 (ja) 研磨パッド及びその製造方法
CN103180100B (zh) 研磨垫及其制造方法
JP5356098B2 (ja) 研磨パッド及びその製造方法
JP2008080478A (ja) 研磨パッド
JP5453507B1 (ja) 研磨パッド及びその製造方法
JP5465578B2 (ja) 研磨パッドおよびその製造方法、ならびに半導体デバイスの製造方法
JP4128607B2 (ja) 研磨パッド
JP5009020B2 (ja) 研磨パッド
JP2017113856A (ja) 研磨パッド及びその製造方法
JP4986274B2 (ja) 研磨パッド及びその製造方法
CN103153539B (zh) 研磨垫及其制造方法
JP5087439B2 (ja) 研磨パッド、研磨パッドの製造方法、及び半導体デバイスの製造方法
TWI428362B (zh) Polishing pad and its manufacturing method (2)

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees