TWI354800B - - Google Patents
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- Publication number
- TWI354800B TWI354800B TW097105700A TW97105700A TWI354800B TW I354800 B TWI354800 B TW I354800B TW 097105700 A TW097105700 A TW 097105700A TW 97105700 A TW97105700 A TW 97105700A TW I354800 B TWI354800 B TW I354800B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- electronic component
- tested
- carrier
- storage
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 169
- 238000012546 transfer Methods 0.000 claims description 79
- 238000003860 storage Methods 0.000 claims description 64
- 230000008707 rearrangement Effects 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 10
- 239000011159 matrix material Substances 0.000 claims description 5
- 238000012937 correction Methods 0.000 claims description 4
- 210000002784 stomach Anatomy 0.000 claims description 2
- 238000001179 sorption measurement Methods 0.000 description 32
- 102100030140 Thiosulfate:glutathione sulfurtransferase Human genes 0.000 description 29
- 239000000758 substrate Substances 0.000 description 8
- 230000003139 buffering effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 102100032306 Aurora kinase B Human genes 0.000 description 1
- 108090000749 Aurora kinase B Proteins 0.000 description 1
- 241000283690 Bos taurus Species 0.000 description 1
- 101000798007 Homo sapiens RAC-gamma serine/threonine-protein kinase Proteins 0.000 description 1
- 241000254158 Lampyridae Species 0.000 description 1
- 206010036790 Productive cough Diseases 0.000 description 1
- 102100032314 RAC-gamma serine/threonine-protein kinase Human genes 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 210000000078 claw Anatomy 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000344 soap Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 210000003802 sputum Anatomy 0.000 description 1
- 208000024794 sputum Diseases 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2007/054667 WO2008126164A1 (ja) | 2007-03-09 | 2007-03-09 | 電子部品試験装置及び電子部品の移載方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200907369A TW200907369A (en) | 2009-02-16 |
| TWI354800B true TWI354800B (enrdf_load_stackoverflow) | 2011-12-21 |
Family
ID=39863348
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097105700A TW200907369A (en) | 2007-03-09 | 2008-02-19 | Electronic component testing apparatus and method for transferring electronic component |
Country Status (2)
| Country | Link |
|---|---|
| TW (1) | TW200907369A (enrdf_load_stackoverflow) |
| WO (1) | WO2008126164A1 (enrdf_load_stackoverflow) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08292233A (ja) * | 1995-04-25 | 1996-11-05 | Hitachi Ltd | Ｉｃハンドラ |
| JPH08334548A (ja) * | 1995-06-07 | 1996-12-17 | Tokyo Electron Ltd | 検査装置 |
-
2007
- 2007-03-09 WO PCT/JP2007/054667 patent/WO2008126164A1/ja active Application Filing
-
2008
- 2008-02-19 TW TW097105700A patent/TW200907369A/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008126164A1 (ja) | 2008-10-23 |
| TW200907369A (en) | 2009-02-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |